Movatterモバイル変換


[0]ホーム

URL:


Jump to content
WikipediaThe Free Encyclopedia
Search

Wide-angle X-ray scattering

From Wikipedia, the free encyclopedia
This articleneeds additional citations forverification. Please helpimprove this article byadding citations to reliable sources. Unsourced material may be challenged and removed.
Find sources: "Wide-angle X-ray scattering" – news ·newspapers ·books ·scholar ·JSTOR
(December 2011) (Learn how and when to remove this message)

InX-ray crystallography,wide-angle X-ray scattering (WAXS) orwide-angle X-ray diffraction (WAXD) is the analysis ofBragg peaks scattered to wide angles, which (byBragg's law) are caused by sub-nanometer-sized structures.[1] It is anX-ray-diffraction[2] method and commonly used to determine a range of information about crystalline materials. The term WAXS is commonly used inpolymer sciences to differentiate it from SAXS but many scientists doing "WAXS" would describe the measurements as Bragg/X-ray/powder diffraction orcrystallography.

Wide-angle X-ray scattering is similar tosmall-angle X-ray scattering (SAXS) but the increasing angle between the sample and detector is probing smaller length scales. This requires samples to be more ordered/crystalline for information to be extracted. In a dedicated SAXS instrument the distance from sample to the detector is longer to increase angular resolution. Most diffractometers can be used to perform both WAXS and limited SAXS in a single run (small- and wide-angle scattering, SWAXS) by adding a beamstop/knife edge.

Applications

[edit]

The WAXS technique is used to determine the degree ofcrystallinity ofpolymer samples.[3] It can also be used to determine the chemical composition or phase composition of a film, the texture of afilm (preferred alignment of crystallites), the crystallite size and presence of filmstress. As with other diffraction methods, the sample is scanned in a wide-angle X-raygoniometer, and the scattering intensity is plotted as a function of the 2θ angle.

X-ray diffraction is a non destructive method of characterization of solid materials. When X-rays are directed at solids they scatter in predictable patterns based on the internal structure of the solid. A crystalline solid consists of regularly spaced atoms (electrons) that can be described by imaginary planes. The distance between these planes is called the d-spacing.

The intensity of the d-space pattern is directly proportional to the number of electrons (atoms) in the imaginary planes. Every crystalline solid has a unique pattern of d-spacings (known as the powder pattern), which is a fingerprint for that solid. Solids with the same chemical composition but different phases can be identified by their pattern of d-spacings.

References

[edit]
  1. ^Podorov, S. G.; Faleev, N. N.; Pavlov, K. M.; Paganin, D. M.; Stepanov, S. A.; Förster, E. (2006-09-12). "A new approach to wide-angle dynamical X-ray diffraction by deformed crystals".Journal of Applied Crystallography.39 (5). International Union of Crystallography (IUCr):652–655.doi:10.1107/s0021889806025696.ISSN 0021-8898.
  2. ^"WIDE-ANGLE X-RAY DIFFRACTION THEORY VERSUS CLASSICAL DYNAMICAL THEORY" by S.G. Podorov, A. Nazarkin, Recent Res. Devel. Optics, 7 (2009)ISBN 978-81-308-0370-8
  3. ^Murthy, N. S.; Minor, H. (1990-06-01). "General procedure for evaluating amorphous scattering and crystallinity from X-ray diffraction scans of semicrystalline polymers".Polymer.31 (6):996–1002.doi:10.1016/0032-3861(90)90243-R.ISSN 0032-3861.
Characteristics
Sources and instruments
Interaction with matter
Applications
Imaging
Spectroscopy
Scattering
Others


Stub icon

Thisscattering–related article is astub. You can help Wikipedia byexpanding it.

Stub icon

Thisspectroscopy-related article is astub. You can help Wikipedia byexpanding it.

Retrieved from "https://en.wikipedia.org/w/index.php?title=Wide-angle_X-ray_scattering&oldid=1144427735"
Categories:
Hidden categories:

[8]ページ先頭

©2009-2025 Movatter.jp