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Home> Journals> J. Electron. Imag.> Volume 27> Issue 5>Article
25 September 2018Microsphere rapid positioning and contour evaluation in a microvisual environment
Guohua Liu,Jinxin Li
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Guohua Liu,1 Jinxin Li1

1Tianjin Polytechnic Univ. (China)
Funded by:Tianjin science and technology project
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Abstract
In microvision, the efficiency of image analysis is reduced by low signal-to-noise ratios, large amounts of data, and target over-concentration. Processing speeds can be optimized by introducing a biomimetic visual attention mechanism; however, the most mature attention mechanisms are not fully applicable to microvision environments. They rely on pixels, and this reliance significantly limits processing speeds. Therefore, we propose a fast attention mechanism based on the visual-entropy value and a method of evaluating the difference-entropy convergence of the target contour. We have performed a theoretical analysis, a large quantity of data sampling, and comparisons of multiple experiments. Given a fixed field of view, the visual-entropy attention mechanism can quickly locate the target area, and thus is highly suitable to a microvision environment. The difference-entropy convergence evaluation method can effectively distinguish a special, damaged target.
© 2018 SPIE and IS&T 1017-9909/2018/$25.00 © 2018 SPIE and IS&T
Guohua Liu andJinxin Li"Microsphere rapid positioning and contour evaluation in a microvisual environment," Journal of Electronic Imaging 27(5), 053014 (25 September 2018).https://doi.org/10.1117/1.JEI.27.5.053014
Received: 6 April 2018; Accepted: 27 August 2018; Published: 25 September 2018
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Cited by 1 scholarly publication and 1 patent.
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KEYWORDS
Microspheres

Visualization

Image processing

Lithium

Biomimetics

Detection and tracking algorithms

Fourier transforms

Image information entropy

Signal to noise ratio

Visual process modeling

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Guohua Liu, Jinxin Li, "Microsphere rapid positioning and contour evaluation in a microvisual environment," J. Electron. Imag. 27(5) 053014 (25 September 2018) https://doi.org/10.1117/1.JEI.27.5.053014
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