Part ofAdvances in Neural Information Processing Systems 15 (NIPS 2002)
Shih-Chii Liu, Malte Boegershausen, Pascal Suter
We describe a model of short-term synaptic depression that is derived from a silicon circuit implementation. The dynamics of this circuit model are similar to the dynamics of some present theoretical models of short- term depression except that the recovery dynamics of the variable de- scribing the depression is nonlinear and it also depends on the presynap- tic frequency. The equations describing the steady-state and transient re- sponses of this synaptic model fit the experimental results obtained from a fabricated silicon network consisting of leaky integrate-and-fire neu- rons and different types of synapses. We also show experimental data demonstrating the possible computational roles of depression. One pos- sible role of a depressing synapse is that the input can quickly bring the neuron up to threshold when the membrane potential is close to the rest- ing potential.
Requests for name changes in the electronic proceedings will be accepted with no questions asked. However name changes may cause bibliographic tracking issues. Authors are asked to consider this carefully and discuss it with their co-authors prior to requesting a name change in the electronic proceedings.
Use the "Report an Issue" link to request a name change.