Zeinolabedinzadeh, 2024
| Publication | Publication Date | Title |
|---|---|---|
| US7924025B2 (en) | System, device, and method for embedded S-parameter measurement | |
| US9720023B2 (en) | Vector network power meter | |
| US7002335B2 (en) | Method for measuring a three-port device using a two-port vector network analyzer | |
| US6049219A (en) | Signal probing of microwave integrated circuit internal nodes | |
| US20090174415A1 (en) | Method for Calibrating a Real-Time Load-Pull System | |
| Zeinolabedinzadeh | Millimeter-wave and THz Measurement Practices | |
| CN112530825B (en) | On-chip multi-parameter measuring device | |
| Béland et al. | An enhanced on-wafer millimeter-wave noise parameter measurement system | |
| Randa et al. | On-wafer measurements of noise temperature | |
| Gasseling et al. | A new characterization technique of" Four hot S parameters" for the study of nonlinear parametric behaviors of microwave devices | |
| Hakkinen et al. | A frequency mixing and sub-sampling based RF-measurement apparatus for IEEE 1149.4 | |
| Lahdes et al. | 60 GHZ on-wafer noise parameter measurements using cold-source method | |
| CN120254575B (en) | Test system for testing radio frequency characteristics of unit under test and calibration method thereof | |
| CN116599609B (en) | A measuring device and a measuring method for a terahertz superconducting transmission line | |
| Nose et al. | A 0.016 mm $^{2} $, 2.4 GHz RF Signal Quality Measurement Macro for RF Test and Diagnosis | |
| Selby | Voltage measurement at high and microwave frequencies in coaxial systems | |
| Velychko et al. | Metrological Traceability of Power Measurements at Microwave Frequencies | |
| Khoee et al. | An embedded calibration structure for mm-wave multi-probe reflectometers | |
| CiHui et al. | Novel Detection Model for Wideband Noise Figure Measurement with Power Method | |
| Belkhadra et al. | An integrated miniaturized VNA for on-chip PA mismatch measurement | |
| Morris | The Unique Challenges of GaN Amplifier Production Test. | |
| Zhang et al. | On-line calibration and power optimization of RF systems using a built-in detector | |
| Ledingham et al. | Analog Test Bus Structure for Wide-Bandwidth High-Frequency Measurements | |
| Cacho et al. | Robustness Assessment Through 77GHz Operating Life Test of Power Amplifier for Radar Applications in 28nm FD-SOI CMOS | |
| Zielska et al. | A true differential characterization of a 80 ghz low power wideband receiver chip for microwave imaging application |