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WO2008153127A1 - Instrument for examining/measuring object to be measured - Google Patents

Instrument for examining/measuring object to be measuredDownload PDF

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Publication number
WO2008153127A1
WO2008153127A1PCT/JP2008/060843JP2008060843WWO2008153127A1WO 2008153127 A1WO2008153127 A1WO 2008153127A1JP 2008060843 WJP2008060843 WJP 2008060843WWO 2008153127 A1WO2008153127 A1WO 2008153127A1
Authority
WO
WIPO (PCT)
Prior art keywords
imaging units
calculating
distance
unit
examining
Prior art date
Application number
PCT/JP2008/060843
Other languages
French (fr)
Japanese (ja)
Inventor
Tetsuro Aikawa
Yoshinori Satoh
Tatsuya Oodake
Naruhiko Mukai
Hisashi Hozumi
Yasuhiro Yuguchi
Original Assignee
Kabushiki Kaisha Toshiba
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kabushiki Kaisha ToshibafiledCriticalKabushiki Kaisha Toshiba
Priority to US12/664,749priorityCriticalpatent/US8483444B2/en
Priority to KR1020097026055Aprioritypatent/KR101204486B1/en
Priority to JP2009519316Aprioritypatent/JP5112432B2/en
Priority to EP08777204.2Aprioritypatent/EP2163847B1/en
Publication of WO2008153127A1publicationCriticalpatent/WO2008153127A1/en

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Abstract

An instrument for examining/measuring an object to be measured comprises a distance measuring device having a light projecting unit for projecting a two-dimensional optical pattern onto a measurement target of the object, imaging units adapted to image the object and arranged stereoscopically and a drive unit for rotating the posture of at least one of the imaging units and controlling the parallax angle between the imaging units and a distance calculating device having a work distance control unit for controlling the drive unit and thereby adjusting the position where the optical axes of the imaging units cross each other, a corresponding position calculating unit for calculating the corresponding positions of the same region of the images picked up by the imaging units, and a distance calculating unit for calculating the distance to the measurement target of the object from the result of the calculation by the corresponding position calculating unit.
PCT/JP2008/0608432007-06-152008-06-13Instrument for examining/measuring object to be measuredWO2008153127A1 (en)

Priority Applications (4)

Application NumberPriority DateFiling DateTitle
US12/664,749US8483444B2 (en)2007-06-152008-06-13Apparatus for inspecting and measuring object to be measured
KR1020097026055AKR101204486B1 (en)2007-06-152008-06-13Instrument for examining/measuring object to be measured
JP2009519316AJP5112432B2 (en)2007-06-152008-06-13 Device for inspection and measurement of measured objects
EP08777204.2AEP2163847B1 (en)2007-06-152008-06-13Instrument for examining/measuring an object to be measured

Applications Claiming Priority (2)

Application NumberPriority DateFiling DateTitle
JP20071591422007-06-15
JP2007-1591422007-06-15

Publications (1)

Publication NumberPublication Date
WO2008153127A1true WO2008153127A1 (en)2008-12-18

Family

ID=40129730

Family Applications (1)

Application NumberTitlePriority DateFiling Date
PCT/JP2008/060843WO2008153127A1 (en)2007-06-152008-06-13Instrument for examining/measuring object to be measured

Country Status (5)

CountryLink
US (1)US8483444B2 (en)
EP (1)EP2163847B1 (en)
JP (1)JP5112432B2 (en)
KR (1)KR101204486B1 (en)
WO (1)WO2008153127A1 (en)

Cited By (25)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
JP2013007722A (en)*2011-06-272013-01-10Toshiba CorpThree-dimensional measuring device and method for the same
JP2014106167A (en)*2012-11-292014-06-09Hitachi LtdLaser projection method and laser projection device
CN104075688A (en)*2013-03-292014-10-01中原工学院Distance measurement method of binocular stereoscopic gazing monitoring system
JP2015537228A (en)*2012-12-142015-12-24ファロ テクノロジーズ インコーポレーテッド Apparatus for optically scanning and measuring the surrounding environment
CN105758366A (en)*2015-08-242016-07-13江苏理工学院Novel three-dimensional laser scanning equipment
CN105758373A (en)*2015-08-242016-07-13江苏理工学院Novel range finder
CN105758299A (en)*2015-08-242016-07-13江苏理工学院Novel two-dimensional laser scanning equipment
CN105758375A (en)*2015-08-242016-07-13江苏理工学院Simple laser tracking and measuring system
CN105758371A (en)*2015-08-242016-07-13江苏理工学院High-temperature forging measuring equipment
CN105758370A (en)*2015-08-242016-07-13江苏理工学院Laser tracking measurement system
CN105758372A (en)*2015-08-242016-07-13江苏理工学院Distance measuring instrument
CN105758387A (en)*2015-08-242016-07-13江苏理工学院Simple Total Station
CN105758379A (en)*2015-08-242016-07-13江苏理工学院Simple tunnel section instrument
CN105758369A (en)*2015-08-242016-07-13江苏理工学院Laser tracking measurement system
CN105758390A (en)*2015-08-242016-07-13江苏理工学院Novel total station
CN105758367A (en)*2015-08-242016-07-13江苏理工学院Two-dimensional laser scanning equipment
CN105758378A (en)*2015-08-242016-07-13江苏理工学院Novel tunnel section appearance
CN105758388A (en)*2015-08-242016-07-13江苏理工学院Total station
CN105758368A (en)*2015-08-242016-07-13江苏理工学院Novel laser tracking measurement system
CN105758332A (en)*2015-08-242016-07-13江苏理工学院Three-dimensional laser scanning equipment
CN105783860A (en)*2015-08-242016-07-20江苏理工学院Simple two-dimensional laser scanning equipment
EP2488825A4 (en)*2009-10-172017-08-16Hermary Opto Electronics Inc.Enhanced imaging method and apparatus
US9964402B2 (en)2015-04-242018-05-08Faro Technologies, Inc.Two-camera triangulation scanner with detachable coupling mechanism
CN111457886A (en)*2020-04-012020-07-28北京迈格威科技有限公司Distance determination method, device and system
KR20210027461A (en)*2018-08-062021-03-10베이징 쿠앙쉬 테크놀로지 씨오., 엘티디. Image processing method and apparatus and image processing device

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US20110044544A1 (en)*2006-04-242011-02-24PixArt Imaging Incorporation, R.O.C.Method and system for recognizing objects in an image based on characteristics of the objects
US20100141734A1 (en)*2008-10-282010-06-10Hitachi Maxell, Ltd.Imaging apparatus and optical axis correction method of imaging apparatus
US8926954B2 (en)2009-02-092015-01-06L'oreal S.A.Wave composition containing a bisulfite compound, a sulfate compound, and a phenol
JP5337658B2 (en)*2009-10-022013-11-06株式会社トプコン Wide-angle imaging device and measurement system
KR101281454B1 (en)*2010-10-132013-07-03주식회사 고영테크놀러지Inspection apparatus and compensating method thereof
US20120162412A1 (en)*2010-12-222012-06-28Electronics And Telecommunications Research InstituteImage matting apparatus using multiple cameras and method of generating alpha maps
CN103415807B (en)*2011-03-022017-03-08富士胶片株式会社Stereo image shooting device
TW201245768A (en)2011-03-292012-11-16Sony CorpImage pickup apparatus, image pickup device, image processing method, aperture control method, and program
KR20120132342A (en)*2011-05-252012-12-05삼성전자주식회사Apparatus and method for removing vocal signal
US10319484B1 (en)2011-11-172019-06-11Nuscale Power, LlcMethod for imaging a nuclear reactor
CA2875266C (en)2012-06-182022-01-11Collineo Inc.Remote visual inspection system and method
US9644942B2 (en)*2012-11-292017-05-09Mitsubishi Hitachi Power Systems, Ltd.Method and apparatus for laser projection, and machining method
FR3012215B1 (en)*2013-10-182018-01-19Hexagon Metrology Sas EASY SCALE SCANNER
KR102219739B1 (en)*2014-01-292021-02-24엘지이노텍 주식회사Camera module
US10156438B2 (en)*2014-08-152018-12-18Fugro N.V.Underwater laser based modeling device
US10027928B2 (en)*2014-10-282018-07-17Exnodes Inc.Multiple camera computational wafer inspection
KR101671736B1 (en)*2015-06-022016-11-03한국생산기술연구원Optical Inspection for Carbon Fiber Reinforced Plastics
US11143504B2 (en)*2015-11-162021-10-12Sony Semiconductor Solutions CorporationImage capture device and image capture system
US10480928B2 (en)2016-08-232019-11-19Datalogic Usa, Inc.Parallax-based determination of dimension(s) related to an object
FR3055155A1 (en)*2017-01-102018-02-23Celette France MEASURING SYSTEM
CN110969159B (en)*2019-11-082023-08-08北京字节跳动网络技术有限公司Image recognition method and device and electronic equipment
CN212623504U (en)*2020-06-082021-02-26三赢科技（深圳）有限公司Structured light projector
CN112361962B (en)*2020-11-252022-05-03天目爱视（北京）科技有限公司Intelligent visual 3D information acquisition equipment of many every single move angles
CN113189602A (en)*2021-03-252021-07-30成都中信华瑞科技有限公司Motion imaging compensation device and motion compensation method
CN114111589B (en)*2021-11-192024-05-28南方海洋科学与工程广东省实验室(湛江)Net-based underwater ranging method, ranging system and storage medium

Citations (10)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
JPS59112207A (en)*1982-12-201984-06-28Hitachi Ltd 2D position detection device
JPS60125515A (en)*1983-12-121985-07-04Toshiba CorpStereo camera device
JPH08243962A (en)*1995-03-141996-09-24Tokyo Electric Power Co Inc:The Range finder
JPH09318351A (en)*1996-05-241997-12-12Kokusai Electric Co Ltd Distance measuring device and object size measuring method
JPH10227623A (en)*1996-08-211998-08-25Komatsu Ltd Semiconductor package inspection equipment
JP2001194127A (en)*1999-05-132001-07-19Shiseido Co Ltd Three-dimensional shape measuring device, three-dimensional shape measuring method, and automatic detection system for shape, strain, and stress of facial wrinkles
JP2001208522A (en)*2000-01-242001-08-03Sony CorpDistance image generator, distance image generation method and program supply medium
JP2005326324A (en)*2004-05-172005-11-24Toshiba Corp Apparatus surface roughness measuring apparatus and method
JP2006285183A (en)*2004-08-252006-10-19Fuji Photo Film Co LtdOptical element and image taking apparatus
JP2007120993A (en)*2005-10-252007-05-17Tokyo Institute Of Technology Object shape measuring device

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
GB9200828D0 (en)*1992-01-151992-03-11Image Research LtdImprovements in and relating to material identification using x-rays
JP3378401B2 (en)*1994-08-302003-02-17株式会社日立メディコ X-ray equipment
US6005965A (en)1997-04-071999-12-21Komatsu Ltd.Inspection apparatus for semiconductor packages
US6897966B2 (en)*2001-05-252005-05-24Poster-Miller, Inc.Non-contacting mensuration system
JP3984018B2 (en)2001-10-152007-09-26ペンタックス株式会社 3D image detection apparatus and 3D image detection adapter
JP3941631B2 (en)2002-08-162007-07-04富士ゼロックス株式会社 Three-dimensional imaging apparatus and method
US7257237B1 (en)*2003-03-072007-08-14Sandia CorporationReal time markerless motion tracking using linked kinematic chains
CA2529498A1 (en)*2003-07-242005-02-03Cognitens Ltd.Method and sytem for the three-dimensional surface reconstruction of an object
JP2006078291A (en)2004-09-082006-03-23Tokyo Institute Of Technology Omnidirectional three-dimensional measuring device
WO2008130905A2 (en)*2007-04-172008-10-30Mikos, Ltd.System and method for using three dimensional infrared imaging to provide detailed anatomical structure maps
US8605983B2 (en)*2007-08-172013-12-10Renishaw PlcNon-contact probe
US8320621B2 (en)*2009-12-212012-11-27Microsoft CorporationDepth projector system with integrated VCSEL array

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
JPS59112207A (en)*1982-12-201984-06-28Hitachi Ltd 2D position detection device
JPS60125515A (en)*1983-12-121985-07-04Toshiba CorpStereo camera device
JPH08243962A (en)*1995-03-141996-09-24Tokyo Electric Power Co Inc:The Range finder
JPH09318351A (en)*1996-05-241997-12-12Kokusai Electric Co Ltd Distance measuring device and object size measuring method
JPH10227623A (en)*1996-08-211998-08-25Komatsu Ltd Semiconductor package inspection equipment
JP2001194127A (en)*1999-05-132001-07-19Shiseido Co Ltd Three-dimensional shape measuring device, three-dimensional shape measuring method, and automatic detection system for shape, strain, and stress of facial wrinkles
JP2001208522A (en)*2000-01-242001-08-03Sony CorpDistance image generator, distance image generation method and program supply medium
JP2005326324A (en)*2004-05-172005-11-24Toshiba Corp Apparatus surface roughness measuring apparatus and method
JP2006285183A (en)*2004-08-252006-10-19Fuji Photo Film Co LtdOptical element and image taking apparatus
JP2007120993A (en)*2005-10-252007-05-17Tokyo Institute Of Technology Object shape measuring device

Cited By (36)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
EP2488825A4 (en)*2009-10-172017-08-16Hermary Opto Electronics Inc.Enhanced imaging method and apparatus
JP2013007722A (en)*2011-06-272013-01-10Toshiba CorpThree-dimensional measuring device and method for the same
JP2014106167A (en)*2012-11-292014-06-09Hitachi LtdLaser projection method and laser projection device
JP2015537228A (en)*2012-12-142015-12-24ファロ テクノロジーズ インコーポレーテッド Apparatus for optically scanning and measuring the surrounding environment
US9858682B2 (en)2012-12-142018-01-02Faro Technologies, Inc.Device for optically scanning and measuring an environment
CN104075688A (en)*2013-03-292014-10-01中原工学院Distance measurement method of binocular stereoscopic gazing monitoring system
US11262194B2 (en)2015-04-242022-03-01Faro Technologies, Inc.Triangulation scanner with blue-light projector
US10866089B2 (en)2015-04-242020-12-15Faro Technologies, Inc.Two-camera triangulation scanner with detachable coupling mechanism
US10444009B2 (en)2015-04-242019-10-15Faro Technologies, Inc.Two-camera triangulation scanner with detachable coupling mechanism
US9964402B2 (en)2015-04-242018-05-08Faro Technologies, Inc.Two-camera triangulation scanner with detachable coupling mechanism
CN105758368A (en)*2015-08-242016-07-13江苏理工学院Novel laser tracking measurement system
CN105758375A (en)*2015-08-242016-07-13江苏理工学院Simple laser tracking and measuring system
CN105758379A (en)*2015-08-242016-07-13江苏理工学院Simple tunnel section instrument
CN105758369A (en)*2015-08-242016-07-13江苏理工学院Laser tracking measurement system
CN105758390A (en)*2015-08-242016-07-13江苏理工学院Novel total station
CN105758367A (en)*2015-08-242016-07-13江苏理工学院Two-dimensional laser scanning equipment
CN105758378A (en)*2015-08-242016-07-13江苏理工学院Novel tunnel section appearance
CN105758388A (en)*2015-08-242016-07-13江苏理工学院Total station
CN105758372A (en)*2015-08-242016-07-13江苏理工学院Distance measuring instrument
CN105758332A (en)*2015-08-242016-07-13江苏理工学院Three-dimensional laser scanning equipment
CN105783860A (en)*2015-08-242016-07-20江苏理工学院Simple two-dimensional laser scanning equipment
CN105758370A (en)*2015-08-242016-07-13江苏理工学院Laser tracking measurement system
CN105758371A (en)*2015-08-242016-07-13江苏理工学院High-temperature forging measuring equipment
CN105758387A (en)*2015-08-242016-07-13江苏理工学院Simple Total Station
CN105758299B (en)*2015-08-242019-01-01江苏理工学院New Two Dimensional Laser Scanning Equipment
CN105758369B (en)*2015-08-242019-01-25江苏理工学院 Laser tracking measurement system
CN105758370B (en)*2015-08-242019-01-25江苏理工学院 A laser tracking measurement system
CN105758371B (en)*2015-08-242019-01-25江苏理工学院 A kind of high temperature forging measuring equipment
CN105758388B (en)*2015-08-242019-01-25江苏理工学院 a total station
CN105758299A (en)*2015-08-242016-07-13江苏理工学院Novel two-dimensional laser scanning equipment
CN105758366A (en)*2015-08-242016-07-13江苏理工学院Novel three-dimensional laser scanning equipment
CN105758373A (en)*2015-08-242016-07-13江苏理工学院Novel range finder
KR20210027461A (en)*2018-08-062021-03-10베이징 쿠앙쉬 테크놀로지 씨오., 엘티디. Image processing method and apparatus and image processing device
KR102586009B1 (en)*2018-08-062023-10-10베이징 쿠앙쉬 테크놀로지 씨오., 엘티디. Image processing method and apparatus and image processing device
CN111457886A (en)*2020-04-012020-07-28北京迈格威科技有限公司Distance determination method, device and system
CN111457886B (en)*2020-04-012022-06-21北京迈格威科技有限公司Distance determination method, device and system

Also Published As

Publication numberPublication date
JP5112432B2 (en)2013-01-09
EP2163847A4 (en)2012-08-15
KR101204486B1 (en)2012-11-26
US20100183197A1 (en)2010-07-22
US8483444B2 (en)2013-07-09
KR20100007999A (en)2010-01-22
EP2163847A1 (en)2010-03-17
EP2163847B1 (en)2013-10-16
JPWO2008153127A1 (en)2010-08-26

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