USRE37769E1 - Methods for fabricating memory cells and load elements - Google Patents
Methods for fabricating memory cells and load elementsDownload PDFInfo
- Publication number
- USRE37769E1 USRE37769E1US08/316,035US31603594AUSRE37769EUS RE37769 E1USRE37769 E1US RE37769E1US 31603594 AUS31603594 AUS 31603594AUS RE37769 EUSRE37769 EUS RE37769E
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
- H01L23/532—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body characterised by the materials
- H01L23/53204—Conductive materials
- H01L23/53271—Conductive materials containing semiconductor material, e.g. polysilicon
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
- H01L23/5226—Via connections in a multilevel interconnection structure
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/019—Contacts of silicides
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24802—Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.]
- Y10T428/24917—Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.] including metal layer
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24802—Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.]
- Y10T428/24926—Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.] including ceramic, glass, porcelain or quartz layer
Definitions
- the present inventionis related generally to integrated circuits, and more specifically to a contact between different layers of polycrystalline silicon interconnect.
- An ohmic contactis one in which no P-N junction is formed.
- a contact structureprovides electrical contact between two polycrystalline silicon interconnect layers.
- the lower layerhas a silicide layer on its upper surface.
- the upper polycrystalline silicon layercan be doped with a different conductivity type, and makes the ohmic contact with the silicided region of the lower polycrystalline silicon layer.
- FIGS. 1-3illustrate a preferred method for forming a contact according to the present invention.
- FIG. 4is a schematic diagram of the SRAM cell utilizing an ohmic contact formed according to the present invention.
- a semiconductor substrate 10is partially covered with an oxide layer 12 .
- the oxide layer 12is not complete over the entire surface of the substrate 10 , but that portion of interest to the present description has no openings to the substrate 10 .
- a polycrystalline silicon layer 14lies on the oxide layer 12 .
- layer 14is doped N-type.
- the polycrystalline silicon layer 14has been silicided to form a silicide layer 16 thereon.
- the polycrystalline silicon 14 and silicide layer 16have been patterned in a previous processing step as known in the art to form a signal line.
- the polycrystalline silicon layer 14may be a first polycrystalline silicon layer, such as commonly used to form gate electrodes of field effect devices.
- polycrystalline silicon layer 14may be a second or later level used for interconnect between different portions of an integrated circuit device. At the processing stage shown in FIG. 1, the transistors of the device have already been formed.
- Oxide layer 18is typically a thin oxide layer, having a thickness of between 500 and 1000 angstroms.
- the thickness of oxide layer 18may be any thickness which is compatible with the fabrication process with which the invention described herein is being used.
- oxide layer 18is patterned and etched to define a contact opening 20 to the upper surface of the silicide layer 16 .
- a layer of polycrystalline silicon 22is then deposited over the surface of the device.
- a light dosage of boronis implanted into the polycrystalline silicon layer 22 in order to convert it to a P-type conductor.
- a typical dosagewould be approximately 10 13 atoms/cm 2 .
- the polycrystalline silicon layer 22is then masked, and a heavy arsenic implant made to define an N + region 24 .
- a typical dosage for such implantis 5 ⁇ 10 15 atoms/cm 2 .
- Such doping levelis used to allow the N + region 24 to be used as a power supply line.
- a P-N junction 26is formed at the interface between the N + region 24 and the lightly P-doped polycrystalline silicon layer 22 .
- the doping of polycrystalline silicon layer 22is low enough to define a resistor, but is sufficiently high to cause degeneration in the contact opening 20 , providing an ohmic contact between the polycrystalline silicon layer 22 and the silicide layer 16 .
- the polycrystalline silicon layer 14is N-type, no P-N junction is formed at the contact between the two layers 14 , 22 .
- the polycrystalline silicon layer 22is etched to define interconnect, leaving the structure shown in FIG. 3 .
- the deviceis then ready for formation of further oxide and interconnect levels as desired.
- FIG. 4a 4-transistor SRAM cell is shown.
- the contact structure formed in FIG. 1-3is suitable for use as a load element in the cell of FIG. 4 .
- Cross-coupled field effect devices 30 , 32form the basis of the SRAM cell.
- Access transistors 34 , 36connect the bit line BL and complemented bit line BL′ to common nodes 38 , 40 , respectively.
- Access transistors 34 , 36are driven by the word line 42 as known in the art.
- Node 38is connected to the power supply line V cc through resistor 44 and diode 46 .
- Node 40is connected to V cc through resistor 48 and diode 50 .
- Node 38corresponds to contact opening 20 in FIG. 3 .
- Resistor 44corresponds to polycrystalline silicon region 22 of FIG. 3, with diode 46 being formed at the junction 26 .
- Node 40 , resistor 48 , and diode 50correspond to FIG. 3 in a similar manner.
- the load for the SRAM cellis formed by a resistor and a diode rather than back-to-back polycrystalline silicon diodes. In some SRAM cell designs, this can provide improved performance over the use of a resistor alone, or back-to-back polycrystalline silicon diodes.
- a similar ohmic contactcan be formed between a lower polycrystalline silicon layer which is doped P-type and an upper N-type layer.
- the silicide layerprevents formation of a P-N junction in the contact opening.
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Semiconductor Memories (AREA)
- Electrodes Of Semiconductors (AREA)
Abstract
Description
1. Field of the Invention
The present invention is related generally to integrated circuits, and more specifically to a contact between different layers of polycrystalline silicon interconnect.
2. Description of the Prior Art
In semiconductor circuits, it is known that ohmic contacts are desirable between interconnect layers. An ohmic contact is one in which no P-N junction is formed.
When polycrystalline silicon interconnect lines having different conductivity types make contact, a P-N junction is formed. A similar junction can be formed when polycrystalline silicon having the same conductivity type, but very different doping levels (such as N−− to N+) make contact. For various reasons, it is often desirable to have interconnect having different conductivity types make contact, and it would be desirable to provide an ohmic contact for such structures.
It is therefore an object of the present invention to provide an ohmic contact between polycrystalline silicon interconnect layers having different conductivity types.
It is another object of the present invention to provide such a contact which is easily formed with a process compatible with existing process technologies.
It is a further object of the present invention to provide such a contact which is suitable for use in an SRAM structure to provide a load.
Therefore, according to the present invention, a contact structure provides electrical contact between two polycrystalline silicon interconnect layers. The lower layer has a silicide layer on its upper surface. The upper polycrystalline silicon layer can be doped with a different conductivity type, and makes the ohmic contact with the silicided region of the lower polycrystalline silicon layer.
The novel features believed characteristic of the invention are set forth in the appended claims. The invention itself however, as well as a preferred mode of use, and further objects and advantages thereof, will best be understood by reference to the following detailed description of an illustrative embodiment when read in conjunction with the accompanying drawings, wherein:
FIGS. 1-3 illustrate a preferred method for forming a contact according to the present invention; and
FIG. 4 is a schematic diagram of the SRAM cell utilizing an ohmic contact formed according to the present invention.
The process steps and structures described below do not form a complete process flow for manufacturing integrated circuits. The present invention can be practiced in conjunction with integrated circuit fabrication techniques currently used in the art, and only so much of the commonly practiced process steps are included as are necessary for an understanding of the present invention. The figures representing cross-sections of portions of an integrated circuit during fabrication are not drawn to scale, but instead are drawn so as to illustrate the important features of the invention.
Referring to FIG. 1, asemiconductor substrate 10 is partially covered with anoxide layer 12. Theoxide layer 12 is not complete over the entire surface of thesubstrate 10, but that portion of interest to the present description has no openings to thesubstrate 10.
Apolycrystalline silicon layer 14 lies on theoxide layer 12. In the illustrative embodiment,layer 14 is doped N-type. Thepolycrystalline silicon layer 14 has been silicided to form asilicide layer 16 thereon. Thepolycrystalline silicon 14 andsilicide layer 16 have been patterned in a previous processing step as known in the art to form a signal line. Thepolycrystalline silicon layer 14 may be a first polycrystalline silicon layer, such as commonly used to form gate electrodes of field effect devices. Alternatively,polycrystalline silicon layer 14 may be a second or later level used for interconnect between different portions of an integrated circuit device. At the processing stage shown in FIG. 1, the transistors of the device have already been formed.
Once the polycrystalline silicon andsilicide layers oxide layer 18 is formed over the surface of the device.Oxide layer 18 is typically a thin oxide layer, having a thickness of between 500 and 1000 angstroms. The thickness ofoxide layer 18 may be any thickness which is compatible with the fabrication process with which the invention described herein is being used.
Referring to FIG. 2,oxide layer 18 is patterned and etched to define a contact opening20 to the upper surface of thesilicide layer 16. A layer ofpolycrystalline silicon 22 is then deposited over the surface of the device.
A light dosage of boron is implanted into thepolycrystalline silicon layer 22 in order to convert it to a P-type conductor. A typical dosage would be approximately 1013atoms/cm2.
Referring to FIG. 3, thepolycrystalline silicon layer 22 is then masked, and a heavy arsenic implant made to define an N+region24. A typical dosage for such implant is 5×1015atoms/cm2. Such doping level is used to allow the N+region24 to be used as a power supply line.
AP-N junction 26 is formed at the interface between the N+region24 and the lightly P-dopedpolycrystalline silicon layer 22. The doping ofpolycrystalline silicon layer 22 is low enough to define a resistor, but is sufficiently high to cause degeneration in the contact opening20, providing an ohmic contact between thepolycrystalline silicon layer 22 and thesilicide layer 16. Thus, although thepolycrystalline silicon layer 14 is N-type, no P-N junction is formed at the contact between the twolayers
After formation of the highly doped N+regions24, thepolycrystalline silicon layer 22 is etched to define interconnect, leaving the structure shown in FIG.3. The device is then ready for formation of further oxide and interconnect levels as desired.
Referring to FIG. 4, a 4-transistor SRAM cell is shown. The contact structure formed in FIG. 1-3 is suitable for use as a load element in the cell of FIG.4.
Cross-coupledfield effect devices Access transistors common nodes Access transistors word line 42 as known in the art. Node38 is connected to the power supply line Vccthroughresistor 44 anddiode 46.Node 40 is connected to Vccthroughresistor 48 and diode50.
Since the contact atcontact opening 20, corresponding tonodes
A similar ohmic contact can be formed between a lower polycrystalline silicon layer which is doped P-type and an upper N-type layer. The silicide layer prevents formation of a P-N junction in the contact opening.
While the invention has been particularly shown and described with reference to a preferred embodiment, it will be understood by those skilled in the art that various changes in form and detail may be made therein without departing from the spirit and scope of the invention.
Claims (20)
1. A method for forming a contact in a semiconductor integrated circuit device, comprising the steps of:
forming a first polycrystalline silicon interconnect layer having a first conductivity type;
forming a silicide layer on the first polycrystalline silicon interconnect layer;
forming an insulating layer over the entire device;
forming a contact opening in the insulating layer, wherein a contact region on an upper surface of the silicide layer is exposed;
forming a second polycrystalline silicon interconnect layer having a second conductivity type over the insulating layer, wherein the second polycrystalline silicon interconnect layer makes ohmic contact with the silicide layer through the contact opening.
2. The method ofclaim 1 , wherein the first and second conductivity types are the same type, and wherein the second polycrystalline silicon interconnect layer is lightly doped relative to the first polycrystalline silicon interconnect layer.
3. The method ofclaim 1 , wherein the first and second conductivity types are of opposite types.
4. The method ofclaim 1 , wherein the first and second conductivity types are the same type, and wherein the first polycrystalline silicon interconnect layer is lightly doped relative to the second polycrystalline silicon interconnect layer.
5. The method ofclaim 3 , wherein the first conductivity type is N-type, and the second conductivity type is P-type.
6. The method ofclaim 3 , wherein the first conductivity type is P-type, and the second conductivity type is N-type.
7. A method for forming a contact in a semiconductor integrated circuit device, comprising the steps of:
forming a first polycrystalline silicon interconnect lyar having a first conductivity type;
forming a silicide layer on the first polycrystalline silicon interconnect layer;
forming an insulating layer over the entire device;
forming a contact opening in the insulating layer, wherein a contact region on an upper surface of the silicide layer is exposed;
forming a second polycrystalline silicon interconnect layer having a second conductivity type opposite to the first conductivity type over the insulating layer, wherein the second polycrystalline silicon interconnect layer makes ohmic contact with the silicide layer through the contact opening; and
forming a region having the first conductivity type within the second polycrystalline silicon interconnect layer at a location spaced from the contact opening, wherein a P-N junction is formed within the second polycrystalline silicon interconnect layer.
8. A method of fabricating an SRAM cell, comprising the steps of:
fabricating first and second driver transistors and first and second pass transistors, said driver transistors each being N-channel field-effect transistors and having respect gates, sources, and drains;
connecting said gate of said driver transistor to said drain of second driver transistor, and connecting said gate of said second driver transistor to said drain of said first driver transistor, using a polycide layer comprising a lower polysilicon portion which is doped n-type polysilicon and an upper silicide portion;
providing an additional patterned polysilicon layer which includes both heavily doped n-type regions and lightly doped p-type regions,
said heavily doped n-regions of said additional polysilicon layer being connected directly to a positive power supply voltage, and
said lightly doped p-type regions of said additional polysilicon layer making ohmic contact directly to said silicide portion of said polycide layer to provide pull-up connections to said drains of said driver transistors.
9. A product made by the method ofclaim 1 .
10. A product made by the method ofclaim 7 .
11. A product made by the method ofclaim 8 .
12. The method ofclaim 1 , wherein said insulating layer has a thickness in the range of500-1000 Å.
13. The method ofclaim 1 , wherein said second polycrystalline silicon interconnect layer includes1013cm−2implanted atoms of dopant.
14. The method ofclaim 1 , wherein said first polycrystalline silicon interconnect layer includes about5×1015cm−2implanted atoms of dopant.
15. The method ofclaim 7 , wherein the first and second conductivity types are of opposite types.
16. The method ofclaim 7 , wherein said insulating layer has a thickness in the range of500-1000 Å.
17. The method ofclaim 7 , wherein said second polycrystalline silicon interconnect layer, other than said region having the first conductivity type, includes1013cm−2implanted atoms of dopant.
18. The method ofclaim 8 , wherein said additional patterned polysilicon layer includes1013cm−2implanted atoms of dopant.
19. The method ofclaim 8 , wherein said polycide layer includes about5×1015cm−2implanted atoms of dopant.
20. The method ofclaim 8 , wherein said additional patterned polysilicon layer overlies an oxide layer which has a thickness in the range of500-1000 Å.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US08/316,035USRE37769E1 (en) | 1990-04-30 | 1994-09-29 | Methods for fabricating memory cells and load elements |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US07/516,272US5151387A (en) | 1990-04-30 | 1990-04-30 | Polycrystalline silicon contact structure |
| US08/316,035USRE37769E1 (en) | 1990-04-30 | 1994-09-29 | Methods for fabricating memory cells and load elements |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US07/516,272ReissueUS5151387A (en) | 1990-04-30 | 1990-04-30 | Polycrystalline silicon contact structure |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| USRE37769E1true USRE37769E1 (en) | 2002-06-25 |
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ID=24054859
Family Applications (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US07/516,272CeasedUS5151387A (en) | 1990-04-30 | 1990-04-30 | Polycrystalline silicon contact structure |
| US07/843,818Expired - LifetimeUS5279887A (en) | 1990-04-30 | 1992-02-28 | Polycrystalline silicon contact structure |
| US08/316,035Expired - LifetimeUSRE37769E1 (en) | 1990-04-30 | 1994-09-29 | Methods for fabricating memory cells and load elements |
Family Applications Before (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US07/516,272CeasedUS5151387A (en) | 1990-04-30 | 1990-04-30 | Polycrystalline silicon contact structure |
| US07/843,818Expired - LifetimeUS5279887A (en) | 1990-04-30 | 1992-02-28 | Polycrystalline silicon contact structure |
Country Status (5)
| Country | Link |
|---|---|
| US (3) | US5151387A (en) |
| EP (1) | EP0455339B1 (en) |
| JP (1) | JP3064472B2 (en) |
| KR (1) | KR910019137A (en) |
| DE (1) | DE69130622T2 (en) |
Families Citing this family (10)
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|---|---|---|---|---|
| US5204279A (en)* | 1991-06-03 | 1993-04-20 | Sgs-Thomson Microelectronics, Inc. | Method of making SRAM cell and structure with polycrystalline p-channel load devices |
| JPH06275724A (en)* | 1993-01-22 | 1994-09-30 | Mitsubishi Electric Corp | Semiconductor device and manufacture thereof |
| TW230266B (en)* | 1993-01-26 | 1994-09-11 | American Telephone & Telegraph | |
| US5432129A (en)* | 1993-04-29 | 1995-07-11 | Sgs-Thomson Microelectronics, Inc. | Method of forming low resistance contacts at the junction between regions having different conductivity types |
| KR100473308B1 (en)* | 1995-01-31 | 2005-03-14 | 가부시끼가이샤 히다치 세이사꾸쇼 | Nonvolatile memory device |
| US5627103A (en)* | 1995-03-02 | 1997-05-06 | Sony Corporation | Method of thin film transistor formation with split polysilicon deposition |
| US6406984B1 (en) | 1997-10-06 | 2002-06-18 | The United States Of America As Represented By The Secretary Of The Navy | Method of making improved electrical contact to porous silicon using intercalated conductive materials |
| KR100379136B1 (en) | 1998-10-02 | 2003-04-08 | 인터내셔널 비지네스 머신즈 코포레이션 | Beta control using a rapid thermal oxidation |
| US6214694B1 (en)* | 1998-11-17 | 2001-04-10 | International Business Machines Corporation | Process of making densely patterned silicon-on-insulator (SOI) region on a wafer |
| US6429101B1 (en) | 1999-01-29 | 2002-08-06 | International Business Machines Corporation | Method of forming thermally stable polycrystal to single crystal electrical contact structure |
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Also Published As
| Publication number | Publication date |
|---|---|
| DE69130622T2 (en) | 1999-05-06 |
| JP3064472B2 (en) | 2000-07-12 |
| DE69130622D1 (en) | 1999-01-28 |
| EP0455339B1 (en) | 1998-12-16 |
| EP0455339A3 (en) | 1992-06-03 |
| KR910019137A (en) | 1991-11-30 |
| US5151387A (en) | 1992-09-29 |
| EP0455339A2 (en) | 1991-11-06 |
| US5279887A (en) | 1994-01-18 |
| JPH0737885A (en) | 1995-02-07 |
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