Movatterモバイル変換


[0]ホーム

URL:


USRE37124E1 - Ring oscillator using current mirror inverter stages - Google Patents

Ring oscillator using current mirror inverter stages
Download PDF

Info

Publication number
USRE37124E1
USRE37124E1US09/096,693US9669398AUSRE37124EUS RE37124 E1USRE37124 E1US RE37124E1US 9669398 AUS9669398 AUS 9669398AUS RE37124 EUSRE37124 EUS RE37124E
Authority
US
United States
Prior art keywords
transistor
coupled
stage
oscillator
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US09/096,693
Inventor
Trevor K. Monk
Andrew M. Hall
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics lnc USA
Original Assignee
STMicroelectronics Ltd Great Britain
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics Ltd Great BritainfiledCriticalSTMicroelectronics Ltd Great Britain
Priority to US09/096,693priorityCriticalpatent/USRE37124E1/en
Application grantedgrantedCritical
Publication of USRE37124E1publicationCriticalpatent/USRE37124E1/en
Assigned to STMICROELECTRONICS, INC.reassignmentSTMICROELECTRONICS, INC.ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).Assignors: STMICROELECTRONICS LIMITED
Anticipated expirationlegal-statusCritical
Expired - Lifetimelegal-statusCriticalCurrent

Links

Images

Classifications

Definitions

Landscapes

Abstract

A ring oscillator having an odd number of single ended stages, each stage including two transistors connected as a current mirror. The stage provides for low-voltage performance and improved process tolerance characteristics.

Description

FIELD OF THE INVENTION
This invention relates to an oscillator and more particularly to a ring oscillator.
BACKGROUND OF THE INVENTION
New manufacturing processes and new applications are forcing power supplies to lower voltages (3.3 v now, with 2.4 v and 1.5 v being expected soon). Advanced Phase-Locked Loops require stable oscillators which may be varied in frequency by a control signal.
To help achieve frequency stability, oscillators integrated into a noisy VLSI environment often use a regulator to generate a quiet power supply. This usually has to be at an even lower voltage than the normal power supply.
There is thus a desire to provide oscillators which can work at these very low supply voltages and still produce high quality, high frequency output signals.
Reference is made to IBM Technical Disclosure Bulletin, Vol. 31, No. 2, July 1988, pages 154 to 156 “CMOS Ring Oscillator with controlled frequency” which describes a ring oscillator using CMOS transistors and is designed to give an almost sinusoidal output. This design suffers from stability problems outside a narrow range of frequencies. In particular, as the frequency increases, the amplitude decreases and it becomes difficult to convert the signal to CMOS levels.
SUMMARY OF THE INVENTION
According to the present invention there is provided a ring oscillator comprising a plurality of oscillator stages, each stage comprising a first and second transistors. The first transistor has a controllable path connected between an output node and a reference voltage and a control node acting as an input node to the stage. The second transistor has a controllable path connected between the output node and the reference voltage and a control node connected to the output node. The gain of each stage is selectively determined by the ratio of the widths of the first and second transistors to produce an output signal having a sawtooth or trapezoidal waveform. Each stage further comprise a respective current source which controls the speed of the stage and which is connected to the output node. The input node of one stage is connected to the output node of a preceding stage to form a ring and the number of stages is selected so that there is a total phase shift of 360° around the ring at the frequency of operation.
For transistors of the same length, the width of the first transistor can be set to m times the width of the second transistor where m>1 to determine the d.c. gain of the stage. This ratio m determines the shape of the waveform output by the oscillator. The higher the value of m, the more the waveform moves away from a sinusoid. For a three stage oscillator, a ratio of m close to 2 produces a substantially sinusoidal output. The present invention uses a ratio higher than 2 and preferably with a minimum value of 2.5. In practice the smallest value that can be selected to provide an appropriately shaped waveform will be selected. The maximum value of m is limited by practical considerations and particularly layout considerations. A practical maximum value for m is likely to be about 10.
The first and second transistors can be n-channel field effect devices having a gate as the control node and the source-drain path as the controllable path. As the transistors are of the same type, process variations affect the transistors in the same manner. The maximum frequency of operation is limited only by the ratio of gain to gate capacitance.
The current source can comprise a p-channel transistor gated by a control voltage.
The first transistor is preferably operated in its saturation region.
The current sources of each stage can either be controlled by a common control signal or by respective different control signals.
The present oscillator can operate at voltages down to a level just above the threshold voltages of the transistors.
For a better understanding of the present invention and to show how the same may be carried into effect, reference will now be made by way of example to the accompanying drawings.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a circuit diagram of a low-voltage inverting gain stage in MOS technology;
FIG. 1a is a circuit diagram of an implementation of a current source;
FIG. 2 is a circuit diagram of a low-voltage inverting gain stage in bipolar technology;
FIG. 3 is a diagram showing the transistor structure of a ring oscillator;
FIG. 4 is an equivalent logical schematic for FIG. 3; and
FIG. 5 shows typical waveforms for the 3-stage ring oscillator of FIGS.3 and4.
DESCRIPTION OF THE PREFERRED EMBODIMENT
FIG. 1 shows a low-voltage inverting gain stage in MOS technology. The stage comprises first and second transistors T1, T2 which have their drains connected together and their sources connected to ground. The gate of the first transistor T1 acts as the input Sinfor the stage and the gate of the second transistor T2 acts as the output Sout. The gate of the second transistor T2 is connected to its drain. Each stage is controlled by a control current I which is generated by acurrent source2. Thecurrent source2 is connected between a supply voltage Vcc and the drains of the first and second transistors T1,T2. The common node between thecurrent source2 and the drains of the transistors T1 and T2 is denoted4. As shown in FIG. 1a, thecurrent source2 can comprise a p-channel MOS field effect transistor T3 with its source/drain path connected between the supply voltage Vcc and the node4 and its gate connected to receive a control signal V which is taken with respect to the supply voltage Vcc. In the following discussion, it will readily be apparent that where reference is made to the control current I, this can be taken in practice as being derived from the control voltage V. The stage also has capacitance C, the largest component of which is the gate capacitance of the transistors connected to the output Sout.
The ratio of gains of the transistors T1,T2 is indicated as “m”. The value of m controls the relative charge and discharge rates of the output mode Sout, and thus determines the gain of the stage. The speed of the stage (and thus the phaseshift at the frequency of operation) is readily controlled by varying the current I supplied by thecurrent source2.
FIG. 2 shows the low-voltage inverting gain stage in bipolar technology. This also has excellent low-voltage operation characteristics and the speed can be controlled using acurrent source2 in precisely the same way. Although the rest of this specification refers to MOS circuits, it should be understood that the same idea can easily be applied to bipolar technology.
In FIG. 2, the first and second transistors are denoted Ti′ and T2′ and are connected in the same way as for FIG. 1, where gates correspond to bases, drains correspond to collectors and sources correspond to emitters.
FIG. 3 illustrates a 3-stage ring oscillator, the three stages being denoted S1,S2,S3. Each stage S1,S2,S3 is as illustrated in FIG.1. Of course, a similar ring oscillator could be produced using the stages of FIG.2. FIG. 4 shows the ring oscillator in an equivalent logical schematic. Each stage is a so-called single-ended stage, that is with a single input and a single output and is inverting. As is well known in the design of ring oscillators, for oscillation to occur it can be shown that there must be:
(i) an odd number n of stages
(ii) minimum of three stages
(iii) if all stages are identical and have a gain ratio of “m”, then
m>1/cos(pi/n)
where
pi=3.14 . . .
n=number of stages
and
m=gain of each stage
For a 3-stage ring, the formula above gives m>2.
Where the transistors are of the same length, the gain m=W(T1)/W(T2), where W is the width of a transistor.
Thus, by use of an appropriate layout, the parameter m can be made substantially independent of manufacturing process variables which would tend to affect the width of both transistors by corresponding amounts.
The required value for m, and hence the transistor sizes, is selected to satisfy small signal and large signal design requirements to provide a sawtooth or trapezoidal waveform. A system designed to produce these waveforms produces a more stable output amplitude from the oscillator across all operating frequencies. A more stable amplitude over a wide range of operating frequencies provides a signal which can be more reliably and easily converted to CMOS levels over a wide range of frequencies.
FIG. 5 shows the waveforms for the 3-stage oscillator of FIG. 4 when m=3.Node1,node2 andnode3 are denoted N1, N2 and N3 in FIG.4.
The frequency of oscillation of the ring can be controlled by the control current I. In a symmetrical arrangement, each stage has the same phase shift at the frequency of operation (equal to 180°/n for inverting stages) and receives a common control signal so that the control currents I are the same. However, the phase shift can differ for each stage provided that the complete phase shift in the loop is 360° at the frequency of oscillation. In this case, the control currents I for the individual stages can be independently varied.

Claims (25)

We claim:
1. A ring oscillator comprising:
a plurality of oscillator stages, each stage comprising first and second transistors, wherein the first transistor has a controllable path connected between an output node and a reference voltage and a control node acting as an input node to the stage and wherein the second transistor has a controllable path connected between the output node and the reference voltage and a control node connected to the output node, the gain of each stage being selectively determined by the ratio of the widths of the first and second transistors to produce an output signal having a sawtooth or trapezoidal waveform and each stage further comprising a respective current source which controls the speed of the stage and which is connected to said output node, wherein the input node of one stage is connected to the output node of a preceding stage to form said ring oscillator and wherein the number of stages is selected so that there is a total phase shift of 360° around the ring at the frequency of operation.
2. A ring oscillator according to claim1, wherein the first and second transistors are n-channel field effect devices having a gate as the control node and a source/drain path as the controllable path.
3. A ring oscillator according to claim1, wherein the first and second transistors are bipolar transistors in which the base is the control node and the controllable path extends between a collector and emitter.
4. A ring oscillator according to claim1, wherein the current source comprises a p-channel MOS field effect transistor gated by a control voltage.
5. A ring oscillator according to claim2 wherein the current source comprises a p-channel MOS field effect transistor gated by a control voltage.
6. A ring oscillator according to claim3 wherein the current source comprises a p-channel MOS field effect transistor gated by a control voltage.
7. A ring oscillator having improved process tolerance characteristics, said ring oscillator comprising:
a plurality of oscillator stages, each stage having a gain, a speed, and an operation frequency wherein an input node of one stage is coupled to an output node of a preceding stage to form a ring, and wherein the number of stages is selected so there is a total phase shift of 360° around the ring at the operation frequency, each stage including:
a first transistor having a control node, and a path controlled by the control node, the path coupling a reference voltage to the output node of said stage, wherein the control node is coupled to the input node of said stage;
a second transistor having a control node coupled to the output node of said stage and a controllable path which couples the reference voltage to the output node,
wherein the gain of said stage is selectively determined by the ratio of widths of said first transistor and said second transistor, and wherein an output signal of the stage is at least one of a sawtooth waveform and a trapezoidal waveform; and
a current source, which controls the speed of the stage, coupled to the output node.
8. An oscillator for producing a periodic waveform, the oscillator comprising:
a first, a middle, and a last serially coupled stage, each stage having an input terminal and an output terminal and the output terminal of the last stage coupled to the input terminal of the first stage, at least one stage including:
an input transistor coupled between the output terminal and a reference voltage, and having a control terminal coupled to the input terminal,
a second transistor coupled between the output terminal and the reference voltage, and having a control terminal coupled to the output terminal,
a current source coupled to the output terminal, and
wherein a ratio of the gain of the input transistor to the second transistor is greater than2.
9. The oscillator of claim8 wherein the input and second transistors comprise respective MOS transistors and wherein a drain of the input transistor is coupled to the output terminal, a gate of the input transistor is coupled to the input terminal, and wherein both a drain and gate of the second transistor are coupled to the output terminal.
10. The oscillator of claim9 wherein the input and second transistors have respective first and second widths, wherein the ratio of the first width to the second width is greater than2.
11. The oscillator of claim8 wherein the input and second transistors comprise respective bipolar transistors and wherein a collector of the input transistor is coupled to the output terminal, a base of the input transistor is coupled to the input terminal, and wherein both a collector and base of the second transistor are coupled to the output terminal.
12. The oscillator of claim11 wherein the ratio of the gain of the input transistor to the second transistor is a ratio of an area of the input transistor to the area of the second transistor.
13. The oscillator of claim8 wherein the ratio is at least2.5.
14. The oscillator of claim8 wherein the ratio is selected such that at least one of the stages produces a sawtooth waveform at its output terminal.
15. The oscillator of claim8 wherein the ratio is selected such that at least one of the stages produces a trapezoidal waveform at its output terminal.
16. The oscillator of claim8 wherein the current source comprises a PMOS transistor having a drain coupled to the output terminal and having a gate coupled to a control voltage.
17. The oscillator of claim8 wherein the current source comprises a bipolar transistor having a base coupled to a control voltage.
18. The oscillator of claim8 wherein the speed of the at least one stage is controlled by the current source.
19. An oscillator for producing a periodic waveform, the oscillator comprising:
at least three stages each having an input terminal and an output terminal, wherein the input terminal of each stage is coupled to the output terminal of another stage so as to constitute a ring, at least one stage including:
an input transistor coupled between the output terminal and a supply voltage, and having a control terminal coupled to the input terminal,
a second transistor coupled between the output terminal and the supply voltage, and having a control terminal coupled to the output terminal,
a current source coupled to the output terminal, and
wherein a gain of the at least one stage is approximately2.
20. The oscillator of claim19 wherein the input and second transistors comprise respective MOS transistors and wherein a drain of the input transistor is coupled to the output terminal, a gate of the input transistor is coupled to the input terminal, and wherein both a drain and gate of the second transistor are coupled to the output terminal.
21. The oscillator of claim20 wherein the input and second transistors have respective first and second widths, wherein the ratio of the first width to the second width is greater than2.
22. The oscillator of claim19 wherein the input and second transistors comprise respective bipolar transistors and wherein a collector of the input transistor is coupled to the output terminal, a base of the input transistor is coupled to the input terminal, and wherein both a collector and base of the second transistor are coupled to the output terminal.
23. The oscillator of claim22 wherein the ratio of area of the input transistor to the second transistor is greater than2.
24. The oscillator of claim19 wherein the gain is selected such that at least one of the stages produces a sawtooth waveform at its output terminal.
25. The oscillator of claim19 wherein the gain is selected such that at least one of the stages produces a trapezoidal waveform at its output terminal.
US09/096,6931993-04-301994-04-27Ring oscillator using current mirror inverter stagesExpired - LifetimeUSRE37124E1 (en)

Priority Applications (1)

Application NumberPriority DateFiling DateTitle
US09/096,693USRE37124E1 (en)1993-04-301994-04-27Ring oscillator using current mirror inverter stages

Applications Claiming Priority (5)

Application NumberPriority DateFiling DateTitle
GB93089441993-04-30
GB939308944AGB9308944D0 (en)1993-04-301993-04-30Ring oscillator
US09/096,693USRE37124E1 (en)1993-04-301994-04-27Ring oscillator using current mirror inverter stages
US08/360,699US5525938A (en)1993-04-301994-04-27Ring oscillator using current mirror inverter stages
PCT/GB1994/000890WO1994026025A1 (en)1993-04-301994-04-27Ring oscillator

Related Parent Applications (1)

Application NumberTitlePriority DateFiling Date
US08/360,699ReissueUS5525938A (en)1993-04-301994-04-27Ring oscillator using current mirror inverter stages

Publications (1)

Publication NumberPublication Date
USRE37124E1true USRE37124E1 (en)2001-04-03

Family

ID=10734730

Family Applications (5)

Application NumberTitlePriority DateFiling Date
US09/096,693Expired - LifetimeUSRE37124E1 (en)1993-04-301994-04-27Ring oscillator using current mirror inverter stages
US08/360,696Expired - LifetimeUS5635866A (en)1993-04-301994-04-27Frequency Doubler
US08/360,699CeasedUS5525938A (en)1993-04-301994-04-27Ring oscillator using current mirror inverter stages
US08/360,698Expired - LifetimeUS5635877A (en)1993-04-301994-04-27Low voltage high frequency ring oscillator for controling phase-shifted outputs
US08/636,851Expired - LifetimeUS5602514A (en)1993-04-301996-04-23Quadrature oscillator having a variable frequency

Family Applications After (4)

Application NumberTitlePriority DateFiling Date
US08/360,696Expired - LifetimeUS5635866A (en)1993-04-301994-04-27Frequency Doubler
US08/360,699CeasedUS5525938A (en)1993-04-301994-04-27Ring oscillator using current mirror inverter stages
US08/360,698Expired - LifetimeUS5635877A (en)1993-04-301994-04-27Low voltage high frequency ring oscillator for controling phase-shifted outputs
US08/636,851Expired - LifetimeUS5602514A (en)1993-04-301996-04-23Quadrature oscillator having a variable frequency

Country Status (6)

CountryLink
US (5)USRE37124E1 (en)
EP (5)EP0648387A1 (en)
JP (4)JP2980685B2 (en)
DE (4)DE69426498T2 (en)
GB (1)GB9308944D0 (en)
WO (4)WO1994026028A1 (en)

Cited By (24)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US20050052220A1 (en)*2003-09-082005-03-10Burgener Mark L.Low noise charge pump method and apparatus
US20100033226A1 (en)*2008-07-182010-02-11Tae Youn KimLevel shifter with output spike reduction
US20110165759A1 (en)*2007-04-262011-07-07Robert Mark EnglekirkTuning Capacitance to Enhance FET Stack Voltage Withstand
US20110227637A1 (en)*2005-07-112011-09-22Stuber Michael AMethod and Apparatus Improving Gate Oxide Reliability by Controlling Accumulated Charge
US8559907B2 (en)2004-06-232013-10-15Peregrine Semiconductor CorporationIntegrated RF front end with stacked transistor switch
US8583111B2 (en)2001-10-102013-11-12Peregrine Semiconductor CorporationSwitch circuit and method of switching radio frequency signals
US8669804B2 (en)2008-02-282014-03-11Peregrine Semiconductor CorporationDevices and methods for improving voltage handling and/or bi-directionality of stacks of elements when connected between terminals
US8686787B2 (en)2011-05-112014-04-01Peregrine Semiconductor CorporationHigh voltage ring pump with inverter stages and voltage boosting stages
US8742502B2 (en)2005-07-112014-06-03Peregrine Semiconductor CorporationMethod and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink-harmonic wrinkle reduction
US8994452B2 (en)2008-07-182015-03-31Peregrine Semiconductor CorporationLow-noise high efficiency bias generation circuits and method
US9130564B2 (en)2005-07-112015-09-08Peregrine Semiconductor CorporationMethod and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink
US9264053B2 (en)2011-01-182016-02-16Peregrine Semiconductor CorporationVariable frequency charge pump
US9419565B2 (en)2013-03-142016-08-16Peregrine Semiconductor CorporationHot carrier injection compensation
US9590674B2 (en)2012-12-142017-03-07Peregrine Semiconductor CorporationSemiconductor devices with switchable ground-body connection
US9660590B2 (en)2008-07-182017-05-23Peregrine Semiconductor CorporationLow-noise high efficiency bias generation circuits and method
US9831857B2 (en)2015-03-112017-11-28Peregrine Semiconductor CorporationPower splitter with programmable output phase shift
US9948281B2 (en)2016-09-022018-04-17Peregrine Semiconductor CorporationPositive logic digitally tunable capacitor
US10236872B1 (en)2018-03-282019-03-19Psemi CorporationAC coupling modules for bias ladders
US10505530B2 (en)2018-03-282019-12-10Psemi CorporationPositive logic switch with selectable DC blocking circuit
US10804892B2 (en)2005-07-112020-10-13Psemi CorporationCircuit and method for controlling charge injection in radio frequency switches
US10886911B2 (en)2018-03-282021-01-05Psemi CorporationStacked FET switch bias ladders
US11011633B2 (en)2005-07-112021-05-18Psemi CorporationMethod and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink-harmonic wrinkle reduction
USRE48965E1 (en)2005-07-112022-03-08Psemi CorporationMethod and apparatus improving gate oxide reliability by controlling accumulated charge
US11476849B2 (en)2020-01-062022-10-18Psemi CorporationHigh power positive logic switch

Families Citing this family (42)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
GB9308944D0 (en)*1993-04-301993-06-16Inmos LtdRing oscillator
DE4322701C1 (en)*1993-07-071994-08-18Siemens AgCircuit arrangement for a ring oscillator
JP3519143B2 (en)*1994-11-172004-04-12三菱電機株式会社 Current type inverter circuit, current type logic circuit, current type latch circuit, semiconductor integrated circuit, current type ring oscillator, voltage controlled oscillator, and PLL circuit
US5673008A (en)*1995-05-181997-09-30Matsushita Electric Industrial Co., Ltd.Voltage-controlled oscillator and PLL circuit exhibiting high-frequency band operation, linear frequency characteristics, and power-source variation immunity
US5568099A (en)*1995-09-271996-10-22Cirrus Logic, Inc.High frequency differential VCO with common biased clipper
US5877907A (en)*1995-11-221999-03-02Fujitsu LimitedApparatus and method for demodulating data signals read from a recording medium
FR2750268B1 (en)*1996-06-191998-07-31Bull Sa METHOD FOR OBTAINING A VARIABLE FREQUENCY SIGNAL AND VARIABLE DELAY CELL SUITABLE FOR IMPLEMENTING THE METHOD
KR0177586B1 (en)*1996-06-291999-04-01김주용 Oscillator Output Generator
JP3609609B2 (en)*1997-03-192005-01-12コリア インスティテュート オブ サイエンス アンド テクノロジー Organosilane derivative substituted with fluorenyl group and method for producing the same
US5990721A (en)*1997-08-181999-11-23Ncr CorporationHigh-speed synchronous clock generated by standing wave
DE19736857C1 (en)*1997-08-231999-01-07Philips Patentverwaltung Ring oscillator
JP2001523435A (en)*1998-03-042001-11-20コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ Device having an oscillator circuit
US6385442B1 (en)*1998-03-042002-05-07Symbol Technologies, Inc.Multiphase receiver and oscillator
US6091271A (en)*1998-06-302000-07-18Lucent Technologies, Inc.Frequency doubling method and apparatus
US6188291B1 (en)*1999-06-302001-02-13Lucent Technologies, Inc.Injection locked multi-phase signal generator
US6278334B1 (en)*1999-11-292001-08-21Arm LimitedVoltage controlled oscillator with accelerating and decelerating circuits
AU4523501A (en)*1999-12-132001-06-18Broadcom CorporationOscillator having multi-phase complementary outputs
US6348830B1 (en)2000-05-082002-02-19The Regents Of The University Of MichiganSubharmonic double-balanced mixer
US6339346B1 (en)2000-08-302002-01-15United Memories, Inc.Low skew signal generation circuit
US7088188B2 (en)*2001-02-132006-08-08Telefonaktiebolaget Lm Ericsson (Publ)Differential oscillator
US6990164B2 (en)*2001-10-012006-01-24Freescale Semiconductor, Inc.Dual steered frequency synthesizer
US6657502B2 (en)*2001-10-012003-12-02Motorola, Inc.Multiphase voltage controlled oscillator
US7005930B1 (en)*2001-11-142006-02-28Berkana Wireless, Inc.Synchronously coupled oscillator
US6900699B1 (en)2001-11-142005-05-31Berkana Wireless, Inc.Phase synchronous multiple LC tank oscillator
US20040032300A1 (en)*2002-08-192004-02-19Koninklijke Philips Electronics N.V.Multi-phase oscillator and method therefor
US7302011B1 (en)2002-10-162007-11-27Rf Micro Devices, Inc.Quadrature frequency doubling system
KR100533626B1 (en)*2003-04-012005-12-06삼성전기주식회사Quadrature signal generator with feedback type frequency doubler
KR101153911B1 (en)*2003-08-122012-06-08매그나칩 반도체 유한회사Ring Oscillator
US7071789B2 (en)*2004-04-212006-07-04Texas Instruments IncorporatedCross coupled voltage controlled oscillator
FR2879374B1 (en)*2004-12-152007-03-02Commissariat Energie Atomique DOUBLE FREQUENCY DEVICE
US7221204B2 (en)*2005-02-012007-05-22Infineon Technologies AgDuty cycle corrector
US7268635B2 (en)*2005-04-292007-09-11Seiko Epson CorporationCircuits for voltage-controlled ring oscillators and method of generating a periodic signal
JP4623679B2 (en)*2005-05-272011-02-02パナソニック株式会社 Coupled ring oscillator
WO2007063965A1 (en)2005-12-022007-06-07Matsushita Electric Industrial Co., Ltd.Multi-phase oscillator
JP2007188395A (en)*2006-01-162007-07-26Elpida Memory IncClock signal generation circuit
US7683725B2 (en)*2007-08-142010-03-23International Business Machines CorporationSystem for generating a multiple phase clock
US8369820B2 (en)2007-09-052013-02-05General Instrument CorporationFrequency multiplier device
JP4808197B2 (en)2007-09-062011-11-02シャープ株式会社 Optical encoder and electronic device having the same
DE102007059231A1 (en)*2007-12-072009-06-10Polyic Gmbh & Co. Kg Electronic assembly with organic switching elements
US20100045389A1 (en)*2008-08-202010-02-25Pengfei HuRing oscillator
JP6415285B2 (en)*2014-12-082018-10-31セイコーNpc株式会社 Temperature voltage sensor
WO2022101901A1 (en)*2020-11-112022-05-19Ariel Scientific Innovations Ltd.Current mirror circuit for enhancement mode wide bandgap semiconductor

Citations (6)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US3350659A (en)1966-05-181967-10-31Rca CorpLogic gate oscillator
US4210882A (en)1977-09-021980-07-01U.S. Philips CorporationDelay network comprising a chain of all-pass sections
US4368480A (en)1978-04-051983-01-11Massachusetts Institute Of TechnologyMultiplexing of chemically responsive FETs
US4408168A (en)1979-11-291983-10-04Fujitsu LimitedDelay circuit oscillator having unequal on and off times
EP0187572A1 (en)1984-12-041986-07-16Thomson-CsfLogic voltage excursion limiter circuit, and circuit using such an excursion limiter
EP0407082A2 (en)1989-07-071991-01-09STMicroelectronics LimitedClock generation

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US3448387A (en)*1967-01-061969-06-03Us ArmyFrequency doubler
US3382455A (en)*1967-04-031968-05-07Rca CorpLogic gate pulse generator
US3613025A (en)1969-11-051971-10-12Globe Universal SciencesLow pass astable multivibrator
JPS5029270A (en)*1973-07-181975-03-25
US4077010A (en)*1976-12-081978-02-28Motorola, Inc.Digital pulse doubler with 50 percent duty cycle
EP0101896B1 (en)*1982-07-301988-05-18Kabushiki Kaisha ToshibaMos logic circuit
JPS5981914A (en)*1982-11-021984-05-11Nec CorpDigital frequency doubling circuit for clock signal
JPS61163714A (en)*1985-01-141986-07-24Nec CorpFrequency multiplying circuit using delay line
US4737732A (en)*1987-02-241988-04-12Motorola, Inc.Low voltage operational amplifier having a substantially full range output voltage
DE3870680D1 (en)*1987-03-201992-06-11Hitachi Ltd CLOCK SIGNAL SUPPLY SYSTEM.
US5103114A (en)*1990-03-191992-04-07Apple Computer, Inc.Circuit technique for creating predetermined duty cycle
EP0569658B1 (en)*1992-05-151998-08-12STMicroelectronics S.r.l.Signals generator having not-overlapping phases and high frequency
SE515076C2 (en)*1992-07-012001-06-05Ericsson Telefon Ab L M Multiplexer / demultiplexer circuit
JPH06152338A (en)*1992-10-301994-05-31Nec Ic Microcomput Syst LtdMultiplying circuit
GB9308944D0 (en)*1993-04-301993-06-16Inmos LtdRing oscillator
US5399994A (en)*1993-09-301995-03-21Texas Instruments IncorporatedProgrammable voltage-controlled oscillator having control current generating and compensating circuits
US5475322A (en)*1993-10-121995-12-12Wang Laboratories, Inc.Clock frequency multiplying and squaring circuit and method

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US3350659A (en)1966-05-181967-10-31Rca CorpLogic gate oscillator
US4210882A (en)1977-09-021980-07-01U.S. Philips CorporationDelay network comprising a chain of all-pass sections
US4368480A (en)1978-04-051983-01-11Massachusetts Institute Of TechnologyMultiplexing of chemically responsive FETs
US4408168A (en)1979-11-291983-10-04Fujitsu LimitedDelay circuit oscillator having unequal on and off times
EP0187572A1 (en)1984-12-041986-07-16Thomson-CsfLogic voltage excursion limiter circuit, and circuit using such an excursion limiter
EP0407082A2 (en)1989-07-071991-01-09STMicroelectronics LimitedClock generation

Non-Patent Citations (6)

* Cited by examiner, † Cited by third party
Title
Bennett et al., "Sub-Nanosecond Bipolar LSI" 1st I.E.E. European Solid State Circuits Conference, London, GB, pp. 34-35, 1975.
IBM Technical Disclosure Bulletin, 31:(2), pp. 154-156, Jul. 1988.
IBM Technical Disclosure Bulletin, 32:(12), pp. 149-151, May 1990.
Kumar, U. and S.P. Suri, "A simple digital 2n frequency multiplier," Int. J. Electronics 48:(1), pp. 43-45, 1980.
McGahee, T., "Pulse-frequency doubler requires no adjustment," Electronics 48:(8), p. 149, Apr. 17, 1975.
Ware, et al., "THPM 14.1: a 200 MHz CMOS Phase-Locked Loop With Dual Phase Detectors," IEEE International Solid-State Circuits Conference, New York, USA, pp. 192-193 and 338, 1989.

Cited By (57)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US10812068B2 (en)2001-10-102020-10-20Psemi CorporationSwitch circuit and method of switching radio frequency signals
US10797694B2 (en)2001-10-102020-10-06Psemi CorporationSwitch circuit and method of switching radio frequency signals
US9225378B2 (en)2001-10-102015-12-29Peregrine Semiconductor CorpoprationSwitch circuit and method of switching radio frequency signals
US8583111B2 (en)2001-10-102013-11-12Peregrine Semiconductor CorporationSwitch circuit and method of switching radio frequency signals
US20100214010A1 (en)*2003-09-082010-08-26Burgener Mark LLow noise charge pump method and apparatus
US10965276B2 (en)2003-09-082021-03-30Psemi CorporationLow noise charge pump method and apparatus
US8378736B2 (en)2003-09-082013-02-19Peregrine Semiconductor CorporationLow noise charge pump method and apparatus
US9190902B2 (en)2003-09-082015-11-17Peregrine Semiconductor CorporationLow noise charge pump method and apparatus
US20050052220A1 (en)*2003-09-082005-03-10Burgener Mark L.Low noise charge pump method and apparatus
US7719343B2 (en)*2003-09-082010-05-18Peregrine Semiconductor CorporationLow noise charge pump method and apparatus
US9680416B2 (en)2004-06-232017-06-13Peregrine Semiconductor CorporationIntegrated RF front end with stacked transistor switch
US8559907B2 (en)2004-06-232013-10-15Peregrine Semiconductor CorporationIntegrated RF front end with stacked transistor switch
US8649754B2 (en)2004-06-232014-02-11Peregrine Semiconductor CorporationIntegrated RF front end with stacked transistor switch
US9369087B2 (en)2004-06-232016-06-14Peregrine Semiconductor CorporationIntegrated RF front end with stacked transistor switch
US9130564B2 (en)2005-07-112015-09-08Peregrine Semiconductor CorporationMethod and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink
USRE48965E1 (en)2005-07-112022-03-08Psemi CorporationMethod and apparatus improving gate oxide reliability by controlling accumulated charge
US20110227637A1 (en)*2005-07-112011-09-22Stuber Michael AMethod and Apparatus Improving Gate Oxide Reliability by Controlling Accumulated Charge
US11011633B2 (en)2005-07-112021-05-18Psemi CorporationMethod and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink-harmonic wrinkle reduction
US9087899B2 (en)2005-07-112015-07-21Peregrine Semiconductor CorporationMethod and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink-harmonic wrinkle reduction
US9608619B2 (en)2005-07-112017-03-28Peregrine Semiconductor CorporationMethod and apparatus improving gate oxide reliability by controlling accumulated charge
US10804892B2 (en)2005-07-112020-10-13Psemi CorporationCircuit and method for controlling charge injection in radio frequency switches
USRE48944E1 (en)2005-07-112022-02-22Psemi CorporationMethod and apparatus for use in improving linearity of MOSFETS using an accumulated charge sink
US8954902B2 (en)2005-07-112015-02-10Peregrine Semiconductor CorporationMethod and apparatus improving gate oxide reliability by controlling accumulated charge
US12074217B2 (en)2005-07-112024-08-27Psemi CorporationMethod and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink-harmonic wrinkle reduction
US8742502B2 (en)2005-07-112014-06-03Peregrine Semiconductor CorporationMethod and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink-harmonic wrinkle reduction
US9177737B2 (en)2007-04-262015-11-03Peregrine Semiconductor CorporationTuning capacitance to enhance FET stack voltage withstand
US8536636B2 (en)2007-04-262013-09-17Peregrine Semiconductor CorporationTuning capacitance to enhance FET stack voltage withstand
US20110165759A1 (en)*2007-04-262011-07-07Robert Mark EnglekirkTuning Capacitance to Enhance FET Stack Voltage Withstand
US10951210B2 (en)2007-04-262021-03-16Psemi CorporationTuning capacitance to enhance FET stack voltage withstand
US9106227B2 (en)2008-02-282015-08-11Peregrine Semiconductor CorporationDevices and methods for improving voltage handling and/or bi-directionality of stacks of elements when connected between terminals
US11082040B2 (en)2008-02-282021-08-03Psemi CorporationDevices and methods for improving voltage handling and/or bi-directionality of stacks of elements when connected between terminals
US9293262B2 (en)2008-02-282016-03-22Peregrine Semiconductor CorporationDigitally tuned capacitors with tapered and reconfigurable quality factors
US8669804B2 (en)2008-02-282014-03-11Peregrine Semiconductor CorporationDevices and methods for improving voltage handling and/or bi-directionality of stacks of elements when connected between terminals
US9024700B2 (en)2008-02-282015-05-05Peregrine Semiconductor CorporationMethod and apparatus for use in digitally tuning a capacitor in an integrated circuit device
US9197194B2 (en)2008-02-282015-11-24Peregrine Semiconductor CorporationMethods and apparatuses for use in tuning reactance in a circuit device
US11671091B2 (en)2008-02-282023-06-06Psemi CorporationDevices and methods for improving voltage handling and/or bi-directionality of stacks of elements when connected between terminals
US8994452B2 (en)2008-07-182015-03-31Peregrine Semiconductor CorporationLow-noise high efficiency bias generation circuits and method
US9660590B2 (en)2008-07-182017-05-23Peregrine Semiconductor CorporationLow-noise high efficiency bias generation circuits and method
US9030248B2 (en)2008-07-182015-05-12Peregrine Semiconductor CorporationLevel shifter with output spike reduction
US20100033226A1 (en)*2008-07-182010-02-11Tae Youn KimLevel shifter with output spike reduction
US9413362B2 (en)2011-01-182016-08-09Peregrine Semiconductor CorporationDifferential charge pump
US9264053B2 (en)2011-01-182016-02-16Peregrine Semiconductor CorporationVariable frequency charge pump
US8686787B2 (en)2011-05-112014-04-01Peregrine Semiconductor CorporationHigh voltage ring pump with inverter stages and voltage boosting stages
US9354654B2 (en)2011-05-112016-05-31Peregrine Semiconductor CorporationHigh voltage ring pump with inverter stages and voltage boosting stages
US9590674B2 (en)2012-12-142017-03-07Peregrine Semiconductor CorporationSemiconductor devices with switchable ground-body connection
US9419565B2 (en)2013-03-142016-08-16Peregrine Semiconductor CorporationHot carrier injection compensation
US9831857B2 (en)2015-03-112017-11-28Peregrine Semiconductor CorporationPower splitter with programmable output phase shift
US9948281B2 (en)2016-09-022018-04-17Peregrine Semiconductor CorporationPositive logic digitally tunable capacitor
US11018662B2 (en)2018-03-282021-05-25Psemi CorporationAC coupling modules for bias ladders
US10505530B2 (en)2018-03-282019-12-10Psemi CorporationPositive logic switch with selectable DC blocking circuit
US10236872B1 (en)2018-03-282019-03-19Psemi CorporationAC coupling modules for bias ladders
US11418183B2 (en)2018-03-282022-08-16Psemi CorporationAC coupling modules for bias ladders
US10886911B2 (en)2018-03-282021-01-05Psemi CorporationStacked FET switch bias ladders
US11870431B2 (en)2018-03-282024-01-09Psemi CorporationAC coupling modules for bias ladders
US10862473B2 (en)2018-03-282020-12-08Psemi CorporationPositive logic switch with selectable DC blocking circuit
US11476849B2 (en)2020-01-062022-10-18Psemi CorporationHigh power positive logic switch
US12081211B2 (en)2020-01-062024-09-03Psemi CorporationHigh power positive logic switch

Also Published As

Publication numberPublication date
JPH07507914A (en)1995-08-31
DE69404935D1 (en)1997-09-18
WO1994026027A1 (en)1994-11-10
JPH07507435A (en)1995-08-10
DE69404255D1 (en)1997-08-21
EP0749207B1 (en)2000-12-27
EP0648388A1 (en)1995-04-19
DE69404255T2 (en)1997-12-18
GB9308944D0 (en)1993-06-16
EP0648389A1 (en)1995-04-19
EP0648387A1 (en)1995-04-19
EP0648389B1 (en)1997-08-13
EP0749207A3 (en)1997-01-15
US5635866A (en)1997-06-03
US5635877A (en)1997-06-03
EP0749207A2 (en)1996-12-18
DE69426498T2 (en)2001-05-03
DE69421035D1 (en)1999-11-11
JPH07507436A (en)1995-08-10
US5602514A (en)1997-02-11
JP2980685B2 (en)1999-11-22
EP0648388B1 (en)1997-07-16
WO1994026026A1 (en)1994-11-10
DE69426498D1 (en)2001-02-01
DE69421035T2 (en)2000-01-27
US5525938A (en)1996-06-11
JPH07507434A (en)1995-08-10
EP0648386A1 (en)1995-04-19
DE69404935T2 (en)1998-01-22
WO1994026025A1 (en)1994-11-10
EP0648386B1 (en)1999-10-06
WO1994026028A1 (en)1994-11-10

Similar Documents

PublicationPublication DateTitle
USRE37124E1 (en)Ring oscillator using current mirror inverter stages
KR100292574B1 (en) Cascode Switched Charge Pump Circuit
US6275117B1 (en)Circuit and method for controlling an output of a ring oscillator
US6255888B1 (en)Level shift circuit
US5357217A (en)Signals generator having non-overlapping phases and high frequency
US5300898A (en)High speed current/voltage controlled ring oscillator circuit
US6252467B1 (en)Voltage controlled oscillator including a plurality of differential amplifiers
US20040032300A1 (en)Multi-phase oscillator and method therefor
EP0936736B1 (en)Delay elements arranged for a signal controlled oscillator
US5714912A (en)VCO supply voltage regulator
US4947140A (en)Voltage controlled oscillator using differential CMOS circuit
US6794905B2 (en)CMOS inverter
US5945883A (en)Voltage controlled ring oscillator stabilized against supply voltage fluctuations
KR100214548B1 (en)Voltage controlled oscillator
JPH08102646A (en)Voltage controlled oscillator device
US20090021313A1 (en)Voltage controlled oscillator capable of operating in a wide frequency range
US6404295B1 (en)Voltage controlled oscillator with linear input voltage characteristics
US11637549B2 (en)Replica circuit and oscillator including the same
US6414556B1 (en)Voltage controlled oscillator having an oscillation frequency variation minimized in comparison with a power supply voltage variation
US6255881B1 (en)High tunability CMOS delay element
CN117254775B (en)Self-bias oscillating circuit
US6593820B2 (en)High frequency voltage controlled oscillator
US20250070787A1 (en)Loop filter used in pll, and pll
JPS63288514A (en)Waveform shaping circuit
JPH06291617A (en)Voltage controlled oscillator

Legal Events

DateCodeTitleDescription
FEPPFee payment procedure

Free format text:PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

ASAssignment

Owner name:STMICROELECTRONICS, INC., TEXAS

Free format text:ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:STMICROELECTRONICS LIMITED;REEL/FRAME:013496/0067

Effective date:20021030

FPAYFee payment

Year of fee payment:8

FEPPFee payment procedure

Free format text:PAYER NUMBER DE-ASSIGNED (ORIGINAL EVENT CODE: RMPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

Free format text:PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

FPAYFee payment

Year of fee payment:12


[8]ページ先頭

©2009-2025 Movatter.jp