Movatterモバイル変換


[0]ホーム

URL:


USD991814S1 - Spectrum analyzer - Google Patents

Spectrum analyzer
Download PDF

Info

Publication number
USD991814S1
USD991814S1US29/857,732US202229857732FUSD991814SUS D991814 S1USD991814 S1US D991814S1US 202229857732 FUS202229857732 FUS 202229857732FUS D991814 SUSD991814 SUS D991814S
Authority
US
United States
Prior art keywords
spectrum analyzer
design
view
spectrum
broken line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/857,732
Inventor
Daisuke Sato
Gentarou ISHIHARA
Ayako KOUNO
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Yokogawa Test and Measurement Corp
Original Assignee
Yokogawa Electric Corp
Yokogawa Test and Measurement Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp, Yokogawa Test and Measurement CorpfiledCriticalYokogawa Electric Corp
Priority to US29/857,732priorityCriticalpatent/USD991814S1/en
Application grantedgrantedCritical
Publication of USD991814S1publicationCriticalpatent/USD991814S1/en
Activelegal-statusCriticalCurrent
Anticipated expirationlegal-statusCritical

Links

Images

Description

The file of this patent contains at least one drawing/photograph executed in color. Copies of this patent with color drawing(s)/photograph(s) will be provided by the Office upon request and payment of the necessary fee.
FIG.1 is a front view of a spectrum analyzer showing our new design;
FIG.2 is a right side view thereof, the left side view being a mirror image; and,
FIG.3 is a top view thereof.
The broken line gridded portion forms part of the claimed design.
The broken lines outside the gridded area depict portions of the spectrum analyzer which form no part of the claimed design.
The broken line text forms no part of the claimed design.

Claims (1)

    CLAIM
  1. The ornamental design for a spectrum analyzer, as shown and described.
US29/857,7322021-04-262022-10-25Spectrum analyzerActiveUSD991814S1 (en)

Priority Applications (1)

Application NumberPriority DateFiling DateTitle
US29/857,732USD991814S1 (en)2021-04-262022-10-25Spectrum analyzer

Applications Claiming Priority (2)

Application NumberPriority DateFiling DateTitle
US35/355,128USD987459S1 (en)2021-04-262021-04-26Spectrum analyzer
US29/857,732USD991814S1 (en)2021-04-262022-10-25Spectrum analyzer

Related Parent Applications (1)

Application NumberTitlePriority DateFiling Date
US35/355,128DivisionUSD987459S1 (en)2021-04-262021-04-26Spectrum analyzer

Publications (1)

Publication NumberPublication Date
USD991814S1true USD991814S1 (en)2023-07-11

Family

ID=86426444

Family Applications (3)

Application NumberTitlePriority DateFiling Date
US35/355,128ActiveUSD987459S1 (en)2021-04-262021-04-26Spectrum analyzer
US29/857,732ActiveUSD991814S1 (en)2021-04-262022-10-25Spectrum analyzer
US29/857,716ActiveUSD991813S1 (en)2021-04-262022-10-25Spectrum analyzer

Family Applications Before (1)

Application NumberTitlePriority DateFiling Date
US35/355,128ActiveUSD987459S1 (en)2021-04-262021-04-26Spectrum analyzer

Family Applications After (1)

Application NumberTitlePriority DateFiling Date
US29/857,716ActiveUSD991813S1 (en)2021-04-262022-10-25Spectrum analyzer

Country Status (1)

CountryLink
US (3)USD987459S1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
TWD232693S (en)2023-11-072024-08-01炳碩生醫股份有限公司 Parts of Spectroscopic Analysis Inspection Machine
TWD232694S (en)2023-11-072024-08-01炳碩生醫股份有限公司 Parts of Spectroscopic Analysis Inspection Machine

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
USD993277S1 (en)*2020-12-102023-07-25Yokogawa Electric CorporationDisplay screen or portion thereof with graphical user interface
CA226931S (en)*2023-09-262025-01-21Aerosol D O OMeasuring instrument

Citations (69)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
USD251366S (en)1977-03-141979-03-20Wiltron CompanyElectronic test instrument
US4244024A (en)1978-08-101981-01-06Hewlett-Packard CompanySpectrum analyzer having enterable offsets and automatic display zoom
US4253152A (en)1978-08-101981-02-24Hewlett-Packard CompanySpectrum analyzer with parameter updating from a display marker
US4257104A (en)1978-08-101981-03-17Hewlett-Packard CompanyApparatus for spectrum analysis of an electrical signal
US4264958A (en)1978-08-101981-04-28Hewlett-Packard CompanyVideo processor for a spectrum analyzer
US4350953A (en)1978-03-201982-09-21Hewlett-Packard CompanyTime interval measurement apparatus
USD282351S (en)1983-10-111986-01-28Norland CorporationDigital oscilloscope
US4578640A (en)1982-09-141986-03-25Analogic CorporationOscilloscope control
US4695833A (en)1983-03-281987-09-22Hitachi Construction Machinery Co.Man-machine interface type portable ultrasonic composite measuring apparatus
US4800378A (en)*1985-08-231989-01-24Snap-On Tools CorporationDigital engine analyzer
US4821030A (en)*1986-12-191989-04-11Tektronix, Inc.Touchscreen feedback system
US4924175A (en)*1988-02-291990-05-08Clinton James RApparatus for displaying analog signatures of an electronic component
US4972138A (en)1987-05-111990-11-20Hewlett Packard Co.Oscilloscope-like user-interface for a logic analyzer
US5025411A (en)*1986-12-081991-06-18Tektronix, Inc.Method which provides debounced inputs from a touch screen panel by waiting until each x and y coordinates stop altering
US5177560A (en)1991-11-061993-01-05Hewlett-Packard CompanyOptical spectrum analyzer having adjustable sensitivity
USD335093S (en)1991-09-231993-04-27Snap-On Tools CorporationDigital oscilloscope
US5321420A (en)1991-04-261994-06-14Motorola, Inc.Operator interface for an electronic measurement system
US5396444A (en)1984-01-091995-03-07Hewlett-Packard CompanyTerminator keys having reciprocal exponents in a data processing system
US5434954A (en)*1990-03-301995-07-18Anritsu CorporationWaveform display apparatus for easily realizing high-definition waveform observation
USD367821S (en)1993-11-061996-03-12Helmut FischerCoating thickness gauge
USD377319S (en)1995-06-141997-01-14Advantest CorporationNetwork analyzer
US5631667A (en)*1993-12-081997-05-20Cadwell Industries, Inc.Frequency and amplitude measurement tool for electronic displays
USD420607S (en)*1999-04-092000-02-15Tektronix, Inc.Front panel for a measurement instrument
US6112593A (en)*1997-11-142000-09-05Hitachi Construction Machinery Co., Ltd.Portable non-destructive inspection device and support casing therefor
US6140812A (en)*1998-06-182000-10-31Tektronix, Inc.Electronic instrument with multiple position spring detented handle
US6195617B1 (en)1998-03-092001-02-27Lecroy, S.A.Digital storage oscilloscope with simultaneous primary measurement and derived parameter display on common time axis and method therefor
USD460371S1 (en)2001-12-202002-07-16Tektronix, Inc.Measurement instrument
USD460703S1 (en)2001-12-202002-07-23Tektronix, Inc.Measurement instrument
US6437552B1 (en)2000-07-312002-08-20Lecroy CorporationAutomatic probe identification system
US20030062906A1 (en)*2001-09-282003-04-03Anderson Mark A.Instrument with housing having recess for connectors
US20030219086A1 (en)2002-05-212003-11-27Lecheminant Greg D.Jitter identification using a wide bandwidth oscilloscope
US6731104B1 (en)*2002-12-052004-05-04Tektronix, Inc.Measurement probe system with EOS/ESD protection
US20040095381A1 (en)2002-11-142004-05-20Mcdowell David H.Graphical user interface for a remote spectrum analyzer
US6774890B2 (en)2001-01-092004-08-10Tektronix, Inc.Touch controlled zoom and pan of graphic displays
US20040167727A1 (en)2003-02-252004-08-26Pickerd John J.Method of constraints control for oscilloscope timebase subsection and display parameters
US20040164984A1 (en)2003-02-252004-08-26Pickerd John J.Method of constraints control for oscilloscope vertical subsection and display parameters
USD499658S1 (en)2004-04-302004-12-14Tektronix, Inc.Waveform generator
USD501414S1 (en)2003-10-092005-02-01Lecroy CorporationMeasurement instrument
US6856127B1 (en)*2003-07-252005-02-15Tektronix, Inc.Oscilloscope-based automatic finder for locating high power dissipation areas in switch-mode power supply (SMPS) switching devices
USD504079S1 (en)2004-04-302005-04-19Tektronix, Inc.Oscilloscope instrument
USD504078S1 (en)2003-10-092005-04-19Lecroy CorporationMeasurement instrument
USD504080S1 (en)2004-04-302005-04-19Tektronix, Inc.Oscilloscope instrument
USD504341S1 (en)2003-10-092005-04-26Lecroy CorporationMeasurement instrument
US6982550B2 (en)*2004-04-282006-01-03Agilent Technologies, Inc.Unbreakable micro-browser
USD514004S1 (en)2004-04-302006-01-31Tektronix, Inc.Waveform generator
US20070027675A1 (en)2005-07-262007-02-01Lecroy CorporationSpectrum analyzer control in an oscilloscope
USD556066S1 (en)2006-01-102007-11-27Lecroy CorporationHousing for oscilloscope
US20080231256A1 (en)*2006-12-192008-09-25Lecroy CorporationRemovable Front Panel Control for Oscilloscope
US20080278143A1 (en)*2006-12-192008-11-13Lecroy CorporationRemote Display and Control for Test and Measurement Apparatus
US7459898B1 (en)2005-11-282008-12-02Ryan WoodingsSystem and apparatus for detecting and analyzing a frequency spectrum
US7911466B2 (en)*2006-09-262011-03-22Fujitsu LimitedMethod and apparatus for editing timing diagram, and computer product
US8195413B2 (en)*2006-05-222012-06-05Rohde & Schwarz Gmbh & Co. KgMeasuring device for a preview display of several time-variable electrical signals
USD663636S1 (en)2011-04-222012-07-17Tektronix, Inc.Front panel for a measurement instrument
US20130006570A1 (en)2011-06-302013-01-03Kaplan Sidney JUnbound oscilloscope probe systems-using rf and or optical test point links - provides operational access and mobility
US8521457B2 (en)*2008-10-202013-08-27Olympus NdtUser designated measurement display system and method for NDT/NDI with high rate input data
US8576231B2 (en)*2005-11-282013-11-05Ryan WoodingsSpectrum analyzer interface
US9234927B2 (en)*2009-04-242016-01-12Rohde & Schwarz Gmbh & Co. KgMeasuring instrument and measuring method featuring dynamic channel allocation
US9367166B1 (en)*2007-12-212016-06-14Cypress Semiconductor CorporationSystem and method of visualizing capacitance sensing system operation
US9459290B2 (en)*2013-04-302016-10-04Keysight Technologies, Inc.Oscilloscope system and method for simultaneously displaying zoomed-in and zoomed-out waveforms
US9546927B2 (en)*2014-09-082017-01-17Yokogawa Electric CorporationOptical pulse tester
US9646395B2 (en)*2014-02-272017-05-09Change Healthcare LlcMethod and apparatus for comparing portions of a waveform
USD787961S1 (en)*2015-05-262017-05-30Graphtec CorporationMeasurement data collector
USD820127S1 (en)2014-11-212018-06-12Tektronix, Inc.Housing for a test and measurement instrument
USD845797S1 (en)*2016-12-012019-04-16Elma Electronic AgVersatile casing for electronic equipment
US20190162764A1 (en)2014-04-022019-05-30Research Electronics International, LlcExpanded Detail Graphical Display for Spectrum Analyzers
USD909899S1 (en)*2019-01-252021-02-09Tektronix, Inc.Housing for a test and measurement instrument
US20210325437A1 (en)2020-04-192021-10-21Research Electronics International, LlcCached Peak Graphical Display for Spectrum Analyzers
USD955246S1 (en)*2018-05-312022-06-21Micromass Uk LimitedMass spectrometer
US11415602B2 (en)*2018-12-032022-08-16Rohde & Schwarz Gmbh & Co. KgMethod for operating an oscilloscope as well as oscilloscope

Patent Citations (70)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
USD251366S (en)1977-03-141979-03-20Wiltron CompanyElectronic test instrument
US4350953A (en)1978-03-201982-09-21Hewlett-Packard CompanyTime interval measurement apparatus
US4244024A (en)1978-08-101981-01-06Hewlett-Packard CompanySpectrum analyzer having enterable offsets and automatic display zoom
US4253152A (en)1978-08-101981-02-24Hewlett-Packard CompanySpectrum analyzer with parameter updating from a display marker
US4257104A (en)1978-08-101981-03-17Hewlett-Packard CompanyApparatus for spectrum analysis of an electrical signal
US4264958A (en)1978-08-101981-04-28Hewlett-Packard CompanyVideo processor for a spectrum analyzer
US4578640A (en)1982-09-141986-03-25Analogic CorporationOscilloscope control
US4695833A (en)1983-03-281987-09-22Hitachi Construction Machinery Co.Man-machine interface type portable ultrasonic composite measuring apparatus
USD282351S (en)1983-10-111986-01-28Norland CorporationDigital oscilloscope
US5396444A (en)1984-01-091995-03-07Hewlett-Packard CompanyTerminator keys having reciprocal exponents in a data processing system
US4800378A (en)*1985-08-231989-01-24Snap-On Tools CorporationDigital engine analyzer
US5025411A (en)*1986-12-081991-06-18Tektronix, Inc.Method which provides debounced inputs from a touch screen panel by waiting until each x and y coordinates stop altering
US4821030A (en)*1986-12-191989-04-11Tektronix, Inc.Touchscreen feedback system
US4972138A (en)1987-05-111990-11-20Hewlett Packard Co.Oscilloscope-like user-interface for a logic analyzer
US4924175A (en)*1988-02-291990-05-08Clinton James RApparatus for displaying analog signatures of an electronic component
US5434954A (en)*1990-03-301995-07-18Anritsu CorporationWaveform display apparatus for easily realizing high-definition waveform observation
US5321420A (en)1991-04-261994-06-14Motorola, Inc.Operator interface for an electronic measurement system
USD335093S (en)1991-09-231993-04-27Snap-On Tools CorporationDigital oscilloscope
US5177560A (en)1991-11-061993-01-05Hewlett-Packard CompanyOptical spectrum analyzer having adjustable sensitivity
USD367821S (en)1993-11-061996-03-12Helmut FischerCoating thickness gauge
US5631667A (en)*1993-12-081997-05-20Cadwell Industries, Inc.Frequency and amplitude measurement tool for electronic displays
USD377319S (en)1995-06-141997-01-14Advantest CorporationNetwork analyzer
US6112593A (en)*1997-11-142000-09-05Hitachi Construction Machinery Co., Ltd.Portable non-destructive inspection device and support casing therefor
US6195617B1 (en)1998-03-092001-02-27Lecroy, S.A.Digital storage oscilloscope with simultaneous primary measurement and derived parameter display on common time axis and method therefor
US6140812A (en)*1998-06-182000-10-31Tektronix, Inc.Electronic instrument with multiple position spring detented handle
USD420607S (en)*1999-04-092000-02-15Tektronix, Inc.Front panel for a measurement instrument
US6437552B1 (en)2000-07-312002-08-20Lecroy CorporationAutomatic probe identification system
US6774890B2 (en)2001-01-092004-08-10Tektronix, Inc.Touch controlled zoom and pan of graphic displays
US20030062906A1 (en)*2001-09-282003-04-03Anderson Mark A.Instrument with housing having recess for connectors
USD460371S1 (en)2001-12-202002-07-16Tektronix, Inc.Measurement instrument
USD460703S1 (en)2001-12-202002-07-23Tektronix, Inc.Measurement instrument
US20030219086A1 (en)2002-05-212003-11-27Lecheminant Greg D.Jitter identification using a wide bandwidth oscilloscope
US20040095381A1 (en)2002-11-142004-05-20Mcdowell David H.Graphical user interface for a remote spectrum analyzer
US6731104B1 (en)*2002-12-052004-05-04Tektronix, Inc.Measurement probe system with EOS/ESD protection
US20040167727A1 (en)2003-02-252004-08-26Pickerd John J.Method of constraints control for oscilloscope timebase subsection and display parameters
US20040164984A1 (en)2003-02-252004-08-26Pickerd John J.Method of constraints control for oscilloscope vertical subsection and display parameters
US6856127B1 (en)*2003-07-252005-02-15Tektronix, Inc.Oscilloscope-based automatic finder for locating high power dissipation areas in switch-mode power supply (SMPS) switching devices
USD504341S1 (en)2003-10-092005-04-26Lecroy CorporationMeasurement instrument
USD501414S1 (en)2003-10-092005-02-01Lecroy CorporationMeasurement instrument
USD504078S1 (en)2003-10-092005-04-19Lecroy CorporationMeasurement instrument
US6982550B2 (en)*2004-04-282006-01-03Agilent Technologies, Inc.Unbreakable micro-browser
USD504080S1 (en)2004-04-302005-04-19Tektronix, Inc.Oscilloscope instrument
USD504079S1 (en)2004-04-302005-04-19Tektronix, Inc.Oscilloscope instrument
USD514004S1 (en)2004-04-302006-01-31Tektronix, Inc.Waveform generator
USD499658S1 (en)2004-04-302004-12-14Tektronix, Inc.Waveform generator
US20070027675A1 (en)2005-07-262007-02-01Lecroy CorporationSpectrum analyzer control in an oscilloscope
US7459898B1 (en)2005-11-282008-12-02Ryan WoodingsSystem and apparatus for detecting and analyzing a frequency spectrum
US8576231B2 (en)*2005-11-282013-11-05Ryan WoodingsSpectrum analyzer interface
USD556066S1 (en)2006-01-102007-11-27Lecroy CorporationHousing for oscilloscope
US8195413B2 (en)*2006-05-222012-06-05Rohde & Schwarz Gmbh & Co. KgMeasuring device for a preview display of several time-variable electrical signals
US7911466B2 (en)*2006-09-262011-03-22Fujitsu LimitedMethod and apparatus for editing timing diagram, and computer product
US20080278143A1 (en)*2006-12-192008-11-13Lecroy CorporationRemote Display and Control for Test and Measurement Apparatus
US20080231256A1 (en)*2006-12-192008-09-25Lecroy CorporationRemovable Front Panel Control for Oscilloscope
US9367166B1 (en)*2007-12-212016-06-14Cypress Semiconductor CorporationSystem and method of visualizing capacitance sensing system operation
US8521457B2 (en)*2008-10-202013-08-27Olympus NdtUser designated measurement display system and method for NDT/NDI with high rate input data
US9234927B2 (en)*2009-04-242016-01-12Rohde & Schwarz Gmbh & Co. KgMeasuring instrument and measuring method featuring dynamic channel allocation
USD663636S1 (en)2011-04-222012-07-17Tektronix, Inc.Front panel for a measurement instrument
US20130006570A1 (en)2011-06-302013-01-03Kaplan Sidney JUnbound oscilloscope probe systems-using rf and or optical test point links - provides operational access and mobility
US9459290B2 (en)*2013-04-302016-10-04Keysight Technologies, Inc.Oscilloscope system and method for simultaneously displaying zoomed-in and zoomed-out waveforms
US9646395B2 (en)*2014-02-272017-05-09Change Healthcare LlcMethod and apparatus for comparing portions of a waveform
US20190162764A1 (en)2014-04-022019-05-30Research Electronics International, LlcExpanded Detail Graphical Display for Spectrum Analyzers
US9546927B2 (en)*2014-09-082017-01-17Yokogawa Electric CorporationOptical pulse tester
USD820127S1 (en)2014-11-212018-06-12Tektronix, Inc.Housing for a test and measurement instrument
USD820129S1 (en)*2014-11-212018-06-12Tektronix, Inc.Front panel for a measurement instrument
USD787961S1 (en)*2015-05-262017-05-30Graphtec CorporationMeasurement data collector
USD845797S1 (en)*2016-12-012019-04-16Elma Electronic AgVersatile casing for electronic equipment
USD955246S1 (en)*2018-05-312022-06-21Micromass Uk LimitedMass spectrometer
US11415602B2 (en)*2018-12-032022-08-16Rohde & Schwarz Gmbh & Co. KgMethod for operating an oscilloscope as well as oscilloscope
USD909899S1 (en)*2019-01-252021-02-09Tektronix, Inc.Housing for a test and measurement instrument
US20210325437A1 (en)2020-04-192021-10-21Research Electronics International, LlcCached Peak Graphical Display for Spectrum Analyzers

Cited By (2)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
TWD232693S (en)2023-11-072024-08-01炳碩生醫股份有限公司 Parts of Spectroscopic Analysis Inspection Machine
TWD232694S (en)2023-11-072024-08-01炳碩生醫股份有限公司 Parts of Spectroscopic Analysis Inspection Machine

Also Published As

Publication numberPublication date
USD991813S1 (en)2023-07-11
USD987459S1 (en)2023-05-30

Similar Documents

PublicationPublication DateTitle
USD991814S1 (en)Spectrum analyzer
USD1037301S1 (en)Display or portion thereof with graphical user interface
USD992951S1 (en)Oven
USD846633S1 (en)Type font
USD844700S1 (en)Type font
USD1002643S1 (en)Display or portion thereof with graphical user interface
USD1000808S1 (en)Footwear
USD1095669S1 (en)Type font
USD1041816S1 (en)Shoe
USD931979S1 (en)Cylinder
USD978668S1 (en)Jerrycan
USD959866S1 (en)Seat
USD940052S1 (en)Scooter
USD1009985S1 (en)Type font
USD1041818S1 (en)Shoe
USD1016089S1 (en)Display or portion thereof with graphical user interface
USD1020717S1 (en)Protective case
USD1041817S1 (en)Shoe
USD1021138S1 (en)Shop interior arrangement
USD1061573S1 (en)Display screen or portion thereof with graphical user interface
USD882446S1 (en)Band
USD1036546S1 (en)Label
USD1036652S1 (en)Mask
USD1039616S1 (en)Label
USD1039614S1 (en)Label

Legal Events

DateCodeTitleDescription
FEPPFee payment procedure

Free format text:ENTITY STATUS SET TO UNDISCOUNTED (ORIGINAL EVENT CODE: BIG.); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY


[8]ページ先頭

©2009-2025 Movatter.jp