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USD769200S1 - Elastic membrane for semiconductor wafer polishing apparatus - Google Patents

Elastic membrane for semiconductor wafer polishing apparatus
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Publication number
USD769200S1
USD769200S1US29/472,346US201329472346FUSD769200SUS D769200 S1USD769200 S1US D769200S1US 201329472346 FUS201329472346 FUS 201329472346FUS D769200 SUSD769200 SUS D769200S
Authority
US
United States
Prior art keywords
semiconductor wafer
polishing apparatus
elastic membrane
wafer polishing
view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/472,346
Inventor
Makoto Fukushima
Hozumi Yasuda
Keisuke Namiki
Osamu Nabeya
Shingo Togashi
Satoru Yamaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ebara Corp
Original Assignee
Ebara Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JPD2013-10676Fexternal-prioritypatent/JP1495739S/ja
Priority claimed from JPD2013-10678Fexternal-prioritypatent/JP1521701S/ja
Priority claimed from JPD2013-10677Fexternal-prioritypatent/JP1521451S/ja
Priority claimed from JPD2013-10674Fexternal-prioritypatent/JP1495081S/ja
Priority claimed from JPD2013-10672Fexternal-prioritypatent/JP1494713S/ja
Priority claimed from JPD2013-10675Fexternal-prioritypatent/JP1495082S/ja
Priority claimed from JPD2013-10673Fexternal-prioritypatent/JP1495738S/ja
Application filed by Ebara CorpfiledCriticalEbara Corp
Assigned to EBARA CORPORATIONreassignmentEBARA CORPORATIONASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).Assignors: NABEYA, OSAMU, NAMIKI, KEISUKE, FUKUSHIMA, MAKOTO, TOGASHI, SHINGO, YAMAKI, SATORU, YASUDA, HOZUMI
Priority to US29/489,477priorityCriticalpatent/USD770990S1/en
Priority to US29/580,339prioritypatent/USD813180S1/en
Application grantedgrantedCritical
Publication of USD769200S1publicationCriticalpatent/USD769200S1/en
Activelegal-statusCriticalCurrent
Anticipated expirationlegal-statusCritical

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Description

FIG. 1 is a top perspective view a first embodiment of an elastic membrane for semiconductor wafer polishing apparatus showing our new design;
FIG. 2 is a bottom perspective view thereof;
FIG. 3 is a top plan view thereof;
FIG. 4 is a bottom plan view thereof;
FIG. 5 is a side view thereof, with the apparatus being radially symmetrical about a vertical axis;
FIG. 6 is a cross sectional view taken along section line6-6 inFIG. 3;
FIG. 7 is an enlarged portion view taken along line7-7 inFIG. 6;
FIG. 8 is a top perspective view a second embodiment of an elastic membrane for semiconductor wafer polishing apparatus showing our new design;
FIG. 9 is a bottom perspective view thereof;
FIG. 10 is a top plan view thereof;
FIG. 11 is a bottom plan view thereof;
FIG. 12 is a side view thereof, with the apparatus being radially symmetrical about a vertical axis;
FIG. 13 is a cross sectional view taken along section line13-13 inFIG. 10;
FIG. 14 is an enlarged portion view taken along line14-14 inFIG. 13;
FIG. 15 is a top perspective view a third embodiment of an elastic membrane for semiconductor wafer polishing apparatus showing our new design;
FIG. 16 is a bottom perspective view thereof;
FIG. 17 is a top plan view thereof;
FIG. 18 is a bottom plan view thereof;
FIG. 19 is a side view thereof, the apparatus being radially symmetrical about a vertical axis;
FIG. 20 is a cross sectional view taken along section line20-20 inFIG. 17;
FIG. 21 is an enlarged portion view taken along line21-21 inFIG. 20;
FIG. 22 is a top perspective view a fourth embodiment of an elastic membrane for semiconductor wafer polishing apparatus showing our new design;
FIG. 23 is a bottom perspective view thereof;
FIG. 24 is a top plan view thereof;
FIG. 25 is a bottom plan view thereof;
FIG. 26 is a side view thereof, the apparatus being radially symmetrical about a vertical axis;
FIG. 27 is a cross sectional view taken along line27-27 inFIG. 24; and,
FIG. 28 is an enlarged portion view taken along line28-28 inFIG. 27.
The broken lines shown in the drawings represent portions of the elastic membrane for semiconductor wafer polishing apparatus that form no part of the claimed design.

Claims (1)

    CLAIM
  1. The ornamental design for an elastic membrane for semiconductor wafer polishing apparatus, as shown and described.
US29/472,3462013-05-152013-11-12Elastic membrane for semiconductor wafer polishing apparatusActiveUSD769200S1 (en)

Priority Applications (2)

Application NumberPriority DateFiling DateTitle
US29/489,477USD770990S1 (en)2013-05-152014-04-30Elastic membrane for semiconductor wafer polishing apparatus
US29/580,339USD813180S1 (en)2013-05-152016-10-07Elastic membrane for semiconductor wafer polishing apparatus

Applications Claiming Priority (14)

Application NumberPriority DateFiling DateTitle
JP2013-106772013-05-15
JPD2013-10675FJP1495082S (en)2013-05-152013-05-15
JPD2013-10672FJP1494713S (en)2013-05-152013-05-15
JPD2013-10678FJP1521701S (en)2013-05-152013-05-15
JPD2013-10674FJP1495081S (en)2013-05-152013-05-15
JPD2013-10676FJP1495739S (en)2013-05-152013-05-15
JP2013-106782013-05-15
JPD2013-10673FJP1495738S (en)2013-05-152013-05-15
JPD2013-10677FJP1521451S (en)2013-05-152013-05-15
JP2013-106722013-05-15
JP2013-106742013-05-15
JP2013-106732013-05-15
JP2013-106752013-05-15
JP2013-106762013-05-15

Related Child Applications (2)

Application NumberTitlePriority DateFiling Date
US29/489,477Continuation-In-PartUSD770990S1 (en)2013-05-152014-04-30Elastic membrane for semiconductor wafer polishing apparatus
US29/580,339DivisionUSD813180S1 (en)2013-05-152016-10-07Elastic membrane for semiconductor wafer polishing apparatus

Publications (1)

Publication NumberPublication Date
USD769200S1true USD769200S1 (en)2016-10-18

Family

ID=57120114

Family Applications (2)

Application NumberTitlePriority DateFiling Date
US29/472,346ActiveUSD769200S1 (en)2013-05-152013-11-12Elastic membrane for semiconductor wafer polishing apparatus
US29/580,339ActiveUSD813180S1 (en)2013-05-152016-10-07Elastic membrane for semiconductor wafer polishing apparatus

Family Applications After (1)

Application NumberTitlePriority DateFiling Date
US29/580,339ActiveUSD813180S1 (en)2013-05-152016-10-07Elastic membrane for semiconductor wafer polishing apparatus

Country Status (1)

CountryLink
US (2)USD769200S1 (en)

Cited By (34)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
USD797067S1 (en)*2015-04-212017-09-12Applied Materials, Inc.Target profile for a physical vapor deposition chamber target
USD798248S1 (en)*2015-06-182017-09-26Applied Materials, Inc.Target profile for a physical vapor deposition chamber target
USD799646S1 (en)*2016-08-302017-10-10Asm Ip Holding B.V.Heater block
USD801942S1 (en)*2015-04-162017-11-07Applied Materials, Inc.Target profile for a physical vapor deposition chamber target
USD808349S1 (en)*2013-05-152018-01-23Ebara CorporationElastic membrane for semiconductor wafer polishing apparatus
USD813180S1 (en)*2013-05-152018-03-20Ebara CorporationElastic membrane for semiconductor wafer polishing apparatus
USD836572S1 (en)*2016-09-302018-12-25Applied Materials, Inc.Target profile for a physical vapor deposition chamber target
USD839224S1 (en)2016-12-122019-01-29Ebara CorporationElastic membrane for semiconductor wafer polishing
USD851613S1 (en)2017-10-052019-06-18Applied Materials, Inc.Target profile for a physical vapor deposition chamber target
USD859332S1 (en)2017-06-292019-09-10Ebara CorporationElastic membrane for semiconductor wafer polishing
USD859331S1 (en)*2017-03-312019-09-10Ebara CorporationVacuum contact pad
USD868124S1 (en)2017-12-112019-11-26Applied Materials, Inc.Target profile for a physical vapor deposition chamber target
USD877101S1 (en)2018-03-092020-03-03Applied Materials, Inc.Target profile for a physical vapor deposition chamber target
USD908645S1 (en)2019-08-262021-01-26Applied Materials, Inc.Sputtering target for a physical vapor deposition chamber
USD918161S1 (en)*2017-12-192021-05-04Ebara CorporationElastic membrane
USD918848S1 (en)*2019-07-182021-05-11Kokusai Electric CorporationRetainer of ceiling heater for semiconductor fabrication apparatus
US11179823B2 (en)2016-10-282021-11-23Ebara CorporationSubstrate holding apparatus, elastic membrane, polishing apparatus, and method for replacing elastic membrane
USD937329S1 (en)2020-03-232021-11-30Applied Materials, Inc.Sputter target for a physical vapor deposition chamber
USD940765S1 (en)2020-12-022022-01-11Applied Materials, Inc.Target profile for a physical vapor deposition chamber target
USD947802S1 (en)*2020-05-202022-04-05Applied Materials, Inc.Replaceable substrate carrier interfacing film
USD954567S1 (en)*2019-06-252022-06-14Ebara CorporationMeasurement jig
USD962184S1 (en)*2019-07-112022-08-30Kokusai Electric CorporationRetainer plate of top heater for wafer processing furnace
USD962183S1 (en)*2019-07-112022-08-30Kokusai Electric CorporationRetainer plate of top heater for wafer processing furnace
USD981969S1 (en)*2020-12-182023-03-28Ebara CorporationElastic membrane for semiconductor wafer polishing apparatus
USD989012S1 (en)*2020-09-172023-06-13Ebara CorporationElastic membrane
USD1006768S1 (en)*2021-01-072023-12-05Solaero Technologies Corp.Semiconductor wafer for mosaic solar cell fabrication
USD1007449S1 (en)2021-05-072023-12-12Applied Materials, Inc.Target profile for a physical vapor deposition chamber target
US11958163B2 (en)2016-10-282024-04-16Ebara CorporationSubstrate holding apparatus, elastic membrane, polishing apparatus, and method for replacing elastic membrane
USD1051530S1 (en)*2023-03-292024-11-12Irobot CorporationDrip tray for use with a mobile cleaning robot
USD1053230S1 (en)2022-05-192024-12-03Applied Materials, Inc.Sputter target for a physical vapor deposition chamber
USD1072774S1 (en)2021-02-062025-04-29Applied Materials, Inc.Target profile for a physical vapor deposition chamber target
USD1091033S1 (en)2023-03-092025-08-26Irobot CorporationDrip tray for use with a mobile cleaning robot
USD1090499S1 (en)*2024-02-272025-08-26Avery Dennison Retail Information Services LlcAntenna
USD1092453S1 (en)*2024-04-222025-09-09Avery Dennison Retail Information Services LlcAntenna

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US20010029158A1 (en)*1998-07-302001-10-11Yoshitaka SasakiPolishing apparatus and polishing method, and method of manufacturing semiconductor device and method of manufacturing thin film magnetic head
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USD633452S1 (en)2009-08-272011-03-01Ebara CorporationElastic membrane for semiconductor wafer polishing apparatus
USD634719S1 (en)2009-08-272011-03-22Ebara CorporationElastic membrane for semiconductor wafer polishing apparatus
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USD649126S1 (en)*2008-10-202011-11-22Ebara CorporationVacuum contact pad
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US8859070B2 (en)*2011-11-302014-10-14Ebara CorporationElastic membrane

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US20050035514A1 (en)*2003-08-112005-02-17Supercritical Systems, Inc.Vacuum chuck apparatus and method for holding a wafer during high pressure processing
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CN100467210C (en)*2004-03-252009-03-11揖斐电株式会社 Vacuum Chucks and Suction Plates
USD769200S1 (en)*2013-05-152016-10-18Ebara CorporationElastic membrane for semiconductor wafer polishing apparatus
USD770990S1 (en)*2013-05-152016-11-08Ebara CorporationElastic membrane for semiconductor wafer polishing apparatus
USD797067S1 (en)*2015-04-212017-09-12Applied Materials, Inc.Target profile for a physical vapor deposition chamber target
USD798248S1 (en)*2015-06-182017-09-26Applied Materials, Inc.Target profile for a physical vapor deposition chamber target

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US6659850B2 (en)*2000-03-312003-12-09Speedfam-Ipec CorporationWork piece carrier with adjustable pressure zones and barriers and a method of planarizing a work piece
US7357699B2 (en)*2003-02-102008-04-15Ebara CorporationSubstrate holding apparatus and polishing apparatus
US20040175951A1 (en)*2003-03-072004-09-09Applied Materials, Inc.Substrate carrier with a textured membrane
US20090068935A1 (en)*2003-10-172009-03-12Hiroomi ToriiPolishing apparatus
US20080070479A1 (en)*2004-11-012008-03-20Ebara CorporationPolishing Apparatus
US20090247057A1 (en)*2005-09-142009-10-01Ebara CorporationPolishing platen and polishing apparatus
US7402098B2 (en)*2006-10-272008-07-22Novellus Systems, Inc.Carrier head for workpiece planarization/polishing
US8469776B2 (en)*2006-11-222013-06-25Applied Materials, Inc.Flexible membrane for carrier head
US20090068934A1 (en)*2007-09-042009-03-12Samsung Electronics Co., Ltd.Wafer polishing carrier apparatus and chemical mechanical polishing equipment using the same
US20090111362A1 (en)*2007-10-292009-04-30Ebara CorporationPolishing Apparatus
USD649126S1 (en)*2008-10-202011-11-22Ebara CorporationVacuum contact pad
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USD633452S1 (en)2009-08-272011-03-01Ebara CorporationElastic membrane for semiconductor wafer polishing apparatus
CN301348233S (en)2009-08-272010-09-15株式会社荏原制作所Elastic film for semiconductor wafer polishing device
USD634719S1 (en)2009-08-272011-03-22Ebara CorporationElastic membrane for semiconductor wafer polishing apparatus
USD711330S1 (en)2010-12-282014-08-19Ebara CorporationElastic membrane for semiconductor wafer polishing
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US20130316628A1 (en)*2012-05-232013-11-28Samsung Electronics Co., Ltd.Flexible membranes for a polishing head

Cited By (47)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
USD808349S1 (en)*2013-05-152018-01-23Ebara CorporationElastic membrane for semiconductor wafer polishing apparatus
USD813180S1 (en)*2013-05-152018-03-20Ebara CorporationElastic membrane for semiconductor wafer polishing apparatus
USD837755S1 (en)*2015-04-162019-01-08Applied Materials, Inc.Target profile for a physical vapor deposition chamber target
USD801942S1 (en)*2015-04-162017-11-07Applied Materials, Inc.Target profile for a physical vapor deposition chamber target
USD825504S1 (en)2015-04-212018-08-14Applied Materials, Inc.Target profile for a physical vapor deposition chamber target
USD797067S1 (en)*2015-04-212017-09-12Applied Materials, Inc.Target profile for a physical vapor deposition chamber target
USD798248S1 (en)*2015-06-182017-09-26Applied Materials, Inc.Target profile for a physical vapor deposition chamber target
USD825505S1 (en)*2015-06-182018-08-14Applied Materials, Inc.Target profile for a physical vapor deposition chamber target
USD799646S1 (en)*2016-08-302017-10-10Asm Ip Holding B.V.Heater block
USD836572S1 (en)*2016-09-302018-12-25Applied Materials, Inc.Target profile for a physical vapor deposition chamber target
USD869409S1 (en)2016-09-302019-12-10Applied Materials, Inc.Target profile for a physical vapor deposition chamber target
US11958163B2 (en)2016-10-282024-04-16Ebara CorporationSubstrate holding apparatus, elastic membrane, polishing apparatus, and method for replacing elastic membrane
US11179823B2 (en)2016-10-282021-11-23Ebara CorporationSubstrate holding apparatus, elastic membrane, polishing apparatus, and method for replacing elastic membrane
USD839224S1 (en)2016-12-122019-01-29Ebara CorporationElastic membrane for semiconductor wafer polishing
USD913977S1 (en)2016-12-122021-03-23Ebara CorporationElastic membrane for semiconductor wafer polishing
USD859331S1 (en)*2017-03-312019-09-10Ebara CorporationVacuum contact pad
USD859332S1 (en)2017-06-292019-09-10Ebara CorporationElastic membrane for semiconductor wafer polishing
USD851613S1 (en)2017-10-052019-06-18Applied Materials, Inc.Target profile for a physical vapor deposition chamber target
USD894137S1 (en)2017-10-052020-08-25Applied Materials, Inc.Target profile for a physical vapor deposition chamber target
USD868124S1 (en)2017-12-112019-11-26Applied Materials, Inc.Target profile for a physical vapor deposition chamber target
USD946638S1 (en)2017-12-112022-03-22Applied Materials, Inc.Target profile for a physical vapor deposition chamber target
USD918161S1 (en)*2017-12-192021-05-04Ebara CorporationElastic membrane
USD902165S1 (en)2018-03-092020-11-17Applied Materials, Inc.Target profile for a physical vapor deposition chamber target
USD877101S1 (en)2018-03-092020-03-03Applied Materials, Inc.Target profile for a physical vapor deposition chamber target
USD1035468S1 (en)2019-06-252024-07-16Ebara CorporationMeasurement jig
USD1034248S1 (en)2019-06-252024-07-09Ebara CorporationMeasurement jig
USD954567S1 (en)*2019-06-252022-06-14Ebara CorporationMeasurement jig
USD962184S1 (en)*2019-07-112022-08-30Kokusai Electric CorporationRetainer plate of top heater for wafer processing furnace
USD962183S1 (en)*2019-07-112022-08-30Kokusai Electric CorporationRetainer plate of top heater for wafer processing furnace
USD918848S1 (en)*2019-07-182021-05-11Kokusai Electric CorporationRetainer of ceiling heater for semiconductor fabrication apparatus
USD908645S1 (en)2019-08-262021-01-26Applied Materials, Inc.Sputtering target for a physical vapor deposition chamber
USD970566S1 (en)2020-03-232022-11-22Applied Materials, Inc.Sputter target for a physical vapor deposition chamber
USD937329S1 (en)2020-03-232021-11-30Applied Materials, Inc.Sputter target for a physical vapor deposition chamber
USD947802S1 (en)*2020-05-202022-04-05Applied Materials, Inc.Replaceable substrate carrier interfacing film
USD1021832S1 (en)*2020-09-172024-04-09Ebara CorporationElastic membrane
USD989012S1 (en)*2020-09-172023-06-13Ebara CorporationElastic membrane
USD940765S1 (en)2020-12-022022-01-11Applied Materials, Inc.Target profile for a physical vapor deposition chamber target
USD966357S1 (en)2020-12-022022-10-11Applied Materials, Inc.Target profile for a physical vapor deposition chamber target
USD981969S1 (en)*2020-12-182023-03-28Ebara CorporationElastic membrane for semiconductor wafer polishing apparatus
USD1006768S1 (en)*2021-01-072023-12-05Solaero Technologies Corp.Semiconductor wafer for mosaic solar cell fabrication
USD1072774S1 (en)2021-02-062025-04-29Applied Materials, Inc.Target profile for a physical vapor deposition chamber target
USD1007449S1 (en)2021-05-072023-12-12Applied Materials, Inc.Target profile for a physical vapor deposition chamber target
USD1053230S1 (en)2022-05-192024-12-03Applied Materials, Inc.Sputter target for a physical vapor deposition chamber
USD1091033S1 (en)2023-03-092025-08-26Irobot CorporationDrip tray for use with a mobile cleaning robot
USD1051530S1 (en)*2023-03-292024-11-12Irobot CorporationDrip tray for use with a mobile cleaning robot
USD1090499S1 (en)*2024-02-272025-08-26Avery Dennison Retail Information Services LlcAntenna
USD1092453S1 (en)*2024-04-222025-09-09Avery Dennison Retail Information Services LlcAntenna

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