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US8687304B1 - Sensor-aided patterned magnetic media synchronization systems - Google Patents

Sensor-aided patterned magnetic media synchronization systems
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US8687304B1
US8687304B1US13/007,787US201113007787AUS8687304B1US 8687304 B1US8687304 B1US 8687304B1US 201113007787 AUS201113007787 AUS 201113007787AUS 8687304 B1US8687304 B1US 8687304B1
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write clock
write
phase
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Qiyue Zou
Xueshi Yang
Gregory Burd
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Marvell International Ltd
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Abstract

A write clock synchronization system includes a first module configured to generate a write clock signal. A second module is configured to, based on a sensor signal received, detect a pattern of bit islands on bit-patterned media. The second module is configured to determine a phase error of the write clock signal based on the pattern of the bit islands. A third module is configured to at least one of adjust or select a phase of the write clock signal based on the phase error.

Description

CROSS-REFERENCE TO RELATED APPLICATIONS
This application claims the benefit of U.S. Provisional Application No. 61/295,931, titled “SENSOR-AIDED DISK SYNCHRONOUS WRITE FOR PATTERNED MEDIA”, filed on Jan. 18, 2010 and U.S. Provisional Application No. 61/362,236, titled “SENSOR-AIDED DISK SYNCHRONOUS WRITE FOR PATTERNED MEDIA”, filed on Jul. 7, 2010. The disclosures of the above applications are incorporated herein by reference in their entirety.
FIELD
The present disclosure relates to magnetic recording systems for continuous media and bit-patterned media.
BACKGROUND
The background description provided herein is for the purpose of generally presenting the context of the disclosure. Work of the presently named inventors, to the extent the work is described in this background section, as well as aspects of the description that may not otherwise qualify as prior art at the time of filing, are neither expressly nor impliedly admitted as prior art against the present disclosure.
Continuous media recording systems write data to a disk that is coated by magnetic material in a continuous pattern. Prior to a write operation, servo sector information (e.g., preamble data, synchronization marks, and positioning information) is read from a disk. The servo sector information is used to position a read/write head and to correct head positioning error. Head positioning error may refer to a difference between (i) the true track/data bit position on a disk that data is stored (or is to be stored) and (ii) the read/write head position on the disk at which the data is to be read and/or written. Subsequent to correcting head positioning error, data is written to sectors of the disk at a desired position. Since data is written to the disk with continuous magnetic material pattern in a track, the data may be written generally at any point within a sector of the disk.
In continuous media, bits are stored in adjacent locations on a disk. Each bit is stored in multiple independent grains (nanometer-scale grains) in a film of magnetic alloy. The size of the grains may be reduced to increase bit density on a disk. The smaller the size of the grains, the more interference between the grains due to a superparamagnetic effect. The superparamagnetic effect refers to magnetization flipping of grains due to changes in, for example, temperature. The superparamagentic effect can negatively affect maintenance of data and thus limit storage density of a disk.
Bit-patterned media (BPM) recording systems provide increased storage capacity over continuous media recording systems. BPM recording systems may store as much as ten times more information on a magnetic storage device (e.g., a magnetic disk or hard disk) than continuous media recording systems. As an example, a BPM recording system may store 1 or more terabits (Tbit) of data in one square inch (in2) of a magnetic disk.
BPM recording systems write data to a disk in discontinuous island-based patterns (uniform magnetic islands on the disk surface). Bits of data are stored at specific points or discrete bit islands on the disk. The bit islands are separated by grooves and/or non-magnetic material(s). For example, each bit island may store 1 bit of data. As each bit is stored on a designated bit island, thermal stability of BPM can be better than thermal stability of continuous media. Also, interference between bit islands of BPM is less than interference between grains in continuous media.
Bit-level head positioning accuracy requirements of BPM recording systems are more stringent than that of continuous media recording systems, as bit positions on BPM (or bit island locations) are predefined. Accurate bit-level head positioning ensures that data is written over correct bit islands areas of a disk while minimizing and/or avoiding attempts to write data over areas between bit islands (or to wrong bit islands).
A BPM recording system may include a write clock. The write clock may be used for timing write events including positioning and access timing of a write head. Synchronization of the write clock with the patterned media is needed in a BPM recording system due to the discontinuous format of BPM. A write clock signal is synchronized when rising and/or falling edges of the write clock signal are aligned with start and end positions of the bit islands, such that writing occurs over the bit islands and not over areas between bit islands. Loss in synchronization between the write clock signal and the bit islands can lead to errors, which may be difficult to detect and correct.
SUMMARY
A write clock synchronization system is provided and includes a first module configured to generate a write clock signal. A second module is configured to, based on a sensor signal received, detect a pattern of bit islands on bit-patterned media. The second module is configured to determine a phase error of the write clock signal based on the pattern of the bit islands. A third module is configured to at least one of adjust or select a phase of the write clock signal based on the phase error.
In other features, the write clock synchronization system further includes a synchronization sensor configured to generate the sensor signal. The synchronization sensor is one of an optical sensor and a magnetic sensor.
In other features, the second module is configured to determine the phase error based on a phase of the sensor signal and a predetermined phase shift value. In other features, the write clock synchronization system further includes a fourth module configured to generate the predetermined phase shift value based on a test write.
In other features, the third module includes a sixth module configured to at least one of adjust or select a phase of the write clock signal to generate an interpolated clock signal.
In other features, the write clock synchronization system further includes a write head configured to write data on a disk. The third module includes a fourth module configured to generate an interpolated clock signal based on the phase error and the write clock signal generated by the first module; The third module includes a fifth module configured to frequency convert the interpolated clock signal to a write clock output signal. The write head is configured to write the data on the disk based on the write clock output signal.
In other features, the write clock synchronization system further includes a phase lock loop comprising the second module and the third module. In other features, the third module is configured to generate an interpolated clock signal based on the phase error. The phase lock loop further includes a fourth module configured to adjust phase of the interpolated clock signal based on a calibrated phase shift value.
In other features, the second module determines timing information of the sensor signal. The third module synchronizes phase and frequency of the write clock signal with the sensor signal.
In other features, the second module includes a fourth module configured to filter the sensor signal to generate a filtered sensor signal. A fifth module is configured to convert the filtered sensor signal from an analog signal to a digital signal. A sixth module is configured to determine the phase error based on the digital signal. The third module includes a seventh module configured to generate an interpolated clock signal based on the phase error and the write clock signal generated by the first module.
In other features, the third module includes a fourth module configured to generate an equalized signal based on a digital version of the sensor signal. A fifth module is configured to generate a bit sequence based on the equalized signal. A sixth module is configured to generate a reconstructed signal based on the bit sequence. A seventh module is configured to determine the phase error based on the equalized signal and the reconstructed signal.
Further areas of applicability of the present disclosure will become apparent from the detailed description, the claims and the drawings. The detailed description and specific examples are intended for purposes of illustration only and are not intended to limit the scope of the disclosure.
BRIEF DESCRIPTION OF DRAWINGS
The present disclosure will become more fully understood from the detailed description and the accompanying drawings, wherein:
FIG. 1 is a functional block diagram of a hard disk drive system incorporating a write clock synchronization system in accordance with the present disclosure;
FIG. 2 is a functional block diagram of the write clock synchronization module in accordance with the present disclosure;
FIG. 3 is a bit-patterned media track diagram illustrating a write head and synchronization sensor relationship in accordance with the present disclosure;
FIG. 4 is a functional block diagram illustrating a write clock synchronization system for a synchronization sensor incorporating a phase shifter module in accordance with the present disclosure;
FIG. 5 is a functional block diagram illustrating another write clock synchronization system for the synchronization sensor ofFIG. 4 with phase error calibration adjustment in accordance with the present disclosure;
FIG. 6 illustrates methods of synchronizing write clock signals generated by the write clock synchronization systems ofFIGS. 4-5;
FIG. 7 is a functional block diagram illustrating another write clock synchronization system in accordance with the present disclosure;
FIG. 8 illustrates a method of synchronizing a write clock signal generated by the write clock synchronization system ofFIG. 7;
FIG. 9 is a top view of a zone of bit-patterned media with connected bit islands in accordance with the present disclosure;
FIG. 10 is a bit-patterned media track diagram illustrating a test write operation in accordance with the present disclosure;
FIG. 11 illustrates a method of calibrating a phase shift value for continuous media in accordance with the present disclosure; and
FIG. 12 illustrates a method of calibrating a phase shift value for discontinuous media in accordance with the present disclosure.
DESCRIPTION
The following description is merely illustrative in nature and is in no way intended to limit the disclosure, its application, or uses. For purposes of clarity, the same reference numbers will be used in the drawings to identify similar elements. As used herein, the phrase at least one of A, B, and C should be construed to mean a logical (A or B or C), using a non-exclusive logical OR. It should be understood that steps within a method may be executed in different order without altering the principles of the present disclosure.
As used herein, the term module may refer to, be part of, or include an Application Specific Integrated Circuit (ASIC); an electronic circuit; a combinational logic circuit; a field programmable gate array (FPGA); a processor (shared, dedicated, or group) that executes code; other suitable components that provide the described functionality; or a combination of some or all of the above, such as in a system-on-chip. The term module may include memory (shared, dedicated, or group) that stores code executed by the processor.
The term code, as used above, may include software, firmware, and/or microcode, and may refer to programs, routines, functions, classes, and/or objects. The term shared, as used above, means that some or all code from multiple modules may be executed using a single (shared) processor. In addition, some or all code from multiple modules may be stored by a single (shared) memory. The term group, as used above, means that some or all code from a single module may be executed using a group of processors. In addition, some or all code from a single module may be stored using a group of memories.
The apparatuses and methods described herein may be implemented by one or more computer programs executed by one or more processors. The computer programs include processor-executable instructions that are stored on a non-transitory tangible computer readable medium. The computer programs may also include stored data. Non-limiting examples of the non-transitory tangible computer readable medium are nonvolatile memory, magnetic storage, and optical storage.
Although the terms first, second, third, etc. may be used herein to describe various elements, components, regions, areas, zones and/or sections, these elements, components, regions, areas, zones and/or sections should not be limited by these terms. These terms may be only used to distinguish one element, component, region, layer, zone or section from another element, component, region, layer, zone or section. Terms such as “first,” “second,” and other numerical terms when used herein do not imply a sequence or order unless clearly indicated by the context. Thus, a first element, component, region, area, zone or section discussed below could be termed a second element, component, region, area, zone or section without departing from the teachings herein.
In a continuous media system, disk synchronous write (DSW) operations may be performed to synchronize frequencies and phases of a write clock with continuous media. A 1st-order or 2nd-order phase-locked loop (PLL) may be used in a read/write channel to provide the synchronization. Use of the 1st-order or 2nd-order PLL can reduce a maximum clock phase error to 50%-60% of a bit period. In continuous media, a bit period corresponds to a collective width of grains associated with storing a bit. A maximum phase error of 50%-60% of a bit period is unacceptable for bit-patterned media (BPM) systems, as synchronization requirements for BPM are more stringent than continuous media. Disk synchronous write implementations are disclosed herein for BPM system that provide clock phase error of less than or equal to 20% of a bit period (i.e. width of a bit). The width of a bit refers to a distance along a track between a starting and ending edge of the bit, where the bit island is sitting in the middle.
InFIG. 1, a hard disk drive (HDD)system10 incorporating a writeclock synchronization module11 is shown. TheHDD system10 includes a hard disk assembly (HDA)12 and a HDD printed circuit board (PCB)14. TheHDA12 includes one or more circular platters (i.e. disks)16, which have magnetic surfaces that are used to store data magnetically. Data can be stored in either a continuous media format or bit-patterned format on thedisks16. Thedisks16 are arranged in a stack, and the stack is rotated by aspindle motor18. At least one read and write head assembly20 (read/write head assembly20) reads data from and writes data on the magnetic surfaces of thedisks16.
Thewrite head assembly20 includes a write element (write head), such as an inductor, that generates a magnetic field and a read element (read head), such as a magneto-resistive (MR) element, that senses the magnetic field on thedisks16. Thewrite head assembly20 is mounted at a distal end of anactuator arm22. An actuator, such as a voice coil motor (VCM)24, moves theactuator arm22 relative to thedisks16.
Thewrite head assembly20 may include asynchronization sensor25 or thesynchronization sensor25 may be mounted elsewhere, such as on the actuator arm22 a distance D from thewrite head assembly20, as shown. The distance D is fixed. Thesynchronization sensor25 may be an optical sensor, a magnetic sensor, or other suitable sensor. An optical sensor may be used to detect a landscape of bit islands and grooves (non-magnetic areas between bit islands) of the BPM. A magnetic sensor may be used to detect magnetic fields around the bit islands.
Thesynchronization sensor25 may be active while the write head is writing to thedisks16. In one implementation, thesynchronization sensor25 is not included and the read element is used as a synchronization sensor. The signals or magnetic field generated by the write head may be shielded away prior to being received by the read head to prevent the write head from negatively affecting operation of the read head. This allows the read head to be used as a synchronization sensor and be active while the write head is writing to thedisks16.
TheHDA12 includes apreamplifier device26 that amplifies signals received from and sent to thewrite head assembly20. Thepreamplifier device26 generates a write current that flows through the write element of thewrite head assembly20 when writing data. The write current is used to produce a magnetic field on the magnetic surfaces of thedisks16. Magnetic surfaces of thedisks16 induce low-level analog signals in the read element of thewrite head assembly20 during reading of thedisks16. Thepreamplifier device26 amplifies the low-level analog signals and outputs amplified analog signals to a read/write channel module28.
TheHDD PCB14 includes the read/write channel module28, a hard disk controller (HDC)30, aprocessor32, aspindleNCM driver module34,volatile memory36,nonvolatile memory38, and an input/output (I/O)interface40. The read/write channel module28 includes the writeclock synchronization module11.
The writeclock synchronization module11 synchronizes write clock signals with discontinuous bit islands (“bit islands”) on thedisks16. The writeclock synchronization module11 aligns write clock signal pulses with the bit islands. In operation, the writeclock synchronization system11 detects a bit island pattern (i.e. bit island timing or phase of the bit islands) and adjusts the write clock signals based on the bit island pattern. The phase of the bit islands is directly related to start and end times associated with starting and ending edges of the bit islands. Thesynchronization sensor25 generates a sensor signal based on the starting and ending edges. Phase (“sensor phase”) of the sensor signal is directly related to and/or the same as phase (“bit island phase”) of the bit islands. The writeclock synchronization module11 adjusts phase (“write clock phase”) of the write clock signals based on the sensor phase. This adjustment may be provided using a closed phase lock loop (PLL), as shown inFIGS. 4,5 and7. An example of the writeclock synchronization module11 is shown inFIG. 2.
During write operations, the read/write channel module28 may encode the data to increase reliability by using error-correcting codes (ECC) such as run length limited (RLL) code, Reed-Solomon code, etc. The read/write channel module28 then transmits the encoded data to thepreamplifier device26. Data is written to the bit islands based on the synchronized write clock signals. During read operations, the read/write channel module28 receives analog signals from thepreamplifier device26. The read/write channel module28 converts the analog signals into digital signals, which are decoded to recover the original data.
TheHDC module30 controls operation of theHDD system10. For example, theHDC module30 generates commands that control the speed of thespindle motor18 and the movement of theactuator arm22. The spindle/VCM driver module34 implements the commands and generates control signals that control the speed of thespindle motor18 and the positioning of theactuator arm22. Additionally, theHDC module30 communicates with an external device (not shown), such as a host adapter within a host device, via theinterface40. TheHDC module30 may receive data to be stored from the external device, and may transmit retrieved data to the external device.
Theprocessor32 processes data, including encoding, decoding, filtering, and/or formatting. Additionally, theprocessor32 processes servo or positioning information to position the read/write head assembly20 over thedisks16 during read/write operations. Servo, which is stored on thedisks16, ensures that data is written to and read from correct locations on thedisks16. In some implementations, a self-servo write (SSW)module42 may write servo on thedisks16 using thewrite head assembly20 prior to storing data on theHDD10.
InFIG. 2, the writeclock synchronization module11 is shown. The writeclock synchronization module11 includes a bit islandpattern detection module50, a clock phase adjustment module (or delay module)52, and a writeclock generation module54. The writeclock synchronization module11 synchronizes a write clock with the media based on a bit island pattern detected by asynchronization sensor25′. Thesynchronization sensor25′ may be mounted on a slider oractuator arm22′ and be a fixed distance from thewrite head56. Thesynchronization sensor25′ may be at various locations relative to thewrite head56. InFIG. 2, thesynchronization sensor25′ is located forward of thewrite head56 relative to a rotation direction of BPM. Thesynchronization sensor25′ detectsbit islands60 on a track of the BPM prior to thebit islands60 rotating under thewrite head56.Arrow62 illustrates order of thebit islands60 along the track, which is opposite the rotational direction of the BPM.
A synchronization sensor may detect bit islands on the same track as bit islands written to by the write head (as shown inFIG. 2) or may detect bit islands on a different track (as shown inFIGS. 3 and 8). In other words, the write head may write to the same bit islands monitored by a synchronization sensor or may write to bits islands in a different track than the track monitored by the synchronization sensor. A different track may be monitored, as bit island patterns (or phases of bit islands) of different tracks of BPM may be similar or essentially identical. The bit island patterns may be essentially identical when the tracks are in the same zone of the BPM. A zone may refer to an area of the BPM and/or to a set of tracks that include bit islands having the same bit island pattern. A bit island pattern may refer to sizes of bit islands, distances between bit islands, arrangement of bit islands, number of bit islands per unit area of the BPM, etc.
Sensor signals generated by thesynchronization sensor25′ may be adjusted based on whether thesynchronization sensor25′ is monitoring bit islands in the same zone as bit islands to which data is being written by thewrite head56. For example, phases and/or frequencies of the sensor signals may be adjusted to compensate for differences in bit island patterns between the bit islands detected by thesynchronization sensor25′ and bit islands written to by thewrite head56. Phases and frequencies of sensor signals and corresponding bit island pattern information for each zone may be stored inmemory68 of the writeclock synchronization module11. The bit islandpattern detection module50 may access the phase and frequency information stored in thememory68 and adjusts the sensor signals accordingly. The sensor signals may be adjusted to compensate for differences in a first bit island pattern of a first zone monitored by thesynchronization sensor25′ and a second bit island pattern of a second zone written to by a write head.
The bit islandpattern detection module50 detects a bit island pattern based on detection of starting and ending edges (e.g., startingedges70 and ending edges72) of thebit islands60. Surface geometry variations associated with thebit islands60 provide timing information for write clock synchronization. The timing information is provided based on physical characteristics of thebit islands60 and not based on preambles of data signals. Thesynchronization sensor25′ generates asensor signal74 that indicates timing of the starting and ending edges of thebit islands60.
The bit islandpattern detection module50 generates a phase error (or delay adjustment) signal76 based on the periodic pattern of the sensor signal. The bit islandpattern detection module50 determines the phase of the sensor signal and associated phase error. The phase error may be determined based on a desired or predetermined (desired) phase, as further described below.
The clockphase adjustment module52 adjusts and/or selects awrite clock signal78 received from the writeclock generation module54 based on the phase error. The clockphase adjustment module52 may delay thewrite clock signal78 for a fixed amount of time or adjust phase of thewrite clock signal78 to generate a writeclock output signal80. The delay or amount of phase adjustment may be determined based on distance between thesynchronization sensor25′ and thewrite head56 and/or position of thesynchronization sensor25′ relative to thewrite head56. The delay or amount of phase adjustment may alternatively be based on the phase error and/or a calibrated phase shift value, as further described below. The writeclock output signal80 may be provided to thewrite head56 and/or used to control write operations of thewrite head56. Examples of the bit islandpattern detection module50, the clockphase adjustment module52, and the writeclock generation module54 are shown inFIGS. 4,5 and7.
InFIG. 3, a write head and synchronization sensor relationship is shown. Asynchronization sensor100 and awrite head102 are mounted on aslider104. Tracks ofBPM108 rotate relative to theslider104 in a direction indicated byarrow110. Thesynchronization sensor100 is used to detect a bit island pattern of a track (e.g., track1) while thewrite head102 writes bits in bit islands103 of a different track (e.g., track3). Phase of a write clock signal may be adjusted based on the bit island pattern detected using thesynchronization sensor100. The write clock signal may be provided to the write head and/or used to write data via thewrite head102. Thewrite head102 and synchronization sensor relationship ofFIG. 3 may be used in the implementations ofFIGS. 1,4,5, and7.
InFIGS. 4-5, first and second writeclock synchronization systems120,122 for a first synchronization sensor124 (e.g., optical sensor) are shown. Although the writeclock synchronization systems120,122 are described primarily in association with an optical sensor, the writeclock synchronization systems120,122 may be used with other types of synchronization sensors.
The writeclock synchronization systems120,122 include phase lock loops (PLLs) with bit islandpattern detection modules126,126′, aloop filter128, and clockphase adjustment modules130,130′. The bit islandpattern detection modules126,126′generate phase error signals132,132′ based on sensor signals from thefirst synchronization sensor124. Theloop filter128 filters the phase error signals to generate filtered phase error signals134,134′. The clockphase adjustment modules130,130′ may adjust and/or select a write clock signal from a writeclock generation module140 based on the filtered phase error signals134,134′. The clockphase adjustment modules130,130′ may adjust phase and/or frequency of the write clock signal and/or select the phase and/or frequency of the write clock signal.
The bit islandpattern detection modules126,126′ include asensor filter module146, an analog-to-digital converter (ADC)148, andphase error modules150,150′. The clockphase adjustment modules130,130′ include aphase interpolator module152 and may include a phase shifter module153 (shown inFIG. 4). Output of thephase interpolator module152 is provided to a frequency converter154 (e.g., N:1 frequency converter), where N is an integer greater than 1. The frequency converter280 generates write clock output signals142,142′, which may be provided to awrite head144.
The first and second writeclock synchronization systems120,122 may include respective a phaseshift calibration modules205,205′ withmemories207,207′. The memories may store phase shift values209,209′ and/or performance parameter values211,211′. Thevalues209,209211,211′ may be calibrated values and/or values determined and/or calculated by the phaseshift calibration modules205,205′. Use and operation of the phaseshift calibration modules205,205′ are described below with respect toFIGS. 6,8,11 and12.
Referring now also toFIG. 6, method(s) of synchronizing write clock signals of the writeclock synchronization systems120,122 ofFIGS. 4-5 are shown. Although the following tasks202-212 are primarily described with respect to the implementations ofFIGS. 4 and 5, the tasks202-212 may be easily modified to apply to other implementations of the present disclosure. The tasks202-212 and/or a portion thereof may be iteratively performed. The method may begin at200.
At202, a bit island pattern detection module (e.g., one of the bit islandpattern detection modules126,126′) detects a bit island pattern and generates a phase error signal (e.g., one of the phase error signals132,132′). At202A, thesensor filter module146 filters a sensor signal generated by thefirst synchronization sensor124 to remove noise from the sensor signal. Thesensor filter module146 generates a filtered sensor signal. Thesensor filter module146 filters and/or processes the sensor signal to generate the filtered sensor signal, which may have a periodic and/or sinusoidal pattern. Thesensor filter module146 may convert the sensor signal having a periodic pattern into the filtered sensor signal having a sinusoidal pattern.
At202B, theADC148 samples and converts the filtered sensor signal from an analog signal to a digital signal. The sampling rate of theADC148 may be a multiple M of the frequency of data in the analog signal, where M is an integer greater than 1. The digital signal can be represented by, for example,equation 1 below, where x[n] is the filtered sensor signal, n is the sample number, N is the total number of samples, A is amplitude, f is frequency, and θ is phase of the filtered sensor signal.
x[n]=Asin(2πfn+θ),n=0, 1, . . . ,N−1  (1)
TheADC148 may sample the filtered sensor signal based on a phase adjusted clock signal (e.g., an interpolated clock signal generated at206). The phase adjusted clock signal may be generated by the phase shifter module153 (as shown inFIG. 4) or by the phase interpolator module152 (as shown inFIG. 5). Frequency of the interpolated clock signal may be greater than the data bit frequency to avoid aliasing.
At202C, a phase error module (e.g., one of thephase error modules150,150′) estimates phase (and/or frequency) of the digital signal. As a first example, the estimated phase may be determined using equation 2 below, where {circumflex over (θ)} is the estimated phase.
θ^=tan-1(n=0N-1×[n]cos(2πfn)n=0N-1×[n]sin(2πfn))(2)
As another example, the phase error module may estimate the phase of the digital signal using, for example, equations 3 and 4 below based on an assumption that phase error ε is small.
x[0]=Asin(θ)≈  (3)
{circumflex over (θ)}=  (4)
In this example, the sample x[0] provides an estimate of the phase and can be used as an estimate of the phase error ε at202D (i.e. ε≈x[n]), wherein x[0] is proportional to the phase θ.
At202D, the phase error module determines the phase error ε and generates the phase error signal based on the estimated phase {circumflex over (θ)} and a first predetermined (or desired) phase θD. The first predetermined phase θDmay, for example, be set to 0. The phase error ε may be determined using, for example, equation 5.
ε=θD−{circumflex over (θ)}  (5)
The phase error ε may be equal to −{circumflex over (θ)} when the first predetermined phase θDis set equal to 0.
At202D1, the first predetermined phase θDmay be adjusted by the phase shift calibration module205 (shown inFIG. 5) included in the writeclock synchronization system120. A phase shift value (or phase offset) may be used to adjust and/or offset the first predetermined phase θD. A method of calibrating the phase shift values is described with respect toFIGS. 9-11. Task202D1 may be performed instead oftask208.
At204, theloop filter128 filters the phase error signal to suppress noise associated with the phase error computations performed at202. Theloop filter128 may be a proportional-integral (PI) type filter with a transfer function provided by, for example equation 6 below, where H(z) is the transfer function, α and β are constants.
H(z)=α+β1-z-1(6)
At206, thephase interpolator module152 performs one or more of the following operations: adjusts phase of a write clock signal generated by the writeclock generation module140; selects phase of the write clock signal; and/or selects a write clock signal based on the output of the loop filter128 (filtered phase error signal). Thephase interpolator module152 performs the operations to generate the interpolated clock signal with phase that minimizes the resulting phase error determined at202D. Thephase interpolator module152 may also adjust frequency and/or select a frequency of the write clock signal(s) generated by the writeclock generation module140 relative to a frequency of the bit islands. The frequency of the write clock signal(s) generated by the writeclock generation module140 may be adjusted such that frequency of a write clock output signal generated at206B is the same as frequency of the sensor signal.
The phase and frequency control performed by thephase interpolator module152 ensures that the interpolated clock signal, subsequent to frequency conversion by thefrequency converter154, is aligned with (i.e., has the same phase and/or frequency as) the sensor signal. This minimizes a bit error rate (BER) of the data written to the bit islands. Since the sensor signal contains timing information associated with the bit island patterns on BPM, frequency of the write clock output signal is the same as frequency of the bit islands and/or bits passing thefirst synchronization sensor124. The write clock output signal is generated by thefrequency converter154 at206B.
The writeclock generation module140 may generate one or more write clock signals. Each of the write clock signals may have a different fixed phase. For example, the writeclock generation module140 may generate write clock signals having phases provided by, for example, equation 7 below, where θwis the phase for a write clock signal i, i is the write clock signal number, I is the number of different phases and/or write clock signals.
θW=2πiI,i=0,1,,I-1(7)
The writeclock generation module140 may generate the write clock signals based on the output of theloop filter128. The writeclock generation module140 may select phase(s) of the write clock signals based on the output of theloop filter128. The output of theloop filter128 may be a “phase jump” or amount of phase adjustment to be: applied to a write clock signal generated by the writeclock generation module140; used to select a phase of the write clock signal; and/or used to select a write clock signal generated by the writeclock generation module140.
Thephase interpolator module152 may select two phases that are closest to a second predetermined (or desired) phase. The write clock signals with the two phases may be linearly combined to generate the interpolated clock signal with the second predetermined phase. Thephase interpolator module152 may interpolate between the two phases or write clock signals to generate the interpolated clock signal. The interpolation allows a write clock signal with any arbitrarily selected phase value to be generated regardless of whether the hardware associated with the write clock generation module is phase limited. The writeclock generation module140 may include delay elements to provide write clock signals with different phase.
At208, thephase shifter module153 may generate the phase shifted write clock signal based on the interpolated clock signal. Thephase shifter module153 may adjust phase of the interpolated clock signal based on a phase shift value from the phaseshift calibration module205′ (shown inFIG. 4).
The phaseshift calibration module205′ selects the phase shift value that has the best performance parameter value or set of performance parameter values (e.g., the performance parameter values211). As an example, the phaseshift calibration module205′ may select a phase shift value associated with a minimum phase error value and adjust the interpolated clock signal based on the phase shift value.
A method of calibrating phase shift values is described with respect toFIGS. 9-11. Although the phase shift values generated by the phaseshift calibration modules205,205′ may be provided to thephase shifter module153 and/or thephase error module150′, the phase shift values may also be provided to thephase interpolator module152. Thephase interpolator module152 may adjust and/or select phase of the write clock signal generated by the writeclock generation module140 based on a selected phase shift value.
Thephase shifter module153 adjusts the phase of the interpolated clock signal to maintain a constant phase difference between the phase of the sensor signal and phase of the interpolated clock signal. The interpolated clock signal may be adjusted to be in alignment (in phase) with the sensor signal and/or the digital signal. The constant phase difference may be a predetermined difference.Task208 may be performed instead of task202D1.
Use of thephase shifter module153 can improve calibration of the phase shift values, which improves phase locking performance of the PLL.Task202 may be performed subsequent totask208.
At206B, thefrequency converter154 converts the interpolated clock signal into the write clock output signal. Frequency of the write clock output signal may be the same as frequency of the sensor signal and/or frequency of the bit islands. At210, data may be written to the bit islands based on the write clock output signal. The method may end at212.
InFIG. 7, a writeclock synchronization system250 for a second type of synchronization sensor252 (e.g., magnetic sensor) is shown. Although the writeclock synchronization system250 is described primarily in association with a magnetic sensor, the writeclock synchronization system250 may be used with other types of synchronization sensors.
The writeclock synchronization system250 includes a bit islandpattern detection module254, aloop filter module256, and a clockphase adjustment module258. The bit islandpattern detection module254 generates a phase error signal based on a sensor signal from thesynchronization sensor252. Theloop filter module256 filters the phase error signal. The clockphase adjustment module258 may adjust and/or select a write clock signal from a writeclock generation module260 based on the filtered phase error signal.
The bit islandpattern detection module254 includes asensor filter module264, anADC266, anequalizer268, aviterbi detector270, asignal reconstruction module272, and aphase error module274. The clockphase adjustment module258 includes aphase shifter module276 and aphase interpolator module278.
Referring now also toFIG. 8, a method of synchronizing a write clock signal generated by the writeclock synchronization system250 ofFIG. 7 is shown. Although the following tasks302-312 are primarily described with respect to the implementation ofFIG. 7, the tasks302-312 may be easily modified to apply to other implementations of the present disclosure. The tasks302-312 and/or a portion thereof may be iteratively performed. The method may begin at300.
At302, the bit-pattern detection module254 detects the bit island pattern and generates the phase error signal. At302A, thesensor filter module264 filters the sensor signal generated by thesecond synchronization sensor252 to remove noise from the sensor signal. Thesensor filter module264 generates a filtered sensor signal. The filtered sensor signal has a periodic pattern and through filtering may have a sinusoidal pattern.
At302B, theADC266 samples the filtered sensor signal and converts the sensor signal from analog signal to a digital signal x[n]. TheADC266 may sample the filtered sensor signal based on a phase adjusted clock signal (e.g., an interpolated clock signal generated at306). The phase adjusted clock signal may be generated by thephase shifter module276. The digital signal x[n] may be represented by, for example, equation 8 below, where a[k] is the bit polarization of the kthmagnetic island, p[n] is the impulse response function of a signal bit island, and n and k are integers.
x[n]=Σka[k]p[n−k]  (8)
At302C, theequalizer268 equalizes the digital signal x[n] to generate equalized signal y[n]. The equalized signal y[n] may be represented by, for example, equation 9 below, where q[n] is a predetermined pulse shape.
y[n]=Σka[k]q[n−k]  (9)
In the presence of phase error ε, y[n] may be represented by, for example,equation 10.
y[n]=Σka[k]q[n−k−ε]  (10)
A magnetic sensor, such as thesynchronization sensor252, senses pre-written data on the BPM. Due to the presence of inter-symbol interference (ISI), the digital signal is equalized prior to detection of stored bits. Theequalizer268 mitigates the effect of the interferences by converting the pulse shape associated with p[n] to the predetermined pulse shape q[n]. Theequalizer268 removes unrecognizable variances and/or irregularities in p[n] to generate q[n], which is recognizable by theViterbi detector270.
At302D, theViterbi detector270 detects the bit sequence a[k], k=1, 2, . . . since the predetermined pulse shape q[n] is recognizable. At302E, thesignal reconstruction module272 generates a reconstructed signal based on the detected bit sequence a[k], k=1, 2, . . . . The reconstructed signal may be represented by, for example,equation 11.
z[n]=Σka[k]q[n−k]  (11)
At302F, thephase error module274 estimates the phase error based on the equalized signal y[n] and the reconstructed signal z[n]. The phase error may be derived based on a difference between the equalized signal y[n] and the reconstructed signal z[n].
In one implementation, the phase error is determined based on a peak in a cross-correlation between up-sampled versions of the equalized signal y[n] and the reconstructed signal z[n].Equation 12 may be provided using a first order approximation to link y[n] to z[n].
y[n]=ka[k]q[n-k-ɛ]ka[k]q[n-k]-(ka[k]q[n-k]-ka[k]q[n-k-1])ɛz[n]-(z[n]-z[n-1])ɛ(12)
The estimated phase error {circumflex over (ε)} may be determined using, for example, equation 13 below, which may be derived based onequation 12.
ɛ^=n=0N-1(y[n]-z[n])(z[n-1]-z[n])n=0N-1(z[n-1]-z[n])2(13)
At302F1, thephase error module274 may adjust the estimated phase error {circumflex over (ε)} based on a phase shift value generated by a phaseshift calibration module303. The phaseshift calibration module303 may includememory305 and store phase shift values307.
A phase shift value (or phase offset) associated with a best performance parameter value and/or set of performance parameter values (e.g., performance parameter values309) may be selected and used to adjust or offset the estimated phase error {circumflex over (ε)}. A method of calibrating the phase shift value is described with respect toFIGS. 9-11. Task302F1 may be performed instead oftask308.
At304, theloop filter module256 filters the phase error signal to suppress noise associated with the phase error computations at302. Theloop filter module256 may be a proportional-integral (PI) type filter with a transfer function provided by, for example, equation 6.
At306, thephase interpolator module278 performs one or more of the following operations: adjusts phase of a write clock signal generated by the writeclock generation module260; selects a write clock signal phase; and/or selects a write clock signal based on the output of the loop filter module256 (filtered phase error signal). Thephase interpolator module278 performs the operations to adjust write clock phase relative to the bit island pattern to minimize the resulting phase error determined at302F. Thephase interpolator module278 may also adjust frequency and/or select frequency of the write clock signal relative to frequency of the bit islands, such that the write clock output signal has the same frequency as the frequency of the sensor signal.
The phase control performed by thephase interpolator module278 ensures that the interpolated clock signal (the write clock output signal) generated at306 is aligned with (i.e., has the same phase as) the sensor signal. Since the sensor signal contains timing information associated with the bit island patterns on the BPM, frequency of the write clock output signal is the same as frequency of the bit islands or bits passing thesynchronization sensor252.
The output of theloop filter module256 is a “phase jump” or amount of phase adjustment to be applied to a write clock signal generated by the write clock generation module; used to select a phase of the write clock signal; and/or used to select a write clock signal generated by the writeclock generation module260.
The writeclock generation module260 may generate one or more write clock signals. Each of the write clock signals may have a different fixed phase. For example, the writeclock generation module260 may generate write clock signals having phases provided by, for example, equation 7. The writeclock generation module260 may generate the write clock signals based on the output of theloop filter module256. The writeclock generation module260 may select phase(s) of the write clock signals based on the output of theloop filter module256.
Thephase interpolator module278 may select two phases that are closest to a predetermined (or desired) phase. The write clock signals with the two phases may be linearly combined to generate the interpolated clock signal with the predetermined (or desired) phase. Thephase interpolator module278 may interpolate between the two phases or write clock signals to generate the interpolated clock signal.
At308, thephase shifter module276 may generate the phase shifted write clock signal based on the interpolated clock signal. Thephase shifter module276 may adjust phase of the interpolated clock signal based on a phase shift value from the phaseshift calibration module303. A phase shift value maintains a phase difference between a desired write clock signal and the sensor signal, because a constant phase difference may exist between the desired write clock signal and an expected sensor signal. A method of calibrating the phase shift values is described with respect toFIGS. 9-11.
Thephase shifter module276 adjusts the phase of the interpolated clock signal to maintain a constant phase difference between the phase of the sensor signal and phase of the interpolated clock signal. The interpolated clock signal may be adjusted to be in alignment (in phase) with the sensor signal. The constant difference may be a predetermined difference.Task308 may be performed instead of task302F1.
At310, data may be written to the BPM based on the write clock output signal. The method may end at312.
Test Write Calibration
Phase difference between a sensor signal generated by a synchronization sensor and a desired write clock signal can vary based on temperature and BPM imperfections. A test write calibration method is described below to account for these variations.
A test write may be performed occasionally and/or regularly to calibrate a phase shift provided to a phase shifter module (e.g, provided by one of thephase shifter modules153,150′,276 ofFIGS. 4,5 and7). The terms “occasionally and/or regularly” may refer to performing a test write: subsequent to each power ON event of a HDD system, subsequent to each cycle of a recurring predetermined period; each time a predetermined number of write errors are detected; subsequent to each time a predetermined number of write operations is performed; etc. The phase shift values provided to the phase shift calibration modules may also be updated occasionally and/or regularly.
InFIG. 9, a top view of azone350 of BPM with connected bit islands is shown. Thezone350 includesbit islands352 andgrooves354. Thebit islands352 may be formed of magnetic material and thegrooves354 may be formed of non-magnetic material. Thezone350 includes atest write area356. Each zone of the BPM may have a dedicated test write area. Thetest write area356 may include connected bit islands together to form continuouswritable regions358. Aportion360 of thetest write area356 is shown inFIG. 10.
Referring now also toFIG. 10, a BPM track diagram of theportion360 of thetest write area356 is shown. Theportion360 includes, for example, tracks1-4, where tracks3 and4 include the continuouswritable regions358. A slider370 with a synchronization sensor372 and a write head374 may be positioned over the portion of thetest write area356. Arrow375 indicates direction of theportion360 relative to the slider370. The synchronization sensor372 may be used to detect a bit island pattern of the tracks1-2while the write head374 may write to the continuouswritable regions358 in tracks3-4.
InFIG. 11, a method of calibrating a phase shift value for continuous media and for a phase shifter module and/or a phase error module is shown.
The method includes performing a test write, as provided by tasks382-388. Although the tasks382-388 are primarily described with respect to the implementations ofFIGS. 4,5,7,9 and10, the tasks382-388 may be easily modified to apply to other implementations of the present disclosure. The tasks382-388 and/or a portion thereof may be iteratively performed. The method may begin at380.
At382, a phase shift calibration module (e.g., one of the phaseshift calibration modules205,205′,303) selects a phase shift value for a current test write. The phase shift value may be: a predetermined value, a random value, a value within a predetermined range, etc.
At384, a read/write channel module (e.g., the read/write channel module28 ofFIG. 1) and/or a write synchronization module writes a sequence of bits to the BPM in a continuous writable region (e.g., the continuouswritable region358 ofFIG. 10) based on the selected phase shift value. A periodic pattern may be written to the continuous writable region using a write clock output signal generated by, for example, one of the synchronization systems ofFIGS. 4,5 and7. For example, the periodic pattern can be “ . . . ++−−++−− . . . ”. At386, the read head (read/write head) reads the sequence of bits from the BPM.
At388, the phase shift calibration module may estimate the phase of the read back sequence (read back signal), which gives information about the error in the selected phase shift value used at382. The phase error is used to correct the selected phase shift value used at382. The phase of the read back sequence may be compared to a reference read phase value. The reference read phase value may be a calibrated and/or predetermined value. The reference read phase value may represent a correct read phase value and correspond to a correct write phase value. For example, when the phase shift value used at382 is correct such that the sequence of bits written at404 are aligned with the bit islands, the error between the phase of the read back signal and the reference read phase value is negligible and/or equal to 0. The phase shift value used at382 may be adjusted based on the phase error to align bits written in subsequent write events. The method may end at390.
In the absence of a dedicated test write area and/or continuous writable regions, a test write may be performed on discontinuous bit islands. A pre-defined bit pattern sequence is written to the discontinuous bit islands according to the write clock output signal. The same pre-defined bit pattern sequence is written with different phase shift values. The phase shift value that provides the best performance parameters is selected. This modified method may also be performed occasionally and/or regularly and based on whether there is on-going scheduled read and write operations.
InFIG. 12, a method of calibrating a phase shift value for discontinuous (discrete) media and for a phase shifter module and/or a phase error module is shown. The method includes performing a test write, as provided by tasks402-410. Although the following tasks402-416 are primarily described with respect to the implementations ofFIGS. 4,5,7,9 and10, the tasks402-416 may be easily modified to apply to other implementations of the present disclosure. The tasks402-416 and/or a portion thereof may be iteratively performed. The method may begin at400.
At402, a phase shift calibration module (e.g., one of the phaseshift calibration modules205,205′,303) selects a phase shift value for a current test write. The phase shift value may be: a predetermined value, a random value, a value within a predetermined range.
At404, a read/write channel module (e.g., the read/write channel module28 ofFIG. 1) and/or a write synchronization module writes a sequence of bits to the BPM in a discontinuous writable region (e.g., area with discrete bit islands) based on the selected phase shift value. A periodic pattern may be written to the discontinuous writable region using a write clock output signal generated by, for example, one of the synchronization systems ofFIGS. 4,5 and7. For example, the periodic pattern can be “ . . . ++−−++−− . . . ”. At406, the read head (read/write head) reads the sequence of bits from the BPM.
At408, the phase shift calibration module determines performance parameters (or performance parameter values), such as write phase errors. The phase shift calibration module may estimate the phase of the read back sequence, which gives information about the error in the selected phase shift value. The phase error is used to correct the selected phase shift value. Compare the sequence of bits written to the continuous writable region to the sequence of bits read from the continuous writable region. Each difference between the first and second sequences is a bit error. Write clock phase error may be detected via one of the phase error modules ofFIGS. 4,5 and7 and provided to the phase shift calibration module. At410, the phase shift calibration module may store the performance parameters determined at408 in memory of the phase shift calibration module
At412, the phase shift calibration module determines whether another test write is to be performed.Task402 is performed when another test write is to be performed, otherwisetask414 is performed.
At414, the phase shift calibration module determines which one of the phase shift values of the test write(s) performed has the best performance parameters. The phase shift value that provides the best performance parameters is selected. For example the phase shift value that has the smallest associated BER is selected. The performance parameters may be weighted and summed for each phase shift value to determine the phase shift value with the best associated set of performance parameters. At416, the phase shift calibration module provides the phase shift value with the best performance parameters to a phase shifter module and/or a phase error module (such as one of themodules150′,153,274,276 ofFIGS. 4,5 and7). This calibrates a phase shift value of a write synchronization system to improve write clock synchronization and minimize errors associated with writing data to and from bit islands.
The above calibration methods ofFIGS. 11 and 12 may be performed, for example, when the read/write channel is not performing scheduled read and write operations. A look-up table may be generated based on performed calibrations and stored in memory (e.g., in one of thememories207,207′,305 ofFIGS. 4,5 and7). The look-up table may include calibrated phase shift values for different zones of the BPM. The calibration methods may be repeated occasionally and/or regularly to update the calibrated phase shift values in the look-up table. The phase shift calibration module may provide the stored calibrated phase shift values to, for example, themodules150′,153,274,276 during scheduled read/write operations. The calibration methods may also be performed regularly and prior to each scheduled write operation or prior to a set of write operations.
The above-described tasks ofFIGS. 6,8,11 and12 are meant to be illustrative examples; the tasks may be performed sequentially, synchronously, simultaneously, continuously, during overlapping time periods or in a different order depending upon the application.
The broad teachings of the disclosure can be implemented in a variety of forms. Therefore, while this disclosure includes particular examples, the true scope of the disclosure should not be so limited since other modifications will become apparent upon a study of the drawings, the specification, and the following claims.

Claims (17)

What is claimed is:
1. A write clock synchronization system comprising:
a first module configured to generate a write clock signal;
a second module configured to, based on a sensor signal received, detect a pattern of bit islands on bit-patterned media, wherein the second module is configured to determine a phase error of the write clock signal based on (i) the pattern of the bit islands, and (ii) a predetermined phase shift value;
a third module configured to at least one of adjust or select a phase of the write clock signal based on the phase error;
a fourth module configured to generate the predetermined phase shift value based on a test write; and
a fifth module configured to write data to the bit islands,
wherein during the test write
the fourth module is configured to select the predetermined phase shift value from a plurality of phase shift values,
the third module is configured to generate the write clock signal based on the predetermined phase shift value, and
the fifth module is configured to write the data to the bit islands based on the write clock signal.
2. The write clock synchronization system ofclaim 1, further comprising a synchronization sensor configured to generate the sensor signal, wherein the synchronization sensor is one of an optical sensor and a magnetic sensor.
3. The write clock synchronization system ofclaim 2, wherein the synchronization sensor is configured to detect the bit islands while a write head writes data in the bit islands.
4. The write clock synchronization system ofclaim 1, wherein the second module is configured to determine the phase error based on a phase of the sensor signal.
5. The write clock synchronization system ofclaim 1, wherein:
the fourth module is configured to determine at least one performance parameter associated with the predetermined phase shift value; and
the at least one performance parameter comprises the phase error or a bit error rate.
6. The write clock synchronization system ofclaim 1, wherein:
the third module comprises a sixth module; and
the sixth module is configured to at least one of adjust or select a phase of the write clock signal to generate an interpolated clock signal.
7. The write clock synchronization system ofclaim 6, wherein:
the fourth module is configured to perform a plurality of test writes for the plurality of phase shift values;
the plurality of phase shift values comprise the predetermined phase shift value;
the fourth module is configured to select, based on performance parameters associated with the plurality of phase shift values, the predetermined phase shift value from the plurality of phase shift values; and
the second module is configured to determine the phase error based on (i) the sensor signal, and (ii) the predetermined phase shift value.
8. The write clock synchronization system ofclaim 7, wherein:
the third module is configured to generate the interpolated clock signal based on (i) the phase error, and (ii) the write clock signal generated by the first module;
the second module comprises a seventh module configured to, based on the interpolated clock signal, convert the sensor signal to a digital signal; and
the second module comprises an eighth module configured to determine the phase error based on (i) the digital signal, and (ii) the predetermined phase shift value.
9. The write clock synchronization system ofclaim 1, further comprising a write head configured to write data on a disk, wherein:
the third module comprises a sixth module and a seventh module;
the sixth module is configured to generate an interpolated clock signal based on (i) the phase error, and (ii) the write clock signal generated by the first module;
the seventh module is configured to frequency convert the interpolated clock signal to a write clock output signal; and
the write head is configured to write the data on the disk based on the write clock output signal.
10. The write clock synchronization system ofclaim 1, further comprising a phase lock loop comprising the second module and the third module.
11. The write clock synchronization system ofclaim 10, wherein:
the third module is configured to generate an interpolated clock signal based on the phase error;
the phase lock loop further comprises a sixth module; and
the sixth module is configured to, based on a calibrated phase shift value, adjust a phase of the interpolated clock signal.
12. The write clock synchronization system ofclaim 1, wherein:
the second module is configured to determine timing information of the sensor signal; and
the third module is configured to synchronize phase and frequency of the write clock signal with the sensor signal.
13. The write clock synchronization system ofclaim 1, wherein the second module comprises:
a sixth module configured to filter the sensor signal to generate a filtered sensor signal;
a seventh module configured to convert the filtered sensor signal from an analog signal to a digital signal; and
an eighth module configured to determine the phase error based on the digital signal.
14. A write clock synchronization system comprising:
a first module configured to generate a write clock signal;
a second module configured to, based on a sensor signal received, detect a pattern of bit islands on bit-patterned media, wherein the second module is configured to determine a phase error of the write clock signal based on (i) the pattern of the bit islands, and (ii) a predetermined phase shift value;
a third module configured to at least one of adjust or select a phase of the write clock signal based on the phase error; and
a fourth module configured to generate the predetermined phase shift value based on a test write,
wherein:
the fourth module is configured to perform a plurality of test writes for a plurality of phase shift values, wherein the plurality of phase shift values comprise the predetermined phase shift value,
the fourth module is configured to, based on performance parameters associated with the plurality of phase shift values, select the predetermined phase shift value from the plurality of phase shift values, and
the third module is configured to, based on the phase error, synchronize the write clock signal to the bit islands.
15. A write clock synchronization system comprising:
a first module configured to generate a write clock signal;
a second module configured to, based on a sensor signal received, detect a pattern of bit islands on bit-patterned media, wherein the second module is configured to, based on the pattern of the bit islands, determine a phase error of the write clock signal; and
a third module configured to, based on the phase error, at least one of adjust or select a phase of the write clock signal,
wherein the third module comprises:
a fourth module configured to generate an equalized signal based on a digital version of the sensor signal,
a fifth module configured to generate a bit sequence based on the equalized signal,
a sixth module configured to generate a reconstructed signal based on the bit sequence, and
a seventh module configured to determine the phase error based on (i) the equalized signal, and (ii) the reconstructed signal.
16. The write clock synchronization system ofclaim 15, further comprising a magnetic sensor configured to generate the sensor signal.
17. The write clock synchronization system ofclaim 13, wherein:
the third module comprises a ninth module; and
the ninth module is configured to generate an interpolated clock signal based on (i) the phase error, and (ii) the write clock signal generated by the first module.
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US9355679B1 (en)*2013-11-082016-05-31Seagate Technology LlcTransducer write field curvature characterization and compensation
US11475912B1 (en)*2021-06-112022-10-18Seagate Technology LlcSynchronous writing of patterned media

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US10734016B2 (en)2018-08-212020-08-04Marvell Asia Pte, Ltd.Pulse-based writing for magnetic storage media
US12197738B2 (en)2019-01-312025-01-14Marvell Asia Pte, Ltd.Health management for magnetic storage media
US11450348B2 (en)2019-01-312022-09-20Marvell Asia Pte, Ltd.Health management for magnetic storage media
WO2020174426A1 (en)2019-02-262020-09-03Marvell Asia Pte, Ltd.Codeword interleaving for magnetic storage media
US10971187B2 (en)*2019-03-112021-04-06Marvell Asia Pte, Ltd.Constant-density writing for magnetic storage media
US12198724B1 (en)2022-07-252025-01-14Marvell Asia Pte, Ltd.Codeword interleaving over magnetic media surfaces

Citations (4)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US6643082B1 (en)1999-06-082003-11-04Seagate Technology LlcServo sector format for a patterned media
US20100073801A1 (en)*2008-09-222010-03-25Fujitsu LimitedMagnetic recording device, control device, and magnetic recording device control method
US20100123973A1 (en)*2008-11-142010-05-20Fujitsu LimitedInformation storage medium and information storage apparatus
US20100202079A1 (en)*2009-02-102010-08-12Bruce Douglas BuchWrite synchronization phase calibration for storage media

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US8508878B1 (en)2010-01-212013-08-13Marvell International Ltd.Write clock phase tracking for magnetic recording device
US8508879B1 (en)2010-01-212013-08-13Marvell International Ltd.Write clock rephase for magnetic recording device

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US6643082B1 (en)1999-06-082003-11-04Seagate Technology LlcServo sector format for a patterned media
US20100073801A1 (en)*2008-09-222010-03-25Fujitsu LimitedMagnetic recording device, control device, and magnetic recording device control method
US20100123973A1 (en)*2008-11-142010-05-20Fujitsu LimitedInformation storage medium and information storage apparatus
US20100202079A1 (en)*2009-02-102010-08-12Bruce Douglas BuchWrite synchronization phase calibration for storage media

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
"Density Multiplication and Improved Lithography by Directed Block Copolymer Assembly for Patterned Media at 1Tbit/in2 and Beyond"; Aug. 2008; pp. 1-3; Hitachi Global Storage Technologies; San Jose, CA.
U.S. Appl. No. 12/949,681, filed Nov. 18, 2010; First Named Inventor: Qiyue Zou.
U.S. Appl. No. 12/949,693, filed Nov. 18, 2010; First Named Inventor: Qiyue Zou.

Cited By (4)

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US11475912B1 (en)*2021-06-112022-10-18Seagate Technology LlcSynchronous writing of patterned media
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US11735214B2 (en)*2021-06-112023-08-22Seagate Technology LlcSynchronous writing of patterned media

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