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US7807499B2 - Stacked module and manufacturing method thereof - Google Patents

Stacked module and manufacturing method thereof
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US7807499B2
US7807499B2US11/688,362US68836207AUS7807499B2US 7807499 B2US7807499 B2US 7807499B2US 68836207 AUS68836207 AUS 68836207AUS 7807499 B2US7807499 B2US 7807499B2
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wiring board
board
wiring
chip
bump
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Yoshihiko Nishizawa
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Murata Manufacturing Co Ltd
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Murata Manufacturing Co Ltd
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Abstract

A manufacturing method of a stacked module includes a step of fabricating the first wiring board which includes a wiring pattern provided on at least one of a surface and an inner portion and a bump electrode which is integrated from the simultaneous sintering with the wiring pattern, and which extends in the vertical direction, a step of layering the first wiring board with the second wiring board having the wiring pattern provided on at least one of the surface and the inner portion thereof to be connected to the second wiring board via the bump electrode.

Description

BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to a stacked module including multiple wiring boards that are layered in a vertical direction, a stacked module in which each layer of the wiring boards can be precisely connected, and a manufacturing method thereof.
2. Description of the Related Art
In general, technology of this type has been disclosed in Japanese Unexamined Patent Application Publication No. 7-263625 (Patent Document 1), Japanese Unexamined Patent Application Publication No. 8-236694 (Patent Document 2, Japanese Unexamined Patent Application Publication No. 11-8474 (Patent Document 3), and Japanese Unexamined Patent Application Publication No. 11-251515 (Patent Document 4).
In Patent Document 1, a vertical layered IC chip article is disclosed which includes a discrete chip carrier made of a dielectric tape. This layered IC chip article includes a substrate including multiple fused dielectric tape layers and a hollow space defined by an opening in the upper tape layer, wherein the IC chip is disposed in the hollow space. The layered IC chip article also includes a horizontal wiring path provided on the substrate along one or more of the tape layers, a vertical wiring path which passes through the uppermost tape layer on the substrate and extends toward the horizontal wiring path, an electric connecting unit for connecting the IC chip to the vertical wiring path, a carrier mutual connecting unit for connecting between the vertical wiring paths for adjacent carriers, and a layered connecting unit which connects each carrier mutual connecting unit for performing external connections, for example, to a layered article. Thus, the amount of used surface area is reduced, the advantages of an LTCC configuration are maintained, a standard IC chip can be used, and a 3-dimensional IC chip layered article can be obtained in which substandard chips can be replaced without destroying the other chips of the layered article.
In Patent Document 2, a semiconductor package and a manufacturing method thereof are disclosed. The semiconductor package includes multiple layered carriers, said carriers having a through hole in the inner side or end surface, a conductor pattern provided on at least the surface of the carrier, an inner bonding pad which is electrically connected to the through hole provided on the end surface of the carrier, and LSI chips which are connected and fixed by the inner bonding pad, and which are also connected three-dimensionally with the through hole portion. Thus, a stacked module semiconductor package is obtained which is small, thin, and highly precise, and which has extremely short wiring lengths and good electrical properties, and which is also low-cost and highly reliable, without using wire bonding or TAB methods.
In Patent Document 3, a manufacturing method of a multi-layer board is disclosed. This manufacturing method includes a step of providing multiple boards each having electrode pads with semiconductor chips mounted on the front surface and back surface thereof, a step of layering multiple boards by narrowing the soldering member for connecting between the electrode pads of each board, and a step of heating the layered board and melting the connector soldering member to connect each board. Thus, by performing the heating process only one time, the connection reliability between the semiconductor chips and the boards is improved, the manufacturing time is decreased, and the productivity is increased.
In Patent Document 4, a layered semiconductor device module is disclosed in which thermal stress is reduced. With this layered semiconductor device module, a resin fills the spaces between the circuit boards which are made of differing materials, a printed board that functions as a dummy board is layered between the bottom-most ceramic board and a mounting printed board, under a module, and a resin also fills a space between this dummy board and the bottom-most layer of ceramic board. Thus, the terminal stress of the connecting point of the connecting portion between the ceramic board and the printed board adjacent to a BGA-type layered semiconductor device module is eased between the bottom-most layer of ceramic board and the printed wiring board for mounting the module, thereby enabling many variations of circuit board combinations as well as a larger board.
However, with a conventional stacked module manufacturing method, a soldering ball with a Cu core or a sphere-shaped metal is used as the connecting bump between the boards. Therefore, the adhesion members, such as the spheres, cannot be processed at one time as is the case with a printed paste, but rather, the spheres must be disposed one at a time, or a specialized collet must be used for disposing the spheres. Further, in order to prevent the disposed soldering balls from shifting positions, a soldering paste or flax must be provided to fix the sphere-shaped adhesive members beforehand. Therefore, when connecting the boards to one another, the manufacturing processes for forming a connecting bump as described above increase substantially, and since a large amount of time and effort are required, the product cost and the rate of defective goods are increased. With Patent Document 3, the process is simplified by reducing the heat processing from twice to once. However, the processes for painting flax on the surface electrode and for disposing the soldering ball are still required. Thus, from the perspective of the complication of the process, this is no different from the technologies disclosed in the other Patent Documents. In addition, because of the complications involved in the process, a region in the vicinity of the soldering balls must be provided in which certain components cannot be mounted, which prevents the size of the product from being sufficiently reduced.
SUMMARY OF THE INVENTION
To overcome the problems described above, preferred embodiments of the present invention provide a stacked module and a simplified manufacturing method thereof which reduces the rate of defective goods, and significantly lowers the manufacturing cost. In addition, the quality of the produce is improved, and multiple stacked modules can be simultaneously manufactured.
The stacked module manufacturing method according to a preferred embodiment of the present invention includes a step of producing a first wiring board having a bump which is integrated with a board and which extends in a direction that is substantially perpendicular to the surface of the board, and a step of layering the first wiring board with a second wiring board, which includes a wiring pattern provided on at least one of the surface the inner side thereof, and connecting the second wiring board via the bump.
Preferably, the first wiring board further includes a wiring pattern provided on at least one of the surface and the inner side thereof, wherein the bump is a bump electrode integrated by simultaneous sintering with the wiring pattern.
Preferably, the stacked module manufacturing method further includes a step of fabricating a board ceramic green body having a low-temperature sintering ceramic as a primary component and having a green wiring pattern on at least one of the surface and inner side thereof, a step of fabricating a shrinkage suppressing ceramic green body having a hard-to-sinter ceramic as a primary component which is not sintered with the low-temperature sintering ceramic, and having a green via conductor defining the bump electrode, a step of layering the shrinkage suppressing ceramic green body on at least one principal surface of the board ceramic green body, a step of baking both of the ceramic green bodies at a baking temperature for the low-temperature sintering ceramics, and while sintering the board ceramic green body, integrating the green wiring pattern and the green via conductor by simultaneous sintering, and a step of removing the shrinkage suppressing ceramic green body.
Preferably, in the stacked module manufacturing method, the first wiring board further includes the bump electrode on a first principal surface thereof, and at least one of a chip-type passive component and a chip-type active component disposed on at least one of the first principal surface and a second principal surface facing the first principal surface, as a surface mounted component.
Preferably, the first wiring board includes a chip-type active component connected to the first principal surface via a bonding wire.
Preferably, the first wiring board includes a chip-type active component connected to the second principal surface via a soldering bump.
Preferably, the first wiring board further includes a chip-type passive component on the second principal surface, wherein a ceramic sintered article defines an element body and includes a terminal electrode.
Preferably, the bump electrode of the first wiring board has a tapered cross-sectional shape.
Preferably, the bump electrode of the first wiring board is connected to the wiring pattern provided on the surface of the second wiring board via a brazing metal.
Preferably, the first wiring board further includes at least one of a chip-type passive component and a chip-type active component on a second principal surface thereof, and the second wiring board further includes an external connecting electrode on the first principal surface thereof, and another chip-type passive component or chip-type active component on a second principal surface thereof which faces the first principal surface, wherein the wiring pattern of the first wiring board and the wiring pattern of the second wiring board are connected via the bump electrode on the first wiring board, so that the first principal surface of the first wiring board and the second principal surface of the second wiring board face one another.
Preferably, the second wiring board also includes a bump electrode disposed thereon, integrated with the wiring pattern thereof by simultaneous sintering, and wherein the first wiring board and the second wiring board are connected by connecting the bump electrode of the first wiring board and the bump electrode of the second wiring board.
The bump electrode may be provided on both principal surfaces of the first wiring board.
Preferably, the stacked module manufacturing method further includes a step whereby the first wiring board and the second wiring board are connected in a combination board state, and are divided into individual stacked modules.
When the combination board state is divided as described above, the bump electrode is also divided, such that the stacked modules including the divided surface of the bump electrode define a side surface electrode.
In the stacked module manufacturing method, a space between the first wiring board and the second wiring board is sealed with a resin.
A stacked module according to another preferred embodiment of the present invention includes a first wiring board having a bump which is integrated with a board and which extends in a direction that is substantially perpendicular to the surface of the board, and a second wiring board having a wiring pattern provided on at least one of the surface and the inner side thereof, which is layered on the first wiring board and is connected to the first wiring board via the bump of the first wiring board.
Preferably, the first wiring board further includes a wiring pattern provided on at least one of the surface and the inner side thereof, wherein the bump is a bump electrode integrated by simultaneous sintering with the wiring pattern.
Preferably, the first wiring board is a wiring board with a low-temperature sintering ceramic as the primary component thereof.
Preferably, the first wiring board further includes the bump electrode on a first principal surface thereof, and at least one of a chip-type passive component a chip-type active component on at least one of the first principal surface and a second principal surface facing the first principal surface, as a surface mounted component.
Preferably, the bump electrode of the first wiring board has a tapered cross-section.
Preferably, the first wiring board further includes at least one of a chip-type passive component and a chip-type active component on a second principal surface thereof, and the second wiring board further includes an external connecting electrode on the first principal surface thereof, and another chip-type passive component or chip-type active component on a second principal surface thereof which surfaces the first principal surface, wherein the wiring pattern of the first wiring board and the wiring pattern of the second wiring board are connected via the bump electrode on the first wiring board, such that the first principal surface of the first wiring board and the second principal surface of the second wiring board are facing one another.
Preferably, the side surface of the bump electrode defines the side surface electrode on the same plane as the side surface of the first wiring board.
In the stacked module, a space between the first wiring board and the second wiring board is preferably sealed with a resin.
According to preferred embodiments of the present invention, a stacked module and a manufacturing method thereof are provided which simplify the manufacturing process thereof, reduce the rate of defective goods, and lower the cost significantly. In addition, the quality of the product is improved, and multiple stacked modules can be simultaneously produced.
Other features, elements, steps, characteristics and advantages of the present invention will become more apparent from the following detailed description of preferred embodiments of the present invention with reference to the attached drawings.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a cross-sectional view illustrating a preferred embodiment of the stacked module according to the present invention.
FIGS. 2A through 2D are process diagrams each illustrating the main portions of a manufacturing process of the stacked module illustrated inFIG. 1.
FIGS. 3A through 3D are process diagrams each illustrating the main portions of a manufacturing process of the stacked module illustrated inFIG. 1.
FIGS. 4A and 4B are process diagrams each illustrating the main portions of a manufacturing process of the stacked module illustrated inFIG. 1.
FIGS. 5A through 5C are process diagrams illustrating yet another preferred embodiment of the stacked module according to the present invention.
FIG. 6 is a perspective view illustrating a preferred embodiment of a wiring board configuring a combination board including a plurality of the stacked modules according to the present invention.
FIG. 7 is a cross-sectional view illustrating a portion of the combination board including the wiring board illustrated inFIG. 6.
FIGS. 8A through 8C are diagrams illustrating other preferred embodiments of the combination board including a plurality of stacked modules according to the present invention, whereinFIG. 8A is a cross-sectional view illustrating a portion thereof,FIG. 8B is a cross-sectional view illustrating a stacked module divided from the combination board, andFIG. 8C is a cross-sectional view illustrating a bump electrode portion of the stacked module illustrated inFIG. 8B.
FIG. 9 is a perspective view illustrating the wiring board configuring the combination board illustrated inFIG. 8A.
FIGS. 10A and 10B are each cross-sectional diagrams illustrating the state of the stacked module illustrated inFIG. 8A mounted on a motherboard.
FIGS. 11A and 11B are each cross-sectional diagrams illustrating yet another preferred embodiment of the stacked module according to the present invention.
FIGS. 12A and 12B are each cross-sectional diagrams illustrating a bump electrode configuring the stacked module according to the present invention.
FIGS. 13A through 13D are each process diagrams illustrating a manufacturing process of yet another preferred embodiment of the stacked module according to the present invention.
FIGS. 14A and 14B are each process diagrams illustrating the main portions of a manufacturing process of yet another preferred embodiment of the stacked module according to the present invention.
FIGS. 15A and 15B are each process diagrams illustrating the main portions of a manufacturing process of yet another preferred embodiment of the stacked module according to the present invention.
FIG. 16 is a cross-sectional diagram illustrating a mounting state of a surface mounted component of yet another preferred embodiment of the stacked module according to the present invention.
FIGS. 17A and 17B are cross-sectional diagrams illustrating a mounting state of a surface mounted component of yet another preferred embodiment of the stacked module according to the present invention.
FIG. 18 is a cross-sectional view illustrating yet another preferred embodiment of the stacked module according to the present invention.
DETAILED DESCRIPTION OF PREFERRED EMBODIMENTS
The present invention will be described in the context of various preferred embodiments with reference toFIG. 1 throughFIG. 18.
First Preferred Embodiment
A stackedmodule10 according to the present preferred embodiment, as shown inFIG. 1, includes afirst wiring board11, asecond wiring board12 disposed on the lower side of thefirst wiring board11, athird wiring board13 disposed on the upper side of thefirst wiring board11, wherein the first, second, andthird wiring boards11,12, and13 are arranged so as to be layered with thefirst wiring board11 disposed in the center in a vertical direction thereof, and, for example, can be configured to be mounted on a mounting board, such as a motherboard (not shown).
As shown inFIG. 1, thefirst wiring board11 includes a boardmain unit11A preferably made of a ceramic material, for example, awiring pattern11B provided on the boardmain unit11A in a predetermined pattern,multiple bump electrodes11C which are connected to thewiring pattern11B and which extend vertically downward from the first principal surface (lower surface) of the boardmain unit11A. Thefirst wiring board11 is connected to asecond wiring board12 via themultiple bump electrodes11C. Thewiring pattern11B includes an in-plane conductor11D provided in the boardmain unit11A in a predetermined pattern, and a viaconductor11E which connects the in-plane conductors11D and/or extends toward the upper surface and second principal surface (lower surface) of the boardmain unit11A from the in-plane conductor11D.
Also, as shown inFIG. 1, asurface electrode11F, which is a type of in-plane conductor, is provided on the multiple viaconductors11E which are arranged on the inner side of thebump electrodes11C and protrudes on the upper surface of thefirst wiring board11, and multiple chip-typepassive components14, such as chip-type capacitors or chip-type inductors, in which a ceramic sintered article is an element body thereof, for example, are mounted to thesurface electrodes11F via terminal electrodes via a method using conventionally known solder as a surface mounted component. Also, the height of thebump electrodes11C can be appropriately adjusted according to the height of the surface mounted components. The height of the bump electrodes described hereafter can be similarly adjusted. Note that from the perspective of the strength of a cylindrical shaped bump electrodes, the diameter thereof is preferably greater than the diameter of the via conductors within the wiring board.
As shown inFIG. 1, asecond wiring board12 includes, for example, a boardmain unit12A, awiring pattern12B and externalterminal electrodes12G, and is configured in a manner similar to thefirst wiring board11. Similar to thefirst wiring board11, thewiring pattern12B includes an in-plane conductor12D and a viaconductor12E, and while not shown, the viaconductor12E or thesurface electrode12F is connected to thebump electrode11C of thefirst wiring board11. The externalterminal electrode12G is used when being mounted onto a mounting board, such as a motherboard.
Also, as shown inFIG. 1,surface electrodes12F, which are a type of in-plane conductor, are provided on the multiple viaconductors12E which are arranged on the inner side of thebump electrodes11C of thefirst wiring board11 and protrude on the upper surface of thesecond wiring board12, and a chip-typeactive component15, such as a semiconductor device or other suitable active component, is connected to thesurface electrodes12F via asolder15A as a surface mounted component.
Also, as shown inFIG. 1, athird wiring board13 includes, for example, a boardmain unit13A, awiring pattern13B andbump electrodes13C, and is connected to the viaconductors11E or thesurface electrodes11F, which protrude on the upper surface of thefirst wiring board11 via thebump electrodes13C, to protect the inner portion thereof. Also, the in-plane conductor13D of thethird wiring board13B is defined by a shield electrode, for example, wherein the chip-typepassive components14 or the chip-typeactive components15 within the stackedmodule10 are protected from an external electromagnetic field by this shield electrode.
InFIG. 1, a configuration in which only a chip-typepassive component14 is mounted on the upper surface of thefirst wiring board11 is illustrated. However, chip-typeactive components15 other than chip-typepassive components14 may be mounted as required, and alternatively, only a chip-typeactive component15 may be mounted. Also, on the lower surface of thefirst wiring board11, chip-typepassive components14 and/or chip-typeactive components15 may also be mounted at locations in which these components do not interact with the surface mounted components of thesecond wiring board12. Thesecond wiring board12 can be similarly configured. That is to say, chip-typepassive components14 and/or chip-typeactive components15 may be mounted on each of the upper surfaces and the lower surfaces of the first andsecond wiring boards11 and12, as required.
Accordingly, with the first, second, andthird wiring boards11,12, and13, therespective wiring patterns11B,12B, and13B are each electrically connected via thebump electrodes11C and13C, and the chip-typepassive components14 and chip-typeactive components15 perform functions according to a predetermined objective. Note that the boardmain units11A,12A, and13A include multiple (two layers in the present preferred embodiment) layers of ceramic layers.
The boardmain units11A,12A, and13A of the first, second, andthird wiring boards11,12, and13 are each made of a ceramic material. As a ceramic material, for example, a low-temperature sintered ceramic (LTCC: Low Temperature Co-baked Ceramic) material may be used. A low-temperature sintered ceramic is a ceramic material which can be sintered at a temperature of about 1050° C. or less and which permits simultaneous baking with silver or copper which have low specific resistances. As for a low-temperature sintered ceramic, specifically, a glass complex system LTCC material which combines a borate silicate acid with a ceramic powder, such as alumina, forsterite or other suitable ceramic powder, a crystallized glass LTCC material using a crystallized glass of a ZnO—MgO—Al2O3—SiO2, a non-glass LTCC material using a BaO—Al2O3—SiO2ceramic powder, a Al2O3—CaO—SiO2—MgO—B2O3ceramic powder or other suitable ceramic powder, are examples thereof.
Thewiring patterns11B,12B, and13B, thebump electrodes11C and13C, and the externalterminal electrode12C may each be made of a conductive metal. For the conductive metal, a metal including at least one type of Ag, Ag—Pt alloy, Cu, Ni, Pt, Pd, W, Mo, and Au as a primary component may be used. Of these conductive metals, Ag, Ag—Pt alloy, Ag—Pd alloy, and Cu are preferably used since the specific resistances thereof are low. Also, when using a low-temperature sintered ceramic as the material for the boardmain units11A,12A, and13A, a metal, such as Ag, Cu or other metal, having low resistance and a low melting point of about 1050° C. or less can be used, such that the boardmain units11A,12A, and13A,wiring patterns11B,12B, and13B,bump electrodes11C and13C, and the externalterminal electrode12C can be simultaneously baked at a low temperature of about 1050° C. or less.
Next, description will be provided regarding a preferred embodiment of the stacked module manufacturing method according to the present invention. With the present preferred embodiment, a step of fabricating thefirst wiring board11, having thewiring pattern11B provided on the surface and/or internally and abump electrode11C which is integrated with thewiring pattern11B and which extends in a vertical direction by simultaneous baking with thewiring pattern11B, and a step of connecting thefirst wiring board11 to thesecond wiring board12 by layering with thesecond wiring board12 which has awiring pattern12B provided on the surface and/or internally, via thebump electrode11C are provided.
The stacked module manufacturing method according to the present preferred embodiment will be described in detail with reference toFIG. 2A throughFIG. 4B. With the present preferred embodiment, a wiring board including a bump electrode attached thereto is fabricated using a non-contraction construction method. A non-contraction construction method is a method in which the dimensions in the planar direction of the ceramic board do not substantially change before and after baking of the ceramic board. With this non-contraction construction method, a shrinkage suppression ceramic green sheet is used, which will be described later.
1. Fabrication of Wiring Board
A. Fabrication ofFirst Wiring Board11
1) Fabrication of Ceramic Green Body for Board (Green Sheet for Board)
First, for a low temperature sintered ceramic powder, for example, a powder mixture made of an alumina powder and a borate silicate acid, for example, is adjusted. This powder mixture is scattered in an organic vehicle to adjust the slurry, and by forming this into a sheet form with a casting method, a predetermined number of the board ceramicgreen sheet111A shown inFIG. 2A are fabricated at a thickness of, for example, about 20 μm. Next, after a via hole is formed in a predetermined pattern on the board ceramicgreen sheet111A using a laser light or metal mold, for example, this via hole is filled with a conductive paste to form the green viaconductor111E. For a conductive paste, for example, Ag can be used as the primary component therein. Next, the same conductive paste can be printed onto the board ceramicgreen sheet111A in a predetermined pattern using a screen printing method, for example, to form a green in-plane conductor111D. Also, a green viaconductor111′E and agreen surface electrode111′F are similarly formed on another board ceramicgreen sheet111′A. In this case, a capacitor, a coil, and a shielding ground electrode are formed on one or both of the board ceramicgreen sheets111A and111′A, thereby providing the capacitor, the coil, and the shielding ground electrode in both of the board ceramicgreen sheets111A and111′A.
2) Fabrication of Shrinkage Suppression Ceramic Green Compact (Shrinkage Suppression Ceramic Green Sheet)
The shrinkage suppression ceramic green sheet includes hard-to-sinter ceramic as the primary component thereof, which cannot sinter at the baking temperatures of low temperature sintered ceramics. For a hard-to-sinter ceramic powder, for example, an alumina powder is prepared, this alumina powder is scattered in an organic vehicle to adjust the slurry, and by forming this into a sheet shape with a casting method, a predetermined number of the shrinkage suppression ceramicgreen sheets100 shown inFIG. 2A are fabricated. The baking temperature of the shrinkage suppression ceramicgreen sheet100 is about 1500° C. to about 1600° C., and since a baking temperature significantly higher than that of the sintering temperature (about 1050° C. or less) for the board ceramicgreen sheet111A formed from low-temperature sintered ceramic is required, sintering is not performed at the baking temperature for the board ceramicgreen sheet111A. After forming via holes for the bump electrodes in a predetermined pattern on the shrinkage suppression ceramicgreen sheet100 using laser light or a metal mold, a green viaconductor111C is formed within this via hole. For example, three of these shrinkage suppression ceramicgreen sheets100 are fabricated as shown inFIG. 1. Three shrinkage suppression ceramicgreen sheets100 are also similarly fabricated as shown in the same diagram without the green viaconductor111C. For a hard-to-sinter ceramic powder, for example, other than alumina, a ceramic powder, such as zirconia or magnesia, may be used. For the shrinkage suppression ceramicgreen sheets100, a ceramic component which is the same as the ceramic component included in the board ceramicgreen sheet111A is preferable. Note that when electrical conductivity is not required at a particular portion, the via hole at that portion can be filled with a ceramic paste (a low-temperature sintered ceramic as the primary component), thereby also enabling this via hole to be used as a connecting bump, such as a spacer.
3) Fabrication of Layered Article
As shown inFIG. 2B, three shrinkage suppression ceramicgreen sheets100A which do not include the green viaconductor111C are layered, and on top of this, a board ceramicgreen sheet111′A having a green surface electrode111F is layered with the board ceramicgreen sheet111′A facing downwards, and further, on top of this, a board ceramicgreen sheet111A having a green in-plane conductor111D is layered with the green in-plane conductor111D facing downwards. Next, after layering the three shrinkage suppression ceramicgreen sheets100 having green viaconductors111C, each layer is pressed and pressure bonded at a pressure of about 200 kg/cm2to about 1500 kg/cm2in the layered direction (vertical direction) so as to obtain alayered article111 shown inFIG. 2B, wherein these layers are integrated.
4) Baking of the Layered Article
If thelayered article111 is baked at a predetermined temperature of about 1050° C. or less, for example, the shrinkage suppression ceramicgreen sheets100 and100A are not sintered, and since shrinkage does not occur in the facing direction, even if thegreen wiring pattern111B, the green viaconductor111C of the board ceramicgreen sheet111A, green in-plane conductor111D and other elements are sintered and integrated, shrinkage does not occur in the facing direction because of the shrinkage suppression ceramicgreen sheets100 and100A. Thus, thefirst wiring board11 shown inFIG. 2C can be fabricated with the highlyprecise wiring pattern11B, which is only shrunk in the height direction, and thebump electrode11C. Since thefirst wiring board11 is only shrunk in the height direction, this enables a reduced height of the stackedmodule10. With the baking, the shrinkage suppression ceramicgreen sheets100 and100A become an aggregate of alumina powder because the organic vehicle is burnt up. The alumina powder aggregate can be easily removed with a blasting process. Thus, by removing the alumina powder, thefirst wiring board11 is easily obtained. For example, when the board ceramicgreen sheet111A has a thickness of about 20 μm, the total thickness is about 40 μm thick when two layers are provided. However, with the baking, the board ceramicgreen sheet11A can be shrunk down in the height direction to obtain a boardmain unit11A having a thickness of about 20 μm.
5) Plating Processing
Following fabrication of thefirst wiring board11, a plating process is performed with a metal plating, for example, on thebump electrode11C and thesurface electrode11F, which increases the wettability of the contact member, such as solder or other suitable contact member.
6) Mounting of Surface Mounted Components
In the case of mounting a chip-typepassive component14 on thefirst wiring board11, thebump electrode11C is faced downward as shown inFIG. 2D, thesurface electrode11F is faced upward, and the chip-typepassive components14 are mounted on the surface (second principal surface) on which thebump electrode11C is not formed. In this case, after coating thepredetermined surface electrode11F with a soldering paste using a metal mask, for example, the chip-typepassive component14 is mounted using a mounter and positioned. Next, by performing a heating process, such as a reflow process, the solder is melted and the chip-typepassive component14 is mounted on the upper surface of thefirst wiring board11, as shown inFIG. 2D. Thus, when using a metal mask at the time of mounting, the metal mask must be adhered to the mounting surface, and thus, it is preferable that thebump electrode11C is not formed on the mounting surface.
With steps 1) through 6) described above, afirst wiring board11 on which surface mounted components are mounted is obtained.
B. Fabrication of Second andThird Wiring Boards12 and13
Thesecond wiring board12 is fabricated with the same procedures as thefirst wiring board11. Thesecond wiring board12 does not include any bump electrodes. Thus, when fabricating thesecond wiring board12, as shown inFIG. 3A, thesecond wiring board12 can be fabricated in the same manner as thefirst wiring board11, except for using a shrinkage suppression ceramicgreen sheet100 which does not include a green via conductor. That is to say, a board ceramicgreen sheet112A having a green in-plane conductor112D, a green externalterminal electrode112G, and a green viaconductor112E is fabricated, while fabricating a board ceramicgreen sheet112′A having a green externalterminal electrode112G and a green viaconductor112E.
Then, as shown inFIG. 3A, a predetermined number (three inFIGS. 3A and 3B) of previously fabricated shrinkage suppression ceramicgreen sheets100 are layered, and board ceramicgreen sheets112′A and112A are layered thereon in this order to be aligned and layered, following which three shrinkage suppression ceramicgreen sheets100 are layered thereon, and pressure bonding is performed at a predetermined pressure to fabricate thelayered article112 shown inFIG. 3B. Next, by baking thelayered article112 at a predetermined temperature, thesecond wiring board12 shown inFIG. 3C is obtained. Then, thesecond wiring board12 is turned over to the back side, following which the flax is coated on thesurface electrode12F, the chip-typeactive component15 is mounted via a soldering bump, for example, and by performing heating processing, thesecond wiring board12 on which the chip-typeactive component15 is mounted is obtained, as shown inFIG. 3D. Thethird wiring board13 is also fabricated using the procedures described above.
C. Layering of First, Second, andThird Wiring Boards11,12,13
In the case of layering the first, second, andthird wiring boards11,12, and13, thesewiring boards11,12, and13 are layered in a predetermined order and aligned with one another, the via conductors or surface electrode (not shown) of thesecond wiring board12 and thebump electrode11C of thefirst wiring board11 are connected, and viaconductor11E orsurface electrode11F of thefirst wiring board11 and thebump electrode13C of thethird wiring board13 are connected to produce the stackedmodule10.
As a method for connecting thebump electrode11C of thefirst wiring board11 with thesecond wiring board12, or connecting thebump electrode13C of thethird wiring board13 with thefirst wiring board11 in this event, for example, a method may be used in which a brazing metal is coated on eachbump electrode11C and13C. For a brazing metal, any liquid form or semi-liquid form is acceptable, but a soldering paste, a conductive resin, or other suitable brazing metal is preferably used.
The method for coating the brazing metal is performed as follows. That is to say, for example as shown inFIG. 4A, thebump electrode13C of thethird wiring board13 is moved in contact with the liquid brazing material B within container A, and thus, the brazing material B is directly transferred onto the tip surface of thebump electrode13C. Thebump electrode11C of thefirst wiring board11 is also similarly subjected to transfer of the brazing material, although this is not shown in the diagram. Then, as shown inFIG. 4B, following alignment of thebump electrode11C of thefirst wiring board11 and the via conductor or the surface electrode (not shown) of thesecond wiring board12, or thebump electrode13C of thethird wiring board13 and the viaconductor11E or the surface electrode of thefirst wiring board11, the first, second andthird wiring boards11,12, and13 are layered to connect these three boards as the stackedmodule10.
Also, as another coating method, for example, following the brazing material being coated on the viaconductor11E of thefirst wiring board11, alignment is performed on the viaconductor11E of thefirst wiring board11 and thebump electrode13C of thethird wiring board13 to connect thewiring boards11,13. In the case of the former method shown inFIG. 4A, the metal mask which is required in the latter case is not needed, and furthermore, there is an advantage in that numerous types of products with different shapes can be manufactured using the same process, and in the case of semiconductor manufacturing device for performing production of many types of products at low volume, manufacturing costs are greatly reduced by using a unified process. Also, in the case in which electrical connectivity is not required, an insulating adhesive can be used.
The method for matching the wiring boards to one another is not particularly limited, but generally an alignment method using an image recognition device can be suitably used. Also, with the present preferred embodiment, the first, second andthird wiring boards11,12, and13 are fabricated with a non-contraction construction method, and thus, fabrication can be performed with high precision without distortion of the first, second andthird wiring boards11,12, and13, and therefore alignment with a jig can also be performed.
As described above, according to the present preferred embodiment, the manufacturing method includes a step of fabricating the first wiring board11 which has a wiring pattern11B provided on the surface and/or inner portion of the board main unit11A and a bump electrode11C which is integrated from the simultaneous baking with the wiring pattern B and which extends in the vertical direction, a step of layering the first wiring board11 with the second wiring board12 having the wiring pattern12B provided on the surface and/or inner portion thereof with the first wiring board11 to be connected to the second wiring board12 via the bump electrode11C, and a step of layering the third wiring board13 fabricated with the same procedures as with the first wiring board11 to be connected to the first wiring board11 via the bump electrode13C, and therefore, by matching the respective positions of the bump electrode11C of the first wiring board11 and the via conductor or surface electrode of the second wiring board12, and the third wiring board13 and the via conductor or surface electrode of the first wiring board11, the first, second, and third wiring boards11,12,13 are connected in the above-described sequence, such that conventional processes of transferring the flax onto the surface of the wiring board or processing of disposing minute soldering balls are omitted. Thus, the manufacturing cost of the stackedmodule10 is significantly reduced.
Also, with the present preferred embodiment, thebump electrodes11C and13C of the respective first andthird wiring boards11 and13 are sintered to be integrated with thewiring patterns11B and13B and thus formed simultaneously, thebump electrodes11C and13C can be formed with good precision and without problems occurring, such as irregularities, position shifting, or oxidation of the solder, and thus, the wiring boards are securely connected to one another with high precision, and a high quality stackedmodule10 is obtained.
Also, according to the present preferred embodiment, when fabricating the first, second, andthird wiring boards11,12, and13, in order to bake thelayered article110, which is layered by disposing shrinkage suppressiongreen sheets100 and100A on both of the top and bottom surfaces of the board ceramicgreen sheets111A and112A which are layered on one another, at a temperature at which the alumina powder, which is a primary component of the shrinkage suppressiongreen sheets100 and10A, does not sinter, shrinkage does not occur in the facing direction of the first, second, andthird wiring boards11,12, and13, but rather, shrinkage occurs only in the height direction. Thus, thewiring patterns11B,12B, and13B or thebump electrodes11C and13C can be formed with high precision without distortion occurring in the facing direction of eachwiring board11,12, and13, and a stacked module with a low height is produced. Moreover, the surface mounted components can be precisely mounted with respect to first andsecond wiring boards11 and12. Also, since the green viaconductor111C used with a bump electrode is formed on the shrinkage suppressiongreen sheet100, the positioning accuracy of the bump electrode is improved, and a narrower pitch of the bump electrodes is achieved. Thus, a smallerstacked module10 is produced.
Second Preferred Embodiment
With the stacked module according to the present preferred embodiment, portions which are similar or equivalent to the above-described preferred embodiment will be described using the same reference numerals. The stackedmodule10 of the present preferred embodiment includes afirst wiring board11, asecond wiring board12 which is connected on the lower side of thewiring board11, and athird wiring board13 which is connected on the upper side of thefirst wiring board11, and the board configuration is similar to that of the above-described preferred embodiment. Accordingly, the first, second, andthird wiring boards11,12, and13 are fabricated using the substantially same procedures used for above-described preferred embodiment.
In addition, with the present preferred embodiment, as shown inFIG. 5A, the chip-typepassive components14, which are mounted on the first wiring board in the above-described preferred embodiment, are mounted on the lower surface of thethird wiring board13, and no surface mounted components are mounted on thefirst wiring board11. Accordingly, awiring pattern11B defining a grounding electrode is formed on thefirst wiring board11, and awiring pattern13B for mounting the chip-typepassive components14 is formed on thethird wiring board13. Further, with the present preferred embodiment, as shown inFIG. 5A, thebump electrodes11C and11G are provided on both of the top and bottom surfaces of thefirst wiring board11, and there are no bump electrodes provided on the second andthird wiring boards12 and13.
Thus, when fabricating thefist wiring board11 of the present preferred embodiment, as shown inFIG. 5B, the board ceramicgreen sheet111A in which the green in-plane conductor111B is formed and the board ceramicgreen sheet111′A in which the green viaconductor111′E is formed are layered so as to sandwich the green in-plane conductor111B, and further, three of the shrinkage suppression ceramicgreen sheets100 in which the green viaconductors111C and111G are formed are disposed on both of the top and bottom sides of the board ceramicgreen sheets111A and111′A after determining the positions thereof. After layering the green sheets, thelayered article111 is fabricated by pressing these layers together at a predetermined pressure to pressure-bond. Thelayered article111 is baked using the substantially same procedures used for the above-described preferred embodiment, and thewiring pattern111B and the viaconductors111C and111G are sintered so as to be integrated. Then, thefirst wiring board11 is fabricated by removing the remaining green alumina powder after the shrinkage suppression ceramicgreen sheet100 is baked.
Subsequently, the separately fabricated second thethird wiring boards12 and13 are layered, as shown inFIG. 5C, so as to be connected. Thus, the stackedmodule10 of the present preferred embodiment is obtained.
According to the present preferred embodiment, the second andthird wiring boards12 and13 on which chip-typepassive components14 and chip-typeactive components15 are mounted do not include any bump electrodes, and therefore, there is no obstruction when mounting the surface mounted components. Thus, the surface mounted components, such as the chip-typepassive components14 and chip-typeactive components15, can be disposed in various arrangements so as to be mounted, and the freedom of design of the stackedmodule10 improved improved.
Third Preferred Embodiment
Each of the above-described preferred embodiments describes a case in which only one stacked module is fabricated. However, usually multiple stacked modules are fabricated simultaneously. Thus, with the present preferred embodiment, a method for fabricating multiple stacked modules simultaneously is described with reference toFIG. 6 andFIG. 7, wherein portions which are similar or equivalent to each of the above-described preferred embodiments will be described using the same reference numerals. With the present preferred embodiment, for example, multiple first wiring boards, second wiring boards, or third wiring boards can be fabricated from one board ceramic green sheet.
For example, in the case of fabricating multiplefirst wiring boards11 simultaneously, the necessary number of board ceramic green sheets (not shown) for thefirst wiring board11 is fabricated with the same procedures as for the first preferred embodiment. A green wiring pattern is independently provided on the board green sheet for each of the multiple first wiring boards. Then, the shrinkage suppression ceramic green sheet (not shown) is also fabricated with approximately the same surface area as the board ceramic green sheet. A green wiring pattern is formed on the board ceramic green sheet, and a green via conductor for the bump electrode is formed on the shrinkage suppression ceramic green sheet. Then, similar to the first preferred embodiment, the necessary number of shrinkage suppression ceramic green sheets not including a green via conductor are disposed on the lower side of the board ceramic green sheet, and the necessary number of shrinkage suppression ceramic green sheets including a green via conductor are disposed on the upper side of the board ceramic green sheet, following which pressure bonding is performed with a predetermined pressure, followed by baking at a predetermined temperature, to produce severalfirst combination boards51 sufficient for severalfirst wiring boards11.
As shown inFIG. 6,multiple bump electrodes11C corresponding to the individualfirst wiring boards11 are arrayed along the external circumference of thefirst wiring board11 on thefirst combination board51, whereupon a predetermined spacing δ is provided between the adjoiningfirst wiring boards11 and11. When dividing thefirst combination board51 into individualfirst wiring boards11, thefirst combination board51 is cut according to the spacing δ provided between the adjoiningfirst wiring boards11 and11. Chip-typepassive components14 are mounted withinregions51A of the multiplefirst wiring boards11 in thefirst combination board51. Note that, inFIG. 6, the L shown along the spacing δ is a hypothetical dividing line for dividing thefirst combination board51 into individualfirst wiring boards11.
Similarly, with the second and third wiring boards, the second andthird combination boards52 and53 are each fabricated which include multiple second andthird wiring boards12 and13, as with thefirst wiring board11. The chip-typeactive components15, for example, are mounted on each of the regions of the multiplesecond wiring boards12 of thesecond combination boards52, as shown inFIG. 7.Multiple bump electrodes13C corresponding to thethird wiring board13 are formed on thethird combination board53, as shown inFIG. 7, in the same manner as with thefirst combination board51.
Alignment of the first, second, andthird combination boards51,52, and53 is performed, wherein the first second andthird combination boards51,52, and53 are layered in the same order as in the first preferred embodiment, each of the combination boards are joined to each other via the brazing material, and heat processing is performed to obtain thecombination board50 shown inFIG. 7. Thiscombination board50 includes multiple stackedmodules10. Between adjacent stacked modules10 a spacing δ is provided, and the hypothetical dividing line L is located in this spacing δ. Then, by dicing thecombination board50 along the hypothetical dividing line L, the individualstacked modules10 are obtained. Thesestacked modules10 preferably have essentially the same configuration as that in the first preferred embodiment. Thus, according to the present preferred embodiment, multiplestacked modules10 are fabricated simultaneously with one baking.
The first, second, andthird combination boards51,52, and53 are fabricated using the shrinkage suppression ceramicgreen sheets100 and10A, and therefore, the various wiring patterns and bump electrodes are formed with high precision. Thus, the first, second, andthird combination boards51,52, and53 can be aligned using a rack-shaped jig. That is to say, the rack-shaped jig is used to accommodate the first, second, andthird combination boards51,52, and53 at each of the end surfaces while position-matching is performed. After a brazing material is coated onto thebump electrodes11C and13C of the respective first andthird combination boards51 and53 (seeFIG. 4), the first, second, andthird combination boards51,52, and53 are stored in the rack-shaped jig in a predetermined sequence, and by performing heating processing while in this state, the first, second, andthird combination boards51,52, and53 can be layered and connected. In this case, acombination board50 which includes multiple stackedmodules10 can be fabricated without using an image recognition device.
Fourth Preferred Embodiment
With the present preferred embodiment, the combination board is fabricated with the same procedures used for the third preferred embodiment. However, as shown inFIGS. 8A through 8C, acombination board50A according to the present preferred embodiment differs from the third preferred embodiment in that thebump electrodes11C and13C are shared between the adjacentstacked modules10, and division is made along thebump electrodes11C and13C into individualstacked modules10. Also, thewiring patterns11B,12B, and13B of the respective adjacent first, second, andthird wiring boards11,12, and13 are formed so as to be integrated along the entire surface of therespective combination boards51,52, and53, as shown in the same diagrams.
When dividing thecombination board50A into individualstacked modules10, if the division is made along the hypothetical dividing line L, along thebump electrodes11C and13C, as shown inFIG. 8A, the individualstacked modules10A are obtained, as shown inFIG. 8B. Thewiring patterns11B,12B, and13B of the respective first, second, andthird wiring boards11,12, and13 and thebump electrodes11C and13C define side surface electrodes on the divided surface of thestacked modules10A, as shown inFIG. 8C. Also,FIG. 9 is a perspective view illustrating thebump electrode11C, facing upwards, of thefirst combination board51 configuring thecombination board50A shown inFIGS. 8A through 8C.
In the case of mounting thestacked modules10A of the present preferred embodiment on a motherboard M, as shown inFIG. 10A, thestacked modules10A are mounted while being matched to predetermined surface electrodes P of the motherboard M, following which solder is applied to the side surface electrode, heat processing is performed, thereby forming a soldered fillet F as shown inFIGS. 10A and 10B, and thestacked modules10A can be electrically connected to the motherboard M.
According to the present preferred embodiment, thestacked modules10A include a side surface electrode on the same plane as the side surface of the wiring board, and in order to form the soldered fillet F when thestacked modules10A are mounted to the motherboard M, external inspection of the connection state can be easily performed via the soldered fillet F. Also, in the case of mounting thestacked modules10A on the motherboard M, the generated heat from the chip-typepassive components14 and chip-typeactive components15 can be efficiently scattered using not only the ceramic first and second wiring boards, but also thewiring patterns11B,12B, and13B and the soldered fillet F as heat transfer paths, as shown with the arrows inFIG. 10B.
Fifth Preferred Embodiment
With the present preferred embodiment, a resin is injected into the space within thecombination boards50 and50A of the third and fourth preferred embodiments, and except for sealing the chip-typepassive components14 or chip-typeactive components15 with resin, the combination board is fabricated with the same procedures as thecombination boards50 and50A of the third and fourth preferred embodiments. By dividing these combination boards, thestacked modules10B and10C shown inFIGS. 11A and 11B are obtained. With the stackedmodules10B and10C shown in these diagrams, the space between thefirst wiring board11 andsecond wiring board12, and the space between thefirst wiring board11 and thethird wiring board13 are both completely filled with aresin16, such as a thermoset resin or other suitable resin. Thus, by injecting aresin16 in the stackedmodules10B and10C, the mechanical strength of eachstacked module10B and10C is improved, and therefore, the chip-typepassive components14 or chip-typeactive components15 can be securely fixed on therespective wiring boards11 and12, thus preventing damage resulting from external force, such as an impact or other external force. Note that the stacked modules which are obtained by dividing the combination boards are illustrated inFIGS. 11A and 11B, but even in the case of fabricating one stacked module at a time, a resin can be used to improve mechanical strength.
Other Preferred Embodiments
The stacked module according to the present invention can be modified to have various bump electrode configurations or mounting states of the surface mounted components, as shown inFIG. 12A throughFIG. 18, for example. These stacked modules are configured according to the above-described preferred embodiments, except for the portions shown inFIG. 12A throughFIG. 18. Accordingly, hereafter only the above-described preferred embodiments and the featured portions will be described based onFIG. 12A throughFIG. 18. Note that inFIG. 12A throughFIG. 17B, description is given of the relationship between thefirst wiring board11 and thesecond wiring board12, as an example.
1) Modification Example of Bump Electrode Form
i) Bump Electrode Having a Taper
As shown inFIG. 12A, with the above-described preferred embodiments, abump electrode11C of thefirst wiring board11 preferably has a straight cylinder shape, however, a shape in which the cross-section in the axis direction has a taper as shown inFIG. 12B, i.e. abump electrode11C′ in an inverted trapezoid cone shape or an inverted quadrangle pyramid shape may be used. When the via hole is subjected to punching processing with a mold or the like, this becomes a viaconductor11C in a straight cylinder as shown inFIG. 12A, but with processing by laser light, a taper can be formed on the cross section as thebump electrode11C′ as shown inFIG. 12B. Accordingly, the connecting area of thesecond wiring board12 of the viaconductor11C′ including the soldering fillet F inFIG. 12B, i.e. the diameter d′ is smaller as compared to the diameter d in the case of a straight cylinder shape shown inFIG. 12A.
ii) Bump Electrode Having a Radiating Fin
Thebump electrode11C″ can be formed in a shape in which the cross-section has a radiatingfin11H with multiple trapezoid-shaped electrodes layered together as shown inFIG. 13A. Thebump electrode11C″ of thefirst wiring board11 has a greater surface area than that in a straight cylindrical shape, such that radiation is increased. Such abump electrode11C″ is fabricated as described below. That is to say, in the event of fabricating the first andthird wiring boards11 and13, an inverse cone shaped green viaconductor111C″ is formed on one shrinkage suppression ceramicgreen sheet100 as shown inFIG. 13B, following which as shown inFIG. 13C, these shrinkage suppression ceramicgreen sheets100 are layered on board ceramicgreen sheets111A having agreen wiring pattern111B which is layered on a shrinkage suppression ceramicgreen sheet100A not including a green via conductor with the same procedures as that in the first preferred embodiment in accordance with the number of fins, and pressure-bonded, following which thelayered article111 is baked so as to obtain thefirst wiring board11 having abump electrode11C″ with a radiating fin, as shown inFIG. 13D.
iii) Connecting Bump
The connecting bump differs from a bump electrode in which conductivity is the object, and is a bump for connecting the upper and lower wiring boards in a particular configuration. For example, in the case of fabricating a protective board to protect the inner portion of the wiring board, forming a wiring pattern on the protective board which is conductive with the connecting bump is not required. Such a protective board can be fabricated as shown inFIG. 14A, for example. That is to say, as shown in this diagram, for a board ceramicgreen sheet114A, two ceramic green sheets having a thickness of about 20 μm are layered, and on the lower surface thereof a shrinkage suppression ceramicgreen sheet100A having a thickness of about 250 μm and not including a green via conductor is disposed, and on the upper surface thereof, a shrinkage suppression ceramicgreen sheet100 having a thickness of about 250 μm and including a green connecting bump is disposed, and these are layered and pressure-bonded to produce the layered article. By baking this layered article, theprotective board14 having the connectingbumps14C as shown inFIG. 14B is obtained. Theprotective board14 has a thickness of about 20 μm. For a green connecting bump, a ceramic paste may be used with a low-temperature sintered ceramic as the primary component thereof, for example. The connecting bumps can be provided on the wiring board in combination with the bump electrodes.
iv) Height of Bump Electrodes
If the bump electrodes protrude substantially from the wiring board, damage may occur, such as loss, during transportation of the wiring board. Thus, as shown inFIGS. 15A and 15B, the bump electrodes may be provided on the surface facing both of thesecond wiring boards11 and12. Thus, by allocating the bump electrodes asbump electrodes11C and12C on both of the first andsecond wiring boards11 and12, thebump electrodes11C and12C can be set to, for example, about ½ the height, which suppresses and prevents damage, such as loss of thebump electrodes11C and12C during transportation. This can also be true for the connecting bumps for which conductivity is not required. Note thatFIG. 15A illustrates the first andsecond wiring boards11 and12 before being layered, andFIG. 15B illustrates the first andsecond wiring boards11 and12 after being layered. Also, the chip-typeactive components15 are sealed with aresin16.
2) Modification Example of a Preferred Embodiment of Surface Mounted Components
i) Mounting by Wire Bonding
There may be cases in which the chip-typeactive components15 connect to thesurface electrodes12F of awiring board12 via awire15A by the wire bonding as shown inFIGS. 15A and 15B andFIG. 16, as required. It is desirable for thebump electrodes12C to be formed on the mounting surface of thesecond wiring board12 as shown inFIG. 16. Thewires15A of the chip-typeactive components15 can change shape due to external force, such as the transporting process of thewiring board11, and can be destroyed. Thus, if thebump electrodes12C are formed on the mounting surface of the chip-typeactive components15, as shown inFIG. 16, thewire15A can be protected from external force by thebump electrodes12C. Even if thesebump electrodes12C are formed on the mounting surface of the chip-typeactive components15, the chip-typeactive components15 can be securely mounted by the wire bonding without damage. This is because even if the wire bonding includes a step of coating the adhesive on thesurface electrodes12F, a step of mounting the chip-typeactive components15 to thesecond wiring board12 to fix the chip-typeactive components15 to thesurface electrodes12F via an adhesive, and a step of performing wire bonding, this process is performed from the upper portion of the mounting surface of thesecond wiring substrate12.
ii) Mounting Portions for Surface Mounted Components
The surface mounted components can be provided on the upper surface and/or lower surface of the first andsecond wiring boards11 and12. Further, for surface mounting components, the chip-typepassive components14 and/or the chip-typeactive components15 can be provided on the upper surface and/or lower surface of the first andsecond wiring boards11 and12.
That is to say, as shown inFIGS. 17A and 17B, the chip-typepassive components14 are provided on the lower surface of thefist wiring board11, as well as providing the chip-typeactive components15 on the upper surface of thesecond wiring board12, and a combination of the chip-typepassive components14 and chip-typeactive components15 can be provided in the space between thefirst wiring board11 and second wiring board. In this case, similar to thesecond wiring board12 shown inFIG. 16, abump electrode12C is formed on the upper surface thereof, and chip-typeactive components15 are mounted therein by wire bonding. Mounting the chip-typepassive components14 by soldering and mounting the chip-typeactive components15 by wire bonding are generally difficult to perform on the same mounting surface. In other words, since mounting of the chip-typepassive components14 by soldering requires the metal mask to be adhered to the mounting surface, in the case of mounting on the same mounting surface as the chip-typeactive components15, the mounting of chip-typepassive components14 by soldering must be performed first. However, with the soldering mounting, reflow processing is performed, but the surface electrodes of the mounting surface on which the wire bonding is to be performed can be oxidized from the heat at this time. Thus, wire bonding thereafter cannot usually be performed. Conversely, with the method shown inFIGS. 17A and 17B, the mounting by soldering and the mounting by wire bonding are performed on separated mounting surfaces. Thus, damage such as that described above does not occur, and both mountings can be securely performed. Moreover, the quality is improved and reliability is increased. Note thatFIG. 17A shows the first andsecond wiring boards11 and12 before being layered, andFIG. 17B shows the first andsecond wiring boards11 and12 after being layered.
3) Modification Example of Number of Layers of Wiring Boards
With the above-described preferred embodiments, a configuration is described wherein three wiring boards are layered. However, the number of layers of wiring boards can be appropriately set according to the desired capabilities and functionalities of the stacked modules. If the stacked module is highly functional, the number of layers increases accordingly. For example,FIG. 18 shows an example of astacked module10D using five wiring boards. In this case, the dimensions of the stackedmodule10D arelength 10 mm×width 10 mm×thickness 1 mm, for example, the thickness of each of thewiring boards11,12,13,17, and18 is about 20 μm, and the height of the bump electrodes61C through65D is about 200 μm.
Note that the present invention is not restricted to the above-described preferred embodiments, and the chip-type passive components and chip-type active components can be mixed using several of each as required and mounted on both of the top and bottom surfaces of one wiring board, and also, the chip-type passive components and chip-type active components mounted on both wiring boards can be mixed within the space formed between the upper and lower wiring boards.
The present invention can be for a stacked module to be used for various types of electronic equipment.
While preferred embodiments of the present invention have been described above, it is to be understood that variations and modifications will be apparent to those skilled in the art without departing the scope and spirit of the present invention. The scope of the present invention, therefore, is to be determined solely by the following claims.

Claims (14)

1. A stacked module manufacturing method comprising:
a step of creating a first wiring board having a bump which is integrated with a board and extends in a direction substantially perpendicular to a surface of the board;
a step of layering a second wiring board, which has a wiring pattern provided on at least one of a surface and an inner side thereof, on said first wiring board; and
a step of connecting said second wiring board to said first wiring board via said bump; wherein
said bump is disposed on the surface of the board and extends only in a direction away from the surface of the board on which the bump is disposed;
said first wiring board further comprises a wiring pattern provided on at least one of the surface and an inner side thereof; and
said bump is a bump electrode integrated with said wiring pattern by simultaneous sintering.
2. The stacked module manufacturing method according toclaim 1, further comprising:
a step of fabricating a board ceramic green body having a low-temperature sintering ceramic as a primary component and having a green wiring pattern on at least one of a surface and an inner side thereof;
a step of fabricating a shrinkage suppressing ceramic green body having a hard-to-sinter ceramic which is not sintered at the baking temperature of said low-temperature sintering ceramic, as a primary component, and having a green via conductor defining said bump electrode;
a step of layering said shrinkage suppressing ceramic green body on at least one principal surface of said board ceramic green body;
a step of baking the board ceramic green body and the shrinkage suppressing ceramic green body at a baking temperature for said low-temperature sintering ceramics, and while sintering said board ceramic green body, integrating said green wiring pattern and said green via conductor by simultaneous sintering; and
a step of removing said shrinkage suppressing ceramic green body.
9. The stacked module manufacturing method according toclaim 3, wherein,
said first wiring board further comprises at least one of a chip-type passive component and a chip-type active component on a second principal surface thereof;
said second wiring board further comprises an external connecting electrode on the first principal surface thereof, and at least one of another chip-type passive component and another chip-type active component on a second principal surface thereof which faces the first principal surface; and
said wiring pattern of said first wiring board and said wiring pattern of said second wiring board are connected via the bump electrode on said first wiring board, such that the first principal surface of said first wiring board and the second principal surface of said second wiring board face one another.
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