Movatterモバイル変換


[0]ホーム

URL:


US6176067B1 - Method for packaging sponge or porous polymeric products - Google Patents

Method for packaging sponge or porous polymeric products
Download PDF

Info

Publication number
US6176067B1
US6176067B1US09/275,735US27573599AUS6176067B1US 6176067 B1US6176067 B1US 6176067B1US 27573599 AUS27573599 AUS 27573599AUS 6176067 B1US6176067 B1US 6176067B1
Authority
US
United States
Prior art keywords
porous polymeric
polymeric member
containment package
packaging
package
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
US09/275,735
Inventor
Kristan G. Bahten
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Illinois Tool Works Inc
Original Assignee
Rippey Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rippey CorpfiledCriticalRippey Corp
Priority to US09/275,735priorityCriticalpatent/US6176067B1/en
Assigned to RIPPEY CORPORATIONreassignmentRIPPEY CORPORATIONASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).Assignors: BAHTEN, KRISTAN G.
Application grantedgrantedCritical
Publication of US6176067B1publicationCriticalpatent/US6176067B1/en
Assigned to ILLINOIS TOOL WORKS INC.reassignmentILLINOIS TOOL WORKS INC.ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).Assignors: RIPPEY CORPORATION
Anticipated expirationlegal-statusCritical
Expired - Fee Relatedlegal-statusCriticalCurrent

Links

Images

Classifications

Definitions

Landscapes

Abstract

The present invention provides a novel method (400) for packaging sponge or porous polymeric devices, e.g., scrubbing brush. The method includes a step of providing a porous polymeric member (401), which has an outer surface and may also include inner surfaces. The member is substantially free from impurities (e.g., ions, particles) that may be distributed on the surface and through the member. Preferably, the method treats the devices using a preservative to prevent bacteria growth during storage or shipping of the devices. The brushes are removed from the wash treatment and placed within containment packages.

Description

CROSS-REFERENCES TO RELATED APPLICATIONS
This present application claims priority to U.S. Provisional Patent Application Ser. No. 60/079,695 filed Mar. 27, 1998, commonly assigned and hereby incorporated by reference for all purposes.
The following two commonly-owned co-pending applications, including this one, are being filed concurrently and the other one is hereby incorporated by reference in their entirety for all purposes:
1. U.S. patent application Ser. No. 09/275,735, Kristan G. Bahten, entitled, “A Method for Packaging Sponge or Porous Polymeric Products,”; and
2. U.S. patent application Ser. No. 09/275,661, Kristan G. Bahten, entitled, “A Packaged Sponge or Porous Polymeric Product,”
BACKGROUND OF THE INVENTION
The present invention relates to the manufacture of objects. More particularly, the present invention provides a method for cleaning and packaging a sponge or porous polymeric product such as an ultra clean “scrubbing” brush or surface treatment device for the manufacture of integrated circuits, for example. Merely by way of example, the present invention is applied to a packaging method for a scrubbing device for the manufacture of integrated circuits. But it will be recognized that the invention has a wider range of applicability; it can also be applied to the manufacture of semiconductor substrates, hard disks, and the like.
In the manufacture of electronic devices such as integrated circuits, the presence of particulate contamination, trace metals, and mobile ions on a wafer is a serious problem. Particulate contamination can cause a wide variety of problems such as electrical “opens” or “shorts” in the integrated circuit. These opens and shorts often lead to reliability and functional problems in the affected integrated circuit. Mobile ion and trace metal contaminants can also lead to reliability and functional problems in the integrated circuit. The combination of these factors is the main source of lower device yields on a wafer, thereby increasing the cost of an average functional device on the wafer.
Chemical-mechanical polishing (“CMP”) is a commonly used technique for planarizing a film on a wafer prior to subsequent processing of the wafer. CMP often requires introduction of a polishing slurry onto a surface of a film on the semiconductor wafer as the wafer is being mechanically polished against a rotating polishing pad. The slurries typically are water based and can contain fine abrasive particles such as silica, alumina, and other abrasive materials. After polishing is complete, the processed wafers must be cleaned to completely remove residual slurry and other residue from the polishing process to ready the surface for other processing steps such as etching, photolithography, and others.
To clean residual slurry material from the polished surface, cleaning brushes have been used. A cleaning brush of this type often comprises a member that is cylindrical in shape, which generally rotates along a center axis of the cylindrical shaped member. The cleaning brushes are also often made of a foam or porous polymeric material such as polyvinyl alcohol (“PVA”). A combination of rotational movement of the brush and force or pressure placed on the brush against the wafer causes residual slurry materials to be removed from the surface of the wafer. Unfortunately, it has been found that the brushes themselves often contain residual materials from the brush manufacturing process. These residual materials include, among others, residual particles and impurities such as ions and particulate contamination. Given that brushes received directly from a manufacturer are often “dirty” it is difficult to maintain the cleanliness of an integrated circuit manufacturing process by using such dirty brushes. Other impurities also may be introduced to the brush during the packaging process.
In some cases, conventional sponge or porous polymeric materials such as PVA attract microorganisms. More particular, microorganisms such as bacteria often introduce themselves on the wet surfaces and pores of the materials and reproduce at significant rates. These microorganisms contaminate the pores and surface area of the material. They also form particulate contamination, which should not be introduced in the manufacture of electronic devices such as integrated circuits. Furthermore, the microorganisms often degrade the quality of the material, which shortens it's life and resiliency. These and other microorganisms can also degrade the porous polymeric product material.
From the above, it is seen that an improved technique for maintaining cleanliness of a surface treatment device is highly desired.
SUMMARY OF THE INVENTION
According to the present invention, a technique for packaging sponge or porous polymeric products is provided. In an exemplary embodiment, the present invention provides a method for cleaning and packaging an ultraclean surface treatment device, which includes a scrubbing brush for the manufacture of substrates for the electronics industry.
In a specific embodiment, the present invention provides a novel method for packaging a sponge or porous polymeric product, which can be made of PVA and other sponge-like materials. The method includes a step of providing a porous polymeric member, which has an outer surface and may also include inner surfaces, e.g., pores. The member also has a plurality of impurities (e.g., ions, particles) distributed through the member. These impurities can be introduced into the member through the manufacturing process, which is commonly “dirty” and does not provide substantially clean polymeric products. In addition, other impurities may be introduced to the brush during the packaging process. In some embodiments, the impurities are a by-product of the manufacturing process. The present method includes a wash cycle for the member for cleaning purposes that removes a substantial portion of the impurities from the products. The wash cycle can be performed by a washing-type machine, as well as other types of apparatus. The wash cycle can include at least one or more treatments to remove selected impurities from the member. The treatments include washes using an acid, a base, a solvent, and other cleaning materials. In this way, selected impurities are removed in a desirable manner.
Once the washing treatment has concluded, the brush can be removed from the treatment medium and placed within the containment package. In a specific embodiment, these packaging steps are carried out in a Class 100 cleanroom, Class 10 cleanroom, Class 1 cleanroom, or cleaner environment. Preferably, the porous polymeric member is packaged in a preservative such as a basic solution (e.g., ammonium hydroxide) to prevent growth of impurities such as bacteria and the like. This containment package can be single, double, or triple contained, depending upon the application. The containment package can then be heat sealed, which prevents the preservative from evaporating and keeps impurities from coming in contact with the porous polymeric member.
In an alternative embodiment, the wash cycle includes a treatment step that introduces a preservative onto the porous polymeric member. In one aspect, the wash cycle sprays, wets, doses or applies a basic solution such as ammonium hydroxide onto the porous polymeric member. The ammonium hydroxide solution has a concentration in the member ranging from a pH of 9.0 and greater, or preferably a pH of 9.5 and greater. Depending upon the application, other types of preservatives also can be used. These preservatives include TMAH and the like. Once the preservative is deposited on the member, the member is packaged. The packaged member is sealed from the environment, which also prevents the preservative from escaping in some embodiments.
Numerous advantages are achieved using the present invention over conventional techniques. For example, in some embodiments the present invention provides an ultraclean or microclean process for cleaning polymeric products. The present process is easy to use with standard chemicals and provides an improved polymeric product, which tends to introduce fewer particles or impurities onto a substrate to be processed. Additionally, the present brush product is cleaner “out of the box.” That is, the present brush product is much cleaner on delivery than the conventional products on the market at the filing date of this present application. Accordingly, the present brush product is easier to use and provides for a more efficient manufacturing process, which is important in the manufacture of integrated circuits, for example. The present invention can also be applied to other porous polymeric products. Furthermore, the improved packaging technique of the present process maintains the cleanliness of the product. The ammonium hydroxide is also readily available, which makes the present method easy to implement. Ammonium hydroxide also has a positive zeta potential, which often tends to repel particles from the brush product. Ammonium hydroxide also is easily removable with water in most cases. These and other advantages or benefits are described throughout the present specification and are described more particularly below.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a simplified diagram of surface treatment devices according to embodiments of the present invention;
FIG. 2 is a simplified diagram of a cleaning system according to an embodiment of the present invention;
FIG. 3 is a simplified flow diagram of a cleaning method according to an embodiment of the present invention;
FIG. 4 is a simplified flow diagram of a cleaning and packaging method according to an embodiment of the present invention;
FIG. 4A is a simplified pictorial diagram of a packaged device according to an embodiment of the present invention;
FIG. 5 is a simplified flow diagram of an unpackaging method according to an embodiment of the present invention; and
FIG. 6 is a simplified diagram of a scrubbing system according to an embodiment of the present invention
DESCRIPTION OF THE SPECIFIC EMBODIMENTS
FIG. 1 is a simplified diagram of surface treatment devices according to embodiments of the present invention. This Fig. is merely an illustration and should not limit the scope of the claims herein. One of ordinary skill in the art would recognize other variations, modifications, and alternatives. As shown, the devices or porous polymeric products (e.g., foam products) can range in size and shape, depending upon the application. According to an embodiment, the device can be shaped asbrush rollers101, which have protrusions thereon, orbrush rollers103 that have smooth surfaces. These brush rollers have shapes and sizes to meet the particular cleaning application for devices such as semiconductor wafers, hard disks, and other applications. The device can also be in the form ofwipes105,disks107, andcustom applications109. Additionally, the device can be in the form of puck brushes111 and plugs113. Furthermore, the device can be in other shapes and sizes depending upon the application.
In a specific embodiment, the devices are made using a suitable material that is firm, porous, elastic, and has certain abrasion resistiveness. In most embodiments, the main raw starting material for the device is polyvinyl alcohol, but can be others. For example, polyvinyl alcohol is used to form a polyvinyl acetal porous elastic material. The characteristics of the porous material vary depending on cleanliness, type of foaming agent, type of aldehyde employed for the conversion of a polyvinyl alcohol to a polyvinyl acetal, and other factors. These factors also include the relative proportions of reactants, reaction temperature and time, and the general condition and starting materials in the extrusion process. Cleanliness of the manufacturing process is another important factor in the manufacture of these devices.
Cleaning effectiveness of the device also depends on porosity and the pore size of the device. In most embodiments, the porosity can be more than about 85%. In devices where porosity is less than 85%, polyvinyl acetal porous elastic material may have poor flexibility. In most embodiments, the porosity is less than about 95%, since a greater porosity value may provide poor strength. Other characteristics include a desirable average pore size or opening. The pore size or opening in some embodiments ranges from about 10 microns to about 200 microns. In devices where the average pore opening is less than 10 microns, the porous elastic material may have poor elasticity, thus making the performance of the cleaning roll unsatisfactory. Alternatively, an average pore opening of more than 200 microns can be unsuitable for a cleaning roll because of inconsistent pore configuration. Of course, the selected pore size and porosity depend upon the application.
The polyvinyl acetal porous elastic material usable for the present invention can be produced in a known manner, for example, by dissolving at least one polyvinyl alcohol having an average degree of polymerization of 300 to 3,000, and a degree of saponification of not less than 80%, in water to form a 5% to 30% aqueous solution, adding a foaming agent to the solution, and subjecting the solution to reaction with an aldehyde such as formaldehyde or acetaldehyde until the device becomes water insoluble. The polymer is 50 to 70 mole % of acetal units. In some embodiments, where the polymer has less than 50 mole % of acetal units, the retained polyvinyl alcohol may ooze out from the product upon use and contaminate the article to be cleaned. Where the polymer has more than 70 mole % of acetal units, the device may have poor elasticity and flexibility in other embodiments.
Although the above devices are generally described in selected shapes and sizes, alternative configurations can also be used. As merely an example, the polymeric product can have a gear-like configuration, which has numerous parallel grooves formed at an angle to the roll. Additionally, protrusions or projections on the surface of the foam product can include a variety of shapes, e.g., circular, ellipsoidal, rectangular, diamond, or the like. The total surface area occupied by the projections can range in value from about 10% or greater, or about 15% to about 65% or greater, most preferably 65%. Of course, the particular shape and size of the foam product depends upon the application.
Other techniques can also be used to manufacture porous polymeric devices used for surface treatment applications. These techniques include, among others, an air injected foam or sponge product.
The present devices have fewer impurities and/or particulates than conventional foam products. The concentration ranges of the impurities in a preferred embodiment are shown in Table 1. These impurity concentrations compare a conventional brush with the present brush. Concentrations are noted in parts per million and were derived using ion chromatography or ICPMS.
TABLE 1
Impurity Levels in Present Foam Product
Conventional BrushPresent Brush
Impurity(PPM)(PPM)
Fluoride13.0<.1
Chloride5.0<1.0
Nitrite<0.5<0.01
Bromide<1.0<0.05
Nitrate<1.0<0.05
Phosphate<1.0<0.05
Sulfate9.5<0.20
Lithium<0.1<0.1
Calcium7.3<0.05
Magnesium3.2<0.01
Potassium2.33<0.05
Sodium243<0.10
Table 1 shows that the present invention provides a much cleaner device than conventional ones. In particular, the concentration of sodium, for example, which is detrimental to integrated circuits, is less than about 0.10 parts per million (“PPM”) from a conventional value of about 243 PPM. In addition, the other impurities also have been substantially reduced by way of the present invention. The present invention achieves these results by way of a novel cleaning procedure, which is described below in more detail.
FIG. 2 is a simplified diagram of acleaning system200 according to an embodiment of the present invention. This Fig. is merely an illustration and should not limit the scope of the claims herein. One of ordinary skill in the art would recognize other variations, modifications, and alternatives. The simplified diagram shows asystem200, used to clean porous polymeric products (e.g., foam, sponge) to microclean or ultraclean levels.System200 includes a variety of features such as achemical source region201, and achemical metering region203. A variety of chemicals used for cleaning are available in thechemical source region201. These chemicals include, among others, acids, bases, solvents, and chelating agents. The chemicals preferably include hydrochloric acid (HCl)223, ammonium hydroxide (NH4OH)225, isopropyl alcohol (IPA)227, and ethylenediaminetetraacetic acid (EDTA)229, but are not limited to these. Each of these chemical sources is coupled to ametering pump221 through one of a plurality oflines222,224,226, and228.Line222 connects metering pump221 (P-1) to the HCl source,line224 connects metering pump221 (P-2) to the NH4OH source,line226 connects metering pump221 (P-3) to the IPA source, andline228 connects metering pump221 (P-4) to the EDTA source. All of these lines combine at a manifold, which directs the chemical or fluid toline213, which connects to the washer/extraction unit209. In other embodiments, the lines may be kept apart to be separate from each other.
The chemical source region is made of a suitable enclosure for preventing chemicals from escaping into the environment or onto the plant floor. In some embodiments, the source region is made by a chemically nonreactive material such as polypropylene, Kynar™, Teflon™, polyvinyl chloride, or others. In most embodiments, the source region is double contained. That is, chemicals escaping from any of the sources are trapped and drain out of the source region without escaping to the plant floor or environment. In other embodiments, the chemical source region is triple contained. Of course, the type of source unit used depends upon the nature and types of chemicals.
Pumps (P-1, P-2, P-3, P-4) are commonly controlled by achemical distribution controller205, which is electrically connected byline219.Line219 separates into a plurality of lines to control each of the pumps for metering purposes. For example, the metering pumps are capable of handling a wide variety of corrosive chemicals and solvents. These pumps are often units made by Nova Systems, but can be pumps made by other manufacturers.
Chemical distribution controller205 communicates to the pumps throughline219, which that separates into independent lines to metering pumps221.Chemical distribution controller205 can be any suitable unit for metering chemicals from one of a plurality of chemical sources through one of a plurality of metering pumps. Alternatively, multiple pumps can be actuating to route more than one chemical source into the washer/extraction unit. The controller has input/output modules that receive and transmit signals to and from selected system elements. The controller is sufficiently chemical resistant and is durable for manufacturing operations. For example, the controller could be a product called Novalink, which is made by Nova Systems. Of course, other controllers can be used.
To oversee the operation of the system including the washer/extraction unit, a washer/extraction unit controller207 couples tocontroller205 throughline217 and couples to washer/extraction unit209 throughline215. The controller has a variety of input and output modules. These modules are used to interface with sensors, motors, pumps, and the like from the washer/extraction unit, and with other apparatus or devices. The controller is a microprocessor-based unit which is coupled to memory, including dynamic random access memory, and program storage devices. A variety of process recipes can be stored in the memory of the controller. The controller is also sufficiently chemical resistant and is durable for manufacturing operations. For example, the controller could be from a Dubix machine. Of course, other controllers can be used.
Also shown is awaste stream211 from the washer/extraction unit. The waste stream removes used fluids or undesirable fluids from the washer extraction unit. In preferred embodiments, the waste fluid stream is chemically balanced and is safe to health, environment, and property. In some embodiments, washer/extraction unit 209 uses a specific process recipe that produces an environmentally safe waste stream. Alternatively, the waste stream may be treated before returning fluids back to the environment.
Washer/extraction unit209 is used with a variety of process recipes to clean and remove impurities from the foam product or products. The unit can be any suitable washing-machine-type unit with a variety of cleaning and rinsing cycles that are programmable. For example, the unit could be a product made by Dubix, but units made by other manufacturers could be used. The unit is made of a suitable material to be chemically resistant and clean to reduce any possibility of particulate contamination or the introduction of impurities onto the foam products. In preferred embodiments, the unit is a spin/rinse unit, which rotates a basket in a circular manner to clean and remove impurities from the foam product. The spin/rinse unit is preferably made of stainless steel or another relatively nonreactive material that does not introduce impurities into the porous polymeric product.
A process according to the present invention can be briefly outlined as follows:
(1) Provide products from manufacturer;
(2) Insert products into washer;
(3) Perform pre-wash with clean water;
(4) Perform solvent wash;
(5) Perform acid wash;
(6) Perform caustic wash;
(7) Perform EDTA wash;
(8) Perform rinse;
(9) Perform preservative wash;
(10) Perform dry;
(11) Perform additional steps, as required;
(12) Remove cleaned products; and
(13) Package cleaned products.
The above sequence of steps is used to substantially remove all particulate contamination and impurities from the porous polymeric devices. These devices are often “dirty” from the manufacturing process and should be substantially cleaned before use in a manufacturing operation, e.g., semiconductor fabrication. The above sequence of steps removes or substantially reduces quantities of ionic contamination and particulate. Although complex, the above sequence of steps is easily used in a washer unit with a programmable control unit. Depending upon the embodiment or embodiments, a rinse cycle or cycles may follow any of the above washes. Furthermore, the cleaned product is treated with a preservative (e.g., NH4OH) to prevent breakdown or growth of contaminants such as bacteria on the product in storage or shipping. Accordingly, the present method can be easily implemented using conventional technology in a cost-effective manner.
Some details of the above method are shown in FIG. 3, which illustrates a simplified flow diagram300 of a cleaning (and packaging) method according to an embodiment of the present invention. FIG. 3 is presented merely as an illustration and should not limit the scope of the claims herein. One of ordinary skill in the art would recognize other variations, modifications, and alternatives.
For example, a process according to the present invention begins atstep301. The process has a step (step302) of providing a plurality of porous polymeric devices, which require cleaning. These devices generally are from a manufacturer of polymeric devices or foam products. An example of this device is a product made by Kanebo Limited of Japan. Other companies also have similar devices. These companies include, among others, Cupps Industrial Inc., Merocel Scientific Products, Perfect and Glory Enterprise Co., Ltd. In generally all of the present embodiments, the polymeric devices include a variety of impurities that can be detrimental to the manufacture of integrated circuits, for example. These impurities should be removed or reduced in concentration before use in a clean or sensitive environment.
The devices are loaded (step305) into a washer/extraction unit which can be programmed with a variety of process recipes to clean and remove impurities from the devices. The washer/extraction unit may rotate the devices. The unit can be any suitable washing machine-type unit with a variety of cleaning and rinsing cycles that are programmable. The unit is made of a suitable material, chemically resistant and clean, to reduce any possibility of particulate contamination or the introduction of impurities onto the devices to be cleaned. In preferred embodiments, the unit is a spin/rinse unit, which rotates a basket in a circular manner, to clean and remove impurities from the devices. The rotational action provides mechanical agitation to fluids that tend to loosen and remove impurities and particulate matter from the devices. In one embodiment, further details of a cleaning process are explained in U.S. patent application Ser. No. 09/193,009 filed Nov. 16, 1998 (18886-001110US), entitled “A Microcleaning Process For Sponge Or Porous Polymeric Products,” commonly assigned.
A program according to this embodiment is selected from the washer/extraction unit. The program is often loaded into a controller. This program can carry out a variety of cleaning processes. This program removes a substantial amount of impurities and particulate contamination from the devices. After the process, the devices are substantially free from impurities. For example, the impurities would be fewer than those noted in Table 1. The cleaned or microcleaned devices are removed (step311) from the washer/extraction unit in a cleanroom environment before packaging. The packaging step (step315) may then be performed within the cleanroom. The cleanroom environment is generally at least a Class 100 or Class 10 cleanroom, thereby preventing additional contamination of the devices. The process stops at step313, but additional steps can be performed as desired.
In a preferred embodiment, the cleaned devices are packaged in a preservative such as a basic solution or the like. The preservative can be added or introduced into the product during one of the last cycles in the washer. The preservative can also be added to the devices after being cleaned. The techniques for introducing the preservative can include spraying, vaporizing, wetting, soaking, and others. Of course, other techniques can also be used to preserve the cleaned product during storage or shipping. Details of the packaging method according to an embodiment of the present invention are shown below in the Figs.
FIG. 4 is a simplified flow diagram of a cleaning andpackaging method400 according to an embodiment of the present invention. This Fig. is merely an illustration and should not limit the scope of the claims herein. One of ordinary skill in the art would recognize other variations, modifications, and alternatives. Thepresent method400 begins at start,step401. The method has a step (step403) of providing or inputting a plurality of porous polymeric devices, which require cleaning. These devices generally are from a manufacturer of polymeric devices or foam products such as the ones noted as well as others. An example of this device is a product made by Kanebo Limited of Japan. Other companies also have similar devices. These companies include, among others, Cupps Industrial Inc., Merocel Scientific Products, Perfect and Glory Enterprise Co., Ltd. In generally all of the present embodiments, the polymeric devices include a variety of impurities that can be detrimental to the manufacture of integrated circuits, for example. These impurities should be removed or reduced in concentration before use in a clean or sensitive environment.
In a specific embodiment, the devices are cleaned,step405. In particular, the devices are loaded into a washer/extraction unit which can be programmed with a variety of process recipes to clean and remove impurities from the devices. The washer/extraction unit may rotate the devices. The unit can be any suitable washing machine-type unit with a variety of cleaning and rinsing cycles that are programmable. As merely an example, the unit is a product made by Dubix of France, but units made by other manufacturers can be used. The unit is made of a suitable material, chemically resistant and clean, to reduce any possibility of particulate contamination or the introduction of impurities onto the devices to be cleaned. In preferred embodiments, the unit is a spin/rinse unit, which rotates a basket in a circular manner, to clean and remove impurities from the devices. The rotational action provides mechanical agitation to fluids that tend to loosen and remove impurities and particulate matter from the devices.
After the cleaning process, the devices are substantially free from impurities. For example, the impurities would be fewer than those noted in Table 1. The cleaned or microcleaned devices are removed (step407) from the washer/extraction unit in a cleanroom environment before packaging. The cleanroom environment is generally at least a Class 100 or Class 10 or Class 1 cleanroom, thereby preventing additional contamination of the devices. The Class 1 cleanroom has fewer than 1 particle greater than about 0.1 micron in a volume of a cubic foot. In a specific embodiment, the output of the washer/extraction unit faces into the cleanroom. Alternatively, the washer/extraction unit has a passthrough, which connects or couples to the cleanroom. Still further, the package can come out of the washer/extraction unit and placed in a clean module such as a SMIF unit or the like. The SMIF unit couples to a packaging apparatus, which seals the device in a substantially particle free package.
In a preferred embodiment, a preservative is added to the devices after one of the wash cycles. The preservative can be any suitable compound or compounds that reduce or minimize damage to the porous polymeric material. In one aspect, the preservative can be any high pH bearing compound that reduces the ability for bacterial or other organisms to grow on the porous polymeric material. In the present example, the preservative can be ammonium hydroxide, ammonium, TMAH, and other compounds. Alternatively, the preservative can be a low pH bearing compound such as oxalic acid, citric acid, and dehydroacetic acid. Still further, the preservative can also be other organic biocides. In an embodiment using ammonium hydroxide, for example, the pH on the polymeric product is greater than about 9.0 pH or greater than about 9.5 pH, but can also be others. Of course, the type of preservative depends highly upon the type of porous polymeric material and the like. In a specific embodiment, the preservative can also be added to the devices after being cleaned, but outside the washer/extraction unit. The techniques for introducing the preservative can include spraying, vaporizing, wetting, soaking, and others. Of course, other techniques can also be used to preserve the cleaned product during storage or shipping.
The packaging step (step409) is then performed within the cleanroom or other clean environment. The packaging step occurs by transferring the clean device into a substantially free package such as a polyethylene bag or other product. The package can be any suitable particulate free material that can provide a substantially clean environment. The package can be a plastic material such as polyethylene, polyvinyl chloride, nylon, and others. The package can also be laminated for strength and durability. An example of a laminated package is Precision Clean II made by Fisher container Copr. of Evanston, Ill., but can also be others. The package generally has been processed in at least a Class 10 Cleanroom and meets FFC Level 1 surface cleanliness standards. The material construction can be polyethylene. The material is preferably substantially amine-free and organic-free and contains substantially no silicon and/or slip agents.
In a specific embodiment, the package including the device and preservative is sealed (step411). In some embodiments, preservative can be added to the package itself, which coats the devices. The package can be sealed using a variety of techniques such as heat seal, glue, locks, staples, and other fastening devices. The sealed package does not allow any of the preservative material or porous polymeric product to escape into the environment. Additionally, particulate contamination and/or trace materials cannot leech into the sealed package. The package can be sealed using a heat sealer called “Foot Impulse Sealer” and made by a company called American International Electric Co. of Taiwan, but is not limited to this product. The process stops atstep413, but additional steps can be performed as desired.
The packaged devices often occupy a selected region of the package for handling purposes. In one embodiment, the device occupies about 70 percent or more of the interior region of the package. Alternatively, the device occupies about 80 percent or more of the interior region of the package. In a specific embodiment, only a single device is packaged at once. Alternatively, more than one device such as two or more can be placed in a package. The package can also be vacuum sealed to prevent oxidizing materials from damaging the porous polymeric product. The device also can be sealed with an inert gas or non-reactive gas such as nitrogen, argon, helium, or the like. In one aspect, each of the packaged devices is placed in a larger package or plastic container for shipping purposes. That is, the package is at least double contained or preferably triple contained.
FIG. 4A is a simplified diagram420 of a packaged device according to an embodiment of the present invention. This diagram is merely an illustration which should not limit the scope of the claims herein. One of ordinary skill in the art would recognize other variations, modifications, and alternatives. The packaged device includes adevice425, which has been treated with a preservative, and a packaging member orpackage423. Each side of thepackage423 is sealed421. An interior volume orportion427 of the package may include a non-reactive gas, or be evacuated, depending upon the application. Alternatively, the volume may include a preservative, which has been placed in asmaller package429. The smaller package emits the preservative in a predetermined manner to preserve the device during transit and storage, for example. The device has been placed into the package without contact with human hands. For example, the device can be placed into the package with tongs, gloved hands, a robot arm, and other techniques, which substantially reduce a presence of particulate contamination on the device. The device and interior volume of the package are substantially free from trace metals and mobile ions. Additionally, the device and interior volume of the package are substantially free from particles greater than about 0.5 micron in dimension, or about 0.25 micron in dimension, or about 0.1 micron in dimension, or about 0.05 micron in dimension. Details of removing the device from the package are shown below in the Fig.
FIG. 5 is a simplified flow diagram of anunpackaging method500 according to an embodiment of the present invention. This Fig. is merely an illustration and should not limit the scope of the claims herein. One of ordinary skill in the art would recognize other variations, modifications, and alternatives. Thepresent method500 begins at start,step501. The packaged devices are often provided (step503) in a double or triple contained package. In a specific embodiment, each of the devices is placed in individual packages, which are placed in a larger package, typically plastic, or other particle free material. The larger package is often placed in a cardboard container (step505), which has been laminated to reduce the amount of particulate contamination.
The cardboard container, including the devices, is shipped (step509) to a user site, such as a wafer, integrated circuit, or disk drive company. The user site often opens the container and removes the larger package from the container. A user generally inspects the contents of the container for quality control. The larger package is often cleaned using a moist clean wipe. The larger package is placed in an air shower to remove any loose particulate contaminants from the exterior surfaces of the package. The package is then placed into a cleanroom or the like. The individual device including the package is opened in the cleanroom, where it is clean and free from particulate contamination. Depending upon the application, the device is placed on an apparatus (e.g., scrubbing system) for use. An example of such an apparatus is shown below by way of the Fig.
FIG. 6 is a simplified diagram of a scrubbing process600 according to an embodiment of the present invention. This Fig. is merely an illustration and should not limit the scope of the claims herein. One of ordinary skill in the art would recognize other variations, modifications, and alternatives. The scrubbing process uses the cleaned devices according to the present invention. As shown in the Fig., a semiconductor product wafer cleaning system601 has two brush stations, a first comprising cylindrical PVA brushes602 and603, and a second comprising cylindrical PVA brushes604 and605. On each of the brushes, there areprojections606 also made of PVA. The brushes are mounted onspindles607,608,609 and610 so that they are barely touching and rotate in the direction indicated. Deionized water is sprayed fromnozzles611 and612 and pumped613 through the brushes from the spindles. The combination of the water and brush contact acts to remove residual cleaning composition from a semiconductor product wafer614 which is passed through the brushes in the cleaning stations.
In order to remove the slurry or other residue, deionized water and/or cleaning chemistries sprayed from nozzles above and below impinges the wafers. As the brushes rotate over the surface of the wafer, they tend to pick up and trap in the brush surface particles of the slurry and other residue of the cleaning composition. Additionally, deionized water may be pumped through holes in the spindle to saturate the tubular brushes. The slurries which eventually contaminate the cleaning brushes and render them ineffective for further cleaning comprise the slurries and other cleaning compositions described in the background section of this application.
The cleaning brushes used in post CMP cleaning operations is employed in connection with resilient foam brushes such as those used on the Synergy wafer cleaning system manufactured by OnTrak Systems, Inc. of Milpitas, Calif. This system employs multiple sequential cleaning stations wherein each station comprises a pair of tubular brushes made of polyvinyl alcohol (PVA) in the form of a sponge. Each brush has a length of approximately 10 in. (25.4 cm), an outside diameter of approximately 2⅜ in. (6.0 cm) and an inside diameter of approximately 1¼ in. (3.2 cm), and has an outer cylindrical surface covered with sponge projections approximately ¼ in. (0.5 cm) in height and A in. (0.7 cm) in diameter. Each brush is rotatably mounted on a spindle through which may be pumped water to saturate the brush and the brushes at each station are spaced so that the surfaces approximately contact each other. Given the resilience of the sponge, this permits thin semiconductor wafers containing the cleaning composition residue to pass between the pairs of brushes as they rotate. Typically, as the cleaning system will have two (2) stations, with each station having a pair of the brushes as described above. The wafers pass directly from one station through the other.
The process described above is merely an example of a technique that can be performed to provide ultraclean surface treatment devices according to an embodiment of the present invention. The present invention can also be performed in a “batch” type process, where various cleaning solutions are applied to the devices in a sequential manner. This batch type process would include, among other techniques, immersion of the devices in tanks and sprays.
The semiconductor product wafers that may be cleaned by the system referenced herein include silicon, silicon nitride, silicon oxide, polysilicon or various metals and alloys. As used herein the term “product wafer” refers to the wafer which is to be intended to be produced by further treatment in a semiconductor device. The CMP compositions which are used to planarize or otherwise treat and polish the surface of the semiconductor product wafers must be removed to a degree sufficient to allow subsequent manufacture and deposition steps to be made to a clean surface. Although the above embodiments are generally described in terms of semiconductor manufacturing, the invention has a much broader range of applicability. For example, the invention can be applied to a manufacturing process for wafers, hard disks, flat panel displays, and other devices that require a high degree of cleanliness. In addition, the present invention can be used to replenish or rework “dirty” foam products. Accordingly, the present invention is not limited to cleaning products prior to a manufacturing process.
While the above is a full description of the specific embodiments, various modifications, alternative constructions and equivalents may be used. Therefore, the above description and illustrations should not be taken as limiting the scope of the present invention which is defined by the appended claims.

Claims (25)

What is claimed is:
1. A method for packaging a porous polymeric member in a containment package, the method comprising:
providing a porous polymeric members the member comprising an outer surface and a plurality of impurities distributed through the member;
subjecting the porous polymeric member to a wash cycle, the wash cycle comprising at least two sequential and different treatments selected from the group of an acid treatment, a base treatment, or a solvent treatment;
providing a containment package; and
positioning the porous polymeric member within the containment package;
wherein the porous polymeric member comprises a shape selected from the group consisting of a brush, a puck, a pad, or a plug.
2. The method of claim1 wherein the acid treatment comprises removing a portion of a trace metal from the porous polymeric member; the base treatment comprises removing a charged particle from the porous polymeric member; and the solvent treatment comprises removing a loose portion of the porous polymeric member from the porous polymeric member.
3. The packaging method of claim1, wherein the wash cycle is performed by rotating the porous polymeric member.
4. The packaging method of claim1, wherein the acid treatment comprises an HCl bearing compound.
5. The packaging method of claim1, wherein the base treatment comprises an NH3OH bearing compound.
6. The packaging method of claim1, wherein the solvent treatment comprises an alcohol bearing compound.
7. The packaging method of claim1, wherein the method further comprises removing the porous polymeric member from the wash within a cleanroom.
8. The method of claim1, wherein the method further comprises heat-sealing the containment package such that the porous polymeric member is sealed within the containment package.
9. The packaging method of claim8, wherein the method further comprises heat-sealing the containment package within a cleanroom.
10. The method of claim1, wherein the method further comprises providing an amount of preservative within the containment package.
11. The method of claim10, wherein the method further comprises heat-sealing the containment package such that the porous polymeric member and the preservative are sealed together inside the containment package.
12. The method of claim11, wherein the method further comprises heat-sealing the containment package within a cleanroom.
13. The method of claim1, wherein the containment package is a class 10 clear polymer bag.
14. The method of claim1 wherein the porous polymeric member is selected from a material including polyvinyl acetal porous elastic material.
15. The method of claim1 further comprising a step of subjecting the porous polymeric member to a chelating compound.
16. The method of claim1 wherein member has a sodium concentration level of less than 0.10 parts per million after the subjecting the step of subjecting the porous polymeric member to a wash results in a sodium concentration of less than 0.10 parts per million in the porous polymeric member.
17. A method for packaging a porous polymeric member in a containment package, the method comprising:
providing a porous polymeric member, the member comprising an outer surface and a plurality of impurities distributed through the member, said impurities less than about 0.20 parts per million;
subjecting said porous polymeric member to a preservative, said preservative preventing microorganisms from growing on surfaces of said porous polymeric member;
positioning the porous polymeric member within a containment package while in a cleanroom environment; and sealing said containment package in the cleanroom environment.
18. The method of claim17 wherein said preservative comprises an ammonium bearing compound.
19. The method of claim17 wherein said preservative comprises an ammonium hydroxide compound.
20. The method of claim17 wherein the method further comprises heat-sealing the containment package such that the porous polymeric member is sealed within the containment package.
21. The method of claim17, wherein the method further comprises providing an amount of the preservative within the containment package.
22. The method of claim17, wherein the containment package is a class 10 clear polymer bag.
23. The method of claim17 wherein the porous polymeric member is selected from a material including polyvinyl acetal porous elastic material.
24. The method of claim17 wherein the porous polymeric member has a sodium concentration level of less than 0.10 parts per million prior to the packaging step.
25. The method of claim17 wherein a shape of the porous polymeric member is selected from the group consisting of a brush, a puck, a pad, or a plug.
US09/275,7351998-03-271999-03-24Method for packaging sponge or porous polymeric productsExpired - Fee RelatedUS6176067B1 (en)

Priority Applications (1)

Application NumberPriority DateFiling DateTitle
US09/275,735US6176067B1 (en)1998-03-271999-03-24Method for packaging sponge or porous polymeric products

Applications Claiming Priority (2)

Application NumberPriority DateFiling DateTitle
US7969598P1998-03-271998-03-27
US09/275,735US6176067B1 (en)1998-03-271999-03-24Method for packaging sponge or porous polymeric products

Publications (1)

Publication NumberPublication Date
US6176067B1true US6176067B1 (en)2001-01-23

Family

ID=26762328

Family Applications (1)

Application NumberTitlePriority DateFiling Date
US09/275,735Expired - Fee RelatedUS6176067B1 (en)1998-03-271999-03-24Method for packaging sponge or porous polymeric products

Country Status (1)

CountryLink
US (1)US6176067B1 (en)

Cited By (27)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
USD622920S1 (en)2007-05-022010-08-31Entegris CorporationCleaning sponge roller
US20120136083A1 (en)*2008-09-262012-05-31Nike, Inc.Systems And Methods For Stabilization Of A Phylon Article
US9811089B2 (en)2013-12-192017-11-07Aktiebolaget ElectroluxRobotic cleaning device with perimeter recording function
US9939529B2 (en)2012-08-272018-04-10Aktiebolaget ElectroluxRobot positioning system
US9946263B2 (en)2013-12-192018-04-17Aktiebolaget ElectroluxPrioritizing cleaning areas
US10045675B2 (en)2013-12-192018-08-14Aktiebolaget ElectroluxRobotic vacuum cleaner with side brush moving in spiral pattern
US10149589B2 (en)2013-12-192018-12-11Aktiebolaget ElectroluxSensing climb of obstacle of a robotic cleaning device
US10209080B2 (en)2013-12-192019-02-19Aktiebolaget ElectroluxRobotic cleaning device
US10219665B2 (en)2013-04-152019-03-05Aktiebolaget ElectroluxRobotic vacuum cleaner with protruding sidebrush
US10231591B2 (en)2013-12-202019-03-19Aktiebolaget ElectroluxDust container
US10285774B2 (en)2017-09-182019-05-14Certol International LLCMedical kit and dispenser for medical kits
US10433697B2 (en)2013-12-192019-10-08Aktiebolaget ElectroluxAdaptive speed control of rotating side brush
US10448794B2 (en)2013-04-152019-10-22Aktiebolaget ElectroluxRobotic vacuum cleaner
US10499778B2 (en)2014-09-082019-12-10Aktiebolaget ElectroluxRobotic vacuum cleaner
US10518416B2 (en)2014-07-102019-12-31Aktiebolaget ElectroluxMethod for detecting a measurement error in a robotic cleaning device
US10534367B2 (en)2014-12-162020-01-14Aktiebolaget ElectroluxExperience-based roadmap for a robotic cleaning device
US10617271B2 (en)2013-12-192020-04-14Aktiebolaget ElectroluxRobotic cleaning device and method for landmark recognition
US10678251B2 (en)2014-12-162020-06-09Aktiebolaget ElectroluxCleaning method for a robotic cleaning device
US10729297B2 (en)2014-09-082020-08-04Aktiebolaget ElectroluxRobotic vacuum cleaner
US10877484B2 (en)2014-12-102020-12-29Aktiebolaget ElectroluxUsing laser sensor for floor type detection
US10874274B2 (en)2015-09-032020-12-29Aktiebolaget ElectroluxSystem of robotic cleaning devices
US10874271B2 (en)2014-12-122020-12-29Aktiebolaget ElectroluxSide brush and robotic cleaner
US11099554B2 (en)2015-04-172021-08-24Aktiebolaget ElectroluxRobotic cleaning device and a method of controlling the robotic cleaning device
US11122953B2 (en)2016-05-112021-09-21Aktiebolaget ElectroluxRobotic cleaning device
US11169533B2 (en)2016-03-152021-11-09Aktiebolaget ElectroluxRobotic cleaning device and a method at the robotic cleaning device of performing cliff detection
US11474533B2 (en)2017-06-022022-10-18Aktiebolaget ElectroluxMethod of detecting a difference in level of a surface in front of a robotic cleaning device
US11921517B2 (en)2017-09-262024-03-05Aktiebolaget ElectroluxControlling movement of a robotic cleaning device

Citations (13)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US2621784A (en)*1948-12-061952-12-16Annette CaldwellMedicament or cosmetic applicator package
US3057467A (en)*1959-11-181962-10-09Colgate Palmolive CoPackage for treating agents and disposable applicator forming a part thereof
US4515703A (en)*1981-06-011985-05-07Lever Brothers CompanyArticle carrying active material
US4753844A (en)*1986-12-041988-06-28Airwick Industries Inc.Disposable semi-moist wipes
US4795497A (en)1985-08-131989-01-03Mcconnell Christopher FMethod and system for fluid treatment of semiconductor wafers
US5639311A (en)1995-06-071997-06-17International Business Machines CorporationMethod of cleaning brushes used in post CMP semiconductor wafer cleaning operations
US5868863A (en)1995-10-131999-02-09Ontrak Systems, Inc.Method and apparatus for cleaning of semiconductor substrates using hydrofluoric acid (HF)
US5897671A (en)*1997-11-071999-04-27Diversey Lever, Inc.System and method for washing machine cycle identification and chemical dosing identification
US5978994A (en)*1997-03-121999-11-09Vision International Production, Inc.Device and method for use in cleaning laundry
US5996780A (en)*1997-10-201999-12-07Gurrera; Vivien K.Cosmetic apparatus
US6004402A (en)1994-10-061999-12-21Xomed Surgical Products, Inc.Method of cleaning silicon material with a sponge
US6012576A (en)*1995-07-262000-01-11Fujitsu LimitedMethod of storing brush used in substrate surface treatment and container for storing such brush
US6027573A (en)1994-10-062000-02-22Xomed Surgical Products, Inc.Industrial cleaning sponge apparatus and method for extracting residue from a sponge material

Patent Citations (13)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US2621784A (en)*1948-12-061952-12-16Annette CaldwellMedicament or cosmetic applicator package
US3057467A (en)*1959-11-181962-10-09Colgate Palmolive CoPackage for treating agents and disposable applicator forming a part thereof
US4515703A (en)*1981-06-011985-05-07Lever Brothers CompanyArticle carrying active material
US4795497A (en)1985-08-131989-01-03Mcconnell Christopher FMethod and system for fluid treatment of semiconductor wafers
US4753844A (en)*1986-12-041988-06-28Airwick Industries Inc.Disposable semi-moist wipes
US6004402A (en)1994-10-061999-12-21Xomed Surgical Products, Inc.Method of cleaning silicon material with a sponge
US6027573A (en)1994-10-062000-02-22Xomed Surgical Products, Inc.Industrial cleaning sponge apparatus and method for extracting residue from a sponge material
US5639311A (en)1995-06-071997-06-17International Business Machines CorporationMethod of cleaning brushes used in post CMP semiconductor wafer cleaning operations
US6012576A (en)*1995-07-262000-01-11Fujitsu LimitedMethod of storing brush used in substrate surface treatment and container for storing such brush
US5868863A (en)1995-10-131999-02-09Ontrak Systems, Inc.Method and apparatus for cleaning of semiconductor substrates using hydrofluoric acid (HF)
US5978994A (en)*1997-03-121999-11-09Vision International Production, Inc.Device and method for use in cleaning laundry
US5996780A (en)*1997-10-201999-12-07Gurrera; Vivien K.Cosmetic apparatus
US5897671A (en)*1997-11-071999-04-27Diversey Lever, Inc.System and method for washing machine cycle identification and chemical dosing identification

Cited By (31)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
USD622920S1 (en)2007-05-022010-08-31Entegris CorporationCleaning sponge roller
US20120136083A1 (en)*2008-09-262012-05-31Nike, Inc.Systems And Methods For Stabilization Of A Phylon Article
US9456655B2 (en)*2008-09-262016-10-04Nike, Inc.Systems and methods for stabilization of a phylon article
US9939529B2 (en)2012-08-272018-04-10Aktiebolaget ElectroluxRobot positioning system
US10219665B2 (en)2013-04-152019-03-05Aktiebolaget ElectroluxRobotic vacuum cleaner with protruding sidebrush
US10448794B2 (en)2013-04-152019-10-22Aktiebolaget ElectroluxRobotic vacuum cleaner
US9811089B2 (en)2013-12-192017-11-07Aktiebolaget ElectroluxRobotic cleaning device with perimeter recording function
US10149589B2 (en)2013-12-192018-12-11Aktiebolaget ElectroluxSensing climb of obstacle of a robotic cleaning device
US10209080B2 (en)2013-12-192019-02-19Aktiebolaget ElectroluxRobotic cleaning device
US10045675B2 (en)2013-12-192018-08-14Aktiebolaget ElectroluxRobotic vacuum cleaner with side brush moving in spiral pattern
US10617271B2 (en)2013-12-192020-04-14Aktiebolaget ElectroluxRobotic cleaning device and method for landmark recognition
US10433697B2 (en)2013-12-192019-10-08Aktiebolaget ElectroluxAdaptive speed control of rotating side brush
US9946263B2 (en)2013-12-192018-04-17Aktiebolaget ElectroluxPrioritizing cleaning areas
US10231591B2 (en)2013-12-202019-03-19Aktiebolaget ElectroluxDust container
US10518416B2 (en)2014-07-102019-12-31Aktiebolaget ElectroluxMethod for detecting a measurement error in a robotic cleaning device
US10499778B2 (en)2014-09-082019-12-10Aktiebolaget ElectroluxRobotic vacuum cleaner
US10729297B2 (en)2014-09-082020-08-04Aktiebolaget ElectroluxRobotic vacuum cleaner
US10877484B2 (en)2014-12-102020-12-29Aktiebolaget ElectroluxUsing laser sensor for floor type detection
US10874271B2 (en)2014-12-122020-12-29Aktiebolaget ElectroluxSide brush and robotic cleaner
US10534367B2 (en)2014-12-162020-01-14Aktiebolaget ElectroluxExperience-based roadmap for a robotic cleaning device
US10678251B2 (en)2014-12-162020-06-09Aktiebolaget ElectroluxCleaning method for a robotic cleaning device
US11099554B2 (en)2015-04-172021-08-24Aktiebolaget ElectroluxRobotic cleaning device and a method of controlling the robotic cleaning device
US10874274B2 (en)2015-09-032020-12-29Aktiebolaget ElectroluxSystem of robotic cleaning devices
US11712142B2 (en)2015-09-032023-08-01Aktiebolaget ElectroluxSystem of robotic cleaning devices
US11169533B2 (en)2016-03-152021-11-09Aktiebolaget ElectroluxRobotic cleaning device and a method at the robotic cleaning device of performing cliff detection
US11122953B2 (en)2016-05-112021-09-21Aktiebolaget ElectroluxRobotic cleaning device
US11474533B2 (en)2017-06-022022-10-18Aktiebolaget ElectroluxMethod of detecting a difference in level of a surface in front of a robotic cleaning device
US10675120B2 (en)2017-09-182020-06-09Certol International LLCMedical kit and dispenser for medical kits
US10675119B2 (en)2017-09-182020-06-09Certol International LLCMedical kit and dispenser for medical kits
US10285774B2 (en)2017-09-182019-05-14Certol International LLCMedical kit and dispenser for medical kits
US11921517B2 (en)2017-09-262024-03-05Aktiebolaget ElectroluxControlling movement of a robotic cleaning device

Similar Documents

PublicationPublication DateTitle
US6076662A (en)Packaged sponge or porous polymeric products
US6176067B1 (en)Method for packaging sponge or porous polymeric products
US6182323B1 (en)Ultraclean surface treatment device
US5868863A (en)Method and apparatus for cleaning of semiconductor substrates using hydrofluoric acid (HF)
US6274059B1 (en)Method to remove metals in a scrubber
KR100574607B1 (en) Method and apparatus for cleaning semiconductor substrate after polishing copper film
US5723019A (en)Drip chemical delivery method and apparatus
US20060213536A1 (en)Substrate cleaning apparatus and substrate cleaning method
KR20010031262A (en)Methods and Apparatus for Cleaning Semiconductor Substrates after Polishing Copper Film
US10242862B2 (en)Post-CMP hybrid wafer cleaning technique
US20100043824A1 (en)Microelectronic substrate cleaning systems with polyelectrolyte and associated methods
JP2002096037A (en) Substrate cleaning tool and substrate cleaning device
US6120616A (en)Microcleaning process for sponge or porous polymeric products
US6158448A (en)System for cleaning sponge or porous polymeric products
JP7511466B2 (en) Cleaning device for cleaning member, substrate cleaning device and cleaning member assembly
JP7482768B2 (en) Cleaning device for cleaning member, cleaning method for cleaning member, and substrate cleaning method
JP7274883B2 (en) Cleaning equipment for cleaning members and substrate processing equipment
JPH11323000A (en)Microcleaning of sponge or porous polymer product
JP2000040684A (en)Cleaning equipment
JP6971676B2 (en) Board processing equipment and board processing method
TWI879930B (en) Cleaning device for cleaning component, substrate cleaning device and cleaning component assembly
JP3576216B2 (en) How to clean a synthetic resin storage case
WO2022270449A1 (en)Cleansing member treating device, break‐in method, and cleansing member cleaning method
US20050170980A1 (en)ER cleaning composition and method
TW202249100A (en)Substrate processing method and substrate processing system

Legal Events

DateCodeTitleDescription
ASAssignment

Owner name:RIPPEY CORPORATION, CALIFORNIA

Free format text:ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:BAHTEN, KRISTAN G.;REEL/FRAME:010027/0480

Effective date:19990513

FEPPFee payment procedure

Free format text:PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

FPAYFee payment

Year of fee payment:4

ASAssignment

Owner name:ILLINOIS TOOL WORKS INC., ILLINOIS

Free format text:ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:RIPPEY CORPORATION;REEL/FRAME:016377/0443

Effective date:20050801

FEPPFee payment procedure

Free format text:PAT HOLDER NO LONGER CLAIMS SMALL ENTITY STATUS, ENTITY STATUS SET TO UNDISCOUNTED (ORIGINAL EVENT CODE: STOL); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

REMIMaintenance fee reminder mailed
LAPSLapse for failure to pay maintenance fees
STCHInformation on status: patent discontinuation

Free format text:PATENT EXPIRED DUE TO NONPAYMENT OF MAINTENANCE FEES UNDER 37 CFR 1.362

FPLapsed due to failure to pay maintenance fee

Effective date:20090123


[8]ページ先頭

©2009-2025 Movatter.jp