US3885232A - Apparatus for the treatment of yarn thickness variation signals - Google Patents

Abstract

This invention relates to a method and apparatus for processing yarn defect signals of a plurality of yarns on the on-line base. For this purpose and in the case of the signal processing apparatus according to this invention a large number of yarn defect signals are processed through a scanning device for signal sampling, means is provided for placing possible drop-out signals into respective provisional memories, and preferably in the form of a binary ''''1'''' from a binary ''''0'''' and for reading out the contents from the memories at the beginning the next succeeding sampling period and for further processing these read-out yarn defects signals, together with regular yarn defects signals under processing through regular samplings.

Description

United StatesPatent 11 1Gate 1 APPARATUS FOR THE TREATMENT OF YARN THICKNESS VARIATION SIGNALS [75] Inventor:

[73] Assignee: Asahi Kasei Kogyo Kabushiki Kaisha, Osaka, Japan [22] Filed: Mar. 22, 1973 [21] Appl. No.: 343,980

Tsugio Goto, Nobeoka, Japan [30] Foreign Application Priority Data Mar. 24, 1972 Japan 47-29893 [52] US. Cl 340/173 R; 73/160; 235/1513; 235/92 PD; 324/111; 340/172.5

[51] Int. Cl.Gllc 11/24;G06h 3/05 [58] Field of Search 340/1725, 146.1, 173 CA; 235/92 PD, 92 QC, 92 ST,151.1, 151.13,

[4 1 May 20, 1975 3,689,898 9/1972 Stites 340/1725 3,704,362 11/1972 Kolby et a1. 235/I5l.13 3,705,391 12/1972 Baker 340/173 CA 3,714,623 1/1973 Mickler.... 340/173 CA X 3,727,033 4/1973 Bassist 235/92 PD 3,731,069 5/1973 Goto et al.... 235/1513 3,790,887 2/1974 Rich 324/111 3,795,906 3/1974 Erbstein 73/160 X 3,798,624 3/1974 Baxter et al. 235/15 1.1

Primary ExaminerRaulfe B. Zache Assistant Examiner-Jan E. Rhoads Attorney, Agent, or Firm-Armstrong, Nikaido & Wegner [57] ABSTRACT This invention relates to a method and apparatus for processing yarn defect signals of a plurality of yarns on the on-line base.

For this purpose and in the case of the signal processing apparatus according to this invention a large number of yarn defect signals are processed through a scanning device for signal sampling, means is provided for placing possible drop-out signals into respective provisional memories, and preferably in the form of a binary 1" from a binary 0" and for reading out the contents from the memories at the beginning the next succeeding sampling period and for further processing these read-out yarn defects signals, together with regular yarn defects signals under processing through regular samplings.

4 Claims, 3 Drawing Figures FIRSY INFMMYION GVERALL 1NFOHMAY1ON a PROCESSOR READOUT cmcun SOLID STATE R RELAY SCANNER CONYROL SECTlON WJENTED 3.885.232

sum 2 BF 3 FIG. 2

PATENTEDHAYZOISYS 3,885,232

saw 3 [IF 3 FIG. 3

220 220 I u 22 230 a 23 1 APPARATUS FOR THE TREATMENT OF YARN THICKNESS VARIATION SIGNALS BACKGROUND OF THE INVENTION This invention relates to a method and apparatus for processing yarn defects signals of a plurality of yarns on the on-line base for the overall evaluation of the yarn quality, said yarn defects signals being in the form of yarn thickness variation signals sensed through respective capacitor type sensors provided in a one-to-one relationship with said yarns.

Although the measurement of yarn defects signals of the above kind is a conventional technique, it has attracted the attention of those skilled in the art on account of its anticipating nature on later developabie color strips and dyed specks which occur on a woven or knitted fabric made from the yarns upon later dyeing, weaving and the like processing.

These yarn defects information signals delivered from a large number of the capacitance type sensors are passed through and processed by a conventional electronic scanner for conveying these signals in succession from yarn to yarn into a common information processing apparatus, preferably an electronic computer, for evaluation of the general quality of the yarns under manufacture in a spinning plant.

In such yarn information processing and evaluation systems, signal drop-outs may occur at interscanning periods and result in a fatal and adverse effect upon the generalized yarn quality determination being carried out for the yarn manufacturing plant.

SUMMARY OF THE INVENTION It is therefore the main object of the invention to provide a unique, effective and substantially improved technique for avoiding interscanning signal drop-outs which have an important effect upon the general evaluation of yarn quality of a large number of synthetic yarns under manufacture.

For this purpose and in the case of processing a large number of yarn defects signals through scanning for signal sampling, means are provided for placing otherwise possible drop-out signals into a provisional memory, preferably in the form of a binary l from a binary O and for reading out these memory contents from the memory at the beginning of the next succeeding sampling period and for further processing these read-out yarn defects signals, together with regular yarn defects signal under processing through regular samplings.

BRIEF DESCRIPTION OF THE DRAWINGS These and further objects, features and advantages of the invention will become more apparent from the following detailed description of the invention by reference to the accompanying drawings, in which:

FIG. 1 is a schematic diagram of a yarn defects signal processor adapted for carrying out the method according of this invention.

FIG. 2 is a chart for illustration of the operating modes of the signal processing system for n-yarns.

FIG. 3 is an additional chart to FIG. 2 adopted for the same illustrating purpose.

DESCRIPTION OF THE PREFERRED EMBODIMENT In the following, the invention will be described more LII in detail by reference to the accompanying drawings illustrative of a preferred sole embodiment of the invention.

In FIG. 1, numeral representing a yarn supplied from a spinning unit in its broadest sense, comprising at least, a spinneret, a stretcher and a scouring and the like after-treating unit, not shown. Theyarn 100 is passed through a sensing gap formed between a pair of stationary condenser electrodes contained in a yarn defects sensor 4-1 of the capacitance type, shown only schematically in a block. The thus sensed yarn defects signal is supplied through an output lead No. 1 to input terminal 22-1 ofa temporary memory circuit 5-1 which includes a silicon-controlled rectifier element 6-1 acting as memory element, condensers 9-1; 12-1 and semiconductor diodes 10-1; 11-1, resistors 7-1; 8-1, these circuit elements being electrically connected with each other as shown.

In the similar way,yarns 101; 102 100+ n are passed through respective yarn defects sensors 4-2; 4-3 4-n, each of which has similar structure as the first mentioned sensor 4-1, and the capacitively sensed yarn defects signals are fed therefrom through respective output leads Nos. 2; 3 n to temporary memories S-2', 5-3 5-n, respectively, each of which has similar structure as the first mentioned memory circuit 5-1.

Input terminals 22-2; 22-3 22-n correspond to that shown at 22-1. Silicon-controlled rectifier elements 6-2; 6-3 6-n are same with that shown at 6-1. Resistors 7-2; 7-3 7-n and 8-2; 8-3 8-n correspond to those 7-1 and 8-1, respectively. Condensers 9-2; 9-3 9-n and 12-2; 12-3 12-n correspond to those denoted 9-1 and 12-1, respectively. Semiconductor diodes 10-2; 10-3 10-n and 11-2; 11-3 11-n correspond to those denoted 10-1 and 11-1, respectively.

The respective yarn defects signals delivered from the sensors 4-1, 4-2, 4-3 4-n are shown in FIG. 2 at 1b, 2b, 3b nb, representatively and by way of exam-- ple. These yarn defects signals 1b, 2b, 3b rib are conveyed throughscanning contacts 14a-1, -2, 1411-3 l4a-n ofscanners 14, 15 to afirst information processor 19, shown only schematically by a block, as its successive inputs.

On the other hand, the memory signals in the temporary memories 5-1, 5-2, 5-3 S-n, as being shown representatively and only by way of example at 3c and nc in FIG. 2, are taken out and conveyed throughrespective scanning contacts 14b-1, 14b-2, 14b-3 14b-n ofscanners 14, 15 to a read-outcircuit 20 in succession, saidcircuit 20 being shown only schematically by a block. The operational sequence of the said first and second scanning contact series may be in the order of 140-1; 14b-1', 14a-2; 14b-2; 14a-3, 14b-3 14a-n; 14b-n.

Numeral 21 represents a final and overall information processor shown only schematically by a block and connected at its respective inputs 21a and 21b with the first andsecond information processors 19 and 20, and adapted for processing the signal outputs therefrom. When a full-automatic signal processing system is to be realized, thefinal processor 21 may be a digital type electronic computer. Or alternatively, when a rather simplified information record system is to be realized, thefinal information processor 21 may be a digital printer or terminal recorder.

The part denoted of thescanning circuit 14 is a control section thereof and is connected in series with asolid state timer 16 and arelay 17 which are shown only schematically by respective blocks. ln synchronism with the scanning operations shown at lal; 2al and 3al in FIG. 2 or 3, thecontrol section 15 delivers successively signals 22a of thesignal series 22 totimer 16 which, when thus energized, initiates its operation for a predetermined time period when one ofsignal 230 belonging to signal series comes. At this time,relay 17 energized so as to close itscontact 18 connected between the input to theprocessor 20 and ground.Timer 16 is reset when thesignal 22b arrives in thesignal series 22, thereby the operation ofrelay 17 is terminated so as to release itsrelay contact 18 from its closed position. Thecontact 18 is thus opened again.

in FIG. 2, (1) represents a group of signal series representing in turn those necessary for the operation of the first sensor 4-1 and its following electronic parts. In the similar way, (2) represents a similar group of signal series representing in turn those necessary for operation of the second sensor 4-2 and its following electronic parts. Similarly, (3) (n) are related to sensors 4-3 4-n and their following electronic parts. Arrows T" appearing in FIGS. 2 and 3 demonstrate the progress of time.

Wave series la; 20; 3a na represents respective signal sampling modes. The operational sequence can be more clearly understood by reference to FIG. 3.

As an example, the sampling is carried out for each of the time periods of lal; 1a2 in connection with the first yarn defects signal lb.

Similarly, for each of the time periods of 2al, 2a2 sampling is carried out in connection with the second yarn defects signal 212.

Samplings are carried out in the similar way at each of time periods 3al; 3a2 of thewave series 3a in connection with theyarn defects signal 3b.

In the case of n-th yarn defects signal series rib, sampling will be carried out at each of the time periods nal; n02 of the wave series 110.

In the case of the first yarn defects signal series 1b, the second irregular signal pulse 1b-2 is developed during thesampling period 102 and exceed over the upper established level ldl] of both limiting levels ldO; 1e0, thus it is treated as a yarn defect in the information processing.

Further, in the case of the second yarndefects signal series 2b, all the pulses exceeding established levels 2d0', 2e0 are thus subjected to information processing at each of thesampling periods 2a]; 202.

Next, consider the first yarn defect signal lbl appearing in the first signal series 1b which developed outside of the regular and related sampling periods. According to the conventional sampling method, this yarn defect pulse would not be taken into account, thus representing a fatal drawback in the conventional technique.

This drawback can be remedied according to the present invention.

As an example, the yarn defect pulse 3bl appearing in the third yarndefects signal series 3b exceeds the establishedlevel 3d; 3e and thus, the temporary memory circuit 5-3 is energized upon reception of this yarn defeet pulse. Thus the energized memory state thereof is continued until the next sampling time period 302 arrives and terminates, as shown at 3C] in thewave series 30. At the arrival of the sampling period 3a2, the memorized information is read out as a yarn defect signal which will be processed. Upon this read-out, the memory is reset and cleared for the next memory operation.

The same will be applied to the yarn defect pulse nbl appearing in the n-th yarn defects signal series ab and, outside of the two successive sampling periods nal and n02 of wave series rm and exceeding the both established limiting levels nd; ne. The memorized signal is shown at ncl of the signal series nc. The pulse nbl represents, in this case also, a random and large yarn defect such as a defective broken monofilament ball in a multifilament.

As an example, as on-line yarn quality control system in a multifilament yarn manufacturing factory will be explained with reference to FIGS. 2 and 3.

In this case, the sensors 4-1, 4-2, 4-3 4-n are attached one by one to all the stretching twister units contained in the factory, and each being provided directly upstream of the related pirn winding stage. Thus, all the manufacturing multifilaments are sensed and the sensed yarn strength variation information signals are fed out from the respective sensors to conveying leads Nos. 1, 2, 3 n, as was exaplined hereinbefore. These signals are subjected to sampling once every ten seconds per yarn, through the on-off operation of relay contacts l4a-1', 14a-2,' 14a-3 l4a-n. These successively sampled signals are conveyed to the firstprimary processor 19, as was referred to hereinbefore.

As an example and as was referred to hereinbefore, a random and larger yarn defect pulse 3bl, representing mostly a pill, appearing outside of sampling periods such as 3a1 and 302 and exceeding the limitinglevels 3d and 32, will be conveyed from lead No. 3 and through input terminal 22-3; condenser 12-3; semiconductor diodes 10-3; 11-3, condenser 9-3 and resistor 7-3 to the control grid of silicon-controlled rectifier element 6-3 which is thus energized. With energization of the element 6-3, the potential at the anode side of the element 6-3 which continue to operate even if the large yarn defect signal decreases to those lying within its regular and allowable range defined by and between the limiting both levels. This means that by the presence of the random and large yarn defect signal representing a pill or the like has been transformed from binary 0 to binary l by actuation of theelement 6, as expressed at ml in FIG. 2 for memory purpose. This memory condition will continue until the next succeeding sampling period 302 comes, as was referred to hereinbefore. At this last-mentioned period, both sampling contacts l4a-3 and 14b-3 are closed simultaneously, the large yarn defect signal 3bl will thus be conveyed through the now-closedfirst relay contact 14a-3 to firstprimary processor 19 and the read-outbinary signal 1 from the memory 5-3 through the anode of siliconcontrolled element 6-3 and the now closed relay second contact 1412-15 to secondprimary processor 20 acting as large yarn defect read-out circuit which is thus brought into actuation.

The outputs from the bothprimary processors 19 and 20 are conveyed to final andoverall processor 21 which may preferably a digital type electronic computer, as was referred to hereinbefore.

The firstprimary processor 19 may treat simultaneously those yarn defect signals which represent the mean wave height characteristics of the yarn defect signals displaying in advance color strips to appear in the dyed and woven fabric; the mean wave area characteristics of the yarn defect signals indicating in advance dyed specks to appear later; the degree or sizes of the developed monofilament pills; the developed extraordinary monofilament conditions and yarn breakage information, if any.

Outputs from thefinal processor 21 may be used pri marily providing an indication of the overall yarn quality of the products from the factory. The processed overall yarn information can be utilized for control of the quality of the spinning material and/or the overall spinning conditions of the factory plant.

At each of the short time durations 23a ofwave series 23, 23, FIG. 3, extending I second, as an example, therelay contact 18, in FIG. I, is closed and the anode of the now operating silicon-controlled element 6-3 is grounded through the closed relay contacts l4b-3 and saidcontact 18. Therefore, the element in is reset for sensing and preserving again the large yarn defect signal.

In the preferred embodiment shown and described, the scanning apparatus has a signal sampling period of 10 seconds per one spinning unit, not shown, from which one of themultifilament yarn 100; 101', I02 or 100 n is delivered. The yarn stretching and winding plant in the factory is assumed to have 156 such spinning units. Therefore, in this case, the sampling period will be 26 minutes. In other words, the sampling for one spinning unit is carried out for 10 seconds per 26 minutes. These data have been selected mainly and naturally from economical reasons.

In practice, a continuous yarn defect signal as shown at 2b in FIG. 2 may be frequently encountered during manufacture of synthetic multifilaments with which the invention is concerned. In this case, also, the aforemen' tioned kind of the sampling mode is sufficiently for the desired purpose. ()n the other hand, even ifa large yarn defect as shown at lbl; 1122; SM or nbl should not be sensed, the resulted pirn could be discarded exclusively from this reason. According to the present invention, such large yarn defects as large filament pills can be practically continuously sensed and processed with an economical sampling system as shown and described. Thus, it is highly valuable for the purpose of on-line supervision of a large number of multifilament yarns as spun, stretched and wound, thereby providing a re markable progress in the art.

As was referred to, the randomly developed large yarn defects are stored in the provisional memory wherein in each reception of the corresponding yarn defects signals the binary O is changed in its state into the binary 1, thus the memory means is simple and inexpensive. The read-out operation for taking out the memorized yarn defects signal from the memory can be made simple and inexpensive in comparison with comparative conventional means.

In FIG. 2 at (3), different effective signal ranges 3:10; 3e0 and 3d; 3e are shown in an overlapped manner for showing possible alteration of the range depending upon the kind and nature of the yarn and the scope and purpose of the yarn quality evaluation. In FIG. 2 at (n), the same is applied to different and overlapped effective yarn signal ranges defined by nd0; ne0 and nd; ne, respectively.

The embodiments of the invention in which an exclusive property or privilege is claimed are as follows:

1. An apparatus for processing defect signals from a plurality of yarns wherein said signals may be applied to a digital processor, said apparatus comprising:

a. a plurality of sensor means, each sensor means associated with one of said yarns for detecting a defeet in said yarns; b. a plurality of memory means, each of said memory means coupled to a corresponding one of said sensor means for storing a defect signal produced by its corresponding sensor means; 0. scanner means coupled to said plurality of memory means for cyclically sequentially sampling the signals stored in said memory means for subseqeunt output to said digital processor; and d. reset means for periodically resetting said memory means at the beginning of each sampling cycle; wherein each said memory means includes a thyristor, the anode thereof being coupled to said scanner means;

a capacitor having one electrode connected to its corresponding sensor means;

diode means coupled between the other electrode of said capacitor and the gate electrode of said thyristor, wherein said sensor means applies a pulse to the gate of said thyristor through said capacitor and diode means, turning said thyristor on and thereby changing the potential on the anode thereof when a defect signal is sensed by said sensor means; wherein said thyristor remains on until reset by said reset means.

2. The apparatus ofclaim 1 wherein said sensor means is a capacitive sensor.

3. The apparatus ofclaim 1, wherein said scanner means includes normally open switch means associated with each memory means coupled to the anode of said thyristor wherein each said switch means is closed during the sampling of the corresponding memory means thereby coupling the anode of said thyristor to said processer means.

4. The apparatus ofclaim 1, wherein said reset means comprises means for grounding the anode of said thyristor thereby turning said thyristor off.

Claims (4)

1. An apparatus for processing defect signals from a plurality of yarns wherein said signals may be applied to a digital processor, said apparatus comprising: a. a plurality of sensor means, each sensor means associated with one of said yarns for detecting a defect in said yarns; b. a plurality of memory means, each of said memory means coupled to a coRresponding one of said sensor means for storing a defect signal produced by its corresponding sensor means; c. scanner means coupled to said plurality of memory means for cyclically sequentially sampling the signals stored in said memory means for subseqeunt output to said digital processor; and d. reset means for periodically resetting said memory means at the beginning of each sampling cycle; wherein each said memory means includes a thyristor, the anode thereof being coupled to said scanner means; a capacitor having one electrode connected to its corresponding sensor means; diode means coupled between the other electrode of said capacitor and the gate electrode of said thyristor, wherein said sensor means applies a pulse to the gate of said thyristor through said capacitor and diode means, turning said thyristor on and thereby changing the potential on the anode thereof when a defect signal is sensed by said sensor means; wherein said thyristor remains on until reset by said reset means.

2. The apparatus of claim 1 wherein said sensor means is a capacitive sensor.

3. The apparatus of claim 1, wherein said scanner means includes normally open switch means associated with each memory means coupled to the anode of said thyristor wherein each said switch means is closed during the sampling of the corresponding memory means thereby coupling the anode of said thyristor to said processer means.

4. The apparatus of claim 1, wherein said reset means comprises means for grounding the anode of said thyristor thereby turning said thyristor off.

Images