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US3598107A - Pupillary motion observing apparatus - Google Patents

Pupillary motion observing apparatus
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US3598107A
US3598107AUS747543AUS3598107DAUS3598107AUS 3598107 AUS3598107 AUS 3598107AUS 747543 AUS747543 AUS 747543AUS 3598107D AUS3598107D AUS 3598107DAUS 3598107 AUS3598107 AUS 3598107A
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pupil
signals
infrared
image
video
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US747543A
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Satoshi Ishikawa
Masao Okabe
Yuji Hakamata
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Hamamatsu TV Co Ltd
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Hamamatsu TV Co Ltd
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Abstract

A television system using an infrared vidicon is used for displaying the pupil of a human eye to provide a measure of pupil size. Line scanning video signals scanned across the pupil may be monitored and clipped at a predetermined threshold level to determine the width of the pupil and therefore the area of the pupil. Line scans across the pupil are detected by an electronic system to provide an indication of pupil size.

Description

United States Patent (72] Inventors Satoshi lshikawa Tokyo; Masao Okabe, llamamatsu; Yuji Hakamata, llamamatsu, all of, Japan [21] Appl. No. 747,543 [22] Filed July 25, 1968 [45] Patented Aug. 10, 1971 [73] Assignee llarnamatsu T.V. Company, Limited Hamamatsn, Shizuoka, Japan [54] PUPILLARY MOTION OBSERVING APPARATUS I Claim, 6 Drawing Figs.
(52] US. Cl 128/2, 351/6, 351/7 [51] lnt.Cl A6lb3/l0 [50] Field of Search 128/2; 351/7, 6, 23, 39; 250/206, 221 220 [56] References Cited UNITED STATES PATENTS 3,525,565 8/1970 O'Neill et a1 351/6 2,445,787 7/1948 Lilienfeld 351/7 2,573,464 10/1951 Lowenstein et al 351/7 3,036,568 5/1962 Stark 128/2 3,433,935 3/1969 Sherman 128/2 X 3,473,868 10/1969 Young et al. 351/6 OTHER REFERENCES Feinberg, R., Transactions Of The lntemational Opthalmic Optics Congress, 1961, publ. in London, 1962, British Optical Assoc., pp. 268 273, RE951 I55, Lib. of Cong. (copy in GR. 250, 351/6) Roth; N., The Review Of Scientific instruments, Vol. 36, No. 11, Nov. 1965, pp. 1636- 1639, (copy in GR. 250, 351/6) Primary Examiner-Richard A. Gaudet Assistant Examiner-Kyle L. Howell Attorney-Laurence R. Brown MON! TOE 2 I I 8 I/ I! P .OA pEE 1 67707214 4742 ZED v g l g g PUPILLARY MOTION OBSERVING APPARATUS This invention relates to a pupillary motion observing apparatus.
The observation of the motion of a pupil is very important particularly to the diagnosis of diseases in both ophthalmology and neurology fields. The overall observation of the pupil is generally inaccurate. In some countries or particularly in America, there is a method of continuously photographing it with an infrared film or observing it by using a noctovision. But there are shortcomings that no direct quantitative measurement value can be obtained without an enormous cost.
Therefore, an object of the present invention is to provide an apparatus whereby the motion of a pupil can be recorded quantitatively without any time delay.
Another object of the present invention is to provide a tiny inexpensive apparatus whereby accurate medical examinations and diagnoses can be made quickly without requiring any skill.
A further object of the present invention is to provide an ap- In the synchronous signal polarity reverser 10,positive polarity pulses 32 synchronized .with the synchronous signal 30 and having a large amplitude somewhat wider than that of said signal will be superposed as shown in FIG. 4(a) and ([2). Therefore, if the trigger level is adjusted to be in the projecting part of the video signal, that is, in between the parts 31 corresponding to thepupil 13, the Schmitt trigger circuit 11 will send out square waves 33 as shown in FIG. 4 (c). The time width T of this unit square wave is proportional to the time during which one scanning line, for example, ascanning line 14 scans the pupil I3 and therefore to the distance I Further,
when a constant current circuit 15 is controlled with such square wave signal as in FIG. 4 whenever each unit square wave is applied, a constant current [will be able to be sent out of said circuit. As acondenser 16 is charged with said current I, the ten'ninal voltage of this condenser will increase with a fixed angle a of inclination for each square wave in FIG. 4 (c) as in FIG. 4 (d). Whenever the image pickup means 6 completes the scanning of one frame, thecondenser 16 will discharge the stored charge byreset circuit 18. Therefore, the
' voltage of thecondenser 16 will be zero in the initial period of paratus whereby it is not necessary to apply any mydriatic to eyes and therefore no pain will be felt by the patient.
In the accompanying drawings:
FIG. 1 is a block diagram of an embodiment of the present invention;
FIG. 2 is a more detailed block diagram of an area detecting means of the apparatus in FIG. 1;
FIG. 3 is a view showing an optical image projected on a image pickup means by means ofthe apparatus in FIG. I;
FIG. 4 shown wave form diagrams for explaining the operation of the apparatus in FIG. I;
FIGS. 5 and 6 show examples of recorded curves observed with apparatus of FIG. I.
FIG. I shows an embodiment of theprcsent invention.
The eyeball 3 of a patient is illuminated in a dark room with a known infrared irradiating means such as an infrared filter 2 on a l. AXenon flash 4 or 5 in a basic experiment are employed for the stimulus to the pupil. Further, ifa proper stimulation is given to the eye so that the pupil has contracted in a bright room, the pupil will gradually dilate to open in a dark room. The infrared image of pupil motion-is displayed on the photosensitive surface of an infrared image pickup means 6. Since an infrared filter is provided in front ofthe image pickup means 6, irrespective of the visible rays of the xenon lamp 4 for dilating or contracting the pupil by irradiation to the eye, an image of a fixed brightness will be projected on the image pickup means 6 which senses only the rays of the infrared irradiating means. Therefore, the image pickup means 6 will stably view the dilating or contracting motion of the pupil and will send out its video signal with vertical and horizontal synchronous signals superposed on it. As those signals are fed into an area detecting means 7 and amonitoring device 8, the motion of the pupil can be observed with themonitoring device 8. In the area detecting means 7, as shown in FIG. 2, the video signal applied from aterminal 9 will control a Schmitt trigger circuit I I through a synchronous signal polarity reverser I0. That is to say, if an image of an eyeball as shown in FIG. 3 is projected on the photosensitive surface of the photosensitive surface of the image pickup means 6, theiris part 12 andpupil 13 will be low in brightness. Therefore, if it is scanned with anyscanning line 14, there will be obtained a video signal of a substantially inverted convex form as shown in FIG. 4 (a). Since the iris and pupil are circular, when the scanning line moves down, the time width of the above mentioned video signal in the scanning line will gradually increase to reach the maximum value and will again gradually decrease. Further, between the respective unit video signals, a horizontal synchronous signal of the inverse polarity to these signals will be inserted as shown in FIG. 4 (b) and, at the same time, though not illustrated, whenever the scanning of one frame is completed, a vertical synchronous signal will be inserted. The form of these synchronous signals is the same as in general industrial television apparatus.
scanning one frame but will rise by the voltage proportional to the distance I as the horizontal scanning line gradually lowers from the upper end of the photosensitive surface to cross theimage 13 of the pupil and will reach the maximum value when the scanning line has reached the lower end to complete the scanning of one frame. This value is evidently proportional to the area of theimage 13 of the pupil. This voltage is amplified with a high input impedance amplifier l9 and is applied to a memory circuit 2! through aswitch circuit 20. The memory pulses generated from the memorypulse generating circuit 17 are applied to theswitch circuit 20 so that the switch circuit may be in a conducting state for a short time and transfers the voltage of the condenser to thememory circuit 21 just before the reset is applied.
Further, the operation of the memory and the reset is practiced within the period of the vertical blanking pulse fromgenerator 24. Whenever the scanning of one frame ends, thememory circuit 21 will memorize a voltage proportional to the area of the pupil and will hold the memorized value during the next period of one frame.
Since the output of thismemory circuit 21 is amplified with as highinput impedance amplifier 22 and is applied to arecording system 23 as shown in FIG. 1, the dilation and contraction of the pupil will be recorded by a commercial recorder. For the recording, an analog automatic balance recorder may be used. Further, when the output is applied to a numerical value recording means through a proper analog to digital converter, it will be possible to type and record the area of the pupil at intervals ofa fixed time.
FIG. 5 shows a curve of the relation between the time t and pupil area A in the case that the pupil was gradually dilated by giving a longer stimulus to the eyeball in which the pupil was contracted from atime 0 to r as recorded with an automatic balance recorder in such apparatus as is described above. FIG, 6 shows an example of the same curve in the case that the pupil was contracted by giving an irradiation to the eyeball in which the pupil was dilated from atime 0 to 1,. Therefore, for example, if a standard curve in each symptom is recorded in advance and an observed curve is compared with it, an accurate diagnosis will be made easily without any skill.
As has been explained in the above with reference to the described embodiment of the present invention, such difficul ty as causing pain to the patient when using conventional diagnosing methods can be eliminated and, at the same time, an accurate observation of the pupil motion can be made independent of visible rays irradiating the eyeball. Further, the changes of pupil area can be recorded quantitatively at the same time without any time delay: ie a quick accurate diagnosis can be made without requiring any professional skill and furthermore, it is possible to make a diagnosis mechanically by applying a measured value directly to an electronic computer. The apparatus can be made simple, tiny and inexpensive.
What we claim is:
means extracting pupil signals-scanned across only the pupil out of the video scan signals produced by said image pickup means, means integrating the time widths of said pupil signals over each line scan presentation during an entire frame period, and means for observing the variation with time of said integrated pupil output signal of said signals.

Claims (1)

1. Pupil motion observing apparatus comprising infrared irradiating means for irradiating a pupil with infrared rays, infrared image pickup means for producing video signals of said pupil responsive to the infrared rays irradiated on the pupil to thereby display the image of the pupil in video signal form, pupil area detecting means for obtaining signals corresponding to the area of the pupil comprising means for processing said video signals scanned across the image of the pupil, means extracting pupil signals scanned across only the pupil out of the video scan signals produced by said image pickup means, means integrating the time widths of said pupil signals over each line scan presentation during an entire frame period, and means for observing the variation with time of said integrated pupil output signal of said signals.
US747543A1968-07-251968-07-25Pupillary motion observing apparatusExpired - LifetimeUS3598107A (en)

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Cited By (33)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US3777738A (en)*1968-06-221973-12-11Tokai Rika Co LtdOphthalmic diagnostic instrument
US3782364A (en)*1971-12-201974-01-01J WattMethod for detecting and recording abnormal human eye responses
US4102564A (en)*1975-04-181978-07-25Michael Henry LPortable device for the accurate measurement of eye movements both in light and obscurity
US4283124A (en)*1974-06-191981-08-11Canon Kabushiki KaishaEye fundus camera
EP0048346A1 (en)*1980-09-231982-03-31The University Of BirminghamAutomatic measurement of areas
WO1986005018A1 (en)*1985-02-201986-08-28Leonard FlomIris recognition system
DE3702528A1 (en)*1986-01-281987-07-30George Pavlidis METHOD AND SYSTEM FOR DETERMINING THE PRESENCE OF VARIOUS NEUROLOGICAL INFLUENCES, IN PARTICULAR OF DYSLEXIA
US4729652A (en)*1985-11-041988-03-08Eye Research Institute Of Retina FoundationApparatus and method for determining angular orientation of eye
US4798214A (en)*1987-11-241989-01-17The United States Of America As Represented By The Secretary Of The Air ForceStimulator for eye tracking oculometer
US4854329A (en)*1987-07-211989-08-08Walruff James CApparatus and method for noninvasive testing of voluntary and involuntary motor response patterns
FR2653917A1 (en)*1989-10-311991-05-03Luneau Sa METHOD FOR AUTOMATIC MEASUREMENT OF KERATOMETRY AND APPARATUS FOR IMPLEMENTING SAID METHOD
US5070883A (en)*1988-12-161991-12-10Konan Camera Research Institute Inc.Eye movement analyzing device utilizing pupil center-of-gravity data
US5507291A (en)*1994-04-051996-04-16Stirbl; Robert C.Method and an associated apparatus for remotely determining information as to person's emotional state
US5576780A (en)*1992-05-261996-11-19Cain Research Pty. Ltd.Method for evaluation of length of focus of the eye
US5717512A (en)*1996-05-151998-02-10Chmielewski, Jr.; Thomas A.Compact image steering and focusing device
US6320610B1 (en)1998-12-312001-11-20Sensar, Inc.Compact imaging device incorporating rotatably mounted cameras
WO2008037299A1 (en)2006-09-292008-04-03Flitcroft Investments LimitedEye examining system and method
US7744216B1 (en)2006-01-062010-06-29Lockheed Martin CorporationDisplay system intensity adjustment based on pupil dilation
US20140364015A1 (en)*2011-06-062014-12-11Nuvotronics, LlcBatch fabricated microconnectors
US9306255B1 (en)2013-03-152016-04-05Nuvotronics, Inc.Microstructure including microstructural waveguide elements and/or IC chips that are mechanically interconnected to each other
US9306254B1 (en)2013-03-152016-04-05Nuvotronics, Inc.Substrate-free mechanical interconnection of electronic sub-systems using a spring configuration
US9312589B2 (en)2003-03-042016-04-12Nuvotronics, Inc.Coaxial waveguide microstructure having center and outer conductors configured in a rectangular cross-section
US9325044B2 (en)2013-01-262016-04-26Nuvotronics, Inc.Multi-layer digital elliptic filter and method
US9505613B2 (en)2011-06-052016-11-29Nuvotronics, Inc.Devices and methods for solder flow control in three-dimensional microstructures
US9515364B1 (en)2006-12-302016-12-06Nuvotronics, Inc.Three-dimensional microstructure having a first dielectric element and a second multi-layer metal element configured to define a non-solid volume
US9570789B2 (en)2007-03-202017-02-14Nuvotronics, IncTransition structure between a rectangular coaxial microstructure and a cylindrical coaxial cable using step changes in center conductors thereof
US9993982B2 (en)2011-07-132018-06-12Nuvotronics, Inc.Methods of fabricating electronic and mechanical structures
US10002818B2 (en)2007-03-202018-06-19Nuvotronics, Inc.Integrated electronic components and methods of formation thereof
US10310009B2 (en)2014-01-172019-06-04Nuvotronics, IncWafer scale test interface unit and contactors
US10319654B1 (en)2017-12-012019-06-11Cubic CorporationIntegrated chip scale packages
US10497511B2 (en)2009-11-232019-12-03Cubic CorporationMultilayer build processes and devices thereof
US10511073B2 (en)2014-12-032019-12-17Cubic CorporationSystems and methods for manufacturing stacked circuits and transmission lines
US10847469B2 (en)2016-04-262020-11-24Cubic CorporationCTE compensation for wafer-level and chip-scale packages and assemblies

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US2445787A (en)*1945-12-181948-07-27Lilienfeld Julius EdgarMethod of and apparatus for plotting an ordered set of quantities
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US2573464A (en)*1948-08-061951-10-30LowensteinMethod and machine having application in pupillography
US3036568A (en)*1958-01-201962-05-29Stark LawrencePupillometer
US3433935A (en)*1963-07-121969-03-18Herbert ShermanApparatus for computation particularly adapted for producing a measure of transit time and the like
US3473868A (en)*1967-04-271969-10-21Space Sciences IncEye position and movement monitor
US3525565A (en)*1968-01-291970-08-25Whittaker CorpOptical status testing means and method for dynamically determining lens accommodation

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Roth; N., The Review Of Scientific Instruments, Vol. 36, No. 11, Nov. 1965, pp. 1636 1639, (copy in GR. 250, 351/6)*

Cited By (47)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US3777738A (en)*1968-06-221973-12-11Tokai Rika Co LtdOphthalmic diagnostic instrument
US3782364A (en)*1971-12-201974-01-01J WattMethod for detecting and recording abnormal human eye responses
US4283124A (en)*1974-06-191981-08-11Canon Kabushiki KaishaEye fundus camera
US4102564A (en)*1975-04-181978-07-25Michael Henry LPortable device for the accurate measurement of eye movements both in light and obscurity
EP0048346A1 (en)*1980-09-231982-03-31The University Of BirminghamAutomatic measurement of areas
WO1986005018A1 (en)*1985-02-201986-08-28Leonard FlomIris recognition system
US4641349A (en)*1985-02-201987-02-03Leonard FlomIris recognition system
US4729652A (en)*1985-11-041988-03-08Eye Research Institute Of Retina FoundationApparatus and method for determining angular orientation of eye
DE3702528A1 (en)*1986-01-281987-07-30George Pavlidis METHOD AND SYSTEM FOR DETERMINING THE PRESENCE OF VARIOUS NEUROLOGICAL INFLUENCES, IN PARTICULAR OF DYSLEXIA
US4854329A (en)*1987-07-211989-08-08Walruff James CApparatus and method for noninvasive testing of voluntary and involuntary motor response patterns
US4798214A (en)*1987-11-241989-01-17The United States Of America As Represented By The Secretary Of The Air ForceStimulator for eye tracking oculometer
US5070883A (en)*1988-12-161991-12-10Konan Camera Research Institute Inc.Eye movement analyzing device utilizing pupil center-of-gravity data
FR2653917A1 (en)*1989-10-311991-05-03Luneau Sa METHOD FOR AUTOMATIC MEASUREMENT OF KERATOMETRY AND APPARATUS FOR IMPLEMENTING SAID METHOD
EP0426558A1 (en)*1989-10-311991-05-08Luneau S.A.Keratometry procedure and automatic measurement and apparatus to implement said procedure
US5684561A (en)*1992-05-261997-11-04Daphne Eye TechnologiesDevice and method for evaluation of refraction of the eye
US5576780A (en)*1992-05-261996-11-19Cain Research Pty. Ltd.Method for evaluation of length of focus of the eye
US5507291A (en)*1994-04-051996-04-16Stirbl; Robert C.Method and an associated apparatus for remotely determining information as to person's emotional state
US5717512A (en)*1996-05-151998-02-10Chmielewski, Jr.; Thomas A.Compact image steering and focusing device
US6005704A (en)*1996-05-151999-12-21Sensar, Inc.Cable driven image steering and focusing device
US6320610B1 (en)1998-12-312001-11-20Sensar, Inc.Compact imaging device incorporating rotatably mounted cameras
US9312589B2 (en)2003-03-042016-04-12Nuvotronics, Inc.Coaxial waveguide microstructure having center and outer conductors configured in a rectangular cross-section
US10074885B2 (en)2003-03-042018-09-11Nuvotronics, IncCoaxial waveguide microstructures having conductors formed by plural conductive layers
US7744216B1 (en)2006-01-062010-06-29Lockheed Martin CorporationDisplay system intensity adjustment based on pupil dilation
US7976162B2 (en)2006-09-292011-07-12Daniel Ian FlitcroftEye examining system and method
WO2008037299A1 (en)2006-09-292008-04-03Flitcroft Investments LimitedEye examining system and method
US9515364B1 (en)2006-12-302016-12-06Nuvotronics, Inc.Three-dimensional microstructure having a first dielectric element and a second multi-layer metal element configured to define a non-solid volume
US10002818B2 (en)2007-03-202018-06-19Nuvotronics, Inc.Integrated electronic components and methods of formation thereof
US10431521B2 (en)2007-03-202019-10-01Cubic CorporationIntegrated electronic components and methods of formation thereof
US9570789B2 (en)2007-03-202017-02-14Nuvotronics, IncTransition structure between a rectangular coaxial microstructure and a cylindrical coaxial cable using step changes in center conductors thereof
US10497511B2 (en)2009-11-232019-12-03Cubic CorporationMultilayer build processes and devices thereof
US9505613B2 (en)2011-06-052016-11-29Nuvotronics, Inc.Devices and methods for solder flow control in three-dimensional microstructures
US20140364015A1 (en)*2011-06-062014-12-11Nuvotronics, LlcBatch fabricated microconnectors
US9583856B2 (en)*2011-06-062017-02-28Nuvotronics, Inc.Batch fabricated microconnectors
US9993982B2 (en)2011-07-132018-06-12Nuvotronics, Inc.Methods of fabricating electronic and mechanical structures
US9608303B2 (en)2013-01-262017-03-28Nuvotronics, Inc.Multi-layer digital elliptic filter and method
US9325044B2 (en)2013-01-262016-04-26Nuvotronics, Inc.Multi-layer digital elliptic filter and method
US9306254B1 (en)2013-03-152016-04-05Nuvotronics, Inc.Substrate-free mechanical interconnection of electronic sub-systems using a spring configuration
US10193203B2 (en)2013-03-152019-01-29Nuvotronics, IncStructures and methods for interconnects and associated alignment and assembly mechanisms for and between chips, components, and 3D systems
US10257951B2 (en)2013-03-152019-04-09Nuvotronics, IncSubstrate-free interconnected electronic mechanical structural systems
US10361471B2 (en)2013-03-152019-07-23Nuvotronics, IncStructures and methods for interconnects and associated alignment and assembly mechanisms for and between chips, components, and 3D systems
US9888600B2 (en)2013-03-152018-02-06Nuvotronics, IncSubstrate-free interconnected electronic mechanical structural systems
US9306255B1 (en)2013-03-152016-04-05Nuvotronics, Inc.Microstructure including microstructural waveguide elements and/or IC chips that are mechanically interconnected to each other
US10310009B2 (en)2014-01-172019-06-04Nuvotronics, IncWafer scale test interface unit and contactors
US10511073B2 (en)2014-12-032019-12-17Cubic CorporationSystems and methods for manufacturing stacked circuits and transmission lines
US10847469B2 (en)2016-04-262020-11-24Cubic CorporationCTE compensation for wafer-level and chip-scale packages and assemblies
US10319654B1 (en)2017-12-012019-06-11Cubic CorporationIntegrated chip scale packages
US10553511B2 (en)2017-12-012020-02-04Cubic CorporationIntegrated chip scale packages

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