Movatterモバイル変換


[0]ホーム

URL:


US3424909A - Straight parallel channel electron multipliers - Google Patents

Straight parallel channel electron multipliers
Download PDF

Info

Publication number
US3424909A
US3424909AUS538900AUS3424909DAUS3424909AUS 3424909 AUS3424909 AUS 3424909AUS 538900 AUS538900 AUS 538900AUS 3424909D AUS3424909D AUS 3424909DAUS 3424909 AUS3424909 AUS 3424909A
Authority
US
United States
Prior art keywords
canals
electron
diode
electron multiplier
parallel channel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US538900A
Inventor
Henri Rougeot
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thales SA
Original Assignee
CSF Compagnie Generale de Telegraphie sans Fil SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from FR10462Aexternal-prioritypatent/FR1465381A/en
Application filed by CSF Compagnie Generale de Telegraphie sans Fil SAfiledCriticalCSF Compagnie Generale de Telegraphie sans Fil SA
Application grantedgrantedCritical
Publication of US3424909ApublicationCriticalpatent/US3424909A/en
Anticipated expirationlegal-statusCritical
Expired - Lifetimelegal-statusCriticalCurrent

Links

Images

Classifications

Definitions

Landscapes

Description

Jan. 28, 1969 H. ROUGEOT 3,424,909
STRAIG HT PARALLEL CHANNEL ELECTRON MULTIPLIERS Filed March 24, 1966 INVENTORZ H ROUGEOT a, 4 ,6 run BY nfirm United States Patent 0,462 US. Cl. 2s0 207 Int. (:1. H011 39/12 4 Claims ABSTRACT OF THE DISCLOSURE A straight parallel channel electron multiplier wherein channels are formed in a silicon diode biased in the reverse direction by a source establishing a longitudinal electric field in said channels.
The present invention relates to electron multipliers of the type in which a beam of primary electrons is multiplied through a series of secondary electron emissions within a set of straight, parallel channels, placed in a longitudinal electric field.
Such electron multipliers and the applications thereof in devices known as light amplifiers have been described in various publications, among others in the United States Patent 3,128,408 of July 7, 1964.
It may be recalled that electron multipliers of the type specified comprise an insulating body, pierced by canals of a very small diameter. The inner walls of the canals are coated with a very thin electrically resistive layer, having properties of secondary electron emission with acoeflicient 6 1. When an electric zfield is produced in the canals by establishing a suitable difference of potential between the extremities of the resistive coatings, a beam of primary electrons penetrating into the canals under different angles causes a series of secondary electron emissions on the internal coatings. The number of electrons at the output of the canals is then greatly increased as compared with the primary beam.
Unfortunately, the manufacture of the emissive coatings for those electron multipliers is rather difiicult because the diameter of the canals does not exceed a few tens of microns, while the thickness and the electric resistivity of the coating layers must be uniform over the entire length of the canals. Another difiioulty lies in the necessity of preventing the electric current that flows in the coatings from attaining an excessive value which could deteriorate the canals.
This invention has for its object an improved structure of electron multiplier in which the drawbacks and inconveniences of the prior art structures are avoided.
In accordance with the present invention, an electron multiplier of the type specified is characterized in that the canals are pierced in the body of a silicon diode, biased in the reverse direction.
Under these conditions there is no longer any need to provide the canals with an internal coating since the silicon, by itself, possesses a secondary electron emission coefficient greater than 1. Moreover, the electric current that traverses the silicon (leakage current) is zero or negligible since the diode is in the reverse or blocking condition.
The present invention will be best understood from the following decsription in connection with the accompanying drawing in which:
FIGURE 1 shows a light intensifier that utilizes an electron multiplier of the known art;
FIGURES 2 and 3 represent an electron multiplier in accordance with the present invention, FIGURE 3 being a section along line III-III of FIGURE 2; and
FIGURE 4 represents schematically a light intensifier utilizing an electron multiplier in accordance with the present invention.
The prior art light intensifier, represented in FIGURE 1, comprises within an air-evacuated enclosure aninsulating cylinder 2, for example of glass pierced bycanals 3 whose internal walls are coated with acoating 4 made of a resistive substance, deposited by surface treatment and capable of releasing secondary electrons with aratio 5 1 when submitted to the impact of primary electrons. On the opposite sides of cylinder 1 arephotocathode 5 and afluorescent screen 6, between which a source of current 7 establishes a DC. voltage of a few hundreds or a few thousands of volts. The extremities of thecanals 3 facing the photocathode are carried at a potential somewhat lower than the screen.
When a light image is projected ontophotocathode 5, electrons released therefrom penetrate into thecanals 3 under different angles. These primary electrons cause on theemissive coatings 4 emissions of secondary electrons which, in turn, strike the emissive walls and cause emissions of tertiary electrons, and so on. Since thecoefiicient 6 is greater than 1, the electrons are multiplied at the output of thecanals 3 and produce on thefluorescent screen 6 animage 9 of a brilliancy intensified with respect to that of theinitial image 8.
In accordance with the present invention, the electron multiplier of FIGURE 1, formed by thecylinder 2 and thecanals 3, is replaced by the improved electron multiplier shown in elevational view in FIGURE 2 and in sectional view in FIGURE 3. This novel electron multiplier comprises a thick diode of the surface barrier type, formed by a monocrystal ofsilicon 11 of high resistivity, bearing on one of its faces a rectifyinggold contact 12 and on the other face an aluminum layer 13- that provides an ohmic, i.e., non-rectifying contact. Canals I14 having a diameter of the order of 30 microns and spaced apart, for example, by one hundred microns from each other, are pierced into the diode whose thickness is about 1 millimeter.
A source of DC.voltage 15 sets ahe rectifyingcontact 12 at 1,000 volts With respect to the aluminum layer (reverse bias), whereby an accelerating electric field is produced along the entire length of the canals.
In operation, electron multiplication is obtained in the canals through secondary emissions merely on the walls of the canals which do not bear any complementary coating, since silicon has a secondaryelectron emission ratio 5 1.
Since the diode is biased in the reverse direction, the leakage current is negligible.
Thick diodes can be made in different manners. If a monocrystal of silicion of high resistivity, for example, 1 mm. thick, is available, canals of a few tens of microns are pierced in that sample by an electron beam, or by laser effect, or by any other process. In order to eliminate surface dislocations and, if necessary, to enlarge the "holes, the sample is soaked for a few minutes in an etching solution. The surface 'barrier type diode is then formed by evaporating obliquely on one of its faces a thin layer of gold and on the other face a layer of aluminium or indium.
If the resisitivity of the original monocrystal is sufficient, the space charge zone that defines the zone of the electric field will extend over the entire thickness of the crystal.
The diode may also be constructed in an n-i-p type rectifier, !well known to those skilled in the art.
Lithium (n impurity) is diffused in a monocrystal of p silicon, thus producing an n region (excess of lithium),
:n i region (compensated) and a p region (initial silicon).
The i region is enlarged by draining the lithium ions in an electric field obtained by biasing the diode in the reverse direction. The temperature must be comprised between 100 and 200 degrees.
The dead 11 and p portions are reduced by grinding and pickling, and the diodes thus obtained may have a thickness of a few millimeters.
A modification of the technique for manufacturing thick diodes, also known to those skilled in the art, consists in totally suppressing the n region and depositing on the concerned face a layer of gold. Thereafter, like previously, one proceeds with piercing the canals, pickling, and deposting the contacts.
FIGURE 4 represents schematically a light intensifier utilizing the electron multiplier of FIGURES 2 and 3. It comprises aphotocathode 21, the electron multiplier symbolized by theblock 22, and afluorescent screen 23. A source ofvoltage 24 and avoltage divider 25 permit to set the various elements at appropriate potentials.
The silicon diode of theelectron multiplier 22 is disposed in the reverse direction with the gold face (rectifying contact) facing thephotocathode 21 and the aluminium side facing thefluorescent screen 23.
Like in FIGURE 1, thephotocathode 21 here converts a light image into an electron image. The latter penetrates into themultiplier 22 from which it emerges intensified and strikes thefluorcesent screen 23 on which it produces an image having increased brilliancy as compared with the initial image.
While I have shown and described several embodiments in accordance with the present invention, it is understood that the same is not limited thereto but is susceptible of numerous changes and modifications as 'known to those skilled in the art, and I therefore do not wish to be limited to the details shown and described herein but intend to cover all such changes and modifications as are encompassed by the scope of the appended claims.
I claim:
1. An electron multiplier comprising a diode constituted by a silicon wafer and two metal layers in rectifying and non-rectifying contact with the two faces of said wafer, respectively, said diode being pierced transversely with approximately straight, parallel canals, a source of direct current potential connected at its negative and positive terminals to said rectifying and non-rectifying layers, respectively, for biassing said diode in the reverse direction and simultaneously establishing a longitudinal electric field within said canals, means for injecting primary electrons into said canals at the negative potential end thereof at various angles with respect to the inner surfaces of the canals, thereby causing multiple secondary electron emissions from said surfaces within the canals, and means for picking up the multiplied electrons emerging from said canals at the positive potential end thereof.
2. A light intensifier including an electron multiplier as claimed in claim 1, further comprising a photocathode opposite the negative potential face of said silicon wafer, a fluorescent screen opposite the positive potential face of said silicon wafer, and means for setting said photocathode and said fluorescent screen at direct current potentials lower than said negative potential and higher than said positive potential, respectively.
3. An electron multiplier, comprising a photocathode, an anode and between said photocathode and anode a relatively thick diode structure of the barrier type having two faces and provided with relatively small canals extending through said diode structure from one face to the other, and rectifying contact means on one of said faces and non-rectifying contact means on the other of said faces.
4. An electron multiplier according toclaim 3, wherein said diode structure consists of a monocrystal of silicon.
References Cited UNITED STATES PATENTS 2,998,541 8/1961 Lempert 313--103 X 3,128,408 4/1964 Goodrich et al. 3l3--103 X 3,341,730 9/1967 Goodrich et a1. 250207 X JAMES W. LAWRENCE, Primary Examiner.
C. R. CAMPBELL, Assistant Examiner.
US. Cl. X.-R.
US538900A1965-03-241966-03-24Straight parallel channel electron multipliersExpired - LifetimeUS3424909A (en)

Applications Claiming Priority (1)

Application NumberPriority DateFiling DateTitle
FR10462AFR1465381A (en)1965-03-241965-03-24 Improvements to electron multipliers

Publications (1)

Publication NumberPublication Date
US3424909Atrue US3424909A (en)1969-01-28

Family

ID=8574732

Family Applications (1)

Application NumberTitlePriority DateFiling Date
US538900AExpired - LifetimeUS3424909A (en)1965-03-241966-03-24Straight parallel channel electron multipliers

Country Status (3)

CountryLink
US (1)US3424909A (en)
GB (1)GB1081829A (en)
NL (1)NL6603797A (en)

Cited By (20)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US3612946A (en)*1967-08-011971-10-12Murata Manufacturing CoElectron multiplier device using semiconductor ceramic
US3622828A (en)*1969-12-011971-11-23Us ArmyFlat display tube with addressable cathode
US3666957A (en)*1971-01-251972-05-30Bendix CorpBrightness limiter for image intensifiers
US4119852A (en)*1976-01-301978-10-10Thomson-CsfSolid detector for ionizing radiation
US5086248A (en)*1989-08-181992-02-04Galileo Electro-Optics CorporationMicrochannel electron multipliers
US5705079A (en)*1996-01-191998-01-06Micron Display Technology, Inc.Method for forming spacers in flat panel displays using photo-etching
US5716251A (en)*1995-09-151998-02-10Micron Display Technology, Inc.Sacrificial spacers for large area displays
US5719623A (en)*1993-03-231998-02-17Hamamatsu Photonics K.K.Streak tube
US5729244A (en)*1995-04-041998-03-17Lockwood; Harry F.Field emission device with microchannel gain element
US5730636A (en)*1995-09-291998-03-24Micron Display Technology, Inc.Self-dimensioning support member for use in a field emission display
US5795206A (en)*1994-11-181998-08-18Micron Technology, Inc.Fiber spacers in large area vacuum displays and method for manufacture of same
US5851133A (en)*1996-12-241998-12-22Micron Display Technology, Inc.FED spacer fibers grown by laser drive CVD
US5888112A (en)*1996-12-311999-03-30Micron Technology, Inc.Method for forming spacers on a display substrate
US5916004A (en)*1996-01-111999-06-29Micron Technology, Inc.Photolithographically produced flat panel display surface plate support structure
US5990601A (en)*1971-02-221999-11-23Itt Manufacturing Enterprises, Inc.Electron multiplier and methods and apparatus for processing the same
US6155900A (en)*1999-10-122000-12-05Micron Technology, Inc.Fiber spacers in large area vacuum displays and method for manufacture
US6491559B1 (en)1996-12-122002-12-10Micron Technology, Inc.Attaching spacers in a display device
US6522061B1 (en)1995-04-042003-02-18Harry F. LockwoodField emission device with microchannel gain element
US20040183028A1 (en)*2003-03-192004-09-23Bruce LapradeConductive tube for use as a reflectron lens
US20100090098A1 (en)*2006-03-102010-04-15Laprade Bruce NResistive glass structures used to shape electric fields in analytical instruments

Citations (3)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US2998541A (en)*1958-07-291961-08-29Westinghouse Electric CorpTransmission storage tube
US3128408A (en)*1958-09-021964-04-07Bendix CorpElectron multiplier
US3341730A (en)*1960-04-201967-09-12Bendix CorpElectron multiplier with multiplying path wall means having a reduced reducible metal compound constituent

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US2998541A (en)*1958-07-291961-08-29Westinghouse Electric CorpTransmission storage tube
US3128408A (en)*1958-09-021964-04-07Bendix CorpElectron multiplier
US3341730A (en)*1960-04-201967-09-12Bendix CorpElectron multiplier with multiplying path wall means having a reduced reducible metal compound constituent

Cited By (34)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US3612946A (en)*1967-08-011971-10-12Murata Manufacturing CoElectron multiplier device using semiconductor ceramic
US3622828A (en)*1969-12-011971-11-23Us ArmyFlat display tube with addressable cathode
US3666957A (en)*1971-01-251972-05-30Bendix CorpBrightness limiter for image intensifiers
US5990601A (en)*1971-02-221999-11-23Itt Manufacturing Enterprises, Inc.Electron multiplier and methods and apparatus for processing the same
US4119852A (en)*1976-01-301978-10-10Thomson-CsfSolid detector for ionizing radiation
US5086248A (en)*1989-08-181992-02-04Galileo Electro-Optics CorporationMicrochannel electron multipliers
US5719623A (en)*1993-03-231998-02-17Hamamatsu Photonics K.K.Streak tube
US5795206A (en)*1994-11-181998-08-18Micron Technology, Inc.Fiber spacers in large area vacuum displays and method for manufacture of same
US6183329B1 (en)1994-11-182001-02-06Micron Technology, Inc.Fiber spacers in large area vacuum displays and method for manufacture of same
US5729244A (en)*1995-04-041998-03-17Lockwood; Harry F.Field emission device with microchannel gain element
US6522061B1 (en)1995-04-042003-02-18Harry F. LockwoodField emission device with microchannel gain element
US5962969A (en)*1995-09-151999-10-05Micron Technology, Inc.Sacrificial spacers for large area displays
US5716251A (en)*1995-09-151998-02-10Micron Display Technology, Inc.Sacrificial spacers for large area displays
US6083070A (en)*1995-09-152000-07-04Micron Technology, Inc.Sacrificial spacers for large area displays
US5730636A (en)*1995-09-291998-03-24Micron Display Technology, Inc.Self-dimensioning support member for use in a field emission display
US6077142A (en)*1995-09-292000-06-20Micron Technology, Inc.Self-dimensioning support member for use in a field emission display
US5916004A (en)*1996-01-111999-06-29Micron Technology, Inc.Photolithographically produced flat panel display surface plate support structure
US5840201A (en)*1996-01-191998-11-24Micron Display Technology, Inc.Method for forming spacers in flat panel displays using photo-etching
US5705079A (en)*1996-01-191998-01-06Micron Display Technology, Inc.Method for forming spacers in flat panel displays using photo-etching
US6696783B2 (en)1996-12-122004-02-24Micron Technology, Inc.Attaching spacers in a display device on desired locations of a conductive layer
US6491559B1 (en)1996-12-122002-12-10Micron Technology, Inc.Attaching spacers in a display device
US6172454B1 (en)1996-12-242001-01-09Micron Technology, Inc.FED spacer fibers grown by laser drive CVD
US5851133A (en)*1996-12-241998-12-22Micron Display Technology, Inc.FED spacer fibers grown by laser drive CVD
US6121721A (en)*1996-12-312000-09-19Micron Technology, Inc.Unitary spacers for a display device
US6010385A (en)*1996-12-312000-01-04Micron Technology, Inc.Method for forming a spacer for a display
US5888112A (en)*1996-12-311999-03-30Micron Technology, Inc.Method for forming spacers on a display substrate
US6155900A (en)*1999-10-122000-12-05Micron Technology, Inc.Fiber spacers in large area vacuum displays and method for manufacture
US6280274B1 (en)1999-10-122001-08-28Micron Technology, Inc.Fiber spacers in large area vacuum displays and method for manufacture
US6447354B1 (en)1999-10-122002-09-10Micron Technology, Inc.Fiber spacers in large area vacuum displays and method for manufacture
US6561864B2 (en)1999-10-122003-05-13Micron Technology, Inc.Methods for fabricating spacer support structures and flat panel displays
US20040183028A1 (en)*2003-03-192004-09-23Bruce LapradeConductive tube for use as a reflectron lens
US7154086B2 (en)2003-03-192006-12-26Burle Technologies, Inc.Conductive tube for use as a reflectron lens
US20100090098A1 (en)*2006-03-102010-04-15Laprade Bruce NResistive glass structures used to shape electric fields in analytical instruments
US8084732B2 (en)2006-03-102011-12-27Burle Technologies, Inc.Resistive glass structures used to shape electric fields in analytical instruments

Also Published As

Publication numberPublication date
NL6603797A (en)1967-01-25
DE1539755A1 (en)1969-12-11
DE1539755B2 (en)1972-07-27
GB1081829A (en)1967-09-06

Similar Documents

PublicationPublication DateTitle
US3424909A (en)Straight parallel channel electron multipliers
US4370797A (en)Method of semiconductor device for generating electron beams
US4325084A (en)Semiconductor device and method of manufacturing same, as well as a pick-up device and a display device having such a semiconductor device
US3615934A (en)Insulated-gate field-effect device having source and drain regions formed in part by ion implantation and method of making same
EP0260075B1 (en)Vacuum devices
US3747203A (en)Methods of manufacturing a semiconductor device
EP0913849A2 (en)Field emission electron source, method of producing the same, and use of the same
US3581151A (en)Cold cathode structure comprising semiconductor whisker elements
GB2109156A (en)Cathode-ray device and semiconductor cathodes
DE2813918A1 (en) LIGHT SEMICONDUCTOR COMPONENT
US2816847A (en)Method of fabricating semiconductor signal translating devices
US4801994A (en)Semiconductor electron-current generating device having improved cathode efficiency
US3699404A (en)Negative effective electron affinity emitters with drift fields using deep acceptor doping
DE69016492T2 (en) Electron generation device and display device.
US4069121A (en)Method for producing microscopic passages in a semiconductor body for electron-multiplication applications
US4506284A (en)Electron sources and equipment having electron sources
US2842466A (en)Method of making p-nu junction semiconductor unit
US3544399A (en)Insulated gate field-effect transistor (igfet) with semiconductor gate electrode
US3808477A (en)Cold cathode structure
US3387137A (en)Multi-passage electron multiplier with potential differences between passageways
US3098168A (en)Hot electron cold lattice semiconductor cathode
DE3538175C2 (en) Semiconductor device for generating an electron current and its use
US3805126A (en)Charge storage target and method of manufacture having a plurality of isolated charge storage sites
US3830717A (en)Semiconductor camera tube target
JPH08321256A (en) Electron emitting cathode, electron emitting device using the same, flat display, thermoelectric cooling device, and method for manufacturing electron emitting cathode

[8]ページ先頭

©2009-2025 Movatter.jp