US20100265989A1 - P-n junction based thermal detector - Google Patents

Abstract

A thermopile-based thermal detector is provided by a thermocouple, formed from a single sheet of material, which is made dissimilar with a P-doped and an N-doped junction electrically isolated via a naturally forming depletion region. The thermopile P-N sheet is uniform and planar, addressing stress and manufacturing issues. The usual non-active area of a conventional thermopile is significantly reduced or eliminated, and thus the output signal per unit diaphragm area of the detector is substantially increased, without the typical reduction in the signal-to-noise ratio. Also, a significant reduction in size of the thermal detector area is provided without a reduction in signal or signal-to-noise ratio. In an aspect, a second layer of thermocouples is axially positioned over, and connected with, a first layer of thermocouples. Additional axially stacked thermopiles can be provided within the same fabrication process. Signal processing circuitry may be electrically interconnected with the thermocouple.

Description

CROSS REFERENCE TO RELATED APPLICATIONS
• The present application is a divisional application of U.S. patent application Ser. No. 11/633,976 filed on Dec. 5, 2006.
FIELD OF THE INVENTION
• The invention relates generally to a thermopile-based thermal detector, and more particularly to a thermocouple having a P-N junction formed from a single sheet of material.
BACKGROUND OF THE INVENTION
• Thermopiles are customarily implemented in commercial applications and utilized for thermal detectors such as infrared (IR) detecting sensors. IR sensors that include thermopiles, comprised of sets of thermocouples, are used in a wide range of applications, such as automotive climate control systems and seat occupancy detection systems. An integrated thermopile-based IR sensor that combines circuitry for processing and compensating output signals of the sensor on an integrated circuit (IC) chip is described in U.S. Pat. No. 6,828,172, titled “Process for a Monolithically-Integrated Micromachined Sensor and Circuit,” to Chavan et al. and U.S. Pat. No. 6,793,389, titled “Monolithically-Integrated Infrared Sensor,” to Chavan et al., each of which are hereby incorporated herein by reference in their entirety. As described, integration of IR sensing and signal processing on the same IC chip leads to various advantages, which include miniaturization, the ability to process very small signals, reduction in cost, simplification of manufacturing and reduced system complexity. Further performance and manufacturing optimization through the creation of a circular membrane and thermopile is described in U.S. patent application Ser. No. 11/263,105, titled, “Infrared Detecting Device with a Circular Membrane.”
• IR detecting sensors frequently use thermopiles having sets of thermocouples. One end of each set of the thermocouple is situated on a membrane or diaphragm that collects IR energy (a thermally isolated region), and a different end is situated on a supporting substrate (a thermally sunk region). The formation of a thermopile uses a series of electrically connected thermocouples, each made up of dissimilar conducting or semi-conducting materials with different Seebeck coefficients, whereby thermal energy is converted into an electric voltage. This is conventionally achieved through the use of a pair of materials such as two dissimilar metals, including n-type poly-silicon and metal, p-type poly-silicon and metal, or n-type poly-silicon and p-type poly-silicon. The connections are made such that they alternate between the thermally isolated and thermally sunk regions of the device. The dissimilar materials are typically arranged either in a horizontal or vertical stack and separated (i.e., electrically isolated) by a dielectric material. This is customarily achieved by separate material depositions, photolithographic operations, and etching for each material.
• FIG. 1 andFIG. 2 are plan views of a conventional vertical thermocouple arrangement. InFIG. 1, theIR detecting device100 utilizes afirst material104 and asecond material106, which are dissimilar materials. These may be, for example, p-type poly-silicon and metal. Thesecond material106 is formed on top of, and electrically isolated from, thefirst material104. InFIG. 2, theIR detecting device200 utilizes afirst material204 and asecond material206, which are dissimilar materials. These may be, for example, n-type poly-silicon and metal. Thesecond material206 is formed along the side of thefirst material204, separated by a dielectric material. With respect to the formation of the conventionalIR detecting devices100 and200, both the physical separation by the dielectric material and the separate process steps required for the formation of each leg of the thermocouple create a considerable non-active area which consumes valuable diaphragm area, and thus reduces output signal per unit diaphragm area.
SUMMARY OF THE INVENTION
• A thermopile-based thermal detector is provided by a thermocouple having dissimilar materials with a P-N junction formed from a single sheet of material. The thermopile can be situated upon a diaphragm for receiving thermal radiation, for use as an integrated and a non-integrated thermoelectric infrared (IR) sensor and detector. Signal processing circuitry can be electrically interconnected with the thermopile.
• The thermopile P-N sheet is uniform and planar, thus addressing stress and mechanical manufacturing problems. The usual non-active area of a conventional thermopile is significantly reduced or eliminated, and thus the output signal per unit diaphragm area of the detector is substantially increased, without the typical reduction in the signal-to-noise ratio incurred by conventional designs. Also, a significant reduction in size of the thermal detector area is provided without a reduction in signal or signal-to-noise ratio. The present invention further provides an axial stack of thermopiles within the same fabrication process. A reduction in the cost and complexity of the fabrication of the thermocouple and thermopile is additionally provided.
• Features of the invention are achieved in part by forming a thermocouple from a single sheet of material having dissimilar electrically-conductive materials, with a P-doped and N-doped junction electrically isolated via a depletion region. The thermocouple extends from a substrate to a diaphragm, the substrate defining a cavity. The diaphragm includes a first portion positioned over the cavity for receiving thermal energy and a second portion at a perimeter of the diaphragm supported by the substrate. The thermocouple includes a hot junction located on the first portion of the diaphragm and a cold junction located on the second portion of the diaphragm, forming a thermopile.
• In an embodiment, a second layer of thermocouples is axially positioned over a first layer of thermocouples, an electrically insulating material such as poly-oxide is positioned between the first layer and the second layer, and the first layer is electrically connected to the second layer. The diaphragm can include an oxide situated adjacent to a nitride material, utilized for an absorbing layer and a stress compensating layer. A passivation layer, an absorptive material and a stress compensating material can be situated over the thermocouple material pair.
• In an embodiment, the diaphragm is created by forming an oxide etch stop on the substrate by either a thermal process or vapor deposition, and then depositing a nitride material adjacent to the oxide etch stop. In an embodiment, the thermocouple material pair and thus the thermopile is created by depositing poly-silicon as a single sheet by chemical vapor deposition, implanting a P-type dopant, depositing a sacrificial silicon dioxide on the P-type doped polysilicon, photolithographically forming a proposed P-type dissimilar area and a proposed N-type dissimilar area, removing the sacrificial silicon dioxide by etching, and thermally depositing an N-type dopant on the proposed N-type dissimilar area. The diaphragm can be shaped in either a circular or rectangle form, and the thermocouple is wedge-shaped and narrower at the hot junction as compared to the cold junction.
• Other features and advantages of this invention will be apparent to a person of skill in the art who studies the invention disclosure. Therefore, the scope of the invention will be better understood by reference to an example of an embodiment, given with respect to the following figures.
BRIEF DESCRIPTION OF THE DRAWINGS
• The foregoing aspects and many of the attendant advantages of this invention will become more readily appreciated by reference to the following detailed description, when taken in conjunction with the accompanying drawings, wherein:
• FIG. 1 is a plan view of a conventional vertical thermocouple arrangement, in which the present invention can be useful;
• FIG. 2 is a plan view of another conventional horizontal thermocouple arrangement, in which the present invention can be useful;
• FIG. 3 is a plan view of a conventional thermocouple arrangement illustrating non-active regions of occupied space;
• FIG. 4A is a cross-sectional side view of the thermocouple arrangement taken along the line IV inFIG. 3;
• FIG. 4B is another cross-sectional side view of the thermocouple arrangement taken along the line V inFIG. 3;
• FIG. 5 is a plan view of a thermocouple arrangement having a P-N junction IR detecting device formed from a single sheet of material, in accordance with an embodiment of the present invention;
• FIG. 6A is a cross-sectional side view of the thermocouple arrangement taken along the line VI inFIG. 4, in accordance with an embodiment of the present invention;
• FIG. 6B is another cross-sectional side view of the thermocouple arrangement taken along the line VII inFIG. 4, in accordance with an embodiment of the present invention;
• FIG. 7 illustrates example steps in fabrication of the device as inFIG. 4, in accordance with an embodiment of the present invention;
• FIG. 8 is a plan view of a thermocouple arrangement having a P-N junction IR detecting device in which a plurality of single sheets of material each incorporate the P-N series junctions, in accordance with an embodiment of the present invention;
• FIG. 9A is a cross-sectional side view of the thermocouple arrangement taken along the line IX inFIG. 7, in accordance with an embodiment of the present invention;
• FIG. 9B is a cross-sectional side view of the thermocouple arrangement taken along the line X inFIG. 7, in accordance with an embodiment of the present invention;
• FIG. 10 illustrates example signal performances of the present invention as inFIG. 5 andFIG. 8 as compared with conventionally IR sensors, in accordance with an embodiment of the present invention; and
• FIG. 11 illustrates example required diaphragm area of the present invention as inFIG. 5 andFIG. 8 as compared with conventionally IR sensors, in accordance with an embodiment of the present invention.
DETAILED DESCRIPTION OF THE INVENTION
• Exemplary embodiments are described with reference to specific configurations. Those of ordinary skill in the art will appreciate that various changes and modifications can be made while remaining within the scope of the appended claims. Additionally, well-known elements, devices, components, methods, process steps and the like may not be set forth in detail in order to avoid obscuring the invention. Further, unless indicated to the contrary, the numerical values set forth in the following specification, figures and claims are approximations that may vary depending upon the desired characteristics sought to be obtained by the present invention.
• As used herein, the term “semiconductor device” is an electronic component with electronic properties of a semiconductor material such as silicon, germanium and gallium arsenide. As used herein, the term “doping type” refers to the resulting charge conduction property of a semiconductor when certain type of atoms are added to the semiconductor in order to increase the number of free positive or negative charge carriers. When the resulting semiconductor contains excessive positive charge carriers or holes, the doping type is defined as P-type. When the resulting semiconductor contains excessive negative charge carriers or electrons, the doping type is defined as N-type. Additionally, the symbols P+ and N+ are used to indicate higher concentrations of P-type and N-type doping, respectively.
• Referring to the drawings wherein identical reference numerals denote the same elements throughout the various views,FIG. 3 is a plan view of a conventional thermocouple arrangement illustrating non-active regions of occupied space. TheIR detecting device300 utilizes afirst material312 and asecond material314, which are dissimilar materials. These may be, for example, n-type poly-silicon and p-type poly-silicon. Thesecond material312 is formed on top of, and electrically isolated from, the first material314 (making up a thermocouple pair302). As illustrated, thearrows304 indicate electrical connectivity through first andsecond materials312 and314.FIG. 4A is a cross-sectional side view of the thermocouple arrangement taken along the line IV inFIG. 3. As shown, the thermocouple pair, comprisingfirst material312 and dissimilarsecond material314 are separated by poly-oxide412. An oxide-etch stop and LP nitride (layers402) create a membrane for the thermocouple pair. Aplanarization406 and apassivation408 are formed over the thermocouple pair.FIG. 4B is another cross-sectional side view of the thermocouple arrangement taken along the line V inFIG. 3. This view shows themetal connectors422 and424, whereinmetal connector422 joinsfirst material312 tosecond material314 at the thermally isolated region.Metal connector424 joinsfirst material312 tosecond material314 at the thermally sunk region situated over thesilicon frame420.
• The conventional design and fabrication methods for IR detecting devices require physical or dielectric separation to achieve electrical isolation. With respect to the formation of the conventionalIR detecting device300, both the requiredphysical separation306 by the dielectric material and the separate process steps required for the formation of each leg of the thermocouple create a considerablenon-active area308, which consumes valuable diaphragm area, and thus reduces output signal per unit diaphragm area.
• Turning again now to the present invention, a system and method are described herein for providing a thermocouple to form, for example, a thermopile upon a diaphragm for use as a thermal detector. A thermopile-based thermal detector is provided by a thermocouple having dissimilar materials with a P-N junction formed from a single sheet of material. The thermopile can be situated upon a diaphragm for receiving thermal radiation, for use as an integrated or a non-integrated thermoelectric infrared (IR) sensor and detector. Signal processing circuitry can be electrically interconnected with the thermopile.
• Referring toFIG. 5, a thermocouple arrangement is shown having a P-N junction IR detecting device formed from a single sheet of material, in accordance with an embodiment of the present invention. The thermal detectingdevice500 utilizes afirst material512 and asecond material514, which are dissimilar materials created from a single sheet of material. These may be, for example, n-type poly-silicon and p-type poly-silicon. Thefirst material512 is formed planar to, and electrically isolated from, thesecond material514, making up athermocouple material pair502. As used herein, the term thermocouple material pair refers to the two legs of dissimilar materials (i.e.,first material512 and second material514), which together form one thermocouple. The single sheet of material (i.e., poly-silicon) is made dissimilar by utilizing a depletion region that naturally forms during doping of the single sheet of material. The doping employed is a P-type (i.e., boron) and an N-type (i.e., phosphorous) character, in which a series of P-N junctions are formed. The formation of a depletion region allows for electrical isolation of each leg of the thermocouple (i.e. each dissimilar material) without physical separation by space and/or dielectric material. As illustrated, thearrows504 indicate electrical connectivity throughfirst material512 andsecond material514.
• As shown in the present invention inFIG. 5, thenon-active area508 is reduced, which was unavoidable in conventional designs such asFIG. 3. Size restrictions are also reduced or eliminated for the width and length of each leg of the thermocouple. This allows an increase in the packing density of the thermocouple pairs (i.e., see packing density506) and thus the total number of thermocouples in the thermopile for the same given area. This directly increases the signal per unit diaphragm area. This can further allow for a reduction of the thermopile overall size without loss of signal or increase of thermal noise.
• FIG. 6A is a cross-sectional side view of the thermocouple arrangement taken along the line VI inFIG. 4, in accordance with an embodiment of the present invention. The thermocouple material pair, comprisingfirst material512 and dissimilarsecond material514, are separated by a naturally formed depletion region. An oxide-etch stop602 and LP nitride604 create a membrane for the thermocouple material pair. TheLP nitride604 creates a flat diaphragm since it is tensile in nature, whereas theoxide602 is compressive in nature. TheLP nitride604 also acts as an absorbing layer. A poly-oxide610, aplanarization606 and apassivation608 are formed over the thermocouple material pair.
• FIG. 6B is another cross-sectional side view of the thermocouple arrangement taken along the line VII inFIG. 4, in accordance with an embodiment of the present invention. This view shows themetal connectors522 and524, whereinmetal connector522 joinsfirst material512 tosecond material514 at the thermally isolated region.Metal connector524 joinsfirst material512 tosecond material514 at the thermally sunk region situated over thesilicon frame620.
• FIG. 7 illustrates example steps in fabrication of the device as inFIG. 4, in accordance with an embodiment of the present invention. It is to be appreciated that particular steps described herein may be varied depending on the intended purpose of the thermal detector, and also the method of creating a particular layer may be varied as known to those skilled in the art.
• Instep702, a substrate such as silicon is established. Instep706, a diaphragm is created by forming a dielectric oxide etch stop such as silicon dioxide on the substrate by a thermal process or vapor deposition. Instep710, an LP nitride material is deposited on the oxide etch stop. Other films may next be deposited for mechanical, spectral or process integration purposes. Instep714, poly-silicon is deposited as a single sheet for the thermocouple material pair and thus the thermopile by chemical vapor deposition. Instep718, a blanket P-type dopant is implanted on the poly-silicon, such as boron or boron di-fluoride, creating one leg of the thermopile. Instep722, a sacrificial silicon dioxide is deposited on the P-doped poly-silicon. Instep726, a proposed P-type doped area and a proposed dissimilar N-type doped area are photolithographically formed. Instep730, the sacrificial silicon dioxide is removed by etching. Instep734, an N-type dopant is thermally deposited on the proposed N-type dissimilar area in sufficient quantity to counter-dope the blanket P-type dopant, forming another leg of the thermocouple. The dissimilar materials self-align. As described above, the diaphragm can be circular, rectangular, polygonal and rectangular having rounded corners, and the thermocouple is wedge-shaped and narrower at the hot junction as compared to the cold junction.
• Instep738, electrical connections are established between the P-doped poly-silicon and the N-doped poly-silicon to create a thermocouple material pair. The connections may be made by direct deposition and photolithographic formation of a metal on top of the poly-silicon. Alternatively, the connection may be formed on top of a dielectric material that has been deposited onto the poly-silicon and photolithographically patterned and etched to allow appropriate connectivity. Instep742, poly-oxide, planarization and passivation layers are formed over the thermocouple material pair, as needed for the intended process.
• As illustrated,FIG. 8 is a plan view of a thermocouple arrangement having a P-N junction IR detecting device in which a plurality of single sheets of material each incorporate the P-N series junctions, in accordance with an embodiment of the present invention. The thermal detectingdevice800 utilizes afirst material812 and asecond material814, which are dissimilar materials created from a first single sheet of material. The thermal detectingdevice800 additionally utilizes athird material816 and aforth material818 created from a second single sheet of material. The second sheet of material is stacked on top of the first sheet of material. The second sheet of material is also electrically isolated from the first sheet of material by a dielectric material such as poly-oxide. In an example, thefirst material812 and thesecond material814, created from the first single sheet, are a P-type poly-silicon and an N-type poly−silicon, respectively. Thethird material816 and theforth material818, created from the second single sheet, are an N-type poly-silicon and a P-type poly-silicon, respectively.
• It is to be appreciated that although two sheets of poly-silicon are shown, more than two sheets may alternatively be utilized, creating additional stacked thermopiles. This substantially increases the number of thermocouples for the same given area. Because many semiconductor processes, particularly, but not limited to, those used in monolithically integrated devices, employ two independent poly-silicon depositions for the formation of each leg of the thermopile, the plurality of stacked P-N series sheets of the present invention provides significant performance enhancements for the same or similar process complexity. As described for non-stacked P-N series sheets, the signal per unit area increase allows the device to be miniaturized and produced at a significantly reduced cost.
• Like the embodiment described inFIG. 5, the single sheets of material are made dissimilar by utilizing a depletion region that naturally forms during doping of the single sheet of material. The doping employed is a P-type (i.e., boron) and an N-type (i.e., phosphorous) character, in which a series of P-N junctions are formed. The formation of a depletion region allows for electrical isolation of each leg of the thermocouple (i.e. each dissimilar material) without physical separation by space and/or dielectric material.
• In an embodiment, thefirst material812 which is electrically isolated from thesecond material814 makes up a thermocouple material pair. As used herein, the term thermocouple material pair refers to the two legs of dissimilar materials (i.e.,first material812 and second material814), which together form one thermocouple. In an alternative embodiment, as shown inFIG. 8, thefirst material812 and thethird material816, which are electrically isolated, make up athermocouple material pair802. As illustrated, thearrows804 indicate electrical connectivity through thefirst material812, thesecond material814, thethird material814 and theforth material816.
• It is to be appreciated that various electrical interconnect schemes may be utilized to form the overall thermopile having stacked sheets. In one embodiment, the first planar sheet of thermocouples are serially connected. When a final leg of material from the first planar sheet is reached, the first planar sheet is serially connected to the second planar sheet, and then the second planar sheet is serially connected. In an alternative embodiment, a P-doped region from the first sheet of thermocouples is serially connected to an N-doped region from the second sheet of thermocouples, then the N-doped region from the second sheet is serially connected to a P-doped region from the second sheet, and then the P-doped region from the second sheet of thermocouples is serially connected to an N-doped region from the first sheet.
• As shown in the present invention inFIG. 8, thenon-active area808 is reduced, which was unavoidable in conventional designs such asFIG. 3. Size restrictions are also reduced or eliminated for the width and length of each leg of the thermocouple. This allows an increase in the packing density of the thermocouple pairs (i.e., see packing density806) and thus the total number of thermocouples in the thermopile for the same given area. This directly increases the signal per unit diaphragm area. This can further allow for a reduction of the thermopile overall size without loss of signal or increase of thermal noise. Moreover, the signal per unit diaphragm area is further increased by stacking a plurality of sheets to form additional thermocouple pairs.
• FIG. 9A is a cross-sectional side view of the thermocouple arrangement taken along the line IX inFIG. 7, in accordance with an embodiment of the present invention. As shown, the first sheet and the stacked second sheet of poly-silicon are electrically separated by poly-oxide910. An oxide-etch stop902 and LP nitride904 create a membrane for the thermocouple pairs. Aplanarization906 and apassivation908 are formed over the thermocouple pairs.
• FIG. 9B is a cross-sectional side view of the thermocouple arrangement taken along the line X inFIG. 7, in accordance with an embodiment of the present invention. This view shows themetal connectors822 and824, whereinmetal connector822 joinsfirst material812 tothird material816 at the thermally isolated region.Metal connector824 joinsthird material816 tosecond material814 at the thermally sunk region situated over thesilicon frame920.
• A further understanding of the above description can be obtained by reference to the following experimental result examples that are provided for illustrative purposes and are not intended to be limiting.
• Referring toFIG. 10, example signal performances are illustrated of the present invention as inFIG. 5 andFIG. 8 as compared with conventionally IR sensors. The efficiency of IR detectors can be compared by performance attributes such as signal per unit diaphragm area and signal to noise per unit diaphragm area. As shown by experimental results, the signal and the signal to noise ratio increases beyond the typical contemporary designs when employing a single sheet planar embodiment as inFIG. 5, and increases even more with a dual sheet (stacked) planar embodiment as inFIG. 8. A 215% signal increase was experimentally observed using the single sheet planar embodiment with P+ poly and N+ poly, as compared to a conventional configuration. A 615% signal increase was experimentally observed using the dual sheet planar embodiment with P+ poly and N+ poly for one sheet and P+ poly and N+ poly for the stacked sheet, as compared to a conventional configuration.
• FIG. 11 illustrates example required diaphragm area of the present invention as inFIG. 5 andFIG. 8 as compared with conventionally IR sensors. As observed by experimental results, a signal of 46 μV/C is generated by the contemporary design and the present invention, although the necessary diaphragm area is reduced in the present invention embodiments. The single sheet planar embodiment as inFIG. 5 generates a signal of 46 μV/C with a diaphragm area reduced by 19%, as compared to the typical contemporary design. The dual sheet (stacked) planar embodiment as inFIG. 8 generates a signal of 46 μV/C with a diaphragm area reduced by 63%, as compared to the typical contemporary design.
• Other features and advantages of this invention will be apparent to a person of skill in the art who studies this disclosure. Thus, exemplary embodiments, modifications and variations may be made to the disclosed embodiments while remaining within the spirit and scope of the invention as defined by the appended claims.

Claims (8)

1. A thermal detector comprising:

a substrate defining a cavity;

a diaphragm having a first portion positioned over the cavity for receiving thermal energy, and a second portion at a perimeter of the diaphragm supported by the substrate;

a first layer of at least one material pair formed on a first sheet of material extending in between the diaphragm and the substrate;

a second layer of the at least one material pair formed on a second sheet of material extending in between the diaphragm and the substrate and being axially positioned over the first layer, an electrically insulating material being positioned in between the first layer and the second layer whereby the at least one material pair on the first layer is electrically isolated from the at least one material pair on the second layer, said at least one material pair on the first and second layer including a first and second leg having dissimilar electrically conductive materials, and the dissimilar materials include the first leg being a P-doped junction and the second leg being an N-doped junction, and the first leg and the second leg are electrically isolated via a depletion region; and

at least one thermocouple being configured generally perpendicular to the first and second sheet of material, said at least one thermocouple being formed between a leg of the at least one material pair on the first layer in electrical connection to a leg of the at least one material pair on the second layer, and the leg of the at least one material pair on the first layer and the leg of the at least one material pair on the second layer being dissimilar electrically conductive materials;

wherein the at least one thermocouple defines a hot junction located on the first portion of the diaphragm and a cold junction located on the second portion of the diaphragm.

2. The thermal detector as inclaim 1, wherein the at least one thermocouple material pair is created by depositing poly-silicon by chemical vapor deposition, implanting a P-type dopant, depositing a sacrificial silicon dioxide on the P-type doped polysilicon, photolithographically forming a proposed P-type dissimilar area and a proposed N-type dissimilar area, removing the sacrificial silicon dioxide by etching, and thermally depositing an N-type dopant on the proposed N-type dissimilar area.

3. The thermal detector as inclaim 1, wherein the at least one thermocouple further includes the at least one thermocouple being formed by electrical connection at the hot junction between dissimilar materials on the first and second layers, and the at least one thermocouple having electrical connection to a further thermocouple being formed at the cold junction between dissimilar materials on the first and second layers, and said further thermocouple being generally perpendicular to the first and second sheet and adjacent to the at least one thermocouple without an intermediate space in between.

4. The thermal detector as inclaim 1, wherein the diaphragm is shaped in a form of at least one of circular, rectangular, polygonal, and rectangular having rounded corners shape, and wherein the legs of the at least one thermocouple are wedge-shaped and narrower at the hot junction as compared to the cold junction.

5. A method for establishing a thermal detector comprising:

creating a substrate defining a cavity;

creating a diaphragm having a first portion positioned over the cavity for receiving thermal energy, and a second portion at a perimeter of the diaphragm supported by the substrate;

creating a first layer of at least one material pair formed on a first sheet of material extending in between the diaphragm and the substrate, and the first layer of the at least one material pair including legs having dissimilar electrically conductive materials, wherein the dissimilar materials include a P-doped and N-doped junction electrically isolated via a depletion region;

creating a second layer of at least one material pair formed on a second sheet of material extending in between the diaphragm and the substrate and being axially positioned over the first layer, and an electrically insulating material being positioned in between the first layer and the second layer whereby the at least one material pair on the first layer is electrically isolated from the at least one material pair on the second layer, and the second layer of the at least one material pair including legs having dissimilar electrically conductive materials, and the dissimilar materials include a P-doped and N-doped junction electrically isolated via a depletion region; and

creating at least one thermocouple being configured generally perpendicular to the first and second sheet of material, said at least one thermocouple being between a leg of the at least one material pair on the first layer in electrical connection to a leg of the at least one material pair on the second layer, and the leg of the at least one material pair on the first layer and the leg of the at least one material pair on the second layer being dissimilar electrically conductive materials;

wherein the at least one thermocouple defines a hot junction located on the first portion of the diaphragm and a cold junction located on the second portion of the diaphragm.

6. The method as inclaim 5, wherein the steps of creating the first layer of at least one thermocouple pair and creating the second layer of the at least one thermocouple material pair further include forming the at least one thermocouple pair on the first and second thermocouple layers by depositing poly-silicon by chemical vapor deposition, implanting a P-type dopant, depositing a sacrificial silicon dioxide on the P-type doped polysilicon, photolithographically forming a proposed P-type dissimilar area and a proposed N-type dissimilar area, removing the sacrificial silicon dioxide by etching, and thermally depositing an N-type dopant on the proposed N-type dissimilar area.

7. The method as inclaim 5, wherein the step of creating the at least one thermocouple further includes the at least one thermocouple being formed by electrical connection at the hot junction between dissimilar materials on the first and second layers, and the at least one thermocouple having electrical connection to a further thermocouple being formed at the cold junction between dissimilar materials on the first and second layers, and said further thermocouple being generally perpendicular to the first and second sheet and adjacent to the at least one thermocouple without an intermediate space in between.

8. The method as inclaim 5, wherein the step of creating the diaphragm further includes the diaphragm being shaped in a form of at least one of circular, rectangular, polygonal, and rectangular having rounded corners, and wherein the steps of creating the at least one thermocouple further includes the legs of the at least one thermocouple being wedge-shaped and narrower at the hot junction as compared to the cold junction.

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