US20080006083A1

Movatterモバイル変換

Info

Publication number: US20080006083A1
Application number: US11/426,461
Authority: US
Inventors: Adam Feinstein; Matthew Wilson
Original assignee: Individual
Current assignee: Bruker Nano Inc
Priority date: 2006-06-26
Filing date: 2006-06-26
Publication date: 2008-01-10
Also published as: US7908909B2; WO2008002922A3; WO2008002922A2; US9360498B2; US20110173729A1; US20080179206A1

Abstract

The preferred embodiments are directed to a probe cassette for a scanning probe microscope that includes a base having at least one probe storage receptacle, a lid mountable on the base with the probe storage receptacle at least substantially covering the at least one receptacle, and a probe retainer that retains a probe device of the scanning probe microscope in the receptacle under a compressive force. The probe cassette can be pre-loaded and shipped to a user site where the cassette can be loaded in an AFM without manual manipulation of the individual probe devices.

Description

BACKGROUND OF THE INVENTION

1. Field of the Invention

The preferred embodiments are directed to an apparatus for storing and delivering probe devices for a scanning probe microscope (SPM), and more particularly, a probe cassette for an SPM that is adapted to readily interface with an SPM and includes one or more probe retainers to hold the probe devices under a compressive force without the probe devices sticking thereto.

2. Description of Related Art

Several probe-based instruments monitor the interaction between a cantilever-based probe device and a sample to obtain information concerning one or more characteristics of the sample. The probe devices used by these instruments are typically very expensive to fabricate, and each often costing a thousand dollars or more. They also are quite delicate. As such, great care must be used when handling them, both after fabrication and in preparation for use, as well as when considering shipment, including packaging, and on-site transport options. Prior systems have proven inadequate.

A brief review of these instruments will highlight the challenges associated with maintaining a high yield of usable probes after production. Scanning probe microscopes (SPMs), such as the atomic force microscope (AFM), are instruments which typically use a sharp tip to make a local measurement of one or more properties of a sample. More particularly, SPMs typically characterize the surfaces of such small-scale sample features by monitoring the interaction between the sample and the tip of the associated probe device. By providing relative scanning movement between the tip and the sample, surface characteristic data and other sample-dependent data can be acquired over a particular region of the sample, and a corresponding map of the sample can be generated.

The AFM is a very popular type of SPM. The probe of the typical AFM includes a very small cantilever which is fixed to a support at its base and has a sharp probe tip attached to the opposite, free end. The probe tip is brought very near to or into direct or intermittent contact with a surface of the sample to be examined, and the deflection of the cantilever in response to the probe tip's interaction with the sample is measured with an extremely sensitive deflection detector, often an optical lever system such as described in Hansma et al. U.S. Pat. No. RE 34,489, or some other deflection detector such as an arrangement of strain gauges, capacitance sensors, etc. AFMs can obtain resolution down to the atomic level on a wide variety of insulating or conductive surfaces in air, liquid or vacuum by using piezoelectric scanners, optical lever deflection detectors, and very small cantilevers. Because of their resolution and versatility, AFMs are important measurement devices in many diverse fields ranging from semiconductor manufacturing to biological research.

In operation, the probe is most often scanned over a surface using a high-resolution three axis scanner acting on the sample support and/or the probe. The instrument is thus capable of creating relative motion between the probe and the sample while measuring the topography or some other property of the sample as described, for example, in Hansma et al. supra; Elings et al. U.S. Pat. No. 5,266,801; and Elings et al. U.S. Pat. No. 5,412,980.

A typical AFM system is shown schematically inFIG. 1. An AFM10 employing aprobe device12 including aprobe14 having acantilever15 is coupled to an oscillating actuator ordrive16 that is used to driveprobe14, in this case, at or near the probe's resonant frequency. Commonly, an electronic signal is applied from anAC signal source18 under control of anAFM controller20 to causeactuator16 to drive theprobe14 to oscillate, preferably at a free oscillation amplitude A_o. Probe14 is typically actuated toward and away fromsample22 using a suitable actuator orscanner24 controlled via feedback bycontroller20. Notably, theactuator16 may be coupled to thescanner24 andprobe14 but may be formed integrally with thecantilever15 ofprobe14 as part of a self-actuated cantilever/probe. Moreover, though theactuator24 is shown coupled to theprobe14, theactuator24 may be employed to movesample22 in three orthogonal directions as an XYZ actuator.

For use and operation, one or more probes may be loaded into the AFM and the AFM may be equipped to select one of several loaded probes. Typically, theselected probe14 is oscillated and brought into contact withsample22 as sample characteristics are monitored by detecting changes in one or more characteristics of the oscillation ofprobe14, as described above. In this regard, adeflection detection apparatus17 is typically employed to direct a beam towards the backside ofprobe14, the beam then being reflected towards adetector26, such as a four quadrant photodetector. As the beam translates acrossdetector26, appropriate signals are transmitted tocontroller20, which processes the signals to determine changes in the oscillation ofprobe14. Commonly,controller20 generates control signals to maintain a constant force between the tip and sample, typically to maintain a setpoint characteristic of the oscillation ofprobe14. For example,controller20 is often used to maintain the oscillation amplitude at a setpoint value, A_S, to insure a generally constant force between the tip and sample. Alternatively, a setpoint phase or frequency may be used.

As metrology applications demand greater and greater throughput, improvements to performing conventional AFM measurements, such as that described above, have become necessary. Wafer analysis in the semiconductor industry is one key application. When analyzing such structures at small scales, the corresponding measurements require uniformity control and must be able to accommodate high volume production environments. In this regard, one advancement has been in the area of automated AFMs, which greatly improves the number of samples that may be imaged in a certain time frame by, among other things, minimizing expert user tasks during operation. Instruments for performing automated wafer measurements are varied, but AFM technology offers a unique solution by providing, for example, the ability to perform high-resolution multi-dimension (e.g., 3-D) imaging.

Though automated AFMs provide significant performance advantages by reducing the tasks required by expert users and otherwise streamlining measurements, further improvement is desired. For instance, the manner in which some probe device manufacturers handle and ship probes can create serious challenges in efficiently delivering these often times very costly devices. According to one known delivery method, for example, probe devices for AFMs are delivered in clam-shell packs. Such a clam-shell pack orcontainer30 including arow32 ofprobe devices34 is shown inFIG. 2.Rows32 ofprobe devices34 are placed, preferably, “tip up” in abase36 and are covered with alid38. In this case, theprobe devices34 are individually loaded into receptacles of the clam-shell pack30, or mounted otherwise, and then shipped. To do so, the operator typically uses a tweezers to transfer the micromachined or batch fabricated probe devices from the fabrication site to the clam-shell packs. As the lid of the clam-shell pack is closed for shipping, a foam insert, or other holding mechanism, may be included in an attempt to secure the probe devices.

This operation often compromises efficient probe device delivery, for example, by risking operator error through mishandling. The probes can be dropped, scraped or otherwise subjected to unwanted forces that can damage or destroy these delicate and expensive devices. Also, with the probe devices placed in the package “tip-up,” this crucial part of the device is at high risk of becoming damaged. In the end, this manner of handling and shipping probes has clearly been less than ideal.

In addition, not only do loading, shipping and handling probe devices create challenges, the manner in which probe devices are loaded into the customer's AFM, and replaced during operation, can be a challenge as well. Typically, when probe devices are to be loaded into an SPM, the expert user manually transfers the probe devices from the package in which they were delivered and places them in a probe mount of the SPM. The above-noted problems associated with such manual handling of the probe devices apply here as well, with the problems made only worse by the standard type of insert housed by the clam-shell pack that holds the devices, namely, a Gel-Pak® (Gel-Pak® is a registered trademark of Gel-Pak LLC Ltd. of Sunnyvale, Calif.). A Gel-Pak® is an ESD safe container that uses a gel insert40 (FIG. 2) that engages and holds onto the probe devices, typically, the backs of the probe devices with the tips of the probes normally facing up, as noted previously.

Importantly, as a result, not only does the user need to manually grab the probe devices with a pair of tweezers when loading them, the user needs to turn the probes upside down to place them in the probe mount. To turn a probe device upside-down, the user must often use the tweezers to first grab, and then re-grab the probe with the opposite hand to flip it over, a time consuming process that has a high likelihood of compromising the integrity of the probes (e.g., by mishandling the probes). Alternatively, rather than using two hands, the operator may manually load probes into the AFM by setting the probes down and then picking them up again with the same hand. This procedure clearly creates a slew of other problems mostly directed to potentially damaging the probe, particularly the tip. In either case, this operation is only further complicated by the fact that the probe devices most often have a width and length that are about one millimeter by three millimeters, i.e., they are difficult to handle no matter how careful the operator is when handling the devices.

In the end, given that the probes can cost a thousand dollars each or more, an alternate method of transferring the probes was needed. Ideally, manual handling of the probe devices would be completely avoided.

In one proposed solution disclosed in U.S. Pat. No. 5,705,814, owned by Veeco Instruments Inc., of Santa Barbara, Calif., hereby expressly incorporated by reference herein in its entirety, an automatic tip exchange system is disclosed that uses cassettes loaded with probe devices. In this system, the concept is to load cassettes with probe devices, the cassettes being mountable in an AFM. Also, with this system, the probe devices are shipped, typically, using the Gel-Paks, as described previously, with the customer loading the cassettes upon receipt. When the customer exhausts the probes
Another problem with this and other known delivery and probe loading arrangements has been that the probe devices loaded in the packages can move within the package, especially if jarred, e.g., after being dropped. This clearly increases the risk that the probes might be destroyed or otherwise have their performance altered. In the end, all of these challenges with known probe device delivery and loading arrangements create significant problems with respect to compromising the yield of fully operational probes.
With further reference to one of these challenges, namely probe devices sticking to the lid or other surrounding surfaces, such sticking is often due to the use of a plastic cover when shipping the probe devices. Such plastic covers create significant static charge that attracts probe device (electrostatic discharge—ESD) causing the probe devices to stick thereto. As a result, ESD safe containers are preferred, most often including a conducting metal holder that prevents the probe devices from sticking to the lid. However, such metal holders are not immune from probe devices sticking thereto. Moreover, the use of such metal holders has the additional disadvantage that they oftentimes are unable to absorb significant impact forces, for instance, due to dropping of the package. Again, considering that probe devices can cost a thousand dollars or more, known probe delivery and loading arrangements have been found to be non-ideal.
As a result, the field of scanning probe microscopy, such as automated AFM operation (e.g., for use in the semiconductor industry), was in need of a system and method able to readily exchange probe devices from a package in which they were shipped to the AFM, while also improving yield of usable probes. In particular, a method and apparatus for delivering and replacing probe devices was needed in which the probe devices are maintained in a secure package able to absorb impact yet not damage the probe devices, while also insuring that the probe devices do not stick to any part of the package once the user receives the probe devices and wishes to introduce them to the AFM.

SUMMARY OF THE INVENTION

The preferred embodiments overcome the above-noted drawbacks of known systems by providing a probe device delivery package including a probe cassette in which an array of probe devices is retained in a base of the cassette using one or more probe retainers that impart a compressive retaining force on the probe devices stored therein. The probe retainer is preferably conductive, and thus ESD safe, and is otherwise non-stick. In one embodiment, the compliant element that provides the compressive force is the probe retainer itself, while in another the compliant element is separate from the probe retainer. Importantly, the probe devices can be loaded in the AFM with no manual manipulation by the AFM operator.
According to a first aspect of the preferred embodiment, a probe cassette for a scanning probe microscope (SPM) includes a base having at least one probe storage receptacle and a lid mountable on the base so as to at least substantially cover the at least one receptacle. The lid preferably includes a probe retainer that retains a probe device in the receptacle under a compressive force.
In another aspect of this embodiment, the compressive force is generated by deforming the probe retainer.
In a further aspect of this embodiment, the compressive force is generated by deforming a compliant element that is at least one of a group including a spring, a shock absorber, a gasket and a spring washer.
According to another aspect of this embodiment, the probe retainer is the compliant element mounted on the lid independent of the probe retainer.
In a still further aspect of this embodiment, the probe retainer includes a surface that contacts the probe device when the lid is coupled to the base and does not contact the probe device upon lid removal.
According to a further aspect of this embodiment, the surface of the probe retainer is non-stick and has a surface energy less than about 23 ergs/cm², and more preferably about 20 ergs/cm².
In another aspect of this embodiment, the surface of the probe retainer is conductive and the surface is formed using a polymer that is preferably carbon impregnated PTFE.
In a further aspect of this embodiment, the base is directly mountable in the SPM such that the probe device can be automatically loaded onto a probe mount of the SPM using one of a group including vacuum, mechanical clamp, electromagnetic force, electrostatic force and an adhesive.
According to another preferred embodiment, a probe device delivery apparatus includes a probe cassette in which at least one probe device is retained therein under a compressive force.
According to another aspect of this embodiment, a probe retainer that has a non-stick surface that contacts the probe device provides the compressive force.
According to yet another preferred embodiment, a method includes retaining a probe device of a scanning probe microscope in a receptacle of a probe cassette by applying a compressive force against the probe device.
In another aspect of this embodiment, a probe retainer having non-stick surface that contacts the probe device under the compressive force is provided. The compressive force may be provided by the probe retainer. In addition, the probe device preferably includes a surface made from carbon impregnated PTFE.
According to another preferred embodiment, a method includes shipping a probe cassette pre-loaded with at least one probe device to a user of an SPM such that the probe device is automatically loadable in the SPM from the probe cassette.
According to a further aspect of this embodiment, the probe cassette includes a base having at least one probe storage receptacle and a lid mountable on the base. The lid at least substantially covers the at least one receptacle. Moreover, a probe retainer retains a probe device placed in the receptacle under a compressive force.
In a further aspect of this embodiment, the compressive force is generated by deforming the probe retainer which includes a surface that contacts the probe device when the lid is in place and does not contact the probe device upon lid removal, and wherein the surface of probe retainer has a low surface energy, i.e., is non-stick.
According to yet another preferred embodiment, a method includes loading a probe device into a base of a probe cassette and then applying a compressive force to the probe device to retain the probe device in the base. A user releases the compressive force either before or after mounting the base in a scanning probe microscope (SPM). Once the compressive force is released, the lid can be removed and the probe devices can be automatically loaded onto a probe mount of the SPM.
According to a further aspect of this embodiment, the probe retainer is non-stick and conductive.
These and other objects, features, and advantages of the invention will become apparent to those skilled in the art from the following detailed description and the accompanying drawings. It should be understood, however, that the detailed description and specific examples, while indicating preferred embodiments of the present invention, are given by way of illustration and not of limitation. Many changes and modifications may be made within the scope of the present invention without departing from the spirit thereof, and the invention includes all such modifications.

BRIEF DESCRIPTION OF THE DRAWINGS

A preferred exemplary embodiment of the invention is illustrated in the accompanying drawings in which like reference numerals represent like parts throughout, and in which:
FIG. 1 is a schematic illustration of a SPM, appropriately labeled “PRIOR ART”;
FIG. 2 is a side elevation view of a clam-shell type package for shipping probes, appropriately labeled “PRIOR ART”;
FIG. 3 is a side elevation view of an automatic probe exchange system, appropriately labeled “PRIOR ART”;
FIG. 4 is a perspective view of a probe cassette of a preferred embodiment of this invention;
FIG. 5 is an assembled view of the probe cassette ofFIG. 4;
FIG. 6 is a perspective view of an underside of a lid of the probe cassette ofFIG. 4;
FIG. 7 is a side elevation view of the lid ofFIG. 6;
FIG. 8 is a bottom view of the lid ofFIG. 6;
FIG. 9 is a schematic side view of a probe retainer mounted in the lid ofFIG. 6 as its distal end contacts a substrate of a probe device placed in the cassette;
FIG. 10 is a bottom view of the base of the probe cassette ofFIG. 4;
FIG. 11A is a perspective top view of a lid of a cassette of an alternate embodiment of the invention; and
FIG. 11B is a bottom view of the lid ofFIG. 11A.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT

Turning initially toFIG. 4, aprobe cassette50 according to a preferred embodiment includes abase52 and alid54 that retains one or more probe devices (not shown). The probe devices are placed inbase52 by the probe device manufacturer for ready transport and loading into an AFM (seeFIGS. 1 and 3, for example).Base52, in this case, includesseveral rows56 of probe device receptacles orpockets58 designed to accommodate probe devices of one or more types. The probe devices have a base or substrate from which a cantilever extends, the cantilever supporting a tip extending generally orthogonally thereto near its distal end. Again, because individual probe devices can cost as much as a thousand dollars or more, it is important that the performance of the probe devices not be compromised in any way, paying particular attention to maintaining the integrity of the tips. This includes from the time of manufacture to ultimate loading in an AFM. Notably, in this regard,probe receptacles58 are configured to accommodate the tip of the probe device and minimize the chance that the tip is interfered with in any way, including during transport. (SeeFIG. 9 and description below)
Importantly, by using theprobe cassette50 ofFIG. 4, probe devices can be pre-loaded and delivered to a customer site with minimal AFM operator intervention. More particularly, the probe devices can be loaded anywhere by someone other than the customer (e.g., the manufacturer may pre-load cassette50) and then the pre-loaded cassette can be shipped to the customer (e.g., forwarded to the customer by the manufacturer via any delivery channel) for future use. Once received by the customer, thecassette50, or at least some part thereof, is directly mountable in the AFM. During AFM operation, the probe devices can then be automatically accessed by the AFM.
In this case, “directly mountable” or “automatically loadable” means that no additional manual steps are required beyond interfacingcassette50 with the AFM, i.e., no manual manipulation of the individual probe devices is required by the operator. More particularly, once theprobe cassette50 is delivered, the AFM operator need only remove thelid54 ofprobe cassette50, thereby releasing the compressive force on the probe devices, and then placebase52 of cassette in a mounting position on the AFM, such as onstage43 ofFIG. 3. Alternatively, of course, theprobe cassette50 could be introduced to the AFM upon receipt of thecassette50 and then the compressive force (provided at least in part by thelid54, discussed further below) could then be released and the lid removed. In either case, manual manipulation of the probe devices themselves is minimized, thereby overcoming the drawbacks of prior mechanisms that require operator manipulation of the probe devices and which, therefore, yield an unacceptably low percentage of fully operational probe devices. Notably, the mounting position may or may not be pre-determined but once a location is chosen, locating pins (not shown) of a tip exchange pedestal that is appropriately mounted on a stage of the AFM are used to allowbase52 to be registered therewith. In particular, a series of openings106 (seeFIG. 10) are preferably formed inbase52 to secure and otherwise position the base in the AFM.
Referring toFIGS. 4 and 5,probe cassette50 according to the preferred embodiment includes threerows56 ofprobe receptacles58 in which probe devices (not shown inFIG. 4) are loaded tip-down. Probereceptacles58 may be tailored to accommodate the probe devices and preferably are positioned closely adjacent to one another to accommodate as many probe devices as possible.Base52 also includes anotch60 primarily for facilitating handling of the base52 by the user but could also be used for indexing when introducingprobe cassette50 to a scanning probe microscope (SPM). In addition,base52 includes two threadedopenings62,64 to accept connecting apparatus, for example screws66,68, coupled tolid54 ofpackage50 for securing the probe devices betweenbase52 andlid54, as shown inFIG. 5.
FIG. 5 illustratesprobe cassette50 havingbase52 loaded with probe devices and havinglid54 mounted onbase52, fully assembled withscrews66,68 appropriately tightened. The loadedprobe cassette50 is thus ready for delivery and is able to withstand jarring, including being dropped. Notably, once the AFM operator wishes to use the probes contained withinprobe cassette50, the operator need only loosenscrews66,68, removelid54 and registerbase52 with the AFM, for example, on a stage such as that shown inFIG. 3. At that point, the AFM is able to selectively access probe devices, for example, in response to operator commands. In this regard, a selected probe device may be loaded onto an AFM probe mount using any one of a group of suitable retrieving/retaining apparatus. Such apparatus include, but are not limited to, vacuum, mechanical clamp, electromagnetic force, electrostatic force and an adhesive.
Referring toFIGS. 4 and 6-8, to retain the probe devices disposed inprobe receptacles58 ofbase52 ofcassette50,lid54 includes a series of probe retainers or strips70, preferably corresponding to the number ofrows56, that interface with the probe devices placed inreceptacles58. As shown inFIGS. 4 and 6,retainers70 are disposed on anunderside72 oflid54, extending away therefrom. In this way, whenlid54 is placed onbase52 filled with probe devices, adistal edge74 ofstrips70 can impinge upon the base or substrate of the probe devices, thereby holding the probe devices inreceptacles58 betweenbase52 andlid54. Notably, to accommodateprobe retainers70 alongrows56 but outside ofprobe receptacles58 whenlid54 is placed on top of base52 (with probe devices sandwiched therebetween), channels orgrooves76 are formed on atop surface77 ofbase52 as seen inFIG. 4.Channels76 are preferably formed along therows56 ofprobe receptacles58 generally orthogonally to the longitudinal axis of the probe devices.
In general,probe retainers70 operate to hold the probe devices withincassette50 under a compressive force, i.e., the probe retainers touch the probe devices when thelid54 is mounted on thebase52. As described in further detail below, the compressive force may be generated usingcompliant retainers70 as they sandwich the probe devices betweenbase52 andlid54, or if rigid retainers are used, the compressive force may be provided by one or more appropriately configured connectors for securinglid54 to base52 (seeFIGS. 11A and 11B and the corresponding description below).
With more particular reference toFIG. 6,probe retainers70 are mounted onunderside72 oflid54, preferably inslots86 formed onunderside72. To achieve the desired retaining characteristics,slots86 ideally are formed at a selected angle, α, as shown inFIG. 7. This way,probe retainers70 correspondingly extend fromunderside72 oflid54 substantially at that angle. As a result,retainers70 exert a configurable force on the probe devices to achieve the goals of the preferred embodiments. This is shown in more detail with more particular reference toFIGS. 6-8.
FIGS. 6-8 illustrate howprobe retainers70 are designed and mounted.Retainers70 preferably extend withinslots86 and abut at or near a bottom88 ofslots86. To determine the ideal shape of theprobe retainer70 and the corresponding mounting arrangement, including the angle, α, at which retainers70 extend frominside surface72 oflid54, particular attention is paid to the effective height, “h”, ofretainers70, as shown inFIG. 7. The effective height “h” ofretainers70 is primarily determined by the depth “d” ofslots86 and the width “w” ofretainers70. (FIGS. 7 and 8) The goal in selecting these dimensions is to provideretainers70 that impose a compressive force on probe devices sufficient to hold the probe devices, yet not so large to either deform or damage the probe devices in any way, including creating particles (e.g., by scraping the probe devices) that could attach to the probe devices and cause future operational problems. In addition, the compressive force imposed on the probe devices should not cause the probe devices to stick toretainers70, or any part oflid54, upon removal oflid54 fromcassette50. On whole, the selected effective height “h” and angle, α, is designed to accommodate droppingcassette50 from a significant height, such as shoulder height, with sufficient yield of fully operational probes. In this regard, the achievable yield of fully operational probe devices using the preferred embodiments is at least 90%, and more preferably is maintained at or above 95%.
With respect to the ideal angle, α, given the type ofretainer70 employed, as much compression force as possible is desired without damaging the type of probe devices being housed therein. For example, for probe devices with solid silicon substrates, more force can be applied than when probe devices having components or circuitry mounted on the substrate are packaged. That said, even for less complex probe devices, the applied force should not be so great as to scrape the substrate and create free-flowing particles within the cassette. Preferably, the angle α is between about 30 degrees and 60 degrees, and more preferably about 45 degrees. Notably, at an extreme, if the angle is 90 degrees, the only compliance provided byretainers70 is by the retainer material itself, i.e., there is no bending compliance. Because bending compliance is more readily controlled and robust,retainers70 preferably have significant bending compliance. In the end, forty-five degrees is preferred to provide sufficient force, yet allow material and effective height flexibility. The corresponding cut depth “d” ofslots86 and width “w” ofretainers70 should be appropriately formed, for example, empirically by doing iterations of tests including dropping thecassette50 from varying heights. When ideal cut depth ofslots86 and width ofretainers70 has been determined, the tolerances on those dimensions are preferably about ± 5/1000ths, and more preferably about ± 2/1000ths. In a preferred embodiment, h is about 0.0299 to 0.0337 inches, w is about 0.010 inch±0.001 inch, and d is about 0.085 inch±0.001 inch.
Preferably,retainers70 are held inslots86 with an adhesive. Using an adhesive is preferred primarily because it is desired thatretainers70 not be deformed when mounted, which might occur, for example, by pinching or using separate mechanical connectors to secureretainers70. In this regard, if theretainers70 are deformed, the force they impart on the probe devices may be non-uniform along the length ofretainers70. As a result, some probe devices may not be held at all byretainers70, while others may be subject to forces greater than desired which may, in turn, compromise the performance of those probes. Overall, by using an adhesive it is easier to achieve a continuous retainer height “h” away frominside surface72 oflid54 alongstrip70. As a result, the desired retaining forces are more readily maintained, thus adding to the robust nature of the design. Notably, also, by using an adhesive,retainers70 can be easily replaced when necessary (e.g., due to wear) as long as a removable adhesive is employed.
In sum, to achieve the goals of the package,cassette50 preferably includes an appropriate compliant mechanism. In addition,probe retainers70 should be sufficiently non-stick to prevent the probe devices from sticking to them. With respect to the compliant nature of the holding mechanism ofcassette50, as suggested previously, the compliance may be provided byprobe retainers70 themselves, or by using a combination ofrigid probe retainers70 and compliant, shock-like connectors betweenlid54 and base52 (seeFIGS. 11A and 11B, discussed below). With respect to thestrips70 themselves, they, or at least the surface thereof that contacts the probe devices, are preferably fabricated using a non-stick material that is conductive (e.g., surface resistivity ofstrips70 is preferably less than about 1 Kohm), and thus ESD safe. In this regard, carbon impregnated PTFE is ideal. As an alternative to carbon impregnated PTFE, different types of conducting plastics may be used.
In another alternative,probe retainers70 could be, rather than elongate strips, individual brushes or other discrete protrusions that interface with the probe devices individually. However, such an arrangement is not preferred given wear issues and the fabrication difficulty associated with mounting and replacing individual brushes.
Notably, one of the key advantages of using a compliant strip made of, for example, carbon impregnated PTFE, is thatstrip70 is designed to contact and hold the probe devices at multiple points along each row in contrast to a typical kinematic retainer. More particularly, by using compliant strips, the preferred embodiments are able to impinge each probe device along a row of probe devices, in contrast to retainers with little or no compliance, which typically would only contact the probe devices that extend the highest within the probe device receptacles. Because the preferred embodiments are able to secure each and every probe device within the cassette, the present probe device cassette minimizes the chance that one or more of the probe devices becomes damaged or is otherwise compromised, for example, due to chipping of the silicon.
With further reference to the compliance ofretainer70, the material should be relatively soft, and in any event, less than the hardness of silicon, a Mohs hardness of about 6.5. The preferred compliance should be maintained over both the length ofprobe retainer70 as well as its width, thus defining a spring used to hold the probes withinprobe receptacles58. Regarding the non-stick nature ofprobe retainers70, the material should maintain a low surface energy, preferably within a range of less than about 50 ergs/cm², and more particularly, less than about 20-23 ergs/cm².
As noted previously, AFM probe devices are typically micromachined or batch fabricated according to known techniques. In this case, after inspection and testing, the manufacturer places the probe devices in thebase52 ofprobe cassette50 for delivery to the customer. Once the probe devices are loaded intobase52, the cover orlid54 is placed on top ofbase52, as shown inFIG. 5, such that theprobe retainers70 mounted onunderside72 oflid54 can impart a retaining force on at least a portion of the probe devices. To facilitate proper alignment with the base,lid54 haslegs78,80 that are accommodated bynotches82,84, respectively, inbase54 to properly registerlid54 withbase52. (SeeFIGS. 5 and 6)
Oncebase52 is loaded with probe devices, andlid54 is placed thereon, screws66,68 oflid54 are brought into engagement with corresponding threadedopenings62,64 ofbase52 and then appropriately tightened to clamp the probe devices betweenlid54 andbase52, and more particularly, betweenprobe retainers70 and the bottom surfaces ofprobe receptacles58. In this case,probe retainers70 are formed with some compliance so that the force applied to the probe devices is strong enough to hold the probe devices in place, yet not so great to compromise the integrity thereof, even under stress. Again, the composition of the probe retainers and the placing of probe retainers or strips70 at an angle as described above facilitates this objective.
A schematic illustration of aprobe device90 loaded inbase52 and clamped in place bylid54 including aprobe retainer70 is shown inFIG. 9.Probe device90 includes aprobe92 and a base orsubstrate94 including abottom surface96 that ultimately is placed adjacent abottom surface100 of aprobe receptacle58, such as that shown inFIG. 4. Notably, atip98 ofprobe device90 supported by acantilever99 ofprobe92 is accommodated by anopening102 ofprobe receptacle54 so thattip98 does not contact any portion ofprobe receptacle58, even ifcassette50 is jarred. The probe manufacturer moveslid54 havingprobe retainers70 mounted (e.g., glued) in acorresponding slot86 ofunderside72 oflid54 towards the base52 so that adistal end74 of aretainer70 contacts atop surface104 ofsubstrate94 ofprobe device90. Aslid54 is clamped into place by tighteningscrews66,68 (FIG. 4), thecompliant probe retainer70 may move slightly alongtop surface104 ofsubstrate94 to holdsubstrate94 againstbottom surface100 ofprobe receptacle58 with precision force, yet without damagingprobe device90. Again, the force applied byretainer70 onsubstrate94 ofprobe device90 is sufficiently strong to withstand jostling during delivery or even a four or five foot drop ofprobe cassette50 onto a hard surface without compromising probe device performance.
Turning toFIG. 10, the bottom ofbase52 is shown.Base52 includesopenings62,64 to receive the screws of lid54 (FIG. 4) when tighteninglid54 to base52 ofprobe cassette50, thus securing the probe devices as described previously. A recessedopening108 is provided on the bottom ofbase52 to accommodate, for example, a product identifier (not shown).
In an alternative, reference is made toFIGS. 11A and 11B. In this case, the probe retainers are not necessarily manufactured using carbon impregnated PTFE, or other material with similar compliance characteristics. The compliance instead is provided by spring loaded attachment devices mounted on probe cassette. In particular,openings124,126 formed in alid54′ are provided to accommodate corresponding spring loadedattachment devices112,114 that, when coupled to a base (such asbase52 of cassette50), provide the requisite compliance to insure thatprobe retainers70′ contact the substrate of the probe devices with sufficient force to maintain the probe devices inreceptacles58 of base52 (FIG. 4), even during jarring, yet not with a force so great that the probes break or their performance is otherwise compromised.
Preferably, spring loadedattachment devices112,114 include respectivecaptive screws116,118, andcorresponding springs120,122, such as coil springs.Springs120,122 are introduced toopenings124,126 oflid54′ such that they are seated incylindrical sections128,130 ofopenings124,126.Cylindrical sections128,130 include asupport surface132,134 upon which springs120,122 introduced tocylindrical sections128,130 rest. Support surfaces132,134 ofcylindrical sections128,130 also include acentral opening133,135 that is threaded to receivecaptive screws116,118.
To assemble the spring loadedattachment devices112,114, springs120,122 are introduced tocylindrical sections128,130 where they rest onsurface132,134 of the cylindrical sections. A threadedend136,138 of each ofcaptive screws116,118 is placed axially throughsprings120,122 and engaged with threadedopenings133,135 ofopenings124,126. Once theends136,138 are fully threaded entirely throughopenings133,135, arespective retaining washer152,155 is coupled to theshaft117,119 ofcaptive screw116,118, as shown inFIG. 11B. In this way,captive screws116,118 are floating onsprings120,122 in the undercut portions ofopenings124,126. More particularly, heads144,146 ofcaptive screws116,118 float onsprings120,122 and can be pushed towards undercutsurfaces148,150 ofopenings124,126 againstsprings120,122. When couplinglid54′ to a base, threaded ends136,138 ofcaptive screws116,118 are coupled to corresponding threaded openings of the base, such asopenings62,64 ofbase52 ofFIG. 4. Asscrews116,118 are tightened to the base, the base is pulled towards thelid54′ withsprings120,122 being compressed betweensurfaces133,135 and the undersurfaces ofheads144,146 ofscrews116,118. This arrangement provides the compliant element and the corresponding compliant force.Screws116,118 are further tightened untilprobe retainers70′ contact the probe devices stored in the base. Further tightening of thescrews116,118 is dictated by the amount of force applied byprobe retainer70′ required to retain the probe devices without compromising their operability. The degree to which the spring loadedattachment devices112,114 are tightened is preferably determined for the particular type of probe being delivered, and may be determined empirically. Notably, the spring loadedattachment devices112,114 shown inFIGS. 11A and 11B illustrate one arrangement for providing a compliant element that applies a compressive force to probe devices housed in thecassette110. Alternative arrangements for providing a controllable compressive force are contemplated as being within the skill of those in the art.
In this case,probe retainers70′ can be made of any non-stick and conductive rigid material such as steel, or a more compliant material such as the carbon impregnated PTFE described above. That said, similar tocassette50,retainers70′ ofcassette110 are still preferably mounted inlid54′ havingslots86′ that are angled which operates to minimize the chance that retainers70′ damage the probe devices in any way. And, similar to the above,retainers70′ are preferably glued inslots86′ and may be replaced by using a removable adhesive.
Although the best mode contemplated by the inventors of carrying out the present invention is disclosed above, practice of the present invention is not limited thereto. For example, a variety of non-stick and/or compliant materials could be used as probe retainers and other types of compliant elements may be provided to realize the objectives of the preferred embodiments, including providing a package that minimizes AFM operator handling of the probe devices yet maintains high probe yield. For example, the compliant element could be in the base, the lid, or a combination of both. It could be at least one of a group including a spring, a shock absorber, a gasket and a spring washer. It will be manifest that various additions, modifications and rearrangements of the features of the present invention may be made without deviating from the spirit and scope of the underlying inventive concept.

Claims

1. A probe cassette for a scanning probe microscope (SPM), the probe cassette comprising:

a base having at least one probe storage receptacle;

a lid mountable on the base so as to at least substantially cover the at least one receptacle; and

a probe retainer that retains a probe device for use in the SPM in the receptacle under a compressive force.

2. (canceled)

3. The probe cassette as inclaim 1, wherein the compressive force is generated by deforming a compliant element.

4. The probe cassette as inclaim 3, wherein the compliant element is at least one of a group including a spring and a spring washer.

5. The probe cassette as inclaim 3, wherein the probe retainer forms at least part of the compliant element.

6. The probe cassette as inclaim 3, wherein the compliant element is mounted on the lid independent of the probe retainer.

7. The probe cassette as recited inclaim 1, wherein the probe retainer includes a surface that contacts the probe device when the lid is coupled to the base and does not contact the probe device upon lid removal.

8. The probe cassette as recited inclaim 7, wherein at least the surface of the probe retainer that contacts the probe device is non-stick.

9. The probe cassette as recited inclaim 8, wherein the probe retainer has a surface energy less than about 30 ergs/cm².

10. The probe cassette as recited inclaim 9, wherein the probe retainer has a surface energy less than about 20 ergs/cm².

11. The probe cassette as recited inclaim 8, wherein the surface of the probe retainer is conductive and is formed using a polymer.

12. The probe cassette as recited inclaim 11, wherein the polymer is carbon impregnated PTFE.

13. The probe cassette as recited inclaim 1, wherein the probe retainer includes a surface that contacts the probe device when the lid is coupled to the base, and wherein the surface is conductive.

14. The probe cassette as recited inclaim 13, wherein the surface is formed from carbon impregnated PTFE.

15. The probe cassette as recited inclaim 1, wherein the base is directly mountable in the SPM such that the probe device can be automatically loaded onto a probe mount of the SPM.

16. The probe cassette as recited inclaim 1, wherein the probe cassette is pre-loaded with the at least one probe device so that when shipped, the probe device is automatically loadable onto a probe mount of the SPM.

17. An apparatus comprising:

a probe cassette in which at least one probe device is retained therein under a compressive force.

18. The apparatus ofclaim 17, further comprising a non-stick probe retainer that contacts the probe device under the compressive force.

19. The apparatus ofclaim 18, wherein the compressive force is provided by the probe retainer.

20. The apparatus ofclaim 19, wherein the probe retainer includes carbon impregnated PTFE.

21. The apparatus ofclaim 18, wherein the compressive force is generated by deforming a compliant element.

22. The apparatus ofclaim 21, wherein the compliant element is the probe retainer.

23. A method comprising:

retaining a probe device of a scanning probe microscope in a receptacle of a probe cassette by applying a compressive force against the probe device.

24. The method ofclaim 23, further comprising providing a non-stick probe retainer having a non-stick surface that contacts the probe device under the compressive force.

25. The method ofclaim 24, wherein the compressive force is provided by the probe retainer.

26. The method ofclaim 25, wherein the probe retainer is formed from carbon impregnated PTFE.

27. A method comprising:

loading a probe device into a base of a probe cassette;

applying a compressive force to the probe device to retain the probe device in the base; and

mounting the base in a scanning probe microscope (SPM);

releasing the compressive force; and then

automatically loading the probe device onto a probe mount of the SPM.

28. The method ofclaim 27, wherein the compressive force is generated by deforming a compliant element.

29. The method ofclaim 28, wherein the compliant element is a probe retainer, and wherein the probe retainer includes a surface that contacts the probe device when the lid is in place and releases from the probe device upon lid removal.

30. The method ofclaim 29, wherein the probe retainer includes a surface that contacts the probe device when the lid is in place, and wherein the surface is at least one of non-stick and conductive.

31. The method ofclaim 30, wherein the surface is formed from a carbon impregnated PTFE.

32. The method ofclaim 27, further comprising:

shipping the probe cassette prior to said mounting step, wherein the probe cassette is pre-loaded with the probe device.

33. The probe cassette as inclaim 1, wherein the compressive force is generated by deforming at least one of a part of the lid and the probe retainer.