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US20070178607A1 - Microparticle-based methods and systems and applications thereof - Google Patents

Microparticle-based methods and systems and applications thereof
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Publication number
US20070178607A1
US20070178607A1US11/726,412US72641207AUS2007178607A1US 20070178607 A1US20070178607 A1US 20070178607A1US 72641207 AUS72641207 AUS 72641207AUS 2007178607 A1US2007178607 A1US 2007178607A1
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United States
Prior art keywords
particle
microparticles
binding
particles
light scattering
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Abandoned
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US11/726,412
Inventor
James Prober
Xiumin Cui
Rudy Dam
Edwin Hendrickson
Xueping Jiang
Michael Perry
Larry Steenhoek
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Individual
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Priority to US11/726,412priorityCriticalpatent/US20070178607A1/en
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Abstract

Microparticle-based analytical methods, systems and applications are provided. Specifically, the use of resonant light scattering as an analytical method for determining either or both a particle's identity and the presence and optionally, the concentration of one or more particular target analytes is described. Applications of these microparticle-based methods in biological and chemical assays are also disclosed.

Description

Claims (8)

71. A microparticle based measuring system comprising:
(a) at least two substantially spherical identifiable particles in solution, each particle comprising
a capture probe affixed to the outer surface of the particle;
wherein:
1) each particle is characterized by a unique resonant light scattering signature when scanned over an analytical wavelength range having a window spanning about 1 to about 20 nanometers, over a range of optical wavelengths from about 275 to about 1900 nanometers;
2) each particle is about 75 micrometers in diameter or less;
3) each particle has a refractive index between about 1.45 and about 2.1 over the analytical wavelength range; and
4) each particle has an outer optical region which is substantially transparent to light over said analytical wavelength range;
(b) a tunable diode laser for scanning the particle over the analytical wavelength range;
(c) an optical cell for holding the particles in a position such that the scanning diode laser efficiently illuminates said particles and scattered light is minimized;
(d) a particle handling means for placing the at least two particles into the optical cell; and
(e) an imaging means for detecting resonant light scattering from the particles and converting said light to an electrical signal.
77. A microparticle based measuring system comprising:
(a) at least two substantially spherical identifiable particles in solution, each particle comprising;
a capture probe affixed to the outer surface of the particle;
wherein:
1) each particle is characterized by a unique structural resonant light scattering signature when scanned over an analytical wavelength range having a window spanning about 1 to about 20 nanometers, over a range of optical wavelengths from about 275 to about 1900 nanometers;
2) each particle is about 75 micrometers in diameter or less;
3) each particle has a refractive index between about 1.45 and about 2.1 over the analytical wavelength range; and
4) each particle has an outer optical region which is substantially transparent to light over said analytical wavelength range;
(b) a tunable diode laser light source;
(c) an optical cell for holding the particles in a position such that the scanning diode laser efficiently illuminates said particles and scattered light is minimized;
(d) a means for contacting microparticles with analytes and reagents;
(e) a microscope;
(f) a digital camera and monitor;
(g) digital image acquisition hardware;
(h) a computer operably linked to the elements of (b)-(g); and
(i) software suitable for controlling the elements of (b)-(g), capturing data, and processing the data.
US11/726,4122002-11-062007-03-22Microparticle-based methods and systems and applications thereofAbandonedUS20070178607A1 (en)

Priority Applications (1)

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US11/726,412US20070178607A1 (en)2002-11-062007-03-22Microparticle-based methods and systems and applications thereof

Applications Claiming Priority (4)

Application NumberPriority DateFiling DateTitle
US42416802P2002-11-062002-11-06
US10/702,320US7122384B2 (en)2002-11-062003-11-05Resonant light scattering microparticle methods
US11/189,062US20050282219A1 (en)2002-11-062005-07-25Microparticle-based methods and systems and applications thereof
US11/726,412US20070178607A1 (en)2002-11-062007-03-22Microparticle-based methods and systems and applications thereof

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US11/189,062DivisionUS20050282219A1 (en)2002-11-062005-07-25Microparticle-based methods and systems and applications thereof

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US20070178607A1true US20070178607A1 (en)2007-08-02

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Family Applications (7)

Application NumberTitlePriority DateFiling Date
US10/702,320Expired - Fee RelatedUS7122384B2 (en)2002-11-062003-11-05Resonant light scattering microparticle methods
US11/189,062AbandonedUS20050282219A1 (en)2002-11-062005-07-25Microparticle-based methods and systems and applications thereof
US11/189,063AbandonedUS20050255524A1 (en)2002-11-062005-07-25Microparticle-based methods and systems and applications thereof
US11/189,080AbandonedUS20050282220A1 (en)2002-11-062005-07-25Microparticle-based methods and systems and applications thereof
US11/188,823AbandonedUS20050255523A1 (en)2002-11-062005-07-25Microparticle-based methods and systems and applications thereof
US11/188,560AbandonedUS20050282218A1 (en)2002-11-062005-07-25Microparticle-based methods and systems and applications thereof
US11/726,412AbandonedUS20070178607A1 (en)2002-11-062007-03-22Microparticle-based methods and systems and applications thereof

Family Applications Before (6)

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US10/702,320Expired - Fee RelatedUS7122384B2 (en)2002-11-062003-11-05Resonant light scattering microparticle methods
US11/189,062AbandonedUS20050282219A1 (en)2002-11-062005-07-25Microparticle-based methods and systems and applications thereof
US11/189,063AbandonedUS20050255524A1 (en)2002-11-062005-07-25Microparticle-based methods and systems and applications thereof
US11/189,080AbandonedUS20050282220A1 (en)2002-11-062005-07-25Microparticle-based methods and systems and applications thereof
US11/188,823AbandonedUS20050255523A1 (en)2002-11-062005-07-25Microparticle-based methods and systems and applications thereof
US11/188,560AbandonedUS20050282218A1 (en)2002-11-062005-07-25Microparticle-based methods and systems and applications thereof

Country Status (7)

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US (7)US7122384B2 (en)
EP (1)EP1558750A4 (en)
JP (1)JP2006515420A (en)
KR (1)KR20050073609A (en)
AU (1)AU2003291512A1 (en)
CA (1)CA2503631A1 (en)
WO (1)WO2004044232A1 (en)

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US20050255523A1 (en)2005-11-17
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US20050282218A1 (en)2005-12-22
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US7122384B2 (en)2006-10-17
US20050282220A1 (en)2005-12-22

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