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US20060012875A1 - Microscope with increased resolution - Google Patents

Microscope with increased resolution
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Publication number
US20060012875A1
US20060012875A1US10/967,343US96734304AUS2006012875A1US 20060012875 A1US20060012875 A1US 20060012875A1US 96734304 AUS96734304 AUS 96734304AUS 2006012875 A1US2006012875 A1US 2006012875A1
Authority
US
United States
Prior art keywords
microscope
sample
grid
microscope according
illumination
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US10/967,343
Inventor
Ralf Wolleschensky
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Carl Zeiss Jena GmbH
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by IndividualfiledCriticalIndividual
Assigned to CARL ZEISS JENA GMBHreassignmentCARL ZEISS JENA GMBHASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).Assignors: WOLLESCHENSKY, RALF
Publication of US20060012875A1publicationCriticalpatent/US20060012875A1/en
Priority to US11/698,279priorityCriticalpatent/US7468834B2/en
Priority to US12/973,130prioritypatent/USRE43702E1/en
Abandonedlegal-statusCriticalCurrent

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Abstract

Microscope with heightened resolution wherein the sample is illuminated with a first and a second illuminating light, with the first illuminating light exciting the sample and the second illuminating light being generated through the refraction of coherent light at a periodic structure and displaying a periodic structure in a lateral beam direction and in axial beam direction.

Description

Claims (23)

US10/967,3432004-07-162004-10-19Microscope with increased resolutionAbandonedUS20060012875A1 (en)

Priority Applications (2)

Application NumberPriority DateFiling DateTitle
US11/698,279US7468834B2 (en)2004-07-162007-01-26Microscope with heightened resolution and linear scanning
US12/973,130USRE43702E1 (en)2004-07-162010-12-20Microscope with heightened resolution and linear scanning

Applications Claiming Priority (2)

Application NumberPriority DateFiling DateTitle
DE102004034962ADE102004034962A1 (en)2004-07-162004-07-16 Microscope with increased resolution
DE102004034962.22004-07-16

Related Parent Applications (1)

Application NumberTitlePriority DateFiling Date
US10/967,348ContinuationUS20060012869A1 (en)2004-07-162004-10-19Light grid microscope with linear scanning

Related Child Applications (2)

Application NumberTitlePriority DateFiling Date
US10/967,348ContinuationUS20060012869A1 (en)2004-07-162004-10-19Light grid microscope with linear scanning
US11/698,279ContinuationUS7468834B2 (en)2004-07-162007-01-26Microscope with heightened resolution and linear scanning

Publications (1)

Publication NumberPublication Date
US20060012875A1true US20060012875A1 (en)2006-01-19

Family

ID=34854183

Family Applications (2)

Application NumberTitlePriority DateFiling Date
US10/967,343AbandonedUS20060012875A1 (en)2004-07-162004-10-19Microscope with increased resolution
US11/698,279CeasedUS7468834B2 (en)2004-07-162007-01-26Microscope with heightened resolution and linear scanning

Family Applications After (1)

Application NumberTitlePriority DateFiling Date
US11/698,279CeasedUS7468834B2 (en)2004-07-162007-01-26Microscope with heightened resolution and linear scanning

Country Status (5)

CountryLink
US (2)US20060012875A1 (en)
EP (1)EP1617259B1 (en)
JP (1)JP5150823B2 (en)
DE (1)DE102004034962A1 (en)
GB (1)GB2416445A (en)

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US20110210269A1 (en)*2009-11-252011-09-01Ofs Fitel, LlcNon-Linear Optical System and Techniques
WO2014049127A1 (en)2012-09-282014-04-03Carl Zeiss Microscopy GmbhConfocal incident-light scanning microscope for multipoint scanning
US20140160560A1 (en)*2012-12-122014-06-12Olympus CorporationProtection device and microscope system
US20170205609A1 (en)*2014-10-092017-07-20Olympus CorporationImage-forming optical system, illumination apparatus, and microscope apparatus
US20180202935A1 (en)*2005-05-252018-07-19Massachusetts Institute Of TechnologyMultifocal imaging systems and method
US10222599B2 (en)2012-01-182019-03-05Nikon CorporationStructured illuminating apparatus, structured illuminating microscopy apparatus, and structured illuminating method
US11519832B2 (en)2015-03-112022-12-06Tissuevision, Inc.Systems and methods for serial staining and imaging
US12135261B2 (en)2016-11-182024-11-05Tissuevision, Inc.Automated tissue section capture, indexing and storage system and methods

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JP4785480B2 (en)*2005-09-222011-10-05三鷹光器株式会社 Optical measurement system
DE102006009831B4 (en)*2006-03-012013-07-04Leica Microsystems Cms Gmbh Method and microscope for spatially high-resolution examination of samples
DE102006047912A1 (en)2006-10-062008-04-10Carl Zeiss Microimaging Gmbh Method and device for parallelized microscopic imaging
US8184364B2 (en)*2007-05-262012-05-22Zeta Instruments, Inc.Illuminator for a 3-D optical microscope
US7729049B2 (en)2007-05-262010-06-01Zeta Instruments, Inc.3-d optical microscope
FR2922658B1 (en)*2007-10-182011-02-04Centre Nat Rech Scient STRUCTURED ILLUMINATION SYSTEM OF A SAMPLE
JP5616793B2 (en)*2007-12-192014-10-29コーニンクレッカ フィリップス エヌ ヴェ Detection system and method
US8228601B2 (en)*2008-05-132012-07-24Applied Materials Israel, Ltd.Scanning microscopy using inhomogeneous polarization
DE102008049878A1 (en)2008-09-302010-04-01Carl Zeiss Microlmaging Gmbh Improved methods and devices for microscopy with structured illumination
DE102008054317A1 (en)*2008-11-032010-05-06Carl Zeiss Microlmaging Gmbh combining microscopy
WO2010065538A1 (en)*2008-12-022010-06-10The Regents Of The University Of CaliforniaImaging arrangement and microscope
EP2317362B1 (en)*2009-10-282020-01-15Carl Zeiss Microscopy GmbHMicroscopic method and microscope with improved resolution
US9389408B2 (en)2010-07-232016-07-12Zeta Instruments, Inc.3D microscope and methods of measuring patterned substrates
US10048480B2 (en)2011-01-072018-08-14Zeta Instruments, Inc.3D microscope including insertable components to provide multiple imaging and measurement capabilities
EP2725356A4 (en)*2011-06-232014-12-03Korea Res Inst Of Bioscience MICROSCOPE-TYPE APPARATUS FOR DETECTING OR IMAGING A PROTEIN USING AN IFRET PROBE AND METHOD OF DETECTING OR IMAGING PROTEIN EMPLOYING IT
JP2014063151A (en)*2012-08-292014-04-10Canon IncMicroscope illumination optical system and microscope having the same
DE102013001238B4 (en)*2013-01-252020-06-10Carl Zeiss Microscopy Gmbh Light microscope and microscopy method
DE102013004963A1 (en)2013-03-222014-09-25Carl Zeiss Microscopy Gmbh Microscope with structured illumination
KR101479249B1 (en)2013-11-082015-01-05한국표준과학연구원Coherent Structured Illumination Imaging Method And Coherent Structured Illumination Microscope System
CA2961333A1 (en)*2015-08-242016-08-01Synaptive Medical (Barbados) Inc.A medical imaging system for illuminating tissue samples using three-dimensional structured illumination microscopy
EP3538941B1 (en)2016-11-102025-04-23The Trustees of Columbia University in the City of New YorkRapid high-resolution imaging methods for large samples
EP3822617A4 (en)*2018-07-092022-04-06National University Corporation Kobe University HOLOGRAPHIC THREE-DIMENSIONAL MULTIPOINT LIGHT STIMULATION DEVICE AND METHOD
EP4092462A1 (en)*2021-05-182022-11-23Leica Instruments (Singapore) Pte. Ltd.Laser assisted autofocus
WO2023248853A1 (en)*2022-06-202023-12-28ソニーグループ株式会社Information processing method, information processing device, and microscope system

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US20040047034A1 (en)*2002-09-062004-03-11Ulrich SanderSafety illumination system for surgical microscopes
US20040051976A1 (en)*2002-08-292004-03-18Accretech (Israel) LtdConfocal microscope with diffractively formed virtual pinhole array
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US7009763B1 (en)*1998-12-222006-03-07Carl Zeiss Jena GmbhArrangement for separating excitation light and emission light in a microscope

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DE10155002A1 (en)*2001-11-082003-05-22Zeiss Carl Jena GmbhDepth-resolved optical imaging method for use in biological scanning microscopy, uses phase or frequency modulation of the imaging light
JP3720751B2 (en)*2001-10-232005-11-30オリンパス株式会社 Optical encoder
US6888148B2 (en)*2001-12-102005-05-03Carl Zeiss Jena GmbhArrangement for the optical capture of excited and /or back scattered light beam in a sample
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USD493272S1 (en)*2002-10-082004-07-27Kenneth A. TarverPecan shaped candy
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US5022743A (en)*1987-03-271991-06-11The Board Of Trustees Of The Leland Stanford Junior UniversityScanning confocal optical microscope
US6167173A (en)*1997-01-272000-12-26Carl Zeiss Jena GmbhLaser scanning microscope
US6028306A (en)*1997-05-142000-02-22Olympus Optical Co., Ltd.Scanning microscope
US7009763B1 (en)*1998-12-222006-03-07Carl Zeiss Jena GmbhArrangement for separating excitation light and emission light in a microscope
US20030132394A1 (en)*2001-04-072003-07-17Carl Zeiss Jena GmbhMethod and arrangement for the deep resolved optical recording or a sample
US6947127B2 (en)*2001-12-102005-09-20Carl Zeiss Jena GmbhArrangement for the optical capture of excited and/or back scattered light beam in a sample
US20040051976A1 (en)*2002-08-292004-03-18Accretech (Israel) LtdConfocal microscope with diffractively formed virtual pinhole array
US20040047034A1 (en)*2002-09-062004-03-11Ulrich SanderSafety illumination system for surgical microscopes

Cited By (15)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US20180202935A1 (en)*2005-05-252018-07-19Massachusetts Institute Of TechnologyMultifocal imaging systems and method
US10598597B2 (en)*2005-05-252020-03-24Massachusetts Institute Of TechnologyMultifocal imaging systems and method
US7679741B2 (en)2006-03-012010-03-16Leica Microsystems Cms GmbhMethod and microscope for high spatial resolution examination of samples
US20070206278A1 (en)*2006-03-012007-09-06Leica Microsystems Cms GmbhMethod and microscope for high spatial resolution examination of samples
US8507877B2 (en)*2009-11-252013-08-13Ofs Fitel, LlcNon-linear optical system and techniques
US20110210269A1 (en)*2009-11-252011-09-01Ofs Fitel, LlcNon-Linear Optical System and Techniques
US10222599B2 (en)2012-01-182019-03-05Nikon CorporationStructured illuminating apparatus, structured illuminating microscopy apparatus, and structured illuminating method
US10802259B2 (en)2012-01-182020-10-13Nikon CorporationStructured illuminating apparatus, structured illuminating microscopy apparatus, and structured illuminating method
DE102012019464A1 (en)2012-09-282014-04-03Carl Zeiss Microscopy Gmbh Confocal direct-light scanning microscope for multi-leak scanning
WO2014049127A1 (en)2012-09-282014-04-03Carl Zeiss Microscopy GmbhConfocal incident-light scanning microscope for multipoint scanning
US20140160560A1 (en)*2012-12-122014-06-12Olympus CorporationProtection device and microscope system
US9354435B2 (en)*2012-12-122016-05-31Olympus CorporationProtection device and microscope system
US20170205609A1 (en)*2014-10-092017-07-20Olympus CorporationImage-forming optical system, illumination apparatus, and microscope apparatus
US11519832B2 (en)2015-03-112022-12-06Tissuevision, Inc.Systems and methods for serial staining and imaging
US12135261B2 (en)2016-11-182024-11-05Tissuevision, Inc.Automated tissue section capture, indexing and storage system and methods

Also Published As

Publication numberPublication date
EP1617259B1 (en)2014-06-04
DE102004034962A1 (en)2006-02-16
JP2006030178A (en)2006-02-02
GB2416445A (en)2006-01-25
EP1617259A1 (en)2006-01-18
US20070171519A1 (en)2007-07-26
GB0512343D0 (en)2005-07-27
JP5150823B2 (en)2013-02-27
US7468834B2 (en)2008-12-23

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Legal Events

DateCodeTitleDescription
ASAssignment

Owner name:CARL ZEISS JENA GMBH, GERMANY

Free format text:ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:WOLLESCHENSKY, RALF;REEL/FRAME:016350/0113

Effective date:20050204

STCBInformation on status: application discontinuation

Free format text:ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION


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