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US20050109131A1 - Hard drive test fixture - Google Patents

Hard drive test fixture
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Publication number
US20050109131A1
US20050109131A1US10/723,595US72359503AUS2005109131A1US 20050109131 A1US20050109131 A1US 20050109131A1US 72359503 AUS72359503 AUS 72359503AUS 2005109131 A1US2005109131 A1US 2005109131A1
Authority
US
United States
Prior art keywords
fixture
rail
coupled
rails
tested
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
US10/723,595
Other versions
US7232101B2 (en
Inventor
Donald Wanek
Richard Sands
Robert Walter
Mark Troutman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Benchmark Electronics Inc
Original Assignee
Pemstar Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pemstar IncfiledCriticalPemstar Inc
Priority to US10/723,595priorityCriticalpatent/US7232101B2/en
Assigned to PEMSTAR, INC.reassignmentPEMSTAR, INC.ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).Assignors: SANDS, RICHARD, TROUTMAN, MARK, WALTER, ROBERT, WANEK, DONALD
Publication of US20050109131A1publicationCriticalpatent/US20050109131A1/en
Assigned to WACHOVIA CAPITAL FINANCE CORPORATION (CENTRAL), AS AGENTreassignmentWACHOVIA CAPITAL FINANCE CORPORATION (CENTRAL), AS AGENTSECURITY AGREEMENTAssignors: PEMSTAR INC.
Assigned to PEMSTAR INC.reassignmentPEMSTAR INC.RELEASE OF SECURITY INTEREST IN PATENTS AS RECORDED ON 07/18/2006 AT REEL 017946 FRAME 0488Assignors: WACHOVIA CAPITAL FINANCE CORPORATION (CENTRAL), FORMERLY KNOWN AS CONGRESS FINANCIAL CORPORATION (CENTRAL) AS AGENT
Application grantedgrantedCritical
Publication of US7232101B2publicationCriticalpatent/US7232101B2/en
Assigned to BENCHMARK ELECTRONICS MANUFACTURING INC.reassignmentBENCHMARK ELECTRONICS MANUFACTURING INC.CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).Assignors: PEMSTAR INC.
Assigned to BENCHMARK ELECTRONICS, INC.reassignmentBENCHMARK ELECTRONICS, INC.MERGER (SEE DOCUMENT FOR DETAILS).Assignors: BENCHMARK ELECTRONICS MANUFACTURING INC.
Assigned to BENCHMARK ELECTRONICS (SUZHOU) CO., LTD.reassignmentBENCHMARK ELECTRONICS (SUZHOU) CO., LTD.ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).Assignors: BENCHMARK ELECTRONICS, INC.
Assigned to BENCHMARK ELECTRONICS, INC., BENCHMARK ELECTRONICS (SUZHOU) CO., LTD.reassignmentBENCHMARK ELECTRONICS, INC.CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE ASSIGNEES ADDRESS PREVIOUSLY RECORDED ON REEL 024045 FRAME 0694. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT.Assignors: BENCHMARK ELECTRONICS, INC.
Assigned to BENCHMARK ELECTRONICS (SUZHOU) CO., LTD.reassignmentBENCHMARK ELECTRONICS (SUZHOU) CO., LTD.CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE TO REMOVE BENCHMARK ELECTRONICS, INC. AS ASSIGNEE PREVIOUSLY RECORDED ON REEL 024140 FRAME 0404. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT OF INTEREST.Assignors: BENCHMARK ELECTRONICS, INC.
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Expired - Fee Relatedlegal-statusCriticalCurrent

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Abstract

The present invention is a method and apparatus for testing electrical or optical devices. The invention includes a test fixture having a base component, a first rail and a second rail coupled to the base component, a top component coupled to the first and second rails, and an interposer coupled to the first and second rails.

Description

Claims (14)

US10/723,5952003-11-262003-11-26Hard drive test fixtureExpired - Fee RelatedUS7232101B2 (en)

Priority Applications (1)

Application NumberPriority DateFiling DateTitle
US10/723,595US7232101B2 (en)2003-11-262003-11-26Hard drive test fixture

Applications Claiming Priority (1)

Application NumberPriority DateFiling DateTitle
US10/723,595US7232101B2 (en)2003-11-262003-11-26Hard drive test fixture

Publications (2)

Publication NumberPublication Date
US20050109131A1true US20050109131A1 (en)2005-05-26
US7232101B2 US7232101B2 (en)2007-06-19

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Family Applications (1)

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US10/723,595Expired - Fee RelatedUS7232101B2 (en)2003-11-262003-11-26Hard drive test fixture

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Cited By (42)

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US20050190534A1 (en)*2004-02-272005-09-01Blackwell Donald A.Support device and extender assemblies for interposers
US20050225338A1 (en)*2004-03-312005-10-13Sands Richard LHard drive test fixture
US20090265043A1 (en)*2008-04-172009-10-22Teradyne, Inc.Dependent Temperature Control Within Disk Drive Testing Systems
US7778031B1 (en)2009-07-152010-08-17Teradyne, Inc.Test slot cooling system for a storage device testing system
US20100265609A1 (en)*2007-12-182010-10-21Teradyne, Inc.Disk drive transport, clamping and testing
US20100302678A1 (en)*2008-04-172010-12-02Teradyne, Inc.Temperature Control Within Disk Drive Testing Systems
US7848106B2 (en)2008-04-172010-12-07Teradyne, Inc.Temperature control within disk drive testing systems
US7890207B2 (en)2008-04-172011-02-15Teradyne, Inc.Transferring storage devices within storage device testing systems
US7908029B2 (en)2008-06-032011-03-15Teradyne, Inc.Processing storage devices
US7911778B2 (en)2008-04-172011-03-22Teradyne, Inc.Vibration isolation within disk drive testing systems
US7929303B1 (en)2010-02-022011-04-19Teradyne, Inc.Storage device testing system cooling
US7932734B2 (en)2009-07-152011-04-26Teradyne, Inc.Individually heating storage devices in a testing system
US7940529B2 (en)2009-07-152011-05-10Teradyne, Inc.Storage device temperature sensing
US7945424B2 (en)2008-04-172011-05-17Teradyne, Inc.Disk drive emulator and method of use thereof
US7987018B2 (en)2008-04-172011-07-26Teradyne, Inc.Transferring disk drives within disk drive testing systems
US7996174B2 (en)2007-12-182011-08-09Teradyne, Inc.Disk drive testing
US8041449B2 (en)2008-04-172011-10-18Teradyne, Inc.Bulk feeding disk drives to disk drive testing systems
US8102173B2 (en)2008-04-172012-01-24Teradyne, Inc.Thermal control system for test slot of test rack for disk drive testing system with thermoelectric device and a cooling conduit
US8116079B2 (en)2009-07-152012-02-14Teradyne, Inc.Storage device testing system cooling
US8238099B2 (en)2008-04-172012-08-07Teradyne, Inc.Enclosed operating area for disk drive testing systems
US8547123B2 (en)2009-07-152013-10-01Teradyne, Inc.Storage device testing system with a conductive heating assembly
US8628239B2 (en)2009-07-152014-01-14Teradyne, Inc.Storage device temperature sensing
US8687349B2 (en)2010-07-212014-04-01Teradyne, Inc.Bulk transfer of storage devices using manual loading
US9001456B2 (en)2010-08-312015-04-07Teradyne, Inc.Engaging test slots
US9449643B1 (en)*2015-04-242016-09-20Seagate Technology LlcData storage component test deck
US9459312B2 (en)2013-04-102016-10-04Teradyne, Inc.Electronic assembly test system
US9779780B2 (en)2010-06-172017-10-03Teradyne, Inc.Damping vibrations within storage device testing systems
CN110146262A (en)*2019-04-252019-08-20上海大学 A clamp for a plate-shaped device
US10725091B2 (en)2017-08-282020-07-28Teradyne, Inc.Automated test system having multiple stages
US10775408B2 (en)2018-08-202020-09-15Teradyne, Inc.System for testing devices inside of carriers
US10845410B2 (en)2017-08-282020-11-24Teradyne, Inc.Automated test system having orthogonal robots
US10948534B2 (en)2017-08-282021-03-16Teradyne, Inc.Automated test system employing robotics
US10983145B2 (en)2018-04-242021-04-20Teradyne, Inc.System for testing devices inside of carriers
US20210180746A1 (en)*2018-10-312021-06-17Toshiba Energy Systems & Solutions CorporationCharged particle transport system and installation method therefor
CN113125336A (en)*2021-04-252021-07-16赵岚Zither artificial nail testing device
US11226390B2 (en)2017-08-282022-01-18Teradyne, Inc.Calibration process for an automated test system
US11754622B2 (en)2020-10-222023-09-12Teradyne, Inc.Thermal control system for an automated test system
US11754596B2 (en)2020-10-222023-09-12Teradyne, Inc.Test site configuration in an automated test system
US11867749B2 (en)2020-10-222024-01-09Teradyne, Inc.Vision system for an automated test system
US11899042B2 (en)2020-10-222024-02-13Teradyne, Inc.Automated test system
US11953519B2 (en)2020-10-222024-04-09Teradyne, Inc.Modular automated test system
US12007411B2 (en)2021-06-222024-06-11Teradyne, Inc.Test socket having an automated lid

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JP2007066126A (en)*2005-09-012007-03-15Hitachi Global Storage Technologies Netherlands Bv Data storage device test method and data storage device manufacturing method
EP2333026B1 (en)2009-10-212014-07-16Wintershall Holding GmbHMethod for producing crude oil
WO2019204686A1 (en)2018-04-192019-10-24The Research Foundation For The State University Of New YorkSolderless circuit connector

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Cited By (65)

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US7145765B2 (en)*2004-02-272006-12-05Finisar CorporationSupport device and extender assemblies for interposers
US20050190534A1 (en)*2004-02-272005-09-01Blackwell Donald A.Support device and extender assemblies for interposers
US20050225338A1 (en)*2004-03-312005-10-13Sands Richard LHard drive test fixture
US7996174B2 (en)2007-12-182011-08-09Teradyne, Inc.Disk drive testing
US8549912B2 (en)2007-12-182013-10-08Teradyne, Inc.Disk drive transport, clamping and testing
US8467180B2 (en)2007-12-182013-06-18Teradyne, Inc.Disk drive transport, clamping and testing
US20100265609A1 (en)*2007-12-182010-10-21Teradyne, Inc.Disk drive transport, clamping and testing
US8405971B2 (en)2007-12-182013-03-26Teradyne, Inc.Disk drive transport, clamping and testing
US8451608B2 (en)2008-04-172013-05-28Teradyne, Inc.Temperature control within storage device testing systems
US7890207B2 (en)2008-04-172011-02-15Teradyne, Inc.Transferring storage devices within storage device testing systems
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