US20040197169A1 - Vacuum processing apparatus and semiconductor manufacturing line using the same - Google Patents

Abstract

A vacuum processing apparatus is composed of a cassette block and a vacuum processing block. The cassette block has a cassette table for mounting a plurality of cassettes containing a sample and an atmospheric transfer means. The vacuum processing block has a plurality of processing chambers for performing vacuum processing to the sample and a vacuum transfer means for transferring the sample. Both of the plan views of the cassette block and the vacuum processing block are nearly rectangular, and the width of the cassette block is designed larger than the width of the vacuum processing block, and the plan view of the vacuum processing apparatus is formed in an L-shape or a T-shape.

Description

• This is a divisional application of U.S. Ser. No. 09/956,135, filed Sep.[0001]20,2001, which is copending with U.S. Ser. No. 09/956,136, filed Sep.20,2001, which is copending with U.S. Ser. No. 09/956,140, filed Sep.20,2001, which is copending with U.S. Ser. No. 09/956,137, filed Sep.20,2001, which is copending with U.S. Ser. No. 09/982,957, filed Oct. 22, 2001, now U.S. Pat. No. 6,705,828, which is copending with U.S. Ser. No. 10/085,008, filed Mar. 1, 2002, now abandoned, which is copending with U.S. Ser. No. 10/084,934, filed Mar. 1, 2002, now abandoned, which is copending with U.S. Ser. No. 10/085,007, filed Mar. 1, 2002, now abandoned, which is copending with U.S. Ser. No. 10/689,035, filed Oct. 21, 2003, which is a divisional application of U.S. Ser. No. 09/769,507, filed Jan. 26, 2001, now U.S. Pat. No. 6,526,330, which is a now U.S. Pat. No. 6,430,469, which is a divisional application of U.S. Ser. No. 09/704,614, filed Nov. 3, 2000, now U.S. Pat. No. 6,672,819, which is a divisional application of U.S. Ser. No. 09/487,499, filed Jan. 19, 2000, now U.S. Pat. No. 6,519,504, which is a divisional of U.S. Ser. No. 09/182,218, filed Oct. 30, 1998, now U.S. Pat. No. 6,253,117, which is a divisional application of U.S. Ser. No. 09/158,521, filed Sep. 22, 1998, now abandoned, which is a divisional application of U.S. Ser. No. 09/151,795, filed Sep. 22, 1998, now U.S. Pat. No. 6,188,935, which is a divisional application of U.S. Ser. No. 08/677,682, filed Jul. 8, 1996, now U.S. Pat. No. 5,855,726.
BACKGROUND OF THE INVENTION
• The present invention relates to a vacuum processing apparatus; and more particularly, the invention relates to a vacuum processing apparatus which is suitable for performing treatment, such as etching, chemical vapor deposition (CVD), spattering, ashing, rinsing or the like, on a sample of a semiconductor substrate, such as a Si substrate, and to a semiconductor manufacturing line for manufacturing semiconductor devices using the vacuum processing apparatus.[0002]
• Basically, a vacuum processing apparatus is composed of a cassette block and a vacuum processing block. The cassette block has a front facing the bay path of the semiconductor manufacturing line and extending toward the longitudinal direction of the semiconductor manufacturing line, an alignment unit for aligning the orientation of a cassette for a sample or the orientation of a sample, and a robot operating under an atmospheric pressure environment. The vacuum block has a load lock chamber in the loading side, a load lock chamber in the unloading side, a processing chamber, a post treating chamber, a vacuum pump and a robot operating under a vacuum environment.[0003]
• In the vacuum processing apparatus, a sample extracted from the cassette in the cassette block is transferred to the load lock chamber of the vacuum processing block by the atmospheric transfer robot. The sample is further transferred to the processing chamber from the load lock chamber by the atmospheric transfer robot and is set on an electrode structure body to be subjected to processing, such as plasma treatment. Then, the sample is transferred to the post treating chamber to be processed, if necessary. The sample having been processed is transferred to the cassette in the cassette block by the vacuum transfer robot and the atmospheric transfer robot.[0004]
• Vacuum processing apparatuses for performing plasma etching on a sample are disclosed, for example, in Japanese Patent Publication No. 61-8153, Japanese Patent Application Laid-open No. 63-133532, Japanese Patent Publication No. 6-30369, Japanese Patent Application Laid-Open No. 6-314729, Japanese Patent Application Laid-Open No. 6-314730, and U.S. Pat. No. 5,314,509.[0005]
• In the above-referenced conventional vacuum processing apparatuses, the processing chambers and the load lock chambers are concentrically arranged or arranged in rectangular shape. For example, in the apparatus disclosed in U.S. Pat. No. 5,314,509, a vacuum transfer robot is arranged near the center of the vacuum processing block with three processing chambers being concentrically arranged around the vacuum transfer robot, and a load lock chamber in the loading side and a load lock chamber in the unload side are provided between the vacuum transfer robot and the cassette block. In these apparatuses, there is a problem in that the required installation area of the whole apparatus is large since the rotating angles of the transfer arms of the atmospheric transfer robot and the vacuum transfer robot are large.[0006]
• On the other hand, the processing chamber in the vacuum processing block and the vacuum pump and other various kinds of piping components of the vacuum processing apparatus require maintenance, such as scheduled and unscheduled inspection or repairing. Therefore, in general, there are provided doors around the vacuum processing block so that inspection and repairing of the load lock chamber, the un-load lock chamber, the processing chamber, the vacuum transfer robot and the various kinds of piping components can be performed by opening the doors.[0007]
• In the conventional vacuum processing apparatus, there is a problem in that the installation area is large even though the sample to be handled has a diameter d smaller than 8 inches (nearly 200 mm) and the outer size of the cassette C[0008]_w, is nearly 250 mm. Further, in the case of handling a large diameter sample having a diameter d above 12 inches (nearly 300 mm), the size of the cassette C_w, becomes nearly 350 mm. Accordingly, the width of the cassette block containing a plurality of cassettes becomes large. If the width of the vacuum processing block is determined based on the width of the cassette block, the whole vacuum processing apparatus requires a large installation area. Considering a cassette block containing four cassettes as an example, the width of the cassette block cannot help but increase at least by nearly 40 cm when the diameter d of a sample increases from 8 inches to 12 inches.
• On the other hand, in a general semiconductor manufacturing line order to process a large amount of samples and employ various kinds of processes, a plurality of vacuum processing apparatuses performing the same processing are gathered in a bay, and transmission of samples between bays is performed automatically or manually. Since such a semiconductor manufacturing line requires a high cleanness, the whole semiconductor manufacturing line is installed in a large clean room. An increase in the size of a vacuum processing apparatus due to an increase in diameter of a sample to be processed results in an increase in the required installation area of the clean room, which further increases the construction cost of the clean room, which by its nature already has a high construction cost. If vacuum processing apparatuses requiring a larger installation area are installed in a clean room having the same area, a reduction in the total number of the vacuum processing apparatuses or a decrease in the spacing between the vacuum processing apparatuses becomes inevitable. A reduction in the total number of the vacuum processing apparatuses in the clean room having the same area decreases the productivity of the semiconductor manufacturing line and increases the manufacturing cost of the semiconductor devices as an inevitable consequence. On the other hand, a decrease in the spacing between the vacuum processing apparatuses decreases the maintainability of the vacuum processing apparatus due to lack of maintenance space for inspection and repair.[0009]
SUMMARY OF THE INVENTION
• An object of the present invention is to provide a vacuum processing apparatus which is capable of coping with larger diameter samples while keeping the manufacturing cost to a minimum.[0010]
• Another object of the present invention is to provide a vacuum processing apparatus which is capable of coping with larger diameter samples and at the same time having a better maintainability.[0011]
• A further object of the present invention is to provide semiconductor manufacturing line which is capable of coping with larger diameter samples while keeping manufacturing cost to a minimum by keeping the necessary number of vacuum processing apparatuses, through more economical use of space and at the same time not decreasing the maintainability.[0012]
• In order to attain the above objects, the present invention provides a vacuum processing apparatus composed of a cassette block and a vacuum processing block, and the cassette block has a cassette table for mounting a cassette containing a sample, and the vacuum processing block has a processing chamber for treating the sample and a vacuum transfer means for transferring the sample. In the vacuum processing apparatus, both of the plan views of the cassette block and the vacuum processing block are nearly rectangular and the relation W[0013]₁-W₂>C_wis satisfied, where W, is the width of the cassette block, W₂is the width of the vacuum processing block, and C_wis the width of one cassette.
• Another characteristic of the present invention is that the width of the cassette block is designed to be larger than the width of the vacuum processing block, and the plan view of the vacuum processing apparatus is formed in an L-shape or a T-shape.[0014]
• A further characteristic of the present invention is that a semiconductor manufacturing line comprising a plurality of bay areas having a plurality of vacuum processing apparatuses composed of a cassette block and a vacuum processing block are arranged in the order of the manufacturing process, and the cassette block has a cassette table for mounting a cassette containing a sample, and the vacuum processing block has a process chamber for performing vacuum processing on the sample and a vacuum transfer means for transferring the sample. In the semiconductor manufacturing line, at least one of the vacuum processing apparatuses is designed so that the cassette block is capable of containing a sample having a diameter not less than 300 mm, and the relation W[0015]₁-W₂2>C_wis satisfied, where W₁is the width of the cassette block, W₂is the width of the vacuum processing block, and C_wis the width of one cassette.
• A still further characteristic of the present invention is that a method of constructing a semiconductor manufacturing line which comprises a plurality of vacuum processing apparatuses composed of a cassette block capable of containing a sample having a diameter not less than 300 mm, and a vacuum processing block for performing vacuum processing on said sample. In the method of constructing a semiconductor manufacturing line, at least one of the vacuum processing apparatuses is designed so that the width of the cassette block is larger than the width of the vacuum processing block; the plane view of the vacuum processing apparatus is formed in an L-shape or a T-shape; and a maintenance space is provided between the L-shaped or the T-shaped vacuum processing apparatuses and the adjacent vacuum processing apparatus.[0016]
• According to the present invention, the plan view shapes of the cassette block and the vacuum processing block are rectangular, and the cassette block and the vacuum processing block are designed so that the relation W[0017]₁>W₂is satisfied, where W₁is the width of the cassette block and W₂is the width of the vacuum processing block. Thereby, the plan view of the whole of the vacuum processing apparatus becomes L-shaped or T-shaped. In a case of arranging many such vacuum processing apparatuses, a sufficient space can be provided between the vacuum processing blocks positioned adjacent to each other, even if the interval between the vacuum processing blocks is made small. For example, when W₁is 1.5 m and W₂is 0.8 m, a maintenance space of 0.7 m can be provided between the vacuum processing apparatuses located adjacent to each other.
• Therefore, in spite of a larger diameter sample, the number of vacuum processing apparatuses installed in a clean room, having the same area as a conventional clean room, does not need to be reduced. Accordingly, the productivity of the semiconductor manufacturing line does not decrease. Thus, it is possible to provide a vacuum processing apparatus which can cope with a larger diameter sample and, at the same time, can suppress any increase in the manufacturing cost, and has better maintainability.[0018]
• Further, by employing the vacuum processing apparatus according to the present invention in a semiconductor manufacturing line, it is possible to provide a semiconductor manufacturing line which can cope with a larger diameter sample while keeping manufacturing cost to a minimum by keeping the necessary number of vacuum processing apparatuses, through more economical use of space and, at the same time, without decreasing the maintainability.[0019]
BRIEF DESCRIPTION OF THE DRAWINGS
• FIG. 1 is a perspective view showing an embodiment of a vacuum processing apparatus in accordance with the present invention.[0020]
• FIG. 2 is a vertical cross-sectional view showing the main portion of the apparatus of FIG.1.[0021]
• FIG. 3 is a section of the vacuum processing apparatus being taken on the plane of the line III-III of FIG. 2.[0022]
• FIG. 4 is a cross-sectional view showing the apparatus being taken on the plane of the line IV-IV of FIG. 2.[0023]
• FIG. 5 is a plan view showing a bay area of a semiconductor manufacturing line having a vacuum processing apparatus in accordance with the present invention.[0024]
• FIG. 6A is a top plan view showing a part of a sample flow in a semiconductor manufacturing line, and FIG. 6B is a detail view of the[0025]area6B in FIG. 6A, in accordance with the present invention.
• FIG. 7 is a diagrammatic view showing the relationship between the size of a vacuum processing block and the size of a cassette block.[0026]
• FIG. 8 is a top plane view for explaining how maintenance of a vacuum block of a vacuum processing apparatus is carried out in accordance with the present invention.[0027]
• FIG. 9 is a plan view showing the construction of an example of a conventional vacuum processing apparatus.[0028]
• FIG. 10 is a plan view showing an example of the relative relationship of various kinds of elements inside a vacuum processing apparatus in accordance with the present invention.[0029]
• FIG. 11 is a plan view showing another embodiment of a vacuum processing apparatus in accordance with the present invention.[0030]
• FIG. 12 is a perspective view showing the vacuum processing apparatus of FIG. 11.[0031]
• FIG. 13 is a plan view showing another embodiment of a vacuum processing apparatus in accordance with the present invention.[0032]
• FIG. 14 is a plan view showing another embodiment of a vacuum processing apparatus in accordance with the present invention.[0033]
• FIG. 15 is a plan view showing another embodiment of a vacuum processing apparatus in accordance with the present invention.[0034]
• FIG. 16 is a plan view showing another arrangement of a bay area in accordance with the present invention.[0035]
• FIG. 17 is a plan view showing another arrangement of a bay area in accordance with the present invention.[0036]
• FIG. 18 is a plan view showing a semiconductor manufacturing line in[0037]1o accordance with the present invention.
• FIG. 19 is a plan view showing a semiconductor manufacturing line in accordance with the present invention.[0038]
• FIG. 20 is a plan view showing a semiconductor manufacturing line in accordance with the present invention.[0039]
• FIG. 21 is a plan view showing another embodiment of a vacuum processing apparatus in accordance with the present invention.[0040]
• FIG. 22 is a plan view showing another embodiment of a vacuum processing apparatus in accordance with the present invention.[0041]
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
• An embodiment of a vacuum processing apparatus in accordance with the present invention will be described in detail below, referring to FIG. 1 to FIG. 4. As shown in FIG. 1, each of a pair of[0042]vacuum processing apparatuses100 is composed of a rectangular block shapedcassette block1 and a rectangular block shapedvacuum processing block2. Each of the plan shapes of thecassette block1 and thevacuum processing block2 is rectangular, and the whole plan shape formed by both is L-shaped. Thecassette block1 faces a bay path of a semiconductor manufacturing line and extends in the lateral direction of the bay path, and in the front side of the cassette block there are a cassette table16 for receiving and transferring acassette12 containing a sample from and to the bay path and anoperation panel14. Thevacuum processing block2 installed in the back side of thecassette block1 extends in the direction perpendicular to thecassette block1 and contains various kinds of devices for performing vacuum processing, as well as a transfer device.
• As shown in FIG. 2 to FIG. 4, in the[0043]cassette block1 there are provided anatmospheric robot9 for transferring a sample andcassettes12 for holding a sample. The sample cassettes12 areproduct sample cassettes12A,12B,12C and adummy sample cassette12D. An orientation adjuster for the sample may be provided near thecassettes12, if necessary. Acassette12 contains only product samples or product and dummy samples. Samples for checking for a foreign substance and/or for cleaning are contained in the uppermost stage and/or the lowermost stage of the cassette.
• In the[0044]vacuum processing block2, there are provided a load sideload lock chamber4, an unload sideload lock chamber5, aprocessing chamber6, apost treating chamber7, avacuum pump8 and avacuum transfer robot10. Thereference character13 denotes a discharging means for etching, and thereference character14 denotes a discharging means for post treatment (ashing).
• The[0045]atmospheric transfer robot9 is movably installed on arail92 placed parallel to the cassette table16 inside thecassette block1 and operates to transfer asample3 from acassette12 to theload lock chamber4 on the load side and from theload lock chamber5 on the unload side. The vacuum transfer robot transfers thesample3 from theload lock4 on the load side to theprocessing chamber6 and also transfers thesample3 to and from theprocessing chamber6, theload lock chamber5 on the unload side and thepost treating chamber7. The present invention is based on handling of a larger diameter sample having a diameter d above12 inches (nearly 300 mm). When the diameter of the sample is 12 inches, the outer size C_wof the cassette is nearly 350 mm to 360 mm.
• The[0046]processing chamber6 processes thesamples3 one-by-one, and is, for example, a chamber for performing plasma etching disposed in the upper left of thevacuum processing block2. Theload lock chamber4 on the load side and theload lock chamber5 on the unload side are located on the opposite side of thevacuum transfer robot10 from theprocessing chamber6, that is, they both are placed in the lower position of thevacuum processing block2. Thepost treating chamber7 is a chamber for post treating processedsamples3 one-by-one, and located in the middle position of thevacuum processing block2 facing theload lock chamber5 on the unload side.
• The[0047]atmospheric transfer robot9 has anextensible arm91 which is so designed that the locus of the extensible arm extending and contracting while the robot is moving on therail92 includes a locus containing acassette12 in theload lock chamber4 on the load side and theload lock chamber5 on the unload side. Thevacuum transfer robot10 has anextensible arm101 which is so designed that the rotating locus of the extensible arm includes a locus containing theload lock chamber4 on the load side and theprocessing chamber6 in thevacuum processing block2. Therefore, theextensible arm101 of thevacuum transfer robot10 is so installed that the rotating locus contains theprocessing chamber6, theload lock chamber5 on the unload side and thepost treating chamber7. The installed position of theatmospheric transfer robot9 may be in the right side position on thecassette block1.
• A wafer search mechanism is provided around each of the[0048]cassettes12 to recognize the samples in each of the cassettes when acassette12 is set. In theload lock chambers4,5 and theprocessing chamber6 and thepost treating chamber7, there are providedsample lifting mechanisms14A,14B, respectively, so that asample3 can be transferred to theextensible arm91 or101 of each of the robots. Further, in theprocessing chamber6, there are provided an electrode of an etching discharge means13 and a sample mounting table14C. Inside the etching discharge means13, there is provided a sample lifting mechanism14B. The reference character is a ring-shaped gate valve.
• An operation for processing a sample inside the[0049]processing chamber100 will be described below, taking plasma etching as an example. Initially, theatmospheric transfer robot9 in thecassette block1 is moved on therail92 to approach, for example, thecassette12A on the load side, and a fork (not shown) is inserted under asample3 inside the cassette by extending theextensible arm91 toward thecassette12A to mount thesample3 on the fork. After that, thearm91 of theatmospheric transfer robot9 is moved to theload lock chamber4 while the cover of theload lock chamber4 is kept open to transfer thesample3 therein. At this time, theatmospheric transfer robot9 is moved on therail92 in such a manner that the stroke of theextensible arm91 may easily reach theload lock chamber4, if necessary.
• Then, the[0050]sample lifting mechanism14A is operated to support thesample3 on a support member thereof in theload lock chamber4. Further, after evacuating theload lock chamber4 to a vacuum, the support member is lowered by operating thesample lifting mechanism14A again to transfer the sample to thearm101 of thevacuum transfer robot10 and transfer the sample along a transfer path into theprocessing chamber6 in the vacuum environment. By a reverse operation, the sample is transferred to a cassette position on the unload side in thecassette block1.
• In a case requiring post treatment, the sample is transferred to the[0051]post treating chamber7 using thearm101 of the vacuum transfer robot. In thepost treating chamber7, a sample having been subjected to etching processing is subjected to plasma post treatment, such as ashing.
• In FIG. 3, the locus of the[0052]arm101 of the vacuum transfer robot is as follows, taking a case wheresamples3 are in theload lock chamber4, theprocessing chamber6 and thepost treating chamber7 and no sample is in theload lock chamber5. Thearm101 of thevacuum transfer robot10 initially transfers the onesample3 in thepost treating chamber7 to theload lock chamber5, and then thesample3 in theprocessing chamber6 is transferred to thepost treating chamber7. Next, thesample3 in theload lock chamber4 is transferred to thevacuum chamber6. After treatment, thesample3 in the treatingchamber6 is transferred to thepost treating chamber7. Thearm101 repeats a trace of the same locus.
• Since the vacuum transfer robot is placed near the side of the[0053]vacuum processing block2, a worker can inspect and repair the vacuum transfer robot with ease, and accordingly maintenance can be easily performed.
• FIG. 5 is a plan view showing an embodiment of a[0054]bay area200 of a semiconductor manufacturing line made up of a plurality ofvacuum processing apparatuses100 in accordance with the present invention. In the figure, many L-shapedvacuum processing apparatuses100 are arranged in spaced relationship with a gap G1 within amaintenance space203, and apartition120 divides the room into a highclean level room201A and lowclean level rooms201B. Anautomatic transfer machine202 for supplying and transferringsamples3 is installed along the front surface of the cassette blocks1 down the center of the highclean level room201A. On the other hand, many vacuum processing blocks2 are arranged in the lowclean level room201B, and the interval G2 between them represents a maintenance space to be described later.
• FIG. 6A is a view showing a part of the flow of a[0055]sample3 in an embodiment of a semiconductor manufacturing line in accordance with the present invention. At the entrance portion of each of thebay areas200, there are provided aninspection apparatus206 and abay stoker208. The back portion of each of thebay areas200 communicates with amaintenance path210, and there is provided an air shower212 in the entrance of themaintenance path210. Thesample3 supplied to thebay stoker208 from the outside is successively transferred to an in-bayautomatic transfer machine202 in acertain bay area200 corresponding to the manufacturing process using a lineautomatic transfer machine204, as shown by arrows. Further, thesample3 is transferred from the in-bayautomatic transfer machine202 to the cassette block of thevacuum processing apparatus100. In thevacuum processing apparatus100, as seen in FIG. 6B, thesample3 is transferred between thecassette block1 and thevacuum processing block2 by theatmospheric transfer robot9 and thevacuum transfer robot10. Thesample3 having been processed in thevacuum processing block2 is transferred to the in-bayautomatic transfer machine202, and further is transferred to the lineautomatic transfer machine204, and then is transferred to thenext bay area200.
• In a semiconductor manufacturing line having an in-bay automatic transfer machine, the in-bay[0056]automatic transfer machine202 supplies a new sample (unprocessed wafer) to thecassette block1 in each of thevacuum processing apparatuses100 from thebay stoker208 provided in each of thebays200, and recovers a cassette containing a processed sample from thecassette block1.
• In response to a demand signal output from each of the[0057]vacuum processing apparatuses100, the in-bayautomatic transfer machine202 receives a cassette containing a new sample (unprocessed wafer) from thebay stoker208 provided in each of thebays200, and runs up to and stops at a cassette position where thecassette block1 of the vacuum processing apparatus outputs the demand signal.
• As a cassette handling robot installed in the in-bay[0058]automatic transfer machine202, a robot having a three-axis control function including a rotating operation (θ-axis), vertical movement (Z-axis) and grip operation (φ-axis), or a four-axis control function including a rotating operation (θ-axis), vertical movement (Z-axis), grip operation (φ-axis) and back-and-forth movement (Y-axis) is used.
• In a case where a processed[0059]cassette12 has existed at designated position in thecassette block1, according to the required content output from each of thevacuum processing apparatuses100, the cassette handling robot recovers thecassette12 from thecassette block1 and transfers it to an empty cassette store on the in-bayautomatic transfer machine202, and then supplies anew cassette12 transferred from thebay stoker208 to the empty position left by the recovering operation.
• After completion of this operation, the in-bay automatic transfer machine transfers the recovered[0060]cassette12 to thebay stoker208, and stops its operation and stands by until the next demand signal is output from avacuum processing apparatus100 in thebay200.
• When demand signals are output from plural[0061]vacuum processing apparatuses100,100, . . . in thebay200 within a short time, it depends on the system design whether the in-bay automatic transfer machine transfers samples according to the time sequence of the received signals, or in an order to achieve a higher transfer efficiency from the stand-by position of the in-bayautomatic transfer machine202 taking account of the relationship between the time difference in to demand signals and the positions of signal output apparatuses.
• Cassette management is performed in such a manner that information on a received and sent cassette includes a number specified for each of the cassettes and various kinds of information used in managing the total manufacturing line, and this information is transmitted between the[0062]vacuum processing apparatus100 and the in-bayautomatic transfer machine202 via, for example, an optical communication system.
• The processing flow in the[0063]bay area200 will be described below, taking a sample in each cassette into consideration.
• In the[0064]cassette block1, three to four cassettes are placed side by side on a plane in the same level. In each of the cassettes, a given number of samples, in this case, semiconductor element substrates (wafers) having a diameter of 300 mm (12″) are contained.
• In the two to three[0065]cassettes12 among the three to four cassettes, samples to be subjected to certain vacuum processing in the vacuum processing portion (unprocessed wafers) are contained. In the remaining onecassette12D, dummy wafers are contained.
• The dummy wafer is used for checking for the number of foreign particles in the vacuum processing portion and/or for a cleaning process of the processing chamber composing the vacuum processing zone.[0066]
• Here, the[0067]cassettes12 containing samples before processing will be identified as12A,12B,12C. In such a state, the state of the samples of, for example, thecassette12A is checked by a wafer check means (not shown) in this case, thecassette12A has a function to store samples in a vertical direction one-by-one.
• As the wafer check means used, there is an arrangement where a sensor is successively moved so as to correspond to the position of successive sample containing stages of the[0068]cassette12A, and another arrangement where plural sensors are provided corresponding to respective sample containing stages of thecassette12A. In the latter arrangement, there is no need to provide a means for moving a sensor to sample containing stages of thecassette12A. On the other hand, it may be possible to fix the sensor for the wafer check means and move thecassette12A instead.
• Using the wafer check means, it is determined in which positions in the vertical direction of the[0069]cassette12A the unprocessed samples are contained. For example, in a case where the wafer check means is the type in which a sensor is successively moved so as to correspond to the position of successive sample containing stages of thecassette12A, the sensor detects a sample containing stage of thecassette12A and the presence or absence of a unprocessed sample in the stage while the sensor is moving, for example, upward from the lower position of thecassette12A, or downward from the upper position of thecassette12A.
• The check results are output from the wafer check means to be input to and stored in, for example, a host computer (not shown in the figure) of the semiconductor manufacturing line controller for managing all of the vacuum processing apparatuses. Otherwise, the check results may be input to and stored in a personal computer in a console box on the cassette mounting table or a host computer for controlling the apparatuses through the personal computer.[0070]
• Then, in this embodiment, the[0071]atmospheric transfer robot9 is started to operate. By operation of theatmospheric transfer robot9, one of the unprocessed samples in thecassette12A is extracted out of thecassette12A.
• The[0072]atmospheric transfer robot9 has a scooping-up device for scooping up and holding the surface of a sample opposite (reverse) to the surface to be processed. The scooping-up devices used are a device which adheres to and holds the reverse side surface of the sample, a device having grooves or indented portions for holding the sample, and a device mechanically gripping the peripheral portion of the sample. Further, as for a device adhering to and holding the reverse side surface of the sample, there are devices operating with the use of vacuum sucking adhesion and electrostatic attraction.
• In a case of using for device adhering to and holding the reverse side surface of the sample having a diameter of 300 mm (12″), it is important to select the arrangement and the dimension of the adhering portion so as to minimize bending of the sample as much as possible. For example, the interval between the adhering portions is set to d/3 to d/2 taking the center of the[0073]sample3 as the center, where d is the diameter of thesample3.
• Depending on the amount of bending and the type of bending of the sample, displacement of the sample occurs when the sample is transferred between the scooping-up device and another transfer means, which sometimes causes an undesirable displacement of the orientation of the sample.[0074]
• Further, in a case or using a device for adhering to and holding the reverse side surface of the sample, the adhering force is required to have a sufficient strength that the sample is not detached by the inertia force acting on the sample when the sample is being transferred, including the high forces encountered during starting and stopping. If this condition is not satisfied, the sample may fall from the scooping-up device or a displacement of the orientation of the sample is likely to occur.[0075]
• The scooping-up device is inserted in a position corresponding to the reverse surface of an unprocessed sample required to be extracted in the[0076]cassette12A. In a state there the scooping-up device is inserted, thecassette12A is lowered by a given amount or the scooping-up device is lifted by a given amount. By lowering thecassette12A or lifting the scooping-up device, the unprocessed sample is transferred to the scooping-up device while the sample is kept in a scooped state. The scooping-up device then extracts the sample out of thecassette12A. Thus, one of the unprocessed samples in thecassette12A is extracted out of thecassette12A.
• As described above, for example, the host computer instructs and controls the[0077]atmospheric transfer robot9 as to which unprocessed sample in thecassette12A is to be extracted.
• The information from which stage in the[0078]cassette12A the unprocessed sample is extracted is successively stored in the host computer for every15 extraction of a sample.
• The[0079]atmospheric transfer robot9, having one unprocessed sample in the scooping-up device, is moved to and stopped at a position where the sample can be loaded into theload lock chamber4.
• The[0080]load lock chamber4 is isolated from a vacuum environment of thevacuum processing portion2 and is in an atmospheric pressure state. The unprocessed sample held by the scooping-up device of theatmospheric transfer robot9 is loaded into theload lock chamber4 in such a state so as to be transferred to theload lock chamber4 from the scooping-up device.
• The[0081]atmospheric transfer robot9 having transferred the unprocessed sample into theload lock chamber4 is returned to a predetermined position for standing by until the next operation.
• The operation described above is instructed and controlled by, for example, the host computer.[0082]
• The information as to which stage in the[0083]cassette12A an unprocessed sample loaded in theload lock chamber4 is extracted from is successively stored in the host computer for every extraction of a sample.
• The[0084]load lock chamber4 having received an unprocessed sample is isolated from atmosphere and evacuated to vacuum. Then, the isolation from the processing chamber is released and theload lock chamber4 is communicated with the processing chamber so as to be capable of transferring the unprocessed sample. Then, a predetermined vacuum processing is performed in the vacuum processing zone.
• The sample having been subjected to vacuum processing (sample after processed) is transferred from the vacuum processing zone to the unload[0085]lock chamber5 by a vacuum transfer robot so as to be loaded into the unloadlock chamber5.
• The vacuum transfer robot has a scooping-up device similar to that in the[0086]atmospheric transfer robot9. As the scooping-up device, scooping devices similar to those of theatmospheric transfer robot9 may be used, except for the device having a function of vacuum adhesion.
• After loading the processed sample, the unload[0087]lock chamber5 is isolated from thevacuum processing portion2 and the pressure inside the unloadlock chamber5 is adjusted to atmospheric pressure.
• The unload[0088]lock chamber5 in which the inner pressure becomes atmospheric pressure is opened to atmosphere. Under such a state, the scooping-up device of theatmospheric transfer robot9 is inserted into the unload lock-chamber5, and the processed sample is transferred to the scooping-up device.
• The scooping-up device having received the processed sample transfers the sample out of the unload[0089]lock chamber5. After that, the unloadlock chamber5 is isolated from atmosphere and evacuated to a vacuum so as to be prepared for loading of the next processed sample.
• On the other hand, the[0090]atmospheric transfer robot9 having the processed sample in the scooping-up device is moved to and stopped at a10 position where the processed sample can be returned to thecassette12A.
• Then, the scooping-up device having the processed sample is inserted into the[0091]cassette12A. The host computer controls the inserting position so that the processed sample is returned to the position where the processed sample had been originally located.
• After inserting the scooping-up device having the processed sample, the[0092]cassette12A is lifted or the scooping-up device is lowered.
• By doing so, the processed sample is returned to and contained in the position where the processed sample had been originally located.[0093]
• Such an operation is similarly performed for the remaining unprocessed samples in the[0094]cassette12A and also for the unprocessed samples in thecassettes12B,12C.
• That is, an unprocessed sample successively extracted from each of the cassettes one by one is, for example, numbered. The host computer, for example, stores information indicating that an unprocessed sample extracted from which stage in which cassette has what number.[0095]
• Based on the information, movement of a sample, extraction of the sample from a cassette, vacuum processing of the sample and returning the sample to the cassette after vacuum processing, is managed and controlled.[0096]
• In other words, the movement of a sample from the time it is extracted to the time it is returned to the original cassette, is performed according to the following steps in the following order.[0097]
• (1) checking the sample position in a cassette.[0098]
• (2) extracting of a sample in the cassette using an atmospheric transfer robot.[0099]
• (3) loading the sample into a load lock chamber using an atmospheric transfer robot.[0100]
• (4) transferring the sample from load lock chamber to a vacuum processing zone using a vacuum transfer robot.[0101]
• (5) performing vacuum processing in the vacuum processing zone.[0102]
• (6) transferring the sample from the vacuum processing zone to an unload lock chamber using the vacuum transfer robot.[0103]
• (7) unloading the sample from the unload lock chamber using the atmospheric transfer robot.[0104]
• (8) returning the sample into the original position in the cassette using the atmospheric transfer robot.[0105]
• In every movement of the sample from steps (1) to (8) as described above, the host computer successively updates the information on what designated number sample each of the stations has. The updating processing is performed for every one of the samples. By doing so, each of the samples is managed, that is, it is known what designated number sample exists in which station.[0106]
• For example, the successive updating state process by the host computer may be successively displayed on a vacuum processing system control CRT screen. In this case, each of the stations and what designated number sample exists at present at each station are displayed, so this information is easily recognized by an operator.[0107]
• In a case where orientation adjustment of an unprocessed sample is performed, this step is performed between the above steps (2) and (3).[0108]
• Such management and control for movement of samples may be performed in a case where the[0109]vacuum processing portion2 has a plurality of vacuum processing zones.
• Assuming that the[0110]vacuum processing portion2 has, for example, two vacuum processing zones. In this case, the sample is processed in series or processed in parallel depending on the processing information. Here, series processing refers to a sample being vacuum processed in one vacuum processing zone and the processed sample being successively vacuum-processed in the remaining vacuum processing zone. On the other hand, parallel processing refers to a sample being vacuum-processed in one vacuum processing zone and another sample being vacuum-processed in the remaining vacuum processing zone.
• In a case of series processing, a sample numbered by the host computer is processed according to a determined order and the processed sample is returned to the original position in the cassette.[0111]
• In a case of parallel processing, since the host computer manages and controls in what vacuum processing zone and how a numbered sample is processed, the processed sample is returned to the original position in the cassette.[0112]
• In a case of parallel processing, the host computer may manage and control which vacuum processing zone is used depending on which stage in the cassette the sample is extracted from and what designated number the sample has.[0113]
• In a case where series processing and parallel processing are mixed, since the host computer manages and controls in what vacuum processing zone and how a numbered sample is processed, the processed sample is returned to the original position in the cassette.[0114]
• Examples of the plural vacuum processing zones are a combination of zones having the same plasma generating method, a combination of different plasma etching zones, a combination of a plasma etching zone and a post-processing zone such as ashing, a combination of an etching zone and a film forming zone and so on.[0115]
• The dummy sample in a cassette is handled in the same manner as for an unprocessed sample except for performing vacuum processing, which is performed on the unprocessed sample.[0116]
• A detecting means for detecting presence or absence of a sample is provided in each cassette, in the scooping-up device of the atmospheric transfer robot, in the orientation adjusting station, in the station in the load lock chamber, in the scooping-up device of the vacuum transfer robot, in the station in the vacuum processing zone, and in the station in the unload lock chamber.[0117]
• A contact type or a non-contact type sensor is properly selected to be used as the sample detecting means.[0118]
• The cassette, the scooping-up device and each of the stations become checking points for the movement of the sample.[0119]
• In such a construction, for example, when the presence of a sample is detected in the scooping-up device of the[0120]vacuum transfer robot10 and the presence of a sample is not detected in the station in the vacuum processing zone, this means that a problem has occurred in the sample transfer machine between the scooping-up device of the vacuum transfer robot and the station in the vacuum processing zone due to some cause, and so recovering from the trouble can be properly and speedily preformed. Therefore, it is possible to prevent the through-put of the whole system from being degraded.
• In a construction where the sample detecting means is not provided in each of the scooping-up devices of the[0121]transfer robots9, for example, when the presence of a sample is detected in the station in the load lock chamber and the presence of a sample is not detected in the station in the vacuum processing zone, this means that a problem has occurred in the sample transfer machine between the station in the load lock chamber and the scooping-up device of the vacuum transfer robot, or in the vacuum transfer robot, or in the sample transfer machine between the scooping-up device of the vacuum transfer robot and the station in the vacuum processing zone due to some cause, and so recovering from the trouble can be properly and speedily preformed. Therefore, it is possible to prevent the through-put of the whole system from being degraded.
• Such an embodiment has the following usefulness.[0122]
• (1) Since the stage in the cassette in which an unprocessed sample is contained is checked and movement of the checked unprocessed sample is successively monitored and controlled by numbering the unprocessed sample, the processed sample can be certainly returned to the original position of the cassette.[0123]
• (2) Since the stage in the cassette in which an unprocessed sample is contained is checked and movement of the checked unprocessed sample is successively monitored and controlled by numbering the unprocessed sample even in a case of series processing, parallel processing or a combination thereof, the processed sample can be certainly returned to the original position of the cassette.[0124]
• (3) Since the stage in the cassette in which an unprocessed sample is contained is checked and movement of the checked unprocessed sample is successively monitored and controlled by numbering the unprocessed sample, the processing state of the samples processed in the vacuum processing portion one by one can be properly checked and managed in detail.[0125]
• For example, in a case where a defect occurs in the processing of a sample, since a processing state for each of the samples including the processing condition is managed, the processing state can be identified by the information as to which stage in what cassette the defective sample is contained in. Therefore, the cause of the defect can be known in a short time and accordingly the time required for a countermeasure can be shortened by the time served in identification of the processing state.[0126]
• Although the description in the above embodiment is based on a sample having a diameter of 300 mm (12″), the usefulness of the invention is not limited to the diameter of the sample.[0127]
• The maintenance of the equipment will be described below.[0128]
• As for maintenance of the[0129]vacuum processing apparatus100 in accordance with the present invention, most of the maintenance of thecassette block1 can be performed from the front side of the cassette block since thecassette block1 faces the line of the in-bayautomatic transfer machine202.
• On the other hand, for maintenance of the[0130]vacuum processing block2, an operator is required to enter the area of thevacuum processing block21o from the back side of each bay area through themaintenance path203 or through themaintenance path210.
• FIG. 7 is a view showing the relationship between the size of the[0131]vacuum processing block2 and the size of thecassette block1. When the longer side (width) of thevacuum processing block2 is designated as W1 and the shorter side is designated as B1, and the longer side (width) of thecassette block1 is designated as W2 and the shorter side is designated by B₂, the relations W1>B₁, W2>B₂are satisfied. It is preferable for the relation W₁-W2≈d to be satisfied, where d is the diameter of the sample.
• When the gap between the cassette blocks of the vacuum processing apparatuses adjacent to each other is designated as G[0132]1 and the gap between the vacuum processing blocks adjacent to each other is designated as G2 (referring to FIG. 5), it is assumed that the relation G1<G2 is satisfied. The maintenance space between thevacuum processing apparatuses100 adjacent to each other can be expressed by (W1+G1)−W2=MS. MS is a dimension required for maintenance work of an operator. In this case, it is preferable for the relation (W1+G1)−W2≈d to be satisfied. Although themaintenance space203 is an entrance for the operator, there are some cases where the space is not provided depending on the layout of thebay area200. Even in such a case, an installation clearance G1 between the vacuum processing apparatuses adjacent to each other is required at a minimum, but the installation clearance practically becomes a value near zero. In this case, W1−W2=MS becomes the maintenance space.
• The side face of the[0133]vacuum processing block2 of thevacuum processing apparatus100 in accordance with the present invention is of the opening type door structure. That is, two pairs of hingeddoors214,216 are provided in the side face and the back face of thevacuum processing block2. In order to perform maintenance, it is required that (1) there are spaces from which an operator can check the devices and the pipes from back and front sides, (2) there are spaces to which the various kinds of devices and pipes, for example, the main chamber can be drawn, and (3) there are spaces in which the doors can be opened. Therefore, the maintenance space MS is preferably 90 to 120 cm.
• According to the[0134]vacuum processing apparatus100 in accordance with the present invention, an operator can easily access to the side face and the back face of thevacuum processing block2. Further, by opening thedoors214, theload lock chamber5, thepost treating chamber7, thevacuum transfer robot10 and the various kinds of pipes and devices can be inspected and repaired. Furthermore, by opening thedoors216, theprocessing chamber6 and the vacuum pump and the various kinds of pipes and devices can be inspected and repaired.
• Since there is the maintenance space MS between the vacuum processing blocks[0135]2, there is no obstacle to the operator opening thedoors214 in the side to perform maintenance work. Further, there is provided enough space in the back face side of thevacuum processing block2 to open thedoors216 and perform maintenance work.
• The plan shape of the[0136]vacuum processing apparatus100 is L-shaped, as described before. On the other hand, in theconventional vacuum10processing apparatus800, the vacuum processing block and the cassette block are generally constructed together to form a rectangular shape on the whole, as shown in FIG. 9. The rectangular shape is selected based on the shape of various kinds of elements installed in the vacuum processing apparatus and the mutual operational relationship among the various kinds of elements. In the general conventional vacuum processing apparatus, when the gap between the cassette blocks adjacent to each other is designated as G1 and the gap between the vacuum processing blocks adjacent to each other is designated as by G2, there is the relation G1≧G2.
• Since the conventional[0137]vacuum processing apparatus800 deals with samples having a diameter d not larger than 8 inches, such a construction described above can be used. However, in an apparatus dealing with a sample having a diameter d as large as 12 inches, the outer dimension of thecassette12 becomes larger and consequently the width W1 of the cassette block containing a plurality of thecassettes12 becomes larger. Since the width (W2≈W1) of the vacuum processing block is determined corresponding to the width W1, the whole of thevacuum processing apparatus800 requires a larger space. Further, as the widths W1, W2 of the cassette block and the vacuum processing block become larger, thedoors214,216 must be made larger and a large maintenance space is required in order to provide a space for thedoors214,216 to be opened. For example, if a 12-inch sample is dealt with in the conventional apparatus, W1=W2=150 cm, G1=G2=90 cm and the maintenance space between thevacuum processing apparatuses100 adjacent to each other becomes MS=90 cm. This results in an increase in the effective occupying area of thevacuum processing apparatus800 in each of the bay areas. This is not preferable.
• An example of the mutual relationship of the various kinds of elements in the vacuum processing apparatus in accordance with the present invention will be described, referring to FIG. 10. As shown in the figure, the[0138]rotational center01 of the arm of thevacuum transfer robot10 is arranged on the right hand side or the left hand side of the line L-L connecting the middle position of theload lock chamber4 and the unloadlock chamber5 and the center of theprocessing chamber6, that is, therotational center01 is shifted toward the side of the vacuum processing portion. Thepost treating chamber7 is arranged on the opposite side of the line L-L. Therefore, the rotating range of the arm of the vacuum transfer robot is narrow, and the whole plan shape of thevacuum processing apparatus100 can be made L-shaped by arranging thevacuum transfer robot10 near the side of the vacuum processing portion. By such a construction, the rotation range of the arm of thevacuum transfer robot10 becomes nearly one-half of one round circle. By limiting the rotating range of the arm of thevacuum robot10 for transfer of a wafer to within nearly a semi-circle, onesample3 can be transferred to theload lock chamber4, the unloadlock chamber5, theprocessing chamber6 and thepost treating chamber7 with nearly a semi-circular movement of the arm. As described above, since the rotating range of the arm of the vacuum transfer robot is designed to be within nearly a semi-circle, the width W2 of thevacuum processing block2 can be made narrow.
• As described above, the[0139]vacuum processing apparatus100 in accordance with the present invention makes available the aforementioned maintenance space by making the width W2 of thevacuum processing block2 as small as possible by taking into consideration the shape of the various kinds of elements arranged in the vacuum processing apparatus and the mutual relationship of the various elements, while providing the width W1 of thecassette block1 to cope with a large diameter sample. By doing so, the effective occupied area of thevacuum processing apparatus100 can be increased.
• Since there is the maintenance space MS between the vacuum processing blocks[0140]2, there is no obstacle to the operator opening thedoors214 in the side to perform maintenance work. Further, there is provided enough space in the back side of thevacuum processing block2 to open thedoors216 and perform maintenance work.
• In the[0141]vacuum processing apparatus100 in accordance with the present invention, the positional relationship between thevacuum processing block2 and thecassette block1 can be changed along the lateral direction of the cassette block. For example, as shown in FIG. 11 and FIG. 12, thevacuum processing block2 and thecassette block1 are arranged so that the center line of thevacuum processing block2 passes through the center of thecassette block1 in the lateral direction, in other words, thevacuum processing block2 and the cassette block I may be arranged so as to form a T-shape as seen in a top plan view. In the T-shape arrangement, since there is a maintenance space MS between the vacuum processing blocks2, there is no obstacle to the operator opening thedoors214 in the side to perform maintenance work.
• The plan view shape of the[0142]cassette block1 and thevacuum processing block2 in accordance with the present invention need be not strictly rectangular, that is, it may be nearly rectangular so long as the relation (W1+G1)−W2=MS can be practically maintained. The structural elements contained in thecassette block1 and thevacuum processing block2 and the arrangement of the structural elements may be different from those in the aforementioned embodiments. For example, in the embodiment shown in FIG. 13, theatmospheric transfer robot9 of thecassette block1 is placed between theload lock chamber4 and the unloadlock chamber5 of the vacuum processing block. In this case, the plan view shape of thecassette block1 is strictly a projecting shape and the plan view shape of thevacuum processing block2 is strictly a recessed shape, and the whole of thevacuum processing apparatus100 is a combination of two blocks of nearly rectangular shape forming a T-shape. In this embodiment, the locus of theextensible arm91 can be constructed so as to trace the locus containing thecassette12 and theload lock chamber4 on the load side and theload lock chamber5 on the unloadside5 without moving theatmospheric transfer robot9 on the rail by placing theatmospheric transfer robot9 of thecassette block1 between theload lock chamber4 and the unloadlock chamber5 of the vacuum processing block and movably arranging thecassette12 on therail94. In this embodiment, the aforementioned maintenance space MS between the vacuum processing blocks2 can be provided.
• FIG. 14 shows another embodiment of a[0143]vacuum processing apparatus100 in accordance with the present invention. The vacuum processing apparatus has a cassette mounting table130 and aconsole box132 for1o evaluating and inspecting a sample in addition to acassette block1, anatmospheric transfer robot9 and asample cassette12.
• FIG. 15 shows a further embodiment of a[0144]vacuum processing apparatus100 in accordance with the present invention. The vacuum processing apparatus is a T-shaped vacuum processing apparatus having acassette block1, anatmospheric transfer robot9 and asample orientation adjuster11.
• FIG. 16 is a plan view showing another embodiment of a[0145]bay area200 in accordance with the present invention. A pair of L-shapedvacuum processing apparatuses100A,100B are arranged opposite to each other to form a set, and a console table130 with aconsole box132 is placed between the sets. There is not the aforementioned gap G1, but (W1+W3)−W2=MS becomes the maintenance space when the width of theconsole box130 is W3. Since there is no gap G1, an operator needs to enter thezone201B in which thevacuum processing block2 is located from the back of thebay area200 through themaintenance path210 in order to perform maintenance on thevacuum processing block2. If it is required to reduce the access time, a gap G1 may be provided between the console table130 and the neighboringcassette block1. In this case, (W1+W3+G1)−W2=MS becomes the maintenance space.
• FIG.[0146]17 is a plan view showing a bay area having another arrangement of vacuum processing apparatuses in accordance with the present invention. In thevacuum processing apparatus100 in this embodiment, cassette tables16A for plural cassette blocks1 are formed in a continuous one-piece structure, and a plurality ofatmospheric transfer robots9 run on acommon rail95 on the continuous cassette table. An in-bay automatic transfer machine is placed between the bar stoker and theatmospheric transfer robot9 to transfer a sample between the vacuum processing blocks2. In this case, acassette block1 functionally corresponds to each of the vacuum processing blocks2 in one by one relationship, and it can be thought that a plurality of nearly rectangular blocks corresponding to the respective vacuum processing blocks2 are connected together.
• FIG. 18 is a plan view showing the construction of an embodiment of a manufacturing line in accordance with the present invention. It can be understood from FIG. 18 that the[0147]vacuum processing apparatus100 in accordance with the present invention is L-shaped or T-shaped in plan view shape and a sufficient maintenance space MS can be maintained between the vacuum processing blocks2 even if a gap is provided between thevacuum processing apparatuses100.
• On the other hand, if a sufficient maintenance space is provided in the conventional rectangular[0148]vacuum processing apparatus800 as shown in FIG.9 for purpose of comparison, the gap between the vacuum processing apparatuses must be increased. As result, the number of vacuum processing apparatuses which can be arranged in the same length of line is only five for the conventional rectangularvacuum processing apparatus800 in comparison to seven for thevacuum processing apparatus100 in accordance with the present invention as shown in the embodiment. A difference of two vacuum processing apparatuses is large when the whole semiconductor manufacturing line is considered, and becomes a large difference in arranging a necessary number of apparatuses in a clean room having a given space and in a saving footprint. As for transferring of sample from a bay area having an automatic transfer machine to a bay area for the next process, when the vacuum processing apparatus in accordance with the present invention is employed, an amount of processing corresponding to seven vacuum processing apparatuses can be performed using one side of the one bay area. Whereas, when the conventional apparatus is employed, an amount of processing corresponding to only five vacuum processing apparatuses can be performed. This difference of two apparatuses results in a large improvement of the through-put in a semiconductor manufacturing line.
• There are some cases where the rectangular[0149]vacuum processing apparatus800 is required to be partially used. Even in such a case, by arranging the L-shaped or T-shapedvacuum processing apparatus100 in accordance with the present invention adjacent to the rectangularvacuum processing apparatus800, a proper maintenance space MS can be maintained between the vacuum processing blocks.
• FIG. 19 is a plan view showing the whole construction of another embodiment of a semiconductor manufacturing line in which the vacuum processing apparatuses in accordance with the present invention are partially employed. This semiconductor manufacturing line has a line[0150]automatic transfer machine204 and is of a line automated type where transferring of a sample between each of thebay areas200A to200N and the lineautomatic transfer machine204 is performed by an operator. In this system, the same effects as in the embodiment of FIG.18 can be attained.
• FIG. 20 is a plan view showing the whole construction of a further embodiment of a semiconductor manufacturing line in which the vacuum processing apparatuses in accordance with the present invention are partially employed. This semiconductor manufacturing line has in-bay[0151]automatic transfer machines202 and a lineautomatic transfer machine4 and is of a fully automated type where the transferring of a sample inside each of the bay areas and between each of thebay areas200A to200N and lineautomatic transfer machine204 is performed without an operator. In this case, by arranging the L-shaped or T-shapedvacuum processing apparatuses100 adjacent to each other or by arranging the L-shaped or T-shapedvacuum processing apparatus100 in accordance with the present invention adjacent to a rectangularvacuum processing apparatus800, a proper maintenance space MS can be maintained between the vacuum processing blocks.
• In the aforementioned embodiments, it has been described that the cassette and the atmospheric transfer robot are placed in an atmospheric environment and the atmospheric transfer robot is operated in an atmospheric environment. However, as shown in FIG. 21 and FIG. 22, it is possible for the[0152]cassette12 to be placed in a vacuum environment and thetransfer robot10 to be operated in only a vacuum environment. FIG. 21 shows an embodiment where twocassettes12 are employed, and FIG. 22 shows an embodiment where threecassettes12 are employed. In both cases, the whole vacuum processing apparatus is of a T-shape.
• In FIG. 21 and FIG. 22, the extraction of a sample in the[0153]cassette12, the transferring of the extracted sample to the vacuum processing zone, the transferring of the sample from the vacuum processing zone and the storing of the sample to the original position in the cassette are performed under a vacuum environment using thevacuum transfer robot10. In these cases, in regard to the vacuum processing system, there is no need for the load lock chamber and the unload lock chamber provided in the aforementioned embodiments, in principle. Therefore, the number of data elements successively updated by the host computer is reduced by the number of the data elements used for the load lock chamber and the unload lock chamber.
• In this case, the state of samples contained in the cassette is performed by a wafer check means under a vacuum environment. Further, in an apparatus having an orientation adjusting means for an unprocessed sample, the orientation adjustment is performed under a vacuum environment.[0154]
• Furthermore, in an apparatus having an intermediate cassette between the cassette and the vacuum processing zone, there are provided a robot for transferring the sample between the cassette and the intermediate cassette and a robot for transferring the sample between the intermediate cassette and the vacuum processing zone.[0155]
• In such a vacuum processing system, since the intermediate cassette is added, the number of data elements successively updated by the host computer is increased by the number of the data elements used for the intermediate cassette and the robot.[0156]
• Still further, in the aforementioned embodiments, the processed surface of a sample faces up and the sample is held horizontal in a state when the sample is contained in the cassette, in a state when the sample is transferred and in a state when the sample is vacuum-processed. However, another position of the sample is no problem.[0157]
• As described above, according to the present invention, it is possible to provide a vacuum processing apparatus which is capable of coping with larger diameter samples and is capable of suppressing an increase in the manufacturing cost, and at the same time has a better maintainability.[0158]
• Further, it is possible to provide a semiconductor manufacturing line which is capable of coping with larger diameter samples and at the same time is capable of suppressing an increase in manufacturing cost by maintaining a necessary installation number of vacuum processing apparatuses and not decreasing the maintainability by employing the vacuum processing apparatuses in accordance with the present invention in the semiconductor manufacturing line.[0159]

Claims (35)

1. A vacuum processing apparatus comprising:

a cassette table for mounting at least one cassette on a plane, each cassette capable of storing at least a dummy sample in the atmosphere;

a load lock chamber for storing said dummy sample and changing-over from the atmosphere to the vacuum condition, or from the vacuum condition to the atmosphere;

a first transferring device having an extensible arm capable of vertical operation and rotatable operation and a scooping device for taking out said dummy sample from any one of a plurality of cassettes, and transferring it to said load lock chamber or transferring it from said load lock chamber to said one cassette;

a transferring chamber for transferring said dummy sample in a vacuum condition;

a plurality of vacuum processing chambers connected to said transferring chamber through a gate valve and into which said dummy sample may be provided one by one in a vacuum condition;

a second transferring device arranged in said transferring chamber, having an extensible arm capable of rotatable operation, for transferring said dummy sample between said load lock chamber and said plurality of vacuum processing chambers;

a first support member arranged in said load lock chamber so as to support said dummy sample one by one;

a second support member arranged in each of said plurality of processing chambers so as to support said dummy sample one by one;

a first sample lifting mechanism capable of moving up or moving down said first supporting member so as to transfer said dummy sample to said second transferring device, and a second sample lifting mechanism arranged at said second support member in each of said processing chambers; and

a controller for controlling

(a) receiving of said dummy sample on said scooping-up device of said first transferring device by inserting said scooping-up device of said first transferring device under a bottom surface of said dummy sample to be taken out of said one cassette and by lifting said scooping-up device,

(b) transferring of said dummy sample received on said scooping-up device of said first transferring device to said first support member by said first transferring device,

(c) transferring of said dummy sample to said second transferring device by operating said first sample lifting mechanism, and

(d) transferring of said dummy sample by said second transferring device to said second support member in any one of said processing chambers and transferring of said dummy sample to said second support member by operating the second sample lifting mechanisms.

2. The vacuum processing apparatus according toclaim 1,

wherein the apparatus comprises a detecting device for detecting a position of said dummy sample and

said controller controls each of said controlling operations (a)-(d) under application of an output from said detecting device.

3. The vacuum processing apparatus according toclaim 1, wherein said load lock chamber comprises a load side load lock chamber for transferring said dummy sample from the atmosphere to the vacuum, and an unload side load lock chamber for transferring said dummy sample from the vacuum to the atmosphere, wherein a plurality of said first support members is provided, and each of said plurality of first support members is arranged in each of said load side load lock chamber and unload side load lock chamber.

4. The vacuum processing apparatus according toclaim 1, wherein said dummy sample is used for checking for a number of foreign particles.

5. The vacuum processing apparatus according toclaim 1, wherein said dummy sample is used for a cleaning process of said processing chamber.

6. The vacuum processing apparatus according toclaim 1, wherein said cassette table enables mounting of a plurality of cassettes on a plane.

7. A method for using a dummy sample with a vacuum processing apparatus, wherein

said vacuum processing apparatus includes a cassette table for mounting, in the atmosphere, a plurality of cassettes, each cassette capable of storing at least a dummy sample; a first transferring device having an extensible arm capable of vertical operation and rotatable operation and a scooping device for taking out said dummy sample from any one of a plurality of cassettes, and transferring it to said load lock chamber or transferring it from said load lock chamber to said one cassette; a load lock chamber having a first support member for storing said dummy sample and changing over from the atmosphere to vacuum condition or from the vacuum condition to the atmosphere; a first sample lifting mechanism provided in said load lock chamber enabling said first support member to be moved up or down for transferring said dummy sample between said first support member supporting said dummy sample one by one and said second transferring device; a transferring chamber for transferring said dummy sample under a vacuum condition; a second transferring device arranged in said transferring chamber; a plurality of processing chambers connected to said transferring chamber through a gate valve and into which said dummy sample may be provided one by one in vacuum; a second support member for supporting said dummy sample one by one and a second sample lifting mechanism arranged at said second support member installed within each of said processing chambers; and a controller,

wherein said method comprises steps of:

(a) receiving said dummy sample on said scooping-up device by inserting said scooping-up device of said first transferring device under a bottom surface of said dummy sample to be taken out of any one of said plurality of said cassettes, and by lifting said scooping device,

(b) transferring said dummy sample received on said scooping-up device of said first transferring device to said first support member by said first transferring device,

(c) transferring said dummy sample to said second transferring device by operating said first sample lifting mechanism, and

(d) transferring said dummy sample to said second support member in any one of said processing chambers by said second transferring device and transferring said dummy sample to said second support member by operating the second sample lifting mechanisms.

8. The method for using a dummy sample with a vacuum processing apparatus according toclaim 7,

wherein the apparatus comprises a detecting device for detecting a position of said dummy sample and

each of said steps (a)-(d) is carried out under application of an output of said detecting device.

9. The method for using a dummy sample with a vacuum processing apparatus according to claims7, said load lock chamber comprises a load side load lock chamber for transferring said dummy sample from the atmosphere to the vacuum, and an unload side load lock chamber for transferring said dummy sample from the vacuum to the atmosphere, wherein a plurality of said first support members is provided, and each of said plurality of first support members is arranged in each of said load side load lock chamber and unload side load lock chamber.

10. The method for using a dummy sample with a vacuum processing apparatus according toclaim 7, further comprising using said dummy sample is used for checking for a number of foreign particles.

11. The method for using a dummy sample with a vacuum processing apparatus according toclaim 7, further comprising using said dummy sample is used for a cleaning process of said processing chamber.

12. A vacuum processing apparatus comprising:

a cassette table for mounting at least one cassette on a plane, each a cassette capable of storing at least a dummy sample in the atmosphere;

a load lock chamber for storing said dummy sample and changing-over from the atmosphere to the vacuum condition, or from the vacuum condition to the atmosphere;

a first transferring device having an extensible arm capable of vertical operation and rotatable operation and a scooping device for taking out said dummy sample from any one of a plurality of cassettes, and transferring it to said load lock chamber or transferring it from said load lock chamber to said one cassette;

a transferring chamber for transferring said dummy sample in a vacuum condition;

a plurality of vacuum processing chambers connected to said transferring chamber through a gate valve and into which said dummy sample may be provided one by one in a vacuum condition;

a second transferring device arranged in said transferring chamber, having an extensible arm capable of rotatable operation, for transferring said dummy sample between said load lock chamber and said plurality of vacuum processing chambers;

a first support member arranged in said load lock chamber so as to support said dummy sample one by one;

a second support member arranged in each of said plurality of processing chambers so as to support said dummy sample one by one;

a first sample lifting mechanism capable of effecting relative vertical movement between said first support member and said second transferring device so as to transfer said dummy sample between said first support member and said second transferring device; and

a second sample lifting mechanism capable of effecting relative vertical movement between said second support member and said second transferring device so as to transfer said dummy sample between said second support member and said second transferring device; and

a controller for controlling

(a) receiving of said dummy sample on said scooping-up device of said first transferring device by inserting said scooping-up device of said first transferring device under a bottom surface of said dummy sample to be taken out of said one cassette and by lifting said scooping-up device,

(b) transferring of said dummy sample received on said scooping-up device of said first transferring device to said first support member by said first transferring device

(c) transferring of said dummy sample to said second transferring device by operating said first sample lifting mechanism, and

(d) transferring of said dummy sample by said second transferring device to said second support member in any one of said processing chambers and transferring of said dummy sample to said second support member by operating the second sample lifting mechanism.

13. A method for p using a dummy sample with a vacuum processing apparatus, wherein

said vacuum processing apparatus includes a cassette table for mounting at least one cassette on a plane, each a cassette capable of storing at least a dummy sample in the atmosphere; a load lock chamber for storing said dummy sample and changing-over from the atmosphere to the vacuum condition, or from the vacuum condition to the atmosphere; a first transferring device having an extensible arm capable of vertical operation and rotatable operation and a scooping device for taking out said dummy sample from any one of a plurality of cassettes, and transferring it to said load lock chamber or transferring it from said load lock chamber to said one cassette; a transferring chamber for transferring said dummy sample in a vacuum condition; a plurality of vacuum processing chambers connected to said transferring chamber through a gate valve and into which said dummy sample may be provided one by one in a vacuum condition; a second transferring device arranged in said transferring chamber, having an extensible arm capable of rotatable operation, for transferring said dummy sample between said load lock chamber and said plurality of vacuum processing chambers; a first support member arranged in said load lock chamber so as to support said dummy sample one by one; a second support member arranged in each of said plurality of processing chambers so as to support said dummy sample one by one; a first sample lifting mechanism capable of effecting relative vertical movement between said first support member and said second transferring device so as to transfer said dummy sample between said first support member and said second transferring device; and a second sample lifting mechanism capable of effecting relative vertical movement between said second support member and said second transferring device so as to transfer said dummy sample between said second support member and said second transferring device,

wherein said method comprises the steps of:

(a) receiving said dummy sample on said extensible arm of said first transferring device by inserting said extensible arm of said first transferring device under a bottom surface of said dummy sample to be taken out of said at least one cassette, and by lifting said scooping device;

(b) transferring said dummy sample received on said extensible arm of said first transferring device to said first support member by said first transferring device,

(c) transferring said dummy sample to said second transferring device by inserting said extensible arm of said second transferring device under said dummy sample on said first support and operating said first sample lifting mechanism to effect relative vertical movement between said first support member and said second transferring device so as to transfer said dummy sample from said first support member to said second transferring device, and

(d) transferring said dummy sample to said second support member in one of said processing chambers by moving said extensible arm of said second transferring device over said second support and operating said second sample lifting mechanism to effect relative vertical movement between said second support member and said second transferring device so as to transfer said dummy sample from said second transferring device to said second support member.

14. A vacuum processing apparatus comprising:

a cassette table for mounting at least one cassette on a plane, each cassette capable of storing at least a dummy sample in the atmosphere;

a load lock chamber for storing said dummy sample and changing-over from the atmosphere to the vacuum condition, or from the vacuum condition to the atmosphere;

a first transferring device having an extensible arm capable of vertical operation and rotatable operation and a scooping device for taking out said dummy sample from any one of a plurality of cassettes, and transferring it to said load lock chamber or transferring it from said load lock chamber to said one cassette;

a plurality of vacuum processing chambers into which said dummy sample may be provided one by one in a vacuum condition;

a second transferring device having an extensible arm capable of rotatable operation, for transferring said dummy sample between said load lock chamber and one of said plurality of vacuum processing chambers;

a first support member arranged in said load lock chamber so as to support said dummy sample one by one;

a second support member arranged in each of said plurality of processing chambers so as to support said dummy sample one by one;

a first sample lifting mechanism capable of moving up or moving down said first support member so as to transfer said dummy sample to said second transferring device, and a second sample lifting mechanism arranged at said second support member in each of said processing chambers; and

a controller for controlling

(a) receiving of said dummy sample on said scooping-up device of said first transferring device by inserting said scooping-up device of said first transferring device under a bottom surface of said dummy sample to be taken out of one cassette and by lifting said scooping-up device,

(b) transferring of said dummy sample received on said scooping-up device of said first transferring device to said first support member,

(c) transferring of said dummy sample to said second transferring device by operating said first sample lifting mechanism.

(d) transferring of said dummy sample from said second transferring device to said second support member in one of said processing chambers by operating the second sample lifting mechanisms

15. A method for using a dummy sample with a vacuum processing apparatus, wherein

said vacuum processing apparatus includes a cassette table for mounting at least one cassette on a plane, each cassette capable of storing at least a dummy sample in the atmosphere; a load lock chamber for storing said dummy sample and changing-over from the atmosphere to the vacuum condition, or from the vacuum condition to the atmosphere; a first transferring device having an extensible arm capable of vertical operation and rotatable operation and a scooping device for taking out said dummy sample from any one of a plurality of cassettes, and transferring it to said load lock chamber or transferring it from said load lock chamber to said one cassette; a plurality of vacuum processing chambers into which said dummy sample may be provided one by one in a vacuum condition; a second transferring device having an extensible arm capable of rotatable operation, for transferring said dummy sample between said load lock chamber and one of said plurality of vacuum processing chambers; a first support member arranged in said load lock chamber so as to support said dummy sample one by one; a second support member arranged in each of said plurality of processing chambers so as to support said dummy sample one by one; a first sample lifting mechanism capable of moving up or moving down said first support member so as to transfer said dummy sample to said second transferring device, and a second sample lifting mechanism arranged at said second support member in each of said processing chambers; and a controller,

wherein said method comprises the steps of:

(a) receiving said dummy sample on said scooping-up device of said first transferring device by inserting said scooping-up device of said first transferring device under a bottom surface of said dummy sample to be taken out of one cassette and lifting said scooping-up device,

(b) transferring said dummy sample received on said scooping-up device of said first transferring device to said first support member,

(c) transferring said dummy sample to said second transferring device by operating said first sample lifting mechanism, and

(d) transferring said dummy sample from second transferring device to said second support member in any-one of said processing chambers by operating the second sample lifting mechanism.

16. The method for using a dummy sample with a vacuum processing apparatus according toclaim 15, further comprising the step:

(e) effecting processing in said processing chamber while said dummy sample is provided therein.

17. The method for using a dummy sample with a vacuum processing apparatus according toclaim 16, further comprising using said dummy sample for checking for a number of foreign particles in a vacuum processing portion of said vacuum processing apparatus.

18. The method for using a dummy sample with a vacuum processing apparatus according toclaim 16, wherein said dummy sample is used in step (e) for a cleaning process of said processing chamber.

19. The method for using a dummy sample with a vacuum processing apparatus according toclaim 15, further comprising using said dummy sample for checking for a number of foreign particles in a vacuum processing portion of said vacuum processing apparatus.

20. The vacuum processing apparatus according toclaim 1, wherein said controller further controls:

(e) processing in said processing chamber while said dummy sample is provided therein.

21. The vacuum processing apparatus according toclaim 20, wherein said dummy sample is used for checking for a number of foreign particles in a vacuum processing portion of said vacuum processing apparatus.

22. The vacuum processing apparatus according toclaim 20, wherein said dummy sample is used for a cleaning process of said processing chamber.

23. The vacuum processing apparatus according toclaim 1, wherein said dummy sample is used for checking for a number of foreign particles in a vacuum processing portion of said vacuum processing apparatus.

24. The vacuum processing apparatus according toclaim 12, wherein said controller further controls:

(e) processing in said processing chamber while said dummy sample is provided therein.

25. The vacuum processing apparatus according toclaim 24, wherein said dummy sample is used for checking for a number of foreign particles in a vacuum processing portion of said vacuum processing apparatus.

26. The vacuum processing apparatus according toclaim 24, wherein said dummy sample is used for a cleaning process of said processing chamber.

27. The vacuum processing apparatus according toclaim 12, wherein said dummy sample is used for checking for a number of foreign particles in a vacuum processing portion of said vacuum processing apparatus.

28. The method for processing a dummy sample with a vacuum processing apparatus according toclaim 13, further comprising the step:

(e) effecting processing in said processing chamber while said dummy sample is provided therein.

29. The method for using a dummy sample with a vacuum processing apparatus according toclaim 28, further comprising using said dummy sample for checking for a number of foreign particles in a vacuum processing portion of said vacuum processing apparatus.

30. The method for using a dummy sample with a vacuum processing apparatus according toclaim 28, wherein said dummy sample is used in step (e) for a cleaning process of said processing chamber.

31. The method for using a dummy sample with a vacuum processing apparatus according toclaim 13, further comprising using said dummy sample for checking for a number of foreign particles in a vacuum processing portion of said vacuum processing apparatus.

32. The vacuum processing apparatus according toclaim 14, wherein said controller further controls:

(e) processing in said processing chamber while said dummy sample is provided therein.

33. The vacuum processing apparatus according toclaim 32, wherein said dummy sample is used for checking for a number of foreign particles in a vacuum processing portion of said vacuum processing apparatus.

34. The vacuum processing apparatus according toclaim 32, wherein said dummy sample is used for a cleaning process of said processing chamber.

35. The vacuum processing apparatus according toclaim 14, wherein said dummy sample is used for checking for-a number of foreign particles in a vacuum processing portion of said vacuum processing apparatus.

Images