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US20030148024A1 - Low viscosity precursor compositons and methods for the depositon of conductive electronic features - Google Patents

Low viscosity precursor compositons and methods for the depositon of conductive electronic features
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Publication number
US20030148024A1
US20030148024A1US10/265,351US26535102AUS2003148024A1US 20030148024 A1US20030148024 A1US 20030148024A1US 26535102 AUS26535102 AUS 26535102AUS 2003148024 A1US2003148024 A1US 2003148024A1
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United States
Prior art keywords
recited
precursor composition
metal
metal precursor
substrate
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Abandoned
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US10/265,351
Inventor
Toivo Kodas
Mark Hampden-Smith
Karel Vanheusden
Hugh Denham
Aaron Stump
Allen Schult
Paolina Atanassova
Klaus Kunze
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Cabot Corp
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Individual
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Priority to US10/265,351priorityCriticalpatent/US20030148024A1/en
Assigned to SUPERIOR MICROPOWDERS LLCreassignmentSUPERIOR MICROPOWDERS LLCASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).Assignors: KUNZE, KLAUS
Assigned to SUPERIOR MICROPOWDERS LLCreassignmentSUPERIOR MICROPOWDERS LLCASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).Assignors: HAMPDEN-SMITH, MARK J., KODAS, TOIVO T., DENHAM, HUGH, ATANASSOVA, PAOLINA, SCHULT, ALLEN B., STUMP, AARON D., VANHEUSDEN, KAREL
Priority to US10/417,417prioritypatent/US7098163B2/en
Publication of US20030148024A1publicationCriticalpatent/US20030148024A1/en
Priority to US11/176,640prioritypatent/US20060001726A1/en
Assigned to CABOT CORPORATIONreassignmentCABOT CORPORATIONASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).Assignors: SUPERIOR MICROPOWDERS LLC
Priority to US11/428,533prioritypatent/US7713899B2/en
Priority to US11/464,349prioritypatent/US7642213B2/en
Priority to US11/642,698prioritypatent/US20070102684A1/en
Priority to US11/642,685prioritypatent/US20070120096A1/en
Priority to US11/642,668prioritypatent/US20070102677A1/en
Priority to US11/642,697prioritypatent/US20070102683A1/en
Priority to US11/642,720prioritypatent/US20070104881A1/en
Priority to US11/642,664prioritypatent/US7691664B2/en
Priority to US11/642,748prioritypatent/US20070102685A1/en
Priority to US11/642,711prioritypatent/US20070104880A1/en
Priority to US11/642,749prioritypatent/US20070104869A1/en
Priority to US11/642,719prioritypatent/US20070120098A1/en
Priority to US11/642,688prioritypatent/US20070096064A1/en
Priority to US11/642,691prioritypatent/US20070102680A1/en
Priority to US11/642,663prioritypatent/US20070099330A1/en
Priority to US11/642,699prioritypatent/US20070104875A1/en
Priority to US11/642,669prioritypatent/US20070102678A1/en
Priority to US11/642,692prioritypatent/US20100034986A1/en
Priority to US11/642,753prioritypatent/US20070104883A1/en
Priority to US11/642,662prioritypatent/US20070096062A1/en
Priority to US11/642,694prioritypatent/US20070102681A1/en
Priority to US11/642,703prioritypatent/US20070104876A1/en
Priority to US11/642,689prioritypatent/US20070221887A1/en
Priority to US11/642,723prioritypatent/US20070120099A1/en
Priority to US11/642,693prioritypatent/US20070120097A1/en
Priority to US11/642,670prioritypatent/US20070102679A1/en
Priority to US11/642,752prioritypatent/US20080093423A1/en
Priority to US11/642,695prioritypatent/US20070102682A1/en
Priority to US11/642,666prioritypatent/US20070125989A1/en
Priority to US11/642,750prioritypatent/US20080093422A1/en
Priority to US11/642,724prioritypatent/US20070104882A1/en
Priority to US11/642,707prioritypatent/US20070104879A1/en
Priority to US11/642,667prioritypatent/US20070096063A1/en
Priority to US11/642,696prioritypatent/US20070096065A1/en
Priority to US11/642,754prioritypatent/US20070104870A1/en
Priority to US11/736,896prioritypatent/US20070181844A1/en
Priority to US11/746,475prioritypatent/US20070207565A1/en
Abandonedlegal-statusCriticalCurrent

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Abstract

A precursor composition for the deposition and formation of an electrical feature such as a conductive feature. The precursor composition advantageously has a low viscosity enabling deposition using direct-write tools. The precursor composition also has a low conversion temperature, enabling the deposition and conversion to an electrical feature on low temperature substrates. A particularly preferred precursor composition includes silver metal for the formation of highly conductive silver features.

Description

Claims (146)

What is claimed is:
1. A metal precursor composition having a viscosity of not greater than 1000 centipoise, comprising:
(a) a metal precursor compound; and
(b) a conversion reaction inducing agent in an amount sufficient to reduce the conversion temperature of said metal precursor composition by at least about 25° C. compared to the dry metal precursor compound, wherein the conversion temperature of said metal precursor composition is not greater than about 200° C.
2. A metal precursor composition as recited inclaim 1, wherein said viscosity is not greater than about 100 centipoise.
3. A metal precursor composition as recited inclaim 1, wherein said viscosity is not greater than about 50 centipoise.
4. A metal precursor composition as recited inclaim 1, wherein said metal precursor compound is a silver metal carboxylate compound.
5. A metal precursor composition as recited inclaim 1, wherein said metal precursor compound is a silver metal oxide.
6. A metal precursor composition as recited inclaim 1, wherein said metal precursor compound is an inorganic silver compound.
7. A metal precursor composition as recited inclaim 1, wherein said metal precursor compound is a silver halogenated carboxylate compound.
8. A metal precursor composition as recited inclaim 1, wherein said metal precursor compound is silver trifluoroacetate.
9. A metal precursor composition as recited inclaim 1, wherein said metal precursor composition comprises at least 40 wt. % percent metal.
10. A metal precursor composition as recited inclaim 1, further comprising a crystallization inhibitor.
11. A metal precursor composition as recited inclaim 1, further comprising a crystallization inhibitor selected from the group consisting of glycerol, glycolic acid, lactic acid, humectants and surfactants.
12. A metal precursor composition as recited inclaim 1, wherein said conversion reaction inducing agent is a liquid that functions as a vehicle for said metal precursor composition.
13. A metal precursor composition as recited inclaim 1, wherein said conversion reaction inducing agent is a liquid that functions as a solvent for said metal precursor compound.
14. Metal precursor composition as recited inclaim 1, wherein said conversion reaction inducing agent is selected from the group consisting of alcohols, amines, amides, boranes, borohydrates, borohydrides, and organosilanes.
15. A metal precursor composition as recited inclaim 1, wherein said conversion reaction inducing agent comprises an alcohol.
16. A metal precursor composition as recited inclaim 1, wherein said conversion reaction inducing agent comprises an amine.
17. A metal precursor composition as recited inclaim 1, wherein said conversion reaction inducing agent comprises an amide.
18. A metal precursor composition as recited inclaim 1, wherein said conversion reaction inducing agent comprises terpineol.
19. A metal precursor composition as recited inclaim 1, wherein said conversion reaction inducing agent comprises diethyleneglycol butylether (DEGBE).
20. A metal precursor composition as recited inclaim 1, wherein said conversion reaction inducing agent comprises N,N-dimethyl acetamide (DMAc).
21. A metal precursor composition as recited inclaim 1, wherein said conversion reaction inducing agent comprises diethyleneglycol butylether (DEGBE) and N,N-dimethyl acetamide (DMAc).
22. A metal precursor composition as recited inclaim 1, wherein said conversion reaction inducing agent comprises N,N-dimethyl acetamide (DMAc) and terpineol.
23. A metal precursor composition as recited inclaim 1, wherein said conversion reaction inducing agent comprises a palladium compound.
24. A metal precursor composition as recited inclaim 1, wherein said conversion reaction inducing agent is selected from the group consisting of palladium acetate, palladium tetra-amine hydroxide, and palladium trifluoroacetate.
25. A metal precursor composition as recited inclaim 1, wherein said conversion reducing agent comprises diethyleneglycol butylether (DEGBE) and the molar ratio of DEGBE to said metal precursor compound is from about 0.75 to about 1.25.
26. A metal precursor composition as recited inclaim 1, further comprising a vehicle.
27. A metal precursor composition as recited inclaim 1, further comprising a solvent wherein said metal precursor compound is dissolved in said solvent.
28. A metal precursor composition as recited inclaim 1, further comprising a solvent wherein said metal precursor compound is suspended in said solvent.
29. A metal precursor composition as recited inclaim 1, further comprising an aqueous-based solvent.
30. A metal precursor composition as recited inclaim 1, further comprising particles.
31. A metal precursor composition as recited inclaim 1, further comprising substantially spherical particles.
32. A metal precursor composition as recited inclaim 1, further comprising metallic particles.
33. A metal precursor composition as recited inclaim 1, further comprising silver metal particles.
34. A metal precursor composition as recited inclaim 1, further comprising nanoparticles having a volume median particle size of not greater than 100 nanometers.
35. A metal precursor composition as recited inclaim 1, further comprising nanoparticles having a volume median particle size of not greater than about 75 nanometers.
36. A metal precursor composition as recited inclaim 1, wherein said precursor composition comprises said conversion reaction inducing agent in an amount sufficient to reduce the conversion temperature of said metal precursor compound by at least about 50° C.
37. A metal precursor composition as recited inclaim 1, wherein said precursor composition comprises said conversion reaction inducing agent in an amount sufficient to reduce the conversion temperature of said metal precursor compound by at least about 100° C.
38. A metal precursor composition having a viscosity of not greater than about 1000 centipoise, comprising:
(a) a silver metal compound;
(b) silver particles; and
(c) a conversion reaction inducing agent in amount sufficient to reduce the conversion temperature of said metal precursor composition by at least about 25° C. as compared to the dry silver metal compound, wherein said metal precursor composition has a conversion temperature of not greater than about 250° C.
39. A metal precursor composition as recited inclaim 38, wherein said silver metal compound is a silver carboxylate compound.
40. A metal precursor composition as recited inclaim 38, wherein said conversion reaction inducing agent is an alcohol.
41. A metal precursor composition as recited inclaim 38, wherein said conversion reaction inducing agent is ethylene glycol.
42. A metal precursor composition as recited inclaim 38, wherein said conversion reaction inducing agent is terpineol.
43. A metal precursor composition as recited inclaim 38, wherein said metal precursor composition has a viscosity of not greater than 100 centipoise.
44. A metal precursor composition as recited inclaim 38, wherein said particles have a volume median particle size of not greater than 100 nanometers.
45. A metal precursor composition as recited inclaim 38, wherein said metal precursor composition has a conversion temperature of not greater than 225° C.
46. A metal precursor composition as recited inclaim 38, wherein said metal precursor composition has a conversion temperature of not greater than 200° C.
47. A method for the fabrication of a conductive feature on a substrate, comprising the steps of:
(a) providing a precursor composition comprising a silver metal precursor compound, wherein said precursor composition has a viscosity of not greater than about 50 centipoise and a surface tension of from about 20 to 50 dynes/cm;
(b) depositing said precursor composition on a substrate; and
(c) converting said precursor composition to a conductive feature by heating said precursor composition to a conversion temperature of not greater than about 250° C., wherein said conductive feature has a resistivity of not greater than about 10 times the resistivity of the pure bulk silver.
48. A method as recited inclaim 47, wherein said feature has a minimum feature size of not greater than about 100 μm.
49. A method as recited inclaim 47, wherein said feature has a minimum feature size of not greater than about 75 μm.
50. A method as recited inclaim 47, wherein said feature has a minimum feature size of not greater than about 50 μm.
51. A method as recited inclaim 47, wherein said feature has a minimum feature size of not greater than about 25 μm.
52. A method as recited inclaim 47, wherein said feature has a thickness of at least about 0.05 μm.
53. A method as recited inclaim 47, wherein said feature has a thickness of at least about 0.1 μm.
54. A method as recited inclaim 47, further comprising the step of modifying a first portion of said substrate, wherein said first portion is adapted to confine said deposited precursor composition.
55. A method as recited inclaim 47, further comprising the step of modifying a first portion of said substrate, wherein said first portion is modified to have a surface energy that is different than the surface energy on a second portion of said substrate, and wherein said first portion is adapted to confine said deposited precursor composition.
56. A method as recited inclaim 47, wherein said precursor composition further comprises metallic particles.
57. A method as recited inclaim 47, wherein said precursor composition further comprises metallic nanoparticles.
58. A method as recited inclaim 47, wherein said precursor composition further comprises a palladium compound.
59. A method as recited inclaim 47, wherein said deposition step comprises depositing said precursor composition using a tool selected from the group consisting of an ink-jet device, a syringe dispense device, an aerosol jet, an intaglio printer, a roll printer and a sprayer.
60. A method as recited inclaim 47, wherein said deposition step comprises depositing said precursor composition using an ink-jet device.
61. A method as recited inclaim 47, wherein said conversion temperature is not greater than about 225° C.
62. A method as recited inclaim 47, wherein said conversion temperature is not greater than about 200° C.
63. A method as recited inclaim 47, wherein said conversion temperature is not greater than about 150° C.
64. A method as recited inclaim 47, wherein said heating step comprises heating said precursor composition using a laser.
65. A method as recited inclaim 47, wherein said heating step comprises heating said precursor composition in a furnace.
66. A method as recited inclaim 47, wherein said heating step comprises heating using an infrared lamp.
67. A method as recited inclaim 47, wherein said conductive feature has a resistivity of not greater than about 6 times the pure bulk metal.
68. A method as recited inclaim 47, wherein said conductive feature has a resistivity of not greater than about 4 times the pure bulk metal.
69. A method as recited inclaim 47, wherein said conductive feature has a resistivity of not greater than about 2 times the pure bulk metal.
70. A method as recited inclaim 47, wherein said substrate is selected from the group consisting of polyfluorinated compounds, polyimides, epoxies (including glass-filled epoxy), polycarbonate, cellulose-based materials (i.e. wood or paper), acetate, polyester, polyethylene, polypropylene, polyvinyl chloride, acrylonitrile, butadiene (ABS), flexible fiber board, non-woven polymeric fabric and cloth.
71. A method for the fabrication of a conductive feature on a substrate, comprising the steps of:
(a) providing a precursor composition comprising a metal precursor compound, wherein said precursor composition has a viscosity of not greater than about 50 centipoise and a surface tension of from about 20 to 50 dynes/cm;
(b) depositing said precursor composition on a substrate; and
(c) converting said precursor composition to a conductive feature by heating said precursor composition to a conversion temperature of not greater than about 150° C., wherein said conductive feature has a resistivity of not greater than about 100 times the resistivity of the pure bulk metal.
72. A method as recited inclaim 71, wherein said metal is silver.
73. A method as recited inclaim 71, wherein said conductive feature has a resistivity of not greater than about 80 times the resistivity of the bulk metal.
74. A method as recited inclaim 71, wherein said conversion temperature is not greater than about 100° C.
75. A method as recited inclaim 71, wherein said depositing step comprises depositing said precursor composition using a direct-write tool.
76. A method as recited inclaim 71, wherein said depositing step comprises depositing said precursor composition using an ink-jet device.
77. A method as recited inclaim 71, wherein said conductive feature has a minimum feature size of not greater than about 200 μm.
78. A method as recited inclaim 71, wherein said conductive feature has a minimum feature size of not greater than about 100 μm.
79. A method for the fabrication of a conductive feature on a substrate, comprising the steps of:
(a) providing a precursor composition comprising silver particles, wherein said precursor composition has a viscosity of not greater than about 50 centipoise and a surface tension of from about 20 to 50 dynes/cm;
(b) depositing said precursor composition on a substrate; and
(c) converting said precursor composition to a conductive feature by heating said precursor composition to a conversion temperature of not greater than about 150° C., wherein said conductive feature has a resistivity of not greater than about 100 times the resistivity of the pure bulk metal.
80. A method as recited inclaim 79, wherein said particles are nanoparticles having an average size of not greater than about 100 nanometers.
81. A method as recited inclaim 79, wherein said conductive feature has a resistivity of not greater than about 80 times the resistivity of the bulk metal.
82. A method as recited inclaim 79, wherein said conversion temperature is not greater than about 100° C.
83. A method as recited inclaim 79, wherein said depositing step comprises depositing said precursor composition using a direct-write tool.
84. A method as recited inclaim 79, wherein said depositing step comprises depositing said precursor composition using an ink-jet device.
85. A method as recited inclaim 79, wherein said conductive feature has a minimum feature size of not greater than about 200 μm.
86. A method as recited inclaim 79, wherein said conductive feature has a minimum feature size of not greater than about 100 μm.
87. A method for the fabrication of an electronic device, comprising the steps of:
(a) providing a substrate comprising at least a first non-linear element disposed on said substrate;
(b) depositing a low viscosity metal precursor composition onto said substrate in the form of a trace contacting said first non-linear element, wherein said precursor trace has a minimum size of not greater than about 200μm; and
(c) heating said deposited precursor composition to a temperature of not greater than about 200° C. to form a conductive feature electrically coupled to said first non-linear element, said conductive feature having a minimum feature size of not greater than about 200 μm and a resistivity of not greater than about 200 times the resistivity of the bulk metal.
88. A method as recited inclaim 87, wherein said minimum size of said trace and said conductive feature is not greater than about 100 μm.
89. A method as recited inclaim 87, wherein said minimum size of said trace and said conductive feature is not greater than about 75 μm.
90. A method as recited inclaim 87, wherein said minimum feature size of said trace and said conductive feature is not greater than about 50 μm.
91. A method as recited inclaim 87, wherein said minimum feature size of said trace and said conductive feature is not greater than about 25 μm.
92. A method as recited inclaim 87, wherein said conductive feature has a thickness of at least about 0.05 μm.
93. A method as recited inclaim 87, wherein said conductive feature has a thickness of at least about 0.1 μm.
94. A method as recited inclaim 87, further comprising the step of modifying a first portion of said substrate, wherein said first portion is adapted to confine said deposited precursor composition.
95. A method as recited inclaim 87, further comprising the step of modifying a first portion of said substrate, wherein said first portion is modified to have a surface energy that is different than the surface energy on a second portion of said substrate, and wherein said first portion is adapted to confine said deposited precursor composition.
96. A method as recited inclaim 87, wherein said heating step comprises heating to a temperature of not greater than about 185° C.
97. A method as recited inclaim 87, wherein said heating step comprises heating to a temperature of not greater than about 150° C.
98. A method as recited inclaim 87, wherein said heating step comprises heating to a temperature of not greater than about 125° C.
99. A method as recited inclaim 87, wherein said substrate is a flexible substrate.
100. A method as recited inclaim 87, wherein said substrate is an organic substrate.
101. A method as recited inclaim 87, wherein said substrate is a polymer substrate.
102. A method as recited inclaim 87, wherein said substrate is a glass substrate.
103. A method as recited inclaim 87, wherein said metal precursor composition has a viscosity of not greater than about 50 centipoise.
104. A method as recited inclaim 87, wherein said depositing step comprises depositing said precursor composition using an ink-jet device.
105. A method as recited inclaim 87, wherein said first non-linear element is selected from the group consisting of a diode, a display pixel and a transistor.
106. A method as recited inclaim 87, wherein said first non-linear element is an organic transistor.
107. A method as recited inclaim 87, wherein said electronic device is an organic light emitting display.
108. A method as recited inclaim 87, wherein said metal is silver.
109. A method as recited inclaim 87, wherein said conductive trace has a resistivity of not greater than about 100 times the resistivity of the bulk metal.
110. A method as recited inclaim 87, wherein said conductive trace has a resistivity of not greater than about 20 times the resistivity of the bulk metal.
111. A method as recited inclaim 87, wherein said conductive trace has a resistivity of not greater than about 10 times the resistivity of the bulk conductor.
112. A method as recited inclaim 87, wherein said conductive trace has a resistivity of not greater than about 6 times the resistivity of the bulk conductor.
113. A method for the fabrication of an electronic component, comprising the steps of:
(a) depositing a low viscosity metal precursor composition onto said substrate in the form of a trace, wherein said precursor trace has a minimum size of not greater than about 200 μm;
(b) heating said deposited precursor composition to a temperature of not greater than about 200° C. to form a conductive feature, said conductive feature having a minimum feature size of not greater than about 200 μm and a resistivity of not greater than about 200 times the resistivity of the bulk metal; and
(c) depositing at least a first non-linear element on said substrate, wherein said conductive feature is electrically coupled to said first non-linear element.
114. A method as recited inclaim 113, wherein said minimum size of said trace and said conductive feature is not greater than about 100 μm.
115. A method as recited inclaim 113, wherein said minimum size of said trace and said conductive feature is not greater than about 75 μm.
116. A method as recited inclaim 113, wherein said minimum feature size of said trace and said conductive feature is not greater than about 50 μm.
117. A method as recited inclaim 113, wherein said minimum feature size of said trace and said conductive feature is not greater than about 25 μm.
118. A method as recited inclaim 113, wherein said conductive feature has a thickness of at least about 0.05 μm.
119. A method as recited inclaim 113, wherein said conductive feature has a thickness of at least about 0.1 μm.
120. A method as recited inclaim 113, further comprising the step of modifying a first portion of said substrate, wherein said first portion is adapted to confine said deposited precursor composition.
121. A method as recited inclaim 113, further comprising the step of modifying a first portion of said substrate, wherein said first portion is modified to have a surface energy that is different than the surface energy on a second portion of said substrate, and wherein said first portion is adapted to confine said deposited precursor composition.
122. A method as recited inclaim 113, wherein said heating step comprises heating to a temperature of not greater than about 185° C.
123. A method as recited inclaim 113, wherein said heating step comprises heating to a temperature of not greater than about 150° C.
124. A method as recited inclaim 113, wherein said substrate is a flexible substrate.
125. A method as recited inclaim 113, wherein said substrate is an organic substrate.
126. A method as recited inclaim 113, wherein said substrate is a polymer substrate.
127. A method as recited inclaim 113, wherein said substrate is a glass substrate.
128. A method as recited inclaim 113, wherein said metal precursor composition has a viscosity of not greater than about 50 centipoise.
129. A method as recited inclaim 113, wherein said depositing step comprises depositing said precursor composition using an ink-jet device.
130. A method as recited inclaim 113, wherein said first non-linear element is selected from the group consisting of a diode, a display pixel and a transistor.
131. A method as recited inclaim 113, wherein said first non-linear element is an organic transistor.
132. A method as recited inclaim 113, wherein said electronic device is an organic light emitting display.
133. A method as recited inclaim 113, wherein said metal is silver.
134. A method as recited inclaim 113, wherein said conductive trace has a resistivity of not greater than about 100 times the resistivity of the bulk metal.
135. A method as recited inclaim 113, wherein said conductive trace has a resistivity of not greater than about 20 times the resistivity of the bulk metal.
136. A method as recited inclaim 113, wherein said conductive trace has a resistivity of not greater than about 10 times the resistivity of the bulk conductor.
137. A method as recited inclaim 113, wherein said conductive trace has a resistivity of not greater than about 6 times the resistivity of the bulk conductor.
138. A method for the fabrication of an interconnect for at least first and second organic-based transistors in an electronic component, comprising the steps of:
(a) depositing a silver metal precursor composition onto said substrate using an ink-jet device and in the form of a trace having a minimum size of not greater than about 100 μm; and
(b) heating said deposited precursor composition to a temperature of not greater than 200° C. to form a conductive feature having a minimum feature size of not greater than about 100 μm and a resistivity of not greater than about 10 times the resistivity of bulk silver.
139. A method as recited inclaim 138, further comprising the step of modifying a first portion of said substrate, wherein said first portion is adapted to confine said deposited precursor composition.
140. A method as recited inclaim 138, further comprising the step of modifying a first portion of said substrate, wherein said first portion is modified to have a surface energy that is different than the surface energy on a second portion of said substrate, and wherein said first portion is adapted to confine said deposited precursor composition.
141. A method as recited inclaim 138, wherein said minimum size of said trace and said conductive feature is not greater than about 100 μm.
142. A method as recited inclaim 138, wherein said minimum size of said trace and said conductive feature is not greater than about 75 μm.
143. A method as recited inclaim 138, wherein said minimum feature size of said trace and said conductive feature is not greater than about 50 μm.
144. A method as recited inclaim 138, wherein said minimum feature size of said trace and said conductive feature is not greater than about 25 μm.
145. A method as recited inclaim 138, wherein said conductive feature has a thickness of at least about 0.05 μm.
146. A method as recited inclaim 138, wherein said conductive feature has a thickness of at least about 0.1 μm.
US10/265,3511998-08-272002-10-04Low viscosity precursor compositons and methods for the depositon of conductive electronic featuresAbandonedUS20030148024A1 (en)

Priority Applications (40)

Application NumberPriority DateFiling DateTitle
US10/265,351US20030148024A1 (en)2001-10-052002-10-04Low viscosity precursor compositons and methods for the depositon of conductive electronic features
US10/417,417US7098163B2 (en)1998-08-272003-04-16Method of producing membrane electrode assemblies for use in proton exchange membrane and direct methanol fuel cells
US11/176,640US20060001726A1 (en)2001-10-052005-07-08Printable conductive features and processes for making same
US11/428,533US7713899B2 (en)1998-08-272006-07-03Method of producing membrane electrode assemblies for use in proton exchange membrane and direct methanol fuel cells
US11/464,349US7642213B2 (en)1998-08-272006-08-14Method of producing membrane electrode assemblies for use in proton exchange membrane and direct methanol fuel cells
US11/642,707US20070104879A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,667US20070096063A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,754US20070104870A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,696US20070096065A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,663US20070099330A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,662US20070096062A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,668US20070102677A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,697US20070102683A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,720US20070104881A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,664US7691664B2 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,748US20070102685A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,711US20070104880A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,749US20070104869A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,719US20070120098A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,688US20070096064A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,691US20070102680A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,698US20070102684A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,699US20070104875A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,669US20070102678A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,692US20100034986A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,753US20070104883A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
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US11/746,475US20070207565A1 (en)2001-10-052007-05-09Processes for forming photovoltaic features

Applications Claiming Priority (2)

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US32762001P2001-10-052001-10-05
US10/265,351US20030148024A1 (en)2001-10-052002-10-04Low viscosity precursor compositons and methods for the depositon of conductive electronic features

Related Parent Applications (1)

Application NumberTitlePriority DateFiling Date
US09/815,380Continuation-In-PartUS6967183B2 (en)1998-02-242001-03-22Electrocatalyst powders, methods for producing powders and devices fabricated from same

Related Child Applications (37)

Application NumberTitlePriority DateFiling Date
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US11/642,698ContinuationUS20070102684A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,752ContinuationUS20080093423A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,707ContinuationUS20070104879A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,748ContinuationUS20070102685A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,749ContinuationUS20070104869A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,695ContinuationUS20070102682A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,667ContinuationUS20070096063A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,669ContinuationUS20070102678A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,691ContinuationUS20070102680A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
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US11/642,754ContinuationUS20070104870A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,724ContinuationUS20070104882A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronics features
US11/642,753ContinuationUS20070104883A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,696ContinuationUS20070096065A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,662ContinuationUS20070096062A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,666ContinuationUS20070125989A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,694ContinuationUS20070102681A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,663ContinuationUS20070099330A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,693ContinuationUS20070120097A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,688ContinuationUS20070096064A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,685ContinuationUS20070120096A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,689ContinuationUS20070221887A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,750ContinuationUS20080093422A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,703ContinuationUS20070104876A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,670ContinuationUS20070102679A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,699ContinuationUS20070104875A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,668ContinuationUS20070102677A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,697ContinuationUS20070102683A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,720ContinuationUS20070104881A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,723ContinuationUS20070120099A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,719ContinuationUS20070120098A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,664ContinuationUS7691664B2 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/736,896DivisionUS20070181844A1 (en)2001-10-052007-04-18Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/746,475ContinuationUS20070207565A1 (en)2001-10-052007-05-09Processes for forming photovoltaic features

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US20030148024A1true US20030148024A1 (en)2003-08-07

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Family Applications (36)

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US10/265,351AbandonedUS20030148024A1 (en)1998-08-272002-10-04Low viscosity precursor compositons and methods for the depositon of conductive electronic features
US11/642,720AbandonedUS20070104881A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,724AbandonedUS20070104882A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronics features
US11/642,688AbandonedUS20070096064A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,699AbandonedUS20070104875A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,748AbandonedUS20070102685A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,664Expired - Fee RelatedUS7691664B2 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,692AbandonedUS20100034986A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,711AbandonedUS20070104880A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,719AbandonedUS20070120098A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,696AbandonedUS20070096065A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
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US11/642,689AbandonedUS20070221887A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,753AbandonedUS20070104883A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,752AbandonedUS20080093423A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,723AbandonedUS20070120099A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,669AbandonedUS20070102678A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,693AbandonedUS20070120097A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,668AbandonedUS20070102677A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,663AbandonedUS20070099330A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,666AbandonedUS20070125989A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,670AbandonedUS20070102679A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,694AbandonedUS20070102681A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,691AbandonedUS20070102680A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,754AbandonedUS20070104870A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,662AbandonedUS20070096062A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,685AbandonedUS20070120096A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,695AbandonedUS20070102682A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,698AbandonedUS20070102684A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,667AbandonedUS20070096063A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,707AbandonedUS20070104879A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,703AbandonedUS20070104876A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,750AbandonedUS20080093422A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,749AbandonedUS20070104869A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/736,896AbandonedUS20070181844A1 (en)2001-10-052007-04-18Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/746,475AbandonedUS20070207565A1 (en)2001-10-052007-05-09Processes for forming photovoltaic features

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US11/642,720AbandonedUS20070104881A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,724AbandonedUS20070104882A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronics features
US11/642,688AbandonedUS20070096064A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,699AbandonedUS20070104875A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,748AbandonedUS20070102685A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,664Expired - Fee RelatedUS7691664B2 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,692AbandonedUS20100034986A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,711AbandonedUS20070104880A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,719AbandonedUS20070120098A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,696AbandonedUS20070096065A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,697AbandonedUS20070102683A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,689AbandonedUS20070221887A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,753AbandonedUS20070104883A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,752AbandonedUS20080093423A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,723AbandonedUS20070120099A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,669AbandonedUS20070102678A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,693AbandonedUS20070120097A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,668AbandonedUS20070102677A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,663AbandonedUS20070099330A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,666AbandonedUS20070125989A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,670AbandonedUS20070102679A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,694AbandonedUS20070102681A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,691AbandonedUS20070102680A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,754AbandonedUS20070104870A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,662AbandonedUS20070096062A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,685AbandonedUS20070120096A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,695AbandonedUS20070102682A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,698AbandonedUS20070102684A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,667AbandonedUS20070096063A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,707AbandonedUS20070104879A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,703AbandonedUS20070104876A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,750AbandonedUS20080093422A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/642,749AbandonedUS20070104869A1 (en)2001-10-052006-12-21Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/736,896AbandonedUS20070181844A1 (en)2001-10-052007-04-18Low viscosity precursor compositions and methods for the deposition of conductive electronic features
US11/746,475AbandonedUS20070207565A1 (en)2001-10-052007-05-09Processes for forming photovoltaic features

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