| US6219015B1 (en) | 1992-04-28 | 2001-04-17 | The Board Of Directors Of The Leland Stanford, Junior University | Method and apparatus for using an array of grating light valves to produce multicolor optical images |
| US5717513A (en)* | 1995-01-10 | 1998-02-10 | Texas Instruments Incorporated | Unsticking mirror elements of digital micromirror device |
| US5617242A (en)* | 1995-01-10 | 1997-04-01 | Texas Instruments Incorporated | Repair of digital micromirror device having white defects |
| US5841579A (en) | 1995-06-07 | 1998-11-24 | Silicon Light Machines | Flat diffraction grating light valve |
| US6312528B1 (en) | 1997-03-06 | 2001-11-06 | Cri Recycling Service, Inc. | Removal of contaminants from materials |
| US5982553A (en) | 1997-03-20 | 1999-11-09 | Silicon Light Machines | Display device incorporating one-dimensional grating light-valve array |
| US6306564B1 (en) | 1997-05-27 | 2001-10-23 | Tokyo Electron Limited | Removal of resist or residue from semiconductors using supercritical carbon dioxide |
| TW539918B (en) | 1997-05-27 | 2003-07-01 | Tokyo Electron Ltd | Removal of photoresist and photoresist residue from semiconductors using supercritical carbon dioxide process |
| US6500605B1 (en) | 1997-05-27 | 2002-12-31 | Tokyo Electron Limited | Removal of photoresist and residue from substrate using supercritical carbon dioxide process |
| US6036786A (en)* | 1997-06-11 | 2000-03-14 | Fsi International Inc. | Eliminating stiction with the use of cryogenic aerosol |
| US6088102A (en) | 1997-10-31 | 2000-07-11 | Silicon Light Machines | Display apparatus including grating light-valve array and interferometric optical system |
| US6271808B1 (en) | 1998-06-05 | 2001-08-07 | Silicon Light Machines | Stereo head mounted display using a single display device |
| US6004912A (en)* | 1998-06-05 | 1999-12-21 | Silicon Light Machines | Vapor phase low molecular weight lubricants |
| US6101036A (en) | 1998-06-23 | 2000-08-08 | Silicon Light Machines | Embossed diffraction grating alone and in combination with changeable image display |
| US6130770A (en) | 1998-06-23 | 2000-10-10 | Silicon Light Machines | Electron gun activated grating light valve |
| US6215579B1 (en) | 1998-06-24 | 2001-04-10 | Silicon Light Machines | Method and apparatus for modulating an incident light beam for forming a two-dimensional image |
| US6303986B1 (en) | 1998-07-29 | 2001-10-16 | Silicon Light Machines | Method of and apparatus for sealing an hermetic lid to a semiconductor die |
| US6872984B1 (en) | 1998-07-29 | 2005-03-29 | Silicon Light Machines Corporation | Method of sealing a hermetic lid to a semiconductor die at an angle |
| US7064070B2 (en)* | 1998-09-28 | 2006-06-20 | Tokyo Electron Limited | Removal of CMP and post-CMP residue from semiconductors using supercritical carbon dioxide process |
| US6277753B1 (en) | 1998-09-28 | 2001-08-21 | Supercritical Systems Inc. | Removal of CMP residue from semiconductors using supercritical carbon dioxide process |
| JP3527117B2 (ja)* | 1998-12-24 | 2004-05-17 | 富士電機デバイステクノロジー株式会社 | 半導体力学量センサの製造方法およびその製造装置 |
| US6748960B1 (en) | 1999-11-02 | 2004-06-15 | Tokyo Electron Limited | Apparatus for supercritical processing of multiple workpieces |
| KR100742473B1 (ko) | 1999-11-02 | 2007-07-25 | 동경 엘렉트론 주식회사 | 제 1 및 제 2 소재를 초임계 처리하는 장치 및 방법 |
| US6956878B1 (en) | 2000-02-07 | 2005-10-18 | Silicon Light Machines Corporation | Method and apparatus for reducing laser speckle using polarization averaging |
| EP1277233A2 (en)* | 2000-04-25 | 2003-01-22 | Tokyo Electron Corporation | Method of depositing metal film and metal deposition cluster tool including supercritical drying/cleaning module |
| WO2001089986A1 (en)* | 2000-05-26 | 2001-11-29 | Chaker Khalfaoui | A stiction-free electrostatically driven microstructure device |
| US6795605B1 (en) | 2000-08-01 | 2004-09-21 | Cheetah Omni, Llc | Micromechanical optical switch |
| US6719613B2 (en)* | 2000-08-10 | 2004-04-13 | Nanoclean Technologies, Inc. | Methods for cleaning surfaces substantially free of contaminants utilizing filtered carbon dioxide |
| US6530823B1 (en) | 2000-08-10 | 2003-03-11 | Nanoclean Technologies Inc | Methods for cleaning surfaces substantially free of contaminants |
| US6543462B1 (en) | 2000-08-10 | 2003-04-08 | Nano Clean Technologies, Inc. | Apparatus for cleaning surfaces substantially free of contaminants |
| US6556741B1 (en) | 2000-10-25 | 2003-04-29 | Omm, Inc. | MEMS optical switch with torsional hinge and method of fabrication thereof |
| US6387723B1 (en) | 2001-01-19 | 2002-05-14 | Silicon Light Machines | Reduced surface charging in silicon-based devices |
| US6562146B1 (en) | 2001-02-15 | 2003-05-13 | Micell Technologies, Inc. | Processes for cleaning and drying microelectronic structures using liquid or supercritical carbon dioxide |
| US7177081B2 (en) | 2001-03-08 | 2007-02-13 | Silicon Light Machines Corporation | High contrast grating light valve type device |
| CA2444296A1 (en)* | 2001-04-10 | 2002-10-24 | Supercritical Systems Inc. | High pressure processing chamber for semiconductor substrate including flow enhancing features |
| US6707591B2 (en) | 2001-04-10 | 2004-03-16 | Silicon Light Machines | Angled illumination for a single order light modulator based projection system |
| US6865346B1 (en) | 2001-06-05 | 2005-03-08 | Silicon Light Machines Corporation | Fiber optic transceiver |
| US6958123B2 (en)* | 2001-06-15 | 2005-10-25 | Reflectivity, Inc | Method for removing a sacrificial material with a compressed fluid |
| US6782205B2 (en) | 2001-06-25 | 2004-08-24 | Silicon Light Machines | Method and apparatus for dynamic equalization in wavelength division multiplexing |
| US6747781B2 (en) | 2001-06-25 | 2004-06-08 | Silicon Light Machines, Inc. | Method, apparatus, and diffuser for reducing laser speckle |
| US6646778B2 (en) | 2001-08-01 | 2003-11-11 | Silicon Light Machines | Grating light valve with encapsulated dampening gas |
| US6829092B2 (en) | 2001-08-15 | 2004-12-07 | Silicon Light Machines, Inc. | Blazed grating light valve |
| US6785001B2 (en)* | 2001-08-21 | 2004-08-31 | Silicon Light Machines, Inc. | Method and apparatus for measuring wavelength jitter of light signal |
| US6619304B2 (en) | 2001-09-13 | 2003-09-16 | Micell Technologies, Inc. | Pressure chamber assembly including non-mechanical drive means |
| US6782900B2 (en) | 2001-09-13 | 2004-08-31 | Micell Technologies, Inc. | Methods and apparatus for cleaning and/or treating a substrate using CO2 |
| US6706641B2 (en) | 2001-09-13 | 2004-03-16 | Micell Technologies, Inc. | Spray member and method for using the same |
| US6666928B2 (en) | 2001-09-13 | 2003-12-23 | Micell Technologies, Inc. | Methods and apparatus for holding a substrate in a pressure chamber |
| US6930364B2 (en) | 2001-09-13 | 2005-08-16 | Silicon Light Machines Corporation | Microelectronic mechanical system and methods |
| US6763840B2 (en) | 2001-09-14 | 2004-07-20 | Micell Technologies, Inc. | Method and apparatus for cleaning substrates using liquid carbon dioxide |
| JP2003133070A (ja)* | 2001-10-30 | 2003-05-09 | Seiko Epson Corp | 積層膜の製造方法、電気光学装置、電気光学装置の製造方法、有機エレクトロルミネッセンス装置の製造方法、及び電子機器 |
| US6538233B1 (en) | 2001-11-06 | 2003-03-25 | Analog Devices, Inc. | Laser release process for micromechanical devices |
| US6956995B1 (en) | 2001-11-09 | 2005-10-18 | Silicon Light Machines Corporation | Optical communication arrangement |
| US7028698B2 (en)* | 2001-12-28 | 2006-04-18 | Brian Nils Hansen | Pressure processing apparatus with improved heating and closure system |
| US6800238B1 (en) | 2002-01-15 | 2004-10-05 | Silicon Light Machines, Inc. | Method for domain patterning in low coercive field ferroelectrics |
| WO2003064065A1 (en)* | 2002-01-25 | 2003-08-07 | Supercritical Systems Inc. | Method for reducing the formation of contaminants during supercritical carbon dioxide processes |
| US6876046B2 (en)* | 2002-02-07 | 2005-04-05 | Superconductor Technologies, Inc. | Stiction alleviation using passivation layer patterning |
| JP2006508521A (ja)* | 2002-02-15 | 2006-03-09 | 東京エレクトロン株式会社 | 溶剤浴と超臨界co2を用いたレジストの乾燥 |
| US6924086B1 (en)* | 2002-02-15 | 2005-08-02 | Tokyo Electron Limited | Developing photoresist with supercritical fluid and developer |
| US7387868B2 (en) | 2002-03-04 | 2008-06-17 | Tokyo Electron Limited | Treatment of a dielectric layer using supercritical CO2 |
| EP1481284A4 (en) | 2002-03-04 | 2006-10-25 | Tokyo Electron Ltd | PROCESS FOR PASSIVATION OF MATERIALS WITH LOW DIELECTRIC CONSTANT IN THE PROCESSING OF WAFERS |
| CN1642665A (zh)* | 2002-03-22 | 2005-07-20 | 东京毅力科创株式会社 | 用超临界工艺清除杂质 |
| US7169540B2 (en)* | 2002-04-12 | 2007-01-30 | Tokyo Electron Limited | Method of treatment of porous dielectric films to reduce damage during cleaning |
| US6728023B1 (en) | 2002-05-28 | 2004-04-27 | Silicon Light Machines | Optical device arrays with optimized image resolution |
| US6767751B2 (en) | 2002-05-28 | 2004-07-27 | Silicon Light Machines, Inc. | Integrated driver process flow |
| US7054515B1 (en) | 2002-05-30 | 2006-05-30 | Silicon Light Machines Corporation | Diffractive light modulator-based dynamic equalizer with integrated spectral monitor |
| US6822797B1 (en) | 2002-05-31 | 2004-11-23 | Silicon Light Machines, Inc. | Light modulator structure for producing high-contrast operation using zero-order light |
| US6841079B2 (en) | 2002-05-31 | 2005-01-11 | 3M Innovative Properties Company | Fluorochemical treatment for silicon articles |
| US7256467B2 (en)* | 2002-06-04 | 2007-08-14 | Silecs Oy | Materials and methods for forming hybrid organic-inorganic anti-stiction materials for micro-electromechanical systems |
| US6846380B2 (en)* | 2002-06-13 | 2005-01-25 | The Boc Group, Inc. | Substrate processing apparatus and related systems and methods |
| US6829258B1 (en) | 2002-06-26 | 2004-12-07 | Silicon Light Machines, Inc. | Rapidly tunable external cavity laser |
| US6908201B2 (en) | 2002-06-28 | 2005-06-21 | Silicon Light Machines Corporation | Micro-support structures |
| US6714337B1 (en) | 2002-06-28 | 2004-03-30 | Silicon Light Machines | Method and device for modulating a light beam and having an improved gamma response |
| US6813059B2 (en) | 2002-06-28 | 2004-11-02 | Silicon Light Machines, Inc. | Reduced formation of asperities in contact micro-structures |
| US6764385B2 (en)* | 2002-07-29 | 2004-07-20 | Nanoclean Technologies, Inc. | Methods for resist stripping and cleaning surfaces substantially free of contaminants |
| US7297286B2 (en)* | 2002-07-29 | 2007-11-20 | Nanoclean Technologies, Inc. | Methods for resist stripping and other processes for cleaning surfaces substantially free of contaminants |
| US7066789B2 (en)* | 2002-07-29 | 2006-06-27 | Manoclean Technologies, Inc. | Methods for resist stripping and other processes for cleaning surfaces substantially free of contaminants |
| US7101260B2 (en)* | 2002-07-29 | 2006-09-05 | Nanoclean Technologies, Inc. | Methods for resist stripping and other processes for cleaning surfaces substantially free of contaminants |
| US7134941B2 (en)* | 2002-07-29 | 2006-11-14 | Nanoclean Technologies, Inc. | Methods for residue removal and corrosion prevention in a post-metal etch process |
| US6801354B1 (en) | 2002-08-20 | 2004-10-05 | Silicon Light Machines, Inc. | 2-D diffraction grating for substantially eliminating polarization dependent losses |
| US7057795B2 (en)* | 2002-08-20 | 2006-06-06 | Silicon Light Machines Corporation | Micro-structures with individually addressable ribbon pairs |
| US6712480B1 (en) | 2002-09-27 | 2004-03-30 | Silicon Light Machines | Controlled curvature of stressed micro-structures |
| US6928207B1 (en) | 2002-12-12 | 2005-08-09 | Silicon Light Machines Corporation | Apparatus for selectively blocking WDM channels |
| US20040112409A1 (en)* | 2002-12-16 | 2004-06-17 | Supercritical Sysems, Inc. | Fluoride in supercritical fluid for photoresist and residue removal |
| US20040177867A1 (en)* | 2002-12-16 | 2004-09-16 | Supercritical Systems, Inc. | Tetra-organic ammonium fluoride and HF in supercritical fluid for photoresist and residue removal |
| US7057819B1 (en) | 2002-12-17 | 2006-06-06 | Silicon Light Machines Corporation | High contrast tilting ribbon blazed grating |
| US6987600B1 (en) | 2002-12-17 | 2006-01-17 | Silicon Light Machines Corporation | Arbitrary phase profile for better equalization in dynamic gain equalizer |
| US6934070B1 (en) | 2002-12-18 | 2005-08-23 | Silicon Light Machines Corporation | Chirped optical MEM device |
| US6927891B1 (en) | 2002-12-23 | 2005-08-09 | Silicon Light Machines Corporation | Tilt-able grating plane for improved crosstalk in 1×N blaze switches |
| US7068372B1 (en) | 2003-01-28 | 2006-06-27 | Silicon Light Machines Corporation | MEMS interferometer-based reconfigurable optical add-and-drop multiplexor |
| US7286764B1 (en) | 2003-02-03 | 2007-10-23 | Silicon Light Machines Corporation | Reconfigurable modulator-based optical add-and-drop multiplexer |
| US20040154647A1 (en)* | 2003-02-07 | 2004-08-12 | Supercritical Systems, Inc. | Method and apparatus of utilizing a coating for enhanced holding of a semiconductor substrate during high pressure processing |
| US6947613B1 (en) | 2003-02-11 | 2005-09-20 | Silicon Light Machines Corporation | Wavelength selective switch and equalizer |
| US6922272B1 (en) | 2003-02-14 | 2005-07-26 | Silicon Light Machines Corporation | Method and apparatus for leveling thermal stress variations in multi-layer MEMS devices |
| US7027202B1 (en) | 2003-02-28 | 2006-04-11 | Silicon Light Machines Corp | Silicon substrate as a light modulator sacrificial layer |
| US6922273B1 (en) | 2003-02-28 | 2005-07-26 | Silicon Light Machines Corporation | PDL mitigation structure for diffractive MEMS and gratings |
| US6829077B1 (en) | 2003-02-28 | 2004-12-07 | Silicon Light Machines, Inc. | Diffractive light modulator with dynamically rotatable diffraction plane |
| US6806997B1 (en) | 2003-02-28 | 2004-10-19 | Silicon Light Machines, Inc. | Patterned diffractive light modulator ribbon for PDL reduction |
| US7391973B1 (en) | 2003-02-28 | 2008-06-24 | Silicon Light Machines Corporation | Two-stage gain equalizer |
| US7042611B1 (en) | 2003-03-03 | 2006-05-09 | Silicon Light Machines Corporation | Pre-deflected bias ribbons |
| US7163380B2 (en) | 2003-07-29 | 2007-01-16 | Tokyo Electron Limited | Control of fluid flow in the processing of an object with a fluid |
| DE10358967B4 (de)* | 2003-12-15 | 2006-11-16 | Universität Kassel | Mikrospiegelarray |
| US7307019B2 (en)* | 2004-09-29 | 2007-12-11 | Tokyo Electron Limited | Method for supercritical carbon dioxide processing of fluoro-carbon films |
| US20060102204A1 (en)* | 2004-11-12 | 2006-05-18 | Tokyo Electron Limited | Method for removing a residue from a substrate using supercritical carbon dioxide processing |
| US20060102208A1 (en)* | 2004-11-12 | 2006-05-18 | Tokyo Electron Limited | System for removing a residue from a substrate using supercritical carbon dioxide processing |
| US20060102591A1 (en)* | 2004-11-12 | 2006-05-18 | Tokyo Electron Limited | Method and system for treating a substrate using a supercritical fluid |
| US20060102590A1 (en)* | 2004-11-12 | 2006-05-18 | Tokyo Electron Limited | Method for treating a substrate with a high pressure fluid using a preoxide-based process chemistry |
| US7491036B2 (en)* | 2004-11-12 | 2009-02-17 | Tokyo Electron Limited | Method and system for cooling a pump |
| US7291565B2 (en)* | 2005-02-15 | 2007-11-06 | Tokyo Electron Limited | Method and system for treating a substrate with a high pressure fluid using fluorosilicic acid |
| US20060180572A1 (en)* | 2005-02-15 | 2006-08-17 | Tokyo Electron Limited | Removal of post etch residue for a substrate with open metal surfaces |
| US20060180174A1 (en)* | 2005-02-15 | 2006-08-17 | Tokyo Electron Limited | Method and system for treating a substrate with a high pressure fluid using a peroxide-based process chemistry in conjunction with an initiator |
| US20060186088A1 (en)* | 2005-02-23 | 2006-08-24 | Gunilla Jacobson | Etching and cleaning BPSG material using supercritical processing |
| US7550075B2 (en) | 2005-03-23 | 2009-06-23 | Tokyo Electron Ltd. | Removal of contaminants from a fluid |
| US20060226117A1 (en)* | 2005-03-29 | 2006-10-12 | Bertram Ronald T | Phase change based heating element system and method |
| US7399708B2 (en)* | 2005-03-30 | 2008-07-15 | Tokyo Electron Limited | Method of treating a composite spin-on glass/anti-reflective material prior to cleaning |
| US7442636B2 (en) | 2005-03-30 | 2008-10-28 | Tokyo Electron Limited | Method of inhibiting copper corrosion during supercritical CO2 cleaning |
| US20060255012A1 (en)* | 2005-05-10 | 2006-11-16 | Gunilla Jacobson | Removal of particles from substrate surfaces using supercritical processing |
| US7789971B2 (en)* | 2005-05-13 | 2010-09-07 | Tokyo Electron Limited | Treatment of substrate using functionalizing agent in supercritical carbon dioxide |
| US20070012337A1 (en)* | 2005-07-15 | 2007-01-18 | Tokyo Electron Limited | In-line metrology for supercritical fluid processing |
| US7580174B2 (en)* | 2005-11-23 | 2009-08-25 | Miradia, Inc. | Anti-stiction gas-phase lubricant for micromechanical systems |
| US7471439B2 (en)* | 2005-11-23 | 2008-12-30 | Miradia, Inc. | Process of forming a micromechanical system containing an anti-stiction gas-phase lubricant |
| US7723812B2 (en)* | 2005-11-23 | 2010-05-25 | Miradia, Inc. | Preferentially deposited lubricant to prevent anti-stiction in micromechanical systems |
| US7616370B2 (en)* | 2005-11-23 | 2009-11-10 | Miradia, Inc. | Preferentially deposited lubricant to prevent anti-stiction in micromechanical systems |
| US7463404B2 (en)* | 2005-11-23 | 2008-12-09 | Miradia, Inc. | Method of using a preferentially deposited lubricant to prevent anti-stiction in micromechanical systems |
| US8096665B2 (en)* | 2006-10-11 | 2012-01-17 | Miradia, Inc. | Spatially offset multi-imager-panel architecture for projecting an image |
| US7843695B2 (en)* | 2007-07-20 | 2010-11-30 | Honeywell International Inc. | Apparatus and method for thermal management using vapor chamber |
| US8031391B2 (en) | 2008-04-16 | 2011-10-04 | Texas Instruments Incorporated | System and method for operating light processing electronic devices |
| CN101750694B (zh)* | 2008-11-27 | 2012-11-21 | 鸿富锦精密工业(深圳)有限公司 | 解胶装置和解胶方法 |
| TWI415692B (zh)* | 2008-12-05 | 2013-11-21 | Hon Hai Prec Ind Co Ltd | 解膠裝置和解膠方法 |