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TW200834085A - Probe head module for multi-site probing - Google Patents

Probe head module for multi-site probing

Info

Publication number
TW200834085A
TW200834085ATW96105665ATW96105665ATW200834085ATW 200834085 ATW200834085 ATW 200834085ATW 96105665 ATW96105665 ATW 96105665ATW 96105665 ATW96105665 ATW 96105665ATW 200834085 ATW200834085 ATW 200834085A
Authority
TW
Taiwan
Prior art keywords
probe head
head module
transiting
pin
site probing
Prior art date
Application number
TW96105665A
Other languages
Chinese (zh)
Other versions
TWI317427B (en
Inventor
Hsiang-Ming Huang
An-Hong Liu
Yi-Chang Lee
Yeong-Jyh Lin
Shu-Ching Ho
Original Assignee
Chipmos Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chipmos Technologies IncfiledCriticalChipmos Technologies Inc
Priority to TW96105665ApriorityCriticalpatent/TWI317427B/en
Publication of TW200834085ApublicationCriticalpatent/TW200834085A/en
Application grantedgrantedCritical
Publication of TWI317427BpublicationCriticalpatent/TWI317427B/en

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Abstract

A probe head module for multi-site probing mainly comprises a probe head substrate and a plurality of pin transiting chips. The probe head substrate has a surface including a plurality of unit areas in an array. A plurality of pads are disposed within each unit area. Each pin transiting chip has an upper surface and a lower surface and includes a plurality of probe pins protruding from the upper surface and a plurality of connecting terminals disposed on the lower surface. The pin transiting chips are mounted on the corresponding unit areas so that the connecting terminals are bonded to the pads.
TW96105665A2007-02-152007-02-15Probe head module for multi-site probingTWI317427B (en)

Priority Applications (1)

Application NumberPriority DateFiling DateTitle
TW96105665ATWI317427B (en)2007-02-152007-02-15Probe head module for multi-site probing

Applications Claiming Priority (1)

Application NumberPriority DateFiling DateTitle
TW96105665ATWI317427B (en)2007-02-152007-02-15Probe head module for multi-site probing

Publications (2)

Publication NumberPublication Date
TW200834085Atrue TW200834085A (en)2008-08-16
TWI317427B TWI317427B (en)2009-11-21

Family

ID=44819350

Family Applications (1)

Application NumberTitlePriority DateFiling Date
TW96105665ATWI317427B (en)2007-02-152007-02-15Probe head module for multi-site probing

Country Status (1)

CountryLink
TW (1)TWI317427B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US8648616B2 (en)*2009-12-222014-02-11Ltx-Credence CorporationLoaded printed circuit board test fixture and method for manufacturing the same
TWI481384B (en)*2012-04-022015-04-21Univ Chung HuaBio probe assembly

Also Published As

Publication numberPublication date
TWI317427B (en)2009-11-21

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Legal Events

DateCodeTitleDescription
MM4AAnnulment or lapse of patent due to non-payment of fees

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