TW200632334A - Coplanar test board - Google Patents

Abstract

A coplanar test board includes a substrate, a plurality of testing pads, and a plurality of conductors. The testing pads are disposed on a first surface of the substrate. Each testing pads has a plane for a coplanar contact of a high frequency probe. The conductors are disposed on a second surface of the substrate and electrically connected to the corresponding testing pads through a plurality of vias of the substrate. Each conductor has a concave surface to contact a plurality of spherical electrodes of a DUT (Device Under Test). In order to test the DUT, the concave surfaces of the conductors contact the spherical electrodes of the DUT. A high frequency probe can test the DUT though the testing pads. Accordingly, the coplanar test board can prevent the damage of the DUT made by the high frequency probe and reduce contamination of the high frequency probe and it could be used repeatedly.