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SU598630A1 - Device for introducing into reaction chamber - Google Patents

Device for introducing into reaction chamber

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Publication number
SU598630A1
SU598630A1SU742054359ASU254359ASU598630A1SU 598630 A1SU598630 A1SU 598630A1SU 742054359 ASU742054359 ASU 742054359ASU 254359 ASU254359 ASU 254359ASU 598630 A1SU598630 A1SU 598630A1
Authority
SU
USSR - Soviet Union
Prior art keywords
rings
gases
bevel
gas
reaction chamber
Prior art date
Application number
SU742054359A
Other languages
Russian (ru)
Inventor
Николай Сидорович Веремейчук
Галина Александровна Иванова
Original Assignee
Предприятие П/Я Р-6707
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Publication date
Application filed by Предприятие П/Я Р-6707filedCriticalПредприятие П/Я Р-6707
Priority to SU742054359ApriorityCriticalpatent/SU598630A1/en
Application grantedgrantedCritical
Publication of SU598630A1publicationCriticalpatent/SU598630A1/en

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Translated fromRussian

(54) УСТРОЙСТВО ВВОДАГАЗОВ В РЕАКЦИОННУЮ КАМЕРУ(54) DEVICE OF INPUT OF GAS INTO THE REACTION CAMERA

/ .1Изобретение относитс  к устройствам ввода газов в реакционную камеру дл  процессов газовой эпитаксии, ркис:лёнш1 и диффузий и может быть использовано в полупроводниковой технике . -. . .в.известны  устройствах дл  эпитаксиального осаждени  подачу газов в камеру осуществл ют через трубки с отверсти ми, кольцеобразные каналй или капилл рные в корпусе реактора/ .1 The invention relates to gas injection devices in the reaction chamber for gas epitaxy processes, Rix: Lensh and diffusions and can be used in semiconductor technology. -. . .in known devices for epitaxial sedimentation, the flow of gases into the chamber is carried out through tubes with holes, annular channels or capillaries in the reactor vessel.

выполненные таким образом устройства ввода газов, однако, не обеспечивают необходимого смешивани  компонентов , однородного поступлени  их к осаждаемой поверхности. the gas injection devices thus designed, however, do not provide for the necessary mixing of the components, their uniform flow to the deposited surface.

Известно устройство ввода ;газа в реакционную камеру, например, ДЛ5| процессов эпитаксии, окислени  и диффузии содержащее газовые вводы и распределители потокрв, выполненные в виде колец с отверсти ми, которые произвольно расположены на рабочей стороне 4. В этом устройстве газовый поток на правл етс  в камеру параллельными ПУЧками , что также не обеспечивает высокой степени смешивани  газовых компонентов и их регулируемую подачу.A known input device; gas into the reaction chamber, for example, DL5 | epitaxy, oxidation and diffusion processes containing gas inlets and flow distributors made in the form of rings with holes that are arbitrarily located on the working side 4. In this device the gas flow is directed into the chamber in parallel BEAMS, which also does not provide a high degree of gas mixing components and their adjustable feed.

.Цель изобретени  - повышение степени смешивани  и регулировани  пода чи потоков..The purpose of the invention is to increase the degree of mixing and control of the flow of flow.

Дл  этого предложено кольца распределителей установить концантрично с возможностью перемещени  одного относительно другого кольца имеют пр - мЬугольное сечение со скосом внутрен него угла внешнего кольца, отверсти  которого выполнены на скосе.For this, it has been proposed to install distributor rings with a constant, with the possibility of moving one relative to another, a rectangular cross section with a bevel of the inner corner of the outer ring, the holes of which are made on the bevel.

Скос выполнен/под углом 40-45 к общей оси колец. . .The bevel is made / at an angle of 40-45 to the common axis of the rings. . .

Нафиг, .1 изображено устройство, общий вид,- на фиг. 2 - то же, поперечный разрез; на фиг. 3 - вид по стрелке/А нафиг. 1. ,Fig, .1 shows the device, a general view, - in FIG. 2 - the same, cross section; in fig. 3 - view along the arrow / A nafig. one. ,

Устроййтво включает в себ  средст ва дл  подачи газов - газовые ввсды, и 2, соединенные с распределител ми потоков газа 3 и 4 в камеру . Распределители 3 и 4 выполнены в виде колец 5 и б с Отверсти ми дл  впуска Газов в-камеру. Кольца распределителей установлены концентрично с возможностью перемещени  одного относительно другбго и имеют пр моугольное сечение со скосом 7 внутреннего угла внешнего кольца, отверсти  которого выполнены на скосе. Скос расположен под углом 40-45 к общей оси колец (фиг.З) Один из газовых компонентов поЯают через распределитель 4, а другой через распределитель 3. Получаемый га зовый поток, образуют два противолежащих телесных угла (см,фиг.2), что обеспечивает интенсивное и равномерное смешиванИе газовых компонентов. Перемещением распределител  4 вдоль оси относительно распределител  3 обеспечиваетс  смешивание газовых ком понентов непосредственно в зоне осаж дени  и регулировка рассто ни  точки смешивани  от обрабатываемой поверхности . Устройство может быть использован в процессах, где требуетс  высока  степень, смешивани  компонентов и однородности состава вблизи обрабатываемой поверхности, В качестве примера рассмотрим осс1ждение слоев двуокиси кремни  путем окислени .моносилана водородов в среде азота. Компоненты подают по распределител м 3 и 4 при расходе (л/мин): моносилана 1,2; кислорода 0,61; газоносител  10 Смешанный поток газа поступает к под ложкам, нагретым до 420с в зоне оса дени . Полученные слои двуокиси крем ни  толщиной О,.4 мкм при скорости их осаждени  0,08 мкм/мил. Разброс по то7пдине в партии составл ет10%. Таким образом, устройство.обеспечивает равномерную и регулируемую поThe device includes a means for supplying gases — gas inlets, and 2 — connected to gas distribution valves 3 and 4 into the chamber. Distributors 3 and 4 are made in the form of rings 5 and b with holes for the intake of gases into the chamber. The distributor rings are mounted concentrically with the possibility of moving one relative to each other and have a rectangular cross section with a bevel 7 of the inner corner of the outer ring, the openings of which are made on the bevel. The bevel is at an angle of 40-45 to the common axis of the rings (Fig. 3). One of the gas components appears through the distributor 4 and the other through the distributor 3. The resulting gas flow forms two opposite solid angles (see, figure 2), which provides intensive and uniform mixing of gas components. By moving the distributor 4 along the axis relative to the distributor 3, the gas components are mixed directly in the deposition zone and the distance of the mixing point from the treated surface is adjusted. The device can be used in processes that require a high degree of mixing of components and composition homogeneity near the surface to be treated. As an example, consider the precipitation of silicon dioxide layers by oxidizing hydrogen monosilane in a nitrogen atmosphere. Components served on the distributor m 3 and 4 at the flow rate (l / min): monosilane 1,2; oxygen 0.61; gas carrier 10 The mixed stream of gas flows to the substrates heated to 420 s in the sedimentation zone. The resulting layers of creme dioxide are neither thick, ~ 4 microns thick, or their deposition rate is 0.08 micron / mil. The scatter in the batch is 10%. Thus, the device. Provides uniform and adjustable

Claims (2)

Translated fromRussian
t. f дачу газов при их хорошей смешиваемости . Формула изобретени  1,Устройство ввода газов в реакционную камеру, например, дл  процессов эпитаксии, окислени  и диффузии, включающее средства дл  подачи газов, соединенные с распределител ми потоков газа, выполненными в виде колец с отверсти ми дл  впуска газов в камеру , отличающеес  тем, что, с целью повышени  степени смешивани  и регулировани  подачи потоков , кольца расгпределителей установлены концентрично с возможностью перемещени  одного относительно другого и имеют пр моугольное сечение со скосом внутреннего угла внешнего кольца, отверсти  которого выполнены на скосе,t. f giving gases with their good miscibility. Claim 1, A device for introducing gases into a reaction chamber, for example, for epitaxy, oxidation and diffusion processes, comprising means for supplying gases, connected to gas flow distributors made in the form of rings with openings for inlet gases into the chamber, characterized by that, in order to increase the degree of mixing and control of the flow, the distributor rings are mounted concentrically with the possibility of moving one relative to the other and have a rectangular cross section with an inclined inner corner rings, the holes of which are made on the bevel,2.Устройство по П.1, отличающеес  тем, что скос выполнен под углом 40-45° к общей оси колец . Источники информацииj прин тые во внимание при экспертизе; 1,Патент США (3381114,кл,219-38,5, 1968, 2,Патент США 37459б9,кл,118-48, 1973, 3,Патент Японии 10175гКЛ,99/5/В15, 1972, - . 4,Электронна  промышленность , 1973, 2, с,78-79,2. The device according to claim 1, characterized in that the bevel is made at an angle of 40-45 ° to the common axis of the rings. Sources of information taken into account in the examination; 1, US Patent (3381114, Cl, 219-38.5, 1968, 2, US Patent 37459b9, Cl, 118-48, 1973, 3, Japan Patent 10175gKL, 99/5 / B15, 1972, -. 4, Electronic industry, 1973, 2, p. 78-79,
SU742054359A1974-08-151974-08-15Device for introducing into reaction chamberSU598630A1 (en)

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SU742054359ASU598630A1 (en)1974-08-151974-08-15Device for introducing into reaction chamber

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Application NumberPriority DateFiling DateTitle
SU742054359ASU598630A1 (en)1974-08-151974-08-15Device for introducing into reaction chamber

Related Child Applications (1)

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SU772501175AAdditionSU638452A2 (en)1977-06-301977-06-30Arrangement for uniform load-relieving of long article

Publications (1)

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SU598630A1true SU598630A1 (en)1978-02-21

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Cited By (22)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US4928626A (en)*1989-05-191990-05-29Applied Materials, Inc.Reactant gas injection for IC processing
US5010842A (en)*1988-10-251991-04-30Mitsubishi Denki Kabushiki KaishaApparatus for forming thin film
US5160543A (en)*1985-12-201992-11-03Canon Kabushiki KaishaDevice for forming a deposited film
WO1997015698A1 (en)*1995-10-231997-05-01Watkins-Johnson CompanyGas injection system for semiconductor processing
US6090210A (en)*1996-07-242000-07-18Applied Materials, Inc.Multi-zone gas flow control in a process chamber
US7056806B2 (en)2003-09-172006-06-06Micron Technology, Inc.Microfeature workpiece processing apparatus and methods for controlling deposition of materials on microfeature workpieces
US7258892B2 (en)2003-12-102007-08-21Micron Technology, Inc.Methods and systems for controlling temperature during microfeature workpiece processing, e.g., CVD deposition
US7282239B2 (en)2003-09-182007-10-16Micron Technology, Inc.Systems and methods for depositing material onto microfeature workpieces in reaction chambers
US7323231B2 (en)2003-10-092008-01-29Micron Technology, Inc.Apparatus and methods for plasma vapor deposition processes
US7335396B2 (en)2003-04-242008-02-26Micron Technology, Inc.Methods for controlling mass flow rates and pressures in passageways coupled to reaction chambers and systems for depositing material onto microfeature workpieces in reaction chambers
US7344755B2 (en)2003-08-212008-03-18Micron Technology, Inc.Methods and apparatus for processing microfeature workpieces; methods for conditioning ALD reaction chambers
US7387685B2 (en)2002-07-082008-06-17Micron Technology, Inc.Apparatus and method for depositing materials onto microelectronic workpieces
US7422635B2 (en)2003-08-282008-09-09Micron Technology, Inc.Methods and apparatus for processing microfeature workpieces, e.g., for depositing materials on microfeature workpieces
US7481887B2 (en)2002-05-242009-01-27Micron Technology, Inc.Apparatus for controlling gas pulsing in processes for depositing materials onto micro-device workpieces
US7494560B2 (en)*2002-11-272009-02-24International Business Machines CorporationNon-plasma reaction apparatus and method
US7581511B2 (en)2003-10-102009-09-01Micron Technology, Inc.Apparatus and methods for manufacturing microfeatures on workpieces using plasma vapor processes
US7584942B2 (en)2004-03-312009-09-08Micron Technology, Inc.Ampoules for producing a reaction gas and systems for depositing materials onto microfeature workpieces in reaction chambers
US7588804B2 (en)2002-08-152009-09-15Micron Technology, Inc.Reactors with isolated gas connectors and methods for depositing materials onto micro-device workpieces
US7647886B2 (en)2003-10-152010-01-19Micron Technology, Inc.Systems for depositing material onto workpieces in reaction chambers and methods for removing byproducts from reaction chambers
US7699932B2 (en)2004-06-022010-04-20Micron Technology, Inc.Reactors, systems and methods for depositing thin films onto microfeature workpieces
US7906393B2 (en)2004-01-282011-03-15Micron Technology, Inc.Methods for forming small-scale capacitor structures
US8133554B2 (en)2004-05-062012-03-13Micron Technology, Inc.Methods for depositing material onto microfeature workpieces in reaction chambers and systems for depositing materials onto microfeature workpieces

Cited By (29)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US5160543A (en)*1985-12-201992-11-03Canon Kabushiki KaishaDevice for forming a deposited film
US5010842A (en)*1988-10-251991-04-30Mitsubishi Denki Kabushiki KaishaApparatus for forming thin film
US4928626A (en)*1989-05-191990-05-29Applied Materials, Inc.Reactant gas injection for IC processing
CN1115425C (en)*1995-10-232003-07-23应用材料公司Gas injection system for semiconductor processing
US5851294A (en)*1995-10-231998-12-22Watkins-Johnson CompanyGas injection system for semiconductor processing
WO1997015698A1 (en)*1995-10-231997-05-01Watkins-Johnson CompanyGas injection system for semiconductor processing
US6090210A (en)*1996-07-242000-07-18Applied Materials, Inc.Multi-zone gas flow control in a process chamber
US7481887B2 (en)2002-05-242009-01-27Micron Technology, Inc.Apparatus for controlling gas pulsing in processes for depositing materials onto micro-device workpieces
US7387685B2 (en)2002-07-082008-06-17Micron Technology, Inc.Apparatus and method for depositing materials onto microelectronic workpieces
US7588804B2 (en)2002-08-152009-09-15Micron Technology, Inc.Reactors with isolated gas connectors and methods for depositing materials onto micro-device workpieces
US7494560B2 (en)*2002-11-272009-02-24International Business Machines CorporationNon-plasma reaction apparatus and method
US7335396B2 (en)2003-04-242008-02-26Micron Technology, Inc.Methods for controlling mass flow rates and pressures in passageways coupled to reaction chambers and systems for depositing material onto microfeature workpieces in reaction chambers
US7344755B2 (en)2003-08-212008-03-18Micron Technology, Inc.Methods and apparatus for processing microfeature workpieces; methods for conditioning ALD reaction chambers
US7422635B2 (en)2003-08-282008-09-09Micron Technology, Inc.Methods and apparatus for processing microfeature workpieces, e.g., for depositing materials on microfeature workpieces
US7056806B2 (en)2003-09-172006-06-06Micron Technology, Inc.Microfeature workpiece processing apparatus and methods for controlling deposition of materials on microfeature workpieces
US7279398B2 (en)2003-09-172007-10-09Micron Technology, Inc.Microfeature workpiece processing apparatus and methods for controlling deposition of materials on microfeature workpieces
US7282239B2 (en)2003-09-182007-10-16Micron Technology, Inc.Systems and methods for depositing material onto microfeature workpieces in reaction chambers
US7323231B2 (en)2003-10-092008-01-29Micron Technology, Inc.Apparatus and methods for plasma vapor deposition processes
US7581511B2 (en)2003-10-102009-09-01Micron Technology, Inc.Apparatus and methods for manufacturing microfeatures on workpieces using plasma vapor processes
US7647886B2 (en)2003-10-152010-01-19Micron Technology, Inc.Systems for depositing material onto workpieces in reaction chambers and methods for removing byproducts from reaction chambers
US7258892B2 (en)2003-12-102007-08-21Micron Technology, Inc.Methods and systems for controlling temperature during microfeature workpiece processing, e.g., CVD deposition
US7771537B2 (en)2003-12-102010-08-10Micron Technology, Inc.Methods and systems for controlling temperature during microfeature workpiece processing, E.G. CVD deposition
US8518184B2 (en)2003-12-102013-08-27Micron Technology, Inc.Methods and systems for controlling temperature during microfeature workpiece processing, E.G., CVD deposition
US7906393B2 (en)2004-01-282011-03-15Micron Technology, Inc.Methods for forming small-scale capacitor structures
US8384192B2 (en)2004-01-282013-02-26Micron Technology, Inc.Methods for forming small-scale capacitor structures
US7584942B2 (en)2004-03-312009-09-08Micron Technology, Inc.Ampoules for producing a reaction gas and systems for depositing materials onto microfeature workpieces in reaction chambers
US8133554B2 (en)2004-05-062012-03-13Micron Technology, Inc.Methods for depositing material onto microfeature workpieces in reaction chambers and systems for depositing materials onto microfeature workpieces
US9023436B2 (en)2004-05-062015-05-05Micron Technology, Inc.Methods for depositing material onto microfeature workpieces in reaction chambers and systems for depositing materials onto microfeature workpieces
US7699932B2 (en)2004-06-022010-04-20Micron Technology, Inc.Reactors, systems and methods for depositing thin films onto microfeature workpieces

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