【発明の詳細な説明】[産業上の利用分野]本発明は薄膜能動素子アレイの製造方法に係り、特に液
晶ディスプレイに好適な能動素子アレイの製造方法に関
する。DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a method for manufacturing a thin film active device array, and particularly to a method for manufacturing an active device array suitable for liquid crystal displays.
[従来の技術]薄膜能動素子アレイは1通常、薄膜トランジスタ(TP
T)やダイオードをXYに配線したアレイ状に形成され
、その配線端部の端子がフレキシブルプリントケーブル
(FPC)等で外部回路に接続されている。その端子と
FPCの接続には、半田を使う方法や異方性導電シート
を使う方法が一般的に知られている。この内、後者は技
術的簡便であり、コスト面でも有利である。しかしなが
ら、配線金属と接続した場合、金属膜表面の酸化等のた
め接続不良が発生しやすいという問題がある。これに対
する代案として、金属酸化物膜(透明導電膜)を端子に
使用する方法があるが、金属酸化物自体が高抵抗である
ため、配線抵抗が増加するという問題があった。[Prior Art] Thin film active device arrays typically include thin film transistors (TP).
It is formed in an array in which T) and diodes are wired in an XY direction, and the terminals at the ends of the wires are connected to an external circuit with a flexible printed cable (FPC) or the like. Generally known methods include using solder and anisotropic conductive sheets to connect the terminals to the FPC. Of these, the latter is technically simple and advantageous in terms of cost. However, when connected to metal wiring, there is a problem in that poor connection is likely to occur due to oxidation of the surface of the metal film. As an alternative to this, there is a method of using a metal oxide film (transparent conductive film) for the terminal, but since the metal oxide itself has a high resistance, there is a problem that the wiring resistance increases.
また、能動素子アレイの形成工程において、XY配線を
完了した後、静電気により能動素子が破壊されるという
開運もあった。In addition, in the process of forming the active element array, there was a stroke of luck in which the active elements were destroyed by static electricity after completing the XY wiring.
この種の装置に関連するものとしては、例えば特開昭6
0−120322号、特開昭60−120321号、特
開昭60−111225号等がある。Examples of devices related to this type of device include, for example, Japanese Patent Application Laid-open No. 6
0-120322, JP-A-60-120321, JP-A-60-111225, etc.
[発明が解決しようとする問題点]異方導電性シートを使用した従来技術は、金属膜表面の
汚染による接触抵抗の増加や透明導電膜自体の抵抗によ
る接触抵抗の増加が配慮されておらず、配線抵抗が増加
してディスプレイとしての特性が劣化するという問題が
あった。[Problems to be Solved by the Invention] Conventional techniques using anisotropic conductive sheets do not take into consideration the increase in contact resistance due to contamination of the metal film surface and the increase in contact resistance due to the resistance of the transparent conductive film itself. However, there was a problem in that the wiring resistance increased and the display characteristics deteriorated.
さらに、従来技術では、能動素子アレイの配線パターン
を形成後、静電気により能動素子が破壊されることにつ
いての対策がなされておらず、歩留が低下するという問
題があった。Further, in the conventional technology, no measures have been taken to prevent the active elements from being destroyed by static electricity after forming the wiring pattern of the active element array, resulting in a problem of reduced yield.
本発明の目的は、工程数をまったく増加することなく、
上記の問題点を解決することにある。The purpose of the present invention is to: without increasing the number of steps at all;
The purpose is to solve the above problems.
[問題点を解決するための手段]上貼目的は、能動素子アレイの配線パターンを形成した
後、画素用透明導電膜パターンを形成する際に、端子部
上に透明導電膜パターンを形成し、さらに、端子を相互
に透明導電膜で接続するようにパターン化することで達
成される。[Means for solving the problem] The purpose of overlaying is to form a transparent conductive film pattern on the terminal portion when forming the transparent conductive film pattern for pixels after forming the wiring pattern of the active element array. Furthermore, this can be achieved by patterning the terminals so that they are connected to each other with a transparent conductive film.
[作用]端子金属パターン上に形成された透明導電膜は金属膜表
面の酸化汚染等による高抵抗絶縁膜の形成を防止するた
め、異方性導電ゴムとの接続は確実性を増し、信頼性が
向上する。[Function] The transparent conductive film formed on the terminal metal pattern prevents the formation of a high-resistance insulating film due to oxidation contamination on the metal film surface, so the connection with the anisotropic conductive rubber increases reliability. will improve.
また、透明導電膜パターンで配線を相互に接続すること
により、たとえ静電気により配線に高電圧が印加された
としても、能動素子自体には電圧が印加されないため、
静電破壊を若起することがない。In addition, by interconnecting the wiring with a transparent conductive film pattern, even if high voltage is applied to the wiring due to static electricity, no voltage is applied to the active element itself.
Does not cause electrostatic damage.
[実施例]以下1本発明の一実施例を第1図および第2図により説
明する。第1および第2図により説明する。第1図(a
)はTPTと画素電極部、(b)はゲート電極の端子部
、(e)はソース・ドレイン電極(信号線)の端子部の
断面図である。これらの位置関係を第2図に示す。ここ
では、薄膜製動素子としてのa−8iTPTを使用した
例を示す。[Example] An example of the present invention will be described below with reference to FIGS. 1 and 2. This will be explained with reference to FIGS. 1 and 2. Figure 1 (a
) is a cross-sectional view of the TPT and the pixel electrode part, (b) is a terminal part of the gate electrode, and (e) is a cross-sectional view of the terminal part of the source/drain electrode (signal line). Their positional relationship is shown in FIG. Here, an example is shown in which a-8iTPT is used as a thin film moving element.
まずガラス基板1上にゲート電極パターン2をCrによ
り形成した。次にSiNをゲートM縁膜3゜a−8iを
半導体膜4として形成し、それぞれパターン化した。こ
の堆積とパターン化は通常のP−CVD法とドライエツ
チング法によった。なお、a−8Lはiとnを積層して
2層に形成し、1層をコンタクト抵抗低減のために使用
するが、ここでは説明を簡単にするため1層として示し
た。First, a gate electrode pattern 2 was formed on a glass substrate 1 using Cr. Next, a gate M edge film 3°a-8i of SiN was formed as a semiconductor film 4 and patterned. This deposition and patterning was carried out by the usual P-CVD method and dry etching method. Note that a-8L is formed by laminating i and n to form two layers, and one layer is used for reducing contact resistance, but here, for simplicity of explanation, it is shown as one layer.
Cr5.AQ6の2重膜をソース・ドレイン電極として
形成した。その後、第2図に示すようにITO7を画素
電極として形成した。その際、ITOを各配線の端子部
上および、全端子を接続する形にパターンを残して形成
した。Cr5. A double film of AQ6 was formed as source/drain electrodes. Thereafter, as shown in FIG. 2, ITO 7 was formed as a pixel electrode. At that time, ITO was formed on the terminal portion of each wiring and in a form that connected all the terminals, leaving a pattern.
その後、SiN膜8をパッシベーション膜として堆積し
、TPTの光感度を低減させるために遮光膜としてAQ
等の金属膜aを堆積し、TPTを被覆するようにパター
ン化した。最後に端子部上のSiN膜8をドライエツチ
ングにより除去し、TFTアレイ基板を完成した。After that, a SiN film 8 is deposited as a passivation film, and an AQ film is deposited as a light shielding film to reduce the photosensitivity of TPT.
A metal film a was deposited and patterned to cover TPT. Finally, the SiN film 8 on the terminal portion was removed by dry etching to complete the TFT array substrate.
このTFTアレイ基板を使用して液晶デバイスプレイパ
ネルを組み立て、基板周辺の透明導電膜による端子接続
部を第2図の一点鎖線部で機械的に切断除去した後、異
方性導電シートを使用してFPCと接続し、外部駆動回
路に接続した。This TFT array substrate was used to assemble a liquid crystal device play panel, and after mechanically cutting and removing the terminal connections made of the transparent conductive film around the substrate along the dashed-dotted line in Figure 2, an anisotropic conductive sheet was used. It was connected to the FPC and connected to an external drive circuit.
このようにして得られた液晶ディスプレイの端子接続部
の信頼性は良好あり、寿命テストによる端子の接続不良
等は発生しなかった。The reliability of the terminal connection portion of the liquid crystal display thus obtained was good, and no terminal connection failures occurred during the life test.
また、ITOにより各配線が短絡されているため、XY
配線パターン形成後能動素子アレイ静電気によるTPT
の破壊もなく、歩留の向上がみられた。Also, since each wiring is short-circuited by ITO,
TPT using static electricity on active element array after wiring pattern formation
There was no destruction and the yield was improved.
なお、ここで必要なITOの膜厚は数十Å以上であれば
、特に問題は発生しない。Note that no particular problem will occur as long as the required ITO film thickness is several tens of angstroms or more.
[発明の効果]本発明によれば、端子部金属膜表面の汚染もしくは酸化
による絶縁性被膜の形成を防止できるため、端子接続の
信頼性が大幅に向上する。さらにそのために特に工程を
付加する必要がなく、画素電極形成時に同時に端子表面
保護が出来る。[Effects of the Invention] According to the present invention, it is possible to prevent the formation of an insulating film due to contamination or oxidation on the surface of the terminal metal film, thereby significantly improving the reliability of terminal connection. Furthermore, there is no need to add any special process for this purpose, and the terminal surface can be protected at the same time as forming the pixel electrode.
さらに、TPTの配線形成直後に全端子を短絡するため
、静電気によりTPTの破壊が防止されるという効果が
ある。Furthermore, since all the terminals are short-circuited immediately after the TPT wiring is formed, there is an effect that destruction of the TPT due to static electricity is prevented.
なお、ここでは、能動素子としてTPTについてのみ記
載したが、これ以外の例えば、半導体ダイオード、MI
Mダイオードの場合も同様な効果が見られることは言う
までもない。Note that although only TPT has been described as an active element here, other types such as semiconductor diodes, MI
Needless to say, a similar effect can be seen in the case of the M diode.
また、ITOでなく、In203t 5n02でも同様
の効果が見られた。Furthermore, similar effects were observed with In203t 5n02 instead of ITO.
第1図は本発明の一実施例の断面図であり、(a)はT
PTと画素電極部、(b)はゲート電極配線の端子部、
(C)はソース・ドレイン電極すなわち信号線の端子部
を示す。第2図はこれらの位置関係を示す平面図である
。2・・・ゲート電極、3・・・ゲート絶縁膜、4・・・
半導体膜、5・・・ソース・ドレイン電極用Cr、6・
・・AQ、7・・・ITO18・・・パッシベーション
膜、9・・・遮光膜。FIG. 1 is a sectional view of one embodiment of the present invention, and (a) is T
PT and pixel electrode part, (b) is the terminal part of gate electrode wiring,
(C) shows the source/drain electrodes, that is, the terminal portions of the signal lines. FIG. 2 is a plan view showing their positional relationship. 2... Gate electrode, 3... Gate insulating film, 4...
Semiconductor film, 5... Cr for source/drain electrodes, 6.
...AQ, 7...ITO18...passivation film, 9...light shielding film.
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62151107AJP2624687B2 (en) | 1987-06-19 | 1987-06-19 | Method for manufacturing thin film active element array |
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62151107AJP2624687B2 (en) | 1987-06-19 | 1987-06-19 | Method for manufacturing thin film active element array |
| Publication Number | Publication Date |
|---|---|
| JPS63316084Atrue JPS63316084A (en) | 1988-12-23 |
| JP2624687B2 JP2624687B2 (en) | 1997-06-25 |
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62151107AExpired - LifetimeJP2624687B2 (en) | 1987-06-19 | 1987-06-19 | Method for manufacturing thin film active element array |
| Country | Link |
|---|---|
| JP (1) | JP2624687B2 (en) |
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|---|---|---|---|---|
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| JPH02121727U (en)* | 1989-03-17 | 1990-10-03 | ||
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6148978A (en)* | 1984-08-16 | 1986-03-10 | Seiko Epson Corp | active matrix board |
| JPS62131578A (en)* | 1985-12-03 | 1987-06-13 | Seiko Instr & Electronics Ltd | Manufacturing method of thin film transistor |
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|---|---|---|---|---|
| JPH02188724A (en)* | 1989-01-18 | 1990-07-24 | Hitachi Ltd | Method of forming terminals of liquid crystal display device |
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| JP2008015460A (en)* | 2006-06-30 | 2008-01-24 | Lg Philips Lcd Co Ltd | Method for manufacturing liquid crystal display device and liquid crystal display device |
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| JP2624687B2 (en) | 1997-06-25 |
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| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term | ||
| FPAY | Renewal fee payment (event date is renewal date of database) | Free format text:PAYMENT UNTIL: 20080411 Year of fee payment:11 |