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JPS57157164A - Testing method for reliability in thermo-acceleration of integrated circuit - Google Patents

Testing method for reliability in thermo-acceleration of integrated circuit

Info

Publication number
JPS57157164A
JPS57157164AJP56042503AJP4250381AJPS57157164AJP S57157164 AJPS57157164 AJP S57157164AJP 56042503 AJP56042503 AJP 56042503AJP 4250381 AJP4250381 AJP 4250381AJP S57157164 AJPS57157164 AJP S57157164A
Authority
JP
Japan
Prior art keywords
coder
analog signal
square
signals
square wave
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56042503A
Other languages
Japanese (ja)
Inventor
Takeshi Mizusawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone CorpfiledCriticalNippon Telegraph and Telephone Corp
Priority to JP56042503ApriorityCriticalpatent/JPS57157164A/en
Publication of JPS57157164ApublicationCriticalpatent/JPS57157164A/en
Pendinglegal-statusCriticalCurrent

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Abstract

PURPOSE:To prevent the breakage of a CODER at the turning on of a power source eliminating the need for an exclusive square wave oscillator by inputting easy ti generate square signals into an analog signal input terminal. CONSTITUTION:Square signals having an appropriate amplitude made by R1 and R2 are applied to an analog signal input terminal 2 of a CODER to be tested from an output terminal 1 of a square wave generation circuit. The square wave generation cicuit can be composed of one IC and several resistance capacitors. The symbol C indicates a capacitor for removing a DC content. The CODER being tested is placed at a high temperature (e.g. about 150 deg.C). A PCM coding circuit in the CODER codes analog signals. So, even when an aquare wave is applied, an electric stress can be provided to an internal circuit of the CODER in such a manner as to be equivelent to that when an analog signal is applied. This elminates special testing device thereby the testing with a simple oscillator can be achieved.
JP56042503A1981-03-251981-03-25Testing method for reliability in thermo-acceleration of integrated circuitPendingJPS57157164A (en)

Priority Applications (1)

Application NumberPriority DateFiling DateTitle
JP56042503AJPS57157164A (en)1981-03-251981-03-25Testing method for reliability in thermo-acceleration of integrated circuit

Applications Claiming Priority (1)

Application NumberPriority DateFiling DateTitle
JP56042503AJPS57157164A (en)1981-03-251981-03-25Testing method for reliability in thermo-acceleration of integrated circuit

Publications (1)

Publication NumberPublication Date
JPS57157164Atrue JPS57157164A (en)1982-09-28

Family

ID=12637866

Family Applications (1)

Application NumberTitlePriority DateFiling Date
JP56042503APendingJPS57157164A (en)1981-03-251981-03-25Testing method for reliability in thermo-acceleration of integrated circuit

Country Status (1)

CountryLink
JP (1)JPS57157164A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
JPH01129174A (en)*1987-11-131989-05-22Matsushita Electron CorpIntegrated circuit testing apparatus
JPH01140083A (en)*1987-11-261989-06-01Matsushita Electron CorpApparatus for testing integrated circuit
US5168219A (en)*1988-10-311992-12-01Fujitsu LimitedIntegrated circuit device having signal discrimination circuit and method of testing the same
JP2017528293A (en)*2014-09-122017-09-28アルバート ヌーネス Apparatus and method for providing hyperthermia
US11883644B2 (en)2017-12-192024-01-30Innovarius Corp.Apparatus for creating resonant standing waves in biological tissue

Citations (3)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
JPS4984349A (en)*1972-12-181974-08-13
JPS53124984A (en)*1977-04-071978-10-31Mitsubishi Electric CorpBurn-in system
JPS5460545A (en)*1977-10-241979-05-16Hewlett Packard YokogawaSine wave signal generator

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
JPS4984349A (en)*1972-12-181974-08-13
JPS53124984A (en)*1977-04-071978-10-31Mitsubishi Electric CorpBurn-in system
JPS5460545A (en)*1977-10-241979-05-16Hewlett Packard YokogawaSine wave signal generator

Cited By (8)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
JPH01129174A (en)*1987-11-131989-05-22Matsushita Electron CorpIntegrated circuit testing apparatus
JPH01140083A (en)*1987-11-261989-06-01Matsushita Electron CorpApparatus for testing integrated circuit
US5168219A (en)*1988-10-311992-12-01Fujitsu LimitedIntegrated circuit device having signal discrimination circuit and method of testing the same
US5304923A (en)*1988-10-311994-04-19Fujitsu LimitedIntegrated circuit device having signal discrimination circuit and method of testing the same
US5365167A (en)*1988-10-311994-11-15Fujitsu LimitedIntegrated circuit device having signal discrimination circuit and method of testing the same
JP2017528293A (en)*2014-09-122017-09-28アルバート ヌーネス Apparatus and method for providing hyperthermia
US11324961B2 (en)2014-09-122022-05-10Albert NunezApparatus and method for providing hyperthermia therapy
US11883644B2 (en)2017-12-192024-01-30Innovarius Corp.Apparatus for creating resonant standing waves in biological tissue

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