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JPS57110908A - Measuring method for shape of object - Google Patents

Measuring method for shape of object

Info

Publication number
JPS57110908A
JPS57110908AJP18766080AJP18766080AJPS57110908AJP S57110908 AJPS57110908 AJP S57110908AJP 18766080 AJP18766080 AJP 18766080AJP 18766080 AJP18766080 AJP 18766080AJP S57110908 AJPS57110908 AJP S57110908A
Authority
JP
Japan
Prior art keywords
point
axis line
projection light
distance
shape
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18766080A
Other languages
Japanese (ja)
Other versions
JPS6248162B2 (en
Inventor
Kazuo Tanie
Kiyoshi Komoriya
Tomoaki Nagasu
Susumu Tate
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and TechnologyfiledCriticalAgency of Industrial Science and Technology
Priority to JP18766080ApriorityCriticalpatent/JPS57110908A/en
Publication of JPS57110908ApublicationCriticalpatent/JPS57110908A/en
Publication of JPS6248162B2publicationCriticalpatent/JPS6248162B2/ja
Grantedlegal-statusCriticalCurrent

Links

Classifications

Landscapes

Abstract

PURPOSE:To measure a shape of an object, by utilizing the fact that, when incident light to a certain point on a surface of an object having a curved shape and to another point and the reflection lights of said incident lights satisfy a geometrical condition, said two points are judged as being located in a contour position. CONSTITUTION:A point P1 and a point P2 in a projection light device on an axis line L in common to a projection light device 10 and a collector 12 are produced, a projection light, which is caused to pass a point P positioned at a distance l1 from the axis line L, is reflected by a point A1 and a point A2, and a reflection light, passing through a point Q located at a distance l1 from the axis line L, is collected at a point Q1 and a point Q2 on a photoelectric conversion surface on the axis line L. In the case of P1P2=Q1Q2, the points A1 and A2 on the object pass PQ, and are positioned at an equal distance from a plane perpendicular to a paper surface. Through the rotation of a projector, P1 and P2 are projected in order at a pitch DELTAx to analyze an image-formation on a photoelectric conversion surface 13, and this obtains a contour line.
JP18766080A1980-12-271980-12-27Measuring method for shape of objectGrantedJPS57110908A (en)

Priority Applications (1)

Application NumberPriority DateFiling DateTitle
JP18766080AJPS57110908A (en)1980-12-271980-12-27Measuring method for shape of object

Applications Claiming Priority (1)

Application NumberPriority DateFiling DateTitle
JP18766080AJPS57110908A (en)1980-12-271980-12-27Measuring method for shape of object

Publications (2)

Publication NumberPublication Date
JPS57110908Atrue JPS57110908A (en)1982-07-10
JPS6248162B2 JPS6248162B2 (en)1987-10-13

Family

ID=16209950

Family Applications (1)

Application NumberTitlePriority DateFiling Date
JP18766080AGrantedJPS57110908A (en)1980-12-271980-12-27Measuring method for shape of object

Country Status (1)

CountryLink
JP (1)JPS57110908A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
JPS60152909A (en)*1984-01-211985-08-12Sanwa Seiki KkNon-contact type three-dimensional measuring instrument
US6876458B2 (en)*2002-03-202005-04-05Steinbichler Optotechnik GmbhMethod and device for determining the absolute coordinates of an object

Cited By (2)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
JPS60152909A (en)*1984-01-211985-08-12Sanwa Seiki KkNon-contact type three-dimensional measuring instrument
US6876458B2 (en)*2002-03-202005-04-05Steinbichler Optotechnik GmbhMethod and device for determining the absolute coordinates of an object

Also Published As

Publication numberPublication date
JPS6248162B2 (en)1987-10-13

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