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JPS56150858A - Semiconductor device and manufacture thereof - Google Patents

Semiconductor device and manufacture thereof

Info

Publication number
JPS56150858A
JPS56150858AJP5413480AJP5413480AJPS56150858AJP S56150858 AJPS56150858 AJP S56150858AJP 5413480 AJP5413480 AJP 5413480AJP 5413480 AJP5413480 AJP 5413480AJP S56150858 AJPS56150858 AJP S56150858A
Authority
JP
Japan
Prior art keywords
layer
type
gate
gate electrode
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5413480A
Other languages
Japanese (ja)
Inventor
Takashi Sakamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi LtdfiledCriticalHitachi Ltd
Priority to JP5413480ApriorityCriticalpatent/JPS56150858A/en
Publication of JPS56150858ApublicationCriticalpatent/JPS56150858A/en
Pendinglegal-statusCriticalCurrent

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Abstract

PURPOSE:To highly integrate and accelerate the operation of a vertical ROM by serially connecting an FET having a gate electrode of the first layer and an FET having a gate electrode of the second layer so disposed that the gate electrodes of the two layers are alternately contacted with one another. CONSTITUTION:A p<+> type diffused layer 2 is formed on an n type substrate 1, and a windowlike channel region 1a is formed on the substrate. The first layer gate electrodes 5 (polysilicon) are disposed at a predetermined interval through a gate film 3 on the region 1a. The second layer gate electrode 7 is so formed as to partly superpose with the first layer gate electrode 5 covered with an insulating layer 6. The respective gate electrodes of the two layers extend to be connected to the input unit. A p<+> type diffused layer 2 is connected to a power source, an output and an earth via aluminum electrode wires 8. Since the FETs are connected serially without providing a p<+> type diffused layer between the respective gates in this manner, it can reduce the predetermined area and the floating capacity of the vertical ROM. The modes of the respective FETs can be formed in any of E type or D type by selectively introducing impurity to the substrate at the lower parts of the respective gate regions.
JP5413480A1980-04-251980-04-25Semiconductor device and manufacture thereofPendingJPS56150858A (en)

Priority Applications (1)

Application NumberPriority DateFiling DateTitle
JP5413480AJPS56150858A (en)1980-04-251980-04-25Semiconductor device and manufacture thereof

Applications Claiming Priority (1)

Application NumberPriority DateFiling DateTitle
JP5413480AJPS56150858A (en)1980-04-251980-04-25Semiconductor device and manufacture thereof

Publications (1)

Publication NumberPublication Date
JPS56150858Atrue JPS56150858A (en)1981-11-21

Family

ID=12962103

Family Applications (1)

Application NumberTitlePriority DateFiling Date
JP5413480APendingJPS56150858A (en)1980-04-251980-04-25Semiconductor device and manufacture thereof

Country Status (1)

CountryLink
JP (1)JPS56150858A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
JPS62214594A (en)*1986-03-141987-09-21Nec CorpSemiconductor memory device
JPS63104469A (en)*1986-10-221988-05-09Hitachi Ltd Method for manufacturing semiconductor integrated circuit device
JPS6431456A (en)*1987-07-271989-02-01Sharp KkSemiconductor device
US5442209A (en)*1992-05-301995-08-15Gold Star Electron Co., Ltd.Synapse MOS transistor

Citations (2)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
JPS5341188A (en)*1976-08-251978-04-14Hitachi LtdMis type semiconductor device
JPS54138383A (en)*1978-04-201979-10-26Nippon Telegr & Teleph Corp <Ntt>Semiconductor memory device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
JPS5341188A (en)*1976-08-251978-04-14Hitachi LtdMis type semiconductor device
JPS54138383A (en)*1978-04-201979-10-26Nippon Telegr & Teleph Corp <Ntt>Semiconductor memory device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
JPS62214594A (en)*1986-03-141987-09-21Nec CorpSemiconductor memory device
JPS63104469A (en)*1986-10-221988-05-09Hitachi Ltd Method for manufacturing semiconductor integrated circuit device
JPS6431456A (en)*1987-07-271989-02-01Sharp KkSemiconductor device
US5442209A (en)*1992-05-301995-08-15Gold Star Electron Co., Ltd.Synapse MOS transistor

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