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JPS52104256A - Thickness measuring device - Google Patents

Thickness measuring device

Info

Publication number
JPS52104256A
JPS52104256AJP2079876AJP2079876AJPS52104256AJP S52104256 AJPS52104256 AJP S52104256AJP 2079876 AJP2079876 AJP 2079876AJP 2079876 AJP2079876 AJP 2079876AJP S52104256 AJPS52104256 AJP S52104256A
Authority
JP
Japan
Prior art keywords
measuring device
thickness measuring
transparent body
thickness
contacting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2079876A
Other languages
Japanese (ja)
Inventor
Kozo Uchida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Iwatsu Electric Co Ltd
Original Assignee
Iwatsu Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Iwatsu Electric Co LtdfiledCriticalIwatsu Electric Co Ltd
Priority to JP2079876ApriorityCriticalpatent/JPS52104256A/en
Publication of JPS52104256ApublicationCriticalpatent/JPS52104256A/en
Pendinglegal-statusCriticalCurrent

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Abstract

PURPOSE: To make it possible to measure the thickness of transparent body not only with ordinary temperature but also in the state of high temperature, without contacting it, by means of radiating light beam from the oblique direction on a transparent body such as sheet glass and so on.
COPYRIGHT: (C)1977,JPO&Japio
JP2079876A1976-02-271976-02-27Thickness measuring devicePendingJPS52104256A (en)

Priority Applications (1)

Application NumberPriority DateFiling DateTitle
JP2079876AJPS52104256A (en)1976-02-271976-02-27Thickness measuring device

Applications Claiming Priority (1)

Application NumberPriority DateFiling DateTitle
JP2079876AJPS52104256A (en)1976-02-271976-02-27Thickness measuring device

Publications (1)

Publication NumberPublication Date
JPS52104256Atrue JPS52104256A (en)1977-09-01

Family

ID=12037070

Family Applications (1)

Application NumberTitlePriority DateFiling Date
JP2079876APendingJPS52104256A (en)1976-02-271976-02-27Thickness measuring device

Country Status (1)

CountryLink
JP (1)JPS52104256A (en)

Cited By (12)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
JPS60117231A (en)*1983-11-291985-06-24Mita Ind Co LtdCorrecting device of image distortion
JPS60117230A (en)*1983-11-291985-06-24Mita Ind Co LtdFocus controller of optical scanning part
JPS60117232A (en)*1983-11-291985-06-24Mita Ind Co LtdController for optical scanning part
JPS643503A (en)*1987-06-251989-01-09Fujitsu LtdMethod for measuring thickness of crystal layer
JPH06160031A (en)*1992-08-191994-06-07Owens Brockway Glass Container IncMeasurement of thickness of wall of transparent container
FR2751068A1 (en)*1996-07-091998-01-16Lasers Et Tech Avancees BureauContactless glass thickness measuring optical device
JP2008506095A (en)*2004-07-062008-02-28コミサリア、ア、レネルジ、アトミク Optical device for measuring the thickness of at least partly transparent media
JP2008527380A (en)*2005-01-112008-07-24コーニング インコーポレイテッド Online thickness measuring device and measuring method of thickness of moving glass substrate
JP2009059427A (en)*2007-08-312009-03-19Hoya Corp Method for manufacturing glass substrate for magnetic disk, method for manufacturing magnetic disk, and plate thickness measuring apparatus
JP2009223164A (en)*2008-03-182009-10-01Olympus CorpMicroscopic image photographing apparatus
JP2016500817A (en)*2012-10-182016-01-14エムエスセ エ エスジェセセＭｓｃ ＆ Ｓｇｃｃ Equipment for measuring wall thickness of containers
JP2017015675A (en)*2015-07-022017-01-19達仁 郭 Apparatus and method for instantly identifying photoelectric glass substrate with high accuracy

Citations (2)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
JPS499264A (en)*1972-05-121974-01-26
JPS4943660A (en)*1972-05-221974-04-24

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
JPS499264A (en)*1972-05-121974-01-26
JPS4943660A (en)*1972-05-221974-04-24

Cited By (13)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
JPS60117231A (en)*1983-11-291985-06-24Mita Ind Co LtdCorrecting device of image distortion
JPS60117230A (en)*1983-11-291985-06-24Mita Ind Co LtdFocus controller of optical scanning part
JPS60117232A (en)*1983-11-291985-06-24Mita Ind Co LtdController for optical scanning part
JPS643503A (en)*1987-06-251989-01-09Fujitsu LtdMethod for measuring thickness of crystal layer
JPH06160031A (en)*1992-08-191994-06-07Owens Brockway Glass Container IncMeasurement of thickness of wall of transparent container
FR2751068A1 (en)*1996-07-091998-01-16Lasers Et Tech Avancees BureauContactless glass thickness measuring optical device
JP2008506095A (en)*2004-07-062008-02-28コミサリア、ア、レネルジ、アトミク Optical device for measuring the thickness of at least partly transparent media
JP2008527380A (en)*2005-01-112008-07-24コーニング インコーポレイテッド Online thickness measuring device and measuring method of thickness of moving glass substrate
KR101325426B1 (en)*2005-01-112013-11-04코닝 인코포레이티드On-line thickness gauge and method for measuring the thickness of a moving glass substrate
JP2009059427A (en)*2007-08-312009-03-19Hoya Corp Method for manufacturing glass substrate for magnetic disk, method for manufacturing magnetic disk, and plate thickness measuring apparatus
JP2009223164A (en)*2008-03-182009-10-01Olympus CorpMicroscopic image photographing apparatus
JP2016500817A (en)*2012-10-182016-01-14エムエスセ エ エスジェセセＭｓｃ ＆ Ｓｇｃｃ Equipment for measuring wall thickness of containers
JP2017015675A (en)*2015-07-022017-01-19達仁 郭 Apparatus and method for instantly identifying photoelectric glass substrate with high accuracy

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