JPS51137379U - - Google Patents

Info

Publication number: JPS51137379U
Authority: JP; Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Granted

Other versions

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1975-04-11

Filing date

1975-04-11

Publication date

1976-11-05

1975-04-11Application filedfiledCritical

1975-04-11Priority to JP4892275UpriorityCriticalpatent/JPS55941Y2/ja

1976-11-05Publication of JPS51137379UpublicationCriticalpatent/JPS51137379U/ja

1980-01-11Application grantedgrantedCritical

1980-01-11Publication of JPS55941Y2publicationCriticalpatent/JPS55941Y2/ja

StatusExpiredlegal-statusCriticalCurrent

Landscapes

Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
Measurement Of Current Or Voltage (AREA)

JP4892275U1975-04-111975-04-11ExpiredJPS55941Y2 (en)

Priority Applications (1)

Application Number	Priority Date	Filing Date	Title
JP4892275UJPS55941Y2 (en)	1975-04-11	1975-04-11

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP4892275UJPS55941Y2 (en)	1975-04-11	1975-04-11

Publications (2)

Publication Number	Publication Date
JPS51137379Utrue JPS51137379U (en)	1976-11-05
JPS55941Y2 JPS55941Y2 (en)	1980-01-11

Family

ID=28189773

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP4892275UExpiredJPS55941Y2 (en)	1975-04-11	1975-04-11

Country Status (1)

Country	Link
JP (1)	JPS55941Y2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US9337071B2 (en)	1998-07-15	2016-05-10	Rudolph Technologies, Inc.	Automated wafer defect inspection system and a process of performing such inspection

1975
- 1975-04-11JPJP4892275Upatent/JPS55941Y2/janot_activeExpired

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US9337071B2 (en)	1998-07-15	2016-05-10	Rudolph Technologies, Inc.	Automated wafer defect inspection system and a process of performing such inspection
US9464992B2 (en)	1998-07-15	2016-10-11	Rudolph Technologies, Inc.	Automated wafer defect inspection system and a process of performing such inspection

Also Published As

Publication number	Publication date
JPS55941Y2 (en)	1980-01-11

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