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JPH05215603A - Spectral reflectance measuring apparatus - Google Patents

Spectral reflectance measuring apparatus

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Publication number
JPH05215603A
JPH05215603AJP4596892AJP4596892AJPH05215603AJP H05215603 AJPH05215603 AJP H05215603AJP 4596892 AJP4596892 AJP 4596892AJP 4596892 AJP4596892 AJP 4596892AJP H05215603 AJPH05215603 AJP H05215603A
Authority
JP
Japan
Prior art keywords
sample
measurement
spectral reflectance
optical system
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4596892A
Other languages
Japanese (ja)
Inventor
Tatsumi Sato
辰巳 佐藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu CorpfiledCriticalShimadzu Corp
Priority to JP4596892ApriorityCriticalpatent/JPH05215603A/en
Publication of JPH05215603ApublicationCriticalpatent/JPH05215603A/en
Pendinglegal-statusCriticalCurrent

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Abstract

Translated fromJapanese

(57)【要約】【目的】 1台の装置で、上部設置型、下部設置型、側
部設置型のいずれの方法でも測定を行なうことのできる
分光反射率測定装置。【構成】 試料29を載置する基準板13と分光光学系
25〜27を、水平軸17回りに回転可能とした。【効果】 基準板13が上側で水平となる第1測定位置
では上部設置型として、下側となる第2測定位置では下
部設置型として使用することができる。
(57) [Abstract] [Purpose] A spectral reflectance measurement device that can perform measurements by any one of the upper installation type, the lower installation type, and the side installation type with a single device. [Configuration] The reference plate 13 on which the sample 29 is mounted and the spectroscopic optical systems 25 to 27 are rotatable about the horizontal axis 17. [Effect] The reference plate 13 can be used as an upper installation type at a first measurement position where the reference plate 13 is horizontal on the upper side, and as a lower installation type at a second measurement position that is below.

Description

Translated fromJapanese
【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、分光色彩計、分光光度
計等の分光反射率測定装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a spectral reflectance measuring device such as a spectrocolorimeter and a spectrophotometer.

【0002】[0002]

【従来の技術】分光反射率測定装置を試料の設置方法か
ら分類すると、(1)試料50を測定部51の上に置く
だけの上部設置型(図3(a))、(2)試料50を測
定部52の下に置く下部設置型(b)、(3)試料50
を測定部53の横に保持する側部設置型(c)、の3種
に分けられる。
2. Description of the Related Art Classifying a spectral reflectance measuring device according to a sample installation method includes (1) an upper installation type in which a sample 50 is simply placed on a measuring section 51 (FIG. 3A), and (2) a sample 50. Bottom mounting type (b), (3) sample 50 for placing the sample under the measuring section 52
Is installed on the side of the measuring unit 53, and is divided into three types: a side-mounted type (c).

【0003】このうち、上部設置型では試料は単に測定
部の上に置くだけでよく、それにより試料の表面は測定
部内部の光学系に対して所定の位置に置かれることにな
る。このため、試料表面を光学系に対して位置合わせす
るための試料保持機構を特に必要としない。また、試料
の大きさにあまり制限がないという利点もある。しか
し、液体或いはペースト状の試料や、固めることのでき
ない粉末試料等の場合には、試料を透明な容器に入れる
か測定部の穴に透明な蓋をする等の対策を施さなければ
ならないが、これらの場合、光が透明物質を通過するこ
とによる本質的な測定誤差を避けることができない。
Of these, in the top-mounted type, the sample is simply placed on the measuring section, whereby the surface of the sample is placed at a predetermined position with respect to the optical system inside the measuring section. Therefore, a sample holding mechanism for aligning the sample surface with the optical system is not particularly required. There is also an advantage that the size of the sample is not so limited. However, in the case of liquid or pasty samples, powder samples that cannot be solidified, etc., it is necessary to take measures such as putting the sample in a transparent container or putting a transparent lid on the hole of the measurement unit. In these cases, the inherent measurement error due to light passing through the transparent material is unavoidable.

【0004】下部設置型は、固体はもとより、液体、粉
体等、ほとんどの形態の試料を異物質を介することなく
直接測定することができるという利点がある。しかし、
試料を入れるための容器や試料の表面を測定部の光学系
の所定位置に正確に置くための移動機構等、種々の試料
取扱機構が必要となるとともに、操作が複雑となる。ま
た、試料の大きさに対する制限も大きい。側部設置型は
装置内部の光学系のレイアウトが簡単になり、装置全体
を小型化しやすいという利点はあるが、試料の取扱とい
う点ではむしろ下部設置型よりも制限が大きい。
The bottom-mounted type has an advantage that not only solids but also liquids, powders, and almost all types of samples can be directly measured without passing through different substances. But,
Various sample handling mechanisms such as a container for holding the sample and a moving mechanism for accurately placing the surface of the sample at a predetermined position of the optical system of the measuring section are required, and the operation becomes complicated. In addition, there are large restrictions on the size of the sample. The side-mounted type has the advantage of simplifying the layout of the optical system inside the device and making it easier to downsize the entire device, but it is rather more restrictive than the bottom-mounted type in terms of sample handling.

【0005】[0005]

【発明が解決しようとする課題】上記の通り、試料が液
体等である場合には下部設置型で測定を行なわねばなら
ないが、試料が固体である場合には操作が容易である上
部設置型で測定を行なった方がずっと能率が良い。しか
し、従来、これら3種の分光反射率測定装置は別個に製
造され、市販されていたため、このような使い分けをし
ようとすると3種の測定装置を全て購入しておかなけれ
ばならなかった。本発明はこのような課題を解決するた
めに成されたものであり、その目的とするところは1台
の装置で上記3種の型のいずれの方法でも測定を行なう
ことのできる分光反射率測定装置を提供することにあ
る。
As described above, when the sample is a liquid or the like, the measurement must be performed by the lower mount type, but when the sample is a solid, the upper mount type is easy to operate. It is much more efficient to take measurements. However, in the past, these three types of spectral reflectance measuring devices were separately manufactured and commercially available, so that it was necessary to purchase all three types of measuring devices in order to use them properly. The present invention has been made to solve such a problem, and an object of the present invention is to measure a spectral reflectance capable of performing measurement by any one of the above three types of methods with one device. To provide a device.

【0006】[0006]

【課題を解決するための手段】上記課題を解決するため
に成された本発明では、 a)光源と、 b)光源からの光を所定の基準点に照射するとともに、
基準点において試料の表面で反射された光を測定器に導
く分光光学系と、 c)一方の側に上記分光光学系が、他方の側に試料が配
置され、試料の表面が上記基準点に来るように試料を位
置決めする基準板と、 を備える分光反射率測定装置において、基準板及び分光
光学系を、基準板が分光光学系の上側で水平となる第1
測定位置と、下側となる第2測定位置との間で水平軸回
りに回転可能としたことを特徴としている。
According to the present invention made to solve the above problems, a) a light source, and b) light from the light source is applied to a predetermined reference point, and
A spectroscopic optical system that guides the light reflected on the surface of the sample to the measuring device at the reference point, and c) the spectroscopic optical system is arranged on one side and the sample is arranged on the other side, and the surface of the sample is the reference point. In a spectral reflectance measuring device including a reference plate for positioning a sample so as to come, a reference plate and a spectroscopic optical system are arranged such that the reference plate is horizontal above the spectroscopic optical system.
It is characterized in that it is rotatable about a horizontal axis between a measurement position and a second measurement position on the lower side.

【0007】なお、上記分光光学系は、試料に照射され
る前の光を分光する前分光方式、及び試料から反射した
光を分光する後分光方式のいずれの方式のものをも含
む。
The above-mentioned spectroscopic optical system includes both of a pre-spectroscopic system that disperses the light before it is irradiated onto the sample and a post-spectral system that disperses the light reflected from the sample.

【0008】[0008]

【作用】試料が固体である場合には基準板及び分光光学
系を第1測定位置に配置し、基準板の上に、測定表面が
下側となるように試料を置く。これにより、前記の上部
設置型として分光反射率測定を行なうことができる。試
料が液体や粉体等である場合には基準板及び分光光学系
を水平軸回りに180度回転させて第2測定位置に配置
し、容器に入れた試料を基準板の下に置く。これによ
り、前記の下部設置型として分光反射率測定を行なうこ
とができる。
When the sample is a solid, the reference plate and the spectroscopic optical system are arranged at the first measurement position, and the sample is placed on the reference plate so that the measurement surface is on the lower side. Thereby, the spectral reflectance measurement can be performed as the above-mentioned top-mounted type. When the sample is a liquid, powder, or the like, the reference plate and the spectroscopic optical system are rotated by 180 degrees about the horizontal axis and placed at the second measurement position, and the sample placed in the container is placed under the reference plate. As a result, it is possible to perform the spectral reflectance measurement as the above-mentioned lower installation type.

【0009】なお、基準板及び分光光学系は水平軸回り
に回転可能となっているため、第1測定位置、第2測定
位置以外にも、その中間の任意の測定位置をとることが
でき、例えば両位置の中間の、基準板が垂直となる位置
で測定を行なえば、前記の側部設置型として使用するこ
ともできる。
Since the reference plate and the spectroscopic optical system are rotatable about the horizontal axis, it is possible to take any intermediate measurement position in addition to the first measurement position and the second measurement position. For example, if the measurement is carried out at a position where the reference plate is vertical between the two positions, it can be used as the side-mounted type.

【0010】[0010]

【実施例】図1に本発明の第1実施例である0度照明4
5度受光式の色彩計を示す。図1(a)に示すように、
本実施例の色彩計10は固定部11と回転部12から構
成される。回転部12は固定部11の側面で水平軸回り
に360度回転可能となっており、その間の任意の位置
(角度)で固定しておくことができる。回転部12の一
側面(図1(a)では上面)13は測定基準面として作
用するものであり、そこには測定用の穴14が設けられ
ている。この測定穴14のほぼ中心が分光反射率測定の
基準点となる(すなわち、入射光学系はこの基準点に焦
点を結ぶように調整されている)。この基準面13は回
転部12の回転にともない、上側で水平となり(上記第
1測定位置)或いは下側で水平となる(第2測定位
置)。回転部12の下の固定部11には試料昇降装置1
5が設けられている。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 shows a 0 degree illumination 4 which is a first embodiment of the present invention.
A 5 degree light receiving type colorimeter is shown. As shown in FIG.
The colorimeter 10 of this embodiment is composed of a fixed portion 11 and a rotating portion 12. The rotating portion 12 can be rotated 360 degrees around the horizontal axis on the side surface of the fixed portion 11, and can be fixed at any position (angle) therebetween. One side surface (upper surface in FIG. 1A) 13 of the rotating portion 12 acts as a measurement reference surface, and a measurement hole 14 is provided therein. The approximate center of the measurement hole 14 serves as a reference point for measuring the spectral reflectance (that is, the incident optical system is adjusted to focus on this reference point). The reference surface 13 becomes horizontal on the upper side (first measurement position) or horizontal on the lower side (second measurement position) as the rotary unit 12 rotates. The sample lifting device 1 is provided on the fixed part 11 below the rotating part 12.
5 are provided.

【0011】本色彩計10の内部の構成を図1(b)に
示す。なお、図1(b)は第1測定位置における配置を
示している。固定部11と回転部12とを接続する回転
機構部16は水平中心軸17の回りに回転可能となって
おり、また、この回転機構部16には光を通過させるた
めの光通路18が設けられている。本実施例の色彩計1
0では固定部11には光源(ハロゲンランプ、キセノン
ランプ等)20、スリット板21、透過分光板(干渉フ
ィルタ)22、切換反射鏡(チョッパーミラー)23、
モニタ用検出器24が設けられており、分光板22を通
過した単色光は光通路18を通って回転部12に送られ
る。なおここで、スリット板21以降の光路は回転部1
2の回転中心17にほぼ一致している。
The internal structure of the colorimeter 10 is shown in FIG. Note that FIG. 1B shows the arrangement at the first measurement position. A rotation mechanism portion 16 connecting the fixed portion 11 and the rotation portion 12 is rotatable about a horizontal central axis 17, and the rotation mechanism portion 16 is provided with an optical path 18 for passing light. Has been. Colorimeter 1 of this embodiment
At 0, the fixed portion 11 has a light source (halogen lamp, xenon lamp, etc.) 20, a slit plate 21, a transmission spectral plate (interference filter) 22, a switching reflecting mirror (chopper mirror) 23,
A monitor detector 24 is provided, and the monochromatic light that has passed through the spectroscopic plate 22 is sent to the rotating unit 12 through the optical path 18. Here, the optical path after the slit plate 21 is the rotating unit 1.
It substantially coincides with the center of rotation 17 of 2.

【0012】回転部12には反射鏡25、レンズ26及
び測定用検出器27が設けられており、固定部11から
の単色光は反射鏡25により90度向きを変えられ、レ
ンズ26により基準面13上に焦点を結ぶ。第1測定位
置では試料29は回転部12の基準面13上に、測定面
が下となるように置かれる。これにより、入射単色光は
試料29の測定面に正確に入射角0度で(測定面に垂直
に)照射される。試料表面からの反射光のうち斜め45
度方向に反射された光を測定用検出器27(120度間
隔に3個設けられている)により検出し、その強度を測
定する。この強度を固定部11のモニタ用検出器24に
より検出された強度と比較し、比をとることにより、そ
の単色光の反射率を測定することができる。この測定を
複数の単色光について行なうことにより、試料29の測
定面の色彩を検出することができる。
The rotating part 12 is provided with a reflecting mirror 25, a lens 26 and a measuring detector 27. The monochromatic light from the fixed part 11 is redirected by 90 ° by the reflecting mirror 25 and the reference surface by the lens 26. Focus on 13. At the first measurement position, the sample 29 is placed on the reference surface 13 of the rotating unit 12 with the measurement surface facing downward. As a result, the incident monochromatic light is applied to the measurement surface of the sample 29 accurately at an incident angle of 0 degree (perpendicular to the measurement surface). 45 of the reflected light from the sample surface
The light reflected in the degree direction is detected by the measuring detector 27 (three provided at intervals of 120 degrees), and the intensity thereof is measured. The reflectance of the monochromatic light can be measured by comparing this intensity with the intensity detected by the monitor detector 24 of the fixed portion 11 and taking the ratio. By performing this measurement for a plurality of monochromatic lights, the color of the measurement surface of the sample 29 can be detected.

【0013】液体や粉体の試料を測定する場合は回転部
12を中心軸17の回りに180度回転し、基準面13
及び測定穴14が下に来るようにする。試料は適当な容
器に入れて試料昇降装置15の上に置き、回転部12の
下面(基準面)14に接するまで上昇させる。この場合
における分光光度測定も上記第1位置における場合と同
様であり、分光板22を通過した単色光は光通路18を
通って回転部12に入った後、反射鏡25(これも回転
部12と一緒に180度回転している)により下方に反
射され、測定穴14を通って試料の表面に照射される。
When measuring a liquid or powder sample, the rotating part 12 is rotated by 180 degrees around the central axis 17, and the reference surface 13 is rotated.
And the measurement hole 14 is at the bottom. The sample is placed in a suitable container and placed on the sample elevating / lowering device 15 and lifted until it contacts the lower surface (reference surface) 14 of the rotating part 12. The spectrophotometric measurement in this case is also the same as in the case of the first position, in which the monochromatic light passing through the spectroscopic plate 22 passes through the optical path 18 and enters the rotating section 12, and then the reflecting mirror 25 (also the rotating section 12). Is rotated by 180 °) and is reflected downwardly, and is irradiated onto the surface of the sample through the measurement hole 14.

【0014】本発明の第2実施例として、積分球を使用
した拡散光照明0度受光式の色彩計30を図2により説
明する。本実施例の色彩計30も固定部31と回転部3
2から構成され、回転部32は水平軸37の回りに約1
回転(360度)回転可能となっている。図2は基準面
33が下となっている第2測定位置における状態を示し
ている。第2測定位置で測定する際には、試料29は試
料昇降装置35の台の上に乗せ、試料29の表面が基準
面33にほぼ一致するように位置調整を行なっておく。
As a second embodiment of the present invention, a diffused light illumination 0-degree light receiving type colorimeter 30 using an integrating sphere will be described with reference to FIG. The colorimeter 30 of this embodiment is also the fixed part 31 and the rotating part 3.
2 and the rotating part 32 is about 1 around the horizontal axis 37.
It can rotate (360 degrees). FIG. 2 shows a state in the second measurement position in which the reference plane 33 is downward. When the measurement is performed at the second measurement position, the sample 29 is placed on the table of the sample elevating device 35, and the position of the sample 29 is adjusted so that the surface of the sample 29 substantially coincides with the reference plane 33.

【0015】本実施例の色彩計30では、固定部31の
光源40からの白色光はほぼ回転部32の回転中心37
に沿って回転部32に送られ、回転部32の中に設けら
れた積分球42に入射される。入射白色光は積分球42
の内部で散乱し、下方の穴のところで試料29の表面に
全方向から照射される。試料表面で反射された光のう
ち、垂直上方向(0度)の光のみが積分球42の上部の
穴から出て、レンズ45、切換反射鏡(チョッパーミラ
ー)46、スリット47を介して反射分光板(グレーテ
ィング)48に送られる。分光板48により分光された
光はフォトダイオードアレイ49により各波長毎の強度
として検出される。一方、試料29への入射光の強度
は、積分球42の斜め上方に設けられた穴から取り出さ
れ、反射鏡44によりスリット板47の方に送られる参
照光により検出される。
In the colorimeter 30 of the present embodiment, the white light from the light source 40 of the fixed portion 31 is substantially the rotation center 37 of the rotating portion 32.
Is sent to the rotating unit 32 along with and is incident on the integrating sphere 42 provided in the rotating unit 32. Incident white light is integrating sphere 42
The light is scattered inside and is irradiated from all directions on the surface of the sample 29 at the lower hole. Of the light reflected on the sample surface, only the light in the vertically upward direction (0 degree) goes out from the hole in the upper part of the integrating sphere 42 and is reflected via the lens 45, the switching reflecting mirror (chopper mirror) 46, and the slit 47. It is sent to a spectroscopic plate (grating) 48. The light dispersed by the spectroscopic plate 48 is detected by the photodiode array 49 as the intensity for each wavelength. On the other hand, the intensity of the incident light on the sample 29 is detected by the reference light which is taken out from a hole provided obliquely above the integrating sphere 42 and sent to the slit plate 47 by the reflecting mirror 44.

【0016】一方、固体試料を測定する場合には、回転
部32を180度回転し、基準面33を上側で水平とな
るようにして(第1測定位置)同様に測定を行なう。こ
の場合、上記のように試料の測定面を基準面33の高さ
に合わせるための位置調整が不要であるため、極めて簡
単に測定を行なうことができる。
On the other hand, when measuring a solid sample, the rotating portion 32 is rotated 180 degrees so that the reference surface 33 is horizontal on the upper side (first measurement position) and the same measurement is performed. In this case, since the position adjustment for adjusting the measurement surface of the sample to the height of the reference surface 33 as described above is unnecessary, the measurement can be performed extremely easily.

【0017】なお、上記実施例ではいずれも光源は固定
部11、31内に設けたが、光源を含む分光光学系すべ
てを回転部12、32に収納してもよい。
In each of the above embodiments, the light source is provided in the fixed parts 11 and 31, but the entire spectroscopic optical system including the light source may be housed in the rotating parts 12 and 32.

【0018】[0018]

【発明の効果】本発明に係る分光反射率測定装置では、
1台の装置で上部設置型と下部設置型、及び側部設置型
のいずれの型の測定も行なうことができる。そのため、
液体・粉体等の試料の場合には基準板及び分光光学系を
第2測定位置に配置して下部設置型として測定すること
ができ、固体試料の場合には第1測定位置に配置して上
部設置型として、能率よく短時間で測定を行なうことが
できる。本発明は上記実施例で説明した色彩計以外に
も、分光光度計等、種々の分光反射率測定装置に対して
適用することができる。
According to the spectral reflectance measuring apparatus of the present invention,
It is possible to measure all types of top-mounted type, bottom-mounted type, and side-mounted type with one device. for that reason,
For samples such as liquids and powders, the reference plate and spectroscopic optics can be placed at the second measurement position for measurement as a bottom-mounted type, and for solid samples, placed at the first measurement position. As a top-mounted type, it is possible to perform measurements efficiently and in a short time. The present invention can be applied to various spectral reflectance measuring devices such as a spectrophotometer in addition to the colorimeter described in the above embodiments.

【図面の簡単な説明】[Brief description of drawings]

【図1】 本発明の第1実施例である色彩計の斜視図
(a)及び縦断面図(b)。
FIG. 1 is a perspective view (a) and a vertical sectional view (b) of a colorimeter that is a first embodiment of the present invention.

【図2】 本発明の第2実施例である色彩計の縦断面
図。
FIG. 2 is a vertical sectional view of a colorimeter that is a second embodiment of the present invention.

【図3】 従来の各種形式の分光反射率測定装置の斜視
図。
FIG. 3 is a perspective view of various types of conventional spectral reflectance measuring devices.

【符号の説明】[Explanation of symbols]

10、30…色彩計 11、31…固定部 12、32…回転
部 13、33…基準面 14…測定穴 15、35…試料昇降装置 16…回転機構部 17、37…回転中心軸 18…光通路 29…試料
10, 30 ... Colorimeter 11, 31 ... Fixed part 12, 32 ... Rotating part 13, 33 ... Reference plane 14 ... Measuring hole 15, 35 ... Sample elevating device 16 ... Rotating mechanism part 17, 37 ... Rotation center axis 18 ... Optical Passage 29 ... Sample

Claims (1)

Translated fromJapanese
【特許請求の範囲】[Claims]【請求項1】 a)光源と、 b)光源からの光を所定の基準点に照射するとともに、
基準点において試料の表面で反射された光を測定器に導
く分光光学系と、 c)一方の側に上記分光光学系が、他方の側に試料が配
置され、試料の表面が上記基準点に来るように試料を位
置決めする基準板と、 を備える分光反射率測定装置において、 基準板及び分光光学系を、基準板が分光光学系の上側で
水平となる第1測定位置と、下側となる第2測定位置と
の間で水平軸回りに回転可能としたことを特徴とする分
光反射率測定装置。
1. A) a light source, b) irradiating light from a light source on a predetermined reference point, and
A spectroscopic optical system that guides the light reflected on the surface of the sample to the measuring device at the reference point, and c) the spectroscopic optical system is arranged on one side and the sample is arranged on the other side, and the surface of the sample is the reference point. In a spectral reflectance measuring device including a reference plate for positioning a sample so that it comes to the reference plate and the spectroscopic optical system, the reference plate is a first measurement position horizontal above the spectroscopic optical system, and is the lower side. A spectral reflectance measuring device which is rotatable about a horizontal axis between the second measuring position and the second measuring position.
JP4596892A1992-01-311992-01-31Spectral reflectance measuring apparatusPendingJPH05215603A (en)

Priority Applications (1)

Application NumberPriority DateFiling DateTitle
JP4596892AJPH05215603A (en)1992-01-311992-01-31Spectral reflectance measuring apparatus

Applications Claiming Priority (1)

Application NumberPriority DateFiling DateTitle
JP4596892AJPH05215603A (en)1992-01-311992-01-31Spectral reflectance measuring apparatus

Publications (1)

Publication NumberPublication Date
JPH05215603Atrue JPH05215603A (en)1993-08-24

Family

ID=12734034

Family Applications (1)

Application NumberTitlePriority DateFiling Date
JP4596892APendingJPH05215603A (en)1992-01-311992-01-31Spectral reflectance measuring apparatus

Country Status (1)

CountryLink
JP (1)JPH05215603A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
JP2007519932A (en)*2004-01-302007-07-19エイビービー インコーポレイテッド Optical fiber measuring device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
JP2007519932A (en)*2004-01-302007-07-19エイビービー インコーポレイテッド Optical fiber measuring device

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