第1図は第1実施例による要部斜視図、第2図
は第7図のB―B断面矢視図に相当する説明図、
第3図はデイスク駆動装置の一部切欠を含む概略
側面図、第4図はチヤツキング時とチヤツキング
解除時との説明図、第5図は第2実施例による要
部斜視図、第6図は第3実施例による要部斜視図
、第7図は光デイスクカートリツジの概略平面図
、第8図は第7図のA―A断面矢視図、第9図は
チヤツキング時とチヤツキング解除時との説明図
である。 1,30……光デイスクカートリツジ、2……
光デイスク、3……デイスク、4,5……ハブ、
6,31……ケース、7,32……上ケース、8
,33……下ケース、11……貫通穴、14a,
15a,36a……突起部、16……デイスク駆
動装置、32a,33a,34a……第1突起部
、32b,33b,34b……第2突起部、33
c,34c,36c……基底面。 FIG. 1 is a perspective view of essential parts according to the first embodiment, FIG. 2 is an explanatory diagram corresponding to the BB cross-sectional view in FIG. 7,
Fig. 3 is a schematic side view including a partial cutout of the disk drive device, Fig. 4 is an explanatory view of the disk drive device during chucking and when chucking is released, Fig. 5 is a perspective view of the main part according to the second embodiment, and Fig. 6 is FIG. 7 is a schematic plan view of the optical disk cartridge; FIG. 8 is a cross-sectional view taken along the line AA in FIG. 7; and FIG. FIG. 1,30...Optical disk cartridge, 2...
Optical disk, 3... disk, 4, 5... hub,
6, 31... Case, 7, 32... Upper case, 8
, 33...Lower case, 11...Through hole, 14a,
15a, 36a... protrusion, 16... disk drive device, 32a, 33a, 34a... first protrusion, 32b, 33b, 34b... second protrusion, 33
c, 34c, 36c...basal surface.
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6063888UJPH01165968U (en) | 1988-05-10 | 1988-05-10 |
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6063888UJPH01165968U (en) | 1988-05-10 | 1988-05-10 |
| Publication Number | Publication Date |
|---|---|
| JPH01165968Utrue JPH01165968U (en) | 1989-11-21 |
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6063888UPendingJPH01165968U (en) | 1988-05-10 | 1988-05-10 |
| Country | Link |
|---|---|
| JP (1) | JPH01165968U (en) |
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7321233B2 (en) | 1995-04-14 | 2008-01-22 | Cascade Microtech, Inc. | System for evaluating probing networks |
| US7330041B2 (en) | 2004-06-14 | 2008-02-12 | Cascade Microtech, Inc. | Localizing a temperature of a device for testing |
| US7330023B2 (en) | 1992-06-11 | 2008-02-12 | Cascade Microtech, Inc. | Wafer probe station having a skirting component |
| US7348787B2 (en) | 1992-06-11 | 2008-03-25 | Cascade Microtech, Inc. | Wafer probe station having environment control enclosure |
| US7352168B2 (en) | 2000-09-05 | 2008-04-01 | Cascade Microtech, Inc. | Chuck for holding a device under test |
| US7368925B2 (en) | 2002-01-25 | 2008-05-06 | Cascade Microtech, Inc. | Probe station with two platens |
| US7368927B2 (en) | 2004-07-07 | 2008-05-06 | Cascade Microtech, Inc. | Probe head having a membrane suspended probe |
| US7403025B2 (en) | 2000-02-25 | 2008-07-22 | Cascade Microtech, Inc. | Membrane probing system |
| US7436170B2 (en) | 1997-06-06 | 2008-10-14 | Cascade Microtech, Inc. | Probe station having multiple enclosures |
| US7468609B2 (en) | 2003-05-06 | 2008-12-23 | Cascade Microtech, Inc. | Switched suspended conductor and connection |
| US7492175B2 (en) | 2001-08-21 | 2009-02-17 | Cascade Microtech, Inc. | Membrane probing system |
| US7492172B2 (en) | 2003-05-23 | 2009-02-17 | Cascade Microtech, Inc. | Chuck for holding a device under test |
| US7498828B2 (en) | 2002-11-25 | 2009-03-03 | Cascade Microtech, Inc. | Probe station with low inductance path |
| US7504823B2 (en) | 2004-06-07 | 2009-03-17 | Cascade Microtech, Inc. | Thermal optical chuck |
| US7533462B2 (en) | 1999-06-04 | 2009-05-19 | Cascade Microtech, Inc. | Method of constructing a membrane probe |
| US7541821B2 (en) | 1996-08-08 | 2009-06-02 | Cascade Microtech, Inc. | Membrane probing system with local contact scrub |
| US7550984B2 (en) | 2002-11-08 | 2009-06-23 | Cascade Microtech, Inc. | Probe station with low noise characteristics |
| US7554322B2 (en) | 2000-09-05 | 2009-06-30 | Cascade Microtech, Inc. | Probe station |
| US7616017B2 (en) | 1999-06-30 | 2009-11-10 | Cascade Microtech, Inc. | Probe station thermal chuck with shielding for capacitive current |
| US7639003B2 (en) | 2002-12-13 | 2009-12-29 | Cascade Microtech, Inc. | Guarded tub enclosure |
| US9429638B2 (en) | 2008-11-21 | 2016-08-30 | Cascade Microtech, Inc. | Method of replacing an existing contact of a wafer probing assembly |
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7492147B2 (en) | 1992-06-11 | 2009-02-17 | Cascade Microtech, Inc. | Wafer probe station having a skirting component |
| US7330023B2 (en) | 1992-06-11 | 2008-02-12 | Cascade Microtech, Inc. | Wafer probe station having a skirting component |
| US7348787B2 (en) | 1992-06-11 | 2008-03-25 | Cascade Microtech, Inc. | Wafer probe station having environment control enclosure |
| US7595632B2 (en) | 1992-06-11 | 2009-09-29 | Cascade Microtech, Inc. | Wafer probe station having environment control enclosure |
| US7589518B2 (en) | 1992-06-11 | 2009-09-15 | Cascade Microtech, Inc. | Wafer probe station having a skirting component |
| US7321233B2 (en) | 1995-04-14 | 2008-01-22 | Cascade Microtech, Inc. | System for evaluating probing networks |
| US7541821B2 (en) | 1996-08-08 | 2009-06-02 | Cascade Microtech, Inc. | Membrane probing system with local contact scrub |
| US7626379B2 (en) | 1997-06-06 | 2009-12-01 | Cascade Microtech, Inc. | Probe station having multiple enclosures |
| US7436170B2 (en) | 1997-06-06 | 2008-10-14 | Cascade Microtech, Inc. | Probe station having multiple enclosures |
| US7533462B2 (en) | 1999-06-04 | 2009-05-19 | Cascade Microtech, Inc. | Method of constructing a membrane probe |
| US7616017B2 (en) | 1999-06-30 | 2009-11-10 | Cascade Microtech, Inc. | Probe station thermal chuck with shielding for capacitive current |
| US7403025B2 (en) | 2000-02-25 | 2008-07-22 | Cascade Microtech, Inc. | Membrane probing system |
| US7423419B2 (en) | 2000-09-05 | 2008-09-09 | Cascade Microtech, Inc. | Chuck for holding a device under test |
| US7352168B2 (en) | 2000-09-05 | 2008-04-01 | Cascade Microtech, Inc. | Chuck for holding a device under test |
| US7501810B2 (en) | 2000-09-05 | 2009-03-10 | Cascade Microtech, Inc. | Chuck for holding a device under test |
| US7514915B2 (en) | 2000-09-05 | 2009-04-07 | Cascade Microtech, Inc. | Chuck for holding a device under test |
| US7518358B2 (en) | 2000-09-05 | 2009-04-14 | Cascade Microtech, Inc. | Chuck for holding a device under test |
| US7554322B2 (en) | 2000-09-05 | 2009-06-30 | Cascade Microtech, Inc. | Probe station |
| US7492175B2 (en) | 2001-08-21 | 2009-02-17 | Cascade Microtech, Inc. | Membrane probing system |
| US7368925B2 (en) | 2002-01-25 | 2008-05-06 | Cascade Microtech, Inc. | Probe station with two platens |
| US7550984B2 (en) | 2002-11-08 | 2009-06-23 | Cascade Microtech, Inc. | Probe station with low noise characteristics |
| US7498828B2 (en) | 2002-11-25 | 2009-03-03 | Cascade Microtech, Inc. | Probe station with low inductance path |
| US7639003B2 (en) | 2002-12-13 | 2009-12-29 | Cascade Microtech, Inc. | Guarded tub enclosure |
| US7468609B2 (en) | 2003-05-06 | 2008-12-23 | Cascade Microtech, Inc. | Switched suspended conductor and connection |
| US7492172B2 (en) | 2003-05-23 | 2009-02-17 | Cascade Microtech, Inc. | Chuck for holding a device under test |
| US7876115B2 (en) | 2003-05-23 | 2011-01-25 | Cascade Microtech, Inc. | Chuck for holding a device under test |
| US7504823B2 (en) | 2004-06-07 | 2009-03-17 | Cascade Microtech, Inc. | Thermal optical chuck |
| US7330041B2 (en) | 2004-06-14 | 2008-02-12 | Cascade Microtech, Inc. | Localizing a temperature of a device for testing |
| US7368927B2 (en) | 2004-07-07 | 2008-05-06 | Cascade Microtech, Inc. | Probe head having a membrane suspended probe |
| US7514944B2 (en) | 2004-07-07 | 2009-04-07 | Cascade Microtech, Inc. | Probe head having a membrane suspended probe |
| US9429638B2 (en) | 2008-11-21 | 2016-08-30 | Cascade Microtech, Inc. | Method of replacing an existing contact of a wafer probing assembly |