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JP3610900B2 - Heat treatment equipment - Google Patents

Heat treatment equipment
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Publication number
JP3610900B2
JP3610900B2JP2000364959AJP2000364959AJP3610900B2JP 3610900 B2JP3610900 B2JP 3610900B2JP 2000364959 AJP2000364959 AJP 2000364959AJP 2000364959 AJP2000364959 AJP 2000364959AJP 3610900 B2JP3610900 B2JP 3610900B2
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gas
heat treatment
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JP2002170781A (en
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康夫 八木
勲 萩野
健一 佐藤
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Tokyo Electron Ltd
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Tokyo Electron Ltd
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Translated fromJapanese

【0001】
【発明の属する技術分野】
本発明は、半導体ウエハなどの被処理体に成膜処理などの熱処理を施す熱処理装置に関する。
【0002】
【従来の技術】
一般に、半導体集積回路を形成するには、半導体ウエハ等の被処理体に対して、成膜処理、酸化拡散処理、アニール処理、エッチング処理等の各種の処理を繰り返し行なうが、このような熱処理を行なう熱処理装置の内、一度に多数枚の半導体ウエハに対して処理を行なうことができる、いわゆるバッチ式の縦型の熱処理装置が多く用いられている。
図8は真空排気系を有しない従来のバッチ式の縦型熱処理装置の一例を示す概略斜視図、図9は図8に示す装置の平面図、図10は真空排気系を有する従来のバッチ式の縦型熱処理装置の一例を示す概略斜視図、図11は図10に示す装置の平面図である。
【0003】
この熱処理装置2は、装置本体4と、ガスボックス6と、電気系ボックス8とにより主に構成される。上記装置本体4は全体が筐体12に囲まれており、この中には周囲に加熱ヒータを配置して、内部で一度に多数枚の半導体ウエハに対して所定の熱処理を施す縦型の処理容器14が設けられると共に、その前面側には、半導体ウエハを収容したキャリア(図示せず)を搬入・搬出させる搬出入ポート16が形成されている。この搬出入ポート16側が操作面側となり、その反対側が裏面側となる。更に、図示されていないが、この筐体12内には、カセットを載置するカセットストッカや、ウエハ搬送機、ボートエレベータ等の種々の機構及び部材が設けられている。
【0004】
上記ガスボックス6と上記電気系ボックス8とは、ガスボックス6を上段にして上下に積み重ねられている。そして、このガスボックス6と電気系ボックス8は、装置本体4の裏面側にメンテナンス空間18を隔てて設けられており、上記ガスボックス6の内部には拡散処理等の熱処理に必要な処理ガスを清浄化するフィルタや開閉弁やマスフローコントローラのような流量制御器等を内蔵するガス制御ユニット20が収容されている。このガスボックス6の全体はガスボックス筐体22により覆われて、その前面にはガス操作表示パネル22Aが設けられる。上記ガスボックス6には、複数、図示例では3本のガス供給ライン24A、24B、24Cが接続されており、これらの各ガス供給ライン24A〜24Cは下方へ引き回されて、必要なガスを床下に配設されている集中ガス源より導入するようになっている。また、このガスボックス6からはボックス排気ライン26が下方に向けて延びており、床下に設けた排気設備によりガスボックス6内を吸引排気するようになっている。また、上記電気系ボックス8は、必要な電気系部品を収容したものである。尚、電源トランス等は、これが設置されるクリーンルームの床下などに設置される。
【0005】
そして、装置本体4とガスボックス6との間は、配線用ダクト28で連結されており、この下部に種々のガス配管30を通して、上記ガスボックス6から処理容器14内側へ各種の処理ガスを供給し得るようになっている。このダクト28内には、必要な配線ケーブルが収容される。そして、装置本体4側のガス取り込み部には上記ガス配管30に接続されるバルブボックス32が設けられており、このバルブボックス32内に最終段の開閉弁やフィルタを内蔵させて、配管の引き回しに起因する流量制御の精度劣化等を防止している。
上記熱処理装置2は、大気圧で、或いは大気圧近傍で拡散処理やアニール処理を行う装置であるが、CVD成膜処理等を行うには大がかりな真空排気系が必要であり、この場合には、図10及び図11に示すように、上記ガスボックス6と電気系ボックス8の一体化物に背中合わせとなるように排気ボックス34を併設している。尚、この場合、ガスボックス6と電気系ボックス8は図8及び図9に示す場合とは反対側に向けて、操作を行うようになっている。この排気ボックス34内には、排気管38に介設して開閉弁、圧力制御弁、トラップ機構等(図示せず)が設けられるが、この排気ボックス34の排気管38と上記装置本体4の処理容器14との間は大口径の真空排気管36により接続され、この排気管38を床下に設けた真空ポンプ(図示せず)に接続して処理容器14内を真空引きするようになっている。
【0006】
【発明が解決しようとする課題】
ところで、この種の熱処理装置が設置されるクリーンルームは、単位面積当たりの維持コストが非常に高いことから、装置自体の占有スペースを減少させることは勿論必要であるが、更に、この熱処理装置全体をメンテナンスするために確保すべきスペースを極力減少させることが求められている。
しかしながら、クリーンルームの多くは、装置の階下にガス供給ラインや排気ラインを設けているため、上記した従来の熱処理装置2にあっては、ガスボックス6と電気系ボックス8との一体化物と装置本体4との間にメンテナンス空間18を設ける必要があるばかりか、その一体化物の裏面側には、ガス供給ライン24A〜24Cやボックス排気ライン26を配設するための配管スペース40も必要となり、全体としての必要スペースが非常に大きくなってしまうという問題があった。また、図10及び図11に示す従来装置例の場合には、一体化物のガス操作パネル22A側に、上記配管スペース40よりも面積の大きな、メンテナンス空間42を設けなければならない、という問題があった。
【0007】
特に、ウエハサイズが20cm(8インチ)から30cm(12インチ)へ大きくなるに従って、装置自体も格段に大きくなり、上記した問題点の早期解決が望まれている。
本発明は、以上のような問題点に着目し、これを有効に解決すべく創案されたものである。本発明の目的は、装置の占有スペースのみならず、このメンテナンス空間も含めた必要なスペースを大幅に削減することが可能な熱処理装置を提供することにある。
【0008】
【課題を解決するための手段】
請求項1に係る発明は、複数の被処理体に対して処理ガスにより所定の処理を施すための処理容器を収容する装置本体と、前記処理ガスの供給を制御するガス制御ユニットを収容するガスボックスと、電気部品を収容する電気系ボックスとを有する熱処理装置において、前記装置本体の裏面にメンテナンスドアを設け、前記ガスボックスと前記電気系ボックスとを、前記ガスボックスを下方にした状態でフレーム筐体で上下に接合して一体化物とすると共に、この一体化物の側面を前記装置本体の裏面に、前記メンテナンスドアを避けて連結するように構成したものである。
これにより、ガスボックスを電気系ボックスの下段に位置させ、しかも上記両ボックスの一体化物を装置本体の裏面側へ接合するようにしたので、従来必要とされた配管スペースが不要となり、また、一体化物も装置本体のメンテナンス空間の一部に配置されることになるので、装置占有スペースと装置のメンテナンス空間とを含む全体としての必要スペースを大幅に削減することが可能となる。
【0009】
この場合、例えば請求項2に規定するように、前記ガスボックスのガス操作パネルと、前記電気系ボックスの電気操作パネルとは、前記メンテナンスドアの後方に位置するメンテナンス空間に臨ませて配置される。
また、例えば請求項3に規定するように、前記処理容器内の真空引きを制御するための排気ユニットを収容する排気ボックスを、前記メンテナンス空間を挟んで前記一体化物に対向させて前記装置本体の裏面に接合する。
これによれば、処理容器内の真空引きを行う排気ボックスも装置本体の裏面に直接接合しているので、全体としての必要スペースを一層削減することが可能となる。
【0010】
この場合、例えば請求項4に規定するように、前記一体化物のメンテナンスを行う一体化物メンテナンス空間と、前記排気ボックスのメンテナンスを行う排気メンテナンス空間と、前記装置本体のメンテナンス空間とを共用する。
【0011】
【発明の実施の形態】
以下に、本発明に係る熱処理装置の一実施例を添付図面に基づいて詳述する。
図1は本発明の熱処理装置の第1実施例の裏面側を示す斜視図、図2は図1に示す装置の平面図、図3は図1に示す装置の側面図、図4は本発明装置の第1実施例の必要スペースの削減効果を説明するための説明図である。尚、ここでは先に説明した従来装置と同一構成部分については同一符号を付して説明する。
この熱処理装置50は、大気圧、或いは大気圧近傍で拡散処理等の熱処理を行う装置であり、後述するようにここでは真空排気系を設けていない。
【0012】
まず、この熱処理装置50は、装置本体4と、ガスボックス6と、電気系ボックス8とにより主に構成される。上記装置本体4は全体が筐体12に囲まれており、この中には周囲に加熱ヒータを配置して、内部で一度に多数枚の半導体ウエハに対して熱拡散等の所定の熱処理を施す縦型の処理容器14が設けられると共に、その前面側には、半導体ウエハを収容したキャリア(図示せず)を搬入・搬出させる搬出入ポート16及び本体操作パネル17(図2参照)が形成されている。この搬出入ポート16側が操作面側となり、その反対側が裏面側となる。
更に、図示されていないが、この筐体12内には、カセットを載置するカセットストッカや、ウエハ搬送機、ボートエレベータ等の種々の機構及び部材が設けられている。また、上記筐体12の裏面側には上記処理容器14を搬出入したり、この装置本体4内をメンテナンスする際に、開閉されるメンテナンスドア52が開閉可能に設けられる。
【0013】
上記ガスボックス6と上記電気系ボックス8とは、ガスボックス6を下段にして上下に積み重ねられている。そして、このガスボックス6と電気系ボックス8は、フレームを用いて縦長の直方体状に組み立てられたフレーム筐体54により上下に接合されており、一体化物56として構成されている。そして、この一体化物56の幅の狭い側面を、上記装置本体4の裏面の一側に連結するように接合させている。この場合、勿論のこととして、上記メンテナンスドア52を避けるように上記一体化物56を接合している。
【0014】
上記ガスボックス6の内部には拡散処理等の熱処理に必要な処理ガスを清浄化するフィルタや開閉弁やマスフローコントローラのような流量制御器等を内蔵するガス制御ユニット(図示せず)が収容されている。このガスボックス6の全体はプレート58により覆われて、その前面の一部にはガス操作表示パネル22Aが設けられ、また、前面のパネル58も開閉可能になされている。そして、このガスボックス6の上部には複数、図示例では3つのガス出口60A、60B、60Cが設けられる。また、上記電気ボックス8は、必要な電気部品やガス検出器等が収容されており、この前面にはガス指示計や表示ランプや操作ボタン等の電気系操作表示パネル8Aが設けられる。そして、これらの各パネル8A、22Aは、装置本体4の裏面側である装置本体4のメンテナンス空間62に臨ませて設けられている。
【0015】
そして、図3に示すように、この熱処理装置50を設置するクリーンルームの床は、上床64と下床66とよりなる2重構造になされており、この上床64と下床66との間に形成されたユティリティ空間68内に、必要ガスを供給するガス通路70A、70B、70C、略常圧での排気を行う常圧排気管72、必要な装置毎に真空ポンプ74を設けた真空排気管76、各種の配線コード78等が設けられている。尚、本実施例では常圧処理を行うことから、真空ポンプ74や真空排気管76は用いられない。更に、このユティリティ空間68内には、電源トランス等も設置される。
そして、上記各ガス通路70A〜70Cは、上記ガスボックス6よりその下方へ直接的に延びる各ガス供給管24A、24B、24Cへ接続され、このガスボックス6の上部に設けた各ガス出口60A、60B、60Cと上記処理容器14とを連絡するようにガス管80A、80B、80Cを接続し、必要なガスを流量制御しつつ処理容器14内へ供給し得るようになっている。
【0016】
また、ガスボックス6の下端部には、このガスボックス6内の雰囲気を吸引排気するための複数(図示例では3つ)のボックス排気口80A、80B、80Cが設けられており、各ボックス排気口80A〜80Cを選択的に使用し得るようになっている。図3に示す場合には、中央に位置するボックス排気口80Bを用いており、これに常圧排気管72を接続している。このように複数のボックス排気口80A〜80Cを設けて選択的に利用できるようにした理由は、上記ユティリティ空間68内に設けた床梁(図示せず)等の障害物によって特定のボックス排気口が利用できなくなる場合を考慮したものである。
また、このガスボックス6の一側を上下方向に貫通させるようにして、上記電気系ボックス8に連絡する配線コード78を配設している。
【0017】
このようになされた本発明装置は、一般的には、複数台が隣同士を接して並設されることになる。この本発明装置によれば、ガスボックス6を電気系ボックス8の下段に位置させた状態で両ボックスを接合して一体化物56とし、この一体化物56を装置本体4の裏面側にメンテナンスドア52を避けるようにして取り付けるようにしているので、ガスボックス6からのガス供給管24A〜24Cは、この一体化物56の外側を引き回すことなく下方に直接延ばして床下のユティリティ空間68に配設されている各ガス通路70A〜70Cに直接連結でき、従来装置で必要とされた配管引き回し用のスペース(図9参照)をなくすことが可能となる。
また、上記したようにガスボックス6と電気系ボックス8との一体化物56を、装置本体4の裏面側のメンテナンス空間62の一部に配置させるようになっており、そして、この装置本体4のメンテナンス空間62と上記一体化物56をメンテナンスするための一体化物メンテナンス空間とを共用させるようにしている。従って、以上の理由より、装置の占有スペースと装置のメンテナンス空間とを含む全体としての必要スペースを大幅に削減することができる。
【0018】
このように、本発明装置の第1実施例の省スペース化の効率について、図4を参照して従来装置の場合と比較して説明する。図4(A)は従来装置の配置の場合(図9に対応)を示し、図4(B)は本発明装置の配置の場合を示し、図中、斜線部分はメンテナンス空間(配管スペースを含む)を示す。図4(A)に従来装置の場合には、装置本体4とガス電気系ボックス6、8の両裏面側にそれぞれメンテナンス空間18と配管スペース40を必要としている。この場合、ウエハサイズにもよるが、装置本体4の長さH1は1900mm程度、メンテナンス空間18の長さH2は1200mm程度、ガスボックス6と電気系ボックス8の長さH3は600mm程度、配管スペース40の長さH4は600mm程度である。
尚、このメンテナンス空間18は、処理容器ヒータを搬出入するヒータ通路も兼ねている。
【0019】
これに対して、図4(B)に示す本発明装置の第1実施例の場合には、装置本体4の長さH1が同じく1900mm程度、一体化物56の置かれているメンテナンス空間62の長さH5は1000mm程度、更にその背面側に必要とされるヒータ通路80の長さH6は850mm程度であり、本発明装置の方が遥かに省スペース化に寄与させることができる。
また、本発明装置の場合には、ガスボックス6から処理容器14に至るガス管80A〜80C(図3参照)の長さが非常に短いので、従来装置で必要とされたバルブボックス32(図9参照)を省略することができる。
【0020】
上記実施例の熱処理装置50は、大気圧で、或いは大気圧近傍で拡散処理やアニール処理を行う熱処理装置を例にとって説明したが、真空雰囲気下にてCVD成膜等を行う熱処理装置についても本発明を適用することができる。この真空雰囲気下にてCVD成膜処理等を行うには大がかりな真空排気系が必要であり、この場合には、図5及び図6に示すように、上記ガスボックス6と電気系ボックス8の一体化物56に対向するようにメンテナンス空間62を挟んで排気ボックス34を装置本体4の裏面に接合させている。この排気ボックス34は、全体がパネル82により覆われており、メンテナンス空間62側は開閉可能になっている(図5中においては一部のパネルを取った状態を示す)。この排気ボックス34内には開閉弁84、トラップ機構86、圧力制御弁88等が設けられるが、この排気ボックス34の排気管38の上端は直接的に処理容器14へ接続され、この排気管38の下端は床下に設けた真空ポンプ74(図3参照)に接続して処理容器14内を真空引きするようになっている。
【0021】
この実施例の場合には、先に説明した実施例の作用効果に加えて、装置本体4のメンテナンス空間62と、一体化物56をメンテナンスする一体化物メンテナンス空間と、排気ボックス34をメンテナンスする排気メンテナンス空間とを共用させるようにしているので、全体として必要スペースを更に少なくして省スペース化に寄与することが可能となる。尚、この場合、排気ボックス34を設置した領域だけメンテナンス空間62が狭くなるが、上記各部材をメンテナンスするには十分な広さである。
【0022】
このように、本発明装置の第2実施例の省スペース化の効率について、図7を参照して従来装置の場合と比較して説明する。図7(A)は従来装置の配置の場合(図11に対応)を示し、図7(B)は本発明装置の配置の場合を示し、図中斜線部分はメンテナンス空間(配管スペースを含む)を示す。図7(A)に従来装置の場合には、装置本体4とガス電気系ボックス6、8の両裏面側にそれぞれメンテナンス空間18と配管スペース40を必要としている。また、排気ボックス34のメンテナンス空間は、装置本体4のメンテナンス空間を共用している。この場合、ウエハサイズにもよるが、装置本体4の長さH1は1900mm程度、メンテナンス空間18の長さH2は1200mm程度、排気ボックス34の長さH8は600mm程度、ガスボックス6と電気系ボックス8の長さH3は600mm程度、配管スペース40の長さH4は600mm程度である。
尚、このメンテナンス空間18は、処理容器ヒータを搬出入するヒータ通路も兼ねている。
【0023】
これに対して、図7(B)に示す本発明装置の第2実施例の場合には、装置本体4の長さH1が同じく1900mm程度、一体化物56及び排気ボックス34の置かれているメンテナンス空間62の長さH5は1000mm程度、更にその背面側に必要とされるヒータ通路80の長さH6は850mm程度であり、本発明装置の方が遥かに省スペース化に寄与させることができる。
尚、以上の各数値例は、比較のために単に一例を示したに過ぎず、これらに限定されないのは勿論である。
また、ここでは被処理体として半導体ウエハに対して熱処理する場合を例にとって説明したが、これに限定されず、LCD基板、ガラス基板等に熱処理する場合にも、本発明を適用できるのは勿論である。
【0024】
【発明の効果】
以上説明したように、本発明の熱処理装置によれば、次のように優れた作用効果を発揮することができる。
請求項1、2に係る発明によれば、ガスボックスを電気系ボックスの下段に位置させ、しかも上記両ボックスの一体化物を装置本体の裏面側へ接合するようにしたので、従来必要とされた配管スペースが不要となり、また、一体化物も装置本体のメンテナンス空間の一部に配置されることになるので、装置占有スペースと装置のメンテナンス空間とを含む全体としての必要スペースを大幅に削減することができる。
請求項3、4に係る発明によれば、処理容器内の真空引きを行う排気ボックスも装置本体の裏面に直接接合しているので、全体としての必要スペースを一層削減することができる。
【図面の簡単な説明】
【図1】本発明の熱処理装置の第1実施例の裏面側を示す斜視図である。
【図2】図1に示す装置の平面図である。
【図3】図1に示す装置の側面図である。
【図4】本発明装置の第1実施例の必要スペースの削減効果を説明するための説明図である。
【図5】本発明の熱処理装置の第2実施例の裏面側を示す斜視図である。
【図6】図5に示す装置の平面図である。
【図7】本発明装置の第2実施例の必要スペースの削減効果を説明するための説明図である。
【図8】真空排気系を有しない従来のバッチ式の縦型熱処理装置の一例を示す概略斜視図である。
【図9】図8に示す装置の平面図である。
【図10】真空排気系を有する従来のバッチ式の縦型熱処理装置の一例を示す概略斜視図である。
【図11】図10に示す装置の平面図である。
【符号の説明】
4 装置本体
6 ガスボックス
8 電気系ボックス
14 処理容器
34 排気ボックス
50 熱処理装置
52 メンテナンスドア
54 フレーム筐体
56 一体化物
60A〜60C ガス出口
62 メンテナンス空間
70A〜70C ガス通路
72 常圧排気管
74 真空ポンプ
76 真空排気管
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a heat treatment apparatus for performing a heat treatment such as a film forming process on an object to be processed such as a semiconductor wafer.
[0002]
[Prior art]
In general, a semiconductor integrated circuit is formed by repeatedly performing various processes such as a film forming process, an oxidation diffusion process, an annealing process, and an etching process on an object to be processed such as a semiconductor wafer. Among the heat treatment apparatuses to be performed, a so-called batch type vertical heat treatment apparatus capable of performing treatment on a large number of semiconductor wafers at a time is often used.
8 is a schematic perspective view showing an example of a conventional batch type vertical heat treatment apparatus having no vacuum exhaust system, FIG. 9 is a plan view of the apparatus shown in FIG. 8, and FIG. 10 is a conventional batch type having a vacuum exhaust system. FIG. 11 is a plan view of the apparatus shown in FIG. 10.
[0003]
Theheat treatment apparatus 2 is mainly composed of an apparatusmain body 4, agas box 6, and anelectric system box 8. The apparatusmain body 4 is entirely surrounded by acasing 12, in which a heater is disposed around the apparatusmain body 4 so as to perform a predetermined heat treatment on a large number of semiconductor wafers at once inside. Acontainer 14 is provided, and on the front side thereof, a loading /unloading port 16 for loading / unloading a carrier (not shown) containing a semiconductor wafer is formed. The carry-in / outport 16 side is the operation surface side, and the opposite side is the back surface side. Further, although not shown in the figure, thehousing 12 is provided with various mechanisms and members such as a cassette stocker for placing a cassette, a wafer transfer machine, and a boat elevator.
[0004]
Thegas box 6 and theelectric system box 8 are stacked one above the other with thegas box 6 as an upper stage. Thegas box 6 and theelectric system box 8 are provided on the back side of theapparatus body 4 with amaintenance space 18 therebetween, and a processing gas necessary for heat treatment such as diffusion treatment is placed inside thegas box 6. Agas control unit 20 containing a filter to be cleaned, an on-off valve, a flow rate controller such as a mass flow controller, and the like is housed. Theentire gas box 6 is covered with agas box housing 22, and a gasoperation display panel 22A is provided on the front surface thereof. A plurality ofgas supply lines 24A, 24B, and 24C in the illustrated example are connected to thegas box 6, and each of thesegas supply lines 24A to 24C is routed downward to supply necessary gas. It introduce | transduces from the concentrated gas source arrange | positioned under the floor. Abox exhaust line 26 extends downward from thegas box 6 so that the inside of thegas box 6 is sucked and exhausted by an exhaust facility provided under the floor. Theelectric system box 8 contains necessary electric parts. A power transformer or the like is installed below the floor of a clean room where the power transformer is installed.
[0005]
The apparatusmain body 4 and thegas box 6 are connected by awiring duct 28, and various processing gases are supplied from thegas box 6 to the inside of theprocessing container 14 throughvarious gas pipes 30 in the lower part. It has come to be able to do. Necessary wiring cables are accommodated in theduct 28. Avalve box 32 connected to thegas pipe 30 is provided in the gas intake section on the apparatusmain body 4 side. A final opening / closing valve and a filter are built in thevalve box 32 to route the pipe. This prevents the deterioration of the flow control accuracy caused by this.
Theheat treatment apparatus 2 is an apparatus that performs a diffusion process or an annealing process at or near atmospheric pressure. However, a large-scale vacuum exhaust system is required to perform a CVD film forming process. As shown in FIGS. 10 and 11, anexhaust box 34 is provided side by side on the integrated product of thegas box 6 and theelectric system box 8. In this case, thegas box 6 and theelectric system box 8 are operated toward the opposite side to the case shown in FIGS. In theexhaust box 34, an open / close valve, a pressure control valve, a trap mechanism and the like (not shown) are provided via anexhaust pipe 38. Theexhaust pipe 38 of theexhaust box 34 and the apparatusmain body 4 are connected to each other. Theprocessing vessel 14 is connected by a large-diametervacuum exhaust pipe 36, and theexhaust pipe 38 is connected to a vacuum pump (not shown) provided under the floor so that the inside of theprocessing container 14 is evacuated. Yes.
[0006]
[Problems to be solved by the invention]
By the way, a clean room in which this type of heat treatment apparatus is installed has a very high maintenance cost per unit area, so it is of course necessary to reduce the space occupied by the apparatus itself. It is required to reduce the space to be secured for maintenance as much as possible.
However, since many of the clean rooms are provided with a gas supply line and an exhaust line below the apparatus, in the above-described conventionalheat treatment apparatus 2, the integrated body of thegas box 6 and theelectric system box 8 and the apparatus main body are provided. In addition to the need for providing amaintenance space 18 between thegas supply lines 24 and 4, apiping space 40 for arranging the gas supply lines 24 </ b> A to 24 </ b> C and thebox exhaust line 26 is also required on the back side of the integrated product. There was a problem that the required space would become very large. 10 and 11, there is a problem that amaintenance space 42 having a larger area than thepiping space 40 must be provided on thegas operation panel 22A side of the integrated product. It was.
[0007]
In particular, as the wafer size increases from 20 cm (8 inches) to 30 cm (12 inches), the apparatus itself becomes much larger, and an early solution of the above-described problems is desired.
The present invention has been devised to pay attention to the above problems and to effectively solve them. An object of the present invention is to provide a heat treatment apparatus capable of greatly reducing not only the space occupied by the apparatus but also the necessary space including this maintenance space.
[0008]
[Means for Solving the Problems]
According to the first aspect of the present invention, there is provided an apparatus main body for storing a processing container for performing a predetermined process with a processing gas on a plurality of objects to be processed, and a gas for storing a gas control unit for controlling the supply of the processing gas. In a heat treatment apparatus having a box and an electric system box that houses an electric component, a maintenance door is provided on the back surface of the apparatus main body, and the gas box and the electric system box are framed with the gas box facing downward. with the integrated product by joining up and down in the housing, the side surface of the integrated product on the back of the device body, which is constituted so as to couple to avoidthe maintenance door.
As a result, the gas box is positioned at the lower stage of the electric system box, and the integrated product of the two boxes is joined to the back side of the main body of the apparatus. Since the chemicals are also arranged in a part of the maintenance space of the apparatus main body, it is possible to greatly reduce the necessary space as a whole including the apparatus occupation space and the maintenance space of the apparatus.
[0009]
In this case, for example, as defined inclaim 2, the gas operation panel of the gas box and the electric operation panel of the electric system box are arranged facing a maintenance space located behind the maintenance door. .
Further, for example, as defined in claim 3, an exhaust box for accommodating an exhaust unit for controlling evacuation in the processing container is opposed to the integrated object with the maintenance space interposed therebetween, and Join to the back side.
According to this, since the exhaust box for evacuating the processing container is also directly bonded to the back surface of the apparatus main body, the necessary space as a whole can be further reduced.
[0010]
In this case, for example, as defined inclaim 4, an integrated object maintenance space for maintaining the integrated object, an exhaust maintenance space for maintaining the exhaust box, and a maintenance space for the apparatus main body are shared.
[0011]
DETAILED DESCRIPTION OF THE INVENTION
Hereinafter, an embodiment of a heat treatment apparatus according to the present invention will be described in detail with reference to the accompanying drawings.
1 is a perspective view showing the back side of a first embodiment of the heat treatment apparatus of the present invention, FIG. 2 is a plan view of the apparatus shown in FIG. 1, FIG. 3 is a side view of the apparatus shown in FIG. It is explanatory drawing for demonstrating the reduction effect of the required space of 1st Example of an apparatus. In the following description, the same components as those of the conventional device described above are denoted by the same reference numerals.
Theheat treatment apparatus 50 is an apparatus that performs heat treatment such as diffusion treatment at or near atmospheric pressure, and does not include a vacuum exhaust system here, as will be described later.
[0012]
First, theheat treatment apparatus 50 is mainly composed of the apparatusmain body 4, thegas box 6, and theelectric system box 8. The apparatusmain body 4 is entirely surrounded by acasing 12, in which a heater is disposed around theapparatus body 4, and a predetermined heat treatment such as thermal diffusion is performed on a large number of semiconductor wafers at a time. Avertical processing container 14 is provided, and on the front side thereof, a loading / unloadingport 16 for carrying in / out a carrier (not shown) containing a semiconductor wafer and a main body operation panel 17 (see FIG. 2) are formed. ing. The carry-in / outport 16 side is the operation surface side, and the opposite side is the back surface side.
Further, although not shown in the figure, thehousing 12 is provided with various mechanisms and members such as a cassette stocker for placing a cassette, a wafer transfer machine, and a boat elevator. In addition, amaintenance door 52 that can be opened and closed when theprocessing container 14 is carried in and out or when the inside of the apparatusmain body 4 is maintained is provided on the back side of thecasing 12 so as to be opened and closed.
[0013]
Thegas box 6 and theelectric system box 8 are stacked one above the other with thegas box 6 at the bottom. Thegas box 6 and theelectric system box 8 are joined up and down by aframe housing 54 assembled in a vertically long rectangular parallelepiped shape using a frame, and are configured as anintegrated object 56. Then, the narrow side surface of theintegrated object 56 is joined to be connected to one side of the back surface of theapparatus body 4. In this case, as a matter of course, theintegrated object 56 is joined so as to avoid themaintenance door 52.
[0014]
Thegas box 6 contains a gas control unit (not shown) containing a filter for purifying a processing gas necessary for heat treatment such as diffusion treatment, a flow controller such as an on-off valve and a mass flow controller. ing. Theentire gas box 6 is covered with aplate 58, a gasoperation display panel 22A is provided on a part of the front surface thereof, and thefront panel 58 can be opened and closed. A plurality of, in the illustrated example, threegas outlets 60A, 60B, and 60C are provided in the upper portion of thegas box 6. Theelectrical box 8 contains necessary electrical components, gas detectors, and the like, and an electric systemoperation display panel 8A such as a gas indicator, a display lamp, and operation buttons is provided on the front surface thereof. Thepanels 8A and 22A are provided facing themaintenance space 62 of the apparatusmain body 4 on the back side of the apparatusmain body 4.
[0015]
As shown in FIG. 3, the floor of the clean room where theheat treatment apparatus 50 is installed has a double structure including anupper floor 64 and alower floor 66, and is formed between theupper floor 64 and thelower floor 66.Gas passages 70A, 70B, 70C for supplying necessary gas, a normalpressure exhaust pipe 72 for exhausting at a substantially normal pressure, avacuum exhaust pipe 76 provided with avacuum pump 74 for each required device,Various wiring cords 78 and the like are provided. In this embodiment, since the normal pressure process is performed, thevacuum pump 74 and thevacuum exhaust pipe 76 are not used. Further, in thisutility space 68, a power transformer or the like is also installed.
Thegas passages 70A to 70C are connected to thegas supply pipes 24A, 24B, 24C extending directly downward from thegas box 6, and thegas outlets 60A provided at the upper part of thegas box 6 Thegas pipes 80A, 80B, 80C are connected so as to connect the 60B, 60C and theprocessing container 14 so that necessary gas can be supplied into theprocessing container 14 while controlling the flow rate.
[0016]
In addition, a plurality of (three in the illustrated example)box exhaust ports 80A, 80B, and 80C for sucking and exhausting the atmosphere in thegas box 6 are provided at the lower end of thegas box 6, and each box exhaust is exhausted. Themouths 80A to 80C can be selectively used. In the case shown in FIG. 3, abox exhaust port 80B located in the center is used, and a normalpressure exhaust pipe 72 is connected thereto. The reason why the plurality ofbox exhaust openings 80A to 80C are provided so as to be selectively used is that a specific box exhaust opening is provided by an obstacle such as a floor beam (not shown) provided in theutility space 68. This is for the case where is no longer available.
Further, awiring cord 78 connected to theelectric system box 8 is disposed so as to penetrate one side of thegas box 6 in the vertical direction.
[0017]
In general, the device of the present invention made in this way is arranged in parallel with a plurality of devices in contact with each other. According to the apparatus of the present invention, the two boxes are joined to form anintegrated object 56 with thegas box 6 positioned at the lower stage of theelectric system box 8, and theintegrated object 56 is connected to themaintenance door 52 on the back side of the apparatusmain body 4. Therefore, thegas supply pipes 24A to 24C from thegas box 6 are arranged directly in theutility space 68 under the floor by directly extending downward without routing the outside of theintegrated body 56. It is possible to directly connect to thegas passages 70A to 70C, and it is possible to eliminate the space for pipe routing (see FIG. 9) required in the conventional apparatus.
Further, as described above, theintegrated object 56 of thegas box 6 and theelectric system box 8 is arranged in a part of themaintenance space 62 on the back side of the apparatusmain body 4. Themaintenance space 62 and the integrated object maintenance space for maintaining theintegrated object 56 are shared. Therefore, the necessary space as a whole including the occupation space of the apparatus and the maintenance space of the apparatus can be greatly reduced for the above reasons.
[0018]
Thus, the efficiency of space saving in the first embodiment of the apparatus of the present invention will be described with reference to FIG. 4 in comparison with the conventional apparatus. 4A shows the case of the arrangement of the conventional apparatus (corresponding to FIG. 9), FIG. 4B shows the case of the arrangement of the apparatus of the present invention, and the hatched portion in the figure indicates the maintenance space (including the piping space). ). In the case of the conventional apparatus shown in FIG. 4A, amaintenance space 18 and apiping space 40 are required on both the back surfaces of the apparatusmain body 4 and the gaselectric system boxes 6 and 8, respectively. In this case, although depending on the wafer size, the length H1 of the apparatusmain body 4 is about 1900 mm, the length H2 of themaintenance space 18 is about 1200 mm, the length H3 of thegas box 6 and theelectric system box 8 is about 600 mm, and the piping space The length H4 of 40 is about 600 mm.
Themaintenance space 18 also serves as a heater passage for carrying in and out the processing container heater.
[0019]
On the other hand, in the case of the first embodiment of the apparatus of the present invention shown in FIG. 4B, the length H1 of theapparatus body 4 is also about 1900 mm, and the length of themaintenance space 62 in which theintegrated object 56 is placed. The length H5 is about 1000 mm, and the length H6 of theheater passage 80 required on the back side thereof is about 850 mm, so that the apparatus of the present invention can contribute to much space saving.
In the case of the apparatus of the present invention, the length of thegas pipes 80A to 80C (see FIG. 3) from thegas box 6 to theprocessing container 14 is very short, so that the valve box 32 (see FIG. 9) can be omitted.
[0020]
Theheat treatment apparatus 50 of the above embodiment has been described by taking a heat treatment apparatus that performs a diffusion process or an annealing process at or near atmospheric pressure as an example, but the present invention is also applicable to a heat treatment apparatus that performs CVD film formation in a vacuum atmosphere. The invention can be applied. In order to perform the CVD film forming process or the like in this vacuum atmosphere, a large-scale evacuation system is required. In this case, as shown in FIGS. Theexhaust box 34 is joined to the back surface of the apparatusmain body 4 with themaintenance space 62 interposed therebetween so as to face theintegrated object 56. Theexhaust box 34 is entirely covered with apanel 82, and themaintenance space 62 side can be opened and closed (in FIG. 5, a part of the panel is shown). An open /close valve 84, atrap mechanism 86, apressure control valve 88, and the like are provided in theexhaust box 34. The upper end of theexhaust pipe 38 of theexhaust box 34 is directly connected to theprocessing container 14, and theexhaust pipe 38 Is connected to a vacuum pump 74 (see FIG. 3) provided under the floor to evacuate the inside of theprocessing vessel 14.
[0021]
In the case of this embodiment, in addition to the functions and effects of the above-described embodiment, themaintenance space 62 of theapparatus body 4, the integrated object maintenance space for maintaining theintegrated object 56, and the exhaust maintenance for maintaining theexhaust box 34 are provided. Since the space is shared, it is possible to contribute to space saving by further reducing the necessary space as a whole. In this case, themaintenance space 62 is narrowed only in the area where theexhaust box 34 is installed, but it is wide enough to maintain the above-mentioned members.
[0022]
Thus, the space saving efficiency of the second embodiment of the apparatus of the present invention will be described with reference to FIG. 7 in comparison with the conventional apparatus. 7A shows the case of the arrangement of the conventional apparatus (corresponding to FIG. 11), FIG. 7B shows the case of the arrangement of the apparatus of the present invention, and the hatched portion in the figure indicates the maintenance space (including the piping space). Indicates. In the case of the conventional apparatus shown in FIG. 7A, amaintenance space 18 and apiping space 40 are required on both back sides of the apparatusmain body 4 and the gaselectric system boxes 6 and 8, respectively. In addition, the maintenance space of theexhaust box 34 shares the maintenance space of theapparatus body 4. In this case, although depending on the wafer size, the length H1 of the apparatusmain body 4 is about 1900 mm, the length H2 of themaintenance space 18 is about 1200 mm, the length H8 of theexhaust box 34 is about 600 mm, thegas box 6 and the electric system box. The length H3 of 8 is about 600 mm, and the length H4 of thepiping space 40 is about 600 mm.
Themaintenance space 18 also serves as a heater passage for carrying in and out the processing container heater.
[0023]
On the other hand, in the case of the second embodiment of the device of the present invention shown in FIG. 7B, the length H1 of thedevice body 4 is also about 1900 mm, and theintegrated object 56 and theexhaust box 34 are placed. The length H5 of thespace 62 is about 1000 mm, and the length H6 of theheater passage 80 required on the back side thereof is about 850 mm, so that the apparatus of the present invention can contribute to further space saving.
It should be noted that the above numerical examples are merely examples for comparison and are of course not limited thereto.
Although the case where a semiconductor wafer is heat-treated as an object to be processed has been described as an example here, the present invention is not limited to this, and the present invention can be applied to a case where heat treatment is performed on an LCD substrate, a glass substrate, or the like. It is.
[0024]
【The invention's effect】
As described above, according to the heat treatment apparatus of the present invention, the following excellent effects can be achieved.
According to the first and second aspects of the invention, the gas box is positioned at the lower stage of the electric system box, and the integrated product of the two boxes is joined to the back side of the apparatus main body. Piping space is not required, and the integrated product is also located in a part of the maintenance space of the equipment body, greatly reducing the overall required space including the equipment occupation space and equipment maintenance space. Can do.
According to the third and fourth aspects of the invention, since the exhaust box for evacuating the processing container is also directly joined to the back surface of the apparatus main body, the necessary space as a whole can be further reduced.
[Brief description of the drawings]
FIG. 1 is a perspective view showing the back side of a first embodiment of a heat treatment apparatus of the present invention.
FIG. 2 is a plan view of the apparatus shown in FIG.
FIG. 3 is a side view of the apparatus shown in FIG. 1;
FIG. 4 is an explanatory diagram for explaining the effect of reducing the required space of the first embodiment of the device of the present invention;
FIG. 5 is a perspective view showing the back side of a second embodiment of the heat treatment apparatus of the present invention.
6 is a plan view of the apparatus shown in FIG.
FIG. 7 is an explanatory diagram for explaining the effect of reducing the required space of the second embodiment of the apparatus of the present invention.
FIG. 8 is a schematic perspective view showing an example of a conventional batch type vertical heat treatment apparatus that does not have an evacuation system.
9 is a plan view of the apparatus shown in FIG.
FIG. 10 is a schematic perspective view showing an example of a conventional batch type vertical heat treatment apparatus having an evacuation system.
11 is a plan view of the apparatus shown in FIG.
[Explanation of symbols]
4 apparatusmain body 6gas box 8electric system box 14processing container 34exhaust box 50heat treatment apparatus 52maintenance door 54frame housing 56integrated object 60A-60C gas outlet 62maintenance space 70A-70C gas passage 72 atmosphericpressure exhaust pipe 74vacuum pump 76 Vacuum exhaust pipe

Claims (4)

Translated fromJapanese
複数の被処理体に対して処理ガスにより所定の処理を施すための処理容器を収容する装置本体と、前記処理ガスの供給を制御するガス制御ユニットを収容するガスボックスと、電気部品を収容する電気系ボックスとを有する熱処理装置において、前記装置本体の裏面にメンテナンスドアを設け、前記ガスボックスと前記電気系ボックスとを、前記ガスボックスを下方にした状態でフレーム筐体で上下に接合して一体化物とすると共に、この一体化物の側面を前記装置本体の裏面に、前記メンテナンスドアを避けて連結するように構成したことを特徴とする熱処理装置。An apparatus main body for storing a processing container for performing a predetermined process with a processing gas on a plurality of objects to be processed, a gas box for storing a gas control unit for controlling the supply of the processing gas, and an electrical component are stored. In the heat treatment apparatus having an electric system box, amaintenance door is provided on the back surface of the apparatus main body, and the gas box and the electric system box are joined up and down with a frame casing in a state where the gas box is positioned downward. with the integrated product, a heat treatment apparatus, wherein a side surface of the integrated product on the back surface of the apparatus main body, and configured to connect to avoidthe maintenance door.前記ガスボックスのガス操作パネルと、前記電気系ボックスの電気操作パネルとは、前記メンテナンスドアの後方に位置するメンテナンス空間に臨ませて配置されることを特徴とする請求項1記載の熱処理装置。2. The heat treatment apparatus according to claim 1, wherein the gas operation panel of the gas box and the electric operation panel of the electric system box are arranged facing a maintenance space located behind the maintenance door.前記処理容器内の真空引きを制御するための排気ユニットを収容する排気ボックスを、前記メンテナンス空間を挟んで前記一体化物に対向させて前記装置本体の裏面に接合するようにしたことを特徴とする請求項2記載の熱処理装置。An exhaust box for accommodating an exhaust unit for controlling the evacuation in the processing container is joined to the back surface of the apparatus main body so as to face the integrated object with the maintenance space interposed therebetween. The heat treatment apparatus according to claim 2.前記一体化物のメンテナンスを行う一体化物メンテナンス空間と、前記排気ボックスのメンテナンスを行う排気メンテナンス空間と、前記装置本体のメンテナンス空間とを共用するようにしたことを特徴とする請求項3記載の熱処理装置。4. The heat treatment apparatus according to claim 3, wherein an integrated object maintenance space for maintaining the integrated object, an exhaust maintenance space for maintaining the exhaust box, and a maintenance space for the apparatus main body are shared. .
JP2000364959A2000-11-302000-11-30 Heat treatment equipmentExpired - Fee RelatedJP3610900B2 (en)

Priority Applications (1)

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