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| US12/797,334US8130547B2 (en) | 2007-11-29 | 2010-06-09 | Method of maintaining the state of semiconductor memory having electrically floating body transistor |
| US12/797,320US8130548B2 (en) | 2007-11-29 | 2010-06-09 | Semiconductor memory having electrically floating body transistor |
| US12/897,528US8514622B2 (en) | 2007-11-29 | 2010-10-04 | Compact semiconductor memory device having reduced number of contacts, methods of operating and methods of making |
| US12/897,516US8547756B2 (en) | 2010-10-04 | 2010-10-04 | Semiconductor memory device having an electrically floating body transistor |
| US12/897,538US8264875B2 (en) | 2010-10-04 | 2010-10-04 | Semiconductor memory device having an electrically floating body transistor |
| US201061425820P | 2010-12-22 | 2010-12-22 | |
| PCT/US2011/023947WO2011097592A1 (en) | 2010-02-07 | 2011-02-07 | Semiconductor memory device having electrically floating body transistor, and having both volatile and non-volatile functionality and method |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9601493B2 (en) | 2006-11-29 | 2017-03-21 | Zeno Semiconductor, Inc | Compact semiconductor memory device having reduced number of contacts, methods of operating and methods of making |
| US9391079B2 (en) | 2007-11-29 | 2016-07-12 | Zeno Semiconductor, Inc. | Compact semiconductor memory device having reduced number of contacts, methods of operating and methods of making |
| US8514622B2 (en) | 2007-11-29 | 2013-08-20 | Zeno Semiconductor, Inc. | Compact semiconductor memory device having reduced number of contacts, methods of operating and methods of making |
| US7760548B2 (en) | 2006-11-29 | 2010-07-20 | Yuniarto Widjaja | Semiconductor memory having both volatile and non-volatile functionality and method of operating |
| US8547756B2 (en) | 2010-10-04 | 2013-10-01 | Zeno Semiconductor, Inc. | Semiconductor memory device having an electrically floating body transistor |
| US9230651B2 (en) | 2012-04-08 | 2016-01-05 | Zeno Semiconductor, Inc. | Memory device having electrically floating body transitor |
| US8059459B2 (en)* | 2007-10-24 | 2011-11-15 | Zeno Semiconductor, Inc. | Semiconductor memory having both volatile and non-volatile functionality and method of operating |
| US8130547B2 (en) | 2007-11-29 | 2012-03-06 | Zeno Semiconductor, Inc. | Method of maintaining the state of semiconductor memory having electrically floating body transistor |
| WO2016176248A1 (en)* | 2015-04-29 | 2016-11-03 | Zeno Semiconductor, Inc. | A mosfet and memory cell having improved drain current through back bias application |
| US11908899B2 (en) | 2009-02-20 | 2024-02-20 | Zeno Semiconductor, Inc. | MOSFET and memory cell having improved drain current through back bias application |
| IN2012DN06399A (en) | 2010-02-07 | 2015-10-02 | Zeno Semiconductor Inc | |
| WO2011105310A1 (en)* | 2010-02-26 | 2011-09-01 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| US10461084B2 (en) | 2010-03-02 | 2019-10-29 | Zeno Semiconductor, Inc. | Compact semiconductor memory device having reduced number of contacts, methods of operating and methods of making |
| US10340276B2 (en) | 2010-03-02 | 2019-07-02 | Zeno Semiconductor, Inc. | Method of maintaining the state of semiconductor memory having electrically floating body transistor |
| US9922981B2 (en) | 2010-03-02 | 2018-03-20 | Zeno Semiconductor, Inc. | Compact semiconductor memory device having reduced number of contacts, methods of operating and methods of making |
| US8207041B2 (en)* | 2010-03-09 | 2012-06-26 | Micron Technology, Inc. | Semiconductor processing methods |
| US8582359B2 (en) | 2010-11-16 | 2013-11-12 | Zeno Semiconductor, Inc. | Dual-port semiconductor memory and first-in first-out (FIFO) memory having electrically floating body transistor |
| US8957458B2 (en) | 2011-03-24 | 2015-02-17 | Zeno Semiconductor, Inc. | Asymmetric semiconductor memory device having electrically floating body transistor |
| US9025358B2 (en) | 2011-10-13 | 2015-05-05 | Zeno Semiconductor Inc | Semiconductor memory having both volatile and non-volatile functionality comprising resistive change material and method of operating |
| FR2982700B1 (en)* | 2011-11-15 | 2014-02-07 | Soitec Silicon On Insulator | READING AMPLIFIER WITH DUAL GRID PRECHARGE AND DECODING TRANSISTORS |
| CN107331416B (en) | 2012-02-16 | 2020-11-10 | 芝诺半导体有限公司 | Memory cell including primary and secondary transistors |
| US9430735B1 (en) | 2012-02-23 | 2016-08-30 | Micron Technology, Inc. | Neural network in a memory device |
| US9208880B2 (en) | 2013-01-14 | 2015-12-08 | Zeno Semiconductor, Inc. | Content addressable memory device having electrically floating body transistor |
| US9029922B2 (en) | 2013-03-09 | 2015-05-12 | Zeno Semiconductor, Inc. | Memory device comprising electrically floating body transistor |
| KR20140122328A (en)* | 2013-04-09 | 2014-10-20 | 에스케이하이닉스 주식회사 | Semiconductor Substrate and Fabrication Method Thereof, and Semiconductor Apparatus and Fabrication Method Using the Same |
| US9275723B2 (en) | 2013-04-10 | 2016-03-01 | Zeno Semiconductor, Inc. | Scalable floating body memory cell for memory compilers and method of using floating body memories with memory compilers |
| US9368625B2 (en) | 2013-05-01 | 2016-06-14 | Zeno Semiconductor, Inc. | NAND string utilizing floating body memory cell |
| US9025266B2 (en)* | 2013-06-14 | 2015-05-05 | Rohm Co., Ltd. | Semiconductor integrated circuit device, magnetic disk storage device, and electronic apparatus |
| US9281022B2 (en) | 2013-07-10 | 2016-03-08 | Zeno Semiconductor, Inc. | Systems and methods for reducing standby power in floating body memory devices |
| US9252272B2 (en)* | 2013-11-18 | 2016-02-02 | Globalfoundries Inc. | FinFET semiconductor device having local buried oxide |
| US9548119B2 (en) | 2014-01-15 | 2017-01-17 | Zeno Semiconductor, Inc | Memory device comprising an electrically floating body transistor |
| US9425237B2 (en) | 2014-03-11 | 2016-08-23 | Crossbar, Inc. | Selector device for two-terminal memory |
| US9564449B2 (en)* | 2014-03-24 | 2017-02-07 | Infineon Technologies Ag | Semiconductor device and method of forming a semiconductor device |
| US9727451B2 (en) | 2014-03-28 | 2017-08-08 | Fortinet, Inc. | Virtualization in a multi-host environment |
| US9633724B2 (en) | 2014-07-07 | 2017-04-25 | Crossbar, Inc. | Sensing a non-volatile memory device utilizing selector device holding characteristics |
| US10211397B1 (en) | 2014-07-07 | 2019-02-19 | Crossbar, Inc. | Threshold voltage tuning for a volatile selection device |
| US10115819B2 (en) | 2015-05-29 | 2018-10-30 | Crossbar, Inc. | Recessed high voltage metal oxide semiconductor transistor for RRAM cell |
| US9460788B2 (en) | 2014-07-09 | 2016-10-04 | Crossbar, Inc. | Non-volatile memory cell utilizing volatile switching two terminal device and a MOS transistor |
| US9496053B2 (en) | 2014-08-15 | 2016-11-15 | Zeno Semiconductor, Inc. | Memory device comprising electrically floating body transistor |
| US9607692B2 (en)* | 2014-10-03 | 2017-03-28 | Micron Technology, Inc. | Threshold voltage distribution determination |
| US9318717B1 (en) | 2015-01-05 | 2016-04-19 | International Business Machines Corporation | Semi-conductor device with programmable response |
| US9543382B1 (en)* | 2015-03-19 | 2017-01-10 | Altera Corporation | FinFET with improved SEU performance |
| US10553683B2 (en)* | 2015-04-29 | 2020-02-04 | Zeno Semiconductor, Inc. | MOSFET and memory cell having improved drain current through back bias application |
| CN105633160B (en)* | 2015-08-03 | 2019-06-18 | 中国科学院微电子研究所 | SOI device and method for manufacturing the same |
| US9941300B2 (en) | 2015-12-16 | 2018-04-10 | Globalfoundries Inc. | Structure and method for fully depleted silicon on insulator structure for threshold voltage modification |
| US9847133B2 (en)* | 2016-01-19 | 2017-12-19 | Ememory Technology Inc. | Memory array capable of performing byte erase operation |
| US10269406B2 (en)* | 2016-05-19 | 2019-04-23 | University of Pittsburgh—of the Commonwealth System of Higher Education | Adaptive refreshing and read voltage control scheme for a memory device such as an FeDRAM |
| KR102181177B1 (en) | 2016-07-29 | 2020-11-20 | 웨스턴 디지털 테크놀로지스, 인코포레이티드 | Non-binary encoding for non-volatile memory |
| US9773553B1 (en)* | 2016-08-19 | 2017-09-26 | Micron Technology, Inc. | Segmented memory and operation |
| US10090025B2 (en)* | 2016-10-13 | 2018-10-02 | Cisco Technology, Inc. | Discharging electric charge in integrated circuit unless in-specification condition(s) detected |
| US10079301B2 (en) | 2016-11-01 | 2018-09-18 | Zeno Semiconductor, Inc. | Memory device comprising an electrically floating body transistor and methods of using |
| US10049750B2 (en)* | 2016-11-14 | 2018-08-14 | Micron Technology, Inc. | Methods including establishing a negative body potential in a memory cell |
| US11625523B2 (en) | 2016-12-14 | 2023-04-11 | iCometrue Company Ltd. | Logic drive based on standard commodity FPGA IC chips |
| CN108288616B (en) | 2016-12-14 | 2023-04-07 | 成真股份有限公司 | Chip package |
| US20180175209A1 (en)* | 2016-12-20 | 2018-06-21 | Globalfoundries Inc. | Semiconductor structure including one or more nonvolatile memory cells and method for the formation thereof |
| US9882566B1 (en)* | 2017-01-10 | 2018-01-30 | Ememory Technology Inc. | Driving circuit for non-volatile memory |
| US10096602B1 (en)* | 2017-03-15 | 2018-10-09 | Globalfoundries Singapore Pte. Ltd. | MTP memory for SOI process |
| US10096362B1 (en) | 2017-03-24 | 2018-10-09 | Crossbar, Inc. | Switching block configuration bit comprising a non-volatile memory cell |
| US10262986B2 (en)* | 2017-06-13 | 2019-04-16 | United Microelectronics Corp. | Protection device and method for fabricating the protection device |
| US10447274B2 (en) | 2017-07-11 | 2019-10-15 | iCometrue Company Ltd. | Logic drive based on standard commodity FPGA IC chips using non-volatile memory cells |
| US10957679B2 (en) | 2017-08-08 | 2021-03-23 | iCometrue Company Ltd. | Logic drive based on standardized commodity programmable logic semiconductor IC chips |
| US10186514B1 (en) | 2017-09-06 | 2019-01-22 | Qualcomm Incorporated | Bi-stable static random access memory (SRAM) bit cells formed from III-V compounds and configured to achieve higher operating speeds |
| US10630296B2 (en) | 2017-09-12 | 2020-04-21 | iCometrue Company Ltd. | Logic drive with brain-like elasticity and integrality based on standard commodity FPGA IC chips using non-volatile memory cells |
| US10312244B2 (en)* | 2017-09-19 | 2019-06-04 | Qualcomm Incorporated | Bi-stable static random access memory (SRAM) bit cells that facilitate direct writing for storage |
| US10026740B1 (en) | 2017-10-30 | 2018-07-17 | Globalfoundries Inc. | DRAM structure with a single diffusion break |
| US10777566B2 (en) | 2017-11-10 | 2020-09-15 | Macronix International Co., Ltd. | 3D array arranged for memory and in-memory sum-of-products operations |
| US10529624B2 (en)* | 2017-11-21 | 2020-01-07 | International Business Machines Corporation | Simple contact over gate on active area |
| US10719296B2 (en) | 2018-01-17 | 2020-07-21 | Macronix International Co., Ltd. | Sum-of-products accelerator array |
| US10957392B2 (en) | 2018-01-17 | 2021-03-23 | Macronix International Co., Ltd. | 2D and 3D sum-of-products array for neuromorphic computing system |
| US10608642B2 (en) | 2018-02-01 | 2020-03-31 | iCometrue Company Ltd. | Logic drive using standard commodity programmable logic IC chips comprising non-volatile radom access memory cells |
| US10623000B2 (en) | 2018-02-14 | 2020-04-14 | iCometrue Company Ltd. | Logic drive using standard commodity programmable logic IC chips |
| US10635398B2 (en) | 2018-03-15 | 2020-04-28 | Macronix International Co., Ltd. | Voltage sensing type of matrix multiplication method for neuromorphic computing system |
| TWI787498B (en)* | 2018-04-18 | 2022-12-21 | 美商季諾半導體股份有限公司 | A memory device comprising an electrically floating body transistor |
| US10729012B2 (en) | 2018-04-24 | 2020-07-28 | Micron Technology, Inc. | Buried lines and related fabrication techniques |
| US10950663B2 (en) | 2018-04-24 | 2021-03-16 | Micron Technology, Inc. | Cross-point memory array and related fabrication techniques |
| US10825867B2 (en) | 2018-04-24 | 2020-11-03 | Micron Technology, Inc. | Cross-point memory array and related fabrication techniques |
| US10608638B2 (en) | 2018-05-24 | 2020-03-31 | iCometrue Company Ltd. | Logic drive using standard commodity programmable logic IC chips |
| US11138497B2 (en) | 2018-07-17 | 2021-10-05 | Macronix International Co., Ltd | In-memory computing devices for neural networks |
| JP2020043163A (en)* | 2018-09-07 | 2020-03-19 | キオクシア株式会社 | Semiconductor device |
| US10892011B2 (en) | 2018-09-11 | 2021-01-12 | iCometrue Company Ltd. | Logic drive using standard commodity programmable logic IC chips comprising non-volatile random access memory cells |
| US11309334B2 (en) | 2018-09-11 | 2022-04-19 | iCometrue Company Ltd. | Logic drive using standard commodity programmable logic IC chips comprising non-volatile random access memory cells |
| US10937762B2 (en) | 2018-10-04 | 2021-03-02 | iCometrue Company Ltd. | Logic drive based on multichip package using interconnection bridge |
| US11636325B2 (en) | 2018-10-24 | 2023-04-25 | Macronix International Co., Ltd. | In-memory data pooling for machine learning |
| US11616046B2 (en) | 2018-11-02 | 2023-03-28 | iCometrue Company Ltd. | Logic drive based on chip scale package comprising standardized commodity programmable logic IC chip and memory IC chip |
| WO2020100051A1 (en)* | 2018-11-13 | 2020-05-22 | Khalifa University of Science and Technology | Non-volatile memory systems based on single nanoparticles for compact and high data storage electronic devices |
| US11211334B2 (en) | 2018-11-18 | 2021-12-28 | iCometrue Company Ltd. | Logic drive based on chip scale package comprising standardized commodity programmable logic IC chip and memory IC chip |
| US10672469B1 (en) | 2018-11-30 | 2020-06-02 | Macronix International Co., Ltd. | In-memory convolution for machine learning |
| US11562229B2 (en) | 2018-11-30 | 2023-01-24 | Macronix International Co., Ltd. | Convolution accelerator using in-memory computation |
| US11934480B2 (en) | 2018-12-18 | 2024-03-19 | Macronix International Co., Ltd. | NAND block architecture for in-memory multiply-and-accumulate operations |
| US10777286B2 (en) | 2018-12-28 | 2020-09-15 | Micron Technology, Inc. | Apparatus and methods for determining data states of memory cells |
| KR102554712B1 (en)* | 2019-01-11 | 2023-07-14 | 삼성전자주식회사 | Semiconductor device |
| US11600663B2 (en) | 2019-01-11 | 2023-03-07 | Zeno Semiconductor, Inc. | Memory cell and memory array select transistor |
| CN111653627B (en) | 2019-01-30 | 2021-03-12 | 长江存储科技有限责任公司 | Capacitor structure with vertical diffusion plate |
| US11119674B2 (en) | 2019-02-19 | 2021-09-14 | Macronix International Co., Ltd. | Memory devices and methods for operating the same |
| US10783963B1 (en) | 2019-03-08 | 2020-09-22 | Macronix International Co., Ltd. | In-memory computation device with inter-page and intra-page data circuits |
| US12439611B2 (en) | 2019-03-12 | 2025-10-07 | Zeno Semiconductor, Inc. | Memory cell and memory array select transistor |
| US11132176B2 (en) | 2019-03-20 | 2021-09-28 | Macronix International Co., Ltd. | Non-volatile computing method in flash memory |
| US10910393B2 (en) | 2019-04-25 | 2021-02-02 | Macronix International Co., Ltd. | 3D NOR memory having vertical source and drain structures |
| JP7502317B2 (en)* | 2019-04-30 | 2024-06-18 | 長江存儲科技有限責任公司 | CONTROLLER, APPARATUS AND METHOD |
| US10985154B2 (en) | 2019-07-02 | 2021-04-20 | iCometrue Company Ltd. | Logic drive based on multichip package comprising standard commodity FPGA IC chip with cryptography circuits |
| US11227838B2 (en) | 2019-07-02 | 2022-01-18 | iCometrue Company Ltd. | Logic drive based on multichip package comprising standard commodity FPGA IC chip with cooperating or supporting circuits |
| US11887930B2 (en) | 2019-08-05 | 2024-01-30 | iCometrue Company Ltd. | Vertical interconnect elevator based on through silicon vias |
| US11637056B2 (en) | 2019-09-20 | 2023-04-25 | iCometrue Company Ltd. | 3D chip package based on through-silicon-via interconnection elevator |
| US11600526B2 (en) | 2020-01-22 | 2023-03-07 | iCometrue Company Ltd. | Chip package based on through-silicon-via connector and silicon interconnection bridge |
| DE102020202038A1 (en)* | 2020-02-18 | 2021-08-19 | Robert Bosch Gesellschaft mit beschränkter Haftung | Vertical fin field effect transistor, vertical fin field effect transistor arrangement and method for forming a vertical fin field effect transistor |
| US11985825B2 (en) | 2020-06-25 | 2024-05-14 | Taiwan Semiconductor Manufacturing Co., Ltd. | 3D memory array contact structures |
| US11653500B2 (en) | 2020-06-25 | 2023-05-16 | Taiwan Semiconductor Manufacturing Co., Ltd. | Memory array contact structures |
| US11532343B2 (en) | 2020-06-26 | 2022-12-20 | Taiwan Semiconductor Manufacturing Co., Ltd. | Memory array including dummy regions |
| US11600520B2 (en) | 2020-06-26 | 2023-03-07 | Taiwan Semiconductor Manufacturing Co., Ltd. | Air gaps in memory array structures |
| US11495618B2 (en) | 2020-07-30 | 2022-11-08 | Taiwan Semiconductor Manufacturing Co., Ltd. | Three-dimensional memory device and method |
| CN112510078A (en)* | 2020-11-13 | 2021-03-16 | 安徽清水湖新材料技术有限公司 | Semiconductor based on nano material and preparation method |
| US11411087B2 (en) | 2020-12-04 | 2022-08-09 | Globalfoundries U.S. Inc. | Integrated circuit (IC) structure with high impedance semiconductor material between substrate and transistor |
| US11737274B2 (en) | 2021-02-08 | 2023-08-22 | Macronix International Co., Ltd. | Curved channel 3D memory device |
| US11641746B2 (en)* | 2021-02-25 | 2023-05-02 | Sandisk Technologies Llc | Three-dimensional memory device with peripheral circuit located over support pillar array and method of making thereof |
| US11716856B2 (en) | 2021-03-05 | 2023-08-01 | Taiwan Semiconductor Manufacturing Co., Ltd. | Three-dimensional memory device and method |
| US11916011B2 (en) | 2021-04-14 | 2024-02-27 | Macronix International Co., Ltd. | 3D virtual ground memory and manufacturing methods for same |
| US12176278B2 (en) | 2021-05-30 | 2024-12-24 | iCometrue Company Ltd. | 3D chip package based on vertical-through-via connector |
| US11710519B2 (en) | 2021-07-06 | 2023-07-25 | Macronix International Co., Ltd. | High density memory with reference memory using grouped cells and corresponding operations |
| TWI777662B (en)* | 2021-07-09 | 2022-09-11 | 鈺成投資股份有限公司 | Cell structure of reprogrammable memory and its operation method |
| US12299597B2 (en) | 2021-08-27 | 2025-05-13 | Macronix International Co., Ltd. | Reconfigurable AI system |
| US12268012B2 (en) | 2021-09-24 | 2025-04-01 | iCometrue Company Ltd. | Multi-output look-up table (LUT) for use in coarse-grained field-programmable-gate-array (FPGA) integrated-circuit (IC) chip |
| KR20230120223A (en) | 2022-02-08 | 2023-08-17 | 삼성디스플레이 주식회사 | Display Apparatus |
| DE102022212598A1 (en) | 2022-11-25 | 2024-05-29 | Forschungszentrum Jülich GmbH | Memory cell and operation of the memory cell |
| US12321603B2 (en) | 2023-02-22 | 2025-06-03 | Macronix International Co., Ltd. | High bandwidth non-volatile memory for AI inference system |
| WO2024195116A1 (en)* | 2023-03-23 | 2024-09-26 | ユニサンティス エレクトロニクス シンガポール プライベート リミテッド | Memory device using semiconductor element |
| WO2024201727A1 (en)* | 2023-03-28 | 2024-10-03 | ユニサンティス エレクトロニクス シンガポール プライベート リミテッド | Memory device using semiconductor element |
| US12417170B2 (en) | 2023-05-10 | 2025-09-16 | Macronix International Co., Ltd. | Computing system and method of operation thereof |
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4003076A (en) | 1973-05-21 | 1977-01-11 | Signetics Corporation | Single bipolar transistor memory cell and method |
| NL7700880A (en) | 1976-12-17 | 1978-08-01 | Philips Nv | ACCESSIBLE MEMORY WITH JUNCTION FIELD DEFECT TRANSISTORS. |
| US4274012A (en) | 1979-01-24 | 1981-06-16 | Xicor, Inc. | Substrate coupled floating gate memory cell |
| JPS56163585A (en)* | 1980-05-17 | 1981-12-16 | Semiconductor Res Found | Semiconductor memory |
| JP2685770B2 (en) | 1987-12-28 | 1997-12-03 | 株式会社東芝 | Nonvolatile semiconductor memory device |
| KR900019027A (en)* | 1988-05-23 | 1990-12-22 | 미다 가쓰시게 | Nonvolatile Semiconductor Memory |
| US5844842A (en) | 1989-02-06 | 1998-12-01 | Hitachi, Ltd. | Nonvolatile semiconductor memory device |
| US5222040A (en)* | 1990-12-11 | 1993-06-22 | Nexcom Technology, Inc. | Single transistor eeprom memory cell |
| GB2256735B (en) | 1991-06-12 | 1995-06-21 | Intel Corp | Non-volatile disk cache |
| US5383162A (en)* | 1991-08-26 | 1995-01-17 | Hitachi, Ltd. | Semiconductor memory device |
| DE4311358C2 (en)* | 1992-04-07 | 1999-07-22 | Mitsubishi Electric Corp | Non-volatile semiconductor memory device and operating method for a non-volatile semiconductor memory device and method for programming information into a non-volatile semiconductor memory device |
| JPH065823A (en)* | 1992-06-19 | 1994-01-14 | Toshiba Corp | Nonvolatile semiconductor memory device and method of using the same |
| US5694356A (en)* | 1994-11-02 | 1997-12-02 | Invoice Technology, Inc. | High resolution analog storage EPROM and flash EPROM |
| KR100473308B1 (en) | 1995-01-31 | 2005-03-14 | 가부시끼가이샤 히다치 세이사꾸쇼 | Nonvolatile memory device |
| US5619471A (en)* | 1995-06-06 | 1997-04-08 | Apple Computer, Inc. | Memory controller for both interleaved and non-interleaved memory |
| JPH0982921A (en)* | 1995-09-11 | 1997-03-28 | Rohm Co Ltd | Semiconductor storage device, its manufacture, and virtual ground array connection method of semiconductor storage device |
| US6810449B1 (en)* | 1995-10-19 | 2004-10-26 | Rambus, Inc. | Protocol for communication with dynamic memory |
| US6163048A (en) | 1995-10-25 | 2000-12-19 | Cypress Semiconductor Corporation | Semiconductor non-volatile memory device having a NAND cell structure |
| US5581504A (en) | 1995-11-14 | 1996-12-03 | Programmable Microelectronics Corp. | Non-volatile electrically erasable memory with PMOS transistor NAND gate structure |
| US5767549A (en) | 1996-07-03 | 1998-06-16 | International Business Machines Corporation | SOI CMOS structure |
| JP3951443B2 (en) | 1997-09-02 | 2007-08-01 | ソニー株式会社 | Nonvolatile semiconductor memory device and writing method thereof |
| JP3492168B2 (en) | 1997-10-21 | 2004-02-03 | シャープ株式会社 | Nonvolatile semiconductor memory device |
| US6005818A (en) | 1998-01-20 | 1999-12-21 | Stmicroelectronics, Inc. | Dynamic random access memory device with a latching mechanism that permits hidden refresh operations |
| JP3344313B2 (en)* | 1998-03-25 | 2002-11-11 | 日本電気株式会社 | Nonvolatile semiconductor memory device |
| AU3073800A (en)* | 1999-02-01 | 2000-08-25 | Hitachi Limited | Semiconductor integrated circuit and nonvolatile memory element |
| US6356485B1 (en) | 1999-02-13 | 2002-03-12 | Integrated Device Technology, Inc. | Merging write cycles by comparing at least a portion of the respective write cycle addresses |
| US6452856B1 (en)* | 1999-02-26 | 2002-09-17 | Micron Technology, Inc. | DRAM technology compatible processor/memory chips |
| US6141248A (en) | 1999-07-29 | 2000-10-31 | Micron Technology, Inc. | DRAM and SRAM memory cells with repressed memory |
| JP3878374B2 (en)* | 1999-12-01 | 2007-02-07 | 株式会社東芝 | Nonvolatile semiconductor memory device |
| KR100323140B1 (en) | 2000-01-17 | 2002-02-06 | 윤종용 | NAND-type flash memory device and method of fabricating the same |
| DE10012105B4 (en) | 2000-03-13 | 2007-08-23 | Infineon Technologies Ag | Method for reading non-volatile semiconductor memory devices |
| JP2001274265A (en) | 2000-03-28 | 2001-10-05 | Mitsubishi Electric Corp | Semiconductor device |
| JP2001358313A (en) | 2000-06-14 | 2001-12-26 | Hitachi Ltd | Semiconductor device |
| KR100821456B1 (en) | 2000-08-14 | 2008-04-11 | 샌디스크 쓰리디 엘엘씨 | Dense array and charge storage device and manufacturing method thereof |
| JP2002133878A (en) | 2000-10-23 | 2002-05-10 | Hitachi Ltd | Nonvolatile memory circuit and semiconductor integrated circuit |
| US6566682B2 (en)* | 2001-02-09 | 2003-05-20 | Micron Technology, Inc. | Programmable memory address and decode circuits with ultra thin vertical body transistors |
| EP1384232A4 (en) | 2001-04-05 | 2008-11-19 | T Ram Inc | Dynamic data restore in thyristor-based memory device |
| US6675272B2 (en)* | 2001-04-24 | 2004-01-06 | Rambus Inc. | Method and apparatus for coordinating memory operations among diversely-located memory components |
| TWI230392B (en) | 2001-06-18 | 2005-04-01 | Innovative Silicon Sa | Semiconductor device |
| US6762092B2 (en)* | 2001-08-08 | 2004-07-13 | Sandisk Corporation | Scalable self-aligned dual floating gate memory cell array and methods of forming the array |
| US6567329B2 (en)* | 2001-08-28 | 2003-05-20 | Intel Corporation | Multiple word-line accessing and accessor |
| US7333388B2 (en)* | 2001-10-03 | 2008-02-19 | Infineon Technologies Aktiengesellschaft | Multi-port memory cells |
| US7130213B1 (en)* | 2001-12-06 | 2006-10-31 | Virage Logic Corporation | Methods and apparatuses for a dual-polarity non-volatile memory cell |
| US6788574B1 (en)* | 2001-12-06 | 2004-09-07 | Virage Logic Corporation | Electrically-alterable non-volatile memory cell |
| US6992938B1 (en)* | 2001-12-06 | 2006-01-31 | Virage Logic Corporation | Methods and apparatuses for test circuitry for a dual-polarity non-volatile memory cell |
| US6661042B2 (en) | 2002-03-11 | 2003-12-09 | Monolithic System Technology, Inc. | One-transistor floating-body DRAM cell in bulk CMOS process with electrically isolated charge storage region |
| US6686624B2 (en) | 2002-03-11 | 2004-02-03 | Monolithic System Technology, Inc. | Vertical one-transistor floating-body DRAM cell in bulk CMOS process with electrically isolated charge storage region |
| US6954377B2 (en) | 2002-03-19 | 2005-10-11 | O2Ic, Inc. | Non-volatile differential dynamic random access memory |
| EP1355316B1 (en) | 2002-04-18 | 2007-02-21 | Innovative Silicon SA | Data storage device and refreshing method for use with such device |
| CN1669155A (en)* | 2002-05-09 | 2005-09-14 | 伊皮杰有限公司 | Pseudo-Non-Volatile Direct Tunneling Floating Gate Devices |
| US20040004863A1 (en)* | 2002-07-05 | 2004-01-08 | Chih-Hsin Wang | Nonvolatile electrically alterable memory device and array made thereby |
| US7042052B2 (en) | 2003-02-10 | 2006-05-09 | Micron Technology, Inc. | Transistor constructions and electronic devices |
| US6956256B2 (en)* | 2003-03-04 | 2005-10-18 | Micron Technology Inc. | Vertical gain cell |
| JP2004335797A (en)* | 2003-05-08 | 2004-11-25 | Sharp Corp | Semiconductor storage device, driving method thereof, and portable electronic device |
| US20040228168A1 (en) | 2003-05-13 | 2004-11-18 | Richard Ferrant | Semiconductor memory device and method of operating same |
| US6958513B2 (en)* | 2003-06-06 | 2005-10-25 | Chih-Hsin Wang | Floating-gate memory cell having trench structure with ballistic-charge injector, and the array of memory cells |
| US6955967B2 (en)* | 2003-06-27 | 2005-10-18 | Freescale Semiconductor, Inc. | Non-volatile memory having a reference transistor and method for forming |
| US20050012137A1 (en)* | 2003-07-18 | 2005-01-20 | Amitay Levi | Nonvolatile memory cell having floating gate, control gate and separate erase gate, an array of such memory cells, and method of manufacturing |
| US7227803B2 (en) | 2003-07-31 | 2007-06-05 | Brocade Communications Systems, Inc. | Apparatus for reducing data corruption in a non-volatile memory |
| DE10350751B4 (en) | 2003-10-30 | 2008-04-24 | Infineon Technologies Ag | Method for producing a vertical field effect transistor and field effect memory transistor, in particular FLASH memory transistor |
| US7242050B2 (en)* | 2003-11-13 | 2007-07-10 | Silicon Storage Technology, Inc. | Stacked gate memory cell with erase to gate, array, and method of manufacturing |
| US6969656B2 (en) | 2003-12-05 | 2005-11-29 | Freescale Semiconductor, Inc. | Method and circuit for multiplying signals with a transistor having more than one independent gate structure |
| US20050128807A1 (en)* | 2003-12-05 | 2005-06-16 | En-Hsing Chen | Nand memory array incorporating multiple series selection devices and method for operation of same |
| US7049652B2 (en)* | 2003-12-10 | 2006-05-23 | Sandisk Corporation | Pillar cell flash memory technology |
| JP2005243709A (en) | 2004-02-24 | 2005-09-08 | Toshiba Corp | Semiconductor device and manufacturing method thereof |
| KR100560815B1 (en)* | 2004-03-16 | 2006-03-13 | 삼성전자주식회사 | Release semiconductor substrate and method of forming the same |
| JP4331053B2 (en) | 2004-05-27 | 2009-09-16 | 株式会社東芝 | Semiconductor memory device |
| KR100621628B1 (en) | 2004-05-31 | 2006-09-19 | 삼성전자주식회사 | Nonvolatile Memory Cells and Their Formation Methods |
| US7009887B1 (en) | 2004-06-03 | 2006-03-07 | Fasl Llc | Method of determining voltage compensation for flash memory devices |
| US7118986B2 (en) | 2004-06-16 | 2006-10-10 | International Business Machines Corporation | STI formation in semiconductor device including SOI and bulk silicon regions |
| US7259420B2 (en) | 2004-07-28 | 2007-08-21 | International Business Machines Corporation | Multiple-gate device with floating back gate |
| US7348625B2 (en)* | 2004-08-11 | 2008-03-25 | Macronix International Co., Ltd. | Semiconductor device and method of manufacturing the same |
| US7171321B2 (en)* | 2004-08-20 | 2007-01-30 | Rambus Inc. | Individual data line strobe-offset control in memory systems |
| US7145186B2 (en) | 2004-08-24 | 2006-12-05 | Micron Technology, Inc. | Memory cell with trenched gated thyristor |
| JP2006073062A (en)* | 2004-08-31 | 2006-03-16 | Toshiba Corp | Semiconductor memory device |
| KR100591770B1 (en) | 2004-09-01 | 2006-06-26 | 삼성전자주식회사 | Flash memory device using semiconductor pin and manufacturing method thereof |
| KR100598109B1 (en) | 2004-10-08 | 2006-07-07 | 삼성전자주식회사 | Nonvolatile Memory Device and Formation Method |
| US7476939B2 (en)* | 2004-11-04 | 2009-01-13 | Innovative Silicon Isi Sa | Memory cell having an electrically floating body transistor and programming technique therefor |
| US7301803B2 (en) | 2004-12-22 | 2007-11-27 | Innovative Silicon S.A. | Bipolar reading technique for a memory cell having an electrically floating body transistor |
| US7369438B2 (en)* | 2004-12-28 | 2008-05-06 | Aplus Flash Technology, Inc. | Combo memory design and technology for multiple-function java card, sim-card, bio-passport and bio-id card applications |
| US7307268B2 (en)* | 2005-01-19 | 2007-12-11 | Sandisk Corporation | Structure and method for biasing phase change memory array for reliable writing |
| US7504302B2 (en) | 2005-03-18 | 2009-03-17 | Freescale Semiconductor, Inc. | Process of forming a non-volatile memory cell including a capacitor structure |
| US7602006B2 (en) | 2005-04-20 | 2009-10-13 | Taiwan Semiconductor Manufacturing Co., Ltd. | Semiconductor flash device |
| JP4832004B2 (en)* | 2005-06-09 | 2011-12-07 | パナソニック株式会社 | Semiconductor memory device |
| US7205601B2 (en) | 2005-06-09 | 2007-04-17 | Taiwan Semiconductor Manufacturing Company, Ltd. | FinFET split gate EEPROM structure and method of its fabrication |
| CN1897282A (en)* | 2005-06-30 | 2007-01-17 | St微电子克鲁勒斯图股份公司 | Memory cell with an isolated-body mos transistor with reinforced memory effect |
| US7471570B2 (en)* | 2005-09-19 | 2008-12-30 | Texas Instruments Incorporated | Embedded EEPROM array techniques for higher density |
| TWI263310B (en) | 2005-09-28 | 2006-10-01 | Powerchip Semiconductor Corp | Non-volatile memory and fabricating method thereof |
| KR100663366B1 (en) | 2005-10-26 | 2007-01-02 | 삼성전자주식회사 | Flash memory device manufacturing method having self-aligned floating gate and related devices |
| WO2007070808A2 (en) | 2005-12-12 | 2007-06-21 | The Regents Of The University Of California | Multi-bit-per-cell nvm structures and architecture |
| JP2007194259A (en) | 2006-01-17 | 2007-08-02 | Toshiba Corp | Semiconductor device and manufacturing method thereof |
| US7348621B2 (en)* | 2006-02-10 | 2008-03-25 | Micrel, Inc. | Non-volatile memory cells |
| US7542345B2 (en) | 2006-02-16 | 2009-06-02 | Innovative Silicon Isi Sa | Multi-bit memory cell having electrically floating body transistor, and method of programming and reading same |
| US7535060B2 (en) | 2006-03-08 | 2009-05-19 | Freescale Semiconductor, Inc. | Charge storage structure formation in transistor with vertical channel region |
| US7439594B2 (en) | 2006-03-16 | 2008-10-21 | Micron Technology, Inc. | Stacked non-volatile memory with silicon carbide-based amorphous silicon thin film transistors |
| EP1835530A3 (en) | 2006-03-17 | 2009-01-28 | Samsung Electronics Co., Ltd. | Non-volatile memory device and method of manufacturing the same |
| KR100810614B1 (en) | 2006-08-23 | 2008-03-06 | 삼성전자주식회사 | Semiconductor memory device having DRAM cell mode and nonvolatile memory cell mode and method of operating same |
| JP4364227B2 (en) | 2006-09-29 | 2009-11-11 | 株式会社東芝 | Semiconductor memory device |
| US8325530B2 (en) | 2006-10-03 | 2012-12-04 | Macronix International Co., Ltd. | Cell operation methods using gate-injection for floating gate NAND flash memory |
| US8194451B2 (en) | 2007-11-29 | 2012-06-05 | Zeno Semiconductor, Inc. | Memory cells, memory cell arrays, methods of using and methods of making |
| US8077536B2 (en) | 2008-08-05 | 2011-12-13 | Zeno Semiconductor, Inc. | Method of operating semiconductor memory device with floating body transistor using silicon controlled rectifier principle |
| US8159868B2 (en) | 2008-08-22 | 2012-04-17 | Zeno Semiconductor, Inc. | Semiconductor memory having both volatile and non-volatile functionality including resistance change material and method of operating |
| US8514622B2 (en) | 2007-11-29 | 2013-08-20 | Zeno Semiconductor, Inc. | Compact semiconductor memory device having reduced number of contacts, methods of operating and methods of making |
| US7760548B2 (en) | 2006-11-29 | 2010-07-20 | Yuniarto Widjaja | Semiconductor memory having both volatile and non-volatile functionality and method of operating |
| US8547756B2 (en) | 2010-10-04 | 2013-10-01 | Zeno Semiconductor, Inc. | Semiconductor memory device having an electrically floating body transistor |
| US7450423B2 (en) | 2007-01-03 | 2008-11-11 | Macronix International Co., Ltd. | Methods of operating non-volatile memory cells having an oxide/nitride multilayer insulating structure |
| US7898009B2 (en)* | 2007-02-22 | 2011-03-01 | American Semiconductor, Inc. | Independently-double-gated transistor memory (IDGM) |
| US7447068B2 (en) | 2007-03-19 | 2008-11-04 | Macronix International Co., Ltd. | Method for programming a multilevel memory |
| US7558132B2 (en)* | 2007-03-30 | 2009-07-07 | International Business Machines Corporation | Implementing calibration of DQS sampling during synchronous DRAM reads |
| US7452776B1 (en) | 2007-04-24 | 2008-11-18 | Promos Technoloies Pte. Ltd. | Integrated circuits with substrate protrusions, including (but not limited to) floating gate memories |
| US7723774B2 (en)* | 2007-07-10 | 2010-05-25 | Silicon Storage Technology, Inc. | Non-diffusion junction split-gate nonvolatile memory cells and arrays, methods of programming, erasing, and reading thereof, and methods of manufacture |
| JP2009037703A (en) | 2007-08-02 | 2009-02-19 | Toshiba Corp | Resistance change memory |
| KR100894683B1 (en)* | 2007-08-28 | 2009-04-24 | 경북대학교 산학협력단 | High Performance Single Transistor Floating Body DRAM Device and Manufacturing Method Thereof |
| US7674669B2 (en) | 2007-09-07 | 2010-03-09 | Micron Technology, Inc. | FIN field effect transistor |
| JP5189809B2 (en)* | 2007-09-13 | 2013-04-24 | ルネサスエレクトロニクス株式会社 | Semiconductor memory device |
| TWI351767B (en) | 2007-10-02 | 2011-11-01 | Nanya Technology Corp | Two-bit flash memory |
| US7759715B2 (en) | 2007-10-15 | 2010-07-20 | Micron Technology, Inc. | Memory cell comprising dynamic random access memory (DRAM) nanoparticles and nonvolatile memory (NVM) nanoparticle |
| US8059459B2 (en) | 2007-10-24 | 2011-11-15 | Zeno Semiconductor, Inc. | Semiconductor memory having both volatile and non-volatile functionality and method of operating |
| US20090108351A1 (en) | 2007-10-26 | 2009-04-30 | International Business Machines Corporation | Finfet memory device with dual separate gates and method of operation |
| CN101221953B (en)* | 2007-11-22 | 2011-06-22 | 林殷茵 | Multiport and multi-channel embedded dynamic ram and operating method thereof |
| US8174886B2 (en) | 2007-11-29 | 2012-05-08 | Zeno Semiconductor, Inc. | Semiconductor memory having electrically floating body transistor |
| US8264875B2 (en) | 2010-10-04 | 2012-09-11 | Zeno Semiconducor, Inc. | Semiconductor memory device having an electrically floating body transistor |
| US10403361B2 (en) | 2007-11-29 | 2019-09-03 | Zeno Semiconductor, Inc. | Memory cells, memory cell arrays, methods of using and methods of making |
| US8130547B2 (en) | 2007-11-29 | 2012-03-06 | Zeno Semiconductor, Inc. | Method of maintaining the state of semiconductor memory having electrically floating body transistor |
| US8130548B2 (en) | 2007-11-29 | 2012-03-06 | Zeno Semiconductor, Inc. | Semiconductor memory having electrically floating body transistor |
| US7615447B2 (en)* | 2007-12-19 | 2009-11-10 | Sandisk Corporation | Composite charge storage structure formation in non-volatile memory using etch stop technologies |
| US8331150B2 (en) | 2008-01-03 | 2012-12-11 | Aplus Flash Technology, Inc. | Integrated SRAM and FLOTOX EEPROM memory device |
| US7800156B2 (en) | 2008-02-25 | 2010-09-21 | Tower Semiconductor Ltd. | Asymmetric single poly NMOS non-volatile memory cell |
| US8014200B2 (en) | 2008-04-08 | 2011-09-06 | Zeno Semiconductor, Inc. | Semiconductor memory having volatile and multi-bit, non-volatile functionality and methods of operating |
| US7701763B2 (en) | 2008-04-23 | 2010-04-20 | Micron Technology, Inc. | Leakage compensation during program and read operations |
| KR101498873B1 (en) | 2008-07-08 | 2015-03-04 | 삼성전자주식회사 | Method for operating an memory device having characters of DRAM and Non-volatile memory |
| US7933140B2 (en) | 2008-10-02 | 2011-04-26 | Micron Technology, Inc. | Techniques for reducing a voltage swing |
| US7924630B2 (en) | 2008-10-15 | 2011-04-12 | Micron Technology, Inc. | Techniques for simultaneously driving a plurality of source lines |
| KR101073643B1 (en)* | 2009-02-19 | 2011-10-14 | 서울대학교산학협력단 | High performance 1T-DRAM cell device and manufacturing method thereof |
| JP2010267341A (en)* | 2009-05-15 | 2010-11-25 | Renesas Electronics Corp | Semiconductor device |
| CN101958144B (en)* | 2009-07-13 | 2013-08-21 | 澜起科技(上海)有限公司 | Method for generating reading enabling signals and storage system adopting same |
| IN2012DN06399A (en) | 2010-02-07 | 2015-10-02 | Zeno Semiconductor Inc | |
| US10340276B2 (en)* | 2010-03-02 | 2019-07-02 | Zeno Semiconductor, Inc. | Method of maintaining the state of semiconductor memory having electrically floating body transistor |
| US8379458B1 (en)* | 2010-10-13 | 2013-02-19 | Monolithic 3D Inc. | Semiconductor device and structure |
| US8582359B2 (en) | 2010-11-16 | 2013-11-12 | Zeno Semiconductor, Inc. | Dual-port semiconductor memory and first-in first-out (FIFO) memory having electrically floating body transistor |
| US8957458B2 (en)* | 2011-03-24 | 2015-02-17 | Zeno Semiconductor, Inc. | Asymmetric semiconductor memory device having electrically floating body transistor |
| US9230814B2 (en)* | 2011-10-28 | 2016-01-05 | Invensas Corporation | Non-volatile memory devices having vertical drain to gate capacitive coupling |
| ITTO20120559A1 (en)* | 2012-06-25 | 2013-12-26 | St Microelectronics Srl | NON-VOLATILE MEMORY DEVICE WITH SINGLE-LAYER MEMORY CELLS OF POLYSILIC |
| US9007855B2 (en)* | 2012-12-24 | 2015-04-14 | Arm Limited | Data signal receiver and method of calibrating a data signal receiver |
| US9208880B2 (en)* | 2013-01-14 | 2015-12-08 | Zeno Semiconductor, Inc. | Content addressable memory device having electrically floating body transistor |
| US8902663B1 (en)* | 2013-03-11 | 2014-12-02 | Monolithic 3D Inc. | Method of maintaining a memory state |
| US9236453B2 (en)* | 2013-09-27 | 2016-01-12 | Ememory Technology Inc. | Nonvolatile memory structure and fabrication method thereof |
| US9769589B2 (en) | 2013-09-27 | 2017-09-19 | Sony Interactive Entertainment Inc. | Method of improving externalization of virtual surround sound |
| US9025399B1 (en)* | 2013-12-06 | 2015-05-05 | Intel Corporation | Method for training a control signal based on a strobe signal in a memory module |
| US10468425B2 (en)* | 2014-02-04 | 2019-11-05 | Stmicroelectronics S.R.L. | Embedded non-volatile memory with single polysilicon layer memory cells erasable through band to band tunneling induced hot electron and programmable through Fowler-Nordheim tunneling |
| US9496053B2 (en)* | 2014-08-15 | 2016-11-15 | Zeno Semiconductor, Inc. | Memory device comprising electrically floating body transistor |
| Publication | Publication Date | Title |
|---|---|---|
| IN2012DN06399A (en) | ||
| PL3065184T3 (en) | Trench process and structure for backside contact solar cells with polysilicon doped regions | |
| WO2012170409A3 (en) | Techniques for providing a semiconductor memory device | |
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| IN2012DN05057A (en) | ||
| TW201130114A (en) | Corner layout for superjunction device | |
| SG11201400942YA (en) | Memory cells and memory cell arrays | |
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| IN2012DN00356A (en) | ||
| MX2012002156A (en) | Doped transparent conductive oxide. | |
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