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GB8515025D0 - Calibration apparatus - Google Patents

Calibration apparatus

Info

Publication number
GB8515025D0
GB8515025D0GB858515025AGB8515025AGB8515025D0GB 8515025 D0GB8515025 D0GB 8515025D0GB 858515025 AGB858515025 AGB 858515025AGB 8515025 AGB8515025 AGB 8515025AGB 8515025 D0GB8515025 D0GB 8515025D0
Authority
GB
United Kingdom
Prior art keywords
calibration apparatus
calibration
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
GB858515025A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
GE Healthcare UK Ltd
Original Assignee
GE Healthcare UK Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by GE Healthcare UK LtdfiledCriticalGE Healthcare UK Ltd
Priority to GB858515025ApriorityCriticalpatent/GB8515025D0/en
Publication of GB8515025D0publicationCriticalpatent/GB8515025D0/en
Priority to JP61503551Aprioritypatent/JPS63500907A/en
Priority to GB08614398Aprioritypatent/GB2184849A/en
Priority to PCT/GB1986/000346prioritypatent/WO1986007493A1/en
Priority to EP19860904232prioritypatent/EP0224582A1/en
Pendinglegal-statusCriticalCurrent

Links

GB858515025A1985-06-131985-06-13Calibration apparatusPendingGB8515025D0 (en)

Priority Applications (5)

Application NumberPriority DateFiling DateTitle
GB858515025AGB8515025D0 (en)1985-06-131985-06-13Calibration apparatus
JP61503551AJPS63500907A (en)1985-06-131986-06-13 Integrated circuit calibration equipment
GB08614398AGB2184849A (en)1985-06-131986-06-13Calibrating microwave integrated circuit test systems
PCT/GB1986/000346WO1986007493A1 (en)1985-06-131986-06-13Calibration apparatus for integrated circuits
EP19860904232EP0224582A1 (en)1985-06-131986-06-13Calibration apparatus for integrated circuits

Applications Claiming Priority (1)

Application NumberPriority DateFiling DateTitle
GB858515025AGB8515025D0 (en)1985-06-131985-06-13Calibration apparatus

Publications (1)

Publication NumberPublication Date
GB8515025D0true GB8515025D0 (en)1985-07-17

Family

ID=10580709

Family Applications (2)

Application NumberTitlePriority DateFiling Date
GB858515025APendingGB8515025D0 (en)1985-06-131985-06-13Calibration apparatus
GB08614398AWithdrawnGB2184849A (en)1985-06-131986-06-13Calibrating microwave integrated circuit test systems

Family Applications After (1)

Application NumberTitlePriority DateFiling Date
GB08614398AWithdrawnGB2184849A (en)1985-06-131986-06-13Calibrating microwave integrated circuit test systems

Country Status (4)

CountryLink
EP (1)EP0224582A1 (en)
JP (1)JPS63500907A (en)
GB (2)GB8515025D0 (en)
WO (1)WO1986007493A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
CN118707424A (en)*2024-08-302024-09-27四川映塞科技有限责任公司 Automatic calibration system and method for square resistance tester

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US6380751B2 (en)1992-06-112002-04-30Cascade Microtech, Inc.Wafer probe station having environment control enclosure
US5345170A (en)1992-06-111994-09-06Cascade Microtech, Inc.Wafer probe station having integrated guarding, Kelvin connection and shielding systems
US5561377A (en)1995-04-141996-10-01Cascade Microtech, Inc.System for evaluating probing networks
US6002263A (en)1997-06-061999-12-14Cascade Microtech, Inc.Probe station having inner and outer shielding
US6445202B1 (en)1999-06-302002-09-03Cascade Microtech, Inc.Probe station thermal chuck with shielding for capacitive current
JP4183859B2 (en)*1999-09-022008-11-19株式会社アドバンテスト Semiconductor substrate testing equipment
US6965226B2 (en)2000-09-052005-11-15Cascade Microtech, Inc.Chuck for holding a device under test
US6914423B2 (en)2000-09-052005-07-05Cascade Microtech, Inc.Probe station
DE10056882C2 (en)2000-11-162003-06-05Infineon Technologies Ag Method for calibrating a test system for semiconductor components and test substrate
WO2003020467A1 (en)2001-08-312003-03-13Cascade Microtech, Inc.Optical testing device
US6777964B2 (en)2002-01-252004-08-17Cascade Microtech, Inc.Probe station
US6847219B1 (en)2002-11-082005-01-25Cascade Microtech, Inc.Probe station with low noise characteristics
US7250779B2 (en)2002-11-252007-07-31Cascade Microtech, Inc.Probe station with low inductance path
US6861856B2 (en)2002-12-132005-03-01Cascade Microtech, Inc.Guarded tub enclosure
US7221172B2 (en)2003-05-062007-05-22Cascade Microtech, Inc.Switched suspended conductor and connection
US7492172B2 (en)2003-05-232009-02-17Cascade Microtech, Inc.Chuck for holding a device under test
US7250626B2 (en)*2003-10-222007-07-31Cascade Microtech, Inc.Probe testing structure
US7187188B2 (en)2003-12-242007-03-06Cascade Microtech, Inc.Chuck with integrated wafer support
WO2005121824A2 (en)2004-06-072005-12-22Cascade Microtech, Inc.Thermal optical chuck
US7330041B2 (en)2004-06-142008-02-12Cascade Microtech, Inc.Localizing a temperature of a device for testing
US7535247B2 (en)2005-01-312009-05-19Cascade Microtech, Inc.Interface for testing semiconductors
CN103954927B (en)*2014-05-212016-03-23常州天合光能有限公司 Volume resistance and sheet resistance conversion calibration device and calibration method thereof

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US4349792A (en)*1978-07-141982-09-14Kings Electronics Co., Inc.Pi pad attenuator
US4272739A (en)*1979-10-181981-06-09Morton NessesHigh-precision electrical signal attenuator structures
EP0128986B1 (en)*1982-12-231991-02-27Sumitomo Electric Industries LimitedMonolithic microwave integrated circuit and method for selecting it

Cited By (1)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
CN118707424A (en)*2024-08-302024-09-27四川映塞科技有限责任公司 Automatic calibration system and method for square resistance tester

Also Published As

Publication numberPublication date
GB8614398D0 (en)1986-07-16
JPS63500907A (en)1988-03-31
WO1986007493A1 (en)1986-12-18
EP0224582A1 (en)1987-06-10
GB2184849A (en)1987-07-01

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