GB2576244B - Flexible ceramic coil circuit for high temperature non-destructive inspection - Google Patents

Flexible ceramic coil circuit for high temperature non-destructive inspection Download PDF

Info

Publication number: GB2576244B
Authority: GB; United Kingdom
Prior art keywords: high temperature; destructive inspection; coil circuit; temperature non; flexible ceramic
Prior art date: 2018-06-27
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Active

Application number

GB1909156.0A

Other versions

GB201909156D0 (en

GB2576244A (en

Inventor

Edward Stanton Matthew

C Liu Tricia

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Olympus Scientific Solutions Tech Inc

Original Assignee

Olympus Scientific Solutions Tech Inc

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2018-06-27

Filing date

2019-06-26

Publication date

2021-02-17

2019-06-25Priority claimed from US16/452,135external-prioritypatent/US11442042B2/en

2019-06-26Application filed by Olympus Scientific Solutions Tech IncfiledCriticalOlympus Scientific Solutions Tech Inc

2019-08-07Publication of GB201909156D0publicationCriticalpatent/GB201909156D0/en

2020-02-12Publication of GB2576244ApublicationCriticalpatent/GB2576244A/en

2021-02-17Application grantedgrantedCritical

2021-02-17Publication of GB2576244BpublicationCriticalpatent/GB2576244B/en

StatusActivelegal-statusCriticalCurrent

2039-06-26Anticipated expirationlegal-statusCritical

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
- G01N29/2437—Piezoelectric probes
- G01N29/245—Ceramic probes, e.g. lead zirconate titanate [PZT] probes
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
- G01N29/2412—Probes using the magnetostrictive properties of the material to be examined, e.g. electromagnetic acoustic transducers [EMAT]
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/228—Details, e.g. general constructional or apparatus details related to high temperature conditions
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/26—Scanned objects
- G01N2291/263—Surfaces
- G01N2291/2634—Surfaces cylindrical from outside

Landscapes

Chemical & Material Sciences (AREA)
Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Immunology (AREA)
Health & Medical Sciences (AREA)
Analytical Chemistry (AREA)
Biochemistry (AREA)
General Health & Medical Sciences (AREA)
Pathology (AREA)
Life Sciences & Earth Sciences (AREA)
Electromagnetism (AREA)
Engineering & Computer Science (AREA)
Ceramic Engineering (AREA)
Chemical Kinetics & Catalysis (AREA)
Electrochemistry (AREA)
Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

GB1909156.0A2018-06-272019-06-26Flexible ceramic coil circuit for high temperature non-destructive inspectionActiveGB2576244B (en)

Applications Claiming Priority (2)

Application Number	Priority Date	Filing Date	Title
US201862690525P	2018-06-27	2018-06-27
US16/452,135US11442042B2 (en)	2018-06-27	2019-06-25	Flexible ceramic coil circuit for high temperature non-destructive inspection

Publications (3)

Publication Number	Publication Date
GB201909156D0 GB201909156D0 (en)	2019-08-07
GB2576244A GB2576244A (en)	2020-02-12
GB2576244Btrue GB2576244B (en)	2021-02-17

Family

ID=67511702

Family Applications (2)

Application Number	Title	Priority Date	Filing Date
GB1909156.0AActiveGB2576244B (en)	2018-06-27	2019-06-26	Flexible ceramic coil circuit for high temperature non-destructive inspection
GBGB1909224.6ACeasedGB201909224D0 (en)	2018-06-27	2019-06-27	Flexible ceramic coil circuit for high temperature non-destructive inspection

Family Applications After (1)

Application Number	Title	Priority Date	Filing Date
GBGB1909224.6ACeasedGB201909224D0 (en)	2018-06-27	2019-06-27	Flexible ceramic coil circuit for high temperature non-destructive inspection

Country Status (1)

Country	Link
GB (2)	GB2576244B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US11442042B2 (en)	2018-06-27	2022-09-13	Olympus Scientific Solutions Americas Corp.	Flexible ceramic coil circuit for high temperature non-destructive inspection
CN118311154B (en)*	2024-06-07	2024-08-16	中北大学	Electromagnetic ultrasonic guided wave sensor for detecting high-temperature pipeline defects

Citations (6)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US5050703A (en)*	1988-10-05	1991-09-24	Mannesmann Aktiengesellschaft	Electrodynamic transducer head
US5689070A (en)*	1995-07-24	1997-11-18	The Babcock & Wilcox Company	High temperature electromagnetic acoustic transducer (EMAT) probe and coil assemblies
US20030020462A1 (en)*	2001-07-30	2003-01-30	Bryson David A.	Compliant laminar eddy current sensitivity standard
US20050061076A1 (en)*	2003-09-22	2005-03-24	Hyeung-Yun Kim	Sensors and systems for structural health monitoring
US20060027022A1 (en)*	2004-07-23	2006-02-09	Electric Power Research Institute, Inc.	Flexible electromagnetic acoustic transducer sensor
US20170363583A1 (en)*	2014-12-29	2017-12-21	Röntgen Technische Dienst B.V.	Flexible ultrasonic transducer and a transducer block

2019
- 2019-06-26GBGB1909156.0Apatent/GB2576244B/enactiveActive
- 2019-06-27GBGBGB1909224.6Apatent/GB201909224D0/ennot_activeCeased

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US5050703A (en)*	1988-10-05	1991-09-24	Mannesmann Aktiengesellschaft	Electrodynamic transducer head
US5689070A (en)*	1995-07-24	1997-11-18	The Babcock & Wilcox Company	High temperature electromagnetic acoustic transducer (EMAT) probe and coil assemblies
US20030020462A1 (en)*	2001-07-30	2003-01-30	Bryson David A.	Compliant laminar eddy current sensitivity standard
US20050061076A1 (en)*	2003-09-22	2005-03-24	Hyeung-Yun Kim	Sensors and systems for structural health monitoring
US20060027022A1 (en)*	2004-07-23	2006-02-09	Electric Power Research Institute, Inc.	Flexible electromagnetic acoustic transducer sensor
US20170363583A1 (en)*	2014-12-29	2017-12-21	Röntgen Technische Dienst B.V.	Flexible ultrasonic transducer and a transducer block

Also Published As

Publication number	Publication date
GB201909156D0 (en)	2019-08-07
GB201909224D0 (en)	2019-08-14
GB2576244A (en)	2020-02-12

Publication	Publication Date	Title
GB2579756B (en)	2020-12-16	Optimization method for integrated circuit wafer test
CA193436S (en)	2022-04-22	Temperature probe dock
SG11202012845QA (en)	2021-01-28	Probe card for high frequency applications
IL283243A (en)	2021-07-29	Optical-mode selection for multi-mode semiconductor inspection
IL284444A (en)	2021-08-31	Multi-beam inspection apparatus
GB201806478D0 (en)	2018-06-06	Combinational electronic apparatus
IL277822A (en)	2020-11-30	Multi-beam inspection apparatus
IL282440A (en)	2021-06-30	Inspection apparatus
GB2576244B (en)	2021-02-17	Flexible ceramic coil circuit for high temperature non-destructive inspection
SG10202005941TA (en)	2021-02-25	Wafer inspecting apparatus
GB2571450B (en)	2022-09-21	Apparatus for electrical measurement
KR102277509B9 (en)	2022-07-29	Thermal imaging apparatus
SG11202012315XA (en)	2021-01-28	Measurement apparatus
GB201819508D0 (en)	2019-01-16	Non-destructive testing
GB201800774D0 (en)	2018-02-28	Temperature detection device for ventilator circuit
GB202107914D0 (en)	2021-07-14	Device for the electromagnetic inspection of casting strings
GB2578496B (en)	2021-03-10	Method for detecting easy-cleaning property of ceramic
IL269874B2 (en)	2023-08-01	Lossless lobing circuit for multi-subarray
GB2571724B (en)	2023-03-08	Measurement apparatus
GB201908023D0 (en)	2019-07-17	Eddy current probe circuit
GB2576041B (en)	2022-12-07	Non-destructive testing
GB201820474D0 (en)	2019-01-30	Electronic/digital inspection tag
GB201812634D0 (en)	2018-09-19	non-destructive testing
SG11202102088RA (en)	2021-03-30	Connected measurement device for an aircraft
SI3537122T1 (en)	2021-11-30	Electrical temperature sensor

Movatterモバイル変換