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GB2309823B - Semiconductor device and method of fabricating the same - Google Patents

Semiconductor device and method of fabricating the same

Info

Publication number
GB2309823B
GB2309823BGB9626974AGB9626974AGB2309823BGB 2309823 BGB2309823 BGB 2309823BGB 9626974 AGB9626974 AGB 9626974AGB 9626974 AGB9626974 AGB 9626974AGB 2309823 BGB2309823 BGB 2309823B
Authority
GB
United Kingdom
Prior art keywords
fabricating
same
semiconductor device
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB9626974A
Other versions
GB9626974D0 (en
GB2309823A (en
Inventor
Sang Hoon Park
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SK Hynix Inc
Original Assignee
Hyundai Electronics Industries Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hyundai Electronics Industries Co LtdfiledCriticalHyundai Electronics Industries Co Ltd
Publication of GB9626974D0publicationCriticalpatent/GB9626974D0/en
Publication of GB2309823ApublicationCriticalpatent/GB2309823A/en
Application grantedgrantedCritical
Publication of GB2309823BpublicationCriticalpatent/GB2309823B/en
Anticipated expirationlegal-statusCritical
Expired - Fee Relatedlegal-statusCriticalCurrent

Links

Classifications

GB9626974A1995-12-301996-12-27Semiconductor device and method of fabricating the sameExpired - Fee RelatedGB2309823B (en)

Applications Claiming Priority (1)

Application NumberPriority DateFiling DateTitle
KR1019950069506AKR100209937B1 (en)1995-12-301995-12-30 Transistor manufacturing method of semiconductor device

Publications (3)

Publication NumberPublication Date
GB9626974D0 GB9626974D0 (en)1997-02-12
GB2309823A GB2309823A (en)1997-08-06
GB2309823Btrue GB2309823B (en)2000-11-15

Family

ID=19448490

Family Applications (1)

Application NumberTitlePriority DateFiling Date
GB9626974AExpired - Fee RelatedGB2309823B (en)1995-12-301996-12-27Semiconductor device and method of fabricating the same

Country Status (4)

CountryLink
JP (1)JP3191091B2 (en)
KR (1)KR100209937B1 (en)
DE (1)DE19653656C2 (en)
GB (1)GB2309823B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US8481377B2 (en)2010-02-192013-07-09Semiconductor Energy Laboratory Co., Ltd.Method for manufacturing a semiconductor device with impurity doped oxide semiconductor

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
JPH11177103A (en)*1997-12-151999-07-02Nec Corp Semiconductor device

Citations (3)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
EP0370809A2 (en)*1988-11-251990-05-30Mitsubishi Denki Kabushiki KaishaThin-film soi mosfet and method of manufacturing thereof
EP0480635A1 (en)*1990-10-091992-04-15Mitsubishi Denki Kabushiki KaishaThin film transistor and a method of manufacturing thereof
EP0487220A2 (en)*1990-11-191992-05-27Mitsubishi Denki Kabushiki KaishaSOI-Field effect transistor and method of manufacturing the same

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US5395784A (en)*1993-04-141995-03-07Industrial Technology Research InstituteMethod of manufacturing low leakage and long retention time DRAM

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
EP0370809A2 (en)*1988-11-251990-05-30Mitsubishi Denki Kabushiki KaishaThin-film soi mosfet and method of manufacturing thereof
EP0480635A1 (en)*1990-10-091992-04-15Mitsubishi Denki Kabushiki KaishaThin film transistor and a method of manufacturing thereof
EP0487220A2 (en)*1990-11-191992-05-27Mitsubishi Denki Kabushiki KaishaSOI-Field effect transistor and method of manufacturing the same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
US8481377B2 (en)2010-02-192013-07-09Semiconductor Energy Laboratory Co., Ltd.Method for manufacturing a semiconductor device with impurity doped oxide semiconductor

Also Published As

Publication numberPublication date
DE19653656A1 (en)1997-07-03
JP3191091B2 (en)2001-07-23
KR970053098A (en)1997-07-29
JPH1041517A (en)1998-02-13
DE19653656C2 (en)2003-02-20
GB9626974D0 (en)1997-02-12
GB2309823A (en)1997-08-06
KR100209937B1 (en)1999-07-15

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Legal Events

DateCodeTitleDescription
732EAmendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977)
PCNPPatent ceased through non-payment of renewal fee

Effective date:20061227


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