| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019950069506AKR100209937B1 (en) | 1995-12-30 | 1995-12-30 | Transistor manufacturing method of semiconductor device |
| Publication Number | Publication Date |
|---|---|
| GB9626974D0 GB9626974D0 (en) | 1997-02-12 |
| GB2309823A GB2309823A (en) | 1997-08-06 |
| GB2309823Btrue GB2309823B (en) | 2000-11-15 |
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB9626974AExpired - Fee RelatedGB2309823B (en) | 1995-12-30 | 1996-12-27 | Semiconductor device and method of fabricating the same |
| Country | Link |
|---|---|
| JP (1) | JP3191091B2 (en) |
| KR (1) | KR100209937B1 (en) |
| DE (1) | DE19653656C2 (en) |
| GB (1) | GB2309823B (en) |
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8481377B2 (en) | 2010-02-19 | 2013-07-09 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing a semiconductor device with impurity doped oxide semiconductor |
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11177103A (en)* | 1997-12-15 | 1999-07-02 | Nec Corp | Semiconductor device |
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0370809A2 (en)* | 1988-11-25 | 1990-05-30 | Mitsubishi Denki Kabushiki Kaisha | Thin-film soi mosfet and method of manufacturing thereof |
| EP0480635A1 (en)* | 1990-10-09 | 1992-04-15 | Mitsubishi Denki Kabushiki Kaisha | Thin film transistor and a method of manufacturing thereof |
| EP0487220A2 (en)* | 1990-11-19 | 1992-05-27 | Mitsubishi Denki Kabushiki Kaisha | SOI-Field effect transistor and method of manufacturing the same |
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5395784A (en)* | 1993-04-14 | 1995-03-07 | Industrial Technology Research Institute | Method of manufacturing low leakage and long retention time DRAM |
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0370809A2 (en)* | 1988-11-25 | 1990-05-30 | Mitsubishi Denki Kabushiki Kaisha | Thin-film soi mosfet and method of manufacturing thereof |
| EP0480635A1 (en)* | 1990-10-09 | 1992-04-15 | Mitsubishi Denki Kabushiki Kaisha | Thin film transistor and a method of manufacturing thereof |
| EP0487220A2 (en)* | 1990-11-19 | 1992-05-27 | Mitsubishi Denki Kabushiki Kaisha | SOI-Field effect transistor and method of manufacturing the same |
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8481377B2 (en) | 2010-02-19 | 2013-07-09 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing a semiconductor device with impurity doped oxide semiconductor |
| Publication number | Publication date |
|---|---|
| DE19653656A1 (en) | 1997-07-03 |
| JP3191091B2 (en) | 2001-07-23 |
| KR970053098A (en) | 1997-07-29 |
| JPH1041517A (en) | 1998-02-13 |
| DE19653656C2 (en) | 2003-02-20 |
| GB9626974D0 (en) | 1997-02-12 |
| GB2309823A (en) | 1997-08-06 |
| KR100209937B1 (en) | 1999-07-15 |
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| Date | Code | Title | Description |
|---|---|---|---|
| 732E | Amendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977) | ||
| PCNP | Patent ceased through non-payment of renewal fee | Effective date:20061227 |