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DE4225595C1 - Cable segment test method for locating resistance variations in local area network - supplying measuring pulses and evaluating reflected pulses using analogue=to=digital converter and two separate channels, with memory storing values - Google Patents

Cable segment test method for locating resistance variations in local area network - supplying measuring pulses and evaluating reflected pulses using analogue=to=digital converter and two separate channels, with memory storing values

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Publication number
DE4225595C1
DE4225595C1DE19924225595DE4225595ADE4225595C1DE 4225595 C1DE4225595 C1DE 4225595C1DE 19924225595DE19924225595DE 19924225595DE 4225595 ADE4225595 ADE 4225595ADE 4225595 C1DE4225595 C1DE 4225595C1
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Germany
Prior art keywords
cable
pulses
sampling period
memory
separate channels
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Expired - Fee Related
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DE19924225595
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German (de)
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Wikhard Dr.-Ing. 8551 Hemhofen De Kiesel
Juergen Dipl.-Ing. 7057 Winnenden De Schroeder
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Siemens AG
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Siemens AG
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Abstract

The test method involves supplying measuring pulses to one end of the tested cable section and detecting the reflected pulse response at the same cable end, supplied to 2 separate channels (6,7) each having an A/D converter supplying digital sample values to a single memory (8). The A/D converters receive respective clock signals (T1,T2) with the same sampling frequency which are offset by one half period so that the digital sample values are fed to the memory (8) in alternation. The measuring pulse duration (tMP) is pref. greater than the sampling period (tA). USE/ADVANTAGE - For Time Domain Reflectometry appts. Improved cable fault location accuracy compared to oscilloscope method.

Description

Translated fromGerman

Die vorliegende Erfindung betrifft ein Verfahren zum Lokali­sieren von Widerstandsänderungen in Kabelsegmenten eines lo­kalen Netzwerks (LAN), mit Einspeisung eines Meßimpulses am Kabelanfang und Auswertung der reflektierten Impulsantwort. Mit diesem, unter der Bezeichnung TDR (Time Domain Reflecto­metry) bekannten Impuls-Echo-Verfahren kann aus dem zeitli­chen Verlauf der Impulsantwort auf den Ort von Wellenwider­standsänderungen entlang des Kabels, wie sie durch den An­schluß von Transceivern, durch fehlangepaßten Leitungsab­schluß, durch mechanische Verformungen des Kabels, usw. ent­stehen, geschlossen werden.The present invention relates to a method for localizationsieren of resistance changes in cable segments of a lokalen network (LAN), with feeding of a measuring pulse onCable start and evaluation of the reflected impulse response.With this, under the name TDR (Time Domain Reflectometry) known pulse-echo method can from the ZeitliChen course of the impulse response to the location of wave resistanceChanges in position along the cable, as caused by the Antermination of transceivers due to mismatched linesconclusion, by mechanical deformation of the cable, etc. entstand, be closed.

Bei üblichen TDR-Testgeräten, wie sie beispielsweise auf den Seiten 65 bis 67 des Tektronix-Katalogs 1989, beschrieben sind, oder aus der US 47 66 386 hervorgehen, wird der Re­flexionsverlauf analog mittels eines Oszillographen erfaßt. Zur Ermittlung von Fehlerstellen in elektrischen Kabeln ist es gemäß den deutschen Offenlegungsschriften DE 26 44 157 A1 und DE 29 53 266 A1 auch bekannt, die reflektierte Impulsantwort abzu­tasten, so daß ihre Auswertung bequemer und mit größerer Ge­nauigkeit als bei Verwendung eines Oszillographen erfolgen kann.With conventional TDR test devices, such as those on thePages 65 to 67 of the 1989 Tektronix catalogare, or emerge from US 47 66 386, the Reinflection curve recorded analogously by means of an oscillograph.For the determination of defects in electrical cablesit according to the German published documents DE 26 44 157 A1 andIt is also known from DE 29 53 266 A1 to remove the reflected impulse responsebuttons so that their evaluation is more convenient and with a larger Geaccuracy than when using an oscillographcan.

Im Hinblick auf die noch zu erfassenden Signallaufzeiten zwi­schen zwei Transceivern, welche im minimal zulässigen Abstand an das Kabel angeschlossen sind, werden Abtastfrequenzen in der Größenordnung von 200 MHz erforderlich. Handelsüblich er­hältliche Analog/Digital-Wandler mit solch kleinen Abtastpe­rioden sind recht teuer.With regard to the signal delays to be recorded betweentwo transceivers, which are at the minimum permissible distanceare connected to the cable, sampling frequencies inof the order of 200 MHz is required. Customary heStable analog / digital converters with such small trapperiods are quite expensive.

Die Erfindung stellt sich daher die Aufgabe, ein Verfahren anzugeben, mit dem man mit einfacheren und billigeren Analog-/Digitalwandlern auskommt.The invention therefore addresses theTask to specify a procedure with which one with simplerand cheaper analog / digital converters.

Die Lösung dieser Aufgabe gelingt erfindungsgemäß mit den im Patent­ anspruch 1 angegebenen Maßnahmen. Auf diese Weise steht jeweils nach der halben Abtastperiode ein neuer digita­lisierter Meßwert zur Verfügung und es können zur Implemen­tierung billigere Analog/Digital-Wandler verwendet werden.This object is achieved according to the invention with those in the patent claim 1 specified measures. That way it standsa new digita every half the sampling periodlized measured value available and it can implementcheaper analog / digital converter can be used. 

Von Vorteil ist es, als Speicher einen sogenannten ECL-(Emitter-Coupled Logic) - Speicher einzusetzen, der - da mit ungesättigten Transistoren arbeitend - in sehr schneller Folge mit abzulegenden Eingangswerten beaufschlagt werden kann.It is advantageous to use a so-called ECL(Emitter-Coupled Logic) - use memory that - because withunsaturated transistors working - in very fastSequence with input values to be filedcan.

Die Erfindung mit ihren weiteren, in Unteransprüchen ge­kennzeichneten Ausgestaltungen, soll nachstehend anhand der Figuren näher erläutert werden. Dabei zeigtThe invention with its further gemarked configurations, is to be based on theFigures are explained in more detail. It shows

Fig. 1 ein Prinzipschaltbild für eine die Erfindung reali­sierende Meßanordnung,Fig. 1 is a basic circuit diagram for a measuring device, the invention reali sierende,

Fig. 2 ein Diagramm für aufeinanderfolgende Abtastwerte undFig. 2 is a diagram for successive samples and

Fig. 3 ein typisches Impulsdiagramm für einen sich bei einer bestimmten Kabelkonfiguration ergebenden Reflexionsverlauf.Fig. 3 shows a typical pulse diagram for a reflection curve resulting in a specific cable configuration.

InFig. 1 ist mit1 ein koaxiales Kabel bezeichnet, das ein Teilstück beispielsweise eines Ethernet-Rechnernetzwer­kes darstellt und dessen maximale Länge lmax in diesem Fall bis zu 500 m betragen könnte. Die Testzeit bestimmt sich aus der doppelten Signallaufzeit vom Anfang bis zum Ende eines Kabels mit maximaler Länge und beginnt mit der Aus­sendung eines Meßimpulses mit der Pulsdauer tMP, welcher über einen dem Wellenwiderstand des Kabels entsprechenden Widerstand von 50 Ohm von einem Impulsgenerator2 am Kabel­segmentanfang eingespeist wird. Ausgelöst wird dieser Meßimpuls von einer Steuerstation3, welche über einen internen Systembus4 einen Zugang zu dem Netzwerk hat, der durch das CSNA/CD - (Carrier Sense Multiple Access with Collision Detect) - Zugangsprotokoll geregelt ist. Erkennt die Steuerstation, daß das Netz momentan frei ist, dann aktiviert sie den Impulsgeber2 und wenn nach der vom Zu­gangsprotokoll spezifizierten Wartezeit für eine sende­willige Station das Netz immer noch frei ist, wird unter Aktivierung des Impulsgenerators2 der Meßimpuls in das Kabel1 eingespeist. Impuls und Impulsantwort werden einem Pegelanpaßverstärker5 zugeführt, dessen Ausgangssignal IA die Eingänge von zwei Analog/Digital-Wandlern6 und7 be­aufschlagt. Diese Anlaog/Digital-Wandler weisen interne Abtast- und Haltekreise auf, die nach Maßgabe der ihnen an ihren sogenannten "Strobe"-Eingängen zugeführten und von der Steuerstation3 generierten Taktsignale T1 und T2 be­tätigt werden. Diese Taktsignale legen die Abtastfrequenz fest. Die Taktsignale T1 und T2 sind von gleicher Frequenz, jedoch gegeneinander um eine halbe Taktperiode zeitver­setzt. Die digitalen Ausgänge der beiden Analog/Digital-Wandler6 und7 werden über einen Demultiplexer8 den Eingängen eines ECL-Speichers9 zugeführt, wobei der De­multiplexer8 von der Steuerstation3 so gesteuert wird, daß er jeweils für die Dauer einer halben Abtastperiode abwechselnd den einen oder den anderen Ausgang der Analog/-Digital-Wandler6 bzw.7 zum Speicher9 durchschaltet. Auf diese Weise wird im Abstand einer halben Abtastperiode ein neuer digitalisierter Meßwert der Impulsantwort IA vom Speicher9 übernommen. Wird innerhalb der Meßzeit ein Datenpaket gesendet, dann erkennt dies die Steuerstation4, verwirft die bisher im Speicher9 gesammelten Meßwerte und unternimmt nach einer gemäß dem Protokoll bestimmten Zu­fallszeit einen erneuten Meßversuch.InFig. 1,1 denotes a coaxial cable, which represents a section of, for example, an Ethernet computer network and the maximum length lmax in this case could be up to 500 m. The test time is determined from the double signal propagation time from the beginning to the end of a cable of maximum length and begins with the transmission of a measuring pulse with the pulse duration tMP , which has a resistance of 50 ohms corresponding to the characteristic impedance of the cable from a pulse generator2 on the cable segment start is fed. This measurement pulse is triggered by a control station3 , which has access to the network via an internal system bus4 , which is regulated by the CSNA / CD (Carrier Sense Multiple Access with Collision Detect) access protocol. If the control station detects that the network is currently free, it activates the pulse generator2 and if, after the waiting time specified by the access protocol for a willing station to transmit, the network is still free, the measuring pulse in the cable1 is activated by activating the pulse generator2 fed. Pulse and impulse response are fed to a level matching amplifier5 , the output signal IA of which opens the inputs of two analog / digital converters6 and7 . These analog / digital converters have internal sample and hold circuits which are operated in accordance with the clock signals T1 and T2 they are supplied to their so-called "strobe" inputs and generated by the control station3 . These clock signals determine the sampling frequency. The clock signals T1 and T2 are of the same frequency, but offset against each other by half a clock period. The digital outputs of the two analog / digital converters6 and7 are fed via a demultiplexer8 to the inputs of an ECL memory9 , the de multiplexer8 being controlled by the control station3 in such a way that it alternates for the duration of half a sampling period connects one or the other output of the analog / digital converter6 or7 to the memory9 . In this way, a new digitized measured value of the impulse response IA is taken from the memory9 every half a sampling period. If a data packet is sent within the measuring time, the control station4 recognizes this, discards the measurement values previously collected in the memory9 and, after a time determined according to the protocol, makes a new measurement attempt.

Bei den Analog/Digital-Wandler6 bzw.7 kann es sich um handelsübliche Bauelemente handeln. Der Siemens Analog-Digital-Umsetzer SDA 5200 beispielsweise benötigt nur ein Strobe-Signal T1 bzw. T2, dessen prinzipielle Form in der rechten unteren Hälfte derFig. 1 dargestellt ist. Mit den im zeitlichen Abstand von tA aufeinanderfolgenden, anstei­genden Flanken der Strobesignale T1 bzw. T2 wird jeweils ein aktueller Wert der Impulsantwort IA abgetastet und in der darauffolgenden Impulspause, welche durch einen Taktsignalpegel von "low" gekennzeichnet ist, als einge­schwungener Abtastwert ausgangsseitig zur Verfügung ge­stellt. Am Ausgang des Analog/Digital-Wandlers6 erscheint also jeweils zu den mit einem "." gekennzeichneten Zeiten ein gültiges Ausgangssignal, während ein solches am Ausgang des Analog/Digital-Wandlers7 zu den mit einem "x" gekenn­zeichneten Zeiten erfolgt. Auf diese Weise wird die Abtast­frequenz praktisch verdoppelt.The analog / digital converters6 and7 can be commercially available components. The Siemens analog-digital converter SDA 5200, for example, only requires a strobe signal T1 or T2 , the basic form of which is shown in the lower right half ofFIG. 1. With the successive, rising edges of the strobe signals T1 and T2 at intervals of tA , a current value of the impulse response IA is sampled and in the subsequent impulse pause, which is characterized by a clock signal level of "low", as a more even one Sample value provided on the output side. At the output of the analog-to-digital converter6 , each appears with a "." marked times a valid output signal, while such takes place at the output of the analog / digital converter7 at the times marked with an "x". In this way, the sampling frequency is practically doubled.

Fig. 2 zeigt bei einem willkürlich angenommenen Signal S die zeitliche Abfolge der von den zwei parallel beauf­schlagten Analog/Digital -Wandlern gelieferten Abtastwerte. Man erkennt, daß durch die zeitliche Verschiebung um ta=0,5·tA jeweils im Abstand ta ein neuer aktueller Abtast­wert von einem der beiden parallelen Analog/Digital-Wand­lern zur Verfügung gestellt wird, obwohl diese selbst das Signal S mit einer doppelt so großen Abtastperiode tA ab­tasten.Fig. 2 shows at an arbitrarily assumed signal S, the time sequence of the estimated from the two parallel beauf analog / digital -Wandlern supplied samples. It can be seen that a new current sample value from one of the two parallel analog / digital converters is made available by the time shift by ta = 0.5 · tA each at a distance ta , even though this itself itself produces the signal S sample with a sampling period tA twice as large.

Fig. 3 zeigt den typischen Reflexionsverlauf bei einem Kabelsegment1, an welches vier Transceiver TR1 bis TR4 angeschlossen sind und welches am Leitungsende kurzge­schlossen ist. Auf den Meßimpuls mit der Dauer tMP, welche ungefähr 10 Nanosekunden beträgt, folgen in zeitlichen Ab­ständen, welche proportional zur Entfernung der Transcei­veranschlußstellen vom Kabelanfang sind, die zurückreflek­tierten Impulse.Fig. 3 shows the typical reflection curve for a cable segment1 , to which four transceivers TR1 to TR4 are connected and which is short-circuited at the end of the line. On the measuring pulse with the duration tMP , which is approximately 10 nanoseconds, follow in time intervals, which are proportional to the distance of the transcei connection points from the beginning of the cable, the reflected pulses.

Claims (5)

Translated fromGerman
1. Verfahren zum Lokalisieren von Widerstandsänderungen in Kabelsegmenten eines lokalen Netzwerks (LAN), mit Einspeisung eines Meßimpulses am Kabelanfang und Auswertung der reflektierten Impulsantwort, wobei die Impulsantwort (IA) in zwei getrennten Kanälen (6,7) mit gleicher Abtastperiode (tA), jedoch gegeneinander zeitversetzt um die Zeitdauer ei­ner halben Abtastperiode, abgetastet sowie digitalisiert wird und die digitalisierten Werte der beiden Kanalausgänge je­weils abwechselnd in einem Speicher (9) abgelegt werden.1. Method for localizing changes in resistance in cable segments of a local area network (LAN), with feeding a measuring pulse at the beginning of the cable and evaluating the reflected impulse response, the impulse response (IA) in two separate channels (6 ,7 ) with the same sampling period (tA ) , but offset against each other by the time duration of half a sampling period, is sampled and digitized and the digitized values of the two channel outputs are each alternately stored in a memory (9 ).2. Verfahren nach Anspruch 1, dadurch gekennzeichnet, daß die digitalisierten Werte der Impulsantwort in einem ECL-Speicher abgelegt werden.2. The method according to claim 1,characterized,that the digitized values of the impulse response in an ECLMemory.3. Verfahren nach Anspruch 1, dadurch gekennzeichnet, daß die Abtastperiode (tA) in den beiden Kanälen kleiner als die Signallaufzeit zwischen zwei im minimal zulässigem Ab­stand am Netzkabel anschließbaren Transceivern gewählt ist.3. The method according to claim 1, characterized in that the sampling period (tA ) in the two channels is less than the signal transit time between two in the minimum permissible from the power cord connectable transceivers is selected.4. Verfahren nach Anspruch 1, dadurch gekennzeichnet, daß die Meßimpulsdauer (tMP) größer als die Abtastperiode (tA) gewählt ist.4. The method according to claim 1, characterized in that the measuring pulse duration (tMP ) is chosen to be greater than the sampling period (tA ).5. Verfahren nach einem der vorhergehenden Ansprüche für Netzwerke mit CSMA/CD-Zugangsprotokoll, dadurch gekennzeichnet, daß nach Erkennung eines während der Testzeit im zu testenden Kabel gesendeten Datenpakets die bisher im Speicher ge­sammelten Meßwerte verworfen werden und nach einer proto­kollbestimmten Zufallszeit ein erneuter Testversuch begonnen wird.5. The method according to any one of the preceding claims forNetworks with CSMA / CD access protocol,characterized,that after detection of one to be tested during the test periodCable data packets previously sent in memorycollected measured values are discarded and after a protoa random test started a new test attemptbecomes.
DE199242255951992-08-031992-08-03Cable segment test method for locating resistance variations in local area network - supplying measuring pulses and evaluating reflected pulses using analogue=to=digital converter and two separate channels, with memory storing valuesExpired - Fee RelatedDE4225595C1 (en)

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