技术领域technical field
本实用新型涉及一种样品定位装置，属于显微观测领域。The utility model relates to a sample positioning device, which belongs to the field of microscopic observation.
背景技术Background technique
在扫描隧道显微镜系统中，将曲率半径为原子量级的针尖和被研究物质的表面作为两个电极，当样品与针尖的距离非常接近时（通常小于1nm），在外加电场的作用下，电子会穿过两个电极之间的绝缘层流向另一个电极，产生穿隧电流。计算机记录穿隧电流并控制施加于压电管的电压，以产生与样品表面相应的三维地图，从而反映样品表面的形貌特征。扫描隧道显微镜的传统用法是用于扫描平放材料上下两端的表面形貌，部分材料，例如薄片结构的材料，由于材料无法立向摆放，无法扫描材料的其他侧面，造成了扫描的局限性，同时，现有显微镜无法扫描样品的截面。In the scanning tunneling microscope system, the needle tip with a curvature radius of atomic order and the surface of the substance to be studied are used as two electrodes. When the distance between the sample and the needle tip is very close (usually less than 1nm), the electrons will A tunneling current flows through the insulating layer between two electrodes to the other electrode. The computer records the tunneling current and controls the voltage applied to the piezoelectric tube to generate a three-dimensional map corresponding to the sample surface, thereby reflecting the topographical characteristics of the sample surface. The traditional usage of the scanning tunneling microscope is to scan the surface morphology of the upper and lower ends of the flat material. Some materials, such as thin sheet structure materials, cannot be placed vertically and other sides of the material cannot be scanned, resulting in scanning limitations. , At the same time, existing microscopes cannot scan the cross-section of the sample.
发明内容Contents of the invention
本实用新型的目的在于：提供一种基于扫描隧道显微镜的样品定位装置，以解决现有扫描隧道显微镜由于没有特定的样品定位装置，样品的截面和部分侧面无法直接扫描，使得扫描具有局限性的问题。The purpose of this utility model is to provide a scanning tunneling microscope-based sample positioning device to solve the problem that the existing scanning tunneling microscope has no specific sample positioning device, and the cross section and part of the side of the sample cannot be directly scanned, so that the scanning has limitations. question.
本实用新型的方案如下：一种基于扫描隧道显微镜的样品定位装置，包括样品盘，样品盘上固定设置有滑道，滑道上滑动设置有定位滑块，滑道的一端固定设置有限位座。The scheme of the utility model is as follows: a sample positioning device based on a scanning tunneling microscope, including a sample tray, a slideway is fixedly arranged on the sample tray, a positioning slider is slidably arranged on the slideway, and a limit seat is fixedly arranged at one end of the slideway.
优选地，所述滑道包括相互平行设置的第一滑杆和第二滑杆，第一滑杆和第二滑杆分别设置在定位滑块的两侧，且定位滑块的两侧对应滑动设置在第一滑杆和第二滑杆上。Preferably, the slideway includes a first slide bar and a second slide bar arranged parallel to each other, the first slide bar and the second slide bar are respectively arranged on both sides of the positioning slider, and the two sides of the positioning slider slide correspondingly Set on the first slide bar and the second slide bar.
优选地，还包括有旋钮，旋钮设置在与限位座相对的定位滑块的另一侧，旋钮5与定位滑块的滑动方向相平行，且旋钮的一端固定在定位滑块上，滑道与限位座相对的另一端设置有侧壁，旋钮的另一端穿过侧壁，且旋钮与侧壁螺纹连接。Preferably, a knob is also included, the knob is arranged on the other side of the positioning slider opposite to the limit seat, the knob 5 is parallel to the sliding direction of the positioning slider, and one end of the knob is fixed on the positioning slider, and the slideway The other end opposite to the limit seat is provided with a side wall, the other end of the knob passes through the side wall, and the knob is threadedly connected with the side wall.
优选地，滑道、定位滑块和限位座的表面均为镜面结构，在对准探针时，通过探针在样品盘上的倒影可以确定探针与托盘的距离，这样可以方便探针的对准。Preferably, the surfaces of the slideway, the positioning slider and the limit seat are all mirror structures. When aligning the probe, the distance between the probe and the tray can be determined by the reflection of the probe on the sample plate, which can facilitate the probe alignment.
将样品垂直固定在样品盘上，在固定样品之前，将要扫描截面选好，并用刀片获取，为防止扫描截面在空气中氧化，并不取下样品的多余部分，而是待传到真空环境中之后，使样品和样品台碰撞，让多余部分与样品脱落，从而露出截面，样品截面，样品截面和样品盘表面位于同一平面。传入STM中扫描，从而反映样品截面的形貌特征。 本实用新型与现有技术相比，主要优点是在原有样品盘上增加了用于固定样品的装置，能够使样品以多种角度进行固定，从而通过扫描隧道显微镜对样品的各个表面进行扫描，消除了现有显微镜的扫描部位具有局限性的问题，同时，采用本装置后，能够实现对样品各个截面的扫描，对于研究样品截面的显微结构具有十分重要的意义，本装置结构简单，操作方便，成本也较低，便于推广应用。Fix the sample vertically on the sample plate. Before fixing the sample, select the section to be scanned and obtain it with a blade. In order to prevent the scanning section from being oxidized in the air, the excess part of the sample is not removed, but is to be transferred to a vacuum environment Afterwards, the sample is collided with the sample stage to allow the excess part to fall off from the sample, thereby exposing the section, the section of the sample, and the section of the sample and the surface of the sample plate are on the same plane. It is scanned in STM to reflect the shape characteristics of the sample cross section. Compared with the prior art, the utility model has the main advantage that a device for fixing the sample is added to the original sample tray, and the sample can be fixed at various angles, so that each surface of the sample can be scanned by a scanning tunneling microscope. The problem of the limitations of the scanning part of the existing microscope is eliminated. At the same time, after using this device, it is possible to scan each section of the sample, which is of great significance for studying the microstructure of the sample section. The structure of the device is simple and easy to operate. Convenience, low cost and easy popularization and application.
附图说明Description of drawings
图1是本实用新型的结构示意图；Fig. 1 is the structural representation of the utility model;
图2是本实用新型的主视结构示意图。Fig. 2 is a front structural schematic view of the utility model.
具体实施方式Detailed ways
为使本实用新型的目的、技术方案和优点更加清楚，下面将参照附图对本发明作进一步地详细描述，In order to make the purpose, technical solutions and advantages of the present utility model clearer, the present invention will be described in further detail below with reference to the accompanying drawings,
实施例：Example:
参照图1，本实施例所述一种基于扫描隧道显微镜的样品定位装置，包括：Referring to Fig. 1, a sample positioning device based on a scanning tunneling microscope described in this embodiment includes:
样品盘1、滑道2、定位滑块3、限位座4、旋钮5和侧壁6；Sample tray 1, slideway 2, positioning slider 3, limit seat 4, knob 5 and side wall 6;
所述滑道2、定位滑块3和限位座4的表面均为镜面结构，滑道2固定设置在样品盘1上，定位滑块3滑动设置在滑道2上，限位座4和侧壁6对应固定设置在滑道2的两端，滑道2包括相互平行设置的第一滑杆21和第二滑杆22，第一滑杆21和第二滑杆22分别设置在定位滑块3的两侧，且定位滑块3的两侧对应滑动设置在第一滑杆21和第二滑杆22上。The surfaces of the slideway 2, the positioning slider 3 and the limit seat 4 are all mirror structures, the slideway 2 is fixedly arranged on the sample tray 1, the positioning slide block 3 is slidably arranged on the slideway 2, the limit seat 4 and The side walls 6 are correspondingly and fixedly arranged at both ends of the slideway 2. The slideway 2 includes a first slide bar 21 and a second slide bar 22 arranged parallel to each other. The first slide bar 21 and the second slide bar 22 are respectively arranged on the positioning slide The two sides of the block 3 and the two sides of the positioning slider 3 are correspondingly slidably arranged on the first slide bar 21 and the second slide bar 22 .
旋钮5设置在与限位座4相对的定位滑块3的另一侧，旋钮5与定位滑块3的滑动方向相平行，且旋钮5的一端固定在定位滑块3上，旋钮5上设置有外螺纹，侧壁6上设置有螺纹孔61，旋钮5上的外螺纹恰好与螺纹孔61的内螺纹相匹配，旋钮5的另一端穿过螺纹孔61，转动旋钮5即可控制定位滑块3在滑道2上的滑动，对于薄片类的样品7来说，只需将其竖在定位滑块3和限位座4之间，控制定位滑块3，使样品7夹紧定位在定位滑块3和限位座4之间，再通过扫描隧道显微镜系统进行扫描，即可得到以前无法扫描到的，样品7侧面或截面等的显微结构。The knob 5 is arranged on the other side of the positioning slider 3 opposite to the limit seat 4, the knob 5 is parallel to the sliding direction of the positioning slider 3, and one end of the knob 5 is fixed on the positioning slider 3, and the knob 5 is set There is an external thread, the side wall 6 is provided with a threaded hole 61, the external thread on the knob 5 just matches the internal thread of the threaded hole 61, the other end of the knob 5 passes through the threaded hole 61, and the positioning slide can be controlled by turning the knob 5. For the sliding of the block 3 on the slideway 2, for the sample 7 of the sheet type, it only needs to be vertically placed between the positioning slider 3 and the limit seat 4, and the positioning slider 3 is controlled so that the sample 7 is clamped and positioned on the Position the slider 3 and the limit seat 4, and then scan through the scanning tunneling microscope system to obtain the microstructure of the side or cross section of the sample 7 that could not be scanned before.
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520059154.8UCN204389529U (en) | 2015-01-28 | 2015-01-28 | A kind of sample positioning device based on scanning tunnel microscope |
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520059154.8UCN204389529U (en) | 2015-01-28 | 2015-01-28 | A kind of sample positioning device based on scanning tunnel microscope |
| Publication Number | Publication Date |
|---|---|
| CN204389529Utrue CN204389529U (en) | 2015-06-10 |
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201520059154.8UExpired - Fee RelatedCN204389529U (en) | 2015-01-28 | 2015-01-28 | A kind of sample positioning device based on scanning tunnel microscope |
| Country | Link |
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| CN (1) | CN204389529U (en) |
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| CN106199076A (en)* | 2016-07-26 | 2016-12-07 | 苏州衡微仪器科技有限公司 | A kind of PSTM |
| CN106645238A (en)* | 2017-03-09 | 2017-05-10 | 青海大学 | Layer-by-layer analyzing device for corrosion products based on X-ray diffractometer and method |
| CN109057775A (en)* | 2018-08-14 | 2018-12-21 | 贵州大学 | Rock core scanning imaging logging instrument for ore rock |
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| CN106199076A (en)* | 2016-07-26 | 2016-12-07 | 苏州衡微仪器科技有限公司 | A kind of PSTM |
| CN106199076B (en)* | 2016-07-26 | 2023-05-12 | 苏州衡微仪器科技有限公司 | Scanning tunnel microscope |
| CN106645238A (en)* | 2017-03-09 | 2017-05-10 | 青海大学 | Layer-by-layer analyzing device for corrosion products based on X-ray diffractometer and method |
| CN106645238B (en)* | 2017-03-09 | 2019-03-29 | 青海大学 | The layer-by-layer surface analysis device and method of corrosion product based on X-ray diffractometer |
| CN109057775A (en)* | 2018-08-14 | 2018-12-21 | 贵州大学 | Rock core scanning imaging logging instrument for ore rock |
| CN109057775B (en)* | 2018-08-14 | 2022-05-13 | 贵州大学 | A core scanning imaging logging tool for ore rock |
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| Date | Code | Title | Description |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee | Granted publication date:20150610 Termination date:20210128 |