Disclosure of Invention
In view of the above, the present invention provides a method, a system, a device and a medium for positioning a voltage sag source for solving the above-mentioned technical problems.
The first aspect of the invention provides a voltage sag source positioning method, which comprises the following steps:
acquiring fault data and voltage sag data monitored by a plurality of preset monitoring nodes in a target transformer substation, wherein the fault data comprise internal fault data and external fault data;
The fault time sequence data comprises a plurality of fault points and fault occurrence time of the fault points, and the voltage sag time sequence data comprises a plurality of sag data points and sag occurrence time and sag duration time of the sag data points;
Performing time setting error matching on the fault time sequence data and the voltage dip time sequence data according to the fault occurrence time of each fault point and the dip occurrence time of each dip data point to obtain a fault dip matching set;
Determining a plurality of dip repeated data points according to the internal fault dip matching set and the external fault dip matching set, wherein the dip repeated data points are the dip data points of the internal fault dip matching set and the external fault dip matching set which exist at the same time;
And re-dividing the sag repeat data points into the internal fault sag matching set and the external fault sag matching set according to the sag duration time of each sag repeat data point.
Preferably, after obtaining the fault data and the voltage sag data monitored by the plurality of preset monitoring nodes in the target substation, the method further includes:
And preprocessing the fault data and the voltage sag data, and unifying a time format.
Preferably, the method further comprises:
And identifying the fault data as the internal fault data or the external fault data according to the position of the target transformer substation where the fault data is located and the bus voltage class to which the fault data belongs.
Preferably, the method further comprises:
judging whether the time difference of the sag occurrence time of every two sag data points in the voltage sag time sequence data is smaller than a preset first time difference threshold value or not according to each monitoring node;
When judging that the time difference of the dip occurrence times of every two dip data points in the voltage dip time sequence data is smaller than the preset first time difference threshold value, merging the two dip data points, and updating the merged dip data points according to the minimum residual voltage in the two dip data points and the dip occurrence time and dip duration time corresponding to the minimum residual voltage.
Preferably, the performing time-setting error matching on the fault time sequence data and the voltage dip time sequence data according to the fault occurrence time of each fault point and the dip occurrence time of each dip data point to obtain a fault dip matching set includes:
Traversing from the first fault point in the fault time sequence data, and taking the sag data point as a successfully matched sag data point of the fault point when the sag occurrence time of the first sag data point in the voltage sag time sequence data is searched to meet the sag data point of which the time difference with the fault occurrence time of the fault point is smaller than a preset second time difference threshold;
Adding the fault point and the dip data point successfully matched with the fault point into the fault dip matching set, removing the dip data point successfully matched with the fault point from the voltage dip time sequence data, updating the voltage dip time sequence data, and updating the fault point plus 1;
And re-executing the traversal from the first fault point in the fault time sequence data based on the updated voltage sag time sequence data and the fault point, and when the time difference between the sag occurrence time of the first sag data point in the voltage sag time sequence data and the time difference between the sag occurrence time of the first sag data point in the fault time sequence data and the time difference of the fault occurrence time of the fault point is smaller than a preset second time difference threshold value, taking the sag data point as a sag data point which is successfully matched with the fault point until all the fault points in the fault time sequence data are traversed, and obtaining the fault sag matching set.
Preferably, the re-dividing the dip repetition data points individually into the internal fault dip matching set and the external fault dip matching set according to the dip duration of each of the dip repetition data points includes:
Judging whether the duration of the dip of each dip repeated data point is smaller than the preset relay protection action demarcation time or not according to each dip repeated data point;
When judging that the dip duration of the dip repetition data point is smaller than the preset relay protection action demarcation time, dividing the dip repetition data point into the external fault dip matching set independently;
And when judging that the dip duration time of the dip repetition data point is not smaller than the preset relay protection action demarcation time, dividing the dip repetition data point into the internal fault dip matching set independently.
Preferably, the method further comprises:
The matching data sets in the fault sag matching set are arranged in ascending order according to the size of the time difference, wherein the matching data sets comprise fault points and sag data points matched with the fault points;
Determining the 1 st quartile and the 3 rd quartile of the time difference according to the time difference of each matched data set;
determining a quartile range of the time difference according to the 1 st quartile and the 3 rd quartile;
determining a threshold value of a desired time difference range according to the quartile range, the 1 st quartile and the 3 rd quartile;
Judging whether the time difference of each matching data set meets the expected time difference range threshold value or not according to each matching data set;
When the time difference of the matched data set does not meet the expected time difference range threshold, judging the matched data set as error matching, identifying lag data in the matched data set as fault points or sag data points, eliminating the lag data from the fault time sequence data or the voltage sag time sequence data, and updating the fault time sequence data or the voltage sag time sequence data;
And re-executing the fault occurrence time according to each fault point and the sag occurrence time of each sag data point based on the updated fault time sequence data or voltage sag time sequence data, and performing time setting error matching on the fault time sequence data and the voltage sag time sequence data to obtain a fault sag matching set until the time difference of the matching data set meets the expected time difference range threshold.
In a second aspect, the present invention provides a voltage sag source positioning system, the system comprising:
The system comprises a data acquisition module, a data processing module and a data processing module, wherein the data acquisition module is used for acquiring fault data and voltage sag data monitored by a plurality of preset monitoring nodes in a target transformer substation, and the fault data comprise internal fault data and external fault data;
The data sorting module is used for sorting the fault data and the voltage sag data according to time respectively to obtain fault time sequence data and voltage sag time sequence data, wherein the fault time sequence data comprises a plurality of fault points and fault occurrence time of the fault points, and the voltage sag time sequence data comprises a plurality of sag data points and sag occurrence time and sag duration time of the sag data points;
The data matching module is used for matching time setting errors of the fault time sequence data and the voltage sag time sequence data according to the fault occurrence time of each fault point and the sag occurrence time of each sag data point to obtain a fault sag matching set;
The repeated data screening module is used for determining a plurality of dip repeated data points according to the internal fault dip matching set and the external fault dip matching set, wherein the dip repeated data points are the dip data points of the internal fault dip matching set and the external fault dip matching set which exist at the same time;
And the data updating module is used for re-dividing the dip repeated data points into the internal fault dip matching set and the external fault dip matching set independently according to the dip duration time of each dip repeated data point.
In a third aspect, the present invention provides an electronic device comprising a memory and a processor, the memory storing a computer program which, when executed by the processor, causes the processor to perform the steps of the voltage sag source positioning method according to the first aspect.
In a fourth aspect, the present invention provides a computer readable storage medium having stored thereon a computer program which when executed implements the steps of the voltage sag source positioning method according to the first aspect.
According to the technical scheme, the fault data and the voltage sag data are acquired, the fault data are subdivided into the internal fault data and the external fault data, and the two types of data and the voltage sag data are respectively sequenced according to time sequence, so that the fault time sequence data and the voltage sag time sequence data are obtained. And matching time setting errors of the fault time sequence data and the voltage sag time sequence data by utilizing the occurrence time of each fault point and the sag time of each sag data point, so as to obtain a preliminary fault sag matching result. Further extracting dip repetition data points in the matching result, and re-dividing the dip repetition data points according to the dip duration of the data points. The method can realize accurate and rapid positioning of the sag source without depending on high-precision monitoring data, and effectively improves the positioning precision of the sag source.
Detailed Description
In order to make the present invention better understood by those skilled in the art, the following description will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings, and it is apparent that the described embodiments are only some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
The voltage sag source positioning method provided by the embodiment of the application can be applied to an application environment shown in fig. 1. Wherein the terminal 101 communicates with the server 102 via a network. The data storage system may store data that the server 102 needs to process. The data storage system may be integrated on the server 102 or may be located on a cloud or other network server. The terminal 101 or the server 102 obtains fault data and voltage dip data monitored by a plurality of preset monitoring nodes in a target transformer substation, wherein the fault data comprises internal fault data and external fault data, the fault data and the voltage dip data are sequenced according to time respectively to obtain fault time sequence data and voltage dip time sequence data, the fault time sequence data comprises a plurality of fault points and fault occurrence time of the fault points, the voltage dip time sequence data comprises a plurality of dip data points and dip occurrence time and dip duration time of the dip data points, the fault time sequence data and the voltage dip time sequence data are subjected to time-setting error matching according to the fault occurrence time of each fault point and the dip occurrence time of each dip data point to obtain a fault dip matching set, the fault dip matching set comprises an internal fault dip matching set and an external fault dip matching set, the dip repetition data points are determined to be dip data points of the internal fault dip matching set and the external fault dip matching set simultaneously, and the dip repetition data points are divided into the internal fault dip matching set and the external fault dip matching set independently according to the dip repetition time of each dip repetition data point.
The terminal 101 may be, but is not limited to, various personal computers, notebook computers, smart phones, tablet computers, and the like.
The server 102 may be an independent physical server, a server cluster or a distributed system formed by a plurality of physical servers, or a cloud server providing cloud computing services.
As shown in fig. 2, an embodiment of the present application provides a voltage sag source positioning method, which is described by taking the application of the method to the terminal 101 or the server 102 in fig. 1 as an example, and includes the following steps S1 to S5. Wherein:
S1, acquiring fault data and voltage sag data monitored by a plurality of preset monitoring nodes in a target transformer substation, wherein the fault data comprise internal fault data and external fault data.
Internal fault data are fault data that occur on the internal equipment of the target substation, such faults often being related to equipment faults, operational errors or improper maintenance within the substation. The external fault data refers to fault data caused by external factors of the target transformer substation.
And identifying the fault data as internal fault data or external fault data according to the position of the target transformer substation where the fault data is located and the voltage class of the bus.
Illustratively, fault data are divided into internal faults and external faults based on voltage sag propagation characteristics, all faults under a 10kV bus where a monitoring node is located are internal fault data under a 220kV transformer substation, 110kV and 220kV fault data of the self-station and 220kV faults and 220kV and above outside the self-station are external fault data, and the monitoring node is installed at a 10kV feeder line.
To facilitate subsequent processing, fault data and voltage sag data are preprocessed and time-formatted in a unified manner, e.g., in minutes. The preprocessing comprises the steps of abnormal data filtering, data cleaning and the like so as to ensure the accuracy and the reliability of the data. The data cleansing step may include, but is not limited to, culling missing values, handling outliers, smoothing data fluctuations, etc., to improve data accuracy and integrity.
And S2, respectively sequencing the fault data and the voltage sag data according to time to obtain fault time sequence data and voltage sag time sequence data, wherein the fault time sequence data comprises a plurality of fault points and fault occurrence time of the fault points, and the voltage sag time sequence data comprises a plurality of sag data points and sag occurrence time and sag duration time of the sag data points.
Wherein, can carry out ascending order to fault data and voltage sag data according to the time respectively, set up voltage sag data as S:
Wherein, theThe voltage dip dataset representing monitoring node i, i=1, 2,..n, n is the total number of monitoring points.
Arranging voltage sag data of all monitoring points according to the ascending sequence of the sag occurrence time:
Wherein, theThe j-th dip data point representing a monitoring point i, j=1, 2.
Wherein each dip data point comprises the following features:
Wherein, theTo monitor the residual voltage of the jth dip data point of point i,In order to dip the duration of the data point,Is the time of occurrence of a dip for a dip data point.
The fault data is divided into internal fault data and external fault data, and the internal fault set is set as Fin, and the external fault set is set as Fout:
Wherein, theTo monitor all internal faults under the 10kV bus where node i is located,To monitor all external faults under node i.
The fault data are arranged according to the ascending order of the fault occurrence time:
Wherein, theFor the jth internal fault under the 10kV busbar where the monitoring point i is located,For the jth external fault, each data point/Comprising the following features:
Wherein, theIn order for the time of occurrence of the fault,Is the voltage class to which the fault belongs.
And step S3, performing time setting error matching on the fault time sequence data and the voltage dip time sequence data according to the fault occurrence time of each fault point and the dip occurrence time of each dip data point to obtain a fault dip matching set, wherein the fault dip matching set comprises an internal fault dip matching set and an external fault dip matching set.
And comparing each fault point in the fault time sequence data with each sag data point in the voltage sag time sequence data in time to determine the time relevance between the fault points and the sag data points.
If the fault occurrence time of a fault point is similar to the sag occurrence time of a sag data point and is within a preset time error range, the fault point is paired with the sag data point to form a matched data pair.
Dividing all the matching data pairs according to internal faults and external faults to form an internal fault dip matching set and an external fault dip matching set respectively. The internal failure dip match set includes dip data points associated with the internal failure data and the external failure dip match set includes dip data points associated with the external failure data. By matching the timing errors of the fault timing data and the voltage sag timing data, the voltage sag event associated with the fault can be accurately identified.
And S4, determining a plurality of dip repeated data points according to the internal fault dip matching set and the external fault dip matching set, wherein the dip repeated data points are dip data points which exist in the internal fault dip matching set and the external fault dip matching set at the same time.
And comparing the internal fault dip matching set with the external fault dip matching set to find out dip data points which occur in the two matching sets simultaneously, wherein the dip data points are dip repeated data points. The presence of dip repeat data points may mean that these dip events are caused by complex fault conditions, which are associated with both internal and external faults. Or these duplicate data points may be due to errors in the data recording or processing. Therefore, deep analysis of dip repeated data points helps to more accurately locate the voltage dip source.
And S5, according to the dip duration time of each dip repetition data point, individually dividing the dip repetition data points into an internal fault dip matching set and an external fault dip matching set.
Wherein the duration of the dip repeat data point is compared to the duration characteristics of the internal and external faults by further analysis. If the dip duration of the dip repetition data point is more consistent with the duration characteristic of the internal fault, the dip repetition data point is re-divided into an internal fault dip matching set, and if the dip duration of the dip repetition data point is more similar to the duration characteristic of the external fault, the dip repetition data point is re-divided into an external fault dip matching set. This step helps to more accurately distinguish whether a voltage sag event is caused by an internal or external fault, thereby improving the accuracy of voltage sag source localization. By repartitioning the dip repetition data points, the potential range of the voltage dip source can be further narrowed.
In the embodiment of the application, the fault time sequence data and the voltage sag time sequence data are obtained by acquiring the fault data and the voltage sag data, subdividing the fault data into the internal fault data and the external fault data and sequencing the two types of data and the voltage sag data according to time sequence. And matching time setting errors of the fault time sequence data and the voltage sag time sequence data by utilizing the occurrence time of each fault point and the sag time of each sag data point, so as to obtain a preliminary fault sag matching result. Further extracting dip repetition data points in the matching result, and re-dividing the dip repetition data points according to the dip duration of the data points. The method can realize accurate and rapid positioning of the sag source without depending on high-precision monitoring data, and effectively improves the positioning precision of the sag source.
In order to avoid the repeated calculation caused by the secondary dip caused by reclosing, which affects the algorithm performance, in some embodiments, the dip data of the same monitoring node i are combined, and specifically, the method further includes:
Step S21, judging whether the time difference of the sag occurrence time of every two sag data points in the voltage sag time sequence data is smaller than a preset first time difference threshold value according to each monitoring node.
And S22, when judging that the time difference of the dip occurrence time of every two dip data points in the voltage dip time sequence data is smaller than a preset first time difference threshold value, merging the two dip data points, and updating the merged dip data points according to the minimum residual voltage in the two dip data points and the dip occurrence time and dip duration time corresponding to the minimum residual voltage.
When judging that the time difference of the dip occurrence time of every two dip data points in the voltage dip time sequence data is not smaller than a preset first time difference threshold value, the two dip data points are not combined.
Illustratively, the voltage dip data of the same monitor node i is combined for one minute, starting from the first dip data point of monitor node i, if there is a next dip that satisfiesThen the following steps are obtained:
Wherein, the、The occurrence time of the dip of the two dip data points is respectively, Tih is the duration time of the dip corresponding to the minimum residual voltage in the two dips,The residual voltages of the two dip data points respectively,In order to combine the residual voltages after the combination,Is the duration of the dip after merging.
The latter of the two dip data is sifted out from Si and so on until there is no dip data that can be merged pairwise.
In some embodiments, performing time-setting error matching on the fault time sequence data and the voltage dip time sequence data according to the fault occurrence time of each fault point and the dip occurrence time of each dip data point to obtain a fault dip matching set, including:
Step S301, traversing from a first fault point in the fault time sequence data, and taking the sag data point as a sag data point successfully matched with the fault point when the sag occurrence time of the first sag data point in the voltage sag time sequence data is searched to meet the sag data point of which the time difference with the fault occurrence time of the fault point is smaller than a preset second time difference threshold value.
Step S302, adding fault points and dip data points successfully matched with the fault points into a fault dip matching set, removing the dip data points successfully matched with the fault points from voltage dip time sequence data, updating the voltage dip time sequence data, and updating the fault points by 1.
When the time difference between the occurrence time of the dip data point in the voltage dip time sequence data and the occurrence time of the fault point is smaller than a preset second time difference threshold value, the fault point matching fails, when the matching is successful, the fault point and the dip data point successfully matched with the fault point are added into a fault dip matching set, and the dip data point successfully matched with the fault point is removed from the voltage dip time sequence data, namely, the follow-up matching is not participated.
Step S303, based on the updated voltage sag time sequence data and the fault points, performing traversing from the first fault point in the fault time sequence data again, and when the sag occurrence time of the first sag data point in the voltage sag time sequence data is searched to meet the sag data point with the time difference between the sag occurrence time of the first sag data point and the fault occurrence time of the fault point being smaller than a preset second time difference threshold, taking the sag data point as the sag data point successfully matched with the fault point until all the fault points in the fault time sequence data are traversed, and obtaining a fault sag matching set.
Illustratively, starting from the first fault of the internal fault time sequence data Fin,1, traversing the voltage sag time sequence data, and when finding a first sag which meets the condition that the time difference between the first sag and the fault occurrence time is less than T (self-adapting according to the actual condition, such as 30 minutes), then performing preliminary matching successfully, wherein the fault and the sag on the matching do not participate in subsequent matching;
if the dip meeting the time difference requirement is not found, the fault is not matched with the dip, and the method is analogically performed until all faults in Fin are matched to obtain an internal fault set matching result(,,...)。
The matching of the external fault time sequence data Fout is similar to the matching process of the internal fault time sequence data, the voltage sag time sequence data is traversed from the first fault of the external fault time sequence data Fout, when the first sag which is smaller than T in time difference with the fault occurrence time is found, the preliminary matching is successful, the fault and the sag on the matching do not participate in the subsequent matching, if the sag which meets the time difference requirement is not found, the fault is not matched with the sag, and the matching result of the external fault set is obtained until all the faults in the external fault time sequence data Fout are matched(,,...)。
In some embodiments, re-partitioning the dip repetition data points individually within the internal and external fault dip matching sets according to the dip duration of each dip repetition data point includes:
step S501, judging whether the duration of the dip of each dip repetition data point is smaller than the preset relay protection action demarcation time or not according to each dip repetition data point;
Because the bus voltage grades of the internal faults and the external faults are different, the time for cutting off the faults by relay protection actions is also different. The high voltage class bears the high-capacity power transmission, the fault needs to be rapidly removed, when the fault occurs, the relay protection device does not judge whether the override action acts immediately, the stability of the main network is guaranteed, the low voltage class of 10kV or below belongs to the tail end of the power distribution network, the fault influence range is smaller, longer action time is allowed, the action of the lower protection (such as a user side breaker) is preferentially allowed, and the override trip is avoided.
Step S502, when judging that the duration of the dip repeated data points is smaller than the preset relay protection action demarcation time, dividing the dip repeated data points into an external fault dip matching set independently;
and S503, when judging that the duration of the dip repeated data point is not less than the preset relay protection action demarcation time, dividing the dip repeated data point into an internal fault dip matching set independently.
The relay protection action demarcation time is determined based on the action time of the relay protection device with high and low voltage levels, if the normal dip duration is 80-100 ms (selected according to actual conditions) in the demarcation value of the relay protection device with high and low voltage levels, namely, the relay protection action demarcation time is 80-100 ms, the repeated parts of the internal and external matching results are subjected to internal and external fault cause judgment according to the demarcation value, if the duration of the voltage dip is smaller than the relay protection action demarcation time, the voltage dip is divided into an external fault dip matching set, and otherwise, the voltage dip is divided into an internal fault dip matching set.
In some embodiments, considering that the time setting errors of the power quality monitoring devices at different monitoring points are different, and the time setting errors are relatively stable for the same monitoring point, the difference value between the fault occurrence time and the sag occurrence time should fluctuate near a fixed value, and then the abnormal data is screened according to the monitoring point by adopting a quarter bit distance (Interquartile Range, IQR) method on the primary matching result. The method therefore further comprises:
Step S601, arranging all matching data sets in a fault sag matching set in ascending order according to the size of a time difference, wherein the matching data sets comprise fault points and sag data points matched with the fault points;
Wherein, selecting the interval of the upper and lower limits of the time differenceAnd calculating a time difference between the fault occurrence time and the voltage sag occurrence time for each matching data set for subsequent analysis. The formula is as follows:
Wherein, theRepresenting the difference between the fault and the time of occurrence of the dip in the first matching result,For the failure occurrence time in the first matching result,Is the time of occurrence of the dip in the first matching result.
Step S602, according to the time difference of each matched data set, determining the 1 st quartile and the 3 rd quartile of the time difference.
Step S603, determining the quartile range of the time difference according to the 1 st quartile and the 3 rd quartile.
The IQR method is a statistic for describing the degree of dispersion of data distribution, and by calculating the IQR, the abnormal value range in the data can be determined. Calculating a quartile range IQR of the time difference, wherein the IQR is equal to the difference value between the 3 rd quartile and the 1 st quartile, namely:
Where IQR is the quartile range, Q1 is the 1 st quartile, and Q3 is the 3 rd quartile.
Step S604, determining the threshold value of the expected time difference range according to the quartile range, the 1 st quartile and the 3 rd quartile.
Wherein the difference between the 1 st quartile and 1.5 times IQR, to the sum of the 3 rd quartile and 1.5 times IQR, is taken as the expected time difference range threshold.
Step S605, for each matching data set, determines whether the time difference of the matching data set satisfies a desired time difference range threshold.
In the method, a matching data set with the time difference being greater than the sum of the 3 rd quartile and 1.5 times of IQR or less than the difference between the 1 st quartile and 1.5 times of IQR is regarded as abnormal data and is removed from the fault sag matching set, so that the accuracy of positioning a voltage sag source is further improved, and mismatching caused by time-setting errors is reduced.
And step S606, when the time difference of the matched data set does not meet the expected time difference range threshold, judging the matched data set as error matching, identifying lag data in the matched data set as fault points or dip data points, removing the lag data from the fault time sequence data or the voltage dip time sequence data, and updating the fault time sequence data or the voltage dip time sequence data.
Illustratively, for the matching data sets of the same monitoring node i, the matching data sets areAndThe result of (2) is primarily considered as the result of a mismatch. If the sag hysteresis fault is in the matching result, the fault point is removed from Fin,i/Fout, and the sag data point is reserved, otherwise, the sag data point is removed from Si, and the fault point is reserved.
Step S607, based on the updated fault time sequence data or voltage dip time sequence data, re-executing time setting error matching for the fault time sequence data and the voltage dip time sequence data according to the fault occurrence time of each fault point and the dip occurrence time of each dip data point, so as to obtain a fault dip matching set, until the time difference of the matching data set meets the threshold value of the expected time difference range.
Wherein, repeatedly executing the step S3 until the matching resultAll satisfy. If it isAll satisfyAnd directly outputting the fault sag matching set.
It can be understood that abnormal matching data caused by time setting errors of the monitoring device can be effectively removed through the quarter bit distance analysis of the time difference, so that the accuracy of positioning the voltage sag source is improved.
Based on the same inventive concept, the embodiment of the application also provides a voltage sag source positioning system for realizing the above related voltage sag source positioning method.
The implementation of the solution provided by the system is similar to the implementation described in the above method, so the specific limitation in the embodiments of the one or more voltage sag source positioning systems provided below may be referred to the limitation of the voltage sag source positioning method hereinabove, and will not be repeated herein.
As shown in fig. 3, an embodiment of the present application provides a voltage sag source positioning system, which includes:
The data acquisition module 100 is used for acquiring fault data and voltage sag data monitored by a plurality of preset monitoring nodes in a target transformer substation, wherein the fault data comprises internal fault data and external fault data;
The data ordering module 200 is configured to order the fault data and the voltage dip data according to time respectively to obtain fault time sequence data and voltage dip time sequence data, where the fault time sequence data includes a plurality of fault points and fault occurrence time of the fault points, and the voltage dip time sequence data includes a plurality of dip data points and dip occurrence time and dip duration time of the dip data points;
the data matching module 300 is configured to perform time-setting error matching on the fault time sequence data and the voltage dip time sequence data according to the fault occurrence time of each fault point and the dip occurrence time of each dip data point to obtain a fault dip matching set;
The repeated data screening module 400 is configured to determine a plurality of repeated sag data points according to the internal fault sag matching set and the external fault sag matching set, where the repeated sag data points are sag data points in which the internal fault sag matching set and the external fault sag matching set exist at the same time;
the data updating module 500 is configured to re-divide the dip repetition data points into the internal fault dip matching set and the external fault dip matching set according to the dip duration of each dip repetition data point.
In some embodiments, the system further comprises:
the preprocessing module is used for preprocessing fault data and voltage sag data and unifying time formats.
In some embodiments, the system further comprises:
The fault identification module is used for identifying the fault data as internal fault data or external fault data according to the position of the target transformer substation where the fault data is located and the voltage class of the bus.
In some embodiments, the system further comprises:
The time difference judging module is used for judging whether the time difference of the sag occurrence time of every two sag data points in the voltage sag time sequence data is smaller than a preset first time difference threshold value or not according to each monitoring node;
And the data merging module is used for merging the two sag data points when judging that the time difference of the sag occurrence time of every two sag data points in the voltage sag time sequence data is smaller than a preset first time difference threshold value, and updating the merged sag data points according to the minimum residual voltage in the two sag data points and the sag occurrence time and the sag duration time corresponding to the minimum residual voltage.
In some embodiments, the data matching module 300 includes:
the data searching module is used for traversing from a first fault point in the fault time sequence data, and taking the sag data point as a sag data point successfully matched with the fault point when the time difference between the sag occurrence time of the first sag data point in the searched voltage sag time sequence data and the fault occurrence time of the fault point is smaller than a preset second time difference threshold value;
the data updating module is used for adding fault points and dip data points successfully matched with the fault points into a fault dip matching set, removing the dip data points successfully matched with the fault points from voltage dip time sequence data, updating the voltage dip time sequence data and updating the fault points by 1;
And the data traversing module is used for re-executing traversing from a first fault point in the fault time sequence data based on the updated voltage sag time sequence data and the fault point, and taking the sag data point as a sag data point successfully matched with the fault point when the time difference between the sag occurrence time of the first sag data point in the voltage sag time sequence data and the fault occurrence time of the fault point is smaller than a preset second time difference threshold value is searched, until all the fault points in the fault time sequence data are traversed, and obtaining a fault sag matching set.
In some embodiments, the data update module 500 includes:
the duration judging module is used for judging whether the duration of the dip of each dip repeated data point is smaller than the preset relay protection action demarcation time or not according to each dip repeated data point;
The first dividing module is used for dividing the sag repeated data points into an external fault sag matching set independently when judging that the sag duration time of the sag repeated data points is smaller than the preset relay protection action demarcation time;
And the second dividing module is used for dividing the repeated data points of the dip into the internal fault dip matching sets independently when judging that the dip duration time of the repeated data points of the dip is not less than the preset relay protection action demarcation time.
In some embodiments, the system further comprises:
The data sorting module is used for carrying out ascending order arrangement according to the time difference of each matching data set in the fault sag matching set, wherein the matching data set comprises fault points and sag data points matched with the fault points;
The quantile determining module is used for determining the 1 st quartile and the 3 rd quartile of the time difference according to the time difference of each matched data set;
the quartile range determining module is used for determining the quartile range of the time difference according to the 1 st quartile and the 3 rd quartile;
The threshold determining module is used for determining a threshold value of a desired time difference range according to the quartile range, the 1 st quartile and the 3 rd quartile;
the time difference comparison module is used for judging whether the time difference of the matched data sets meets the threshold value of the expected time difference range or not according to each matched data set;
the data filtering module is used for judging that the matched data set is in error matching when the time difference of the matched data set does not meet the expected time difference range threshold, identifying lag data in the matched data set as fault points or dip data points, removing the lag data from the fault time sequence data or the voltage dip time sequence data, and updating the fault time sequence data or the voltage dip time sequence data;
The data matching execution module is used for re-executing time setting error matching of the fault time sequence data and the voltage sag time sequence data according to the fault occurrence time of each fault point and the sag occurrence time of each sag data point based on the updated fault time sequence data or the updated voltage sag time sequence data, and obtaining a fault sag matching set until the time difference of the matching data set meets the threshold value of the expected time difference range.
As shown in fig. 4, an electronic device 10 is provided, where the electronic device 10 includes a memory 20 and a processor 30, and the memory 20 stores a computer program, and when the computer program is executed by the processor 30, the processor 30 executes the steps of the voltage sag source positioning method as in the above embodiment.
An embodiment of the present application provides a computer-readable storage medium having stored thereon a computer program which, when executed, implements the steps of the voltage sag source positioning method as in the above embodiment.
It will be clearly understood by those skilled in the art that, for convenience and brevity of description, specific working processes of the above-described system, electronic device and computer storage medium may refer to corresponding processes in the foregoing method embodiments, which are not described herein again.
It is noted that the terms "comprises" and "comprising," and any variations thereof, in the description and claims of the present invention and in the foregoing figures, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed or inherent to such process, method, article, or apparatus.
It should be understood that, although the steps in the flowcharts related to the embodiments described above are sequentially shown as indicated by arrows, these steps are not necessarily sequentially performed in the order indicated by the arrows. The steps are not strictly limited to the order of execution unless explicitly recited herein, and the steps may be executed in other orders. Moreover, at least some of the steps in the flowcharts described in the above embodiments may include a plurality of steps or a plurality of stages, which are not necessarily performed at the same time, but may be performed at different times, and the order of the steps or stages is not necessarily performed sequentially, but may be performed alternately or alternately with at least some of the other steps or stages.
In the several embodiments provided herein, it should be understood that the disclosed system, electronic device, computer storage medium, and method may be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative, e.g., the division of the units is merely a logical function division, and there may be additional divisions when actually implemented, e.g., multiple units or components may be combined or integrated into another system, or some features may be omitted or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed with each other may be an indirect coupling or communication connection via some interfaces, devices or units, which may be in electrical, mechanical or other form.
The units described as separate units may or may not be physically separate, and units shown as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
In addition, each functional unit in the embodiments of the present invention may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit. The integrated units may be implemented in hardware or in software functional units.
The integrated units, if implemented in the form of software functional units and sold or used as stand-alone products, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention may be embodied in essence or a part contributing to the prior art or all or part of the technical solution in the form of a software product stored in a storage medium, comprising several instructions for executing all or part of the steps of the method according to the embodiments of the present invention by means of a computer device (which may be a personal computer, a server, or a network device, etc.). The storage medium includes various media capable of storing program codes, such as a U disk, a removable hard disk, a Read-Only Memory (ROM), a random access Memory (Random Access Memory, RAM), a magnetic disk, or an optical disk.
The foregoing embodiments are merely for illustrating the technical solution of the present invention, but not for limiting the same, and although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those skilled in the art that modifications may be made to the technical solution described in the foregoing embodiments or equivalents may be substituted for parts of the technical features thereof, and that such modifications or substitutions do not depart from the spirit and scope of the technical solution of the embodiments of the present invention in essence.