Automatic updating method and system for chip test flowTechnical Field
The invention belongs to the field of chip testing, and particularly relates to a method and a system for automatically updating a chip testing flow.
Background
The testing flow in chip manufacture is a core link for ensuring the quality and reliability of chips. With the increasing complexity of chip design and production requirements, the update frequency of chip test flows and the complexity of flow management are increasing, and the test conditions, test parameters and batch properties become more diversified. The traditional test flow management mode is dependent on manual configuration and manual update, and particularly when test parameters or conditions change, a new test flow must be reestablished and configured. Currently, the chip manufacturing industry commonly adopts a Manufacturing Execution System (MES) to record batch data and transfer information, however, the MES system has obvious limitations in management and automatic update of test flows. In general, the MES system can record attributes such as Lot ID, equipment type, process code, test version, etc., but in specific test flow management, the MES system lacks flexible updating capability and automatic verification function, so that the whole flow management still needs a great deal of manual intervention. The process relying on manual configuration is not only easy to cause human errors, but also can lead to the reduction of test efficiency, and particularly when dealing with the batch requirement of rapid change in the chip production process, the existing management mode is low-efficiency and lagged.
Furthermore, as chip testing technology advances, higher levels of automation are required for the test flow to more quickly accommodate market and technology changes. The test management system at the present stage mainly transmits data in a manual input mode in the information input and transmission process, so that the risk of key parameter input errors is increased. Once errors occur in the input process, the accuracy of the test can be affected, and the chip can be tested in error under the condition of being out of compliance, so that adverse effects are generated, customer complaints are even caused, and the reputation of an enterprise is damaged. Therefore, in the process of information transmission and management, the lack of a reliable automatic update mechanism and verification function has become a key obstacle affecting the efficiency and quality of the chip test flow.
In summary, the prior art mainly has the following disadvantages:
1. Tight binding of test conditions and flows in current test flow management, test conditions (such as test environments, parameters, etc.) are strongly bound to test flows. Whenever test conditions or parameters change, the system must reestablish a test flow, and this cumbersome operation makes the test flow difficult to reuse, significantly increasing the workload and resource consumption of the system.
2. The high error risk of manual input is that in the existing system, the configuration of the test flow and the transmission of parameters depend on a manual input mode, input errors easily occur in the information input process, and especially, once key parameters are input, the whole chip test can be performed under the error condition, the test accuracy is affected, and even a large amount of reworking and customer complaints are generated.
3. The lack of an automatic updating and checking mechanism is that the current test flow management system lacks an automatic updating and checking mechanism, so that the system cannot automatically adjust the test flow according to the change of batch production. The information transmission and the data verification lack of automatic checking and correction, and the system cannot find or correct errors in parameters and processes in time, so that the possibility of process errors is increased, and the reaction speed of the system is reduced.
4. The high cost of repeating the process is that each new production job ticket currently requires the recreating of the test process and the configuration of the test conditions. The frequent repeated operation not only consumes a great deal of time and labor cost, but also limits the expansibility and flexibility of the system, and cannot meet the requirement of the current chip production on high-efficiency low-cost test.
Therefore, the existing chip test flow management system has a significant improvement space in terms of automation level, flexibility and accuracy of data transfer. An innovative solution is needed to realize dynamic update of a test flow, automatic parameter verification and intelligent configuration of the flow, so as to reduce human intervention, reduce resource waste, support complex and changeable test flow requirements, and ensure stability and reliability of product quality while improving chip production efficiency.
Disclosure of Invention
In order to solve the technical problems, the invention provides a method and a system for automatically updating a chip test flow.
The technical scheme provided by the invention is as follows:
A method for automatically updating a chip test flow comprises the following steps:
S1, acquiring a chip batch attribute value to be put into production test;
S2, based on the attribute values, performing process detection and outputting test program information;
s3, downloading the corresponding test program package and production information to the test equipment according to the test program information.
Further, in step S1, during batch feeding, attribute values of the batch are sequentially captured by the test factory through the manufacturing execution system in a database thereof according to set conditions, wherein the database stores chip batch attribute values from upstream clients.
Further, the attribute values include a Lot ID for identifying a chip Lot, a Device for identifying a chip model or series, a Stage Code for production or process, an EXID for identifying chip extension information, a Bin level CP Bin for CP test, and a Version number CP Version for CP test.
Further, in step S2, a configuration table is used to define a process detection rule and logic, the configuration table includes a process search table, a production information configuration table and a production information check table, the process search table includes Device, stage code, EXID, CP Bin, CP version and process ID information obtained by analysis of a client work order, the production information configuration table includes process ID, registration time, package name, program version, program MD5, function key and Retest Bin information obtained by analysis of the client work order, and the production information check table is used to check whether the output information format is correct and whether the content fixed character meets the requirement.
Further, the process detection includes the following steps:
Judging whether a process ID exists in the acquired attribute values, identifying whether the test batch has special test requirements or not and whether the test batch is the first station or not through the existence of the process ID, if so, directly associating the process ID with a production information configuration table, grabbing and outputting production information of the latest registration time, and if not, carrying out search matching on the acquired attribute values and the information in a process search table to locate the process ID to which the batch belongs, associating the process ID with the production information configuration table, grabbing and outputting the production information of the latest registration time, wherein the production information comprises a program package name and program packages MD5, functions key and Retest bin.
Preferably, if the process ID does not exist in the acquired attribute value but includes EXID, the program associated with EXID is preferentially retrieved.
And further, the method also comprises a verification process, wherein the program name is compared with the production information verification table to judge, if the conditions are met, the next process is started, and if the conditions are not met, the related alarm is carried out.
Further, step S3 includes:
The method comprises the steps of obtaining a program package with the name completely consistent with that of a program package output by the step S2 from a program package storage server, downloading the program package to test equipment, calculating the MD5 value of the downloaded program package and checking the MD5 value of the program package output by the step S2, if the MD5 value is the same as that of the program package output by the step S2, continuing the next step, otherwise stopping starting and alarming, transmitting a Function key output by the step S2 to the test equipment to realize Function key configuration of the test equipment, and transmitting Retest Bin output by the step S2 to the test equipment to realize the automatic partition configuration and the retest Bin configuration of a Stocker of the test equipment.
The automatic updating system of the chip test flow based on the method comprises the following modules:
the batch attribute value acquisition module is used for automatically acquiring the attribute value of the batch to be tested through the manufacturing execution system;
The process detection module is used for positioning the process ID according to the acquired attribute value and outputting corresponding production information;
The configuration table module is used for storing a process search table, a production information configuration table and a production information verification table;
the client work order analysis module is used for analyzing and acquiring form information required by the configuration form module from the client work order;
A program downloading module for downloading a specific program package from the program package storage server to the test machine, wherein the name of the specific program package is consistent with the program package name contained in the production information output by the process detection module;
The program package checking module is used for calculating the MD5 value of the program package downloaded by the program downloading module and comparing the MD5 value with the program package MD5 contained in the production information output by the process detection module, and outputting a batch starting stopping signal and triggering an alarm if the MD5 value and the program package MD5 are different;
the configuration updating module is used for transmitting the Function keys and Retest Bin contained in the production information output by the process detection module to the test equipment so as to realize the Function key configuration, the Stocker automatic partition configuration and the retest Bin configuration of the test equipment.
Further, the system also comprises a verification module for comparing and judging the program name contained in the production information output by the process detection module with the production information verification table, and triggering an alarm if the verification condition is not satisfied.
Compared with the prior art, the invention has at least the following beneficial effects:
1. reducing repeated creation of test flow and resource consumption
The invention makes the testing flow no longer depend on the fixed testing condition and parameter binding, and can realize the automatic updating of the flow after the first configuration, thereby reducing the requirement of re-creating the flow and reducing the cost of manpower and material resources.
2. Improving automation and accuracy of flow
The invention avoids errors caused by manual input, remarkably improves the accuracy of information transmission and effectively avoids test failure or customer complaints caused by parameter errors through the functions of automatic acquisition of batch attributes, automatic matching of configuration tables, automatic verification of processes and the like.
3. Accelerating the process update and meeting the high-efficiency production requirement
The invention enables the system to rapidly respond to the change of batches and conditions through an automatic rule setting and dynamic flow updating mechanism, meets the test requirement of high frequency, improves the efficiency of test flow management, and adapts to the requirement of modern chip manufacture on efficient production.
4. Accurate verification and error early warning of flow
The invention can automatically verify the accuracy of the test flow information through the multi-level configuration table and the MD5 verification function, and send out early warning to the flow configuration which does not meet the requirements, thereby ensuring the correctness of the test program package and the configuration.
5. Flexibility and adaptability of the system are improved
The invention supports flexible management and configuration of different batches, equipment types and process stages, can rapidly adapt to the change of production requirements, and provides more flexible test management modes for different products and processes.
In general, the invention is significantly superior to the prior art in terms of process automation, error prevention, resource conservation and flexible adaptability, and provides a more intelligent and efficient solution for test process management in the chip manufacturing process.
Drawings
The accompanying drawings are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate the invention and together with the embodiments of the invention, serve to explain the invention.
FIG. 1 is a schematic diagram illustrating steps of an automatic update method for a chip test process according to an embodiment of the present invention;
FIG. 2 is a functional flowchart of a test flow automatic update system according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of an automatic machine start-up and verification process according to an embodiment of the present invention.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the described embodiments are some embodiments of the present invention, but not all embodiments of the present invention. Based on the embodiments of the present invention, other embodiments that may be obtained by those of ordinary skill in the art without making any inventive effort are within the scope of the present invention.
Example 1
The embodiment provides a method for automatically updating a chip test flow, as shown in fig. 1, which mainly includes:
s10, obtaining a chip batch (Lot) attribute value to be put into production test
When the batch is fed, the upstream client transmits the attribute value of the batch to a database of a testing factory through a server, and the testing factory stores the attribute value. The test factory sequentially grabs attribute values of batches in a server database through a Manufacturing Execution System (MES) according to set conditions and outputs the attribute values according to a fixed format.
The attribute values include Lot ID (number and name of Lot for identifying a specific chip Lot), device (equipment type, refer to model or series of chips), stage Code (Code of production or processing Stage), EXID (extension identifier for identifying extension information of chips), CP Bin (Bin level of CP test, representing performance level or quality level of chips in CP test), CP Version (Version number of CP test, representing Version of CP test program or method used), etc., wherein EXID, CP Bin, CP Version are used for differentiating WIP (product to be tested). The attribute value may serve two purposes at the test plant, ① may determine the WIP follow-up test flow by the attribute value, ② may differentiate incoming materials by the attribute value. For example, (Lot ID:1,Device:A,Stage code:B,EXID:C,CP Bin:D,CP Version:E......and..') means MES. A, B, C, D of Lot 1 was obtained the attribute values of the.
S20, accurately calculating information required by machine production according to set rules in a server
In order to enable the server to accurately calculate information conditions required by test production according to the production information and attribute values of batches through the set rules, corresponding rules and corresponding fool-proof measures are required to be established in an automatic updating system of a chip test flow.
S21, three configuration tables, namely a process retrieval table, a production information configuration table and a production information verification table, are deployed in the automatic updating system of the chip test flow, and are maintained and updated daily through an MES.
The process search table takes the Device/Stage code/EXID/CP Bin/CP version/process ID and the like as search conditions, and the data sources are automatically analyzed client work order contents.
The production information configuration table is information such as process ID/program package name/program version/Function key/Retest bin and the like required for deploying production information, and the data sources are also automatically resolved client work order contents.
And (3) producing an information check list, namely checking whether the format of the output information is correct, and whether the content fixed character meets the requirement.
Table 1 process search table
TABLE 2 production information configuration Table
Table 3 generation of information check table
S22, as shown in FIG. 2, the automatic updating system logic of the chip test flow is as follows:
(1) The Lot attribute value acquired by the MES is transmitted into the automatic updating system of the chip test flow to judge whether the process ID exists or not. The purpose is that whether the lot test has special test requirements can be identified by judging whether the process ID exists or not, and whether the lot is a first station can also be judged.
(2) If the process ID exists, all production information of the latest registration time is grabbed through the direct association of the process ID to the production information configuration table.
(3) If the process ID does not exist, the automation performs matching and positioning to the process ID to which the lot belongs one by one according to the attribute value of the lot and the Device/Stage code/EXID/CP Bin/CP version of the process retrieval table, and then directly associates the process ID to the production information configuration table. All production information of the latest registration time is grasped. If Lot exists EXID, then the program associated with EXID is preferentially retrieved.
(4) The MES retrieves the latest registration time information under the process ID from the production information configuration table.
(5) To ensure that the program information calculated by the above procedure is accurate, a verification procedure is added. And comparing and judging the program name with the production information check list, entering the next flow if the conditions are met, and carrying out related alarm if the conditions are not met. The program name typically contains information about the type of test platform, type of product, capacity of product, version of the program, etc., e.g., a product type a_machine type b_program version c_capacity d_other e_time stamp.
(6) The output information in step (5) at least includes program version, program name, program MD5, bin table, function key, retest Bin.
S30, automatically downloading the test program package and other production information to a machine end to realize automatic batch starting and verification processes, wherein the specific processes comprise:
(1) The Lot transmits the acquired Lot attribute value to a test flow automatic updating system when the MES starts, and the test flow updating system outputs information such as a program package name, a program package MD5, a Function key, retest Bin and the like;
(2) The automation tool will search the program package storage server for the program package with the consistent name of the program package output from the process (1) and download the program package to the test platform, calculate the MD5 of the program package after the download is completed and check with the MD5 of the process (1), if the two are the same, continue the next step, if the two are different, stop starting batch and alarm;
(3) The automatic tool transmits the Function key of the automatic test flow updating system to the machine end, so that the Function key configuration of the machine is automatically set;
(4) The automatic tool transmits Retest Bin of the automatic test flow updating system to the machine end, so that the automatic partition configuration and the retest Bin configuration of the Stocker of the automatic setting machine are realized.
Example two
Based on the above method, the present embodiment provides a system for automatically updating a chip test flow, where the system includes:
the batch attribute value acquisition module is used for automatically acquiring the attribute value of the batch to be tested through the manufacturing execution system;
The process detection module is used for positioning the process ID according to the acquired attribute value and outputting corresponding production information;
The configuration table module is used for storing a process search table, a production information configuration table and a production information verification table;
the client work order analysis module is used for analyzing and acquiring form information required by the configuration form module from the client work order;
A program downloading module for downloading a specific program package from the program package storage server to the test machine, wherein the name of the specific program package is consistent with the program package name contained in the production information output by the process detection module;
The program package checking module is used for calculating the MD5 value of the program package downloaded by the program downloading module and comparing the MD5 value with the program package MD5 contained in the production information output by the process detection module, and outputting a batch starting stopping signal and triggering an alarm if the MD5 value and the program package MD5 are different;
the configuration updating module is used for transmitting the Function keys and Retest Bin contained in the production information output by the process detection module to the test equipment so as to realize the Function key configuration, the Stocker automatic partition configuration and the retest Bin configuration of the test equipment.
In some embodiments, the system further includes a verification module, configured to compare the program name included in the production information output by the process detection module with the production information verification table, and trigger an alarm if the verification condition is not satisfied.
Compared with the existing chip test flow management system, the system of the invention has the following specific characteristics:
(1) And the binding between the flow and the test condition is released, namely in the system, the test flow and the specific test condition are released from the strong binding relation, the flow is only established at the test site, and the test condition and the parameter are automatically transmitted by the test flow automatic updating system.
(2) The repeated configuration flow is reduced, each test flow only needs to be configured for the first time, any subsequent parameter change can be realized through an automatic updating system, the flow is not required to be created again, and the cost of manpower and material resources is reduced.
(3) And (3) automatic check and configuration, namely, the system realizes automatic check of the flow by designing a multi-level configuration table, avoids errors caused by manual input and improves the accuracy of information transmission.
(4) MD5 verification of the machine side program package, namely using MD5 codes to verify the program package at the machine side, ensuring the accuracy of a test flow and avoiding abnormal test conditions caused by program package errors.
It should finally be noted that the above embodiments are only intended to illustrate the technical solution of the present application and not to limit it, that the technical features of the above embodiments or of the different embodiments may be combined in any order, and that many other variations in the different aspects of the present application as described above exist, which are not provided in details for the sake of brevity, and that although the application has been described in the detailed description with reference to the foregoing embodiments, it should be understood by those skilled in the art that it may still make modifications to the technical solution described in the foregoing embodiments or equivalent to some of the technical features thereof, where these modifications or substitutions do not depart from the essence of the corresponding technical solution from the scope of the technical solution of the embodiments of the present application.