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CN117471175B - A method and device for reducing induced voltage - Google Patents

A method and device for reducing induced voltage
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CN117471175B
CN117471175BCN202311423028.1ACN202311423028ACN117471175BCN 117471175 BCN117471175 BCN 117471175BCN 202311423028 ACN202311423028 ACN 202311423028ACN 117471175 BCN117471175 BCN 117471175B
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circuit
voltage
induced voltage
line
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CN117471175A (en
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张志勇
胡春林
杨贺
张帝城
孙洋
廖钧
刘玮
文宗林
刘澜波
罗冰燃
翟梓瑜
甘浩成
刘正东
何跃
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Super High Voltage Co of State Grid Sichuan Electric Power Co Ltd
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Super High Voltage Co of State Grid Sichuan Electric Power Co Ltd
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Abstract

The invention discloses a method and a device for reducing induced voltage, which relate to the field of high-voltage transmission lines and solve the problems that the induced voltage of the existing line to be tested is too high and the insulation resistance test is affected, and the technical scheme is as follows: acquiring the induction voltage of a line to be tested and capacitance parameters of a switchable capacitive reactance loop, wherein the switchable capacitive reactance loop comprises a plurality of capacitive loops and is used for reducing the induction voltage of the line to be tested; determining a switching mode based on the induction voltage of the line to be tested and the capacitance parameter of the switchable capacitive reactance loop; and switching the switchable capacitive reactance loop according to the switching mode. The input capacitance required for reducing the induced voltage of the circuit to be tested to the safe induced voltage can be calculated through the induced voltage of the circuit to be tested and the capacitance parameter of the switchable capacitive reactance loop, so that the switching mode is determined, the induced voltage is reduced to the required safe induced voltage rapidly and effectively, and at the moment, the insulation resistance test can be performed normally.

Description

Translated fromChinese
一种降低感应电压的方法及装置A method and device for reducing induced voltage

技术领域Technical Field

本发明涉及高压输电线路领域,更具体地说,它涉及一种降低感应电压的方法及装置。The present invention relates to the field of high voltage transmission lines, and more particularly to a method and device for reducing induced voltage.

背景技术Background technique

感应电是临近平行或交叉带电线路产生的高压电场通过空气介质感应过来的,并且与带电线路的电压、线路之间的距离、平行长度及气象状况有关。在平行运行输电线路的附近架设线路时,导线呈悬空状态时会产生静电感应电压,如接地则会产生感应电流。感应电压与电容有关,即与导线的相对位置有关,而与它们平行的长度无关;感应电流除与对地电容有关外,还随着平行长度的加大而增大,施工线路与运行线路距离越近,运行导线电流越大,则在施工线路上产生的感应电压越高,感应电触电的危险也越大。Induced electricity is the high-voltage electric field generated by adjacent parallel or crossed live lines that is induced through the air medium, and is related to the voltage of the live line, the distance between the lines, the parallel length and meteorological conditions. When laying lines near parallel transmission lines, electrostatic induced voltage will be generated when the wires are suspended in the air, and induced current will be generated if they are grounded. The induced voltage is related to capacitance, that is, it is related to the relative position of the wires, and has nothing to do with their parallel length; in addition to being related to the capacitance to the ground, the induced current also increases with the increase of the parallel length. The closer the distance between the construction line and the operating line, the greater the current of the operating wire, the higher the induced voltage generated on the construction line, and the greater the risk of electric shock from induced electricity.

由于感应电压的产生与很多因素有关,500kV架空输电线路的感应电压的数值可以达到十几千伏,如不采取措施,可能会威胁施工人员的人身安全,因此,应把临近运行高压输电线附近的施工输电线或电气设备都视为带电体。Since the generation of induced voltage is related to many factors, the induced voltage of a 500kV overhead transmission line can reach more than ten kilovolts. If no measures are taken, it may threaten the personal safety of construction workers. Therefore, construction transmission lines or electrical equipment near operating high-voltage transmission lines should be regarded as live objects.

同时新建或改造后输电线路送电前需通过核相试验来检查线路是否存在接地、需要测试线路绝缘电阻,需要测试线路参数等试验;At the same time, before the new or renovated transmission line is put into operation, a phase test is required to check whether the line is grounded, the insulation resistance of the line needs to be tested, and the line parameters need to be tested.

但是随着输电线路越来越窄,同杆平行架设多回线路和长距离交叉跨越架设情况越趋频繁。对其中一条线路进行试验时,其它线路仍在运行的情况下,被试线路感应电压有的达到上千伏,尤其是500kV及以上的同塔四回线路,最高高压电压已经达到10~15kV,因线路感应电压太高,试验过程中容易造成传统仪器损坏,导致试验无法进行,且对试验人员也存在极大的安全隐患。However, as transmission lines become narrower and narrower, multiple lines are installed on the same pole in parallel and long-distance cross-over installations are becoming more frequent. When testing one of the lines, while the other lines are still in operation, the induced voltage of the tested lines can reach thousands of volts, especially for 500kV and above four-circuit lines on the same tower, where the highest high voltage has reached 10-15kV. Because the line induced voltage is too high, it is easy to cause damage to traditional instruments during the test, making the test impossible, and there are also great safety hazards for the test personnel.

针对此种情况,设计研发一种降低感应电压的方法及装置,降低线路感应电压的同时不影响绝缘电阻测试。In view of this situation, a method and device for reducing the induced voltage are designed and developed, which can reduce the line induced voltage without affecting the insulation resistance test.

发明内容Summary of the invention

本申请的目的是提供一种降低感应电压的方法及装置,解决现有待测试线路感应电压过高,影响绝缘电阻测试的问题,通过公式确定切投方式,结合可切换容抗回路对被测试线路进行自动补偿,快速降低感应电压,且不影响绝缘电阻的测试。The purpose of the present application is to provide a method and device for reducing the induced voltage, so as to solve the problem that the induced voltage of the existing circuit to be tested is too high, affecting the insulation resistance test. The switching mode is determined by a formula, and the tested circuit is automatically compensated in combination with a switchable capacitive reactance circuit, so as to quickly reduce the induced voltage without affecting the insulation resistance test.

本申请首先提供一种降低感应电压的方法,包括:The present application first provides a method for reducing an induced voltage, comprising:

获取待测试线路的感应电压和可切换容抗回路的电容参数,所述可切换容抗回路包含多个电容回路,用于降低待测试线路的感应电压;Acquire the induced voltage of the circuit to be tested and the capacitance parameter of the switchable capacitive reactance circuit, wherein the switchable capacitive reactance circuit includes a plurality of capacitive circuits for reducing the induced voltage of the circuit to be tested;

基于待测试线路的感应电压和可切换容抗回路的电容参数确定切投方式;Determine the switching mode based on the induced voltage of the circuit to be tested and the capacitance parameter of the switchable capacitive reactance circuit;

根据所述切投方式切换所述可切换容抗回路。The switchable capacitive reactance circuit is switched according to the switching mode.

采用上述技术方案,通过待测试线路的感应电压和可切换容抗回路的电容参数可计算出将待测试电路的感应电压降低至安全感应电压所需的投入电容,通过投入电容可确定具体的切投方式,从而快速、有效的将感应电压降低至所需的安全感应电压,此时,绝缘电阻测试可正常进行,对测试仪器无影响。By adopting the above technical solution, the input capacitance required to reduce the induced voltage of the circuit to be tested to the safe induced voltage can be calculated through the induced voltage of the circuit to be tested and the capacitance parameters of the switchable capacitive reactance circuit. The specific switching method can be determined by the input capacitance, so as to quickly and effectively reduce the induced voltage to the required safe induced voltage. At this time, the insulation resistance test can be carried out normally without affecting the test instrument.

在一种可能的实施方式中,基于待测试线路的感应电压和可切换容抗回路的电容参数确定切投方式;包括:In a possible implementation manner, the switching mode is determined based on the induced voltage of the circuit to be tested and the capacitance parameter of the switchable capacitive reactance circuit; including:

将待测试线路的感应电压带入耦合电容计算公式,计算待测试线路的耦合电容;Substitute the induced voltage of the circuit to be tested into the coupling capacitance calculation formula to calculate the coupling capacitance of the circuit to be tested;

将待测试线路的耦合电容带入投入电容计算公式,计算投入电容值;Substitute the coupling capacitance of the circuit to be tested into the input capacitance calculation formula to calculate the input capacitance value;

选择容值大于且最接近投入电容值的电容回路或电容回路的组合,作为切投方式。Select a capacitor circuit or a combination of capacitor circuits with a capacitance value greater than and closest to the input capacitance value as the switching method.

在一种可能的实施方式中,当所述切投方式为电容回路的组合时,各电容回路依次接入。In a possible implementation manner, when the switching mode is a combination of capacitor loops, each capacitor loop is connected in sequence.

在一种可能的实施方式中,所述耦合电容计算公式为:In a possible implementation manner, the coupling capacitance calculation formula is:

其中,C1为待测试线路的耦合电容,C2为待测试线路的对地电容,E1为带电线路对地电压,E2为待测试线路的感应电压。Among them,C1 is the coupling capacitance of the circuit to be tested,C2 is the capacitance of the circuit to be tested to ground,E1 is the voltage of the energized circuit to ground, andE2 is the induced voltage of the circuit to be tested.

在一种可能的实施方式中,所述投入电容计算公式为:In a possible implementation manner, the input capacitance calculation formula is:

其中,Cm为投入电容值,E2为安全感应电压,c0为预留容值。Among them,Cm is the input capacitance value,E2' is the safe induction voltage, andc0 is the reserved capacitance value.

本申请还提供一种降低感应电压的装置,包括:The present application also provides a device for reducing induced voltage, comprising:

待测试线路引接线,所述待测试线路引接线的一端连接待测试线路输入端子,另一端连接待测试线路输出端子;A lead wire for the circuit to be tested, one end of which is connected to the input terminal of the circuit to be tested, and the other end of which is connected to the output terminal of the circuit to be tested;

公共地线,所述公共地线的一端连接地线输入端子,另一端连接地线输出端子;A common ground wire, one end of which is connected to the ground wire input terminal, and the other end of which is connected to the ground wire output terminal;

静电分压电路,一端连接待测试线路引接线,另一端连接公共地线,用于测试待测试线路的感应电压;An electrostatic voltage divider circuit, one end of which is connected to the lead wire of the circuit to be tested and the other end is connected to the common ground wire, and is used to test the induced voltage of the circuit to be tested;

可切换容抗回路,包含多个电容回路,一端连接待测试线路引接线,另一端连接公共地线,用于降低待测试线路的感应电压;A switchable capacitive reactance circuit includes multiple capacitive circuits, one end of which is connected to the lead wire of the circuit to be tested and the other end is connected to the common ground wire, which is used to reduce the induced voltage of the circuit to be tested;

高压开关,置于待测试线路引接线和待测试线路输出端子之间,用于连接外部测试仪器;A high-voltage switch is placed between the lead wire of the circuit to be tested and the output terminal of the circuit to be tested, and is used to connect an external test instrument;

控制MCU,与所述静电分压电路、可切换容抗回路和高压开关连接,用于执行如上所述的一种降低感应电压的方法;A control MCU is connected to the electrostatic voltage divider circuit, the switchable capacitive reactance circuit and the high-voltage switch to execute the above-mentioned method for reducing the induced voltage;

供电电池,用于对所述静电分压电路、可切换容抗回路、控制MCU和高压开关进行供电。The power supply battery is used to supply power to the electrostatic voltage divider circuit, the switchable capacitive reactance circuit, the control MCU and the high-voltage switch.

在一种可能的实施方式中,所述静电分压电路包括:高压继电器和多个并联回路,所述并联回路包括并联的电容和电阻,各个并联回路依次串联,位于首端的并联回路通过高压继电器连接待测试线路引接线,位于尾端的并联回路连接公共地线;In a possible implementation, the electrostatic voltage divider circuit includes: a high-voltage relay and a plurality of parallel circuits, wherein the parallel circuits include capacitors and resistors connected in parallel, and the parallel circuits are sequentially connected in series, the parallel circuit at the head end is connected to the lead wire of the circuit to be tested through the high-voltage relay, and the parallel circuit at the tail end is connected to a common ground wire;

尾端并联回路中,电容与可调电容并联,电阻与可调电阻串联;In the tail end parallel circuit, the capacitor is connected in parallel with the adjustable capacitor, and the resistor is connected in series with the adjustable resistor;

尾端并联回路连接控制MCU,用于计算待测试线路的感应电压。The tail end parallel loop is connected to the control MCU and is used to calculate the induced voltage of the circuit to be tested.

在一种可能的实施方式中,所述可切换容抗回路包括:多个电容回路,电容回路的一端连接待测试线路引接线,另一端连接公共地线;In a possible implementation, the switchable capacitive reactance circuit includes: a plurality of capacitive circuits, one end of the capacitive circuit is connected to a lead wire of a circuit to be tested, and the other end is connected to a common ground wire;

电容回路包括串联的电阻和电容,各个电容回路通过切换高压继电器控制导通,各个电容回路之间通过切换高压继电器连接。The capacitor circuit includes a resistor and a capacitor connected in series. Each capacitor circuit is controlled to be turned on by switching a high-voltage relay, and each capacitor circuit is connected by switching a high-voltage relay.

在一种可能的实施方式中,还包括显示界面,所述显示界面与所述控制MCU连接,用于显示待测试线路感应电压。In a possible implementation manner, a display interface is further included, and the display interface is connected to the control MCU and is used to display the induced voltage of the circuit to be tested.

在一种可能的实施方式中,在可切换容抗回路的电容表面、静电分压电路表面安装屏蔽环。In a possible implementation, a shielding ring is installed on the surface of the capacitor of the switchable capacitive reactance loop and the surface of the electrostatic voltage divider circuit.

与现有技术相比,本申请具有以下有益效果:本方法首先降低了感应电压,避免过高的感应电压影响绝缘电阻测试。其次,基于待测试线路的感应电压以及可切换容抗回路的电容参数,通过公式直接确定切投方式,匹配最佳的切投方式,以最快的速度降低线路上的感应电压。再次,采用可切投容抗回路,可以降低不同等级的感应电压。Compared with the prior art, the present application has the following beneficial effects: First, the present method reduces the induced voltage to prevent excessively high induced voltage from affecting the insulation resistance test. Secondly, based on the induced voltage of the circuit to be tested and the capacitance parameters of the switchable capacitive reactance circuit, the switching mode is directly determined by a formula, and the best switching mode is matched to reduce the induced voltage on the circuit at the fastest speed. Thirdly, the use of a switchable capacitive reactance circuit can reduce induced voltages of different levels.

附图说明BRIEF DESCRIPTION OF THE DRAWINGS

此处所说明的附图用来提供对本发明实施例的进一步理解,构成本申请的一部分,并不构成对本发明实施例的限定。在附图中:The drawings described herein are used to provide a further understanding of the embodiments of the present invention, constitute a part of this application, and do not constitute a limitation of the embodiments of the present invention. In the drawings:

图1为本发明提供的降低感应电压的方法流程图;FIG1 is a flow chart of a method for reducing induced voltage provided by the present invention;

图2为本发明提供的降低感应电压的装置示意图;FIG2 is a schematic diagram of a device for reducing induced voltage provided by the present invention;

图3为本发明提供的静电分压电路的电路示意图;FIG3 is a circuit diagram of an electrostatic voltage divider circuit provided by the present invention;

图4为本发明提供的可切换容抗回路的电路示意图FIG. 4 is a circuit diagram of a switchable capacitive reactance circuit provided by the present invention.

图5为本发明提供的降低感应电压的装置外观图。FIG. 5 is an appearance diagram of a device for reducing induced voltage provided by the present invention.

附图中标记及对应的零部件名称:Marks and corresponding parts names in the attached drawings:

1、待测试线路输入端子;2、地线输入端子;3、电源充电端子;4、电源开关;5、显示界面;6、待测试线路输出端子;7、屏蔽输出端子;8、地线输出端子;9、启动键。1. Input terminal of the circuit to be tested; 2. Ground input terminal; 3. Power charging terminal; 4. Power switch; 5. Display interface; 6. Output terminal of the circuit to be tested; 7. Shield output terminal; 8. Ground output terminal; 9. Start button.

具体实施方式Detailed ways

为使本申请的目的、技术方案和优点更加清楚明白,下面结合实施例和附图,对本申请作进一步的详细说明,本申请的示意性实施方式及其说明仅用于解释本申请,并不作为对本申请的限定。In order to make the objectives, technical solutions and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with examples and drawings. The illustrative implementation scheme of the present application and its description are only used to explain the present application and are not intended to limit the present application.

现有技术中,对线路进行绝缘电阻测试时,由于线路存在较高的静电电压,常常导致绝缘电阻测试仪出现损坏。对于静电感应的降低有采用并联电容的方式,但多为简单的并联一个电容,将线路感应电压降低到相对较低的水平,无法应对不同电压等级的感应电压,且多为手动合闸,操作不够简便。In the prior art, when performing insulation resistance testing on a line, the insulation resistance tester is often damaged due to the presence of high electrostatic voltage in the line. To reduce electrostatic induction, a parallel capacitor is used, but most of them simply connect a capacitor in parallel to reduce the line induced voltage to a relatively low level, which cannot cope with induced voltages of different voltage levels, and most of them are manually closed, which is not easy to operate.

有基于此,本发明提供一种降低感应电压的方法及装置,解决上述问题。Based on this, the present invention provides a method and device for reducing induced voltage to solve the above problems.

实施例1提供一种降低感应电压的方法,请参见图1所示,图1为降低感应电压的方法流程图,方法包括:Embodiment 1 provides a method for reducing the induced voltage. Please refer to FIG. 1 , which is a flow chart of the method for reducing the induced voltage. The method includes:

S1、获取待测试线路的感应电压和可切换容抗回路的电容参数,所述可切换容抗回路包含多个电容回路,用于降低待测试线路的感应电压;S1, obtaining the induced voltage of the circuit to be tested and the capacitance parameters of the switchable capacitive reactance circuit, wherein the switchable capacitive reactance circuit includes a plurality of capacitance circuits, and is used to reduce the induced voltage of the circuit to be tested;

S2、基于待测试线路的感应电压和可切换容抗回路的电容参数确定切投方式;S2, determining a switching mode based on the induced voltage of the circuit to be tested and the capacitance parameters of the switchable capacitive reactance circuit;

S3、根据所述切投方式切换所述可切换容抗回路。S3. Switching the switchable capacitive reactance circuit according to the switching mode.

具体地,可切换容抗回路通过补偿容抗的方式降低待测试线路的感应电压,其内包含的多个电容回路接入待测试线路即可降低待测试线路的感应电压,通过电容回路的不同选择及组合,可应对不同等级的感应电压。通过待测试线路的感应电压和可切换容抗回路的电容参数可计算出将待测试电路的感应电压降低至安全感应电压所需的投入电容,通过投入电容可确定具体的切投方式,从而快速、有效的将感应电压降低至所需的安全感应电压,此时,绝缘电阻测试可正常进行,对测试仪器无影响。Specifically, the switchable capacitive reactance circuit reduces the induced voltage of the circuit to be tested by compensating the capacitive reactance. The multiple capacitive circuits contained therein can be connected to the circuit to be tested to reduce the induced voltage of the circuit to be tested. Different levels of induced voltage can be handled by different selections and combinations of capacitive circuits. The input capacitance required to reduce the induced voltage of the circuit to be tested to a safe induced voltage can be calculated by the induced voltage of the circuit to be tested and the capacitance parameters of the switchable capacitive reactance circuit. The specific switching method can be determined by the input capacitance, so as to quickly and effectively reduce the induced voltage to the required safe induced voltage. At this time, the insulation resistance test can be carried out normally without affecting the test instrument.

与现有技术相比,本方法首先降低了感应电压,避免过高的感应电压影响绝缘电阻测试。其次,基于待测试线路的感应电压以及可切换容抗回路的电容参数,通过公式直接确定切投方式,匹配最佳的切投方式,以最快的速度降低线路上的感应电压。再次,采用可切投容抗回路,可以降低不同等级的感应电压。Compared with the prior art, this method first reduces the induced voltage to avoid excessive induced voltage affecting the insulation resistance test. Secondly, based on the induced voltage of the circuit to be tested and the capacitance parameters of the switchable capacitive reactance circuit, the switching mode is directly determined by the formula, and the best switching mode is matched to reduce the induced voltage on the line at the fastest speed. Thirdly, the use of a switchable capacitive reactance circuit can reduce the induced voltage of different levels.

在一种可能的实施方式中,S2、基于待测试线路的感应电压和可切换容抗回路的电容参数确定切投方式;包括:In a possible implementation, S2, determining a switching mode based on an induced voltage of a circuit to be tested and a capacitance parameter of a switchable capacitive reactance circuit, includes:

S21、将待测试线路的感应电压带入耦合电容计算公式,计算待测试线路的耦合电容;S21, bringing the induced voltage of the circuit to be tested into the coupling capacitance calculation formula to calculate the coupling capacitance of the circuit to be tested;

S22、将待测试线路的耦合电容带入投入电容计算公式,计算投入电容值;S22, substituting the coupling capacitance of the circuit to be tested into the input capacitance calculation formula to calculate the input capacitance value;

S23、选择容值大于且最接近投入电容值的电容回路或电容回路的组合,作为切投方式。S23, selecting a capacitor circuit or a combination of capacitor circuits with a capacitance value greater than and closest to the input capacitance value as the switching mode.

具体地,待测试线路在进行绝缘电阻测试时,需要断电处理,但其相邻线路往往不断电。因此,待测试线路的感应电压与待测试线路的对地电容、待测试线路与相邻带电线路的耦合电容以及相邻带电线路的电压相关。其中,可从待测试线路的历史测试中,获得待测试线路在相邻线路断电时的测试数据,此时仅存在待测试线路的对地电容,可求得待测试线路单位距离的对地电容,结合待测试线路的总长求得待测试线路的对地电容C2。待测试线路的耦合电容是指待测试线路与相邻带电线路存在的耦合电容,与相邻带电线路的距离、电流等相关,情况较为复杂。在本方案中,可通过测量待测试线路的感应电压,结合耦合电容计算公式得到。Specifically, when the circuit to be tested is conducting an insulation resistance test, it needs to be powered off, but its adjacent circuits are often not powered off. Therefore, the induced voltage of the circuit to be tested is related to the ground capacitance of the circuit to be tested, the coupling capacitance between the circuit to be tested and the adjacent live circuit, and the voltage of the adjacent live circuit. Among them, the test data of the circuit to be tested when the adjacent circuit is powered off can be obtained from the historical test of the circuit to be tested. At this time, only the ground capacitance of the circuit to be tested exists, and the ground capacitance per unit distance of the circuit to be tested can be obtained. Combined with the total length of the circuit to be tested, the ground capacitanceC2 of the circuit to be tested is obtained. The coupling capacitance of the circuit to be tested refers to the coupling capacitance between the circuit to be tested and the adjacent live circuit, which is related to the distance, current, etc. of the adjacent live circuit, and the situation is relatively complicated. In this scheme, it can be obtained by measuring the induced voltage of the circuit to be tested and combining it with the coupling capacitance calculation formula.

所述耦合电容计算公式为:The coupling capacitance calculation formula is:

其中,C1为待测试线路的耦合电容,C2为待测试线路的对地电容,E1为带电线路对地电压,E2为待测试线路的感应电压。Among them,C1 is the coupling capacitance of the circuit to be tested,C2 is the capacitance of the circuit to be tested to ground,E1 is the voltage of the energized circuit to ground, andE2 is the induced voltage of the circuit to be tested.

进一步的,待测试线路的耦合电容在短时间内可视为不变,因此,可将待测试线路的耦合电容以及设定的安全感应电压带入投入电容计算公式,得到投入电容值。Furthermore, the coupling capacitance of the circuit to be tested can be regarded as unchanged in a short period of time. Therefore, the coupling capacitance of the circuit to be tested and the set safety induction voltage can be brought into the input capacitance calculation formula to obtain the input capacitance value.

投入电容计算公式为:The calculation formula for input capacitance is:

其中,Cm为投入电容值,E2为安全感应电压,c0为设定的预留容值。Where,Cm is the input capacitance value,E2' is the safe induction voltage, andc0 is the set reserved capacitance value.

进一步的,由于本方法采用可切换容抗回路,包含多个电容回路。故存在多种切投方式,计算各种切投方式的电容值,取大于且最接近投入电容值的切投方式,投入待测试线路。Furthermore, since the method uses a switchable capacitive reactance circuit, including multiple capacitance circuits, there are multiple switching modes, and the capacitance values of various switching modes are calculated, and the switching mode that is larger than and closest to the input capacitance value is selected and input into the circuit to be tested.

在一种可能的实施方式中,当所述切投方式为电容回路的组合时,各电容回路依次接入。In a possible implementation manner, when the switching mode is a combination of capacitor loops, each capacitor loop is connected in sequence.

实施例2提供一种降低感应电压的装置,请参见图2所示,图2为降低感应电压的装置示意图,其特征在于,包括:Embodiment 2 provides a device for reducing the induced voltage. Please refer to FIG. 2 , which is a schematic diagram of the device for reducing the induced voltage, and is characterized in that it includes:

待测试线路引接线,所述待测试线路引接线的一端连接待测试线路输入端子,另一端连接待测试线路输出端子;A lead wire for the circuit to be tested, one end of which is connected to the input terminal of the circuit to be tested, and the other end of which is connected to the output terminal of the circuit to be tested;

公共地线,所述公共地线的一端连接地线输入端子,另一端连接地线输出端子;A common ground wire, one end of which is connected to the ground wire input terminal, and the other end of which is connected to the ground wire output terminal;

静电分压电路,一端连接待测试线路引接线,另一端连接公共地线,用于测试待测试线路的感应电压;An electrostatic voltage divider circuit, one end of which is connected to the lead wire of the circuit to be tested and the other end is connected to the common ground wire, and is used to test the induced voltage of the circuit to be tested;

可切换容抗回路,包含多个电容回路,一端连接待测试线路引接线,另一端连接公共地线,用于降低待测试线路的感应电压;A switchable capacitive reactance circuit includes multiple capacitive circuits, one end of which is connected to the lead wire of the circuit to be tested and the other end is connected to the common ground wire, which is used to reduce the induced voltage of the circuit to be tested;

高压开关,置于待测试线路引接线和待测试线路输出端子之间,用于连接外部测试仪器;A high-voltage switch is placed between the lead wire of the circuit to be tested and the output terminal of the circuit to be tested, and is used to connect an external test instrument;

控制MCU,与所述静电分压电路、可切换容抗回路和高压开关连接,用于执行如上所述的一种降低感应电压的方法;A control MCU is connected to the electrostatic voltage divider circuit, the switchable capacitive reactance circuit and the high-voltage switch to execute the above-mentioned method for reducing the induced voltage;

供电电池,用于对所述静电分压电路、可切换容抗回路、控制MCU和高压开关进行供电。The power supply battery is used to supply power to the electrostatic voltage divider circuit, the switchable capacitive reactance circuit, the control MCU and the high-voltage switch.

具体地,待测试线路输入端子置于装置外壳,通过绝缘杆将待测试线路接入装置,待测试线路上的感应电压经过静电分压电路逐级分压,输入控制MCU,控制MCU通过静电分压电路的分压比例,计算得到待测试线路的感应电压E2。控制MCU内置程序执行上述的一种降低感应电压的方法,最终控制可切换容抗回路按照切投方式切投。待测试线路上的感应电压经过可切换容抗回路泄放,降低至安全感应电压。此时,通过控制MCU控制静电分压电路断开,高压开关闭合,将感应电压降低后的待测试线路接入绝缘电阻测试仪或其他参数测试仪,进行绝缘电阻测试或其他参数测试。Specifically, the input terminal of the circuit to be tested is placed in the housing of the device, and the circuit to be tested is connected to the device through an insulating rod. The induced voltage on the circuit to be tested is divided step by step through the electrostatic voltage divider circuit and input into the control MCU. The control MCU calculates the induced voltageE2 of the circuit to be tested through the voltage divider ratio of the electrostatic voltage divider circuit. The built-in program of the control MCU executes the above-mentioned method of reducing the induced voltage, and finally controls the switchable capacitive reactance circuit to be switched in accordance with the switching mode. The induced voltage on the circuit to be tested is discharged through the switchable capacitive reactance circuit and reduced to a safe induced voltage. At this time, the electrostatic voltage divider circuit is controlled to be disconnected by controlling the MCU, and the high-voltage switch is closed, and the circuit to be tested after the induced voltage is reduced is connected to an insulation resistance tester or other parameter tester to perform an insulation resistance test or other parameter test.

需要说明的是,本装置与上述的方法配合,降低待测试线路的感应电压,同时不影响绝缘电阻测试。其次,通过控制MCU执行上述的方法,投入可切换容抗回路,快速、有效的将待测试线路的感应电压降低至安全感应电压。再次,通过可切换容抗回路进行多种组合,实现不同等级感应电压的降低。It should be noted that this device cooperates with the above method to reduce the induced voltage of the circuit to be tested without affecting the insulation resistance test. Secondly, by controlling the MCU to execute the above method, the switchable capacitive reactance circuit is put into use to quickly and effectively reduce the induced voltage of the circuit to be tested to a safe induced voltage. Thirdly, by performing multiple combinations of the switchable capacitive reactance circuit, different levels of induced voltage reduction can be achieved.

在一种可能的实施方式中,所述静电分压电路请参见图3所示,图3为静电分压电路的电路示意图。包括:继电器和多个并联回路,所述并联回路包括并联的电容和电阻,各个并联回路依次串联,位于首端的并联回路通过继电器连接待测试线路引接线,位于尾端的并联回路连接公共地线;In a possible implementation, the electrostatic voltage divider circuit is shown in FIG3 , which is a schematic diagram of the electrostatic voltage divider circuit. It includes: a relay and multiple parallel circuits, wherein the parallel circuits include capacitors and resistors connected in parallel, and each parallel circuit is connected in series in sequence, the parallel circuit at the head end is connected to the lead wire of the circuit to be tested through the relay, and the parallel circuit at the tail end is connected to the common ground wire;

尾端并联回路中,电容与可调电容并联,电阻与可调电阻串联;In the tail end parallel circuit, the capacitor is connected in parallel with the adjustable capacitor, and the resistor is connected in series with the adjustable resistor;

尾端并联回路连接控制MCU,用于计算待测试线路的感应电压。The tail end parallel loop is connected to the control MCU and is used to calculate the induced voltage of the circuit to be tested.

具体地,本方案采用静电测试分压电路,电容容量越小越好,设计多个小电容串联。在器件选择方面:由于待测试线路的感应电压较大,因此并联回路的器件选择需考虑耐压性。例如,采用27pF/3kV高压电容10个,10个耐压达到30kV满足耐压要求,总电容量极小,为27pF/10=2.7pF。由于电容串联,每个电压对地位置不一样,导致对地电容量改变,导致每个电容分压不均,所以需要再并联直流分压,分压电阻采用电阻电容并联模式。直流电阻采用100MΩ/5kV,10个串联,首先满足耐压要求,再降低直流阻抗,整个分压器的直流阻抗为1000MΩ,交流阻抗1200MΩ,对于10kV交流下位0.1VA,大大降低被测量感应电压的负载需求,且更准确的测试感应高压。Specifically, this scheme adopts an electrostatic test voltage divider circuit. The smaller the capacitance, the better. Multiple small capacitors are designed in series. In terms of device selection: Since the induced voltage of the circuit to be tested is large, the device selection of the parallel circuit needs to consider the voltage resistance. For example, 10 27pF/3kV high-voltage capacitors are used. The 10 withstand voltages reach 30kV to meet the withstand voltage requirements. The total capacitance is extremely small, which is 27pF/10=2.7pF. Since the capacitors are connected in series, each voltage has a different position to the ground, resulting in a change in the capacitance to the ground, resulting in uneven voltage division of each capacitor, so a parallel DC voltage divider is required. The voltage divider resistor adopts a resistor-capacitor parallel mode. The DC resistor uses 100MΩ/5kV, 10 in series, first to meet the withstand voltage requirements, and then reduce the DC impedance. The DC impedance of the entire voltage divider is 1000MΩ, and the AC impedance is 1200MΩ. For 10kV AC, the lower position is 0.1VA, which greatly reduces the load demand of the measured induced voltage and more accurately tests the induced high voltage.

在分压比确定方面:设计分压比为100:1,通过位于尾端的并联回路实现,采用可调电容和可调电阻确保回路的分压比准确度。In terms of determining the voltage division ratio: the designed voltage division ratio is 100:1, which is achieved through a parallel circuit located at the tail end, and adjustable capacitors and adjustable resistors are used to ensure the accuracy of the voltage division ratio of the circuit.

需要说明的是,由于静电分压电路测试直流阻抗为1000MΩ,线路对地阻抗是并联1000MΩ电阻,对于绝缘电阻测量影响较大,所以在绝缘电阻测量时,静电分压电路需要断开,减小系统对测试回路的影响,本装置采用高压继电器K6实现闭合及断开。It should be noted that since the DC impedance of the electrostatic voltage divider circuit test is 1000MΩ, the line-to-ground impedance is a 1000MΩ resistor in parallel, which has a greater impact on the insulation resistance measurement. Therefore, when measuring the insulation resistance, the electrostatic voltage divider circuit needs to be disconnected to reduce the impact of the system on the test loop. This device uses a high-voltage relay K6 to achieve closing and disconnection.

在一种可能的实施方式中,所述可切换容抗回路请参见图4所示,图4为可切换容抗回路的电路示意图。所述可切换容抗回路包括:多个电容回路,电容回路的一端连接待测试线路引接线,另一端连接公共地线;In a possible implementation, the switchable capacitive reactance circuit is shown in FIG4 , which is a circuit diagram of the switchable capacitive reactance circuit. The switchable capacitive reactance circuit includes: a plurality of capacitive circuits, one end of the capacitive circuit is connected to the lead wire of the circuit to be tested, and the other end is connected to the common ground wire;

电容回路包括串联的电阻和电容,各个电容回路通过切换高压继电器控制导通,各个电容回路之间通过切换高压继电器连接。The capacitor circuit includes a resistor and a capacitor connected in series. Each capacitor circuit is controlled to be turned on by switching a high-voltage relay, and each capacitor circuit is connected by switching a high-voltage relay.

需要说明的是,本装置降低线路感应电压的方式是增大回路中负载,如果采用阻性负载,则影响线路对地绝缘电阻的真实阻值;所以本装置采用容性负载来降低线路感应电压,在降低静电感应的同时不影响绝缘电阻测量。It should be noted that the way this device reduces the line induced voltage is to increase the load in the loop. If a resistive load is used, the actual resistance value of the line-to-ground insulation resistance will be affected. Therefore, this device uses a capacitive load to reduce the line induced voltage, which reduces electrostatic induction without affecting the insulation resistance measurement.

具体地,可切换容抗回路根据当前回路的静电电压的等级,投入不同电容回路或电容回路组合,以降低感应电压。以四个电容回路为例,存在以下三种情形:第一,切换高压继电器KA2、KA5、KA8、KA10闭合,四个电容回路串联投入;第二,切换高压继电器KA1、KA3、KA4、KA6、KA7、KA9、KA10闭合,四个电容回路并联投入;第三,切换高压继电器KA2、KA4、KA6、KA8、KA10闭合,两两电容回路先串联再并联投入。根据实际静电电压等级的不同,还可以进一步调整切换高压继电器KA1-KA10以控制不同电容回路及电容回路组合投入,可广泛应对不同等级的静电电压。电容回路中的电容采用高压薄膜电容,切换高压继电器采用高压继电器。Specifically, the switchable capacitive reactance circuit can be put into different capacitor circuits or capacitor circuit combinations according to the level of the electrostatic voltage of the current circuit to reduce the induced voltage. Taking four capacitor circuits as an example, there are the following three situations: first, switch the high-voltage relays KA2, KA5, KA8, and KA10 to close, and the four capacitor circuits are put into series; second, switch the high-voltage relays KA1, KA3, KA4, KA6, KA7, KA9, and KA10 to close, and the four capacitor circuits are put into parallel; third, switch the high-voltage relays KA2, KA4, KA6, KA8, and KA10 to close, and the capacitor circuits are first connected in series and then in parallel. According to the actual electrostatic voltage level, the high-voltage relays KA1-KA10 can be further adjusted to control the input of different capacitor circuits and capacitor circuit combinations, which can widely cope with different levels of electrostatic voltage. The capacitors in the capacitor circuits use high-voltage film capacitors, and the switching high-voltage relays use high-voltage relays.

关于高压薄膜电容,本装置选用高压薄膜电容是基于其存在的诸多优点。薄膜电容具有较低的损耗、高稳定性和较小的体积,可节省空间,而且抗电磁干扰性也较强,便于装置的小型化;高压薄膜电容的外壳可以有效地防止外界环境的污染,因此,它的灵敏度较高,具有较长的使用寿命;薄膜电容器稳定性明显好于电解电容,瓷片电容等,不会因为使用时间长而导致性能变化;薄膜电容具有自愈性,分为放电自愈性和电化学自愈性,薄膜电容器即使收到损坏并不需要更换,很多时候它能够自愈,减少排查故障。Regarding high-voltage film capacitors, this device uses high-voltage film capacitors based on their many advantages. Film capacitors have low loss, high stability and small size, which can save space, and are also highly resistant to electromagnetic interference, which facilitates the miniaturization of the device; the shell of the high-voltage film capacitor can effectively prevent pollution from the external environment, so it has high sensitivity and a long service life; the stability of film capacitors is significantly better than that of electrolytic capacitors, ceramic capacitors, etc., and will not cause performance changes due to long-term use; film capacitors have self-healing properties, which are divided into discharge self-healing and electrochemical self-healing properties. Even if the film capacitor is damaged, it does not need to be replaced. In many cases, it can heal itself and reduce troubleshooting.

在高压薄膜的规格选择上,由于超高电压线路同塔回路感应电压几千到几万电压等级,由于电容负载接入后,感应电压迅速降低,故耐压等级可选用15kV。In the selection of high-voltage film specifications, since the induced voltage of the ultra-high voltage line on the same tower circuit is several thousand to tens of thousands of voltage levels, and the induced voltage drops rapidly after the capacitive load is connected, the withstand voltage level can be selected as 15kV.

本装置以四个电容回路为例,四个电容回路中的电容C1-C4可以采用0.1uF/15kV,对应10kV容抗32VA。This device takes four capacitor circuits as an example. The capacitors C1 -C4 in the four capacitor circuits can be 0.1uF/15kV, corresponding to 10kV capacitive reactance 32VA.

关于高压继电器,本装置选择具有高压引线的耐高压继电器,例如,HVR12-1A15-150高压继电器,为PCB安装、适于切换高达15kVDC电压并且击穿电压为15kVDC,配有高压引线,线圈电压12V,线圈电阻300Ω,触点形式1A,切换电压15kV,切换电流3A;最小击穿电压20kV;继电器引脚连有高压引线,触点形式为一路常开,适于切换高压,绝缘电阻>10TΩ。Regarding the high-voltage relay, this device selects a high-voltage relay with a high-voltage lead, for example, the HVR12-1A15-150 high-voltage relay, which is PCB mounted, suitable for switching voltages up to 15kVDC and has a breakdown voltage of 15kVDC, equipped with high-voltage leads, a coil voltage of 12V, a coil resistance of 300Ω, a contact form of 1A, a switching voltage of 15kV, and a switching current of 3A; the minimum breakdown voltage is 20kV; the relay pins are connected to high-voltage leads, the contact form is one normally open, suitable for switching high voltage, and the insulation resistance is >10TΩ.

可切换容抗回路工作时:通过测得的感应电压确定切投方式,根据切投方式投入适合的电容回路(组合),将感应电压降低至设定的安全感应电压。此时,断开高压继电器K6,降低回路的直流电阻,合上高压开关K5,将降低静电感应后的待测试线路接入到绝缘电阻测试仪或其他参数测试仪,在装置外部实现绝缘电阻等参数测量。When the switchable capacitive reactance circuit is working: the switching mode is determined by the measured induced voltage, and the appropriate capacitive circuit (combination) is put into operation according to the switching mode to reduce the induced voltage to the set safe induced voltage. At this time, the high-voltage relay K6 is disconnected to reduce the DC resistance of the circuit, and the high-voltage switch K5 is closed. The circuit to be tested after the electrostatic induction is reduced is connected to the insulation resistance tester or other parameter tester to achieve the measurement of parameters such as insulation resistance outside the device.

在一种可能的实施方式中,还包括显示界面,所述显示界面与所述控制MCU连接,用于显示待测试线路感应电压。还可以用于显示交流电压、电池电量、绝缘电阻测试仪的高压电压等。In a possible implementation, a display interface is further included, which is connected to the control MCU and is used to display the induced voltage of the circuit to be tested. It can also be used to display AC voltage, battery power, high voltage of the insulation resistance tester, etc.

在一种可能的实施方式中,在可切换容抗回路的电容表面、静电分压电路表面安装屏蔽环。In a possible implementation, a shielding ring is installed on the surface of the capacitor of the switchable capacitive reactance loop and the surface of the electrostatic voltage divider circuit.

请参见图5所示,图5为降低感应电压的装置外观图。装置外壳表面设置:待测试线路输入端子、地线输入端子、电源充电端子、电源开关、显示界面、待测试线路输出端子、屏蔽输出端子、地线输出端子和启动键,待测试线路经绝缘杆引导接入待测试线路输入端子,高压地线接入地线输入端子,绝缘电阻测试仪的屏蔽端G连接本装置的屏蔽输出端子,绝缘电阻测试仪的线路端L连接本装置的待测试线路输出端子,绝缘电阻测试仪的接地端E连接本装置的地线输出端子,实现对绝缘电阻的测量。Please refer to Figure 5, which is an appearance diagram of the device for reducing the induced voltage. The surface of the device shell is set with: input terminal of the circuit to be tested, ground input terminal, power charging terminal, power switch, display interface, output terminal of the circuit to be tested, shield output terminal, ground output terminal and start button. The circuit to be tested is connected to the input terminal of the circuit to be tested through the insulating rod, the high-voltage ground wire is connected to the ground input terminal, the shield terminal G of the insulation resistance tester is connected to the shield output terminal of the device, the line terminal L of the insulation resistance tester is connected to the output terminal of the circuit to be tested of the device, and the ground terminal E of the insulation resistance tester is connected to the ground output terminal of the device to achieve the measurement of insulation resistance.

可以理解的是,本装置采用静电分压器测试待测试线路的感应电压,通过高压继电器K6切换输入测量;通过控制切换高压继电器KA1~KA10,切换投入电容,将待测试线路的感应电压降低到小于安全感应电压(如,50V)后,关闭高压继电器K6并通过高压开关K5将待测试线路接入绝缘电阻测试仪;通过显示界面显示当前待测试线路的感应电压以及绝缘电阻测试仪的高压电压;装置供电部分不采用交流供电,而采用锂电池供电,降低系统对地绝缘影响。It can be understood that the device uses an electrostatic voltage divider to test the induced voltage of the circuit to be tested, and switches the input measurement through the high-voltage relay K6; by controlling the switching of the high-voltage relays KA1~KA10, switching the input capacitor, the induced voltage of the circuit to be tested is reduced to less than the safe induced voltage (such as 50V), and then the high-voltage relay K6 is turned off and the circuit to be tested is connected to the insulation resistance tester through the high-voltage switch K5; the induced voltage of the current circuit to be tested and the high-voltage voltage of the insulation resistance tester are displayed through the display interface; the power supply part of the device does not use AC power supply, but uses lithium batteries to reduce the impact of the system on the ground insulation.

以上所述的具体实施方式,对本发明的目的、技术方案和有益效果进行了进一步详细说明,所应理解的是,以上所述仅为本发明的具体实施方式而已,并不用于限定本发明的保护范围,凡在本发明的精神和原则之内,所做的任何修改、等同替换、改进等,均应包含在本发明的保护范围之内。The specific implementation methods described above further illustrate the objectives, technical solutions and beneficial effects of the present invention in detail. It should be understood that the above description is only a specific implementation method of the present invention and is not intended to limit the scope of protection of the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

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Citations (6)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
JPH01320480A (en)*1988-06-211989-12-26Mitsubishi Rayon Eng Co Ltd Single-core cable shield disconnection monitoring device and its method
CN102184656A (en)*2011-05-102011-09-14安徽省电力科学研究院Power frequency parameter simulation system for power transmission line and control method of power frequency parameter simulation system
CN103715778A (en)*2012-09-282014-04-09源隆科技股份有限公司Non-contact inductive power transmission apparatus
CN104777366A (en)*2015-04-142015-07-15国网辽宁省电力有限公司抚顺供电公司High-voltage insulation resistance testing device for anti-interference power transmission line
CN211478465U (en)*2019-12-112020-09-11国网山东省电力公司青岛供电公司Power transmission line capacitance parameter measuring circuit
CN218546873U (en)*2022-10-202023-02-28山东达顺电子科技有限公司Insulation resistance tester based on capacitance partial pressure restraines induced voltage

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication numberPriority datePublication dateAssigneeTitle
JPH01320480A (en)*1988-06-211989-12-26Mitsubishi Rayon Eng Co Ltd Single-core cable shield disconnection monitoring device and its method
CN102184656A (en)*2011-05-102011-09-14安徽省电力科学研究院Power frequency parameter simulation system for power transmission line and control method of power frequency parameter simulation system
CN103715778A (en)*2012-09-282014-04-09源隆科技股份有限公司Non-contact inductive power transmission apparatus
CN104777366A (en)*2015-04-142015-07-15国网辽宁省电力有限公司抚顺供电公司High-voltage insulation resistance testing device for anti-interference power transmission line
CN211478465U (en)*2019-12-112020-09-11国网山东省电力公司青岛供电公司Power transmission line capacitance parameter measuring circuit
CN218546873U (en)*2022-10-202023-02-28山东达顺电子科技有限公司Insulation resistance tester based on capacitance partial pressure restraines induced voltage

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
消防切非试验问题分析与处理;陈干宪;《中国设备工程》;20200229(第04期);全文*

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