CN113262039A - Ablation probe and apparatus - Google Patents

Abstract

The present application relates to an ablation probe and apparatus. The ablation probe includes: the probe comprises a probe body and at least two ablation circuit structures arranged in the probe body; each of the at least two ablation circuit structures is not in contact with each other; the at least two ablation circuit structures include at least one thermal ablation circuit structure, and at least one non-thermal ablation circuit structure. The application of the scheme provided by the application can expand the application range of ablation treatment, improve ablation treatment effect, and improve application flexibility.

Description

Ablation probe and apparatus

Technical Field

The application relates to the technical field of medical equipment, in particular to an ablation probe and equipment.

Background

In the related art, tumor thermal ablation is an in-situ inactivation technique for directly causing irreversible damage or coagulation necrosis of tumor cells by using a thermally generated biological effect aiming at one or more specific tumor lesions in a certain organ. Thermal ablation may include radio frequency ablation, microwave ablation, resistive thermal ablation, and the like. The radiofrequency ablation utilizes the principle of radiofrequency heating to heat biological tissues to about 60-80 ℃ due to interaction, so that tissue proteins are denatured and necrotized. The microwave ablation uses microwaves with specific wavelengths to oscillate water molecules among biological tissues so as to heat the biological tissues to about 60-80 ℃, thereby denaturing and necrotizing tissue proteins. Resistive heating ablation uses the principle of resistance power-on heating to kill biological tissues by heating.

Electroporation ablation, also known as irreversible electroporation ablation, also known as electrical pulse biological cell electroporation ablation, is a non-thermal ablation treatment technique. The electroporation ablation uses high-voltage electric pulses to act on tissue cells, so that the cell membranes form a plurality of nanoscale irreversible pore canals to destroy the balance inside and outside the cells, thereby promoting the apoptosis of the cells.

However, for ablation probes that currently integrate only one ablation technique, ablation therapy can only be performed for specific tissue cells and produce a single ablation therapy effect.

Disclosure of Invention

In order to solve or partially solve the problems existing in the related art, the application provides an ablation probe and ablation equipment, which can expand the application range of ablation treatment and improve the ablation treatment effect.

The present application provides in a first aspect an ablation probe comprising:

the probe comprises a probe body and at least two ablation circuit structures arranged in the probe body;

each of the at least two ablation circuit structures is not in contact with each other;

the at least two ablation circuit structures include at least one thermal ablation circuit structure, and at least one non-thermal ablation circuit structure.

In one embodiment, the thermal ablation circuit structure is one of a radio frequency ablation circuit structure, a microwave ablation circuit structure, and a resistive thermal ablation circuit structure; the non-thermal ablation circuit structure is an electroporation ablation circuit structure.

In one embodiment, the probe body comprises a probe shell, an insulator filled in the probe shell, and an insulating layer partially wrapped outside the probe shell; at least one of the thermal ablation circuit structures and at least one of the non-thermal ablation circuit structures are embedded in the insulation; at least one of the athermal ablation circuit structures is in contact with the probe housing.

In one embodiment, the thermal ablation circuit structure is a resistive thermal ablation circuit structure; the resistance thermal ablation circuit structure is provided with a heating resistor; the probe shell is divided into a heating section probe shell and a non-heating section probe shell, and the non-heating section probe shell is covered in the insulating layer; the length of the heating section probe shell is smaller than or equal to that of the heating resistor.

In one embodiment, at least one of the athermal ablation circuit structures is in contact with the front end of the probe housing.

In one embodiment, at least one of the atherectomy circuit structures is soldered to the front end of the probe housing.

In one embodiment, the at least two ablation circuit structures include one of the thermal ablation circuit structures and one of the non-thermal ablation circuit structures.

In one embodiment, the at least two ablation circuit structures include a number of the thermal ablation circuit structures and one of the non-thermal ablation circuit structures.

In one embodiment, each of the thermal ablation circuit structures is disposed about the non-thermal ablation circuit structure.

A second aspect of the present application provides an ablation apparatus comprising:

a power supply and at least two ablation probes as described above connected to the power supply;

wherein the power supply is configured to provide a first preset voltage to the thermal ablation circuitry in at least one of the ablation probes;

the power supply is further configured to provide a second preset voltage to the athermal ablation circuitry in both of the ablation probes;

one of the non-thermal ablation circuit structures in one of the ablation probes is connected to the power supply as a positive end, and one of the non-thermal ablation circuit structures in the other ablation probe is connected to the power supply as a negative end.

The technical scheme provided by the application can comprise the following beneficial effects:

the ablation probe that this application embodiment provided sets up two at least ablation circuit structures in probe body, and each ablation circuit structure does not contact each other, mutual independence. At least one thermal ablation circuit structure and/or at least one non-thermal ablation circuit structure are included in the at least two ablation circuit structures. Like this, integrated two kinds at least ablation treatment methods in a probe, the doctor just can switch the ablation mode as required in the operation process, and need not to change the probe to operation convenience has been promoted, has enlarged application scope. In addition, a plurality of ablation circuit structures in the ablation probe can work simultaneously, so that combined ablation treatment is carried out, combined treatment of a thermal ablation mode and a non-thermal ablation mode or combined treatment of multiple thermal ablation modes with different principles and the like is realized, a specific ablation treatment effect is achieved, and the ablation treatment effect is favorably improved.

Further, according to the ablation probe provided by the embodiment of the application, the thermal ablation circuit structure can be one of a radio frequency ablation circuit structure, a microwave ablation circuit structure and a resistance thermal ablation circuit structure, and the non-thermal ablation circuit structure can be an electroporation ablation circuit structure, so that different use requirements can be adapted.

Further, the ablation probe provided by the embodiment of the application comprises a probe shell, an insulating object filled in the probe shell and an insulating layer partially wrapped outside the probe shell, wherein at least one thermal ablation circuit structure and at least one non-thermal ablation circuit structure are embedded in the insulating object, and the at least one non-thermal ablation circuit structure is in contact with the probe shell, so that safe and stable operation of each ablation circuit structure is guaranteed.

Further, according to the ablation probe provided by the embodiment of the application, the thermal ablation circuit structure is a resistance thermal ablation circuit structure, the resistance thermal ablation circuit structure has a heating resistor, and the probe shell is divided into the heating section probe shell and the non-heating section probe shell, and the insulating layer is coated on the outer side of the non-heating section probe shell, so that the length of the heating section probe shell is smaller than or equal to the length of the heating resistor, and thus the part of the ablation probe for implementing thermal ablation treatment is determined.

It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the application.

Drawings

The foregoing and other objects, features and advantages of the application will be apparent from the following more particular descriptions of exemplary embodiments of the application, as illustrated in the accompanying drawings wherein like reference numbers generally represent like parts throughout the exemplary embodiments of the application.

FIG. 1 is a schematic structural view of an ablation probe shown in an embodiment of the present application;

FIG. 2 is another schematic structural view of an ablation probe shown in an embodiment of the present application;

fig. 3 is a schematic structural diagram of an ablation device according to an embodiment of the present application.

Detailed Description

Embodiments of the present application will be described in more detail below with reference to the accompanying drawings. While embodiments of the present application are illustrated in the accompanying drawings, it should be understood that the present application may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.

The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. As used in this application and the appended claims, the singular forms "a", "an", and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It should also be understood that the term "and/or" as used herein refers to and encompasses any and all possible combinations of one or more of the associated listed items.

It should be understood that although the terms "first," "second," "third," etc. may be used herein to describe various information, these information should not be limited to these terms. These terms are only used to distinguish one type of information from another. For example, first information may also be referred to as second information, and similarly, second information may also be referred to as first information, without departing from the scope of the present application. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present application, "a plurality" means two or more unless specifically limited otherwise.

In the related art, an ablation probe carries out ablation treatment based on only one ablation mode, so that the ablation probe can only carry out ablation treatment on specific tissue cells and generate a single ablation treatment effect.

In view of the above problems, the embodiment of the application provides an ablation probe, which can expand the application range of ablation treatment and improve the ablation treatment effect.

The technical solutions of the embodiments of the present application are described in detail below with reference to the accompanying drawings.

Fig. 1 is a schematic structural diagram of an ablation probe according to an embodiment of the present application.

Referring to fig. 1, the present embodiment provides anablation probe 10 comprising: the probe comprises aprobe body 110 and at least two ablation circuit structures arranged in theprobe body 110; each of the at least two ablation circuit structures is not in contact with each other; at least two ablation circuit structures, including at least one thermalablation circuit structure 120, and at least one non-thermalablation circuit structure 130.

It should be noted that theablation probe 10 may be implemented using an external power supply to provide electrical energy to the ablation probe to ensure proper operation of the thermalablation circuit structure 120 and the non-thermalablation circuit structure 130.

The thermalablation circuit structure 120 may be a radio frequency ablation circuit structure, a microwave ablation circuit structure, or a resistive thermal ablation circuit structure, among others. Under the condition that the radio frequency ablation circuit structure is connected with external power supply equipment, the principle of radio frequency heating can be utilized, so that the temperature of biological tissues is raised to about 60-80 ℃ due to interaction, and the tissue protein is denatured and necrotized. The microwave ablation circuit structure can generate microwaves with specific wavelengths under the condition of being connected to external power supply equipment, so that water molecules among biological tissues vibrate, the temperature of the biological tissues is raised to about 60-80 ℃, and therefore, the tissue proteins are denatured and necrotized. The resistance heat ablation circuit structure can be electrified to generate heat under the condition of being connected with external power supply equipment, and then biological tissues are heated and killed.

The athermalablation circuit structure 130 can be, but is not limited to, an electroporation ablation circuit structure. The electroporation ablation circuit structure can utilize electric pulse to act on tissue cells under the condition of being connected with external power supply equipment, so that the cell membranes form a plurality of nanoscale irreversible pore canals, the internal and external balance of the cells is damaged, and the apoptosis of the cells is promoted.

Wherein the at least two ablation circuit structures include at least one thermalablation circuit structure 120 and at least one non-thermalablation circuit structure 130. In a specific embodiment,ablation probe 10 may have four ablation circuit configurations, including a radiofrequency ablation circuit configuration, a microwave ablation circuit configuration, a resistive thermal ablation circuit configuration, and an electroporation ablation circuit configuration, thereby enablingablation probe 10 to have multiple ablation treatment modalities. In another specific embodiment, there may be five ablation circuit structures, including four resistive thermal ablation circuit structures and one electroporation ablation circuit structure, and the four resistive thermal ablation circuit structures are controlled respectively, so as to adjust the heating temperature and the local heating position of theablation probe 10, thereby improving the flexibility of the application of theablation probe 10. It is understood that different combinations of embodiments are possible according to different applications or use requirements, which are not illustrated herein.

According to theablation probe 10 provided by the embodiment, at least two ablation treatment modes are integrated in oneablation probe 10, so that a doctor can switch the ablation modes according to needs in the operation process without replacing the probe, the operation convenience is improved, and the application range is expanded. In addition, a plurality of ablation circuit structures in theablation probe 10 can work simultaneously, so that combined ablation treatment is performed, combined treatment of a thermal ablation mode and a non-thermal ablation mode, combined treatment of multiple thermal ablation modes with different principles, and the like are realized, a specific ablation treatment effect is achieved, and the ablation treatment effect is improved.

Fig. 2 is another schematic structural view of theablation probe 20 shown in the embodiments of the present application. Fig. 2 describes the solution of the present application in more detail with respect to fig. 1.

Referring to fig. 2, the present embodiment provides anablation probe 20 comprising: aprobe body 210 and at least two ablation circuit structures disposed within theprobe body 210; each of the at least two ablation circuit structures is not in contact with each other; at least two ablation circuit structures, including at least one thermal ablation circuit structure, and at least one non-thermal ablation circuit structure.

Wherein the at least two ablation circuit structures include an electroporationablation circuit structure 230 and at least one resistive thermalablation circuit structure 220. In one embodiment, at least two ablation circuit structures include an electroporationablation circuit structure 230 and a resistive thermalablation circuit structure 220, and a user of theablation probe 20 selects to apply the electroporationablation circuit structure 230 or the resistive thermalablation circuit structure 220 individually for different tissue cells or achieving different ablation effects, so as to achieve the switching function of ablation treatment modes and improve the use flexibility; or the electroporationablation circuit structure 230 and the resistance thermalablation circuit structure 220 are selected to be simultaneously applied, so as to achieve the specific ablation treatment effect.

In another embodiment, there are at least two ablation circuit structures, including one electroporationablation circuit structure 230 and several resistive thermalablation circuit structures 220. In particular, each resistive thermalablation circuit structure 220 is disposed around an electroporationablation circuit structure 230. By respectively controlling the resistance thermalablation circuit structures 220, the heating temperature and the local heating position of theablation probe 20 are adjusted, the application flexibility of theablation probe 20 is improved, and resistance thermal ablation and electroporation ablation treatment can be simultaneously carried out.

Theprobe body 210 includes aprobe housing 211, aninsulator 212 filled in theprobe housing 211, and an insulatinglayer 213 partially wrapping the outside of theprobe housing 211. An electroporationablation circuit structure 230 and at least one resistive thermalablation circuit structure 220 are embedded in theinsulation 212, the electroporationablation circuit structure 230 being in contact with theprobe housing 211.

The resistive thermalablation circuit structure 220 is used to provide a thermal ablation therapy function. In one embodiment, a thermal ablation circuit structure includes: the probe comprises a heating resistor and two conductive leads respectively connected to two ends of the heating resistor, wherein the heating resistor is embedded in aninsulator 212, and the two conductive leads penetrate through aprobe body 210. The two conductive paths are connected to an external power supply device to achieve conduction of the circuit loop, so that the resistance thermalablation circuit structure 220 operates.

Theelectroporation ablation circuitry 230 is for providing electroporation ablation therapy functionality. In one embodiment, theelectroporation ablation circuitry 230 comprises: an electrode terminal lead. One end of the electrode terminal lead is in contact with theprobe case 211 and the other end of the electrode terminal lead penetrates theprobe body 210 within theinsulator 212. The electroporationablation circuit structure 230 is operated by connecting the electrode tip lead to an external power supply. Specifically, the electrode end lead of the electroporationablation circuit structure 230 of theablation probe 20 can be connected to the positive electrode of the external power supply device and matched with the other negative electrode lead, so as to perform electroporation ablation treatment. Alternatively, the electrode end lead of the electroporationablation circuit structure 230 of theablation probe 20 may be connected to the negative electrode of the external power supply device and then matched with another positive electrode lead, so as to perform the electroporation ablation treatment.

Theelectroporation ablation circuitry 230 is in electrical communication with theprobe housing 211. Electrical pulses generated by an external power supply may flow through theprobe housing 211 through theelectroporation ablation circuitry 230. When theprobe shell 211 contacts with the tumor tissue, the probe shell is matched with another electrode lead to form a closed loop of a circuit loop, so that the current acts on the tumor tissue, and the electroporation ablation treatment is further realized. Theprobe housing 211 is a conductive housing, and specifically, may be a metal housing, such as a stainless steel metal housing.

The non-contact of the ablation circuit structures is realized through theinsulator 212, so that the independent operation of the resistive thermalablation circuit structure 220 and the electroporationablation circuit structure 230 is guaranteed. Theinsulator 212 serves as an insulating medium, and theinsulator 212 may be an insulating powder, such as silicon dioxide powder, or the like.Insulator 212 may be one insulating medium, andinsulator 212 may also be a combination of a plurality of different insulating media mixed in a predetermined ratio.

The insulatinglayer 213 is used to realize the insulating isolation of the outer surface of theprobe housing 211, so that the user can conveniently take and hold theablation probe 20, and the use safety performance is guaranteed. The insulatinglayer 213 may be a rubber layer having good insulating properties. The insulatinglayer 213 may also be an insulating plating layer that is plated on the outer surface of theprobe housing 211. In this way, the user can safely use theablation probe 20 to avoid electrical accidents.

Further, in one embodiment, the thermal ablation circuit structure is a resistive thermalablation circuit structure 220, and the resistive thermalablation circuit structure 220 has a heating resistor; theprobe shell 211 is divided into a heating section probe shell and a non-heating section probe shell, and the non-heating section probe shell is covered in the insulatinglayer 213; the length of the heating section probe shell is smaller than or equal to that of the heating resistor. Thus, the portion of the heating segment probe housing that is the site at which theablation probe 20 performs thermal ablation therapy reaches a portion that clearly defines the effective thermal ablation of theablation probe 20. The length of the heat generating resistor means a linear length of the heat generating resistor in the longitudinal direction of theprobe case 211, that is, a height of the heat generating resistor in the longitudinal direction of theprobe case 211. It is understood that the heat-generating resistor may have a filament-like structure, and for example, may have a linear shape, a curved shape, a spiral shape, or the like. The heat generating resistor may have other forms, and is not illustrated here.

Further, the composition of theinsulator 212 may be divided according to whether it is in a heated or non-heated section of theprobe housing 211. For example, the portion of theinsulator 212 in the heating section probe housing is made of an insulating medium with better heat resistance, and the portion of theinsulator 212 in the non-heating section probe housing is made of an insulating medium with lower heat resistance.

To enhance the effectiveness of the electroporation ablation therapy, in one embodiment, theelectroporation ablation circuitry 230 is in contact with the front end of theprobe housing 211. In this way, theelectroporation ablation circuitry 230 can be brought closer to the tumor tissue with less electrical energy being lost in theprobe housing 211. Further, the front end of theprobe housing 211 is tapered to facilitate the application of the electroporation ablation therapy. Further, in one embodiment, theelectroporation ablation circuitry 230 is soldered to the front end of theprobe housing 211. Thus, the stability of the connection between the electroporationablation circuit structure 230 and theprobe housing 211 is ensured, poor contact between the electroporationablation circuit structure 230 and theprobe housing 211 is avoided, and the effectiveness of the electroporation ablation treatment of theablation probe 20 is ensured.

It should be further noted that, in the conventional rf ablation or microwave ablation, the generated heat energy is carried away and dissipated by the blood flow based on the heat sink effect, so that the heating temperature is insufficient to affect the therapeutic efficacy, and the conventional rf ablation or microwave ablation cannot be applied to the tissues and parts with abundant blood flow. Theablation probe 20 provided by the application utilizes the heating resistor of the resistance heatablation circuit structure 220 to generate higher temperature (for example, 80-120 ℃ high temperature), so that the influence of heat sink effect can be greatly reduced; for tissues and parts with abundant blood flow around, thecircuit structure 230 can be ablated by electroporation to avoid blood flow and prevent blood vessel damage. By controlling the flowing direction of the current in the electroporationablation circuit structure 230 to selectively kill the cells, the killing rate of the tumor cells is improved.

In the traditional radio frequency ablation or microwave ablation, treatment is carried out through the thermal diffusion effect, and the treatment range is difficult to clearly judge. Theablation probe 20 provided herein is capable of precisely treating a boundary by electroporating theablation circuit structure 230.

In the traditional radio frequency ablation or microwave ablation, the probe needs at least 30 minutes to reach the treatment temperature, and the temperature rise speed is slow. The application provides anablation probe 20 utilizes the resistance that generates heat of resistive heatablation circuit structure 220 to realize rapid heating up function, shortens treatment time. In addition, due to the fast propagation speed of electricity, the tumor cells passing through the electroporationablation circuit structure 230 are killed more quickly, and the treatment time is shortened.

The principle of the traditional radio frequency ablation or microwave ablation is indirect heating of biological tissues, and the traditional radio frequency ablation or microwave ablation is only suitable for tissues with high water content. Theablation probe 20 provided by the present application, using the electroporationablation circuit structure 230, can treat the target object that cannot be treated by rf ablation or microwave ablation, thereby expanding the range of treatable target objects.

As can be seen from this embodiment, the present application provides anablation probe 20 by skillfully designing theprobe body 210 to include: the probe comprises aprobe shell 211, aninsulator 212 filled in theprobe shell 211, and an insulatinglayer 213 partially wrapped outside theprobe shell 211. By embedding an electroporationablation circuit structure 230 and at least one resistive thermalablation circuit structure 220 in theinsulator 212, the electroporationablation circuit structure 230 is in contact with theprobe housing 211, so that mutual independence and mutual noninterference of the ablation circuit structures are ensured, and safe and stable operation of the ablation circuit structures is ensured. Through the cooperation operation of an electroporationablation circuit structure 230 and at least one resistance thermalablation circuit structure 220, or switch over the use to richen the function of ablatingprobe 20, promoted implementation convenience, promoted and used the flexibility, optimized the treatment effect that ablatesprobe 20.

The application also provides an embodiment of an ablation device, and fig. 3 is a structural schematic diagram of the ablation device shown in the embodiment of the application.

Referring to fig. 3, the present embodiment provides an ablation apparatus 30 including: apower supply 310 and at least twoablation probes 320 as described in any of the embodiments above connected to thepower supply 310.

The structure of theablation probe 320 can be referred to the description in fig. 1 and fig. 2, and is not described herein again.

Wherein thepower supply 310 is configured to provide a first preset voltage to thermal ablation circuitry in the at least oneablation probe 320;

thepower supply 310 is further configured to provide a second preset voltage to the athermal ablation circuitry in both ablation probes 320;

one of the non-thermal ablation circuit structures in oneablation probe 320 is connected to thepower supply 310 as a positive terminal, and one of the non-thermal ablation circuit structures in theother ablation probe 320 is connected to thepower supply 310 as a negative terminal.

The thermal ablation circuit structure can be a radio frequency ablation circuit structure, a microwave ablation circuit structure or a resistance thermal ablation circuit structure and the like; the non-thermal ablation circuit structure may be, but is not limited to, an electroporation ablation circuit structure.

In this embodiment, the thermal ablation circuit structure is a resistive thermal ablation circuit structure, and the non-thermal ablation circuit structure is an electroporation ablation circuit structure.

In one embodiment, thepower supply 310 provides a DC voltage of 0-10V to each resistive thermal ablation circuit structure in eachablation probe 320, so that each resistive thermal ablation circuit structure can generate heat energy of 10-150 degrees Celsius. Furthermore, the temperature of the corresponding resistance thermal ablation circuit structure is controlled by adjusting the voltage.

In one embodiment, thepower supply 310 provides a pulse voltage of 0.5-2 KV to the electroporation ablation circuit structure in the twoablation probes 320, and the twoablation probes 320 are respectively used as a positive terminal and a negative terminal, and act on the tumor tissue to form a closed circuit loop for conduction, thereby performing electroporation ablation treatment on the tumor tissue.

Further, the ablation device 30 may include a plurality of ablation probes 320, and one of the non-thermal ablation circuit structures in one of the ablation probes 320 is used as a positive terminal, a plurality of the non-thermal ablation circuit structures in the plurality of ablation probes 320 are used as negative terminals, and the plurality of the negative terminals respectively correspond to one positive terminal, so as to perform the electroporation ablation treatment. The ablation device 30 may further enable one of the non-thermal ablation circuit structures in one of the ablation probes 320 to serve as a negative terminal, and enable a plurality of the non-thermal ablation circuit structures in the plurality of ablation probes 320 to serve as positive terminals, and the positive terminals respectively correspond to one negative terminal, so as to perform the electroporation ablation therapy.

It can be seen from this embodiment that, the ablation device 30 provided by the present application supplies electric energy to eachablation probe 320 through thepower supply 310, and different ablation treatment schemes can be formed by combining and matching the plurality of ablation probes 320, so as to achieve different ablation treatment effects, thereby greatly improving the application flexibility of the ablation device 30, expanding the application range, and optimizing the ablation treatment effects.

Having described embodiments of the present application, the foregoing description is intended to be exemplary, not exhaustive, and not limited to the disclosed embodiments. Many modifications and variations will be apparent to those of ordinary skill in the art without departing from the scope and spirit of the described embodiments. The terminology used herein is chosen in order to best explain the principles of the embodiments, the practical application, or improvements made to the technology in the marketplace, or to enable others of ordinary skill in the art to understand the embodiments disclosed herein.

Claims (10)

1. An ablation probe, comprising:

the probe comprises a probe body and at least two ablation circuit structures arranged in the probe body;

each of the at least two ablation circuit structures is not in contact with each other;

the at least two ablation circuit structures include at least one thermal ablation circuit structure, and at least one non-thermal ablation circuit structure.

2. The ablation probe of claim 1, wherein:

the heat ablation circuit structure is one of a radio frequency ablation circuit structure, a microwave ablation circuit structure and a resistance heat ablation circuit structure;

the non-thermal ablation circuit structure is an electroporation ablation circuit structure.

3. The ablation probe of claim 1 or 2, wherein:

the probe body comprises a probe shell, an insulator filled in the probe shell and an insulating layer partially wrapped outside the probe shell;

at least one of the thermal ablation circuit structures and at least one of the non-thermal ablation circuit structures are embedded in the insulation;

at least one of the athermal ablation circuit structures is in contact with the probe housing.

4. The ablation probe of claim 3, wherein:

the heat ablation circuit structure is a resistance heat ablation circuit structure; the resistance thermal ablation circuit structure is provided with a heating resistor;

the probe shell is divided into a heating section probe shell and a non-heating section probe shell, and the non-heating section probe shell is covered in the insulating layer;

the length of the heating section probe shell is smaller than or equal to that of the heating resistor.

5. The ablation probe of claim 4, wherein:

at least one of the athermal ablation circuit structures is in contact with the front end of the probe housing.

6. The ablation probe of claim 5, wherein:

at least one of the athermal ablation circuit structures is soldered to the front end of the probe housing.

7. The ablation probe of claim 6, wherein:

the at least two ablation circuit structures include one of the thermal ablation circuit structures and one of the non-thermal ablation circuit structures.

8. The ablation probe of claim 6, wherein:

the at least two ablation circuit structures include a plurality of the thermal ablation circuit structures and one of the non-thermal ablation circuit structures.

9. The ablation probe of claim 8, wherein:

each of the thermal ablation circuit structures is disposed around the non-thermal ablation circuit structure.

10. An ablation device, comprising: a power supply and at least two ablation probes according to any of claims 1-9 connected to the power supply;

wherein the power supply is configured to provide a first preset voltage to the thermal ablation circuitry in at least one of the ablation probes;

the power supply is further configured to provide a second preset voltage to the athermal ablation circuitry in both of the ablation probes;

one of the non-thermal ablation circuit structures in one of the ablation probes is connected to the power supply as a positive end, and one of the non-thermal ablation circuit structures in the other ablation probe is connected to the power supply as a negative end.

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