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CN112649717A - Test method, test device, terminal equipment and storage medium - Google Patents

Test method, test device, terminal equipment and storage medium
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Publication number
CN112649717A
CN112649717ACN202010968115.5ACN202010968115ACN112649717ACN 112649717 ACN112649717 ACN 112649717ACN 202010968115 ACN202010968115 ACN 202010968115ACN 112649717 ACN112649717 ACN 112649717A
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tested
equipment
test
calibration
identification information
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CN202010968115.5A
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CN112649717B (en
Inventor
罗宁
李滨村
曹子鹏
张雨力
甄浩凯
刘维球
刘契荣
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Shenzhen Jimi Iot Co ltd
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Guangzhou Jimi Wulian Technology Co ltd
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Abstract

The application is suitable for the technical field of production intelligent manufacturing, and provides a testing method, a testing device, terminal equipment and a storage medium. In the embodiment of the application, the type of a calibration instrument is obtained, and the number of devices to be tested which execute parameter calibration at the same time is determined according to the type of the calibration instrument; selecting a first device to be tested which accords with preset identification information from a device to be tested which is subjected to program downloading; selecting second equipment to be tested according with the number of the equipment to be tested from the equipment to be tested except the first equipment to be tested; and controlling second equipment to be tested according with the number of the equipment to be tested to execute parameter calibration, and controlling the first equipment to be tested to execute the function test according with the identification information. Thereby improving testing efficiency before the PCBA enters the assembly stage.

Description

Test method, test device, terminal equipment and storage medium
Technical Field
The application belongs to the technical field of production intelligent manufacturing, and particularly relates to a testing method, a testing device, terminal equipment and a storage medium.
Background
In most of the existing mobile terminal processing plants, after a Printed Circuit Board (PCB) is Mounted by Surface Mount Technology (SMT), a Printed Circuit Board Assembly (PCBA) is obtained, and the obtained PCBA can enter an Assembly stage through software downloading, parameter calibration and function testing, and then is put into the market.
Disclosure of Invention
The embodiment of the application provides a testing method, a testing device, terminal equipment and a storage medium, and can solve the problem of low testing efficiency before a PCBA enters an assembly stage.
In a first aspect, an embodiment of the present application provides a testing method, including:
acquiring the type of a calibration instrument, and determining the number of devices to be tested which currently execute parameter calibration at the same time according to the type of the calibration instrument;
selecting a first device to be tested which accords with preset identification information from a device to be tested which is subjected to program downloading;
selecting second equipment to be tested according with the number of the equipment to be tested from the equipment to be tested except the first equipment to be tested;
and controlling second equipment to be tested according with the number of the equipment to be tested to execute parameter calibration, and controlling the first equipment to be tested to execute the function test according with the identification information.
Optionally, before selecting the first device to be tested that meets the preset identification information from the set of devices to be tested that have been subjected to program downloading, the method includes:
acquiring the equipment codes of the equipment to be tested in the equipment set to be tested, and determining the current state of the equipment to be tested according to the equipment codes;
and deleting the equipment to be tested of which the current state accords with the preset state from the equipment to be tested in a centralized manner.
Optionally, before selecting the first device to be tested that meets the preset identification information from the set of devices to be tested that have been subjected to program downloading, the method further includes:
and acquiring the equipment type of each piece of equipment to be tested in the equipment set to be tested, determining a function test item of the equipment to be tested according to the equipment type, and matching corresponding identification information according to the function test item.
Optionally, after controlling the first device to be tested to perform the function test conforming to the identification information, the method includes:
and acquiring log information of the equipment to be tested in the operation process of each equipment to be tested, determining an operation result of the equipment to be tested according to the log information, and displaying the operation result.
Optionally, after controlling the first device to be tested to perform the function test conforming to the identification information, the method further includes:
and acquiring a function test completion signal which accords with the first equipment to be tested, and controlling the first equipment to be tested which completes the function test to carry out parameter calibration according to a preset scheduling rule.
Optionally, before acquiring the type of the calibration instrument, the method includes:
and acquiring the order number of the equipment set to be tested, and determining the scheduling rule of the equipment set to be tested according to the order number.
Optionally, before acquiring the type of the calibration instrument, the method includes:
sending request information to an operation tool at a preset time interval so that the operation tool feeds back according to the request information;
and if the feedback information is not acquired within the preset request times, carrying out restarting operation.
In a second aspect, an embodiment of the present application provides a testing apparatus, including:
the acquisition module is used for acquiring the type of a calibration instrument and determining the number of the devices to be tested which execute parameter calibration at the same time at present according to the type of the calibration instrument;
the first selection module is used for selecting first equipment to be tested which accords with preset identification information from the equipment to be tested which is subjected to program downloading;
the second selection module is used for selecting second equipment to be tested according with the number of the equipment to be tested from the equipment to be tested except the first equipment to be tested;
and the execution module is used for controlling second equipment to be tested according with the number of the equipment to be tested to execute parameter calibration and controlling the first equipment to be tested to execute the function test according with the identification information.
In a third aspect, an embodiment of the present application provides a terminal device, which includes a memory, a processor, and a computer program stored in the memory and executable on the processor, where the processor implements the steps of any one of the test methods when executing the computer program.
In a fourth aspect, the present application provides a computer-readable storage medium, which stores a computer program, and when the computer program is executed by a processor, the computer program implements the steps of any one of the above-mentioned test methods.
In a fifth aspect, embodiments of the present application provide a computer program product, which, when run on a terminal device, causes the terminal device to execute any one of the test methods of the first aspect.
In the embodiment of the application, the type of a calibration instrument is obtained, and the number of devices to be tested which execute parameter calibration at the same time is determined according to the type of the calibration instrument; selecting a first device to be tested which accords with preset identification information from a device to be tested which is subjected to program downloading; selecting second equipment to be tested according with the number of the equipment to be tested from the equipment to be tested except the first equipment to be tested; and controlling second equipment to be tested according with the number of the equipment to be tested to execute parameter calibration, and controlling the first equipment to be tested to execute the function test according with the identification information. Parameter calibration and function test of all to-be-tested equipment in the to-be-tested equipment set meeting the conditions are automatically controlled to be carried out simultaneously, instrument reuse rate in the calibration and test process is improved, omission of the to-be-tested equipment in the test process is avoided through selection of the corresponding to-be-tested equipment, and therefore test efficiency before the PCBA enters an assembling stage is integrally improved.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
FIG. 1 is a first schematic flow chart of a testing method provided in an embodiment of the present application;
FIG. 2 is a second flowchart of a testing method provided in an embodiment of the present application;
FIG. 3 is a schematic structural diagram of a testing apparatus provided in an embodiment of the present application;
fig. 4 is a schematic structural diagram of a terminal device according to an embodiment of the present application.
Detailed Description
In the following description, for purposes of explanation and not limitation, specific details are set forth, such as particular system structures, techniques, etc. in order to provide a thorough understanding of the embodiments of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments that depart from these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.
It will be understood that the terms "comprises" and/or "comprising," when used in this specification and the appended claims, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
It should also be understood that the term "and/or" as used in this specification and the appended claims refers to and includes any and all possible combinations of one or more of the associated listed items.
As used in this specification and the appended claims, the term "if" may be interpreted contextually as "when", "upon" or "in response to" determining "or" in response to detecting ". Similarly, the phrase "if it is determined" or "if a [ described condition or event ] is detected" may be interpreted contextually to mean "upon determining" or "in response to determining" or "upon detecting [ described condition or event ]" or "in response to detecting [ described condition or event ]".
Furthermore, in the description of the present application and the appended claims, the terms "first," "second," "third," and the like are used for distinguishing between descriptions and not necessarily for describing or implying relative importance.
Fig. 1 is a schematic flowchart of a testing method in an embodiment of the present application, where an execution main body of the method may be a terminal device, and as shown in fig. 1, the testing method may include the following steps:
step S101, obtaining the type of a calibration instrument, and determining the number of devices to be tested which execute parameter calibration at the same time according to the type of the calibration instrument.
In this embodiment, since the successful products of most of the PCBA boards in the terminal equipment processing plant after the software program downloading, parameter calibration and function test can enter the assembly stage, the three processes before assembly all require large amount of manpower and equipment, the degree of automation is low, in this regard, the scheduling of each process can be performed by a terminal device which integrates the above three processes and performs comprehensive control, because the instruments and meters used in different production lines are slightly different, in order to reduce the idle time of the instruments, improve the reuse rate of the instruments, the types of the instruments used for calibration in the current operation process can be obtained in advance, and judging the number of the devices to be tested which can execute the parameter calibration procedure at the same time according to the type of the instrument so as to reasonably utilize the calibration instrument when the subsequent terminal device carries out comprehensive scheduling. Wherein, the type of the calibration instrument refers to the type of the calibration instrument; the equipment to be tested is a PCBA board subjected to SMT chip mounting.
By way of specific example and not limitation, the calibration instruments currently used in different factory production lines are different, the calibration instruments roughly include agilent 8960, large and small calibrating instruments, CMW100, and the like, and the usage of the specific instruments is determined by the manufacturing factory and is not limited herein. If the above steps are performed simultaneously, the agilent 8960 can only perform parameter calibration on 1 device under test, the large and small calibrating instrument only supports 2 devices under test to perform parameter calibration simultaneously, and the CMW100 can support up to 8 devices under test to perform parameter calibration simultaneously.
Optionally, before step S101, the method includes:
and acquiring the order number of the equipment set to be tested, and determining the scheduling rule of the equipment set to be tested according to the order number.
In this embodiment, because different sets of devices to be tested may have different calibrated parameter standards, different test items for performing function tests, and different instruction configurations related to the process, the related configurations may be performed in advance in the terminal device performing comprehensive control, that is, the order number is associated with the related configuration item, so that after the terminal device obtains the order number of the set of devices to be tested, the configuration item is determined according to the order number, and then the scheduling rule of the set of devices to be tested is determined according to the configuration item. For example, different configuration items may use different time during parameter calibration, so that different functional tests can be integrally scheduled according to the different time; or determining the test items to be tested according to the configuration items, wherein some test items need to be subjected to parameter calibration or some specific test items exist, so that the terminal equipment can perform overall scheduling according to the requirements of the test items. The order number represents the number of the current batch of equipment to be tested; the scheduling rule is to schedule the device to be tested according to different principles so that the device to be tested performs procedures such as function testing, parameter calibration or software program downloading.
It can be understood that, since various hardware parameters of each device to be tested after production cannot be completely consistent, and different hardware parameters can affect the test result of the device to be tested, a parameter standard needs to be set, and the hardware parameters are calibrated to a relatively uniform level for testing, so that the internal parameters of the device to be tested can be adjusted according to the parameter standard, thereby correcting the deviation and ensuring the radio frequency performance index and consistency of each device to be tested.
Optionally, as shown in fig. 2, before step S102, the method includes:
step S201, acquiring the equipment codes of the equipment to be tested in the equipment to be tested set, and determining the current state of the equipment to be tested according to the equipment codes.
Step S202, deleting the devices to be tested of which the current states accord with preset states from the device to be tested in a centralized manner.
In this embodiment, before each piece of to-be-tested equipment in the to-be-tested equipment set is scheduled so that each piece of to-be-tested equipment is put into a corresponding process, the to-be-tested equipment needs to be checked to prevent some pieces of to-be-tested equipment from repeatedly performing the corresponding process or not performing the process all the time, so that the to-be-tested equipment is omitted, each piece of to-be-tested equipment carries a unique equipment code representing the identity of the to-be-tested equipment, and tools used in the related processes upload related data obtained in the process of the corresponding process and the equipment code corresponding to the related data to the MES system. Therefore, the equipment codes of all the to-be-tested equipment in the to-be-tested equipment set can be acquired, the equipment codes are inquired in an MES (manufacturing execution system), the current state of the to-be-tested equipment corresponding to the equipment codes in a production process is determined, the preset state is set to be a state of finished testing, the preset state and the state are compared, and when the current state meets the preset state, the to-be-tested equipment corresponding to the order number is tested, so that the to-be-tested equipment can be deleted from the to-be-tested equipment set, and the to-be-tested equipment is not put into the process for relevant testing.
As a specific example and not by way of limitation, if a corresponding record, for example, a record of operation success or failure, is queried in the terminal device through the device number, and if a corresponding record is queried, it is described that the device to be tested corresponding to the order number has been tested, the device to be tested may be deleted from the device to be tested in a centralized manner, and the device to be tested is not tested; if the corresponding record is not inquired, it is indicated that the device to be tested corresponding to the order number is not tested, or the test is not completed, the test can be continued.
Optionally, before step S102, the method further includes:
and acquiring the equipment type of each piece of equipment to be tested in the equipment set to be tested, determining a function test item of the equipment to be tested according to the equipment type, and matching corresponding identification information according to the function test item.
In this embodiment, because the functions to be tested for the production test of different devices to be tested are different, different test items need to be customized according to the functions of the different devices to be tested to meet the requirements of the devices to be tested, so that the device types of the devices to be tested in a set can be determined according to the serial connection or the related interface protocols, and the corresponding function test items of the devices to be tested are determined and configured according to the different device types. The method and the device for testing the function of the terminal equipment to be tested have the advantages that the function test conforming to the device to be tested is carried out on the device to be tested, the corresponding identification information is matched according to the determined function test, namely, the device to be tested determines a plurality of function test items, and each corresponding identification information is matched aiming at the function test items, so that the terminal equipment for carrying out the total scheduling subsequently carries out the function test scheduling according to different identification information of the device to be tested and corresponding scheduling rules.
As a specific example, but not by way of limitation, if it is determined that the device under test needs to perform a current test item, a vibration test item, a GPS test item, a WIFI signal test item, and a SIM card test item through the device type, corresponding identification information needs to be matched for each test item, for example, the vibration test item matches a vibration identification, the GPS test item matches a GPS identification, and the like.
Optionally, in the development process of the device to be tested, besides the basic function of the device to be tested, a test module needs to be developed to verify whether the function of the device to be tested is complete and whether the performance of the device to be tested is qualified, and when the device to be tested operates the test module, the device to be tested is in a test mode, and the terminal device in charge of the master control performs instruction interaction to control the test module, so as to test each function item of the product. In the testing process, the terminal equipment can receive and transmit the interactive information through the serial port to perform the function test of the equipment to be tested; and calling a chip platform test library according to the related interface protocol to perform corresponding functional test.
It can be understood that the products have different functions and corresponding test items, for example, when the products contain a vibration sensor, the terminal device for performing master control can control an external component to vibrate the products, and obtain test information sent by the products through a serial port, that is, information obtained by the vibration sensor, so as to determine whether the vibration sensor is normal; or the product has a WIFI function, the terminal equipment for performing master control can control the product to search for WIFI hotspots through a serial port instruction, and test information sent by the product is acquired through a serial port after the search is completed so as to judge whether the WIFI function is normal or not.
Step S102, selecting a first device to be tested which accords with preset identification information from a device to be tested which is downloaded with a program.
In this embodiment, in the process of performing total control on the terminal device, in order to improve the multiplexing rate of the instrument and control the processes to perform complementary work, the function test items to be performed by the device to be tested may be divided into a pre-calibration function test and a post-calibration function test according to the current situation, and in this process, when the terminal device controls the device to be tested to perform the function test, the pre-calibration function test, the post-calibration function test and a full function test after the calibration is completed may exist, so the terminal device may centrally obtain identification information of the device to be tested from the device to be tested and perform a judgment, and if the representation information of the current device to be tested conforms to the preset identification information, the device to be tested conforming to the preset identification information is set as the first device to be tested. The number of the first devices to be tested can be one, or two or more; the preset identification information is identification information corresponding to a pre-calibration function test, a post-calibration function test or a full function test, and the identification information carries information whether parameter calibration is performed on the equipment to be tested corresponding to the current post-calibration function test item and the full function test item, and the information can be performed after parameter calibration is performed on the post-calibration function test item and the full function test item, so that the first equipment to be tested meeting the requirements can be selected by carrying corresponding parameter calibration information.
Optionally, the specific division of the pre-calibration functional test and the post-calibration functional test may be divided according to calibration parameters, that is, functional test items that can be performed only by using calibrated hardware parameters are divided in the post-calibration functional test, for example, an RF calibration flag bit test is checked; the functional test items can be divided according to test basic conditions, namely, the functional test items which need to be subjected to functional test on the basis of the completion of the tests of some functional test items are divided into functional tests after calibration, and the functional test items which serve as conditions are divided into functional tests before calibration; the functional test which is relatively consistent with the calibration time can be divided into the functional test before calibration according to the calibration time of the equipment to be tested; or the division may be performed according to the operation requirement of the technician, which is not limited herein, and the division may be performed by combining one or more of the above-mentioned division rules.
Optionally, in order to improve the automation level of the device to be tested in the test process, after the terminal device performing the master control acquires the test instruction sent by the user, the corresponding automation process can be performed according to the preset scheduling rule, so that the overall efficiency is improved. And after the user sends the test instruction, the terminal device downloads the program of each device to be tested according to the test instruction, so that the device to be tested has the corresponding function, and parameter calibration and function test can be conveniently carried out subsequently.
Step S103, selecting second devices to be tested according with the number of the devices to be tested from the devices to be tested except the first devices to be tested.
In this embodiment, after the first device under test capable of performing the function test currently is selected from the above steps, the selected first device under test is removed from the device set, and the remaining device under test is the device under test capable of performing the parameter calibration currently, and the device under test is set as the second device under test, so that the terminal device is required to perform the corresponding control later, where the number of the second device under test may be one, or two or more.
And step S104, controlling second equipment to be tested according with the number of the equipment to be tested to execute parameter calibration, and controlling the first equipment to be tested to execute the function test according with the identification information.
In this embodiment, in order to reduce the idle time of the instrument and improve the multiplexing rate of the instrument, the first device under test and the second device under test meeting the conditions are selected from the above steps, the terminal device performing the total control may control the number of the determined devices under test that perform the parameter calibration at the same time, so as to select the second device under test meeting the number of the devices under test from the second device under test according to the selection rules such as the preset sequence or the preset priority, and the terminal device controls the selected second device under test to perform the parameter calibration, and controls the determined first device under test to perform the function test meeting the identification information thereof, for example, if the current identification information is a vibration identification, the vibration test is performed.
Optionally, because the instruments that the current terminal device controls the device to be tested to perform the corresponding processes are different, the number of the current controllable devices to be tested that can simultaneously perform work is different. For example, if the current terminal device is controlled by using the rf integrated tester, because the rf integrated tester has four channels, each channel corresponds to one device under test, if the terminal device only uses one rf integrated tester, there are only four devices under test that can simultaneously operate currently, the terminal device can monitor the process conditions of the devices under test connected to the rf integrated tester channels in real time, if the number of devices under test currently performing parameter calibration obtained through the above steps is 1, the terminal device controls the second device under test that is ranked first among the second devices under test to perform parameter calibration, and then selects three first devices under test to perform function tests conforming to the identification information thereof, such as function test before calibration, function test after calibration, or full function test, according to the above selection rule from the determined first devices under test, and when the parameter calibration of the second device under test that performs calibration is completed, the first device to be tested is classified as a first device to be tested to be queued for function testing, and after the function testing of the first device to be tested is completed, the identification information of the first device to be tested is checked to judge whether the first device to be tested is classified as a second device to be tested to be queued for parameter calibration.
Optionally, if the number of the second devices to be tested is greater than the determined number of the devices to be tested for performing the parameter calibration, after the second devices to be tested corresponding to the number of the devices to be tested for performing the parameter calibration are selected, the remaining unselected devices to be tested which are not subjected to the function test are divided into the first devices to be tested, so as to wait for the function test before the calibration.
Optionally, after step S104, the method includes:
and acquiring log information of the equipment to be tested in the operation process of each equipment to be tested, determining an operation result of the equipment to be tested according to the log information, and displaying the operation result.
In this embodiment, because there may be a device to be tested whose function or performance does not meet the relevant specification in the device to be tested set, in order to facilitate the user to view the result, the terminal device may obtain log information generated by each device to be tested set in the device to be tested set during the operation processes of the software downloading, the parameter calibration, the function test, and the like, and record the log information to the local, the user may also see the relevant log information through the main control interface of the terminal device, and the terminal device may determine the operation result, that is, the success number and the failure number, of the device to be tested according to the log information, and may also correspondingly display the relevant result information of the device to be tested corresponding to the device number.
Optionally, after step S104, the method further includes:
and acquiring a function test completion signal which accords with the first equipment to be tested, and controlling the first equipment to be tested which completes the function test to carry out parameter calibration according to a preset scheduling rule.
In this embodiment, when the device to be tested performs the process operation, the time for completing the process by different devices to be tested is different, so the terminal device can monitor the progress completed by the device to be tested in each process in real time.
Optionally, before step S104, the second device under test may be controlled by a relay to perform a restart operation.
In this embodiment, since the second device under test is to prevent the parameter calibration from being unqualified due to the instability of the current parameter, the second device under test needs to be restarted before the parameter calibration, and the terminal device can control the second device under test to restart through the switch of the relay.
Optionally, the terminal device may perform the above-mentioned processes by using a pneumatic clamp, perform switching of each device to be tested in the processes by using a multi-jointed board mode, complete the above-mentioned three processes by using a set of clamps, without transferring and detaching boards, and implement automatic downloading, calibration and testing by controlling the relay switching processes; the parameter calibration process of the calibration instrument is realized by utilizing the coaxial switch. Wherein, among the above-mentioned pneumatic fixture can add the cylinder and use pneumatics to replace manual clamp plate to add motor vibrations and replace manual vibrations, in order to deal with the vibrations test item.
Optionally, before performing step S101, the terminal device obtains account password information of the current operating user, verifies the account password information with permission information pre-stored in the terminal device, and performs related configuration according to the order number input by the user after the verification is passed. And in the information input stage of the user, if the information is wrong, the terminal equipment returns wrong prompt information and acquires the wrong prompt information again.
Optionally, before step S101, the method includes:
and sending request information to an operation tool at a preset time interval so that the operation tool feeds back according to the request information.
And if the feedback information is not acquired within the preset request times, carrying out restarting operation.
In this embodiment, when the terminal device sends the request information to start the corresponding operating tool in the processes of serial port calibration, instrument calibration, and the like, if the operating tool does not reply within the preset number of requests, the corresponding operating tool needs to be restarted, so that the operating tool can run normally.
Optionally, if the operation tool is a test tool, the terminal device may query the occupation status of the corresponding port, remove the occupation of the corresponding port, and resend the request message, so that the test tool replies the request message.
Optionally, the terminal device sends the request information to the corresponding downloading tool, and after the downloading tool replies the request information, the terminal device sends the configuration information corresponding to the device to be tested to the downloading tool, so that the downloading tool downloads the corresponding program to the device to be tested, and in this process, the terminal device displays the current status text, the progress information and the corresponding result in real time. After the program is downloaded successfully, the terminal device can control the corresponding calibration instrument to work through the relay, after the calibration instrument replies request information sent by the terminal device, the terminal device creates a shared memory area, sends the COM number to the calibration tool, performs related configuration settings such as related test mode setting and configuration file setting, performs calibration, and obtains a calibration result fed back by the calibration instrument. The terminal equipment can control the corresponding testing tool to work through the relay, after the testing tool replies the request information sent by the terminal equipment, the terminal equipment sends related configuration information such as orders and the like and COM numbers to the testing tool to carry out a testing procedure, and obtains related testing information, testing results and test stopping information fed back by the testing tool.
In the embodiment of the application, the type of a calibration instrument is obtained, and the number of devices to be tested which execute parameter calibration at the same time is determined according to the type of the calibration instrument; selecting a first device to be tested which accords with preset identification information from a device to be tested which is subjected to program downloading; selecting second equipment to be tested according with the number of the equipment to be tested from the equipment to be tested except the first equipment to be tested; and controlling second equipment to be tested according with the number of the equipment to be tested to execute parameter calibration, and controlling the first equipment to be tested to execute the function test according with the identification information. Parameter calibration and function test of all to-be-tested equipment in the to-be-tested equipment set meeting the conditions are automatically controlled to be carried out simultaneously, instrument reuse rate in the calibration and test process is improved, omission of the to-be-tested equipment in the test process is avoided through selection of the corresponding to-be-tested equipment, and therefore test efficiency before the PCBA enters an assembling stage is integrally improved.
It should be understood that, the sequence numbers of the steps in the foregoing embodiments do not imply an execution sequence, and the execution sequence of each process should be determined by its function and inherent logic, and should not constitute any limitation to the implementation process of the embodiments of the present application.
Corresponding to the above-mentioned testing method, fig. 3 is a schematic structural diagram of a testing apparatus in an embodiment of the present application, and as shown in fig. 3, the testing apparatus may include:
an obtainingmodule 301, configured to obtain a type of a calibration instrument, and determine, according to the type of the calibration instrument, the number of devices to be tested that currently execute parameter calibration at the same time.
The first selectingmodule 302 is configured to select a first device to be tested that meets the preset identification information from a set of devices to be tested that have undergone program downloading.
A second selectingmodule 303, configured to select, from the set of devices to be tested except for the first device to be tested, second devices to be tested that meet the number of the devices to be tested.
Theexecution module 304 is configured to control the second device under test meeting the number of the devices under test to execute parameter calibration, and control the first device under test to execute the function test meeting the identification information.
Optionally, the testing apparatus may further include:
and the code acquiring module is used for acquiring the equipment codes of all the equipment to be tested in the equipment to be tested set and determining the current state of the equipment to be tested according to the equipment codes.
And the deleting module is used for deleting the equipment to be tested, the current state of which accords with the preset state, from the equipment to be tested in a centralized manner.
Optionally, the testing apparatus may further include:
and the type obtaining module is used for obtaining the equipment type of each piece of equipment to be tested in the equipment to be tested set, determining the function test item of the equipment to be tested according to the equipment type, and matching corresponding identification information according to the function test item.
Optionally, the testing apparatus may further include:
and the log obtaining module is used for obtaining log information of the equipment to be tested in the operation process of each equipment to be tested, determining the operation result of the equipment to be tested according to the log information and displaying the operation result.
Optionally, the testing apparatus may further include:
and the parameter calibration module is used for acquiring the function test completion signal which accords with the first equipment to be tested and controlling the first equipment to be tested which completes the function test to carry out parameter calibration according to a preset scheduling rule.
Optionally, the testing apparatus may further include:
and the rule determining module is used for acquiring the order number of the equipment set to be tested and determining the scheduling rule of the equipment set to be tested according to the order number.
Optionally, the testing apparatus may further include:
and the sending module is used for sending the request information to the operation tool at preset time intervals so that the operation tool feeds back according to the request information.
And the restarting module is used for carrying out restarting operation if the feedback information is not obtained within the preset request times.
In the embodiment of the application, the type of a calibration instrument is obtained, and the number of devices to be tested which execute parameter calibration at the same time is determined according to the type of the calibration instrument; selecting a first device to be tested which accords with preset identification information from a device to be tested which is subjected to program downloading; selecting second equipment to be tested according with the number of the equipment to be tested from the equipment to be tested except the first equipment to be tested; and controlling second equipment to be tested according with the number of the equipment to be tested to execute parameter calibration, and controlling the first equipment to be tested to execute the function test according with the identification information. Parameter calibration and function test of all to-be-tested equipment in the to-be-tested equipment set meeting the conditions are automatically controlled to be carried out simultaneously, instrument reuse rate in the calibration and test process is improved, omission of the to-be-tested equipment in the test process is avoided through selection of the corresponding to-be-tested equipment, and therefore test efficiency before the PCBA enters an assembling stage is integrally improved.
It is clear to those skilled in the art that, for convenience and brevity of description, the specific working processes of the apparatus and the module described above may refer to corresponding processes in the foregoing system embodiments and method embodiments, and are not described herein again.
Fig. 4 is a schematic structural diagram of a terminal device according to an embodiment of the present application. For convenience of explanation, only portions related to the embodiments of the present application are shown.
As shown in fig. 4, theterminal device 4 of this embodiment includes: at least one processor 400 (only one shown in fig. 4), a memory 401 connected to theprocessor 400, and acomputer program 402, such as a test program, stored in the memory 401 and executable on the at least oneprocessor 400. Theprocessor 400, when executing thecomputer program 402, implements the steps in the above-described embodiments of the test method, such as the steps S101 to S104 shown in fig. 1. Alternatively, theprocessor 400, when executing thecomputer program 402, implements the functions of the modules in the above device embodiments, such as the functions of themodules 301 to 304 shown in fig. 3.
Illustratively, thecomputer program 402 may be partitioned into one or more modules that are stored in the memory 401 and executed by theprocessor 400 to accomplish the present application. The one or more modules may be a series of computer program instruction segments capable of performing specific functions, which are used to describe the execution process of thecomputer program 402 in theterminal device 4. For example, thecomputer program 402 may be divided into an obtainingmodule 301, a first selectingmodule 302, a second selectingmodule 303, and an executingmodule 304, and the specific functions of the modules are as follows:
an obtainingmodule 301, configured to obtain a type of a calibration instrument, and determine, according to the type of the calibration instrument, the number of devices to be tested that currently execute parameter calibration at the same time.
The first selectingmodule 302 is configured to select a first device to be tested that meets the preset identification information from a set of devices to be tested that have undergone program downloading.
A second selectingmodule 303, configured to select, from the set of devices to be tested except for the first device to be tested, second devices to be tested that meet the number of the devices to be tested.
Theexecution module 304 is configured to control the second device under test meeting the number of the devices under test to execute parameter calibration, and control the first device under test to execute the function test meeting the identification information.
Theterminal device 4 may include, but is not limited to, aprocessor 400, a memory 401. Those skilled in the art will appreciate that fig. 4 is merely an example of theterminal device 4, and does not constitute a limitation of theterminal device 4, and may include more or less components than those shown, or combine some of the components, or different components, such as an input-output device, a network access device, a bus, etc.
TheProcessor 400 may be a Central Processing Unit (CPU), and theProcessor 400 may be other general purpose processors, Digital Signal Processors (DSPs), Application Specific Integrated Circuits (ASICs), Field-Programmable Gate arrays (FPGAs) or other Programmable logic devices, discrete Gate or transistor logic devices, discrete hardware components, etc. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.
The storage 401 may in some embodiments be an internal storage unit of theterminal device 4, such as a hard disk or a memory of theterminal device 4. In other embodiments, the memory 401 may also be an external storage device of theterminal device 4, such as a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) Card, a Flash memory Card (Flash Card), and the like provided on theterminal device 4. Further, the memory 401 may also include both an internal storage unit and an external storage device of theterminal device 4. The memory 401 is used for storing an operating system, an application program, a BootLoader (BootLoader), data, and other programs, such as program codes of the computer program. The memory 401 may also be used to temporarily store data that has been output or is to be output.
It will be apparent to those skilled in the art that, for convenience and brevity of description, only the above-mentioned division of the functional units and modules is illustrated, and in practical applications, the above-mentioned function distribution may be performed by different functional units and modules according to needs, that is, the internal structure of the apparatus is divided into different functional units or modules to perform all or part of the above-mentioned functions. Each functional unit and module in the embodiments may be integrated in one processing unit, or each unit may exist alone physically, or two or more units are integrated in one unit, and the integrated unit may be implemented in a form of hardware, or in a form of software functional unit. In addition, specific names of the functional units and modules are only for convenience of distinguishing from each other, and are not used for limiting the protection scope of the present application. The specific working processes of the units and modules in the system may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again.
In the above embodiments, the descriptions of the respective embodiments have respective emphasis, and reference may be made to the related descriptions of other embodiments for parts that are not described or illustrated in a certain embodiment.
Those of ordinary skill in the art will appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the implementation. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.
In the embodiments provided in the present application, it should be understood that the disclosed apparatus/terminal device and method may be implemented in other ways. For example, the above-described embodiments of the apparatus/terminal device are merely illustrative, and for example, the division of the modules or units is only one logical division, and there may be other divisions when actually implemented, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or units, and may be in an electrical, mechanical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present application may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a form of hardware, and can also be realized in a form of a software functional unit.
The integrated unit, if implemented in the form of a software functional unit and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, all or part of the processes in the methods of the embodiments described above can be implemented by a computer program, which can be stored in a computer-readable storage medium and can implement the steps of the embodiments of the methods described above when the computer program is executed by a processor. Wherein the computer program comprises computer program code, which may be in the form of source code, object code, an executable file or some intermediate form, etc. The computer readable medium may include at least: any entity or device capable of carrying computer program code to a photographing apparatus/terminal apparatus, a recording medium, computer Memory, Read-Only Memory (ROM), Random Access Memory (RAM), an electrical carrier signal, a telecommunications signal, and a software distribution medium. Such as a usb-disk, a removable hard disk, a magnetic or optical disk, etc. In certain jurisdictions, computer-readable media may not be an electrical carrier signal or a telecommunications signal in accordance with legislative and patent practice.
The above-mentioned embodiments are only used for illustrating the technical solutions of the present application, and not for limiting the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not substantially depart from the spirit and scope of the embodiments of the present application and are intended to be included within the scope of the present application.

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