CN111999308A - Defect detection control method, control device and control system - Google Patents

Abstract

The control method comprises the steps of firstly obtaining a defect detection standard corresponding to each target to be detected based on the target to be detected on each station, then carrying out image acquisition on a surface to be detected of the target to be detected on each station, determining image information of each target to be detected, and finally determining the defect type of the target to be detected based on the defect detection standard corresponding to the target to be detected and the image information of the target to be detected. Therefore, the defect type of the material can be automatically obtained by analyzing the image information of the material according to the defect detection standard, the visual damage of strong light to quality inspection personnel is avoided, the unification of the detection standard is ensured, the operation efficiency is improved, and the whole operation process is more intelligent.

Description

Defect detection control method, control device and control system

Technical Field

The present disclosure relates to the field of defect detection technologies, and in particular, to a control method, a control device, and a control system for defect detection.

Background

The defect detection generally refers to the detection of defects on the surface of an article, and comprises the detection of defects such as spots, pits, scratches, chromatic aberration, defects and the like on the surface of a workpiece.

At present, the defect detection is mainly carried out by manually observing the detected material under strong light for a long time, on one hand, the strong light can cause serious damage to the eyesight of quality testing personnel; on the other hand, manual detection is easily affected by factors such as personnel experience, fatigue and emotion, so that the judgment standard is inconsistent, the detection result is unstable, the efficiency is low, and the industrial capacity is restricted.

Disclosure of Invention

In view of this, an object of the embodiments of the present application is to provide a defect detection control method, a control device, and a control system, which can automatically obtain the defect type of a material by analyzing image information of the material according to a defect detection standard, avoid visual impairment of hard light to quality inspection personnel, ensure uniformity of the detection standard, improve operation efficiency, and make the whole operation process more intelligent.

In a first aspect, an embodiment of the present application provides a defect detection control method, where the defect detection control method includes:

acquiring a defect detection standard corresponding to each target to be detected on the basis of the target to be detected on each station;

acquiring images of the to-be-detected surface of the to-be-detected target on each station, and determining image information of each to-be-detected target;

and determining the defect type of the target to be detected based on the defect detection standard corresponding to the target to be detected and the image information of the target to be detected.

In a possible implementation manner, before the obtaining, based on the targets to be detected on the respective stations, the defect detection criteria corresponding to each of the targets to be detected, the control method further includes:

determining a detection type corresponding to each target to be detected;

and determining a defect detection standard corresponding to each target to be detected from a defect type database based on the detection type corresponding to each target to be detected.

In a possible implementation manner, after determining the defect type of the object to be detected based on the defect detection standard corresponding to the object to be detected and the image information of the object to be detected, the control method further includes:

clustering the targets to be detected with the same defect type according to the determined defect type of the target to be detected to obtain a target classification result;

and placing the targets to be detected corresponding to the same target classification result into the same target container according to the target classification result.

In a possible implementation manner, after determining the defect type of the object to be detected based on the defect detection standard corresponding to the object to be detected and the image information of the object to be detected, the control method further includes:

and counting the target number and the target percentage of the target to be detected corresponding to each defect type based on the determined defect type of the target to be detected.

In a possible implementation manner, the acquiring images of the to-be-detected surface of the to-be-detected object at each station, and determining the image information of each to-be-detected object includes:

acquiring a plurality of preset first image acquisition positions, wherein the first image acquisition positions correspond to the targets to be detected one by one;

driving an image acquisition device to adjust the position, and controlling the image acquisition device to acquire an image of the to-be-detected surface of the to-be-detected target when the image acquisition device passes through any one first image acquisition position; or controlling the position of the target to be detected to be adjusted, and controlling the image acquisition device to acquire an image of the surface to be detected of the target to be detected when the target to be detected passes through any one of the first image acquisition positions;

and determining the image information of each target to be detected based on the image acquisition result.

In a possible implementation manner, the acquiring images of the to-be-detected surface of the to-be-detected object at each station, and determining the image information of each to-be-detected object includes:

acquiring a plurality of preset second image acquisition positions, wherein the second image acquisition positions correspond to the targets to be detected one by one;

when the image acquisition device and the target to be detected move to any one second image acquisition position, the image acquisition device and the target to be detected are relatively static, and the image acquisition device is controlled to acquire an image of the surface to be detected of the target to be detected;

and determining the image information of each target to be detected based on the image acquisition result.

In a possible implementation manner, the determining the defect type of the target to be detected based on the defect detection standard corresponding to the target to be detected and the image information of the target to be detected includes:

extracting characteristic information of the target to be detected from the image information;

and comparing the characteristic information with a defect detection standard corresponding to the target to be detected to obtain the defect type of the target to be detected.

In a second aspect, an embodiment of the present application provides a control apparatus for defect detection, where the control apparatus includes:

the standard acquisition module is used for acquiring a defect detection standard corresponding to each target to be detected based on the target to be detected on each station;

the image determining module is used for acquiring images of the to-be-detected surface of the to-be-detected target on each station and determining the image information of each to-be-detected target;

and the defect determining module is used for determining the defect type of the target to be detected based on the defect detection standard corresponding to the target to be detected and the image information of the target to be detected.

In a possible implementation manner, before the standard obtaining module is configured to obtain, based on the targets to be detected on each station, the defect detection standard corresponding to each target to be detected, the control device further includes:

the type determining module is used for determining the detection type corresponding to each target to be detected;

and the standard determining module is used for determining the defect detection standard corresponding to each target to be detected from the defect type database based on the detection type corresponding to each target to be detected.

In a possible implementation manner, after the defect determining module is configured to determine the defect type of the object to be detected based on the defect detection standard corresponding to the object to be detected and the image information of the object to be detected, the control device further includes:

the result determining module is used for clustering the targets to be detected with the same defect type according to the determined defect type of the target to be detected to obtain a target classification result;

and the target execution module is used for placing the targets to be detected corresponding to the same target classification result into the same target container according to the target classification result.

In a possible implementation manner, after the defect determining module is configured to determine the defect type of the object to be detected based on the defect detection standard corresponding to the object to be detected and the image information of the object to be detected, the control device further includes:

and the quantity counting module is used for counting the quantity and the target percentage of the target to be detected corresponding to each defect type based on the determined defect type of the target to be detected.

In a possible embodiment, when the image determining module is used for performing image acquisition on the to-be-detected surface of the to-be-detected target at each station and determining the image information of each to-be-detected target, the image determining module is configured to:

acquiring a plurality of preset first image acquisition positions, wherein the first image acquisition positions correspond to the targets to be detected one by one;

driving an image acquisition device to adjust the position, and controlling the image acquisition device to acquire an image of the to-be-detected surface of the to-be-detected target when the image acquisition device passes through any one first image acquisition position; or controlling the position of the target to be detected to be adjusted, and controlling the image acquisition device to acquire an image of the surface to be detected of the target to be detected when the target to be detected passes through any one of the first image acquisition positions;

and determining the image information of each target to be detected based on the image acquisition result.

In a possible embodiment, when the image determining module is used for performing image acquisition on the to-be-detected surface of the to-be-detected target at each station and determining the image information of each to-be-detected target, the image determining module is configured to:

acquiring a plurality of preset second image acquisition positions, wherein the second image acquisition positions correspond to the targets to be detected one by one;

when the image acquisition device and the target to be detected move to any one second image acquisition position, the image acquisition device and the target to be detected are relatively static, and the image acquisition device is controlled to acquire an image of the surface to be detected of the target to be detected;

and determining the image information of each target to be detected based on the image acquisition result.

In a possible implementation manner, when the defect determining module is configured to determine the defect type of the object to be detected based on the defect detection standard corresponding to the object to be detected and the image information of the object to be detected, the defect determining module is configured to:

extracting characteristic information of the target to be detected from the image information;

and comparing the characteristic information with a defect detection standard corresponding to the target to be detected to obtain the defect type of the target to be detected.

In a third aspect, an embodiment of the present application further provides a defect detection control system, where the control system includes an image acquisition device and the control device of the second aspect;

the control device is used for acquiring a defect detection standard corresponding to each target to be detected on the basis of the target to be detected on each station, acquiring an image of a surface to be detected of the target to be detected on each station, determining image information of each target to be detected, and determining the defect type of the target to be detected on the basis of the defect detection standard corresponding to the target to be detected and the image information of the target to be detected;

the image acquisition device is used for acquiring images of the to-be-detected surface of the to-be-detected target on each station and determining the image information of each to-be-detected target.

In a fourth aspect, an embodiment of the present application further provides an electronic device, including: a processor, a memory and a bus, wherein the memory stores machine-readable instructions executable by the processor, the processor and the memory communicate with each other through the bus when the electronic device runs, and the machine-readable instructions are executed by the processor to perform the steps of the defect detection control method according to the first aspect or any one of the possible implementation manners of the first aspect.

In a fifth aspect, the present application further provides a computer-readable storage medium, where a computer program is stored on the computer-readable storage medium, and when the computer program is executed by a processor, the method for controlling defect detection in the first aspect or any one of the possible implementation manners of the first aspect is performed.

The embodiment of the application provides a defect detection control method, a control device and a control system, wherein the control method comprises the steps of firstly obtaining a defect detection standard corresponding to each target to be detected based on the target to be detected on each station, then carrying out image acquisition on a surface to be detected of the target to be detected on each station, determining image information of each target to be detected, and finally determining the defect type of the target to be detected based on the defect detection standard corresponding to the target to be detected and the image information of the target to be detected. Therefore, the defect type of the material can be automatically obtained by analyzing the image information of the material according to the defect detection standard, the visual damage of strong light to quality inspection personnel is avoided, the unification of the detection standard is ensured, the operation efficiency is improved, and the whole operation process is more intelligent.

In order to make the aforementioned objects, features and advantages of the present application more comprehensible, preferred embodiments accompanied with figures are described in detail below.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are required to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present application and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained from the drawings without inventive effort.

Fig. 1 is a flowchart of a defect detection control method according to an embodiment of the present application;

fig. 2 is a schematic structural diagram of a defect detection control apparatus according to an embodiment of the present disclosure;

fig. 3 is a second schematic structural diagram of a defect detection control apparatus according to an embodiment of the present application;

fig. 4 is a schematic structural diagram of a control system for defect detection according to an embodiment of the present disclosure;

fig. 5 is a schematic structural diagram of an electronic device according to an embodiment of the present application.

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all the embodiments. The components of the embodiments of the present application, generally described and illustrated in the figures herein, can be arranged and designed in a wide variety of different configurations. Thus, the following detailed description of the embodiments of the present application, presented in the accompanying drawings, is not intended to limit the scope of the claimed application, but is merely representative of selected embodiments of the application. Every other embodiment that can be obtained by a person skilled in the art without making creative efforts based on the embodiments of the present application falls within the protection scope of the present application.

To enable one skilled in the art to utilize the present disclosure, the following embodiments are presented in conjunction with a specific application scenario, "defect detection of a workpiece," it should be apparent to one skilled in the art that the general principles defined herein may be applied to other embodiments and application scenarios without departing from the spirit and scope of the present disclosure.

Referring to fig. 1, fig. 1 is a flowchart illustrating a defect detection control method according to an embodiment of the present disclosure. As shown in fig. 1, a control method for defect detection provided in the embodiment of the present application is applied to a control device in a control system for defect detection, and includes the following steps:

s101, acquiring defect detection standards corresponding to the targets to be detected on each station.

The embodiment of the application is applied in the control field that carousel formula multistation appearance imperfections detected, evenly is equipped with a plurality of stations at the outward flange of carousel, places the carrier on every station, and the carrier is used for placing the target of waiting to detect, should wait to detect the target and wait to detect the material, contrast the defect detection standard, treat to detect the material and carry out the defect detection. Specifically, the carousel can rotate, and then drives the carrier on the carousel and alternate the position between different stations, makes the material that detects on the carrier can alternate the position along with the carrier.

In this step, the defect types of the material to be detected include: the printing ink comprises a water leakage prevention groove, electroplating of the water prevention groove, scratching of the top surface/side surface, pressing damage, heterochrosis, overflating, notches of a glass surface, knife lines, foreign matters, incomplete grinding, burrs, dirt, missing printing, wrong printing, material mixing, poor code printing and the like.

Specifically, within the detectable range of the system, the defect detection standards of different materials to be detected can be freely defined, and each defect detection standard can be configured into a file. When a certain material to be detected needs to be detected, the number and the name of the material can be directly selected, and the system can detect the material to be detected according to a uniform defect detection standard. When a new material to be detected needs to be detected, the defect type can be configured on the operation interface of the display, the defect detection standard can be defined, an excel file can be directly made according to the defect detection standard and the specified format, and the excel file can be directly imported into the system, so that the method is flexible and convenient.

S102, image acquisition is carried out on the to-be-detected surface of the to-be-detected target on each station, and image information of each to-be-detected target is determined.

In this step, image acquisition is performed on the to-be-detected surface of the to-be-detected target on each station through an image acquisition device, the image acquisition device in the embodiment of the application is an industrial camera, and the to-be-detected surface of the to-be-detected target is photographed through the industrial camera, so that image information of the to-be-detected target is obtained.

The shooting means can adopt flying shooting or still shooting.

Specifically, the control system can be freely configured with the shooting times on each station, can be randomly set according to actual needs, and can automatically calculate the shooting position point of the trigger camera and control the camera to shoot. Meanwhile, the total photographing time of each station can be freely set, and the system automatically calculates and controls the moving speed of the camera or the rotating speed of the material to be detected.

Furthermore, the control system can freely set a photographing trigger starting point (namely the angle or position of the camera at each station for the first time) of the first to-be-detected material or the photographing trigger starting point of the first to-be-detected material at each station according to the difference or difference of the actual structure, the material size and the camera vision field, and the photographing position of the second to-be-detected material at each station, the control system automatically calculates and obtains, and when the equipment runs, the equipment can automatically photograph at the corresponding position of the to-be-detected material.

Like this, this application embodiment can arrange wantonly and make up according to actual need, like station quantity, each station material number, the number of times of shooing, the time of shooing etc. only need set up the position of shooing of the first material of each station, and the system can the automatic calculation other materials the position of shooing to the automatic increase compensation volume of flying to shoot according to the functioning speed of each station. The photographing time of each station can be set, the system automatically calculates the photographing speed, the equipment is convenient to be butted with other process equipment, and the equipment is kept consistent with the production takt of other processes.

For example, in the station 1, when the material to be detected passes horizontally above the camera, the camera takes a picture of the movement below the material to be detected; the No. 2 station is that the stepping motor pushes the material to be detected to rotate for 360 degrees through the connecting rod, and the side surface of the material to be detected is photographed in the rotating process of the material to be detected; the station 2 can also only photograph one side of the side surface of the material to be detected; no. 3 station is that servo motor drives the camera and makes horizontal migration, makes the camera treat the material that detects and shoot above waiting to detect the material moving process. No. 4 station and No. 5 station are similar, are applicable to multirow material, and the quantity of multiplicable carrier bearing material improves the productivity.

S103, determining the defect type of the target to be detected based on the defect detection standard corresponding to the target to be detected and the image information of the target to be detected.

In the step, feature information is extracted from the image information of the target to be detected, the feature information is related to the defect feature of the target to be detected, and the defect type of the target to be detected can be obtained by comparing the extracted feature information with the defect detection standard corresponding to the target to be detected.

Here, the defect type of the object to be detected is a specific defect such as a heterochromatic color, a knife line, a foreign substance, a burr, a stain, missing printing, a mixed material, a code printing failure, or the like.

The embodiment of the application provides a defect detection control method, which includes the steps of acquiring a defect detection standard corresponding to each target to be detected based on the target to be detected on each station, then carrying out image acquisition on a surface to be detected of the target to be detected on each station, determining image information of each target to be detected, and finally determining the defect type of the target to be detected based on the defect detection standard corresponding to the target to be detected and the image information of the target to be detected. Therefore, the defect type of the material can be automatically obtained by analyzing the image information of the material according to the defect detection standard, the visual damage of strong light to quality inspection personnel is avoided, the unification of the detection standard is ensured, the operation efficiency is improved, and the whole operation process is more intelligent.

In this embodiment of the present application, before step S101, the control method further includes:

determining a detection type corresponding to each target to be detected;

and determining a defect detection standard corresponding to each target to be detected from a defect type database based on the detection type corresponding to each target to be detected.

In the step, the defect type information of a plurality of materials is stored in a defect type database, the detection type corresponding to the target to be detected is firstly determined, the detection type of the target to be detected is predetermined according to the characteristics of the material to be detected, and then the defect detection standard corresponding to the detection type of the target to be detected is found from the defect type database.

In this embodiment of the present application, after step S103, the control method further includes:

clustering the targets to be detected with the same defect type according to the determined defect type of the target to be detected to obtain a target classification result;

and placing the targets to be detected corresponding to the same target classification result into the same target container according to the target classification result.

In the step, the targets to be detected with the same defect type are clustered, one type of target to be detected is determined as a target classification result, and then the targets to be detected corresponding to the same target classification result are placed into the same target container according to the target classification result.

In this embodiment of the present application, after step S103, the control method further includes:

and counting the target number and the target percentage of the target to be detected corresponding to each defect type based on the determined defect type of the target to be detected.

In the step, the total number of all targets to be detected is counted, then the number of the targets to be detected corresponding to each defect type is counted based on the determined defect type of the target to be detected, and finally the target percentage corresponding to each defect type is calculated based on the total number and the target number.

Therefore, the defect types of each target to be detected are counted, and different defect types are analyzed and judged in degree, so that process personnel can perform process analysis and improvement on product defects in a targeted manner, the yield is improved, and the rejection rate is reduced. Furthermore, the type and the number of each defect and the defect degree are automatically counted on line, so that the process can be improved, the production structure and the production flow of the product can be optimized, and the production period can be shortened.

In addition, all the stations can be automatically restored after the target number and the target percentage of the target to be detected corresponding to each defect type are counted based on the determined defect type of the target to be detected.

The method comprises the following specific steps: according to the embodiment of the application, the whole machine can be automatically restored to the original point by one key, and the system can automatically avoid mutual interference of all structures and prevent mutual collision and damage to equipment parts. When the recovery is successful, the system gives a state prompt message and serves as a starting condition for automatic and continuous running of the equipment. When recovery fails, the system can automatically prompt the reason, the specific position, the processing method and the measures of the failure.

After the control system is started, the equipment is fed through a feeding machine or a previous process section production line, after the feeding is finished, the equipment starts to operate, the materials are made to flow among different stations, the feeding machine can feed once every time the materials flow, and the whole detection process is made to be continuous and continuous. The materials are circulated to different stations, the control system controls the operation of a motor of the station and a camera to shoot, the material pictures are collected, the collected material pictures are transmitted to image processing software to be analyzed and processed, each material is labeled and classified according to the processing result, the classification type result is butted with the blanking machine, and the blanking machine is enabled to take and place the materials into corresponding material boxes or automatically flow into lower process flow lines of corresponding types according to the classification types of the materials. The equipment automatically operates according to a control program, controls, calculates and displays the operation mode and the system state of the equipment in real time, and triggers each executing mechanism to act, such as CCD (charge coupled device) photographing, motor operation control, motor current position display, motor current rotating speed, material type quantity, detected total quantity, capacity efficiency and the like.

And (3) automatically circulating the program, when no material is fed for 5 minutes (which can be freely set) continuously on the turntable, automatically stopping the equipment, flashing a yellow lamp and sounding a buzzer to indicate that all materials are detected completely and no new material enters for a long time, and closing part of actuating mechanisms, so that the energy is saved and the consumption is reduced.

In the embodiment of the present application, as a preferred embodiment, step S102 includes: acquiring a plurality of preset first image acquisition positions, wherein the first image acquisition positions correspond to the targets to be detected one by one; driving an image acquisition device to adjust the position, and controlling the image acquisition device to acquire an image of the to-be-detected surface of the to-be-detected target when the image acquisition device passes through any one first image acquisition position; or controlling the position of the target to be detected to be adjusted, and controlling the image acquisition device to acquire an image of the surface to be detected of the target to be detected when the target to be detected passes through any one of the first image acquisition positions; and determining the image information of each target to be detected based on the image acquisition result.

In this step, when taking a picture of the target to be detected by the flying photography, the position of the image acquisition device may be adjusted, or the position of the target to be detected may be adjusted, and the adjustment position in the embodiment of the present application is a rotational motion. When the image acquisition device rotates, the image acquisition device acquires an image of a to-be-detected surface of a to-be-detected target every time the image acquisition device passes through a first image acquisition position; when the target to be detected rotates and passes through the first image acquisition position, the image acquisition device also acquires an image of the surface to be detected of the target to be detected.

In order to improve operation detection efficiency, this application embodiment adopts to fly to clap and touches formula, and the camera is moving the in-process or wait to detect the material when rotatory promptly, treats to detect the material and shoots. Because the scanning execution time of the control system, the response delay of the execution mechanism and the like can influence the actual photographing position (for example, the light source has a certain delay from the receiving of the lighting signal to the actual lighting), the system can automatically calculate according to the situation to obtain the moving speed or the material rotating speed of the camera, and automatically calculate the position compensation quantity for lighting the light source and triggering the camera to photograph, and the compensation quantity plus the automatically calculated photographing position value is the actual position when each station performs the aerial photography in the operation process of the equipment.

In the embodiment of the present application, as a preferred embodiment, step S102 includes: acquiring a plurality of preset second image acquisition positions, wherein the second image acquisition positions correspond to the targets to be detected one by one; when the image acquisition device and the target to be detected move to any one second image acquisition position, the image acquisition device and the target to be detected are relatively static, and the image acquisition device is controlled to acquire an image of the surface to be detected of the target to be detected; and determining the image information of each target to be detected based on the image acquisition result.

In this step, when the still photography mode is adopted to photograph the target to be detected, the image acquisition device needs to keep the image acquisition device and the target to be detected relatively still when acquiring the image information of the surface to be detected of the target to be detected.

Furthermore, according to actual need (if gather material image not clear, have the smear etc. when flying to shoot), adopt the still mode of shooing, stop moving (or material rotation stops after certain angle) when moving each material position department promptly, the back stops, and the control camera is shot the material, and this material is shot the back, continues to move next material department or take a picture after rotating certain angle, and the material is all shot the completion until this station. In the still shooting mode, the shooting position point of each material is the position point automatically calculated and obtained by the system, wherein the position point does not need to be compensated like the flying shooting mode.

In the embodiment of the present application, as a preferred embodiment, step S103 includes: extracting characteristic information of the target to be detected from the image information; and comparing the characteristic information with a defect detection standard corresponding to the target to be detected to obtain the defect type of the target to be detected.

The embodiment of the application provides a defect detection control method, which includes the steps of acquiring a defect detection standard corresponding to each target to be detected based on the target to be detected on each station, then carrying out image acquisition on a surface to be detected of the target to be detected on each station, determining image information of each target to be detected, and finally determining the defect type of the target to be detected based on the defect detection standard corresponding to the target to be detected and the image information of the target to be detected. Therefore, the defect type of the material can be automatically obtained by analyzing the image information of the material according to the defect detection standard, the visual damage of strong light to quality inspection personnel is avoided, the unification of the detection standard is ensured, the operation efficiency is improved, and the whole operation process is more intelligent.

Based on the same application concept, the embodiment of the present application further provides a defect detection control device corresponding to the defect detection control method provided in the above embodiment, and since the principle of solving the problem of the device in the embodiment of the present application is similar to that of the defect detection control method in the above embodiment of the present application, the implementation of the device may refer to the implementation of the method, and repeated details are not described herein.

Referring to fig. 2 and fig. 3, fig. 2 is a schematic structural diagram of a defect detection control apparatus according to an embodiment of the present application, and fig. 3 is a second schematic structural diagram of a defect detection control apparatus according to an embodiment of the present application, wherein, as shown in fig. 2, the defectdetection control apparatus 200 includes:

thestandard acquisition module 201 is used for acquiring a defect detection standard corresponding to each target to be detected based on the target to be detected on each station;

theimage determining module 202 is configured to perform image acquisition on a to-be-detected surface of each to-be-detected target on each station, and determine image information of each to-be-detected target;

and thedefect determining module 203 is configured to determine the defect type of the target to be detected based on the defect detection standard corresponding to the target to be detected and the image information of the target to be detected.

Further, as shown in fig. 3, before the standard obtainingmodule 201 is configured to obtain the defect detection standard corresponding to each target to be detected based on the target to be detected on each station, thecontrol device 200 further includes:

atype determining module 204, configured to determine a detection type corresponding to each target to be detected;

and the standard determiningmodule 205 is configured to determine, based on the detection type corresponding to each target to be detected, a defect detection standard corresponding to each target to be detected from a defect type database.

In a possible implementation manner, after thedefect determining module 203 is configured to determine the defect type of the object to be detected based on the defect detection standard corresponding to the object to be detected and the image information of the object to be detected, thecontrol apparatus 200 further includes:

theresult determining module 206 is configured to cluster the to-be-detected targets with the same defect type according to the determined defect type of the to-be-detected target, so as to obtain a target classification result;

and thetarget execution module 207 is configured to put the to-be-detected targets corresponding to the same target classification result into the same target container according to the target classification result.

In a possible implementation manner, after thedefect determining module 203 is configured to determine the defect type of the object to be detected based on the defect detection standard corresponding to the object to be detected and the image information of the object to be detected, thecontrol apparatus 200 further includes:

and thequantity counting module 208 is configured to count the quantity and percentage of the targets to be detected corresponding to each defect type based on the determined defect type of the target to be detected.

In a possible implementation manner, when theimage determining module 202 is configured to perform image acquisition on a to-be-detected surface of an object to be detected on each station, and determine image information of each object to be detected, theimage determining module 202 is configured to:

acquiring a plurality of preset first image acquisition positions, wherein the first image acquisition positions correspond to the targets to be detected one by one;

driving an image acquisition device to adjust the position, and controlling the image acquisition device to acquire an image of the to-be-detected surface of the to-be-detected target when the image acquisition device passes through any one first image acquisition position; or controlling the position of the target to be detected to be adjusted, and controlling the image acquisition device to acquire an image of the surface to be detected of the target to be detected when the target to be detected passes through any one of the first image acquisition positions;

and determining the image information of each target to be detected based on the image acquisition result.

In a possible implementation manner, when theimage determining module 202 is configured to perform image acquisition on a to-be-detected surface of an object to be detected on each station, and determine image information of each object to be detected, theimage determining module 202 is configured to:

acquiring a plurality of preset second image acquisition positions, wherein the second image acquisition positions correspond to the targets to be detected one by one;

when the image acquisition device and the target to be detected move to any one second image acquisition position, the image acquisition device and the target to be detected are relatively static, and the image acquisition device is controlled to acquire an image of the surface to be detected of the target to be detected;

and determining the image information of each target to be detected based on the image acquisition result.

In a possible implementation manner, when thedefect determining module 203 is configured to determine the defect type of the object to be detected based on the defect detection standard corresponding to the object to be detected and the image information of the object to be detected, thedefect determining module 203 is configured to:

extracting characteristic information of the target to be detected from the image information;

and comparing the characteristic information with a defect detection standard corresponding to the target to be detected to obtain the defect type of the target to be detected.

The control device for defect detection provided by the embodiment of the application comprises a standard acquisition module, an image determination module and a defect determination module, wherein the standard acquisition module is used for acquiring a defect detection standard corresponding to each target to be detected based on the target to be detected on each station; the image determining module is used for acquiring images of the to-be-detected surface of the to-be-detected target on each station and determining image information of each to-be-detected target; the defect determining module is used for determining the defect type of the target to be detected based on the defect detection standard corresponding to the target to be detected and the image information of the target to be detected. Therefore, the defect type of the material can be automatically obtained by analyzing the image information of the material according to the defect detection standard, the visual damage of strong light to quality inspection personnel is avoided, the unification of the detection standard is ensured, the operation efficiency is improved, and the whole operation process is more intelligent.

Referring to fig. 4, fig. 4 is a schematic structural diagram of a defect detection control system according to an embodiment of the present disclosure. As shown in fig. 4, the control system includes acontrol device 200 and animage capturing device 400;

thecontrol device 200 is configured to acquire a defect detection standard corresponding to each target to be detected based on the target to be detected on each station, perform image acquisition on a surface to be detected of the target to be detected on each station, determine image information of each target to be detected, and determine a defect type of the target to be detected based on the defect detection standard corresponding to the target to be detected and the image information of the target to be detected;

theimage acquisition device 400 is configured to acquire an image of a to-be-detected surface of each to-be-detected target at each station, and determine image information of each to-be-detected target.

The control system in the embodiment of the application adopts the industrial camera to photograph the material to be detected, analyzes and judges whether the material has defects, the types of the defects, the degree of the defects and the like by using the material picture, and avoids the damage of strong light to human eyes. Meanwhile, the judgment standards are kept consistent, the continuity and stability of the detection process are improved, the productivity is improved, and the labor cost of enterprises is greatly reduced.

The method comprises the following specific steps: the control system in the embodiment of the application mainly comprises an industrial personal computer, a display, a Programmable Logic Controller (PLC), a motor, a servo driver, a servo motor, a stepping driver, a stepping motor, a sensor, a light source Controller, a light source, an industrial camera, a lens, an emergency stop button, a tri-color lamp and the like, wherein all the components are connected through wires and cables. In the embodiment of the present application, the image acquisition device is an industrial camera, and the control device is a PLC.

The specific functions and functions are as follows: the sensor is used for detecting the original point and limit protection of each station module, whether the photographing operation is in place or not and the like; the PLC is used for overall control and state recognition of the whole machine, and specifically comprises receiving an ON/OFF signal of a sensor, preventing collision and judging whether the automatic production conditions are met; controlling the motor and the turntable to rotate so that the position of the material is changed; controlling a servo driver and a servo motor to rotate, driving a camera to move horizontally, and controlling the camera to take pictures above or below different materials; controlling a stepping driver and a stepping motor to rotate, driving the material to rotate, and controlling a camera to take a picture of the side wall of the material by 360 degrees; controlling the light source controller and the CCD camera to take a picture; the equipment state is monitored in real time, so that production personnel can conveniently master the equipment state; alarming abnormal operation, prompting potential risks and prompting a solution; sorting the material judgment result, butting a blanking machine, a robot or the next process flow and the like. The light source controller and the light source are used for receiving signals sent by the PLC and lightening the stroboscopic light source; the industrial camera and the lens are used for acquiring clear material images; the motor driver and the motor are used for driving the turntable to rotate so as to enable the material to change the position of the station; the servo driver and the motor are used for driving the module to move so as to enable the camera to move synchronously; the stepping driver and the motor are used for driving the material to rotate for 360 degrees; the industrial personal computer and the display are used for image display and workpiece attribute (defect type, degree and the like) judgment, classification and statistics.

The control system in this application embodiment passes through the rotation of PLC control motor, and then the drive carousel rotates, makes the carrier that bears the weight of the material on the carousel change the position between different stations, makes to wait to detect the material and remove to corresponding station department. And the PLC drives the corresponding station motor to rotate, so that the camera moves and performs fly-shoot photographing or still photographing on the material to be detected, or the material to be detected rotates and controls the camera to perform fly-shoot photographing or still photographing on the material.

The control system of defect detection that this application embodiment provided, including controlling means and image acquisition device, and then, carry out the defect type that analysis can obtain the material automatically to the image information of material according to the defect detection standard, avoided the highlight to quality testing personnel's visual damage, guaranteed the stability of testing result, improved the operating efficiency for whole operation process is more intelligent. The control system in the embodiment of the application replaces manual detection with an advanced, efficient and intelligent automatic control mode, can freely select the defect types and switch the detection control mode at will according to different defect types, different damage degrees, different precision requirements and different productivity requirements corresponding to the client products, and can quickly construct an online real-time detection control system meeting the self requirements. The control system can be matched with a feeding and discharging device to carry out high-speed defect detection, and can also be directly embedded into a material production processing line to directly connect the upper end and the lower end technological processes.

Referring to fig. 5, fig. 5 is a schematic structural diagram of an electronic device according to an embodiment of the present disclosure, including: a processor 501, a memory 502 and a bus 503, wherein the memory 502 stores machine-readable instructions executable by the processor 501, when the electronic device 500 is running, the processor 501 and the memory 502 communicate via the bus 503, and the machine-readable instructions are executed by the processor 501 to perform the steps of the method for controlling defect detection as described in fig. 1.

The embodiment of the present application further provides a computer-readable storage medium, on which a computer program is stored, where the computer program is executed by a processor to perform the steps of the defect detection control method as described in fig. 1.

It is clear to those skilled in the art that, for convenience and brevity of description, the specific working processes of the system and the apparatus described above may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again.

In the several embodiments provided in the present application, it should be understood that the disclosed system, apparatus and method may be implemented in other ways. The above-described embodiments of the apparatus are merely illustrative, and for example, the division of the units is only one logical division, and there may be other divisions when actually implemented, and for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection of devices or units through some communication interfaces, and may be in an electrical, mechanical or other form.

The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.

In addition, functional units in the embodiments of the present application may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit.

The functions, if implemented in the form of software functional units and sold or used as a stand-alone product, may be stored in a non-volatile computer-readable storage medium executable by a processor. Based on such understanding, the technical solutions of the present application may be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the methods described in the embodiments of the present application. And the aforementioned storage medium includes: various media capable of storing program codes, such as a usb disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk, or an optical disk.

The above description is only for the specific embodiments of the present application, but the scope of the present application is not limited thereto, and any person skilled in the art can easily conceive of the changes or substitutions within the technical scope of the present application, and shall be covered by the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.

Claims (11)

1. A control method of defect detection, the control method comprising:

acquiring a defect detection standard corresponding to each target to be detected on the basis of the target to be detected on each station;

acquiring images of the to-be-detected surface of the to-be-detected target on each station, and determining image information of each to-be-detected target;

and determining the defect type of the target to be detected based on the defect detection standard corresponding to the target to be detected and the image information of the target to be detected.

2. The control method according to claim 1, wherein before the obtaining of the defect detection standard corresponding to each target to be detected based on the target to be detected on each station, the control method further comprises:

determining a detection type corresponding to each target to be detected;

and determining a defect detection standard corresponding to each target to be detected from a defect type database based on the detection type corresponding to each target to be detected.

3. The control method according to claim 1, wherein after determining the defect type of the object to be detected based on the defect detection standard corresponding to the object to be detected and the image information of the object to be detected, the control method further comprises:

clustering the targets to be detected with the same defect type according to the determined defect type of the target to be detected to obtain a target classification result;

and placing the targets to be detected corresponding to the same target classification result into the same target container according to the target classification result.

4. The control method according to claim 1, wherein after determining the defect type of the object to be detected based on the defect detection standard corresponding to the object to be detected and the image information of the object to be detected, the control method further comprises:

and counting the target number and the target percentage of the target to be detected corresponding to each defect type based on the determined defect type of the target to be detected.

5. The control method according to claim 1, wherein the image acquisition of the to-be-detected surface of the to-be-detected object at each station to determine the image information of each to-be-detected object comprises:

acquiring a plurality of preset first image acquisition positions, wherein the first image acquisition positions correspond to the targets to be detected one by one;

driving an image acquisition device to adjust the position, and controlling the image acquisition device to acquire an image of the to-be-detected surface of the to-be-detected target when the image acquisition device passes through any one first image acquisition position; or controlling the position of the target to be detected to be adjusted, and controlling the image acquisition device to acquire an image of the surface to be detected of the target to be detected when the target to be detected passes through any one of the first image acquisition positions;

and determining the image information of each target to be detected based on the image acquisition result.

6. The control method according to claim 1, wherein the image acquisition of the to-be-detected surface of the to-be-detected object at each station to determine the image information of each to-be-detected object comprises:

acquiring a plurality of preset second image acquisition positions, wherein the second image acquisition positions correspond to the targets to be detected one by one;

when the image acquisition device and the target to be detected move to any one second image acquisition position, the image acquisition device and the target to be detected are relatively static, and the image acquisition device is controlled to acquire an image of the surface to be detected of the target to be detected;

and determining the image information of each target to be detected based on the image acquisition result.

7. The control method according to claim 1, wherein the determining the defect type of the object to be detected based on the defect detection standard corresponding to the object to be detected and the image information of the object to be detected comprises:

extracting characteristic information of the target to be detected from the image information;

and comparing the characteristic information with a defect detection standard corresponding to the target to be detected to obtain the defect type of the target to be detected.

8. A control apparatus for defect detection, the control apparatus comprising:

the standard acquisition module is used for acquiring a defect detection standard corresponding to each target to be detected based on the target to be detected on each station;

the image determining module is used for acquiring images of the to-be-detected surface of the to-be-detected target on each station and determining the image information of each to-be-detected target;

and the defect determining module is used for determining the defect type of the target to be detected based on the defect detection standard corresponding to the target to be detected and the image information of the target to be detected.

9. A control system for defect detection, the control system comprising an image acquisition device and a control device for defect detection according to claim 8;

the control device is used for acquiring a defect detection standard corresponding to each target to be detected on the basis of the target to be detected on each station, acquiring an image of a surface to be detected of the target to be detected on each station, determining image information of each target to be detected, and determining the defect type of the target to be detected on the basis of the defect detection standard corresponding to the target to be detected and the image information of the target to be detected;

the image acquisition device is used for acquiring images of the to-be-detected surface of the to-be-detected target on each station and determining the image information of each to-be-detected target.

10. An electronic device, comprising: a processor, a memory and a bus, the memory storing machine-readable instructions executable by the processor, the processor and the memory communicating via the bus when the electronic device is operating, the machine-readable instructions being executable by the processor to perform the steps of the method of controlling defect detection according to any one of claims 1 to 7.

11. A computer-readable storage medium, characterized in that a computer program is stored on the computer-readable storage medium, which computer program, when being executed by a processor, performs the steps of the method of controlling defect detection according to any one of claims 1 to 7.

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