CN111880076B - A signal test point detection method, system and related components - Google Patents
A signal test point detection method, system and related componentsDownload PDFInfo
- Publication number
- CN111880076B CN111880076BCN202010674399.7ACN202010674399ACN111880076BCN 111880076 BCN111880076 BCN 111880076BCN 202010674399 ACN202010674399 ACN 202010674399ACN 111880076 BCN111880076 BCN 111880076B
- Authority
- CN
- China
- Prior art keywords
- information
- signal
- test
- signal line
- receiving end
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
- G01R31/2813—Checking the presence, location, orientation or value, e.g. resistance, of components or conductors
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2803—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] by means of functional tests, e.g. logic-circuit-simulation or algorithms therefor
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
Description
Translated fromChinese技术领域technical field
本申请涉及信号检测领域，特别涉及一种信号测试点检测方法、系统及相关组件。The present application relates to the field of signal detection, in particular to a signal test point detection method, system and related components.
背景技术Background technique
在服务器、存储器等研发中，为保证硬件系统正常运行，信号测试是必不可少的一环。但是某些情况信号测试无法进行，比如某些需要示波器进行点测的信号，PCB(PrintedCircuit Board，印制电路板)上如果走线和芯片设计在了同一层，没有打换层过孔也没有在走线上添加测试点的，那么示波器就无法点测。基于此，需要人工汇总需要示波器进行点测的信号，并在信号线上确定测点，根据SI的要求进行PCB设计，但是考虑到由于添加测点会降低信号完整性性能，且添加测点的位置可能需要多次尝试以满足实际工程需要，人工设计及检查繁琐且会有遗漏出现，降低测试效率及可靠性。In the research and development of servers, storage, etc., signal testing is an essential part to ensure the normal operation of hardware systems. But in some cases, the signal test cannot be carried out, such as some signals that need to be measured by an oscilloscope. If a test point is added to the trace, the oscilloscope will not be able to spot-test. Based on this, it is necessary to manually summarize the signals that need to be measured by an oscilloscope, and determine the measurement points on the signal line, and carry out PCB design according to the requirements of SI. However, considering that adding measurement points will reduce the signal integrity performance, and adding measurement points The location may require multiple attempts to meet the actual engineering needs. Manual design and inspection are cumbersome and there will be omissions, which will reduce the test efficiency and reliability.
因此，如何提供一种解决上述技术问题的方案是本领域技术人员目前需要解决的问题。Therefore, how to provide a solution to the above technical problems is a problem that those skilled in the art need to solve at present.
发明内容Contents of the invention
本申请的目的是提供一种信号测试点检测方法、系统、电子设备及计算机可读存储介质，能够减少对信号完整性性能的影响，且由检测工具完成信号测试点检测，相较于人工检测，可以减少大量工时，提高了检测效率及可靠性。The purpose of this application is to provide a signal test point detection method, system, electronic equipment and computer-readable storage medium, which can reduce the impact on signal integrity performance, and the signal test point detection is completed by detection tools, compared with manual detection , can reduce a lot of man-hours and improve detection efficiency and reliability.
为解决上述技术问题，本申请提供了一种信号测试点检测方法，应用于检测工具，包括：In order to solve the above technical problems, this application provides a signal test point detection method, which is applied to detection tools, including:
获取PCB文件；Get the PCB file;
接收信号线选择指令及SI信息，根据所述信号线选择指令及所述SI信息在所述PCB文件中确定信号线及接收端芯片；receiving a signal line selection instruction and SI information, and determining a signal line and a receiving end chip in the PCB file according to the signal line selection instruction and the SI information;
获取所述信号线的测试信息，根据所述测试信息及测点距离所述接收端芯片的走线长度规范在所述信号线上添加测点。Acquiring the test information of the signal line, and adding a measuring point on the signal line according to the test information and the specification of the trace length of the measuring point from the receiving end chip.
优选的，所述测试信息包括ID信息、连接层面信息、换层过孔信息、测点信息、连接的芯片管脚信息中的一种或多种。Preferably, the test information includes one or more of ID information, connection level information, layer-change via information, measurement point information, and connected chip pin information.
优选的，该信号测试点检测方法还包括：Preferably, the signal test point detection method also includes:
根据所述测试信息和/或所述走线长度规范生成所述信号线的标记信息，并将所述标记信息存储到数据库。Generate marking information of the signal line according to the test information and/or the wiring length specification, and store the marking information in a database.
优选的，所述根据所述测试信息和/或所述走线长度规范生成所述信号线的标记信息的过程具体包括：Preferably, the process of generating the mark information of the signal line according to the test information and/or the trace length specification specifically includes:
当所述换层过孔信息为0，且无测点，生成第一标记；When the layer-changing via hole information is 0 and there is no measuring point, generate a first mark;
当所述换层过孔信息为0，且测点到所述接收端芯片的走线长度大于所述走线长度规范，生成所述第一标记；When the layer-changing via information is 0, and the trace length from the measuring point to the receiving end chip is greater than the trace length specification, generate the first mark;
当所述换层过孔信息不为0、过孔距离所述接收端芯片的走线长度大于所述走线长度规范、且测点到所述接收端芯片的走线长度大于所述走线长度规范，生成所述第一标记。When the layer-changing via information is not 0, the length of the trace from the via to the receiving end chip is greater than the trace length specification, and the trace length from the measuring point to the receiving end chip is greater than the trace A length specification that generates the first token.
优选的，该信号测试点检测方法还包括：Preferably, the signal test point detection method also includes:
显示所有所述第一标记对应的信号线。All the signal lines corresponding to the first marker are displayed.
优选的，该信号测试点检测方法还包括：Preferably, the signal test point detection method also includes:
根据所述接收端芯片的位置确定所述信号线上的测点添加区；determining the measuring point addition area on the signal line according to the position of the receiving end chip;
相应的，所述根据所述测试信息及测点距离所述接收端芯片的走线长度规范在所述信号线上添加测点的过程具体包括：Correspondingly, the process of adding a measuring point on the signal line according to the test information and the distance specification of the measuring point to the receiving end chip's trace length specifically includes:
根据所述测试信息及测点距离所述接收端芯片的走线长度规范在所述测点添加区上添加测点，并更新所述信号线的测试信息。Adding a measuring point in the measuring point addition area according to the test information and the specification of the distance between the measuring point and the wire length of the receiver chip, and updating the test information of the signal line.
优选的，该信号测试点检测方法还包括：Preferably, the signal test point detection method also includes:
生成与所述信号线的检测结果对应的信息。Information corresponding to the detection result of the signal line is generated.
为解决上述技术问题，本申请还提供了一种信号测试点检测系统，应用于检测工具，包括：In order to solve the above technical problems, the present application also provides a signal test point detection system, which is applied to detection tools, including:
获取模块，用于获取PCB文件；Obtain module, used to obtain PCB files;
确定模块，用于接收信号线选择指令及SI信息，根据所述信号线选择指令及所述SI信息在所述PCB文件中确定信号线及接收端芯片；A determining module, configured to receive a signal line selection instruction and SI information, and determine a signal line and a receiving end chip in the PCB file according to the signal line selection instruction and the SI information;
添加模块，用于获取所述信号线的测试信息，根据所述测试信息及测点距离所述接收端芯片的走线长度规范在所述信号线上添加测点。The adding module is used to obtain the test information of the signal line, and add a measuring point on the signal line according to the test information and the specification of the trace length of the measuring point from the receiving end chip.
为解决上述技术问题，本申请还提供了一种电子设备，包括：In order to solve the above technical problems, the present application also provides an electronic device, including:
存储器，用于存储计算机程序；memory for storing computer programs;
处理器，用于执行所述计算机程序时实现如上文任意一项所述的信号测试点检测方法的步骤。A processor, configured to implement the steps of any one of the signal test point detection methods described above when executing the computer program.
为解决上述技术问题，本申请还提供了一种计算机可读存储介质，所述计算机可读存储介质上存储有计算机程序，所述计算机程序被处理器执行时实现如上文任意一项所述的信号测试点检测方法的步骤。In order to solve the above-mentioned technical problems, the present application also provides a computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, it realizes any of the above-mentioned Steps of a signal test point detection method.
本申请提供了一种信号测试点检测方法，首先通过检测工具获取PCB文件，从而确定PCB上所有信号线的信息，保证对信号线测试点检测的全面性，不会出现遗漏现象，然后该检测工具根据信号线选择指令和SI信息确定目标信号线及接收端芯片，在该信号线上按照测点距离接收端芯片的走线长度规范选择测点的位置，减少对信号完整性性能的影响，且由检测工具完成信号测试点检测，相较于人工检测，可以减少大量工时，提高了检测效率及可靠性。本申请还提供了一种信号测试点检测系统、电子设备及计算机可读存储介质，具有和上述信号测试点检测方法相同的有益效果。This application provides a signal test point detection method. Firstly, the PCB file is obtained through the detection tool, so as to determine the information of all signal lines on the PCB, to ensure the comprehensiveness of the signal line test point detection, and no omissions will occur. Then the detection The tool determines the target signal line and the receiving end chip according to the signal line selection instruction and SI information, and selects the position of the measuring point on the signal line according to the trace length specification of the measuring point distance from the receiving end chip to reduce the impact on signal integrity performance. And the signal test point detection is completed by the detection tool, which can reduce a lot of man-hours and improve the detection efficiency and reliability compared with manual detection. The present application also provides a signal test point detection system, electronic equipment, and a computer-readable storage medium, which have the same beneficial effect as the above signal test point detection method.
附图说明Description of drawings
为了更清楚地说明本申请实施例，下面将对实施例中所需要使用的附图做简单的介绍，显而易见地，下面描述中的附图仅仅是本申请的一些实施例，对于本领域普通技术人员来讲，在不付出创造性劳动的前提下，还可以根据这些附图获得其他的附图。In order to illustrate the embodiments of the present application more clearly, the following will briefly introduce the accompanying drawings used in the embodiments. Obviously, the accompanying drawings in the following description are only some embodiments of the present application. As far as people are concerned, other drawings can also be obtained based on these drawings on the premise of not paying creative work.
图1为本申请所提供的一种信号测试点检测方法的步骤流程图；Fig. 1 is the flow chart of the steps of a kind of signal test point detection method provided by the present application;
图2为本申请所提供的一种检测工具显示界面的示意图；FIG. 2 is a schematic diagram of a display interface of a detection tool provided by the present application;
图3为本申请所提供的一种信号测试点检测系统的结构示意图。FIG. 3 is a schematic structural diagram of a signal test point detection system provided by the present application.
具体实施方式Detailed ways
本申请的核心是提供一种信号测试点检测方法、系统、电子设备及计算机可读存储介质，能够减少对信号完整性性能的影响，且由检测工具完成信号测试点检测，相较于人工检测，可以减少大量工时，提高了检测效率及可靠性。The core of this application is to provide a signal test point detection method, system, electronic equipment and computer-readable storage medium, which can reduce the impact on signal integrity performance, and the signal test point detection is completed by detection tools, compared with manual detection , can reduce a lot of man-hours and improve detection efficiency and reliability.
为使本申请实施例的目的、技术方案和优点更加清楚，下面将结合本申请实施例中的附图，对本申请实施例中的技术方案进行清楚、完整地描述，显然，所描述的实施例是本申请一部分实施例，而不是全部的实施例。基于本申请中的实施例，本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例，都属于本申请保护的范围。In order to make the purposes, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments It is a part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.
请参照图1，图1为本申请所提供的一种信号测试点检测方法的步骤流程图，应用于检测工具，该信号测试点检测方法包括：Please refer to Figure 1, Figure 1 is a flow chart of the steps of a signal test point detection method provided by the present application, which is applied to a detection tool, and the signal test point detection method includes:
S101：获取PCB文件；S101: Obtain a PCB file;
S102：接收信号线选择指令及SI(Signal Integrity，信号完整性)信息，根据信号线选择指令及SI信息在PCB文件中确定信号线及接收端芯片；S102: Receive a signal line selection instruction and SI (Signal Integrity, signal integrity) information, and determine the signal line and the receiving end chip in the PCB file according to the signal line selection instruction and SI information;
具体的，当本申请的检测工具运行时，可以获取PCB文件，从而获取该PCB的所有信息，如信号线信息、PCB层面信息、过孔信息等。用户可以输入信号线选择指令，信号线选择指令可以包括信号线对应的关键字，以便检测工具根据关键字过滤出用户选择的信号线，进行后续的检测。当然，信号线选择指令也可以包括完整的信号线名称，检测工具根据完整的信号线名称选择信号线，选择完信号线后，检测工具输出该信号线连接的芯片信息，可以理解的是，每一信号线可以连接一个或多个芯片，在设置测点时，需要分别设置，因此可根据SI信息确定当前的接收端芯片。在确定信号线和接收端芯片后，用户输入测点距离接收端芯片的走线长度规范，以便检测工具在接收到该走线长度规范后进行后续的检测操作。Specifically, when the detection tool of the present application is running, the PCB file can be obtained, so as to obtain all information of the PCB, such as signal line information, PCB layer information, via information, and the like. The user may input a signal line selection instruction, and the signal line selection instruction may include a keyword corresponding to the signal line, so that the detection tool can filter out the signal line selected by the user according to the keyword for subsequent detection. Of course, the signal line selection instruction can also include the complete signal line name, and the detection tool selects the signal line according to the complete signal line name. After the signal line is selected, the detection tool outputs the chip information connected to the signal line. It is understandable that every One signal line can be connected to one or more chips. When setting the measurement points, they need to be set separately, so the current receiving end chip can be determined according to the SI information. After determining the signal line and the receiving end chip, the user inputs the trace length specification of the measuring point from the receiving end chip, so that the detection tool can perform subsequent detection operations after receiving the trace length specification.
S103：获取信号线的测试信息，根据测试信息及测点距离接收端芯片的走线长度规范在信号线上添加测点。S103: Obtain the test information of the signal line, and add a measuring point on the signal line according to the test information and the specification of the trace length between the measuring point and the chip at the receiving end.
具体的，在确定信号线后，获取该信号线的测试信息，测试信息包括但不限于其ID信息，层面信息、换层过孔信息(连接层面、坐标等)、测点信息(层面、坐标等)、连接的芯片管脚等信息。Specifically, after the signal line is determined, the test information of the signal line is obtained. The test information includes but is not limited to its ID information, layer information, layer-changing via information (connection layer, coordinates, etc.), measuring point information (layer, coordinates, etc.) etc.), connected chip pins and other information.
作为一种优选的实施例，该信号测试点检测方法还包括：As a preferred embodiment, the signal test point detection method also includes:
根据测试信息和/或走线长度规范生成信号线的标记信息，并将标记信息存储到数据库。Generate tag information of the signal line according to the test information and/or trace length specification, and store the tag information in a database.
作为一种优选的实施例，根据测试信息和/或走线长度规范生成信号线的标记信息的过程具体包括：As a preferred embodiment, the process of generating the marking information of the signal line according to the test information and/or the trace length specification specifically includes:
当换层过孔信息为0，且无测点，生成第一标记；When the layer-changing via information is 0 and there is no measuring point, generate the first mark;
当换层过孔信息为0，且测点到接收端芯片的走线长度大于走线长度规范，生成第一标记；When the layer-changing via information is 0, and the trace length from the measuring point to the receiver chip is greater than the trace length specification, generate the first mark;
当换层过孔信息不为0、过孔距离接收端芯片的走线长度大于走线长度规范、且测点到接收端芯片的走线长度大于走线长度规范，生成第一标记。When the layer-changing via information is not 0, the trace length between the via hole and the receiving end chip is greater than the trace length specification, and the trace length from the measuring point to the receiving end chip is greater than the trace length specification, a first mark is generated.
具体的，换层过孔信息具体可以指换层过孔数量，如果换层过孔数量为0，说明走线和芯片在同一层，检查是否有测点，如果没有，标记“via 0,testpoint 0，Fail”，记录到数据库，如果有测点，查询测点层面，获取测点到接收芯片的走线长度，并与走线长度规范进行比较，如果大于走线长度规范，标记为“via 0,testpoint 1,Fail”，记录到数据库中，如果小于或等于走线长度规范，标记为“via 0,testpoint 1,Pass”，记录到数据库中。如果过孔数量不为0，查询过孔距离接收端芯片的走线长度，并与走线长度规范进行比较，如果小于或等于走线长度规范，标记为“via 1,Pass”，记录到数据库中。如果大于走线长度规范，继续检查测点信息，如果有，查询测点到接收芯片的走线长度，并与走线长度规范进行比较，如果大于走线长度规范，标记为“via 1,test 1,fail”，记录到数据库中。如果小于或等于走线长度规范，标记为“via 1,test 1,Pass”，记录到数据库中。上述标记中带有fail的标记即为第一标记。Specifically, the layer-changing via information can refer to the number of layer-changing vias. If the number of layer-changing vias is 0, it means that the wiring and the chip are on the same layer. Check whether there is a test point. If not, mark "via 0,
经过上述检测后，作为一种优选的实施例，可以将标记为fail的所有信号线的信息显示在显示界面，便于用户查看及后续添加测试点，显示界面上显示的信息可以包括但不限于信号线名称Net Name、层面Layer、测点Testpoint，过孔信息Via，走线长度Length，标记Result，参照图2所示。After the above detection, as a preferred embodiment, the information of all signal lines marked as fail can be displayed on the display interface, which is convenient for users to view and add test points later. The information displayed on the display interface can include but not limited to signal The line name Net Name, layer Layer, measuring point Testpoint, via information Via, trace length Length, mark Result, as shown in Figure 2.
进一步的，用户可以根据上述显示界面上提示的所有为fail的信号线选择当前需要添加测点的信号线，生成对应的选择指令，检测工具在接收到该选择指令后，可以控制该信号线高亮，并定位到接收端附近，即确定该信号线上的测点添加区，在该测点添加区上添加测点，并计算此测点到接收芯片引脚的走线长度，如果大于走线长度规范，弹出添加错误的提示信息，用户可删掉重新添加，如果小于或等于走线长度规范，弹出添加正确的提示信息，继续点击下一个信号线进行同样操作，直至所选择的信号线全部完成测点添加。Further, the user can select the signal line that currently needs to add measurement points according to all the failed signal lines prompted on the above display interface, and generate a corresponding selection instruction. After receiving the selection instruction, the detection tool can control the height of the signal line. light up, and locate it near the receiving end, that is, determine the measurement point addition area on the signal line, add measurement points on the measurement point addition area, and calculate the trace length from this measurement point to the receiving chip pin, if it is greater than the trace length The line length specification will pop up a prompt message of adding an error. The user can delete it and add it again. If it is less than or equal to the line length specification, a prompt message will pop up to add the correct one. Continue to click on the next signal line to perform the same operation until the selected signal line All measurement points are added.
作为一种优选的实施例，为保证测点添加的可靠性，用户还可以输出复核指令，以便检测工具在接收到该复核指令后，对所选择的信号线重新检查一遍，如有不符合的会将该信号线对应的信息显示在显示界面中，用户可继续完善设计，如全部符合设计要求，则会弹出与全部符合设计要求对应的提示信息。As a preferred embodiment, in order to ensure the reliability of the measurement point addition, the user can also output a review instruction, so that the detection tool can re-check the selected signal line after receiving the review instruction. The information corresponding to the signal line will be displayed on the display interface, and the user can continue to improve the design. If all meet the design requirements, a prompt message corresponding to all meet the design requirements will pop up.
作为一种优选的实施例，可以将所选择的信号线的测点信息、检查结果信息存储到文档中，便于后续查阅，方便SI测试人员对测试点的定位。As a preferred embodiment, the measurement point information and inspection result information of the selected signal line can be stored in a file, which is convenient for subsequent reference and convenient for SI testers to locate the test points.
可见，本实施例中首先通过检测工具获取PCB文件，从而确定PCB上所有信号线的信息，保证对信号线测试点检测的全面性，不会出现遗漏现象，然后该检测工具根据信号线选择指令和SI信息确定目标信号线及接收端芯片，在该信号线上按照测点距离接收端芯片的走线长度规范选择测点的位置，减少对信号完整性性能的影响，且由检测工具完成信号测试点检测，相较于人工检测，可以减少大量工时，提高了检测效率及可靠性，同时便于SI工程师布线检视、layout工程师布线设计、SI测试工程师回板测试，从而保证信号SI质量，进而保证系统的可靠及稳定，使用范围广，推广度高。It can be seen that in this embodiment, the PCB file is first obtained through the detection tool, thereby determining the information of all signal lines on the PCB, ensuring the comprehensiveness of the signal line test point detection, and no omissions will occur, and then the detection tool selects instructions according to the signal line Determine the target signal line and the receiving end chip based on SI information, select the position of the measuring point on the signal line according to the trace length specification of the measuring point distance from the receiving end chip, reduce the impact on signal integrity performance, and complete the signal by the detection tool Compared with manual detection, test point detection can reduce a lot of man-hours, improve detection efficiency and reliability, and facilitate wiring inspection by SI engineers, wiring design by layout engineers, and board test by SI test engineers, thereby ensuring signal SI quality and further ensuring The system is reliable and stable, with a wide range of applications and a high degree of promotion.
请参照图3，图3为本申请所提供的一种信号测试点检测系统的结构示意图，应用于检测工具，该信号测试点检测系统包括：Please refer to Figure 3. Figure 3 is a schematic structural diagram of a signal test point detection system provided by the present application, which is applied to detection tools. The signal test point detection system includes:
获取模块1，用于获取PCB文件；Obtain
确定模块2，用于接收信号线选择指令及SI信息，根据信号线选择指令及SI信息在PCB文件中确定信号线及接收端芯片；The
添加模块3，用于获取信号线的测试信息，根据测试信息及测点距离接收端芯片的走线长度规范在信号线上添加测点。Add
可见，本实施例中首先通过检测工具获取PCB文件，从而确定PCB上所有信号线的信息，保证对信号线测试点检测的全面性，不会出现遗漏现象，然后该检测工具根据信号线选择指令和SI信息确定目标信号线及接收端芯片，在该信号线上按照测点距离接收端芯片的走线长度规范选择测点的位置，减少对信号完整性性能的影响，且由检测工具完成信号测试点检测，相较于人工检测，可以减少大量工时，提高了检测效率及可靠性，同时便于SI工程师布线检视、layout工程师布线设计、SI测试工程师回板测试，从而保证信号SI质量，进而保证系统的可靠及稳定，使用范围广，推广度高。It can be seen that in this embodiment, the PCB file is first obtained through the detection tool, thereby determining the information of all signal lines on the PCB, ensuring the comprehensiveness of the signal line test point detection, and no omissions will occur, and then the detection tool selects instructions according to the signal line Determine the target signal line and the receiving end chip based on SI information, select the position of the measuring point on the signal line according to the trace length specification of the measuring point distance from the receiving end chip, reduce the impact on signal integrity performance, and complete the signal by the detection tool Compared with manual detection, test point detection can reduce a lot of man-hours, improve detection efficiency and reliability, and facilitate wiring inspection by SI engineers, wiring design by layout engineers, and board test by SI test engineers, thereby ensuring signal SI quality and further ensuring The system is reliable and stable, with a wide range of applications and a high degree of promotion.
作为一种优选的实施例，测试信息包括ID信息、连接层面信息、换层过孔信息、测点信息、连接的芯片管脚信息中的一种或多种。As a preferred embodiment, the test information includes one or more of ID information, connection level information, layer-change via information, measurement point information, and connected chip pin information.
作为一种优选的实施例，该信号测试点检测系统还包括：As a preferred embodiment, the signal test point detection system also includes:
标记模块，用于根据测试信息和/或走线长度规范生成信号线的标记信息，并将标记信息存储到数据库。The marking module is configured to generate marking information of signal lines according to test information and/or trace length specifications, and store the marking information in a database.
作为一种优选的实施例，根据测试信息和/或走线长度规范生成信号线的标记信息的过程具体包括：As a preferred embodiment, the process of generating the marking information of the signal line according to the test information and/or the trace length specification specifically includes:
当换层过孔信息为0，且无测点，生成第一标记；When the layer-changing via information is 0 and there is no measuring point, generate the first mark;
当换层过孔信息为0，且测点到接收端芯片的走线长度大于走线长度规范，生成第一标记；When the layer-changing via information is 0, and the trace length from the measuring point to the receiver chip is greater than the trace length specification, generate the first mark;
当换层过孔信息不为0、过孔距离接收端芯片的走线长度大于走线长度规范、且测点到接收端芯片的走线长度大于走线长度规范，生成第一标记。When the layer-changing via information is not 0, the trace length between the via hole and the receiving end chip is greater than the trace length specification, and the trace length from the measuring point to the receiving end chip is greater than the trace length specification, a first mark is generated.
作为一种优选的实施例，该信号测试点检测系统还包括：As a preferred embodiment, the signal test point detection system also includes:
显示模块，用于显示所有第一标记对应的信号线。A display module, configured to display signal lines corresponding to all first markers.
作为一种优选的实施例，该信号测试点检测系统还包括：As a preferred embodiment, the signal test point detection system also includes:
处理模块，用于根据接收端芯片的位置确定信号线上的测点添加区；The processing module is used to determine the measuring point addition area on the signal line according to the position of the receiving end chip;
相应的，添加模块3具体用于：Correspondingly, add
根据测试信息及测点距离接收端芯片的走线长度规范在测点添加区上添加测点，并更新信号线的测试信息。Add measurement points in the measurement point addition area according to the test information and the trace length specification of the measurement point distance from the receiver chip, and update the test information of the signal line.
作为一种优选的实施例，该信号测试点检测系统还包括：As a preferred embodiment, the signal test point detection system also includes:
结果生成模块，用于生成与信号线的检测结果对应的信息。The result generation module is configured to generate information corresponding to the detection result of the signal line.
另一方面，本申请还提供了一种电子设备，包括：On the other hand, the present application also provides an electronic device, including:
存储器，用于存储计算机程序；memory for storing computer programs;
处理器，用于执行计算机程序时实现如上文任意一个实施例所描述的信号测试点检测方法的步骤。The processor is configured to implement the steps of the signal test point detection method described in any one of the above embodiments when executing the computer program.
对于本申请所提供的一种电子设备的介绍请参照上述实施例，本申请在此不再赘述。For the introduction of an electronic device provided in the present application, please refer to the foregoing embodiments, and the present application will not repeat it here.
本申请所提供的一种电子设备具有和上述信号测试点检测方法相同的有益效果。An electronic device provided by the present application has the same beneficial effects as the above-mentioned method for detecting a signal test point.
另一方面，本申请还提供了一种计算机可读存储介质，计算机可读存储介质上存储有计算机程序，计算机程序被处理器执行时实现如上文任意一个实施例所描述的信号测试点检测方法的步骤。On the other hand, the present application also provides a computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the method for detecting a signal test point as described in any one of the above embodiments is implemented A step of.
对于本申请所提供的一种计算机可读存储介质的介绍请参照上述实施例，本申请在此不再赘述。For the introduction of a computer-readable storage medium provided by the present application, please refer to the above-mentioned embodiments, and the present application will not repeat it here.
本申请所提供的一种计算机可读存储介质具有和上述信号测试点检测方法相同的有益效果。A computer-readable storage medium provided by the present application has the same beneficial effect as the above-mentioned method for detecting a signal test point.
还需要说明的是，在本说明书中，诸如第一和第二等之类的关系术语仅仅用来将一个实体或者操作与另一个实体或操作区分开来，而不一定要求或者暗示这些实体或操作之间存在任何这种实际的关系或者顺序。而且，术语“包括”、“包含”或者其任何其他变体意在涵盖非排他性的包含，从而使得包括一系列要素的过程、方法、物品或者设备不仅包括那些要素，而且还包括没有明确列出的其他要素，或者是还包括为这种过程、方法、物品或者设备所固有的要素。在没有更多限制的状况下，由语句“包括一个……”限定的要素，并不排除在包括所述要素的过程、方法、物品或者设备中还存在另外的相同要素。It should also be noted that in this specification, relative terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply that these entities or operations There is no such actual relationship or order between the operations. Furthermore, the term "comprises", "comprises" or any other variation thereof is intended to cover a non-exclusive inclusion such that a process, method, article, or apparatus comprising a set of elements includes not only those elements, but also includes elements not expressly listed. other elements of or also include elements inherent in such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of additional identical elements in the process, method, article or apparatus comprising said element.
对所公开的实施例的上述说明，使本领域专业技术人员能够实现或使用本申请。对这些实施例的多种修改对本领域的专业技术人员来说将是显而易见的，本文中所定义的一般原理可以在不脱离本申请的精神或范围的情况下，在其他实施例中实现。因此，本申请将不会被限制于本文所示的这些实施例，而是要符合与本文所公开的原理和新颖特点相一致的最宽的范围。The above description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the application. Therefore, the present application will not be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (7)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010674399.7ACN111880076B (en) | 2020-07-14 | 2020-07-14 | A signal test point detection method, system and related components |
| PCT/CN2021/077383WO2022012048A1 (en) | 2020-07-14 | 2021-02-23 | Signal test point detection method and system, and related components |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010674399.7ACN111880076B (en) | 2020-07-14 | 2020-07-14 | A signal test point detection method, system and related components |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN111880076A CN111880076A (en) | 2020-11-03 |
| CN111880076Btrue CN111880076B (en) | 2022-11-18 |
Family
ID=73151252
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010674399.7AActiveCN111880076B (en) | 2020-07-14 | 2020-07-14 | A signal test point detection method, system and related components |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN111880076B (en) |
| WO (1) | WO2022012048A1 (en) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111880076B (en)* | 2020-07-14 | 2022-11-18 | 苏州浪潮智能科技有限公司 | A signal test point detection method, system and related components |
| CN112881899B (en)* | 2021-02-26 | 2022-07-29 | 合肥联宝信息技术有限公司 | Test point positioning method, device and equipment and readable storage medium |
| CN113702801A (en)* | 2021-07-09 | 2021-11-26 | 苏州浪潮智能科技有限公司 | Signal measurement method and device of chip and related assembly |
| CN114137388B (en)* | 2021-11-25 | 2024-05-28 | 深圳市三田技术科技有限公司 | Circuit board signal trace-searching detection system |
| CN115291075B (en)* | 2022-06-24 | 2024-07-02 | 杭州未名信科科技有限公司 | A high-speed signal quality testing method and testing device |
| CN116167327B (en)* | 2023-01-30 | 2025-06-27 | 苏州浪潮智能科技有限公司 | Tool and method for checking length of PCB signal line length and via stub length |
| CN116090398A (en)* | 2023-02-10 | 2023-05-09 | 苏州浪潮智能科技有限公司 | Method, system, terminal and storage medium for optimizing signal point measurement position of server |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1979499A (en)* | 2005-11-30 | 2007-06-13 | 英业达股份有限公司 | Method and system for segment detection of wiring |
| CN101430722A (en)* | 2007-11-09 | 2009-05-13 | 英业达股份有限公司 | Test point layout detection method |
| CN103778266A (en)* | 2012-10-18 | 2014-05-07 | 鸿富锦精密工业（深圳）有限公司 | Signal line arrangement checking system and method |
| CN208079088U (en)* | 2018-05-08 | 2018-11-09 | 杭州海康威视数字技术股份有限公司 | Test system and wireless communication module |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101201861A (en)* | 2006-12-14 | 2008-06-18 | 英业达股份有限公司 | Method for automatically checking test point and computer readable storage medium |
| CN101470167A (en)* | 2007-12-28 | 2009-07-01 | 英业达股份有限公司 | Configuration method of test points |
| CN101620565B (en)* | 2008-07-04 | 2012-05-09 | 福建升腾资讯有限公司 | Automatic function testing method of terminal system |
| TW201222299A (en)* | 2010-11-17 | 2012-06-01 | Inventec Corp | Method of disposing testpoints |
| US10444282B2 (en)* | 2014-10-16 | 2019-10-15 | Mentor Graphics Corporation | Test point insertion for low test pattern counts |
| JP6636968B2 (en)* | 2017-02-14 | 2020-01-29 | Ｎｅｃプラットフォームズ株式会社 | Printed circuit board measurement point setting system, measurement point setting method and measurement point setting program |
| CN111880076B (en)* | 2020-07-14 | 2022-11-18 | 苏州浪潮智能科技有限公司 | A signal test point detection method, system and related components |
- 2020
- 2020-07-14CNCN202010674399.7Apatent/CN111880076B/enactiveActive
- 2021
- 2021-02-23WOPCT/CN2021/077383patent/WO2022012048A1/ennot_activeCeased
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1979499A (en)* | 2005-11-30 | 2007-06-13 | 英业达股份有限公司 | Method and system for segment detection of wiring |
| CN101430722A (en)* | 2007-11-09 | 2009-05-13 | 英业达股份有限公司 | Test point layout detection method |
| CN103778266A (en)* | 2012-10-18 | 2014-05-07 | 鸿富锦精密工业（深圳）有限公司 | Signal line arrangement checking system and method |
| CN208079088U (en)* | 2018-05-08 | 2018-11-09 | 杭州海康威视数字技术股份有限公司 | Test system and wireless communication module |
Also Published As
| Publication number | Publication date |
|---|---|
| CN111880076A (en) | 2020-11-03 |
| WO2022012048A1 (en) | 2022-01-20 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN111880076B (en) | A signal test point detection method, system and related components | |
| CN108549606A (en) | interface test method and device | |
| CN115081389B (en) | A printed circuit board wiring inspection method, device, equipment and storage medium | |
| CN107220442A (en) | A kind of difference through hole for PCB is to detection instrument | |
| CN113065300B (en) | Method, system and device for backtracking simulation waveform in chip EDA simulation | |
| CN112527587B (en) | Verification progress determining method, device, equipment and readable storage medium | |
| CN114580326B (en) | Netlist export method, server and storage medium for device functional simulation | |
| CN116844989B (en) | Method and system for identifying causes of chip failure | |
| CN111814421B (en) | Surface-mount connector pin inspection tool, method, equipment and medium | |
| US7293204B2 (en) | Computer peripheral connecting interface system configuration debugging method and system | |
| CN117785723A (en) | Dynamic interface parameter association method, device and electronic equipment | |
| WO2023213094A1 (en) | Dynamic data area selection method, system and device applied to integrated circuit device, and computer-readable storage medium | |
| CN110133474A (en) | A chip output signal detection method and detection system | |
| CN119476150A (en) | Method, device, equipment and medium for verifying chip functional coverage | |
| CN114564903A (en) | Chip simulation design verification method, device, equipment and medium | |
| CN108399128A (en) | A kind of generation method of user data, device, server and storage medium | |
| CN117033208A (en) | Interface contract checking method and device, electronic equipment and storage medium | |
| CN117596778A (en) | Pad positioning method, device, medium and equipment based on circuit board silk screen printing | |
| CN113704035B (en) | Time delay detection method and device and related equipment | |
| CN113743039B (en) | Method, device, storage medium and equipment for checking network label designed by schematic diagram | |
| CN110362482A (en) | Page defect management method and terminal device | |
| CN112015658A (en) | Method and device for generating software integration test case | |
| CN120493825B (en) | Chip verification method, test equipment and chip verification system | |
| CN113419739B (en) | Node map difference detection method and device, electronic equipment and storage medium | |
| CN112464608B (en) | A method, system and medium for automatically adding ground plane measuring points in PCB |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address | Address after:Building 9, No.1, guanpu Road, Guoxiang street, Wuzhong Economic Development Zone, Wuzhong District, Suzhou City, Jiangsu Province Patentee after:Suzhou Yuannao Intelligent Technology Co.,Ltd. Country or region after:China Address before:Building 9, No.1, guanpu Road, Guoxiang street, Wuzhong Economic Development Zone, Wuzhong District, Suzhou City, Jiangsu Province Patentee before:SUZHOU LANGCHAO INTELLIGENT TECHNOLOGY Co.,Ltd. Country or region before:China |