CN111708705A - BIOS automatic repair function testing method, device, equipment and medium - Google Patents

Abstract

The application discloses a method and a device for testing the automatic repair function of a BIOS (basic input output System), electronic equipment and a computer readable storage medium, wherein the method is applied to a BIOS chip and comprises the following steps: after receiving a preset IPMI instruction sent by a substrate management controller, calling a preset simulation program to destroy a main module of the BIOS firmware; storing the damaged BIOS firmware; and restarting the system so as to perform the BIOS automatic repair function test. According to the method and the device, the preset simulation program which is preset in the BIOS chip is triggered and executed based on the preset IPMI instruction, the main module of the BIOS firmware can be efficiently, automatically and accurately damaged, the BIOS chip is prevented from being disassembled and assembled, and a tester does not need to consult a developer to manually position and damage the main module of the firmware, so that the test efficiency and the applicability can be greatly improved, and meanwhile, the accuracy of data positioning of the main module is also improved.

Description

Translated fromChinese

BIOS的自动修复功能测试方法、装置、设备及介质BIOS automatic repair function testing method, device, equipment and medium

技术领域technical field

本申请涉及计算机技术领域，特别涉及一种BIOS的自动修复功能测试方法、装置、电子设备及计算机可读存储介质。The present application relates to the field of computer technology, and in particular, to a method, device, electronic device, and computer-readable storage medium for testing an automatic repair function of a BIOS.

背景技术Background technique

基本输入输出系统(Basic Input Output System，BIOS)是服务器等设备主板上的一个重要固件程序。一般地，为了确保BIOS芯片的正常工作，目前在国产服务器中，设计人员一般均为BIOS芯片开发了自动修复功能，即BIOS recovery功能。基于该功能，当BIOS芯片里的文件被破坏后，其即可进行自动修复，有效保障器件程序的运行安全。The Basic Input Output System (BIOS) is an important firmware program on the motherboard of a device such as a server. Generally, in order to ensure the normal operation of the BIOS chip, in domestic servers, designers generally develop an automatic repair function for the BIOS chip, that is, the BIOS recovery function. Based on this function, when the file in the BIOS chip is damaged, it can be automatically repaired, effectively ensuring the safe operation of the device program.

相应地，在服务器产品测试阶段，BIOS recovery功能的测试也自然成为其中重要的一项。但是，在相关技术中，测试人员一般在咨询过专业的BIOS开发人员后，使用第三方工具破坏掉开发人员指明的BIOS的特定区域，并将被破坏后的BIOS文件用烧录器烧录到BIOS芯片里，并重新将BIOS芯片安装至服务器上电开机，从而对BIOS芯片能否在上电后利用recovery功能成功进行自我修复。Correspondingly, in the testing stage of server products, the test of BIOS recovery function has naturally become an important one. However, in the related art, after consulting a professional BIOS developer, the tester generally uses a third-party tool to destroy a specific area of the BIOS specified by the developer, and burns the damaged BIOS file to the The BIOS chip is installed in the BIOS chip, and the BIOS chip is re-installed in the server to power on, so as to check whether the BIOS chip can use the recovery function to successfully repair itself after power-on.

可见，上述方法比较适用于主板上的BIOS芯片方便取摘的情况，否则将十分麻烦。此外，由于BIOS文件内部区域划分是不断变化的，一般只有专业开发人员才知道，因此，该方法将耗费测试人员较多工时与开发人员进行咨询，不便于测试工作的长期开展，影响测试效率。It can be seen that the above method is more suitable for the situation where the BIOS chip on the main board is easy to pick up, otherwise it will be very troublesome. In addition, since the internal area division of the BIOS file is constantly changing, generally only professional developers know about it. Therefore, this method will cost testers many man-hours to consult with developers, which is inconvenient for the long-term development of the test work and affects the test efficiency.

鉴于此，提供一种解决上述技术问题的方案，已经是本领域技术人员所亟需关注的。In view of this, providing a solution to the above-mentioned technical problems is an urgent need for those skilled in the art.

发明内容SUMMARY OF THE INVENTION

本申请的目的在于提供一种BIOS的自动修复功能测试方法、装置、电子设备及计算机可读存储介质，以便有效提高测试效率和操作的便利性。The purpose of the present application is to provide a method, device, electronic device and computer-readable storage medium for testing the automatic repair function of BIOS, so as to effectively improve the test efficiency and the convenience of operation.

为解决上述技术问题，第一方面，本申请公开了一种BIOS的自动修复功能测试方法，应用于BIOS芯片，包括：In order to solve the above technical problems, in the first aspect, the present application discloses a method for testing the automatic repair function of BIOS, which is applied to a BIOS chip, including:

在接收到基板管理控制器发送的预设IPMI指令后，调用预设模拟程序以破坏BIOS固件的主模块；After receiving the preset IPMI command sent by the baseboard management controller, call the preset simulation program to destroy the main module of the BIOS firmware;

保存被破坏后的所述BIOS固件；saving the damaged BIOS firmware;

重启系统以便进行BIOS自动修复功能测试。Reboot the system to test the BIOS auto-repair function.

可选地，所述调用预设模拟程序以破坏BIOS固件的主模块，包括：Optionally, the invoking preset simulation program to destroy the main module of the BIOS firmware includes:

基于所述预设模拟程序查找BIOS固件的所述主模块；Find the main module of the BIOS firmware based on the preset simulation program;

基于所述预设模拟程序删除所述主模块。The main module is deleted based on the preset simulation program.

可选地，所述调用预设模拟程序以破坏BIOS固件的主模块，包括：Optionally, the invoking preset simulation program to destroy the main module of the BIOS firmware includes:

基于所述预设模拟程序查找BIOS固件的所述主模块；Find the main module of the BIOS firmware based on the preset simulation program;

基于所述预设模拟程序删除所述主模块中的首个字符串。The first character string in the main module is deleted based on the preset simulation program.

可选地，所述重启系统以便进行BIOS自动修复功能测试，包括：Optionally, the restarting the system in order to perform the BIOS automatic repair function test includes:

重启系统以便基于预先存储的完整的BIOS固件备份进行自动修复功能测试。Reboot the system to test the auto-recovery functionality based on a pre-stored full BIOS firmware backup.

第二方面，本申请还公开了一种BIOS的自动修复功能测试装置，包括：In the second aspect, the present application also discloses a BIOS automatic repair function testing device, including:

调用单元，用于在接收到基板管理控制器发送的预设IPMI指令后，调用预设模拟程序以破坏BIOS固件的主模块；a calling unit, configured to call the preset simulation program to destroy the main module of the BIOS firmware after receiving the preset IPMI command sent by the baseboard management controller;

保存单元，用于保存被破坏后的所述BIOS固件；a saving unit for saving the damaged BIOS firmware;

重启单元，用于重启系统以便进行BIOS自动修复功能测试。The restart unit is used to restart the system for the BIOS automatic repair function test.

可选地，所述调用单元具体用于：Optionally, the calling unit is specifically used for:

基于所述预设模拟程序查找BIOS固件的所述主模块；并基于所述预设模拟程序删除所述主模块。Searching for the main module of the BIOS firmware based on the preset simulation program; and deleting the main module based on the preset simulation program.

可选地，所述调用单元具体用于：Optionally, the calling unit is specifically used for:

基于所述预设模拟程序查找BIOS固件的所述主模块；并基于所述预设模拟程序删除所述主模块中的首个字符串。Searching for the main module of the BIOS firmware based on the preset simulation program; and deleting the first character string in the main module based on the preset simulation program.

可选地，所述重启单元具体用于：Optionally, the restarting unit is specifically used for:

重启系统以便基于预先存储的完整的BIOS固件备份进行自动修复功能测试。Reboot the system to test the auto-recovery functionality based on a pre-stored full BIOS firmware backup.

第三方面，本申请还公开了一种电子设备，包括：In a third aspect, the present application also discloses an electronic device, comprising:

存储器，用于存储计算机程序；memory for storing computer programs;

处理器，用于执行所述计算机程序以实现如上所述的任一种BIOS的自动修复功能测试方法的步骤。The processor is configured to execute the computer program to implement the steps of any of the above-mentioned methods for testing the automatic repair function of the BIOS.

第四方面，本申请还公开了一种计算机可读存储介质，所述计算机可读存储介质中存储有计算机程序，所述计算机程序被处理器执行时用以实现如上所述的任一种BIOS的自动修复功能测试方法的步骤。In a fourth aspect, the present application further discloses a computer-readable storage medium, where a computer program is stored in the computer-readable storage medium, and when the computer program is executed by the processor, any one of the above BIOSes is implemented The steps of the automatic repair function test method.

本申请所提供的BIOS的自动修复功能测试方法应用于BIOS芯片，包括：在接收到基板管理控制器发送的预设IPMI指令后，调用预设模拟程序以破坏BIOS固件的主模块；保存被破坏后的所述BIOS固件；重启系统以便进行BIOS自动修复功能测试。The method for testing the automatic repair function of BIOS provided by the present application is applied to a BIOS chip, including: after receiving a preset IPMI command sent by a baseboard management controller, calling a preset simulation program to destroy the main module of the BIOS firmware; saving the damaged main module After the BIOS firmware; restart the system to test the BIOS automatic repair function.

可见，本申请实施例所提供的BIOS的自动修复功能测试方法，基于预设IPMI指令触发执行预先在BIOS芯片中设置的预设模拟程序，可高效、自动、准确地将BIOS固件的主模块破坏，以便进行BIOS自动修复功能测试。一方面，本申请避免了拆装BIOS芯片，适用于各类主板结构，而另一方面，由于本申请中预设模拟程序的开发工作可由BIOS固件开发人员在固件开发阶段一同完成，因此测试人员在测试阶段仅需直接观测测试结果即可，无需再通过咨询开发人员进而手动定位破坏固件的主模块，既提高了测试效率，又避免了主模块的数据定位失误。本申请所提供的BIOS的自动修复功能测试装置、电子设备及计算机可读存储介质同样具有上述有益效果。It can be seen that the method for testing the automatic repair function of the BIOS provided by the embodiment of the present application triggers the execution of the preset simulation program pre-set in the BIOS chip based on the preset IPMI instruction, which can efficiently, automatically and accurately destroy the main module of the BIOS firmware , in order to test the BIOS auto-repair function. On the one hand, the present application avoids disassembly and assembly of BIOS chips, and is applicable to various motherboard structures. On the other hand, since the development of the preset simulation program in this In the testing stage, it is only necessary to directly observe the test results, and there is no need to manually locate the main module that damages the firmware by consulting developers, which not only improves the test efficiency, but also avoids data positioning errors of the main module. The BIOS automatic repair function testing device, electronic device and computer-readable storage medium provided by the present application also have the above beneficial effects.

附图说明Description of drawings

为了更清楚地说明现有技术和本申请实施例中的技术方案，下面将对现有技术和本申请实施例描述中需要使用的附图作简要的介绍。当然，下面有关本申请实施例的附图描述的仅仅是本申请中的一部分实施例，对于本领域普通技术人员来说，在不付出创造性劳动的前提下，还可以根据提供的附图获得其他的附图，所获得的其他附图也属于本申请的保护范围。In order to more clearly illustrate the prior art and the technical solutions in the embodiments of the present application, the following will briefly introduce the drawings to be used in the description of the prior art and the embodiments of the present application. Of course, the following drawings related to the embodiments of the present application describe only a part of the embodiments of the present application. For those of ordinary skill in the art, without any creative effort, they can also obtain other embodiments according to the provided drawings. The accompanying drawings and other drawings obtained also belong to the protection scope of the present application.

图1为本申请实施例公开的一种BIOS的自动修复功能测试方法的流程图；1 is a flowchart of a method for testing an automatic repair function of a BIOS disclosed in an embodiment of the application;

图2为本申请实施例公开的一种BIOS的自动修复功能测试装置的结构框图；2 is a structural block diagram of a device for testing an automatic repair function of a BIOS disclosed in an embodiment of the application;

图3为本申请实施例公开的一种电子设备的结构框图。FIG. 3 is a structural block diagram of an electronic device disclosed in an embodiment of this application.

具体实施方式Detailed ways

本申请的核心在于提供一种BIOS的自动修复功能测试方法、装置、电子设备及计算机可读存储介质，以便有效提高测试效率和操作的便利性。The core of the present application is to provide a BIOS automatic repair function testing method, apparatus, electronic device and computer-readable storage medium, so as to effectively improve the testing efficiency and operation convenience.

为了对本申请实施例中的技术方案进行更加清楚、完整地描述，下面将结合本申请实施例中的附图，对本申请实施例中的技术方案进行介绍。显然，所描述的实施例仅仅是本申请一部分实施例，而不是全部的实施例。基于本申请中的实施例，本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例，都属于本申请保护的范围。In order to describe the technical solutions in the embodiments of the present application more clearly and completely, the technical solutions in the embodiments of the present application will be introduced below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, but not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present application.

基本输入输出系统(Basic Input Output System，BIOS)是服务器等设备主板上的一个重要固件程序。一般地，为了确保BIOS芯片的正常工作，目前在国产服务器中，设计人员一般均为BIOS芯片开发了自动修复功能，即BIOS recovery功能。基于该功能，当BIOS芯片里的文件被破坏后，其即可进行自动修复，有效保障器件程序的运行安全。The Basic Input Output System (BIOS) is an important firmware program on the motherboard of a device such as a server. Generally, in order to ensure the normal operation of the BIOS chip, in domestic servers, designers generally develop an automatic repair function for the BIOS chip, that is, the BIOS recovery function. Based on this function, when the file in the BIOS chip is damaged, it can be automatically repaired, effectively ensuring the safe operation of the device program.

相应地，在服务器产品测试阶段，BIOS recovery功能的测试也自然成为其中重要的一项。但是，在相关技术中，测试人员一般在咨询过专业的BIOS开发人员后，使用第三方工具破坏掉开发人员指明的BIOS的特定区域，并将被破坏后的BIOS文件用烧录器烧录到BIOS芯片里，并重新将BIOS芯片安装至服务器上电开机，从而对BIOS芯片能否在上电后利用recovery功能成功进行自我修复。Correspondingly, in the testing stage of server products, the test of BIOS recovery function has naturally become an important one. However, in the related art, after consulting a professional BIOS developer, the tester generally uses a third-party tool to destroy a specific area of the BIOS specified by the developer, and burns the damaged BIOS file to the The BIOS chip is installed in the BIOS chip, and the BIOS chip is re-installed in the server to power on, so as to check whether the BIOS chip can use the recovery function to successfully repair itself after power-on.

可见，上述方法比较适用于主板上的BIOS芯片方便取摘的情况，否则将十分麻烦。此外，由于BIOS文件内部区域划分是不断变化的，一般只有专业开发人员才知道，因此，该方法将耗费测试人员较多工时与开发人员进行咨询，不便于测试工作的长期开展，影响测试效率。鉴于此，本申请提供了一种BIOS的自动修复功能测试方案，可有效解决上述问题。It can be seen that the above method is more suitable for the situation where the BIOS chip on the main board is easy to pick up, otherwise it will be very troublesome. In addition, since the internal area division of the BIOS file is constantly changing, generally only professional developers know about it. Therefore, this method will cost testers many man-hours to consult with developers, which is inconvenient for the long-term development of the test work and affects the test efficiency. In view of this, the present application provides a BIOS automatic repair function test solution, which can effectively solve the above problems.

参见图1所示，本申请实施例公开了一种BIOS的自动修复功能测试方法，应用于BIOS芯片，主要包括：Referring to FIG. 1 , an embodiment of the present application discloses a method for testing an automatic repair function of a BIOS, which is applied to a BIOS chip, and mainly includes:

S101：在接收到基板管理控制器发送的预设IPMI指令后，调用预设模拟程序以破坏BIOS固件的主模块。S101: After receiving the preset IPMI command sent by the baseboard management controller, call a preset simulation program to destroy the main module of the BIOS firmware.

S102：保存被破坏后的BIOS固件。S102: Save the damaged BIOS firmware.

S103：重启系统以便进行BIOS自动修复功能测试。S103: Restart the system to test the BIOS automatic repair function.

具体地，本申请实施例所提供的BIOS的自动修复功能测试方法，具体可基于基板管理控制器(Baseboard Management Controller，BMC)与BIOS芯片间的数据交互而自动进行，从而无需相关测试人员利用第三方工具等手动破坏BIOS芯片的数据完整性，更有效避免了将BIOS芯片在主板上的摘取、安装操作，省却了不必要的人工成本。Specifically, the method for testing the automatic repair function of the BIOS provided by the embodiments of the present application can be specifically performed automatically based on the data interaction between the Baseboard Management Controller (BMC) and the BIOS chip, so that there is no need for relevant testers to use the first Manually destroying the data integrity of the BIOS chip with third-party tools, etc., more effectively avoids the removal and installation of the BIOS chip on the motherboard, and saves unnecessary labor costs.

具体地，本申请实施例预先为BMC和BIOS芯片间的通信定义并设置了一个预设IPMI(Intelligent Platform Management Interface，智能平台管理接口)指令，并且还在BIOS芯片中预先开发有一个预设模拟程序。该IPMI指令具体用于指示BIOS芯片调用并执行该预设模拟程序。Specifically, the embodiment of the present application defines and sets a preset IPMI (Intelligent Platform Management Interface, intelligent platform management interface) instruction for the communication between the BMC and the BIOS chip in advance, and also pre-developed a preset simulation in the BIOS chip. program. The IPMI instruction is specifically used to instruct the BIOS chip to call and execute the preset simulation program.

其中，该预设模型程序在被执行时具体用于破坏BIOS固件的主模块，由此令BIOS芯片的数据完整性被破坏，以便在此情况下进行自动恢复功能的测试。Wherein, the preset model program is specifically used to destroy the main module of the BIOS firmware when it is executed, thereby destroying the data integrity of the BIOS chip, so that the automatic recovery function can be tested in this case.

当通过执行预设模拟程序而达到破坏BIOS固件数据完整性的目的之后，便可保存被破坏后的BIOS固件，进而重启系统。当BIOS上电重启后，BIOS recovery功能将自动校验数据完整性进而在检测到数据被破坏后进行自动修复，测试人员即可获取关于自动修复功能的测试结果。After the purpose of destroying the data integrity of the BIOS firmware is achieved by executing the preset simulation program, the destroyed BIOS firmware can be saved, and then the system can be restarted. When the BIOS is powered on and restarted, the BIOS recovery function will automatically verify the data integrity and then perform automatic repair after detecting that the data is damaged, and testers can obtain the test results of the automatic repair function.

本申请实施例所提供的BIOS的自动修复功能测试方法应用于BIOS芯片，包括：在接收到基板管理控制器发送的预设IPMI指令后，调用预设模拟程序以破坏BIOS固件的主模块；保存被破坏后的BIOS固件；重启系统以便进行BIOS自动修复功能测试。The method for testing the automatic repair function of the BIOS provided by the embodiment of the present application is applied to a BIOS chip, including: after receiving a preset IPMI command sent by a baseboard management controller, calling a preset simulation program to destroy the main module of the BIOS firmware; saving Corrupted BIOS firmware; reboot the system to test the BIOS auto-repair function.

可见，本申请实施例所提供的BIOS的自动修复功能测试方法，基于预设IPMI指令触发执行预先在BIOS芯片中设置的预设模拟程序，可高效、自动、准确地将BIOS固件的主模块破坏，以便进行BIOS自动修复功能测试。一方面，本申请避免了拆装BIOS芯片，适用于各类主板结构，而另一方面，由于本申请中预设模拟程序的开发工作可由BIOS固件开发人员在固件开发阶段一同完成，因此测试人员在测试阶段仅需直接观测测试结果即可，无需再通过咨询开发人员进而手动定位破坏固件的主模块，既提高了测试效率，又避免了主模块的数据定位失误。It can be seen that the method for testing the automatic repair function of the BIOS provided by the embodiment of the present application triggers the execution of the preset simulation program pre-set in the BIOS chip based on the preset IPMI instruction, which can efficiently, automatically and accurately destroy the main module of the BIOS firmware , in order to test the BIOS auto-repair function. On the one hand, the present application avoids disassembly and assembly of BIOS chips, and is applicable to various motherboard structures. On the other hand, since the development of the preset simulation program in this In the testing stage, it is only necessary to directly observe the test results, and there is no need to manually locate the main module that damages the firmware by consulting developers, which not only improves the test efficiency, but also avoids data positioning errors of the main module.

作为一种具体实施例，本申请实施例所提供的BIOS的自动修复功能测试方法在上述内容的基础上，调用预设模拟程序以破坏BIOS固件的主模块，包括：As a specific embodiment, the method for testing the automatic repair function of the BIOS provided by the embodiment of the present application, on the basis of the above content, calls a preset simulation program to destroy the main module of the BIOS firmware, including:

基于预设模拟程序查找BIOS固件的主模块；Find the main module of the BIOS firmware based on the preset simulation program;

基于预设模拟程序删除主模块。Delete the main module based on the preset simulation program.

具体地，为了对BIOS固件的自动修复功能进行测试，需要先将其数据完整性破坏。而具体地，需要破坏的是BIOS固件的主模块。由此，本实施例中，预设模拟程序可具体包括有相应的定位查找子程序，以便用于查找BIOS固件的主模块。此外，预设模拟程序还可包括相应的删除子程序，用于执行数据删除。Specifically, in order to test the automatic repair function of the BIOS firmware, its data integrity needs to be destroyed first. Specifically, what needs to be destroyed is the main module of the BIOS firmware. Therefore, in this embodiment, the preset simulation program may specifically include a corresponding positioning and searching subroutine, so as to be used for searching the main module of the BIOS firmware. In addition, the preset simulation program may also include a corresponding deletion subroutine for performing data deletion.

其中，在本实施例中，删除子程序在进行主模块的数据删除时，可直接将整个主模块的全部数据删除。Wherein, in this embodiment, when the deletion subroutine deletes the data of the main module, it can directly delete all the data of the entire main module.

作为一种具体实施例，本申请实施例所提供的BIOS的自动修复功能测试方法在上述内容的基础上，调用预设模拟程序以破坏BIOS固件的主模块，包括：As a specific embodiment, the method for testing the automatic repair function of the BIOS provided by the embodiment of the present application, on the basis of the above content, calls a preset simulation program to destroy the main module of the BIOS firmware, including:

基于预设模拟程序查找BIOS固件的主模块；Find the main module of the BIOS firmware based on the preset simulation program;

基于预设模拟程序删除主模块中的首个字符串。Deletes the first string in the main module based on a preset emulator.

在本实施例中，预设模拟程序也同样具体包括有用于查找主模块的查找子程序，以及用于删除数据的删除子程序。本领域技术人员容易理解的是，作为BIOS固件中的一个重要模块，BIOS固件的主模块是用于执行开机运行后的相关基本输入输出初始化工作的，因此主模块中的任何一部分数据的丢失都将破坏BIOS固件的数据完整性。有鉴于此，本实施例中的删除子程序具体仅仅是删除主模块中的首个字符串。In this embodiment, the preset simulation program also specifically includes a search subroutine for searching for the main module, and a deletion subroutine for deleting data. It can be easily understood by those skilled in the art that, as an important module in the BIOS firmware, the main module of the BIOS firmware is used to perform the relevant basic input and output initialization work after the boot operation, so any part of the data in the main module is lost. Will destroy the data integrity of the BIOS firmware. In view of this, the deletion subroutine in this embodiment only deletes the first character string in the main module.

容易理解的是，本领域技术人员也可以自行设置其他具体的删除方式，例如仅删除主模块中的第二个字符串、……、最后一个字符串等，本申请对此并不进行限定。It is easy to understand that those skilled in the art can also set other specific deletion methods by themselves, for example, only delete the second string, ..., the last string in the main module, etc., which is not limited in this application.

作为一种具体实施例，本申请实施例所提供的BIOS的自动修复功能测试方法在上述内容的基础上，重启系统以便进行BIOS自动修复功能测试，包括：As a specific embodiment, the method for testing the automatic repair function of the BIOS provided by the embodiment of the present application, on the basis of the above content, restarts the system to perform the automatic repair function test of the BIOS, including:

重启系统以便基于预先存储的完整的BIOS固件备份进行BIOS自动修复功能测试。Reboot the system to test the BIOS auto-repair function based on the pre-stored full BIOS firmware backup.

具体地，在进行BIOS自动修复功能测试之前，可将存储有完整的BIOS固件备份的存储设备，例如优盘、硬盘等，连接至主板，以便在主板重启开机上电后，利用存储设备中完整的BIOS固件备份对BIOS芯片中被破坏的BIOS固件进行数据完整性校验，进而进行自动修复。Specifically, before the BIOS automatic repair function test is performed, a storage device that stores a complete BIOS firmware backup, such as a USB flash drive, a hard disk, etc., can be connected to the motherboard, so that after the motherboard is restarted and powered on, the complete backup of the BIOS firmware can be used. The BIOS firmware backup performs data integrity verification on the damaged BIOS firmware in the BIOS chip, and then performs automatic repair.

参见图2所示，本申请实施例公开了一种BIOS的自动修复功能测试装置，主要包括：Referring to FIG. 2 , an embodiment of the present application discloses a device for testing an automatic repair function of a BIOS, which mainly includes:

调用单元201，用于在接收到基板管理控制器发送的预设IPMI指令后，调用预设模拟程序以破坏BIOS固件的主模块；The callingunit 201 is configured to call the preset simulation program to destroy the main module of the BIOS firmware after receiving the preset IPMI instruction sent by the baseboard management controller;

保存单元202，用于保存被破坏后的BIOS固件；a savingunit 202, used for saving the damaged BIOS firmware;

重启单元203，用于重启系统以便进行BIOS自动修复功能测试。The restartingunit 203 is used for restarting the system so as to test the BIOS automatic repair function.

可见，本申请实施例所公开的BIOS的自动修复功能测试装置，基于预设IPMI指令触发执行预先在BIOS芯片中设置的预设模拟程序，可高效、自动、准确地将BIOS固件的主模块破坏，以便进行BIOS自动修复功能测试。一方面，本申请避免了拆装BIOS芯片，适用于各类主板结构，而另一方面，由于本申请中预设模拟程序的开发工作可由BIOS固件开发人员在固件开发阶段一同完成，因此测试人员在测试阶段仅需直接观测测试结果即可，无需再通过咨询开发人员进而手动定位破坏固件的主模块，既提高了测试效率，又避免了主模块的数据定位失误。It can be seen that the device for testing the automatic repair function of the BIOS disclosed in the embodiment of the present application triggers the execution of the preset simulation program pre-set in the BIOS chip based on the preset IPMI instruction, which can efficiently, automatically and accurately destroy the main module of the BIOS firmware. , in order to test the BIOS auto-repair function. On the one hand, the present application avoids disassembly and assembly of BIOS chips, and is applicable to various motherboard structures. On the other hand, since the development of the preset simulation program in this In the testing stage, it is only necessary to directly observe the test results, and there is no need to manually locate the main module that damages the firmware by consulting developers, which not only improves the test efficiency, but also avoids data positioning errors of the main module.

关于上述BIOS的自动修复功能测试装置的具体内容，可参考前述关于BIOS的自动修复功能测试方法的详细介绍，这里就不再赘述。For the specific content of the apparatus for testing the automatic repair function of the BIOS, reference may be made to the foregoing detailed introduction on the method for testing the automatic repair function of the BIOS, which will not be repeated here.

作为一种具体实施例，本申请实施例所公开的BIOS的自动修复功能测试装置在上述内容的基础上，调用单元201具体用于：As a specific embodiment, on the basis of the above content, the invokingunit 201 is specifically used for:

基于预设模拟程序查找BIOS固件的主模块；并基于预设模拟程序删除主模块。Searching for the main module of the BIOS firmware based on the preset simulation program; and deleting the main module based on the preset simulation program.

作为一种具体实施例，本申请实施例所公开的BIOS的自动修复功能测试装置在上述内容的基础上，调用单元201具体用于：As a specific embodiment, on the basis of the above content, the invokingunit 201 is specifically used for:

基于预设模拟程序查找BIOS固件的主模块；并基于预设模拟程序删除主模块中的首个字符串。Find the main module of the BIOS firmware based on the preset simulation program; and delete the first character string in the main module based on the preset simulation program.

作为一种具体实施例，本申请实施例所公开的BIOS的自动修复功能测试装置在上述内容的基础上，重启单元203具体用于：As a specific embodiment, on the basis of the above content, the restartingunit 203 is specifically used for:

重启系统以便基于预先存储的完整的BIOS固件备份进行自动修复功能测试。Reboot the system to test the auto-recovery functionality based on a pre-stored full BIOS firmware backup.

参见图3所示，本申请实施例公开了一种电子设备，包括：Referring to FIG. 3 , an embodiment of the present application discloses an electronic device, including:

存储器301，用于存储计算机程序；amemory 301 for storing computer programs;

处理器302，用于执行所述计算机程序以实现如下步骤：Theprocessor 302 is configured to execute the computer program to realize the following steps:

在接收到基板管理控制器发送的预设IPMI指令后，调用预设模拟程序以破坏BIOS固件的主模块；保存被破坏后的所述BIOS固件；重启系统以便进行BIOS自动修复功能测试。After receiving the preset IPMI command sent by the baseboard management controller, the preset simulation program is called to destroy the main module of the BIOS firmware; the damaged BIOS firmware is saved; the system is restarted to perform the BIOS automatic repair function test.

在一个实施例中，存储器301中存储的计算机子程序在被处理器302执行时具体用于：基于所述预设模拟程序查找BIOS固件的所述主模块；基于所述预设模拟程序删除所述主模块。In one embodiment, the computer subprogram stored in thememory 301 is specifically used for: searching for the main module of the BIOS firmware based on the preset simulation program when executed by theprocessor 302; the main module.

在一个实施例中，存储器301中存储的计算机子程序在被处理器302执行时具体用于：基于所述预设模拟程序查找BIOS固件的所述主模块；基于所述预设模拟程序删除所述主模块中的首个字符串。In one embodiment, the computer subprogram stored in thememory 301 is specifically used for: searching for the main module of the BIOS firmware based on the preset simulation program when executed by theprocessor 302; The first string in the main module described above.

在一个实施例中，存储器301中存储的计算机子程序在被处理器302执行时具体用于：重启系统以便基于预先存储的完整的BIOS固件备份进行自动修复功能测试。In one embodiment, the computer subroutine stored in thememory 301 is specifically used when executed by theprocessor 302 to: reboot the system so as to perform an automatic repair function test based on a pre-stored complete BIOS firmware backup.

进一步地，本申请实施例还公开了一种计算机可读存储介质，所述计算机可读存储介质中存储有计算机程序，所述计算机程序被处理器执行时用以实现如下步骤：Further, an embodiment of the present application also discloses a computer-readable storage medium, where a computer program is stored in the computer-readable storage medium, and the computer program is used to implement the following steps when executed by a processor:

在接收到基板管理控制器发送的预设IPMI指令后，调用预设模拟程序以破坏BIOS固件的主模块；保存被破坏后的所述BIOS固件；重启系统以便进行BIOS自动修复功能测试。After receiving the preset IPMI command sent by the baseboard management controller, the preset simulation program is called to destroy the main module of the BIOS firmware; the damaged BIOS firmware is saved; the system is restarted to perform the BIOS automatic repair function test.

在一个实施例中，所述计算机可读存储介质中存储的计算机子程序在被处理器执行时具体用于：基于所述预设模拟程序查找BIOS固件的所述主模块；基于所述预设模拟程序删除所述主模块。In one embodiment, the computer subprogram stored in the computer-readable storage medium is specifically configured to: search for the main module of the BIOS firmware based on the preset simulation program when executed by the processor; The simulation program deletes the main module.

在一个实施例中，所述计算机可读存储介质中存储的计算机子程序在被处理器执行时具体用于：基于所述预设模拟程序查找BIOS固件的所述主模块；基于所述预设模拟程序删除所述主模块中的首个字符串。In one embodiment, the computer subprogram stored in the computer-readable storage medium is specifically configured to: search for the main module of the BIOS firmware based on the preset simulation program when executed by the processor; The simulation program deletes the first string in the main module.

在一个实施例中，所述计算机可读存储介质中存储的计算机子程序在被处理器执行时具体用于：重启系统以便基于预先存储的完整的BIOS固件备份进行自动修复功能测试。In one embodiment, the computer subprograms stored in the computer-readable storage medium are specifically used when executed by the processor to: restart the system so as to perform an automatic repair function test based on a pre-stored complete BIOS firmware backup.

关于上述电子设备和计算机可读存储介质的具体内容，可参考前述关于BIOS的自动修复功能测试方法的详细介绍，这里就不再赘述。For the specific content of the electronic device and the computer-readable storage medium, reference may be made to the foregoing detailed introduction on the method for testing the automatic repair function of the BIOS, which will not be repeated here.

本申请中各个实施例采用递进的方式描述，每个实施例重点说明的都是与其他实施例的不同之处，各个实施例之间相同相似部分互相参见即可。对于实施例公开的设备而言，由于其与实施例公开的方法相对应，所以描述的比较简单，相关之处参见方法部分说明即可。The various embodiments in this application are described in a progressive manner, and each embodiment focuses on the differences from other embodiments, and the same and similar parts between the various embodiments may be referred to each other. For the device disclosed in the embodiment, since it corresponds to the method disclosed in the embodiment, the description is relatively simple, and the relevant part can be referred to the description of the method.

还需说明的是，在本申请文件中，诸如“第一”和“第二”之类的关系术语，仅仅用来将一个实体或者操作与另一个实体或者操作区分开来，而不一定要求或者暗示这些实体或者操作之间存在任何这种实际的关系或者顺序。此外，术语“包括”、“包含”或者其任何其他变体意在涵盖非排他性的包含，从而使得包括一系列要素的过程、方法、物品或者设备不仅包括那些要素，而且还包括没有明确列出的其他要素，或者是还包括为这种过程、方法、物品或者设备所固有的要素。在没有更多限制的情况下，由语句“包括一个……”限定的要素，并不排除在包括所述要素的过程、方法、物品或者设备中还存在另外的相同要素。It should also be noted that, in this application document, relational terms such as "first" and "second" are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require Or imply that there is any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising", "comprising" or any other variation thereof are intended to encompass a non-exclusive inclusion such that a process, method, article or device that includes a list of elements includes not only those elements, but also includes not explicitly listed or other elements inherent to such a process, method, article or apparatus. Without further limitation, an element qualified by the phrase "comprising a..." does not preclude the presence of additional identical elements in a process, method, article or apparatus that includes the element.

以上对本申请所提供的技术方案进行了详细介绍。本文中应用了具体个例对本申请的原理及实施方式进行了阐述，以上实施例的说明只是用于帮助理解本申请的方法及其核心思想。应当指出，对于本技术领域的普通技术人员来说，在不脱离本申请原理的前提下，还可以对本申请进行若干改进和修饰，这些改进和修饰也落入本申请的保护范围内。The technical solutions provided by the present application have been introduced in detail above. Specific examples are used herein to illustrate the principles and implementations of the present application, and the descriptions of the above embodiments are only used to help understand the methods and core ideas of the present application. It should be pointed out that for those skilled in the art, without departing from the principles of the present application, several improvements and modifications can also be made to the present application, and these improvements and modifications also fall within the protection scope of the present application.

Claims (10)

1. A BIOS automatic repair function test method is applied to a BIOS chip and comprises the following steps:

after receiving a preset IPMI instruction sent by a substrate management controller, calling a preset simulation program to destroy a main module of the BIOS firmware;

saving the damaged BIOS firmware;

and restarting the system so as to perform the BIOS automatic repair function test.

2. The automatic repair function test method according to claim 1, wherein the calling the predetermined simulation program to destroy the main module of the BIOS firmware comprises:

searching the main module of the BIOS firmware based on the preset simulation program;

and deleting the main module based on the preset simulation program.

3. The automatic repair function test method according to claim 1, wherein the calling the predetermined simulation program to destroy the main module of the BIOS firmware comprises:

searching the main module of the BIOS firmware based on the preset simulation program;

and deleting the first character string in the main module based on the preset simulation program.

4. The automatic repair function test method according to any one of claims 1 to 3, wherein restarting the system for performing the BIOS automatic repair function test includes:

the system is restarted for an automatic repair function test based on a pre-stored full BIOS firmware backup.

5. An automatic repair function test device for a BIOS, comprising:

the calling unit is used for calling a preset simulation program to destroy a main module of the BIOS firmware after receiving a preset IPMI instruction sent by the substrate management controller;

the storage unit is used for storing the damaged BIOS firmware;

and the restarting unit is used for restarting the system so as to carry out the BIOS automatic repair function test.

6. The automatic repair function test device according to claim 5, wherein the call unit is specifically configured to:

searching the main module of the BIOS firmware based on the preset simulation program; and deleting the main module based on the preset simulation program.

7. The automatic repair function test device according to claim 5, wherein the call unit is specifically configured to:

searching the main module of the BIOS firmware based on the preset simulation program; and deleting the first character string in the main module based on the preset simulation program.

8. The automatic repair function test device according to any one of claims 5 to 7, wherein the restart unit is specifically configured to:

the system is restarted for an automatic repair function test based on a pre-stored full BIOS firmware backup.

9. An electronic device, comprising:

a memory for storing a computer program;

a processor for executing the computer program to implement the steps of the method for automatic repair function testing of a BIOS as claimed in any one of claims 1 to 4.

10. A computer-readable storage medium, in which a computer program is stored, which, when being executed by a processor, is configured to carry out the steps of the method for automatic repair function testing of a BIOS according to any one of claims 1 to 4.

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