Disclosure of Invention
The technical problem that this application mainly solved provides a casing side detection device and casing side detection method of electronic product, through the light source and the mutual cooperation between the image acquisition unit that distribute in first camera bellows and second camera bellows, carries out optical judgement to being surveyed electronic product, and secondary camera bellows is judged, can distinguish the easy defect of obscuring.
In order to solve the technical problem, the application adopts a technical scheme that: the shell side edge detection device of the electronic product is arranged at a specified position of an assembly line and used for detecting each side edge of the electronic product;
the casing side detection device includes: the system comprises a first dark box and a second dark box, wherein the first dark box and the second dark box are arranged on a production line at intervals, at least a first image acquisition unit, a second image acquisition unit, a first light source and a second light source are arranged in the first dark box, the first light source and the first image acquisition unit are arranged on a first side in a matched mode, the second light source and the second image acquisition unit are arranged on a second side in a matched mode, the first side and the second side correspond to two adjacent sides of an electronic product to be tested, and therefore appearance conditions of two sides of the electronic product to be tested are detected;
the second camera bellows is at least internally provided with a third image acquisition unit, a fourth image acquisition unit, a third light source and a fourth light source, the third light source and the third image acquisition unit are arranged on a third side in a matching way, the fourth light source and the fourth image acquisition unit are arranged on a fourth side in a matching way, wherein the third side is opposite to the first side, and the fourth side is opposite to the second side, so as to detect appearance conditions of the other two sides of the tested electronic product.
Preferably, the device for detecting the side edge of the shell further comprises a processing terminal, and the processing terminal is respectively connected with the first image acquisition unit, the second image acquisition unit, the third image acquisition unit and the fourth image acquisition unit;
the processing terminal is used for receiving the images acquired by the first image acquisition unit, the second image acquisition unit, the third image acquisition unit and the fourth image acquisition unit so as to determine whether the side edge of the shell of the tested electronic product has defects.
Preferably, the processing terminal is further configured to analyze and determine a defect level and a defect position of the side edge of the housing of the tested electronic product according to the images acquired by the first image acquisition unit, the second image acquisition unit, the third image acquisition unit and the fourth image acquisition unit.
Preferably, the bottom surfaces of the first dark box and the second dark box are provided with flocked cloth, and the flocked cloth is used for performing diffuse reflection on light so that the light can be uniformly irradiated to the side edge of the detected electronic product.
Preferably, the first image acquisition unit, the second image acquisition unit, the third image acquisition unit and the fourth image acquisition unit are all cameras, and the first light source, the second light source, the third light source and the fourth light source are all shadowless lamps.
Preferably, the tested electronic product is a mobile phone.
Preferably, a sensor is arranged in each of the first dark box and the second dark box, and the sensor is used for detecting the position of the electronic product to be tested so as to trigger the assembly line to stop moving.
In order to solve the above technical problem, another technical solution adopted by the present application is: there is provided a housing side detection method of an electronic product, the housing side detection method being dependent on the housing side detection apparatus according to the present application, the housing side detection method comprising:
acquiring the position of the tested electronic product on the assembly line;
after the tested electronic product reaches a preset reference line in the first dark box, triggering the assembly line to stop moving, starting the first light source, the first image acquisition unit, the second light source and the second image acquisition unit, and acquiring appearance conditions of two side edges of the tested electronic product through the first image acquisition unit and the second image acquisition unit;
after the first image acquisition unit and the second image acquisition unit finish image acquisition, triggering the assembly line to start moving again;
and after the tested electronic product reaches a preset reference line in the second dark box, triggering the assembly line to stop moving, starting the third light source, the third image acquisition unit, the fourth light source and the fourth image acquisition unit, and acquiring appearance conditions of the other two sides of the tested electronic product through the third image acquisition unit and the fourth image acquisition unit.
Preferably, the housing side edge detection method further includes:
analyzing the images acquired by the first image acquisition unit, the second image acquisition unit, the third image acquisition unit and the fourth image acquisition unit;
judging whether the side edge of the tested electronic product has defects or not;
and if the defects exist, performing defect calibration.
Preferably, the defect calibration specifically includes:
determining the types and grades of the defects through a preset algorithm;
and classifying the tested electronic product according to the type of the defect and the grade of the defect.
The beneficial effect of this application is: the shell side detection device is arranged at a specified position of an assembly line and is used for detecting each side of the electronic product; casing side detection device includes: the system comprises a first dark box and a second dark box, wherein the first dark box and the second dark box are arranged on a production line at intervals, at least a first image acquisition unit, a second image acquisition unit, a first light source and a second light source are arranged in the first dark box, the first light source and the first image acquisition unit are arranged on a first side in a matched mode, the second light source and the second image acquisition unit are arranged on a second side in a matched mode, the first side and the second side correspond to two adjacent sides of an electronic product to be detected, and therefore the appearance condition of two sides of the electronic product to be detected is detected; the second camera bellows is at least internally provided with a third image acquisition unit, a fourth image acquisition unit, a third light source and a fourth light source, the third light source and the third image acquisition unit are arranged on a third side in a matching manner, the fourth light source and the fourth image acquisition unit are arranged on a fourth side in a matching manner, wherein the third side is opposite to the first side, and the fourth side is opposite to the second side, so as to detect appearance conditions of the other two sides of the tested electronic product.
In the application, through the mutual matching between the light sources distributed in the first dark box and the second dark box and the image acquisition units, the optical judgment is carried out on the electronic product to be detected, and the secondary dark box judgment can distinguish the easy-confusion defects; the appearance detection is carried out in an intelligent mode, the accuracy can be improved, and missing detection and error detection caused by manual detection can be effectively avoided.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
In this embodiment, with reference to fig. 1 and fig. 2, a casing side detecting device for an electronic product is provided, which is disposed at a designated position of aproduction line 3 and is used for detecting each side of the electronic product.
Wherein, casing side detection device includes: the electronic product detection device comprises afirst camera bellows 1 and a second camera bellows 2, wherein thefirst camera bellows 1 and the second camera bellows 2 are arranged on aproduction line 3 at intervals, at least a firstimage acquisition unit 101, a secondimage acquisition unit 102, afirst light source 111 and asecond light source 112 are arranged in thefirst camera bellows 1, thefirst light source 111 and the firstimage acquisition unit 101 are arranged on a first side in a matching manner, thesecond light source 112 and the secondimage acquisition unit 102 are arranged on a second side in a matching manner, wherein the first side and the second side correspond to two adjacent sides of an electronic product to be detected (specifically, the two sides can be understood in a matching manner with reference to fig. 1) so as to detect appearance conditions of two sides of the electronic product to be detected;
at least a thirdimage acquisition unit 201, a fourthimage acquisition unit 202, athird light source 211 and afourth light source 212 are arranged in the second dark box 2, thethird light source 211 and the thirdimage acquisition unit 201 are arranged on a third side in a matching manner, thefourth light source 212 and the fourthimage acquisition unit 202 are arranged on a fourth side in a matching manner, wherein the third side is opposite to the first side, and the fourth side is opposite to the second side, so as to detect appearance conditions of the other two sides of the electronic product to be tested.
In the embodiment, the mutual cooperation between the light sources distributed in the firstdark box 1 and the second dark box 2 and the image acquisition units is adopted to perform optical judgment on the electronic product to be detected, and the secondary dark box judgment can distinguish the easy-to-confuse defects; the appearance detection is carried out in an intelligent mode, the accuracy can be improved, and missing detection and error detection caused by manual detection can be effectively avoided.
In a preferred embodiment, the device for detecting the side edge of the housing further includes a processing terminal 4, the processing terminal 4 may be a computer, and the processing terminal 4 is connected to the firstimage capturing unit 101, the secondimage capturing unit 102, the thirdimage capturing unit 201, and the fourthimage capturing unit 202 respectively. Wherein, each image acquisition unit can be connected with the processing terminal 4 through a cable or a wireless network to transmit data.
The processing terminal 4 is configured to receive images acquired by the firstimage acquisition unit 101, the secondimage acquisition unit 102, the thirdimage acquisition unit 201, and the fourthimage acquisition unit 202, so as to determine whether a defect exists on a side edge of a housing of the electronic product to be tested. Specifically, the processing terminal 4 determines whether the side of the housing of the electronic product to be tested has a defect according to the uniformity and the gradual change of brightness of the received image, for example, the side of the housing of the electronic product is worn; the processing terminal 4 further determines whether the side edge of the housing of the electronic product to be tested has a defect according to whether the received picture has a scratch, for example, the housing of the electronic product is scratched.
In order to classify the electronic products according to the damage degree, the processing terminal 4 is further configured to analyze and determine the defect level and the defect position of the side edge of the housing of the electronic product to be tested according to the images acquired by the firstimage acquisition unit 101, the secondimage acquisition unit 102, the thirdimage acquisition unit 201, and the fourthimage acquisition unit 202.
For example, the defect levels may be classified as: a low level (e.g., slight color difference), a medium level (e.g., slight scratch) and a high level (e.g., severe scratch), after the level is confirmed, the processing terminal 4 performs product diversion according to the scratch degree of the tested electronic product, specifically, after the second dark box 2, the production line is divided into a first sub-production line (not shown), a second sub-production line (not shown) and a third sub-production line (not shown), a diversion device (not shown) is arranged on theproduction line 3, the diversion device is arranged after the second dark box 2 and before each sub-production line, the diversion device is connected with the processing terminal 4, the processing terminal 4 is used for triggering the diversion device to divert the tested electronic product according to the defect level, for example, when the tested electronic product is in the low defect level, the diversion device conveys the tested electronic product to the first sub-production line, when the detected electronic product is in a medium defect grade, the shunt device conveys the detected electronic product to a second sub-assembly line, and when the detected electronic product is in a high defect grade, the shunt device conveys the detected electronic product to a third sub-assembly line.
In an actual application scenario, the lower side of the side surface of the casing is not easily irradiated by a light source, and the condition of missed detection is easily caused, in order to solve the problem, in a preferred embodiment, as shown in fig. 3, the bottom surfaces of the firstdark box 1 and the second dark box 2 are both provided with flockedfabric 13, each light source is arranged in the corresponding dark box at a preset angle (wherein the preset angle is determined according to the actual condition), the light emitted by the light source is irradiated onto the flocked fabric, and the flockedfabric 13 is used for performing diffuse reflection on the light, so that the light is uniformly irradiated onto the side edge of the detected electronic product. In this embodiment, the position difficult to shoot is polished reversely by the flockedfabric 13, so that the display definition is improved.
In the present embodiment, a sensor is disposed at the preset reference line of thefirst camera bellows 1 and the second camera bellows 2, and the position of the electronic product on theassembly line 3 is obtained through the sensor, which may be a position sensor or an infrared sensor. In actual use, the position of the electronic product is detected by a sensor to trigger thepipeline 3 to stop moving.
Specifically, the firstimage capturing unit 101, the secondimage capturing unit 102, the thirdimage capturing unit 201, and the fourthimage capturing unit 202 are all cameras, and thefirst light source 111, thesecond light source 112, thethird light source 211, and thefourth light source 212 are all shadowless lamps. The electronic product to be tested is a mobile phone or a tablet computer.
Based on the device for detecting the side edge of the casing in the foregoing embodiment, the embodiment provides a method for detecting the side edge of the casing in a matching manner, and referring to fig. 4, the specific implementation process is as follows:
step 501: and acquiring the position of the tested electronic product on the assembly line.
In this embodiment, a sensor is disposed at a preset reference line of the first dark box and the second dark box, and the position of the electronic product on the production line is obtained through the sensor, where the sensor may be a position sensor or an infrared sensor.
Step 502: and when the tested electronic product reaches a preset reference line in the first dark box, triggering the assembly line to stop moving, starting the first light source, the first image acquisition unit, the second light source and the second image acquisition unit, and acquiring appearance conditions of two sides of the tested electronic product through the first image acquisition unit and the second image acquisition unit.
Step 503: and after the first image acquisition unit and the second image acquisition unit finish image acquisition, triggering the assembly line to restart to move.
Step 504: and after the tested electronic product reaches a preset reference line in the second dark box, triggering the assembly line to stop moving, starting the third light source, the third image acquisition unit, the fourth light source and the fourth image acquisition unit, and acquiring appearance conditions of the other two sides of the tested electronic product through the third image acquisition unit and the fourth image acquisition unit.
In addition, the shell side detection method further comprises the following steps:
analyzing the images acquired by the first image acquisition unit, the second image acquisition unit, the third image acquisition unit and the fourth image acquisition unit; judging whether the side edge of the tested electronic product has defects or not; and if the defects exist, performing defect calibration.
Further, the defect calibration specifically includes:
determining the types and grades of the defects through a preset algorithm; and classifying the tested electronic product according to the type of the defect and the grade of the defect. The specific classification method is described in detail in the foregoing embodiments, and is not repeated herein.
In the application, through the mutual matching between the light sources distributed in the first dark box and the second dark box and the image acquisition units, the optical judgment is carried out on the electronic product to be detected, and the secondary dark box judgment can distinguish the easy-confusion defects; the appearance detection is carried out in an intelligent mode, the accuracy can be improved, and missing detection and error detection caused by manual detection can be effectively avoided.
The above embodiments are merely examples and are not intended to limit the scope of the present disclosure, and all modifications, equivalents, and flow charts using the contents of the specification and drawings of the present disclosure or those directly or indirectly applied to other related technical fields are intended to be included in the scope of the present disclosure.